CN103926527A - Digital circuit board self-diagnosis system and method based on feature compression technique - Google Patents
Digital circuit board self-diagnosis system and method based on feature compression technique Download PDFInfo
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Abstract
The invention discloses a digital circuit board self-diagnosis system based on the feature compression technique. The digital circuit board self-diagnosis system based on the feature compression technique comprises a test vector generating module, a space compression module, a time compression module and a diagnosis module, wherein test vectors are added to N modules to be tested of a circuit board respectively through the test vector generating module, so that test response K*K-order square matrix data are obtained; the test response K*K-order square matrix data are added according to phase modes through the space compression module, so that 2K odd-even check values are obtained; time compression is conducted on the 2K odd-even check values through the time compression module so that a line detection value and a row detection value are obtained; the line detection value and the row detection value are compared with a prestored standard line detection value and a prestored standard row detection value respectively through the diagnosis module, and the position information of a corresponding faulted module is displayed according to the line detection value and the row detection value when the line detection value and the row detection value are not equal to the prestored standard line detection value and the prestored standard row detection value respectively. The invention further provides a digital circuit board self-diagnosis method based on the feature compression technique.
Description
Technical field
The present invention relates to the Fault of Integrated Circuits diagnostic test technologies field in electric system, particularly a kind of digital circuit board self-diagnosable system and method based on Feature Compression technology.
Background technology
Along with the increasingly complex of digital device, for providing from detection or self-diagnostic function, user seems more and more important.In various digital devices, the combinational circuit of multimode blocking occupies significant proportion, and sequential circuit can be converted into combinational circuit analysis after some is processed.
Yet because the integrated level of VLSI is more and more higher, thereby depending merely on method that test generates, to detect the fault of LSI and VLSI chip very difficult.
Summary of the invention
In view of this, be necessary to provide a kind of digital circuit board self-diagnosable system based on Feature Compression technology, digital circuit board self-diagnosable system that should be based on Feature Compression technology can accurately detect the malfunctioning module in the circuit board of multimode blocking.
Also be necessary to provide a kind of digital circuit board self-diagnosing method based on Feature Compression technology, digital circuit board self-diagnosing method that should be based on Feature Compression technology can accurately detect the malfunctioning module in the circuit board of multimode blocking.
A kind of digital circuit board self-diagnosable system based on Feature Compression technology, should be applied in the circuit board of multimode blocking by the digital circuit board self-diagnosable system based on Feature Compression technology, should comprise test vector generation module, space compression module, time compression module, memory module, diagnostic module by the digital circuit board self-diagnosable system based on Feature Compression technology.Memory module is for storing the standard row eigenwert of row feature of circuit board and the standard row eigenwert of the row feature in the circuit board of reflection multimode blocking of reflection multimode blocking; Test vector generation module, for after being connected with the module to be measured of circuit board, is added in test vector respectively in N module to be measured, to obtain test response K*K rank square formation data; Space compression module, for respectively each row of test response K*K rank square formation data and each row being carried out to step-by-step exclusive-OR, obtains 2K parity values, and wherein, 2K parity values is the function of time; Time compression module is for carrying out 2K parity values time compression to obtain row detected value, row detected value; Diagnostic module compares for standard row eigenwert, the standard row eigenwert of row detected value, row detected value and storage that time compression module is provided, when standard row eigenwert, the standard row eigenwert of the detected value of relatively going on a journey, row detected value and storage is unequal, the positional information that shows corresponding malfunctioning module according to row detected value, row detected value, positional information is the number of the row and column in the circuit board of malfunctioning module place.
A digital circuit board self-diagnosing method based on Feature Compression technology, comprises the following steps:
The standard row eigenwert of the row feature in the standard row eigenwert of the row feature in the circuit board of storage reflection multimode blocking and the circuit board of reflection multimode blocking;
Be connected with the module to be measured in circuit board, test vector is added in respectively in N module to be measured, to obtain test response K*K rank square formation data;
Respectively each row in the square formation data of test response K*K rank and each row are carried out to step-by-step exclusive-OR, and obtain 2K parity values, wherein, 2K parity values is the function of time;
2K parity values carried out to time compression to obtain row detected value, row detected value;
The standard row eigenwert of row detected value, row detected value and storage, standard row eigenwert are compared, when standard row eigenwert, the standard row eigenwert of the detected value of relatively going on a journey, row detected value and storage is unequal, the positional information that shows corresponding malfunctioning module according to row detected value, row detected value, positional information is the number of the row and column in the circuit board of malfunctioning module place.
