CN104335032B - 使用组合的x射线荧光和拉曼光谱法的样品分析 - Google Patents

使用组合的x射线荧光和拉曼光谱法的样品分析 Download PDF

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CN104335032B
CN104335032B CN201380028486.3A CN201380028486A CN104335032B CN 104335032 B CN104335032 B CN 104335032B CN 201380028486 A CN201380028486 A CN 201380028486A CN 104335032 B CN104335032 B CN 104335032B
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sample
ray
data
optical
raman
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CN104335032A (zh
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M·A·汉密尔顿
S·派尔莱克
R·A·克罗康贝
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Thermo Scientific Portable Analytical Instruments Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

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  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201380028486.3A 2012-05-31 2013-05-09 使用组合的x射线荧光和拉曼光谱法的样品分析 Active CN104335032B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/485,194 2012-05-31
US13/485,194 US8982338B2 (en) 2012-05-31 2012-05-31 Sample analysis
PCT/US2013/040266 WO2013180922A1 (en) 2012-05-31 2013-05-09 Sample analysis using combined x-ray fluorescence and raman spectroscopy

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CN104335032A CN104335032A (zh) 2015-02-04
CN104335032B true CN104335032B (zh) 2017-07-04

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US (1) US8982338B2 (enExample)
EP (1) EP2856125B1 (enExample)
JP (1) JP6378173B2 (enExample)
CN (1) CN104335032B (enExample)
AU (1) AU2013267828C1 (enExample)
CA (1) CA2874319C (enExample)
IN (1) IN2014DN10388A (enExample)
WO (1) WO2013180922A1 (enExample)

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US11796493B2 (en) 2020-04-17 2023-10-24 Shandong University System and method for identifying lithology based on images and XRF mineral inversion

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JP6378173B2 (ja) 2018-08-22
CN104335032A (zh) 2015-02-04
WO2013180922A1 (en) 2013-12-05
US8982338B2 (en) 2015-03-17
JP2015519571A (ja) 2015-07-09
CA2874319A1 (en) 2013-12-05
EP2856125A1 (en) 2015-04-08
EP2856125B1 (en) 2020-07-01
CA2874319C (en) 2019-02-26
AU2013267828C1 (en) 2016-08-25
IN2014DN10388A (enExample) 2015-08-14
US20130321793A1 (en) 2013-12-05
WO2013180922A9 (en) 2015-04-02
AU2013267828A1 (en) 2014-12-11
AU2013267828B2 (en) 2016-04-21

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