CN104362141A - High-power crimp-connection type IGBT module - Google Patents
High-power crimp-connection type IGBT module Download PDFInfo
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Abstract
本发明涉及一种大功率压接型IGBT模块,模块由子单元壳体(1)和子单元壳盖组件(2)组成气密性封装壳体。至少一个半导体芯片(1-1)与第一辅助件(1-6)、至少一个第二辅助件(1-2)、至少一个第三辅助件(1-3)形成的夹层结构布置在子单元壳体(1)与子单元壳盖组件(2)之间的气密性壳体内。不少于一个的上述子单元平行排布在模块外壳(3)中形成大功率IGBT模块。本发明涉及的IGBT模块具有低热阻,高可靠性及适于串联使用的优点。
The invention relates to a high-power crimping type IGBT module. The module consists of a subunit casing (1) and a subunit casing cover assembly (2) to form an airtight packaging casing. A sandwich structure formed by at least one semiconductor chip (1-1) and a first auxiliary part (1-6), at least one second auxiliary part (1-2), and at least one third auxiliary part (1-3) is arranged in the sub- In the airtight casing between the unit casing (1) and the subunit casing cover assembly (2). No less than one of the subunits is arranged in parallel in the module case (3) to form a high-power IGBT module. The IGBT module involved in the invention has the advantages of low thermal resistance, high reliability and being suitable for series use.
Description
技术领域technical field
本发明涉及一种大功率半导体器件,具体涉及一种大功率压接型IGBT模块。The invention relates to a high-power semiconductor device, in particular to a high-power crimping type IGBT module.
背景技术Background technique
绝缘栅双极晶体管(Insulate-Gate Bipolar Transistor—IGBT)综合了电力晶体管(GiantTransistor—GTR)和电力场效应晶体管(Power MOSFET)的优点,具有良好的特性,应用领域很广泛;IGBT也是三端器件:栅极,集电极和发射极。IGBT(Insulated Gate BipolarTransistor)是MOS结构双极器件,属于具有功率MOSFET的高速性能与双极的低电阻性能的功率器件。Insulated gate bipolar transistor (Insulate-Gate Bipolar Transistor—IGBT) combines the advantages of power transistor (Giant Transistor—GTR) and power field effect transistor (Power MOSFET), has good characteristics, and has a wide range of applications; IGBT is also a three-terminal device : Gate, Collector and Emitter. IGBT (Insulated Gate Bipolar Transistor) is a bipolar device with MOS structure, which belongs to the power device with high-speed performance of power MOSFET and low resistance performance of bipolar.
由于硅材料承受电压的极限的限制,现有的IGBT器件的最高电压为6500V,而高达几十甚至上百kV电压应用的装置中,IGBT的应用多以串联形式使用,每个阀段需要多达几十只IGBT器件串联,为保证安装,运输过程中的安全性,常常需要施加高达100kN的紧固力,普通的模块及传统的压接式器件很难满足这样的紧固力要求。Due to the limit of the voltage withstand limit of silicon materials, the highest voltage of existing IGBT devices is 6500V, and in devices with voltage applications up to tens or even hundreds of kV, the application of IGBTs is mostly used in series, and each valve section requires multiple Dozens of IGBT devices are connected in series. In order to ensure the safety during installation and transportation, it is often necessary to apply a fastening force of up to 100kN. It is difficult for ordinary modules and traditional crimping devices to meet such fastening force requirements.
