CN109116211A - A kind of segmentation of test and excitation and coding method - Google Patents
A kind of segmentation of test and excitation and coding method Download PDFInfo
- Publication number
- CN109116211A CN109116211A CN201810710712.0A CN201810710712A CN109116211A CN 109116211 A CN109116211 A CN 109116211A CN 201810710712 A CN201810710712 A CN 201810710712A CN 109116211 A CN109116211 A CN 109116211A
- Authority
- CN
- China
- Prior art keywords
- data
- test
- encoded
- segmentation
- excitation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 144
- 230000011218 segmentation Effects 0.000 title claims abstract description 76
- 230000005284 excitation Effects 0.000 title claims abstract description 62
- 238000000034 method Methods 0.000 title claims abstract description 33
- 230000005540 biological transmission Effects 0.000 claims abstract description 11
- 239000012634 fragment Substances 0.000 claims description 57
- 230000003252 repetitive effect Effects 0.000 claims description 4
- 239000013598 vector Substances 0.000 description 7
- 229910002056 binary alloy Inorganic materials 0.000 description 2
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 238000013500 data storage Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 238000005056 compaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M7/00—Conversion of a code where information is represented by a given sequence or number of digits to a code where the same, similar or subset of information is represented by a different sequence or number of digits
- H03M7/02—Conversion to or from weighted codes, i.e. the weight given to a digit depending on the position of the digit within the block or code word
- H03M7/04—Conversion to or from weighted codes, i.e. the weight given to a digit depending on the position of the digit within the block or code word the radix thereof being two
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Analogue/Digital Conversion (AREA)
Abstract
The present invention relates to a kind of segmentation of test and excitation and coding methods.The coding method includes test and excitation segmentation and segment data coding mode；Firstly, every 8 data of each segmentation then according to the compatibility between the test data of each segmentation, are encoded to 5 data by test and excitation progress homogenous segmentations operation.The present invention can reduce test and excitation and input the chip input port quantity for needing to occupy parallel, can also reduce the transmission time of test and excitation.
Description
Technical field
The present invention relates to digital integrated electronic circuit testing fields, especially Design for testability of digital integrated circuits field, and in particular to
A kind of segmentation of test and excitation and coding method.
Background technique
Digital integrated electronic circuit sweep test at this stage is completed all by using the method for automatic test equipment (ATE)
The sweep test of test vector.The test for completing a test vector needs to undergo test and excitation scanning input, test response life
At and test response output three processes.Two principal elements for influencing digit chip testing cost are test data storage overheads
With test application time expense, existing Test Vectors Compression coding method can preferably reduce test data storage overhead,
But it is had some limitations in the quick output facet for rapidly inputting and testing response of test and excitation.Common test vector
Compaction coding method mainly has PR code, Huffman code, FDR code, 9C code, BM code and EFDR code etc., these methods can obtain compared with
Good compression effectiveness, can be effectively reduced the storage overhead of test data.But test vector is completed after compressed encoding
The test of one test vector, the serial input of test and excitation need to occupy the test application time close to 50%.
Based on this, the input for needing to occupy is inputted parallel in order to reduce the transmission time of test and excitation and reduce test and excitation
Port number, the invention proposes a kind of new test and excitation segmentations and coding method, in one or two test period of ATE
It is interior, 8 bit tests can be rapidly input using 5 input ports of chip and are motivated, and test and excitation scanning input is greatly reduced
Clock periodicity.
Summary of the invention
The purpose of the present invention is to provide a kind of segmentations of test and excitation and coding method, this method can reduce test and excitation
The chip input port quantity that parallel input needs to occupy, can also reduce the transmission time of test and excitation.
To achieve the above object, the technical scheme is that a kind of segmentation of test and excitation and coding method, test is swashed
It encourages and carries out homogenous segmentations operation, then, according to the compatibility between the test data of each segmentation, by 8 digits of each segmentation
According to being encoded to 5 data.
It in an embodiment of the present invention, further include after 8 data of each segmentation are encoded to 5 data, using chip
5 input terminals complete 8 bit tests excitation input.
