CN104459422B - The method of testing of Interference from the power supply wire test system - Google Patents

The method of testing of Interference from the power supply wire test system Download PDF

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CN104459422B
CN104459422B CN201410844413.8A CN201410844413A CN104459422B CN 104459422 B CN104459422 B CN 104459422B CN 201410844413 A CN201410844413 A CN 201410844413A CN 104459422 B CN104459422 B CN 104459422B
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test system
main frame
power supply
test
interference
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CN104459422A (en
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邱信雄
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HUANXU ELECTRONICS CO Ltd
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HUANXU ELECTRONICS CO Ltd
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Abstract

A kind of Interference from the power supply wire test system, it is connected with each other by main frame, power supply unit and test system and is constituted, the system is able to carry out Interference from the power supply wire method of testing, main frame can control power supply unit to carry out a test pattern to test system, confirm whether main frame can set up online with test system afterwards, if result is yes, perform malfunction routine, otherwise if the result is negative, then perform breech lock and check program;Wherein, malfunction routine is to carry out self-examination by test system, and recorded by whether host acknowledgement is received after inspection result, breech lock checks that program can wait the test system to turn back on, and recorded confirming that test system is turned back on successfully or confirmed after test system cannot be started up, it is achieved in Interference from the power supply wire test automation.

Description

The method of testing of Interference from the power supply wire test system
Technical field
The present invention relates to the test equipment of electronic product and method of testing, more particularly to a kind of power line of electronic product is done Test system and method for testing are disturbed, automatic test can be carried out, to improve the efficiency and quality of Interference from the power supply wire test.
Background technology
In order to ensure electronic product can stably be run, electromagnetic susceptibility (Electromagnetic is most likely carried out Susceptibility, EMS) test confirm the ability of electronic product electromagnetism interference, wherein, IEC 61000-4-11 are carried Instantaneously fall (Voltage Dips), short interruptions (Interruption) and voltage gradient for a kind of AC-input voltage The immunity experiment specification of (Voltage Variation), referred to as Interference from the power supply wire (Power Line Disturbance, PLD) test.Aforementioned specifications divide into the antijamming capability of electronic product:Inerrancy (Error Free), without breech lock (Latch-up Free), harmless (Damage Free) Three Estate, and foregoing test specification defines for different brackets Related test condition requirement.
Current power supply unit can provide AC wave modes and test condition required for test specification to test system, but Electronic product state in which to be measured can not be detected and judge whether wrong generation.Therefore, existing Interference from the power supply wire is surveyed Examination is that operation power supply exports specific waveforms to product to be measured manually, and judges to be measured taking human as the mode of observation The state of product, and product to be measured often has the phenomenon turned back in test process, causes the integrated testability time superfluous It is long, also result in tester many times are wasted in wait product to be measured and turn back on.
The content of the invention
In order to solve foregoing problems, it is an object of the invention to provide a kind of Interference from the power supply wire test system and test side Method, is capable of the state and mistake of automation inspection electronic product to be measured, realizes automatic test, to improve Interference from the power supply wire test Efficiency and quality.
The present invention provides a kind of Interference from the power supply wire test system, includes:Main frame, the test system for being connected to the main frame, And power supply unit, the power supply unit is connected to the main frame and controlled by main frame, and is used to supply electricity to the test system; Wherein, the test system with the main frame can set up online after the completion of start, and receive the instruction of the main frame and carry out self Check, then inspection result is returned into the main frame.
Thus, the main frame can provide voltage sag, voltage gradient and short interruptions etc. by power supply unit Test pattern, so that the antijamming capability of test system is verified, after making a mistake and turning back in test system, dress to be measured Put actively or passively can set up online and carry out self-examination with main frame, and inspection result is returned into main frame recorded, And then realize the technique effect of automatic test.
In addition, the present invention also provides the Interference from the power supply wire method of testing using above-mentioned test system, its step is included:Step A) start the main frame, select test pattern and wait time delay to be tested;Step b) judges whether main frame can be with the dress to be measured Set up vertical online, be to perform malfunction routine if confirming as, if otherwise confirm as no, perform breech lock and check program;Its In, whether the malfunction routine is to carry out self-examination by the test system, and received by the host acknowledgement after inspection result Recorded;The breech lock checks that program can wait the test system to turn back on, and the test system is turned back on into confirmation Work(or confirm the test system cannot be started up after recorded;Finally perform step c) to judge whether to terminate test, if sentencing It is no to break, then returns to step a), if on the contrary be judged as YES, is terminated.
Therefore, above-mentioned method of testing can make main frame judge whether test system is normal or smoothly turns back on, and will As a result recorded, during do not need manpower participation, do not result in the waste of stand-by period.
It is preferred that when performing the malfunction routine in above-mentioned steps b), if main frame does not receive inspection result, being considered as hair Raw breech lock is simultaneously recorded, if otherwise main frame receives inspection result, the received inspection result of record.