大功率IGBT的封装通常有两种形式,一种是底板绝缘模块式封装,由底板,覆铜陶瓷基板,绝缘外壳等组成,芯片背面通过焊料与陶瓷覆铜面焊接,正面通过键合线连接到陶瓷覆铜面,陶瓷覆铜面通过刻蚀形成连接正负电极的不同区域。作为非气密性封装,模块内部通过灌注硅凝胶或环氧树脂等绝缘材料来隔离芯片与外界环境(水,气,灰尘)的接触,但灌注材料通常也隔绝了热量的传递并在长期工作过程中出现隔离效果退化的现象。There are usually two types of packaging for high-power IGBTs. One is the bottom plate insulation module package, which is composed of a bottom plate, a copper-clad ceramic substrate, and an insulating shell. The back of the chip is soldered to the ceramic copper-clad surface by solder, and the front is connected by a bonding wire To the ceramic copper clad surface, the ceramic copper clad surface is etched to form different areas connecting the positive and negative electrodes. As a non-hermetic package, insulating materials such as silicone gel or epoxy resin are poured inside the module to isolate the contact between the chip and the external environment (water, air, dust), but the potting material usually also isolates the heat transfer and will last for a long time. During the working process, the isolation effect degrades.
另外一种为类晶闸管,平板压接式封装,由陶瓷管壳及铜电极组成,芯片与电极通过压力接触。全压接IGBT封装由上下电极配合多层材料与硅片实现全压接式接触,消除了因焊接疲劳导致的器件失效。The other is a thyristor-like, flat crimp package, which is composed of a ceramic shell and copper electrodes, and the chip and the electrodes are in contact with pressure. The full crimp IGBT package realizes full crimp contact with the silicon wafer by the upper and lower electrodes and multi-layer materials, which eliminates device failure caused by welding fatigue.
在传统的压接式功率器件设计中,因为要满足芯片的无焊接连接需求,芯片往往直接通过压力接触与电极连接,并考虑到热膨胀系数(CTE)与硅片的匹配,选择钼作为辅助件安装在芯片与电极之间。器件的紧固力受到芯片承受压力极限的限制,不可能过大,否则会损坏芯片。In the design of traditional press-fit power devices, in order to meet the requirements of the chip's non-solder connection, the chip is often directly connected to the electrode through pressure contact, and considering the matching of the coefficient of thermal expansion (CTE) with the silicon chip, molybdenum is selected as an auxiliary part Installed between chip and electrode. The fastening force of the device is limited by the pressure limit of the chip, and it cannot be too large, otherwise the chip will be damaged.
发明内容Contents of the invention
针对现有技术的不足,本发明的目的是提供一种大功率压接型IGBT模块,其中的半导体芯片在子单元壳体内得到气密性加惰性气体的保护,避免了芯片受到水汽、灰尘等外界条件沾污导致的失效,同时增加了芯片上下辅助件间的电弧的影响。Aiming at the deficiencies of the prior art, the object of the present invention is to provide a high-power crimping type IGBT module, in which the semiconductor chip is protected by airtightness and inert gas in the subunit housing, so as to prevent the chip from being exposed to water vapor, dust, etc. The failure caused by the contamination of external conditions also increases the influence of the arc between the upper and lower auxiliary parts of the chip.
本发明的目的是采用下述技术方案实现的:The object of the present invention is to adopt following technical scheme to realize:
本发明提供一种大功率压接型IGBT模块,所述模块为垂直叠层式封装结构,其改进之处在于:所述模块包括子单元壳体1、子单元壳盖组件2和模块外壳3;由子单元壳体1和子单元壳盖组件2通过冷压焊封装形成子单元,模块外壳3内沿轴向设有数量不少于1个的子单元;子单元在垂直方向与模块外壳3活动连接;所述子单元壳体1内填充惰性气体,如氮气,并通过与子单元壳盖组件2间的压力焊接实现气密性封装。The present invention provides a high-power crimping type IGBT module, the module is a vertical stacked packaging structure, the improvement is that: the module includes a subunit housing 1, a subunit housing cover assembly 2 and a module housing 3 ;The subunit housing 1 and the subunit housing cover assembly 2 are packaged by cold pressure welding to form a subunit, and the module housing 3 is provided with not less than one subunit along the axial direction; the subunit moves with the module housing 3 in the vertical direction Connection; the subunit casing 1 is filled with an inert gas, such as nitrogen, and is airtightly sealed by pressure welding with the subunit casing cover assembly 2 .