In an embodiment of the present invention, the compatibility definition mode between test data is as follows: by 8 digits of current fragment
Compared according to 8 data with previous segmentation according to position, if if corresponding two data bit is identical or current fragment in
It is promisingxThe data bit of position, then defining the data bit or those data bit has compatibility.
In an embodiment of the present invention, describedxValue will not influence sweep test failure and cover in position i.e. current fragment data
The data bit of lid rate.
In an embodiment of the present invention, the mode for 8 data of each segmentation being encoded to 5 data is as follows:
If the data of test and excitation current fragment are expressed as with 8 datat 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 ,t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Middle n
Data bit has compatibility, andt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 In bexData after the data bit of position is set to 1 are useds 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1
It indicates,t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Data after coding are usede 5 e 4 e 3 e 2 e 1 It indicates, with previous decoded test and excitation segmentation pair
Than the number of data bits that current fragment needs to negate is usedpIt indicates, value range is；
?In the case where, indicate current fragment data and previous decoded data comparison, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data in the digit that needs to negate be 0,e 5 e 4 e 3 It is encoded to 000, in this casee 2 e 1 Value can
To be ignored, it can directly use the decoding data of previous segmentation as the decoding data of current fragment；?The case where
Lower decoding circuit only needs the test period of an ATE；
?In the case where, indicate the data of current fragment compared with the data of previous segmentation, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data in only a needs negate, that is, share 8 kinds of states；When the data hair that current fragment negates
Life existst 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Low four when,e 5 e 4 e 3 001 is encoded to,e 2 e 1 Binary form according tot 4 t 3 t 2 t 1 Position into
Row binary coding；When the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 High four when,e 5 e 4 e 3 It is 010,e 2 e 1 Binary form according tot 8 t 7 t 6 t 5 Position carry out binary coding；?In the case where decoding circuit only need one
The test period of a ATE；
?In the case where, compared with indicating the data that the data of current fragment are segmented with upper one, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data there is multidigit to need inversion operation, in order to reduce the complexity of decoding circuit, with two ATE's
Test period completes the transmission of segment data,e 5 It is arranged to flag bit and regular coding is 1, in first test week of ATE
It will in phasee 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , will in the second period of ATEe 4 e 3 e 2 e 1 It is encoded ass 8 s 7 s 6 s 5 ；
First segmentation of test and excitation it is unified according toThe case where execute coding.
In an embodiment of the present invention, 8 data of each segmentation are encoded to the specific implementation step of 5 data such as
Under:
(1) will be in each segmentation of test and excitationxThe data bit of position sets 1, and calculates the number of fragments of current test stimulus,
WithkIt indicates；
(2) according toThe case where, first segment data of test and excitation is encoded, that is, is updateds 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1
It will for first segment datae 5 It is encoded to 1, it will in first test periode 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , second test
Period wille 4 e 3 e 2 e 1 It is encoded tos 8 s 7 s 6 s 5 ；
(3) it is calculated according to the latter segment datapValue, ifStep (4) are skipped to, ifSkip to step (5)；IfSkip to step (6)；
(4) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 e 4 e 3 It is encoded to 000, go to step (7)；
(5) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 e 4 e 3 001 is encoded to, e 2 e 1 According toFeelings
Condition is encoded, and go to step (7)；
(6) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 It is encoded to 1, it will in first test periode 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , second test period wille 4 e 3 e 2 e 1 It is encoded tos 8 s 7 s 6 s 5 , go to step (7)；
(7) return step (3), repetitive operation, until the last one segmentation, and after the completion of the last one segment encoding, it wille 5 e 4 e 3 It is encoded to 011.
In an embodiment of the present invention, existIn the case where, when the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Low four when,e 2 e 1 Binary form according tot 4 t 3 t 2 t 1 Position carry out binary-coded mode
If are as follows:t 1 To need the position negated, thene 2 e 1 It is 00；Ift 2 To need the position negated, thene 2 e 1 It is 01；Ift 3 Needs negate
Position, thene 2 e 1 It is 10；Ift 4 To need the position negated, thene 2 e 1 It is 11；When the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 High four when,e 2 e 1 Binary form according tot 8 t 7 t 6 t 5 Position carry out binary-coded mode
If are as follows:t 5 To need the position negated, thene 2 e 1 It is 00；Ift 6 To need the position negated, thene 2 e 1 It is 01；Ift 7 Needs negate
Position, thene 2 e 1 It is 10；Ift 8 To need the position negated, thene 2 e 1 It is 11.