Utilize the invention described above to relate generally to a kind of digital circuit board self-diagnosis technology based on Feature Compression technology, this method can realize the single module fault on circuit board and be positioned at colleague and the multimode fault of same column is made accurate location, and can be located in a less interval for other multimode failure condition, thereby for also not thering is good diagnostic result colleague or the less situation of malfunctioning module number of same column.The method has larger Feature Compression ratio, and the effect having had for the more circuit boards of number of modules, applicable to the more complex digital system of number of modules.
Accompanying drawing explanation
Accompanying drawing 1 is the functional block diagram of the digital circuit board self-diagnosable system based on Feature Compression technology of a better embodiment.
Accompanying drawing 2 is test response square formations.
Accompanying drawing 3 is digital circuit board self-diagnosing method process flow diagrams based on Feature Compression technology of a better embodiment.
In figure: the digital circuit board self-diagnosable system 10 based on Feature Compression technology, test vector generation module 20, space compression module 30, time compression module 40, memory module 50, diagnostic module 60, the digital circuit board self-diagnosing method step S300～S305 based on Feature Compression technology.
Embodiment
The present invention carries out, from detecting and self diagnosis, can solving well searching problem of malfunctioning module to circuit board by the method for Feature Compression, the following specifically describes scheme provided by the invention:
As shown in Figure 1, digital circuit board self-diagnosable system 10 based on Feature Compression technology, should be applied in the circuit board of multimode blocking by the digital circuit board self-diagnosable system 10 based on Feature Compression technology, it comprises test vector generation module 20, space compression module 30, time compression module 40, memory module 50, diagnostic module 60.
Memory module 50 is for storing the standard row eigenwert of row feature of circuit board and the standard row eigenwert of the row feature in the circuit board of reflection multimode blocking of reflection multimode blocking.
Referring to Fig. 2, test vector generation module 20, for after being connected with the module to be measured of circuit board, is added in test vector respectively in N module to be measured, to obtain test response K*K rank square formation data, wherein,, K=[
]+1, [] represents to round, y
ijtest data for modules in N module to be measured.
Space compression module 30, for respectively each row of test response K*K rank square formation data and each row being carried out to step-by-step exclusive-OR, obtains 2K parity values, and wherein, 2K parity values is the function of time.In the present embodiment, space compression module 30 is ranks parity values maker.
Time compression module 40 is for carrying out 2K parity values time compression to obtain row detected value, row detected value.Wherein, time compression module 40 comprises 2K MISR(feature register), ranks parity values maker is sent into 2K parity values in a corresponding 2K MISR and is carried out time compression, for example, the 1st parity values is the parity values of the 1st row, the 1st MISR is the corresponding feature register of row, the 1st parity values correspondence sent in the 1st MISR, the 2nd parity values is the parity values of the 1st row, the 2nd MISR is the corresponding feature register of row, the 2nd parity values correspondence sent in the 2nd MISR, that is, belonging to capable corresponding the sending into of detected value belongs in capable MISR, corresponding the sending into of detected value that belongs to row belongs in the MISR of row, after Preset Time, in each MISR, obtain the row detected value of corresponding row or the row detected value of respective column.
Diagnostic module 60 compares for standard row eigenwert, the standard row eigenwert of row detected value, row detected value and storage that time compression module 40 is provided, when standard row eigenwert, the standard row eigenwert of the detected value of relatively going on a journey, row detected value and storage is unequal, the positional information that shows corresponding malfunctioning module according to row detected value, row detected value, positional information is the number of the row and column in the circuit board of malfunctioning module place; Diagnostic module 60 for when the detected value of relatively going on a journey, row detected value equate with standard row eigenwert, the standard row eigenwert of storage, is exported default circuit board non-fault information by also.
Please refer to Fig. 3, the digital circuit board self-diagnosing method based on Feature Compression technology, comprises the following steps:
Step S300, the standard row eigenwert of the row feature in the standard row eigenwert of the row feature in the circuit board of storage reflection multimode blocking and the circuit board of reflection multimode blocking.
Step S301, is connected with the module to be measured in circuit board, and test vector is added in respectively in N module to be measured, to obtain test response K*K rank square formation data.
Step S302, carries out step-by-step exclusive-OR to each row in the square formation data of test response K*K rank and each row respectively, obtains 2K parity values, and wherein, 2K parity values is the function of time.
Step S303, carries out time compression to obtain row detected value, row detected value by 2K parity values.Step S303 is specially: 2K MISR(feature register is set), 2K parity values sent in a corresponding 2K MISR and carried out time compression, for example, the 1st parity values is the parity values of the 1st row, the 1st MISR is the corresponding feature register of row, the 1st parity values correspondence sent in the 1st MISR, the 2nd parity values is the parity values of the 1st row, the 2nd MISR is the corresponding feature register of row, the 2nd parity values correspondence sent in the 2nd MISR, that is, belonging to capable corresponding the sending into of detected value belongs in capable MISR, corresponding the sending into of detected value that belongs to row belongs in the MISR of row, after Preset Time, in each MISR, obtain the row detected value of corresponding row or the row detected value of respective column.
