CN101000367A - System chip test data compression method of block mark - Google Patents
System chip test data compression method of block mark Download PDFInfo
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- CN101000367A CN101000367A CNA2006101560307A CN200610156030A CN101000367A CN 101000367 A CN101000367 A CN 101000367A CN A2006101560307 A CNA2006101560307 A CN A2006101560307A CN 200610156030 A CN200610156030 A CN 200610156030A CN 101000367 A CN101000367 A CN 101000367A
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Abstract
A method for compressing test data of block-labeled system chip utilizes both complete block of data block to be coded and with zero label in compatible to reference data block as well as complete block of data block to coded and with ten label in anti-phase compatible to reference data block simultaneously to dynamically update reference data block in order to increase compatible probability or anti-phase compatible probability of reference data block and data block to be coded.
Description
Technical field
The present invention relates to ic test technique, particularly to System on Chip/SoC (System-on-a-Chip, outer self-test (Built-Out Self-Test, BOST) test data compressing method in the method built SoC).
Technical background
The development of integrated circuit technique make can be in a chip integrated hundreds of millions of device, and can integratedly design and pass through the IP kernel of verifying in advance, as storer, microprocessor, DSP etc.The integrated chip of this diversification has become the integrated system that can handle various information, is called as SOC (system on a chip) or System on Chip/SoC System-on-a-Chip, SoC.SoC greatly reduces system cost, has shortened the design cycle, has accelerated time to market (TTM), but the test of SoC product faces increasing challenge, as:
1, chip testing point is few, and the test point that can directly control or observe is limited, can only test by the limited I/O pin of chip usually, and the chip internal node is difficult to directly control or observe by macroscopical mechanical hook-up.
2, ATE (automatic test equipment) ATE costs an arm and a leg, and the design and fabrication technology speed of development of chip is faster than the design and fabrication technology development of ATE, and the clock frequency of chip has surpassed the frequency of present state-of-the-art ATE, can't carry out the full speed test.
3, amount of test data is big, and IP integrated among the SoC is many more, and required amount of test data is just big more.The capacity that expects the required storer of storage test vector in 2014 is 150 times in 1999, will surpass the storage depth of ATE.
The test of chip has become " bottleneck " of restriction integrated circuit development.Existing a large amount of documents launches research to the method for testing of integrated circuit, and (Built-In Self-Test BIST) and outward builds two kinds of methods of self-test to mainly contain built-in self-test.
Build-in self-test method, dependence chip its other resources is finished the test to chip.The method is embedded in test pattern maker TPG, test process control and test response Function of Evaluation module on the circuit-under-test CUT, has broken away from the dependence to ATE, has reduced testing expense.But since BIST generate be mostly the pseudorandom test vector, exist anti-random fault (Random Resistant Fault, the drawback that RRF), fault coverage is not high so BIST exists, cycle tests is grown during test usually.Though can or adopt the methods such as BIST of mixed mode further to improve testing efficiency by weighting, along with the expansion of circuit scale, RRF increases, the hardware spending that pay will significantly increase.
Build self-test method outward and be called the test source partitioning technology again, the method is stored in required test vector among the ATE through overcompression, and test period is applied to its reduction on the circuit-under-test by the decompression circuit on the sheet.It is that some test resources are moved into the chip from ATE equally, and the purpose that reduce amount of test data to reach, shortens the test duration can guarantee to reduce the requirement to ATE under the constant situation of test mass.This method does not need to understand tested design, and (Design Under Test, concrete inner structure DUT) can well protect the intellectual property, thereby has obtained using widely.
Because the singularity of SoC test data, a good test source partitioning technology need be made balance aspect three of compressibility, decoding hardware spending and control protocols.Classic methods has the coding method based on the distance of swimming, based on the coding method of statistics with based on the coding method of dictionary.Coding method based on the distance of swimming has: Golomb sign indicating number, FDR sign indicating number, EFDR sign indicating number, alternate code, alternately coding method such as continuation code, but these class methods all exist problems such as control protocol complexity; Coding method based on statistics has: select Huffman encoding, elongated Huffman encoding, but these class methods exist the decompression hardware expense big, problems such as decode procedure complexity; Coding method based on dictionary has: LZ77, LZ78, LZW etc., but that these class methods need be stored the dictionary expense is big, and a large amount of elongated index makes decoding very complicated simultaneously.
Summary of the invention
The present invention is for avoiding above-mentioned existing in prior technology weak point, the system chip test data compression method of a kind of mark is provided, it is a kind of test data compressing method of non-intrusion type, need not to change tested circuit structure, especially the structure of scan chain in the circuit, at first compatible or anti-phase compatible is carried out mark and reduce data volume, use XOR to increase piece perhaps anti-phase compatible probability mutually simultaneously, to reduce the memory capacity of required test data, shorten test application time.
