CN104374633B - 在样本制备期间从tem样本拆下探针 - Google Patents
在样本制备期间从tem样本拆下探针 Download PDFInfo
- Publication number
- CN104374633B CN104374633B CN201410396562.2A CN201410396562A CN104374633B CN 104374633 B CN104374633 B CN 104374633B CN 201410396562 A CN201410396562 A CN 201410396562A CN 104374633 B CN104374633 B CN 104374633B
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- sample
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- ion beam
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- 239000000523 sample Substances 0.000 title claims abstract description 344
- 238000002360 preparation method Methods 0.000 title description 12
- 238000000034 method Methods 0.000 claims abstract description 54
- 239000002245 particle Substances 0.000 claims abstract description 20
- 238000010884 ion-beam technique Methods 0.000 claims description 47
- 239000000758 substrate Substances 0.000 claims description 29
- 238000000151 deposition Methods 0.000 claims description 21
- 238000003801 milling Methods 0.000 claims description 20
- 230000008021 deposition Effects 0.000 claims description 17
- 239000007789 gas Substances 0.000 claims description 12
- 230000033001 locomotion Effects 0.000 claims description 11
- 238000000926 separation method Methods 0.000 claims description 10
- 238000003860 storage Methods 0.000 claims description 10
- 239000002243 precursor Substances 0.000 claims description 9
- 238000005520 cutting process Methods 0.000 claims description 7
- 238000004458 analytical method Methods 0.000 claims description 6
- 229910052710 silicon Inorganic materials 0.000 claims description 2
- 239000010703 silicon Substances 0.000 claims description 2
- 230000008569 process Effects 0.000 description 15
- 150000002500 ions Chemical class 0.000 description 12
- 238000010894 electron beam technology Methods 0.000 description 11
- 239000004065 semiconductor Substances 0.000 description 9
- 230000005540 biological transmission Effects 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 238000003384 imaging method Methods 0.000 description 4
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- 238000005516 engineering process Methods 0.000 description 2
- CKHJYUSOUQDYEN-UHFFFAOYSA-N gallium(3+) Chemical compound [Ga+3] CKHJYUSOUQDYEN-UHFFFAOYSA-N 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 229910001338 liquidmetal Inorganic materials 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 230000001052 transient effect Effects 0.000 description 2
- 102000006391 Ion Pumps Human genes 0.000 description 1
- 108010083687 Ion Pumps Proteins 0.000 description 1
- 239000012190 activator Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- FQNHWXHRAUXLFU-UHFFFAOYSA-N carbon monoxide;tungsten Chemical group [W].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-] FQNHWXHRAUXLFU-UHFFFAOYSA-N 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
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- 238000001514 detection method Methods 0.000 description 1
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- 235000013399 edible fruits Nutrition 0.000 description 1
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- 230000005684 electric field Effects 0.000 description 1
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- 238000005530 etching Methods 0.000 description 1
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- 238000010438 heat treatment Methods 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
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- 230000003993 interaction Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000007737 ion beam deposition Methods 0.000 description 1
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
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- 229960001685 tacrine Drugs 0.000 description 1
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/28—Vacuum evaporation by wave energy or particle radiation
- C23C14/30—Vacuum evaporation by wave energy or particle radiation by electron bombardment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/32—Polishing; Etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/305—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching
- H01J37/3053—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching for evaporating or etching