Step S304, the standard row eigenwert of row detected value, row detected value and storage, standard row eigenwert are compared, when standard row eigenwert, the standard row eigenwert of the detected value of relatively going on a journey, row detected value and storage is unequal, the positional information that shows corresponding malfunctioning module according to row detected value, row detected value, positional information is the number of the row and column in the circuit board of malfunctioning module place.
Step S305, when the detected value of relatively going on a journey, row detected value equate with standard row eigenwert, the standard row eigenwert of storage, exports default circuit board non-fault information.
Claims (7)
1. the digital circuit board self-diagnosable system based on Feature Compression technology, should be applied in the circuit board of multimode blocking by the digital circuit board self-diagnosable system based on Feature Compression technology, it is characterized in that: should comprise test vector generation module, space compression module, time compression module, memory module, diagnostic module by the digital circuit board self-diagnosable system based on Feature Compression technology; Memory module is for storing the standard row eigenwert of row feature of circuit board and the standard row eigenwert of the row feature in the circuit board of reflection multimode blocking of reflection multimode blocking; Test vector generation module, for after being connected with the module to be measured of circuit board, is added in test vector respectively in N module to be measured, to obtain test response K*K rank square formation data; Space compression module, for respectively each row of test response K*K rank square formation data and each row being carried out to step-by-step exclusive-OR, obtains 2K parity values, and wherein, 2K parity values is the function of time; Time compression module is for carrying out 2K parity values time compression to obtain row detected value, row detected value; Diagnostic module compares for standard row eigenwert, the standard row eigenwert of row detected value, row detected value and storage that time compression module is provided, when standard row eigenwert, the standard row eigenwert of the detected value of relatively going on a journey, row detected value and storage is unequal, the positional information that shows corresponding malfunctioning module according to row detected value, row detected value, positional information is the number of the row and column in the circuit board of malfunctioning module place.
2. the digital circuit board self-diagnosable system based on Feature Compression technology according to claim 1, is characterized in that: space compression module is ranks parity values maker.
3. the digital circuit board self-diagnosable system based on Feature Compression technology according to claim 2, it is characterized in that: time compression module comprises 2K MISR, ranks parity values maker is sent into 2K parity values in a corresponding 2K MISR and is carried out time compression, after Preset Time, in each MISR, obtain the row detected value of corresponding row or the row detected value of respective column.
4. the digital circuit board self-diagnosable system based on Feature Compression technology according to claim 3, it is characterized in that: diagnostic module for when the detected value of relatively going on a journey, row detected value equate with standard row eigenwert, the standard row eigenwert of storage, is exported default circuit board non-fault information by also.
5. the digital circuit board self-diagnosing method based on Feature Compression technology, comprises the following steps:
The standard row eigenwert of the row feature in the standard row eigenwert of the row feature in the circuit board of storage reflection multimode blocking and the circuit board of reflection multimode blocking;
Be connected with the module to be measured in circuit board, test vector is added in respectively in N module to be measured, to obtain test response K*K rank square formation data;
Respectively each row in the square formation data of test response K*K rank and each row are carried out to step-by-step exclusive-OR, and obtain 2K parity values, wherein, 2K parity values is the function of time;
2K parity values carried out to time compression to obtain row detected value, row detected value;
The standard row eigenwert of row detected value, row detected value and storage, standard row eigenwert are compared, when standard row eigenwert, the standard row eigenwert of the detected value of relatively going on a journey, row detected value and storage is unequal, the positional information that shows corresponding malfunctioning module according to row detected value, row detected value, positional information is the number of the row and column in the circuit board of malfunctioning module place.
6. the digital circuit board self-diagnosing method based on Feature Compression technology according to claim 5, is characterized in that: 2K parity values carried out to time compression and to obtain the step of row detected value, row detected value, be specially:
2K MISR is set;
2K parity values sent in a corresponding 2K MISR and carried out time compression, after Preset Time, in each MISR, obtain the row detected value of corresponding row or the row detected value of respective column.
7. the digital circuit board self-diagnosing method based on Feature Compression technology according to claim 5, it is characterized in that, further comprising the steps of: when the detected value of relatively going on a journey, row detected value equate with standard row eigenwert, the standard row eigenwert of storage, to export default circuit board non-fault information.
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