The technical scheme that technical solution problem of the present invention is adopted is:
The characteristics of the system chip test data compression method of piece mark of the present invention are:
With the 0 mark monoblock data to be encoded piece compatible with the reference data piece, with 10 marks and the anti-phase compatible monoblock data to be encoded piece of reference data piece, dynamically updating the reference data piece simultaneously increases reference data piece and the perhaps anti-phase mutually compatible probability of data to be encoded piece, and concrete steps are:
A, employing automatic test pattern generate (ATPG) instrument, generate the complete test set T that determines;
B, by data designated block length k with test set T piecemeal, if the not enough k of last piece of test vector position is filled into the k position with don't-care bit (don ' t-care bits), every is designated as B in order
1, B
2, B
3, B
4, B
5... B
m, initialization reference data piece R and data to be encoded piece B
n(n is an integer, 2≤n≤m), even R=B
1, B
n=B
2
C, cataloged procedure are judged reference data piece R and data to be encoded piece B
nWhether perhaps anti-phase compatible mutually, if R and B
nCompatible, then with B
nBe encoded to 0, step-by-step simultaneously is with R and B
nIntersect (R ∩ B
n) dynamically update reference data piece R, if R and B
nAnti-phase compatible, then with B
nBe encoded to 10, simultaneously with the anti-phase back of R (
) step-by-step will
With B
nIntersect (
) dynamically update reference data piece R, if R and B
nBoth incompatible, also not anti-phase compatible, then with B
nBe encoded to 11B
n, carry out step-by-step XOR (R B simultaneously
n) operation dynamically updates the don't-care bit among reference data piece R and the increase R, thereby increase R and the perhaps anti-phase mutually compatible probability of subsequent block;
If d, trace-back process are R and B
nCompatible, then use B
n=R ∩ B
nDynamically update data to be encoded piece B
n, if R and B
nAnti-phase compatible, then use
Dynamically update data to be encoded piece B
n, reducing n gradually, repeating step d is until B
n=B
1
E, repeating step c and steps d if still exist don't-care bit in the coding this moment, are then filled these don't-care bits until all data blocks are all encoded at random.
The characteristics of the inventive method also are:
Include don't-care bit " X " in the test vector among the described test set T, and don't-care bit need account for 35%～95% of test set total bit.
Data to be encoded piece compatible with the reference data piece among the described step c comes label coding with 1; The data to be encoded piece oppositely compatible with the reference data piece comes label coding with 2.
The method that dynamically updates the reference data piece among the described step c is, increases the don't-care bit of data in the reference data piece earlier by xor operation, recalls according to follow-up label coding result and comes reactionary slogan, anti-communist poster reference data piece and the don't-care bit in the coded data block in the past.
The inventive method is by dynamically updating the reference data piece, increase data to be encoded piece and the perhaps anti-phase mutually compatible probability of reference data piece, by the method for mark compatible or anti-phase compatible being compressed.
Compared with the prior art, beneficial effect of the present invention is embodied in:
The present invention is by coming the mark monoblock data to be encoded piece compatible with the reference data piece with 0 in cataloged procedure, come mark and the anti-phase compatible monoblock data to be encoded piece of reference data piece with 10, promptly replace the data to be encoded piece compatible with the reference data piece with 1, replace and the anti-phase compatible data to be encoded piece of reference data piece with 2, having finished monoblock data to 1 or 2 positions changes, thereby realized data compression, improve reference data piece and the perhaps anti-phase mutually compatible probability of data to be encoded piece by dynamically updating the reference data piece simultaneously, not only reduce the test duration in a large number, also reduced the memory capacity of required test data.
Description of drawings
Fig. 1 is for coding of the present invention and recall process flow diagram.
Fig. 2 is for coding of the present invention and recall example schematic, and wherein, Fig. 2 (a) is the original complete test set synoptic diagram behind the piecemeal; Fig. 2 (b) is coding and trace-back process synoptic diagram.
Fig. 3 is a final decompress(ion) structural representation of the present invention.