It is preferred that when breech lock inspection program is performed in above-mentioned steps b), if being set up within the stand-by period with the test system Start success notification that is online and receiving test system transmission, then be considered as and turn back on success;Conversely, the main frame can be temporary transient Recover electric power output again after the electric power output for interrupting the power supply unit, resume waiting for the test system and turn back on;Once When the main frame receives the start success notification of test system transmission, the test system can be considered as to generation breech lock and remembered Record, or after the number of times that the main frame waits the test system to turn back on reaches predetermined quantity, the test system is considered as Damage of product is simultaneously recorded.
Brief description of the drawings
Fig. 1 is the Organization Chart of Interference from the power supply wire test system of the present invention.
Fig. 2 is the flow chart of Interference from the power supply wire method of testing of the present invention.
Fig. 3 is the flow chart of step S20 error checking in Fig. 2.
Fig. 4 is the flow chart of step S30 breech locks inspection in Fig. 2.
(symbol description)
H... main frame
D... test system
P... power supply unit
Embodiment
To further appreciate that the present invention, the present invention provides preferred embodiments below and is described with reference to the drawings as follows.
Fig. 1 is refer to, the present invention provides a kind of Interference from the power supply wire test system, included:Main frame H, (also may be used via network To use USB, RS232 or other wire/wireless coffret) it is connected to main frame H test system D and power supply unit P, power supply unit P are connected to main frame H and controlled by main frame H, and for powering (being alternating current in the present embodiment) to treating Survey device D.
Wherein, main frame H stores a control program, can control power supply unit P to carry out voltage sag, voltage Gradual change and short interruptions these three test patterns, and can start or temporarily interrupt the electric power output of the power supply unit;Treat Survey device D and store a test program, either actively or passively can set up online with main frame H after the completion of start and send out Machine success notification, and Receiving Host H instruction carries out self-examination, then inspection result is back to main frame H.
Using said power disturbed test system, the present invention is able to carry out the Interference from the power supply wire method of testing of automation, Refer to Fig. 2~Fig. 4.
First, perform step S10 to start said power disturbed test system, then in step s 11 according to be measured Device D condition sets voltage and operating frequency, step S12 is performed after the completion of setting, from voltage sag, voltage gradient And select one of which test pattern in short interruptions three kinds of test patterns, and each test pattern have predetermined test event, The test parameters such as number of times, test voltage, voltage change ratio and test time, make main frame H control selected by power supply unit P Test pattern and test system D is tested, and wait time delay to be tested (i.e. step S13), make test system D electricity Source protection mechanism has the time to tackle and act.
Then, perform step S14 and confirm whether main frame H can set up online with test system D, if confirming main frame H with treating Surveying device D can set up online, then into malfunction routine S20, on the contrary then entrance breech lock inspection program S30.
Fig. 3 is refer to, in malfunction routine S20, the test program for indicating test system D by main frame H carries out self Check and return inspection result (i.e. step S21), aft engine H perform step S22, to be confirmed whether to receive test system D's Inspection result, if main frame H does not receive inspection result, generation breech lock (Latch-Up) is considered as in step S23 by test system H And recorded, if instead main frame H receives inspection result, then perform step S24 and record received inspection result, to confirm Whether an error has occurred by test system D.
The generation of above-mentioned breech lock (Latch-Up) represents that test system D may work as machine or in the situation temporarily interrupted, And self-examination can not be smoothly completed by test program.
Main frame H can not smoothly be set up with test system D it is online in the case of, main frame H perform breech lock check program S30, Test system D is waited to turn back on referring to Fig. 4, first carrying out step S31, and test system D can be after turning back on successfully Start test program, and start success notification is sent to main frame H, if main frame H receives above-mentioned start within the stand-by period and successfully led to Know, then test system D is considered as by execution step S32 turns back on successfully and recorded, and this result represents that test system D can Recover original function by turning back on.
Opposite, once main frame H can not receive the start success notification that test system D is sent within the stand-by period, then Step S33 is performed, power supply unit P electric power output temporarily can be interrupted a period of time, recover electric power output again afterwards by main frame H (action be equal to forces test system D to be discharged and turned back on), and resume waiting for test system D and turn back on.If Main frame H successfully leads to resuming waiting for receiving the start that test system D sent in the stand-by period that test system D is turned back on Know, then perform step S34 and test system D is considered as generation breech lock and recorded, if main frame H can not be received within the stand-by period The start success notification sent to test system D, then perform step S35 and confirm whether the wait number of times waited has reached To predetermined quantity, when judged result is to reach predetermined quantity, then test system D can be considered as to damage of product and recorded, Otherwise when judged result is not up to predetermined quantity, then returns to step S33 and force test system D to be turned back on again.
After malfunction routine S20 is completed or breech lock checks program S30, Fig. 2 is returned to, main frame H performs step S15 and sentenced It is disconnected whether to terminate test, if judged result is no, step S11 is returned to, if the determination result is YES, is then terminated into step S16 Whole testing process.
Thus, said power disturbed test method can carry out automatic test after setting is completed, and will test During test system D state (inerrancy occurs, occurs breech lock, turns back on or damage of product) and/or self-examination knot Fruit is recorded, and waits test system to turn back on completely without waste of manpower, can realize the target of the present invention.
Above-mentioned cited accompanying drawing and explanation are to be used to illustrate preferably embodiments possible of the invention, and the present invention is not limited to Above-mentioned illustrated embodiment, it is all in the range of disclosed technological thought, make a little retouching to it and change still Belong to the scope of the present invention.