- H01J37/3056—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching for evaporating or etching for microworking, e. g. etching of gratings or trimming of electrical components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/208—Elements or methods for movement independent of sample stage for influencing or moving or contacting or transferring the sample or parts thereof, e.g. prober needles or transfer needles in FIB/SEM systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/304—Controlling tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/317—Processing objects on a microscale
- H01J2237/3174—Etching microareas
- H01J2237/31745—Etching microareas for preparing specimen to be viewed in microscopes or analyzed in microanalysers
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Plasma & Fusion (AREA)
- Toxicology (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361865929P | 2013-08-14 | 2013-08-14 | |
| US61/865929 | 2013-08-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104374633A CN104374633A (zh) | 2015-02-25 |
| CN104374633B true CN104374633B (zh) | 2019-04-09 |
Family
ID=51301214
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410396562.2A Active CN104374633B (zh) | 2013-08-14 | 2014-08-13 | 在样本制备期间从tem样本拆下探针 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10053768B2 (enExample) |
| EP (1) | EP2837926B1 (enExample) |
| JP (1) | JP6453580B2 (enExample) |
| CN (1) | CN104374633B (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10175295B2 (en) * | 2015-06-25 | 2019-01-08 | Fei Company | Optical nanoprobing of integrated circuits |
| CN105500389A (zh) * | 2016-02-03 | 2016-04-20 | 苏州大学 | 微纳机器人末端执行器自动更换装置 |
| US10401265B1 (en) * | 2018-03-30 | 2019-09-03 | Micron Technology, Inc. | Methods for acquiring planar view stem images of device structures |
| US10410829B1 (en) * | 2018-03-30 | 2019-09-10 | Micron Technology, Inc. | Methods for acquiring planar view stem images of device structures |
| US11972923B2 (en) | 2021-12-31 | 2024-04-30 | Fei Company | Systems and methods for performing sample lift-out for highly reactive materials |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0927880A1 (en) * | 1997-07-22 | 1999-07-07 | Hitachi, Ltd. | Method and apparatus for preparing samples |
| WO2012103534A1 (en) * | 2011-01-28 | 2012-08-02 | Fei Company | Tem sample preparation |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004093353A (ja) * | 2002-08-30 | 2004-03-25 | Seiko Instruments Inc | 試料作製装置 |
| US20070278421A1 (en) * | 2006-04-24 | 2007-12-06 | Gleason K R | Sample preparation technique |
| US7511282B2 (en) * | 2006-05-25 | 2009-03-31 | Fei Company | Sample preparation |
| WO2008051880A2 (en) | 2006-10-20 | 2008-05-02 | Fei Company | Method and apparatus for sample extraction and handling |
| EP2106555B1 (en) | 2006-10-20 | 2015-01-07 | FEI Company | Method for s/tem sample analysis |
| US8835845B2 (en) * | 2007-06-01 | 2014-09-16 | Fei Company | In-situ STEM sample preparation |
| EP2151848A1 (en) | 2008-08-07 | 2010-02-10 | FEI Company | Method of machining a work piece with a focused particle beam |
| US8258473B2 (en) * | 2010-11-12 | 2012-09-04 | Nanotem, Inc. | Method and apparatus for rapid preparation of multiple specimens for transmission electron microscopy |
| US8859963B2 (en) | 2011-06-03 | 2014-10-14 | Fei Company | Methods for preparing thin samples for TEM imaging |
| JP2013057533A (ja) * | 2011-09-07 | 2013-03-28 | Toppan Printing Co Ltd | 試料作製方法および集束イオンビーム加工装置 |
-
2014
- 2014-08-10 JP JP2014163258A patent/JP6453580B2/ja active Active
- 2014-08-11 US US14/456,946 patent/US10053768B2/en active Active
- 2014-08-13 CN CN201410396562.2A patent/CN104374633B/zh active Active
- 2014-08-13 EP EP14180857.6A patent/EP2837926B1/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0927880A1 (en) * | 1997-07-22 | 1999-07-07 | Hitachi, Ltd. | Method and apparatus for preparing samples |
| WO2012103534A1 (en) * | 2011-01-28 | 2012-08-02 | Fei Company | Tem sample preparation |
Also Published As
| Publication number | Publication date |
|---|---|
| JP6453580B2 (ja) | 2019-01-16 |
| US20150075972A1 (en) | 2015-03-19 |
| EP2837926B1 (en) | 2016-06-01 |
| CN104374633A (zh) | 2015-02-25 |
| US10053768B2 (en) | 2018-08-21 |
| JP2015038477A (ja) | 2015-02-26 |
| EP2837926A1 (en) | 2015-02-18 |
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| GR01 | Patent grant | ||
| GR01 | Patent grant |