By the following examples, and in conjunction with the accompanying drawings the present invention is further described
Embodiment
Implementing the present invention carries out as follows:
1, adopts automatic test pattern to generate (ATPG) instrument, generate the complete test set T that determines;
2, described complete test set T is carried out the piecemeal mark.At first each test vector among the described complete test set T being pressed one of k position, be divided into continuous k position piece, if the not enough k of last piece position of test vector is filled into the k position with don't-care bit, all is k with the figure place that guarantees final piece, and every is designated as B in order respectively
1, B
2, B
3, B
4, B
5... B
m, initialization reference data piece R and data to be encoded piece B
n(n is an integer, 2≤n≤m), even R=B
1, B
n=B
2
3, cataloged procedure is judged reference data piece R and data to be encoded piece B
nWhether perhaps anti-phase compatible mutually, if R and B
nCompatible, then with B
nBe encoded to 0, step-by-step simultaneously is with R and B
nIntersect (R ∩ B
n) dynamically update reference data piece R, if R and B
nAnti-phase compatible, then with B
nBe encoded to 10, simultaneously with the anti-phase back of R (
) step-by-step will
With B
nIntersect (
) dynamically update reference data piece R, if R and B
nBoth incompatible, also not anti-phase compatible, then with B
nBe encoded to 11B
n, carry out step-by-step XOR (R B simultaneously
n) operation dynamically updates the don't-care bit among reference data piece R and the increase R, thereby increase R and the perhaps anti-phase mutually compatible probability of subsequent block;
In cataloged procedure, come the mark monoblock data to be encoded piece compatible with the reference data piece with 1 bit data, come mark and the anti-phase compatible monoblock data to be encoded piece of reference data piece with 2 bit data, consequently monoblock data in k position are come mark by 1 or 2, have significantly reduced data bits.
4, if trace-back process is R and B
nCompatible, then use B
n=R ∩ B
nDynamically update data to be encoded piece B
n, if R and B
nAnti-phase compatible, then use
Dynamically update data to be encoded piece B
n, reducing n gradually, repeating step d is until B
n=B
1
Trace-back process is just in time opposite with cataloged procedure.At cataloged procedure, in order to increase R and the perhaps anti-phase mutually compatible probability of data to be encoded piece, increase don't-care bit among the R by XOR, therefore need to use trace-back process to come before the reactionary slogan, anti-communist poster value of don't-care bit in the encoding block.
5, repeating step c and steps d if still exist don't-care bit in the coding this moment, are then filled these don't-care bits until all data blocks are all encoded at random.
Determine the generation of test set fully:
Adopt atpg tool to generate the complete test set T that determines, contained test vector can be tested all faults among the test set T fully.To the selection of atpg tool, make the test vector of its generation contain don't-care bit.Following step is exactly that the complete test set T that determines that generates is compressed.
Compatible or anti-phase compatible mark
Compatible or anti-phase compatible mark are that the test set behind the piecemeal is carried out the perhaps anti-phase compatible mark of phase, come the mark k position monoblock data to be encoded piece compatible with 1 bit data with the reference data piece, come mark and the anti-phase compatible k position monoblock data to be encoded piece of reference data piece with 2 bit data, consequently monoblock data in k position can replace with 1 or 2 bit data, thereby reach the purpose of data compression.Exist a large amount of irrelevantly in the test set, make the piece mark become possibility, its piece labeling process as shown in Figure 1, if reference data piece R and data to be encoded piece B
nCompatible, with 0 phase mark, if reference data piece R and data to be encoded B
nAnti-phase compatible, come mark with 10.
The reference data piece dynamically updates
The reference data piece dynamically updates can increase reference data piece and the perhaps anti-phase mutually compatible probability of follow-up k position data to be encoded piece.Its method is the don't-care bit that increases the reference data piece earlier by xor operation, in the process of encoding backward, if reference data piece and follow-up k position data to be encoded piece are perhaps anti-phase mutually when compatible, come the former k position piece of reactionary slogan, anti-communist poster and the don't-care bit of reference data piece by trace-back process again, its trace-back process as shown in Figure 1, if R and B
nCompatible, then use B
1=R ∩ B
1Revise B
1, if R and B
nAnti-phase compatible, then use
Revise B
1, this process lasts till l=1 or R and B always
nBoth incompatible, not anti-phase again compatible.
Fig. 2 (a) and Fig. 2 (b) have provided one and have encoded and recall example.Shown in Fig. 2 (a), test set T is divided into 5 fully, and every block length is 8.During beginning, the content of reference data piece R is 0XXXX1X1, data to be encoded piece B
2Content be XXX1XXX1, therefore the reference data piece is compatible with the data to be encoded piece, the data to be encoded piece is come mark with 0, dynamically updates (R ∩ B
2) content of reference data piece is 0XX1X1X1, again by trace-back process (R ∩ B
2) dynamically update data to be encoded B
1, make its content be: 0XX1X1X1, this process lasts till that always all data to be encoded all are encoded.