进一步地,所述子单元在垂直方向与模块外壳3有相对位移,其距离为2-3mm。Further, the subunit has a relative displacement with the module casing 3 in the vertical direction, and the distance is 2-3mm.
进一步地,所述子单元壳体1包括半导体芯片1-1、第二辅助件1-2、第三辅助件1-3、电极凸台1-4、子单元外壳1-5和第一辅助件1-6;Further, the subunit casing 1 includes a semiconductor chip 1-1, a second auxiliary part 1-2, a third auxiliary part 1-3, an electrode boss 1-4, a subunit casing 1-5 and a first auxiliary part. pieces 1-6;
所述第一辅助件1-6、半导体芯片1-1、第二辅助件1-2和第三辅助件1-3从上到下依次叠放在框架1-8内,所述框架1-8通过压力接触安装于电极凸台1-4上;所述电极凸台1-4与子单元外壳1-5通过壳体法兰1-7连接。The first auxiliary part 1-6, the semiconductor chip 1-1, the second auxiliary part 1-2 and the third auxiliary part 1-3 are sequentially stacked in the frame 1-8 from top to bottom, and the frame 1- 8 is installed on the electrode boss 1-4 through pressure contact; the electrode boss 1-4 is connected with the subunit shell 1-5 through the shell flange 1-7.
进一步地,所述第一辅助件1-6和第三辅助件1-3采用与硅材料热膨胀系数相近的金属材质;所述第一辅助件1-6和第三辅助件1-3的形状均为方形薄片,厚度均为1-2mm;Further, the first auxiliary part 1-6 and the third auxiliary part 1-3 are made of a metal material with a thermal expansion coefficient close to that of the silicon material; the shape of the first auxiliary part 1-6 and the third auxiliary part 1-3 All are square sheets with a thickness of 1-2mm;
所述第二辅助件1-2采用具有高延展性及高电导率的金属片;The second auxiliary part 1-2 adopts a metal sheet with high ductility and high electrical conductivity;
所述子单元外壳1-5采用绝缘材料。The subunit housing 1-5 is made of insulating material.
进一步地,所述与硅材料热膨胀系数相近的金属材质包括钨、钼或合金;所述具有高延展性及高电导率的金属片包括铝或银;所述绝缘材料包括陶瓷或环氧树脂复合材料。Further, the metal material with a thermal expansion coefficient close to that of silicon material includes tungsten, molybdenum or alloy; the metal sheet with high ductility and high conductivity includes aluminum or silver; the insulating material includes ceramic or epoxy resin composite Material.
进一步地,所述子单元壳盖组件2包括子单元盖凸台2-1、热管散热器2-2、弹簧组件2-3、顶板电极2-4、定位框架2-5和盖法兰2-6;Further, the subunit cover assembly 2 includes a subunit cover boss 2-1, a heat pipe radiator 2-2, a spring assembly 2-3, a top plate electrode 2-4, a positioning frame 2-5 and a cover flange 2 -6;
所述子单元凸台2-1、弹簧组件2-3与顶板电极2-4通过定位框架2-5装配成一体,在所述子单元凸台2-1和弹簧组件2-3之间设置热管散热器2-2;The subunit boss 2-1, the spring assembly 2-3 and the top plate electrode 2-4 are assembled into one body through the positioning frame 2-5, and are arranged between the subunit boss 2-1 and the spring assembly 2-3 Heat pipe radiator 2-2;
所述盖法兰2-6焊接在子单元凸台2-1上,所述盖法兰2-6通过冷压焊与壳体法兰1-7形成气密性子单元。The cover flange 2-6 is welded on the subunit boss 2-1, and the cover flange 2-6 forms an airtight subunit with the housing flange 1-7 through cold pressure welding.
