CN102147446A - Automatic testing method and system applying same - Google Patents
Automatic testing method and system applying same Download PDFInfo
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- CN102147446A CN102147446A CN2010103014309A CN201010301430A CN102147446A CN 102147446 A CN102147446 A CN 102147446A CN 2010103014309 A CN2010103014309 A CN 2010103014309A CN 201010301430 A CN201010301430 A CN 201010301430A CN 102147446 A CN102147446 A CN 102147446A
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Abstract
The invention provides a method for automatically testing a main board and a system applying the method. The method comprises the following steps: a. detecting whether the main board to be tested is started up; b. if the main board to be tested is started up, leading the main board to be tested to be closed down; and if the man board to be tested is closed down, setting a frequency and a voltage; c. leading the main board to be tested to be started up after setting the frequency and the voltage; d. controlling the main board to be tested to be a state to be tested, setting a power meter, reading and storing a test result; e. judging whether the test on the main board to be tested under different states to be tested is finished; f. if the test is not finished, repeating the step d to the step e; if the test is finished, judging whether the test on the main board to be tested under different frequencies and voltages is finished; and g. if the test on the main board to be tested under different frequencies and voltages is not finished, repeating the step b to the step f; and if the test is finished, leading the main board to be tested to be closed down. In the method and the system, the voltage frequency and the state to be tested can be automatically set, and testing results can also be automatically recorded.
Description
Technical field
The present invention relates to a kind of automatic mode that mainboard is tested and the system that uses this method.
Background technology
The method of testing of existing test mainboard to be measured generally needs manual or automanual test mode, testing tool need be set manually, with the to be measured mainboard of test under different test status, and record measurement result, because mainboard to be measured need test its test mode at different electric voltage frequencies, therefore, this kind test mode not only test period long, and need people's intervention, labor intensive.
Summary of the invention
In view of the above problems, the invention provides a kind of automatic mode that mainboard to be measured is tested and the system that uses this method under different electric voltage frequencies and state to be measured.
For achieving the above object, the present invention has adopted following technical scheme: a kind of method of automatic test mainboard, and it mainly may further comprise the steps:
Whether a. detect mainboard to be measured starts shooting;
B. if mainboard to be measured start then makes this mainboard shutdown to be measured, if mainboard to be measured shutdown then is provided with frequency and voltage;
C., after frequency and voltage are set, make mainboard start to be measured;
D. control mainboard to be measured and enter state to be measured, power meter is set, read and store test results;
E. judge whether this mainboard to be measured tested under different states to be measured and finish;
F. if test does not finish, then repeating step d is to step e, if test finishes, then whether this mainboard to be measured of judgement is tested under different frequency, voltage and finished;
G. if this mainboard to be measured is not tested under the state of different frequency, voltage to finish, then repeating step b is to step f; If test finishes, then this mainboard shutdown to be measured of order.
Preferable, the invention provides a kind of method of automatic test mainboard, wherein, described step b may further comprise the steps:
Step b1. constantly inquires about the control port of automatic test device;
Step b2. has judged whether to receive control command, the control command that receives is carried out checkout action, to avoid misoperation;
Step b3. if not, write check is returned, repeating step b1;
If step b4., write check is returned;
Step b5. judges whether this control command is power-on command;
If step b6. power-on command makes this mainboard start to be measured, return step b1;
Step b7. returns step b1 if not power-on command makes this mainboard shutdown to be measured.
Preferable, the invention provides a kind of method of automatic test mainboard, wherein, described steps d may further comprise the steps:
Steps d 1. is constantly inquired about the control port of automatic test device;
Steps d 2. has judged whether to receive control command, the control command that receives is carried out checkout action, to avoid misoperation;
Steps d 3. if not, write check is returned, repeating step d1;
If steps d 4., write check is returned;
Steps d 5. judges whether this control command is the order of change mainboard to be measured state to be measured;
If steps d 6. is changed the order of mainboard to be measured state to be measured, then control triggers the specified button sequence, changes its state to be measured to control mainboard to be measured, returns steps d 1;
Steps d 7. is returned steps d 1 if not.
Preferable, the invention provides a kind of method of automatic test mainboard, wherein, described state to be measured mainly comprises open state, off-mode and dormant state.
In addition, the present invention also provides a kind of system that uses above-mentioned automatic test mainboard method, in order to mainboard to be measured is carried out automatic test, this system mainly comprises: the control platform, the one end is taken into account the scalable power supply by power and is electrically connected with this mainboard to be measured, to provide different voltages and frequency to this mainboard to be measured, its other end electrically connects by automatic test device and this mainboard to be measured, to control this automatic test device this mainboard to be measured is tested under different states to be measured.