Compared to the prior art, the invention has the following advantages: the present invention is before guaranteeing test failure coverage rate
It puts, it is possible to reduce test and excitation inputs the chip input port quantity for needing to occupy parallel, can also reduce test and excitation
Transmission time.
Detailed description of the invention
Fig. 1 is the method for the present invention flow diagram.
Data compatibility definition mode schematic diagram of the Fig. 2 between adjacent sectional.
Specific embodiment
With reference to the accompanying drawing, technical solution of the present invention is specifically described.
As shown in Figure 1, test and excitation is uniformly divided the present invention provides a kind of segmentation of test and excitation and coding method
Every 8 data of each segmentation then, according to the compatibility between the test data of each segmentation, are encoded to 5 by section operation
Data.
In Fig. 2, incompatible test data is indicated with grey between adjacent sectional, compatible test number between adjacent sectional
It is indicated according to white.
Test and excitation is carried out homogenous segmentations operation, then, according to each point by a kind of segmentation of test and excitation and coding method
8 data of each segmentation are encoded to 5 data by the compatibility between the test data of section.
It in an embodiment of the present invention, further include after 8 data of each segmentation are encoded to 5 data, using chip
5 input terminals complete 8 bit tests excitation input.
In an embodiment of the present invention, the compatibility definition mode between test data is as follows: by 8 digits of current fragment
Compared according to 8 data with previous segmentation according to position, if if corresponding two data bit is identical or current fragment in
It is promisingxThe data bit of position, then defining the data bit or those data bit has compatibility.
In an embodiment of the present invention, describedxValue will not influence sweep test failure and cover in position i.e. current fragment data
The data bit of lid rate.
In an embodiment of the present invention, the mode for 8 data of each segmentation being encoded to 5 data is as follows:
If the data of test and excitation current fragment are expressed as with 8 datat 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 ,t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Middle n
Data bit has compatibility, andt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 In bexData after the data bit of position is set to 1 are useds 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1
It indicates,t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Data after coding are usede 5 e 4 e 3 e 2 e 1 It indicates, with previous decoded test and excitation segmentation pair
Than the number of data bits that current fragment needs to negate is usedpIt indicates, value range is；
?In the case where, indicate current fragment data and previous decoded data comparison, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data in the digit that needs to negate be 0,e 5 e 4 e 3 It is encoded to 000, in this casee 2 e 1 Value can
To be ignored, it can directly use the decoding data of previous segmentation as the decoding data of current fragment；?The case where
Lower decoding circuit only needs the test period of an ATE；
?In the case where, indicate the data of current fragment compared with the data of previous segmentation, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data in only a needs negate, that is, share 8 kinds of states；When the data hair that current fragment negates
Life existst 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Low four when,e 5 e 4 e 3 001 is encoded to,e 2 e 1 Binary form according tot 4 t 3 t 2 t 1 Position into
Row binary coding；When the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 High four when,e 5 e 4 e 3 It is 010,e 2 e 1 Binary form according tot 8 t 7 t 6 t 5 Position carry out binary coding；?In the case where decoding circuit only need one
The test period of a ATE；
?In the case where, when the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Low four when,e 2 e 1 's
Binary form according tot 4 t 3 t 2 t 1 Position carry out binary-coded mode are as follows: ift 1 To need the position negated, thene 2 e 1 For
00；Ift 2 To need the position negated, thene 2 e 1 It is 01；Ift 3 To need the position negated, thene 2 e 1 It is 10；Ift 4 Needs negate
Position, thene 2 e 1 It is 11；When the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 High four when,e 2 e 1 Binary system shape
Formula according tot 8 t 7 t 6 t 5 Position carry out binary-coded mode are as follows: ift 5 To need the position negated, thene 2 e 1 It is 00；Ift 6 For
The position for needing to negate, thene 2 e 1 It is 01；Ift 7 To need the position negated, thene 2 e 1 It is 10；Ift 8 To need the position negated, thene 2 e 1
It is 11；
?In the case where, compared with indicating the data that the data of current fragment are segmented with upper one, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data there is multidigit to need inversion operation, in order to reduce the complexity of decoding circuit, with two ATE's
Test period completes the transmission of segment data,e 5 It is arranged to flag bit and regular coding is 1, in first test week of ATE
It will in phasee 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , will in the second period of ATEe 4 e 3 e 2 e 1 It is encoded ass 8 s 7 s 6 s 5 ；
First segmentation of test and excitation it is unified according toThe case where execute coding.