进一步地,所述弹簧组件2-3一端与顶板电极2-4铆接,一端与子单元盖凸台2-1压接,并通过定位框架2-5与子单元凸台2-1定位;Further, one end of the spring assembly 2-3 is riveted with the top plate electrode 2-4, one end is crimped with the subunit cover boss 2-1, and is positioned with the subunit boss 2-1 by the positioning frame 2-5;
所述热管散热器2-2蒸发端与子单元盖凸台2-1通过凸台上的定位槽焊接定位。The evaporating end of the heat pipe radiator 2-2 and the boss 2-1 of the subunit cover are welded and positioned through the positioning grooves on the boss.
进一步地,所述模块外壳3由外壳壳体3-1和外壳盖3-2通过粘接组成;所述外壳壳体3-1和外壳盖3-2端面均有可使顶板电极2-4和电极凸台1-4在垂直方向移动的孔。Further, the module housing 3 is composed of the housing shell 3-1 and the housing cover 3-2 by bonding; and electrode bosses 1-4 to move in the vertical direction.
进一步地,不少于1个子单元通过外壳壳体3-1和外壳盖3-2上的孔安装入外壳壳体3-1;Further, no less than one subunit is installed into the housing shell 3-1 through the holes on the housing shell 3-1 and the shell cover 3-2;
所述电极凸台1-4外端面与顶板电极2-4外端面,在非工作状态分别伸出壳体端面0.5mm~3mm;在工作状态受压力作用下,与壳体端面水平。The outer end surface of the electrode boss 1-4 and the outer end surface of the top plate electrode 2-4 respectively protrude from the end surface of the housing by 0.5 mm to 3 mm in the non-working state; they are horizontal to the end surface of the housing under pressure in the working state.
进一步地,所述模块的电流通路由子单元壳盖组件2到子单元壳体1的垂直方向流动;所述模块安装紧固力由模块外壳3与子单元壳盖组件2共同承受,最大安装紧固力为100kN。Further, the current path of the module flows from the subunit cover assembly 2 to the subunit housing 1 in the vertical direction; the module installation fastening force is jointly borne by the module housing 3 and the subunit cover assembly 2, and the maximum installation The fastening force is 100kN.
与最接近的现有技术比,本发明的优异效果是:Compared with the closest prior art, the excellent effect of the present invention is:
1.本发明提供的大功率压接型IGBT模块为全压接式接触,消除了键合及焊接疲劳导致器件失效的因素。1. The high-power crimping type IGBT module provided by the present invention is a full crimping contact, which eliminates the factors that cause device failure due to bonding and welding fatigue.
2.本发明借助子单元壳盖组件2,实现芯片1-1的双面散热及芯片的压力控制。2. The present invention realizes double-sided heat dissipation of the chip 1-1 and pressure control of the chip by means of the subunit cover assembly 2 .
3.本发明借助子单元壳盖组件2及模块外壳3的装配方式,由二者共同承受外部紧固力,实现整体模块大紧固力安装的要求。3. The present invention utilizes the assembling method of the subunit case cover assembly 2 and the module case 3 to jointly bear the external fastening force, so as to realize the requirement of large fastening force installation of the whole module.
4.本发明提供的大功率压接型IGBT模块,其中芯片1-1为气密性封装,避免了外界的水汽,灰尘等污染,同时增加了芯片上下辅助件间的电弧的影响,提高了器件的长期使用可靠性。4. In the high-power crimping type IGBT module provided by the present invention, the chip 1-1 is airtightly packaged, which avoids external water vapor, dust and other pollution, and at the same time increases the influence of the arc between the upper and lower auxiliary parts of the chip, improving the long-term reliability of the device.
5.本发明提供的大功率压接型IGBT模块借助不同子单元在垂直方向的安装位置,实现多种电路拓扑结构的压接型IGBT模块。5. The high-power crimping IGBT module provided by the present invention realizes crimping IGBT modules with various circuit topologies by virtue of the installation positions of different subunits in the vertical direction.