Can increase the don't-care bit of reference data piece by XOR, thus reference data piece and the perhaps anti-phase mutually compatible possibility increase of follow-up k position data to be encoded piece, as shown in Figure 2, to B
4When encoding, data to be encoded piece B
4Content be 1XX11X0X, the content 1X00X0X0 of reference data piece R, data to be encoded piece B
4Not only incompatible but also not anti-phase compatible with reference data piece R, use xor operation, with data to be encoded piece B
4With reference data piece R mutually XOR dynamically update reference data piece R, make the content of reference data piece R become 0XX1XXXX, don't-care bit has increased among the reference data piece R, has improved reference data piece R and the perhaps anti-phase mutually compatible probability of follow-up k position data to be encoded piece, as data to be encoded piece B
5R is compatible with the reference data piece.
Can see that from Fig. 2 (b) 40 of raw data have only 22 after the compression, the data behind the coding are: 0X1,111,X10 10 111XX1100X 0, and therefore, test data can be compressed greatly, and test application time can obviously shorten.
Decompression procedure
Decompression procedure as shown in Figure 3.At first, default first reference data piece in circulating register (CSR), Ack is a gating signal, and when the code word of reading in from data_in was " 0 ", exported after the difference k position " 0 " that the output of data_out signal is continuous, and the data among the CSR remain unchanged; When code word was " 10 ", exported after the difference k position " 1 " that the output of data_out signal is continuous, and the data among the CSR are negated by turn; When code word was " 11 ", the data_out logarithmic output signal was according to subsequently continuous k position in the stream, and under the Sel signal controlling, when MUX (MUX) was directly exported this k position, the data among the CSR and its XOR by turn upgraded data among the CSR.Constantly circulation is until data_in no longer imports data to this process, and promptly decompress(ion) finishes.
Claims (4)
1, the system chip test data compression method of a kind of mark, it is characterized in that with the 0 mark monoblock data to be encoded piece compatible with the reference data piece, with 10 marks and the anti-phase compatible monoblock data to be encoded piece of reference data piece, dynamically updating the reference data piece simultaneously increases reference data piece and the perhaps anti-phase mutually compatible probability of data to be encoded piece, and concrete steps are:
A, employing automatic test pattern generate (ATPG) instrument, generate the complete test set T that determines;
B, by data designated block length k with complete test set T piecemeal, if the not enough k of last piece of test vector position is filled into the k position with don't-care bit, every is designated as B in order
1, B
2, B
3, B
4, B
5... B
m, initialization reference data piece R and data to be encoded piece B
n(n is an integer, 2≤n≤m), even R=B
1, B
n=B
2
C, cataloged procedure are judged reference data piece R and data to be encoded piece B
nWhether perhaps anti-phase compatible mutually, if R and B
nCompatible, then with B
nBe encoded to 0, step-by-step simultaneously is with R and B
nIntersect (R ⌒ B
n) dynamically update reference data piece R, if R and B
nAnti-phase compatible, then with B
nBe encoded to 10, simultaneously with the anti-phase back of R (
) step-by-step will
With B
nIntersect
Dynamically update reference data piece R, if R and B
nBoth incompatible, also not anti-phase compatible, then with B
nBe encoded to 11Bn, carry out step-by-step XOR (R B simultaneously
n) operation dynamically updates the don't-care bit among reference data piece R and the increase reference data piece R, thereby increase R and the perhaps anti-phase mutually compatible probability of follow-up data to be encoded piece;
If d, trace-back process are R and B
nCompatible, then use B
n=R ⌒ B
nDynamically update data to be encoded piece B
n, if R and B
nAnti-phase compatible, then use
Dynamically update data to be encoded piece B
n, reducing n gradually, repeating step d is until B
n=B
1
E, repeating step c and steps d if still exist don't-care bit in the coding this moment, are then filled these don't-care bits until all data blocks are all encoded at random.
2, the system chip test data compression method of according to claim 1 mark it is characterized in that including don't-care bit " X " in the test vector among the described test set T, and don't-care bit need account for 35%～95% of test set total bit.
3, the system chip test data compression method of according to claim 1 mark is characterized in that data to be encoded piece compatible with the reference data piece among the described step c comes label coding with 1; The data to be encoded piece oppositely compatible with the reference data piece comes label coding with 2.
4, the system chip test data compression method of according to claim 1 mark, it is characterized in that the method that dynamically updates the reference data piece among the described step c is, increase earlier the don't-care bit of data in the reference data piece, recall according to follow-up label coding result again and come reactionary slogan, anti-communist poster reference data piece and the don't-care bit in the coded data block in the past by xor operation.
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| CN100516911C CN100516911C (en) | 2009-07-22 |
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