Claims (6)

1. a kind of Interference from the power supply wire method of testing of use Interference from the power supply wire test system, the test system includes main frame, connected The test system and power supply unit of the main frame are connected to, the power supply unit is connected to the main frame and by the main frame Control, and for supplying electricity to the test system, the test system with the main frame can set up online after the completion of start, And the instruction for receiving the main frame carries out self-examination, then inspection result is returned into the main frame, the step of the method for testing Suddenly include:
A) start the main frame, select test pattern and wait time delay to be tested;
B) judge whether the main frame can set up online with the test system, be if confirming as, perform error checking journey Sequence, if otherwise confirming as no, execution breech lock inspection program;Wherein, the malfunction routine is entered by the test system Row self-examination, and recorded by whether the host acknowledgement is received after inspection result;The breech lock checks that program can be waited The test system is turned back on, and is confirming that the test system is turned back on successfully or confirms that the test system can not Recorded after start;
C) judge whether to terminate test, if being judged as NO, return to step a), otherwise be such as judged as YES, then terminate.
2. Interference from the power supply wire method of testing as claimed in claim 1, it is characterised in that
Test pattern in step a) is a kind of test pattern in voltage sag, voltage gradient and short interruptions.
3. Interference from the power supply wire method of testing as claimed in claim 1, it is characterised in that
When performing the malfunction routine in step b), if main frame does not receive inspection result, it is considered as generation breech lock and adds To record, if otherwise main frame receives inspection result, the received inspection result of record.
4. Interference from the power supply wire method of testing as claimed in claim 1, it is characterised in that
When the breech lock inspection program is performed in step b), if setting up online with the test system within the stand-by period and receiving The start success notification sent to the test system, then be considered as and turn back on success;Conversely, the main frame can be interrupted temporarily Recover electric power output again after the electric power output of the power supply unit, resume waiting for the test system and turn back on.
5. Interference from the power supply wire method of testing as claimed in claim 4, it is characterised in that
In step b), temporarily interrupt the electric power output of the power supply unit in the main frame and the test system completes weight After new start, the test system is considered as hair by the main frame when receiving the start success notification that the test system is sent Raw breech lock is simultaneously recorded.
6. Interference from the power supply wire method of testing as claimed in claim 4, it is characterised in that
In step b), after the number of times that the main frame waits the test system to turn back on reaches predetermined quantity, by institute Test system is stated to be considered as damage of product and recorded.
CN201410844413.8A 2014-12-26 2014-12-26 The method of testing of Interference from the power supply wire test system Active CN104459422B (en)

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CN105608413B (en) * 2014-11-14 2020-04-28 深圳市汇顶科技股份有限公司 Fingerprint sensor latch recovery mechanism based on status monitoring and handshaking
CN110927494B (en) * 2019-12-05 2021-01-08 深圳市华检检测技术有限公司 Anti-interference detection method, device, equipment and computer readable storage medium

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101047374A (en) * 2006-03-31 2007-10-03 技嘉科技股份有限公司 Testing system
CN101661065A (en) * 2008-08-29 2010-03-03 佛山市顺德区顺达电脑厂有限公司 System and method for automatically testing electronic product
JP2010204916A (en) * 2009-03-03 2010-09-16 Nec Corp Test system and test method
CN102147446A (en) * 2010-02-09 2011-08-10 佛山市顺德区顺达电脑厂有限公司 Automatic testing method and system applying same
TW201321765A (en) * 2011-11-25 2013-06-01 Univ Tatung Automatic test system of communication device
CN103294575A (en) * 2012-02-24 2013-09-11 鸿富锦精密工业(深圳)有限公司 Test system and test method
CN103970628A (en) * 2013-02-01 2014-08-06 技嘉科技股份有限公司 Automatic detection system and automatic detection method thereof
CN104133088A (en) * 2013-05-02 2014-11-05 冠捷投资有限公司 Method of testing voltage sag of to-be-tested device

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101047374A (en) * 2006-03-31 2007-10-03 技嘉科技股份有限公司 Testing system
CN101661065A (en) * 2008-08-29 2010-03-03 佛山市顺德区顺达电脑厂有限公司 System and method for automatically testing electronic product
JP2010204916A (en) * 2009-03-03 2010-09-16 Nec Corp Test system and test method
CN102147446A (en) * 2010-02-09 2011-08-10 佛山市顺德区顺达电脑厂有限公司 Automatic testing method and system applying same
TW201321765A (en) * 2011-11-25 2013-06-01 Univ Tatung Automatic test system of communication device
CN103294575A (en) * 2012-02-24 2013-09-11 鸿富锦精密工业(深圳)有限公司 Test system and test method
CN103970628A (en) * 2013-02-01 2014-08-06 技嘉科技股份有限公司 Automatic detection system and automatic detection method thereof
CN104133088A (en) * 2013-05-02 2014-11-05 冠捷投资有限公司 Method of testing voltage sag of to-be-tested device

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