6.本发明涉及的IGBT模块具有低热阻,高可靠性及适于串联使用的优点。6. The IGBT module involved in the present invention has the advantages of low thermal resistance, high reliability and being suitable for series use.
附图说明Description of drawings
图1是本发明提供的大功率压接型IGBT模块的剖面结构图,其中:1-子单元壳体;2-子单元壳盖组件;3-模块外壳;Fig. 1 is a cross-sectional structure diagram of a high-power crimping type IGBT module provided by the present invention, wherein: 1-subunit housing; 2-subunit housing cover assembly; 3-module housing;
图2是本发明提供模块的子单元壳体剖视图,其中:1-1—IGBT或FRD芯片;1-2—第二辅助件;1-3—第三辅助件;1-4—电极凸台;1-5—子单元外壳;1-6—第一辅助件;1-7—壳体法兰;1-8—框架;Fig. 2 is a sectional view of the subunit housing of the module provided by the present invention, wherein: 1-1—IGBT or FRD chip; 1-2—second auxiliary part; 1-3—third auxiliary part; 1-4—electrode boss ; 1-5—subunit shell; 1-6—first auxiliary part; 1-7—housing flange; 1-8—frame;
图3是本发明提供模块的子单元壳盖组件剖视图,其中:2-1—子单元盖凸台;2-2—热管散热器;2-3—弹簧组件;2-4—顶板电极;2-5—定位框架;2-6—盖法兰;Fig. 3 is a cross-sectional view of the subunit shell cover assembly of the module provided by the present invention, wherein: 2-1—subunit cover boss; 2-2—heat pipe radiator; 2-3—spring assembly; 2-4—top plate electrode; 2 -5—positioning frame; 2-6—cover flange;
图4是本发明提供的模块外壳外形示意图;Fig. 4 is a schematic diagram of the appearance of the module shell provided by the present invention;
图5是本发明提供的模块外壳剖视图,其中:3-1—外壳壳体;3-2—外壳盖。Fig. 5 is a sectional view of the module housing provided by the present invention, wherein: 3-1—the housing shell; 3-2—the housing cover.
具体实施方式Detailed ways
下面结合附图对本发明的具体实施方式作进一步的详细说明。The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings.
本发明提供一种大功率压接型IGBT模块,所述模块为垂直叠层式封装结构,大功率压接型IGBT模块的剖面结构图如图1所示,包括子单元壳体1、子单元壳盖组件2和模块外壳3;由子单元壳体1和子单元壳盖组件2通过冷压焊封装形成子单元,不少于1个的子单元顺序排布装配于模块外壳3内,子单元在垂直方向与模块外壳3发生相对位移,距离为2-3mmThe present invention provides a high-power crimping type IGBT module, the module is a vertical laminated packaging structure, the cross-sectional structure diagram of the high-power crimping IGBT module is shown in Figure 1, including a subunit housing 1, a subunit The shell cover assembly 2 and the module shell 3; the subunit shell 1 and the subunit shell cover assembly 2 are encapsulated by cold pressure welding to form a subunit, and no less than one subunit is arranged and assembled in the module shell 3 in sequence, and the subunit is in There is a relative displacement with the module shell 3 in the vertical direction, and the distance is 2-3mm
模块的电流通路由子单元壳盖组件2到子单元壳体1的垂直方向流动;所述模块安装紧固力由模块外壳3与子单元壳盖组件2共同承受,最大安装紧固力为100kN。The current path of the module flows from the subunit case cover assembly 2 to the subunit case 1 in the vertical direction; the module installation fastening force is jointly borne by the module case 3 and the subunit case cover assembly 2, and the maximum installation fastening force is 100kN .