Compared to prior art, the system that the invention provides a kind of automated testing method and use this method is in order to the system that mainboard to be measured is carried out the method for automatic test and uses this method under different electric voltage frequencies and state to be measured.The present invention can be provided with electric voltage frequency and state to be measured automatically, can also write down measurement result automatically, and test process need not people's intervention, has saved manpower.
Description of drawings
Fig. 1 is the synoptic diagram of system of the present invention
Fig. 2 is the method for the invention process flow diagram
Fig. 3 is a process flow diagram of judging the switching on and shutting down order in the method for the invention
Fig. 4 is the process flow diagram of change state to be measured in the method for the invention
Embodiment
Please refer to Fig. 1 to shown in Figure 4, be automated testing method of the present invention and synoptic diagram and the process flow diagram of using the system of this method.
As shown in Figure 1, the system 10 of automatic test mainboard of the present invention, this system 10 mainly comprises control platform 101, the one end electrically connects with this mainboard 105 to be measured by power meter 103 and scalable power supply 104, with needs on this control platform 101 this power meter 103 and scalable power supply 104 are set according to the tester, thereby provide different voltages and frequency to this mainboard 105 to be measured, these control platform 101 other ends electrically connect by automatic test device 102 and this mainboard 105 to be measured, to change the different state to be measured of mainboard to be measured 105 by the control port of control automatic test device 102, in present embodiment, described mainboard to be measured 105 can comprise open state for the state to be measured of change, off-mode and dormant state are to carry out automatic test to this mainboard 105 to be measured under different states to be measured.
Please refer to Fig. 2 and shown in Figure 3, be method flow diagram of the present invention.Wherein, the method for automatic test mainboard of the present invention mainly may further comprise the steps:
Whether step 202. detects mainboard to be measured and starts shooting;
After step 205. is provided with frequency and voltage, make mainboard start to be measured;
Step 210. is not if test finishes, then repeating step 206 is to step 209, if test finishes, then whether this mainboard to be measured of judgement is tested under different frequency, voltage and is finished, described different frequency, voltage can be the electric voltage frequency standard of country variant, as China's electric voltage frequency standard is 220 volts, and frequency is 50 hertz;
Please refer to shown in Figure 3ly again, described step 203 may further comprise the steps:
If step 2034., then write check is returned;
If step 2036. power-on command, step 2031 is returned in then this mainboard start to be measured of order;
Please refer to shown in Figure 4ly again, described step 206 may further comprise the steps:
Step 2061. is constantly inquired about the control port of automatic test device;
Step 2062. judges that whether control port receives the control command that the control platform sends, and carries out checkout action to the control command that receives, to avoid misoperation;
Step 2063. if not, then write check is returned, repeating step 2061;
If step 2064., then write check is returned;
Step 2065. judges whether this control command is the order of change mainboard to be measured state to be measured;
If step 2066. is changed the order of mainboard to be measured state to be measured, then automatic test device 102 controls trigger the specified button sequence, change its state to be measured to control mainboard to be measured, return step 2061;
Step 2067. is returned step 2061 if not.
In sum, the present invention need not people's intervention, just can electric voltage frequency be set automatically and change state to be measured, so that mainboard to be measured is carried out automatic test under different electric voltage frequencies and state to be measured, automatically the record measurement result is simple to operate, has saved manpower.
Claims (5)
1. the method for an automatic test mainboard, it mainly may further comprise the steps:
Whether a. detect mainboard to be measured starts shooting;
B. if mainboard to be measured start then makes this mainboard shutdown to be measured, if mainboard to be measured shutdown then is provided with frequency and voltage;
C., after frequency and voltage are set, make mainboard start to be measured;
D. control mainboard to be measured and enter state to be measured, power meter is set, read and store test results;
E. judge whether this mainboard to be measured tested under different states to be measured and finish;
F. if test does not finish, then repeating step d is to step e, if test finishes, then whether this mainboard to be measured of judgement is tested under different frequency, voltage and finished;
G. if this mainboard to be measured is not tested under the state of different frequency, voltage to finish, then repeating step b is to step f; If test finishes, then this mainboard shutdown to be measured of order.