所述子单元壳体1包括半导体芯片1-1、第二辅助件1-2、第三辅助件1-3、电极凸台1-4、子单元外壳1-5和第一辅助件1-6;至少一个半导体芯片1-1与第一辅助件1-6、至少一个第二辅助件1-2、至少一个第三辅助件1-3形成的夹层结构布置在子单元壳体1与子单元壳盖组件2之间的气密性壳体内。子单元壳体剖视图如图2所示。The subunit housing 1 includes a semiconductor chip 1-1, a second auxiliary part 1-2, a third auxiliary part 1-3, an electrode boss 1-4, a subunit housing 1-5 and a first auxiliary part 1- 6; The sandwich structure formed by at least one semiconductor chip 1-1 and the first auxiliary part 1-6, at least one second auxiliary part 1-2, and at least one third auxiliary part 1-3 is arranged between the subunit housing 1 and the subunit housing 1. In the airtight casing between the unit case cover assembly 2. The sectional view of the subunit housing is shown in Figure 2.
所述第一辅助件1-6、半导体芯片1-1、第二辅助件1-2和第三辅助件1-3从上到下依次叠放在框架1-8内,所述框架1-8通过压力接触安装于电极凸台1-4上;所述电极凸台1-4与子单元外壳1-5通过壳体法兰1-7连接。The first auxiliary part 1-6, the semiconductor chip 1-1, the second auxiliary part 1-2 and the third auxiliary part 1-3 are sequentially stacked in the frame 1-8 from top to bottom, and the frame 1- 8 is installed on the electrode boss 1-4 through pressure contact; the electrode boss 1-4 is connected with the subunit shell 1-5 through the shell flange 1-7.
所述第一辅助件1-6和第三辅助件1-3采用与硅材料热膨胀系数相近的金属材质,包括钨、钼或其他合金;所述第一辅助件1-6和第三辅助件1-3的形状均为方形薄片,厚度均为1-2mm;The first auxiliary part 1-6 and the third auxiliary part 1-3 are made of a metal material with a thermal expansion coefficient close to that of silicon material, including tungsten, molybdenum or other alloys; the first auxiliary part 1-6 and the third auxiliary part The shapes of 1-3 are all square sheets, and the thickness is 1-2mm;
第二辅助件1-2采用具有高延展性及高电导率的金属片,包括铝或银;The second auxiliary part 1-2 adopts a metal sheet with high ductility and high electrical conductivity, including aluminum or silver;
子单元外壳1-5采用绝缘材料,如陶瓷或环氧树脂复合材料。The subunit shells 1-5 are made of insulating materials, such as ceramics or epoxy resin composite materials.
所述子单元壳盖组件2包括子单元盖凸台2-1、热管散热器2-2、弹簧组件2-3、顶板电极2-4、定位框架2-5和盖法兰2-6;子单元壳盖组件剖视图如图3所示。The subunit cover assembly 2 includes a subunit cover boss 2-1, a heat pipe radiator 2-2, a spring assembly 2-3, a top plate electrode 2-4, a positioning frame 2-5 and a cover flange 2-6; The cross-sectional view of the subunit shell cover assembly is shown in Figure 3.
所述子单元凸台2-1、弹簧组件2-3与顶板电极2-4通过定位框架2-5装配成一体,在所述子单元凸台2-1和弹簧组件2-3之间设置至少6根热管散热器2-2;The subunit boss 2-1, the spring assembly 2-3 and the top plate electrode 2-4 are assembled into one body through the positioning frame 2-5, and are arranged between the subunit boss 2-1 and the spring assembly 2-3 At least 6 heat pipe radiators 2-2;
所述盖法兰2-6焊接在子单元凸台2-1上,所述盖法兰2-6通过冷压焊与壳体法兰1-7形成气密性子单元,即子单元壳体1和子单元壳盖组件2通过壳体法兰1-7与盖法兰2-6间的冷压焊接实现子单元的气密性封装。The cover flange 2-6 is welded on the subunit boss 2-1, and the cover flange 2-6 forms an airtight subunit with the shell flange 1-7 through cold pressure welding, that is, the subunit shell 1 and the subunit shell cover assembly 2 realize the airtight packaging of the subunit through cold pressure welding between the shell flange 1-7 and the cover flange 2-6.