2. the method for automatic test mainboard according to claim 1 is characterized in that, described step b may further comprise the steps:
Step b1. constantly inquires about the control port of automatic test device;
Step b2. has judged whether to receive control command, the control command that receives is carried out checkout action, to avoid misoperation;
Step b3. if not, write check is returned, repeating step b1;
If step b4., write check is returned;
Step b5. judges whether this control command is power-on command;
If step b6. power-on command makes this mainboard start to be measured, return step b1;
Step b7. returns step b1 if not power-on command makes this mainboard shutdown to be measured.
3. the method for automatic test mainboard according to claim 1 is characterized in that, described steps d may further comprise the steps:
Steps d 1. is constantly inquired about the control port of automatic test device;
Steps d 2. has judged whether to receive control command, the control command that receives is carried out checkout action, to avoid misoperation;
Steps d 3. if not, write check is returned, repeating step d1;
If steps d 4., write check is returned;
Steps d 5. judges whether this control command is the order of change mainboard to be measured state to be measured;
If steps d 6. is changed the order of mainboard to be measured state to be measured, then control triggers the specified button sequence, changes its state to be measured to control mainboard to be measured, returns steps d 1;
Steps d 7. is returned steps d 1 if not.
4. according to the method for the automatic test mainboard described in claim 1 or 2 or 3, it is characterized in that described state to be measured mainly comprises open state, off-mode and dormant state.
5. an application rights requires the system of 1 described automatic test mainboard method, and it is characterized in that in order to mainboard to be measured is carried out automatic test this system mainly comprises:
The control platform, the one end is taken into account the scalable power supply by power and is electrically connected with this mainboard to be measured, to provide different voltages and frequency to this mainboard to be measured, its other end electrically connects by automatic test device and this mainboard to be measured, tests under different states to be measured to control this mainboard to be measured by the control port of this automatic test device.
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CN2010103014309A CN102147446A (en) | 2010-02-09 | 2010-02-09 | Automatic testing method and system applying same |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104459422A (en) * | 2014-12-26 | 2015-03-25 | 环旭电子股份有限公司 | Power line interference test system and method |
CN104866418A (en) * | 2014-02-26 | 2015-08-26 | 研祥智能科技股份有限公司 | Automatic testing method and system |
CN106771972A (en) * | 2016-12-29 | 2017-05-31 | 百富计算机技术(深圳)有限公司 | A kind of automatic testing equipment, the system and method for POS mainboard |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030204790A1 (en) * | 2002-04-30 | 2003-10-30 | Via Technologies, Inc. | Computer main board on/off testing device, method and system |
CN1460930A (en) * | 2003-06-16 | 2003-12-10 | 刘宗明 | Method for implementing computer testing instrument |
US20090167316A1 (en) * | 2007-12-28 | 2009-07-02 | Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. | Motherboard testing apparatus |
CN101566666A (en) * | 2008-04-25 | 2009-10-28 | 佛山市顺德区顺达电脑厂有限公司 | Automatic voltage testing system |
-
2010
- 2010-02-09 CN CN2010103014309A patent/CN102147446A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030204790A1 (en) * | 2002-04-30 | 2003-10-30 | Via Technologies, Inc. | Computer main board on/off testing device, method and system |
CN1460930A (en) * | 2003-06-16 | 2003-12-10 | 刘宗明 | Method for implementing computer testing instrument |
US20090167316A1 (en) * | 2007-12-28 | 2009-07-02 | Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. | Motherboard testing apparatus |
CN101566666A (en) * | 2008-04-25 | 2009-10-28 | 佛山市顺德区顺达电脑厂有限公司 | Automatic voltage testing system |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104866418A (en) * | 2014-02-26 | 2015-08-26 | 研祥智能科技股份有限公司 | Automatic testing method and system |
CN104866418B (en) * | 2014-02-26 | 2019-01-04 | 研祥智能科技股份有限公司 | Automated testing method and system |
CN104459422A (en) * | 2014-12-26 | 2015-03-25 | 环旭电子股份有限公司 | Power line interference test system and method |
CN104459422B (en) * | 2014-12-26 | 2017-08-18 | 环旭电子股份有限公司 | The method of testing of Interference from the power supply wire test system |
CN106771972A (en) * | 2016-12-29 | 2017-05-31 | 百富计算机技术(深圳)有限公司 | A kind of automatic testing equipment, the system and method for POS mainboard |
CN106771972B (en) * | 2016-12-29 | 2020-01-17 | 百富计算机技术(深圳)有限公司 | Automatic testing device, system and method for POS machine mainboard |
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Application publication date: 20110810 |