弹簧组件2-3一端与顶板电极2-4铆接,一端与子单元盖凸台2-1压接,并通过定位框架2-5与子单元凸台2-1定位;One end of the spring component 2-3 is riveted with the top plate electrode 2-4, one end is crimped with the subunit cover boss 2-1, and is positioned with the subunit boss 2-1 by the positioning frame 2-5;
所述热管散热器2-2蒸发端与子单元盖凸台2-1通过凸台上的定位槽焊接定位。The evaporating end of the heat pipe radiator 2-2 and the boss 2-1 of the subunit cover are welded and positioned through the positioning grooves on the boss.
模块外壳3由外壳壳体3-1和外壳盖3-2通过粘接组成;所述外壳壳体3-1和外壳盖3-2端面均有可使顶板电极2-4和电极凸台1-4在垂直方向移动的孔。模块外壳外形示意图及其剖视图分别如图4和5所示。The module shell 3 is composed of the shell shell 3-1 and the shell cover 3-2 through bonding; the end faces of the shell shell 3-1 and the shell cover 3-2 are provided so that the top plate electrode 2-4 and the electrode boss 1 -4 holes that move in the vertical direction. The schematic diagram of the module shell and its cross-sectional view are shown in Figures 4 and 5, respectively.
不少于1个子单元通过外壳壳体3-1和外壳盖3-2上的孔安装外壳壳体3-1;No less than one subunit is installed on the shell shell 3-1 through the holes on the shell shell 3-1 and the shell cover 3-2;
所述电极凸台1-4外端面与顶板电极2-4外端面,在非工作状态分别伸出壳体端面0.5mm~3mm;在工作状态受压力作用下,与壳体端面水平。The outer end surface of the electrode boss 1-4 and the outer end surface of the top plate electrode 2-4 respectively protrude from the end surface of the housing by 0.5 mm to 3 mm in the non-working state; they are horizontal to the end surface of the housing under pressure in the working state.
子单元壳体1内填充惰性气体,如氮气,并通过与子单元壳盖组件2间的压力焊接实现气密性封装。The subunit casing 1 is filled with an inert gas, such as nitrogen, and is airtightly sealed by pressure welding with the subunit casing cover assembly 2 .
本发明的使半导体芯片工作在气密加惰性气体保护的空间中,同时由弹簧组件及模块外壳共同承受来自使用者的大到100kN的紧固力。The invention makes the semiconductor chip work in the airtight and inert gas-protected space, and at the same time, the spring component and the module shell jointly bear the fastening force of up to 100kN from the user.
本发明的子单元壳盖组件2在为半导体芯片提供弹性压接力的同时,由热管结构将热量从子单元盖凸台2-1传导至顶板电极2-4,并最终传导至散热器,实现半导体芯片的双面散热。The subunit shell cover assembly 2 of the present invention provides elastic crimping force for the semiconductor chip, and conducts heat from the subunit cover boss 2-1 to the top plate electrode 2-4 by the heat pipe structure, and finally conducts heat to the heat sink to realize Double-sided cooling of semiconductor chips.
最后应当说明的是:以上实施例仅用以说明本发明的技术方案而非对其限制,尽管参照上述实施例对本发明进行了详细的说明,所属领域的普通技术人员依然可以对本发明的具体实施方式进行修改或者等同替换,这些未脱离本发明精神和范围的任何修改或者等同替换,均在申请待批的本发明的权利要求保护范围之内。Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit them. Although the present invention has been described in detail with reference to the above embodiments, those of ordinary skill in the art can still implement the present invention Any modification or equivalent replacement that does not deviate from the spirit and scope of the present invention is within the protection scope of the claims of the pending application of the present invention.
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