In an embodiment of the present invention, 8 data of each segmentation are encoded to the specific implementation step of 5 data such as
Under:
(1) will be in each segmentation of test and excitationxThe data bit of position sets 1, and calculates the number of fragments of current test stimulus,
WithkIt indicates；
(2) according toThe case where, first segment data of test and excitation is encoded, that is, is updateds 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1
It will for first segment datae 5 It is encoded to 1, it will in first test periode 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , second test
Period wille 4 e 3 e 2 e 1 It is encoded tos 8 s 7 s 6 s 5 ；
(3) it is calculated according to the latter segment datapValue, ifStep (4) are skipped to, ifSkip to step (5)；IfSkip to step (6)；
(4) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 e 4 e 3 It is encoded to 000, go to step (7)；
(5) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 e 4 e 3 001 is encoded to, e 2 e 1 According toFeelings
Condition is encoded, and go to step (7)；
(6) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 It is encoded to 1, it will in first test periode 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , second test period wille 4 e 3 e 2 e 1 It is encoded tos 8 s 7 s 6 s 5 , go to step (7)；
(7) return step (3), repetitive operation, until the last one segmentation, and after the completion of the last one segment encoding, it wille 5 e 4 e 3 It is encoded to 011.
The following are specific implementation processes of the invention.
The technical solution of test and excitation segmentation and coding method of the invention is: firstly, test and excitation has been carried out uniformly
The segmentation width of staged operation, test and excitation is fixed as 8.Secondly, according to the compatibility between the test data of each segmentation,
8 data of each segmentation are encoded to 5 data, within one or two clock cycle of automatic test equipment (ATE), are made
The excitation input of 8 bit tests is completed with 5 input terminals of chip, chip interior increases corresponding decoding circuit, realizes survey
Examination excitation is rapidly input.Below with reference to coding truth table detail parameters technical solution of the present invention:
Test vector is made of test and excitation and test response, and certain data bit in test and excitation, value is 0 or value is
1 will not influence the fault coverage of sweep test, these data bit be known as "x"bits.Test and excitation is after segmentation, Mei Gefen
The data bit width of section is 8, and the data compatibility of this research is defined as follows: by 8 data of current fragment and previous segmentation
8 data compared according to position, if corresponding two bits are identical or the data of current fragment be "x" position, then
This double figures is defined with compatibility.
Staged operation is carried out to test and excitation in such a way that data width is 8, each segment data width is 8,
Can fix after coding using 5 indicates.Assuming that coding before data with "t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 " indicate, after coding
Data with "e 5 e 4 e 3 e 2 e 1 " indicate, "t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 " in "x" position be set to 1 after data use
“s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 " indicate, it is compared with the test data of a upper decoded segmentation, current fragment needs the data negated
Bit quantity is usedpIt indicates, value range is。
?In the case where, compared with indicating the data being segmented with upper one, current fragment "t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 ”8
Position data only have a needs to negate, and share 8 kinds of states.Whene 5 e 4 e 3 The data negated are indicated when being encoded as 3 ' b001
Occur "t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 " low four, usee 2 e 1 Binary form to "t 4 t 3 t 2 t 1 " position carry out binary system volume
Code；Whene 5 e 4 e 3 Indicated when being encoded as 3 ' b010 the data that negate occur "t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 " it is four high, usee 2 e 1 Binary form to "t 8 t 7 t 6 t 5 " position carry out binary coding.Detailed coding mode is as shown in table 1:
In table 1,e 5 e 4 e 3 Presentation code result it is 3 high,e 2 e 1 Low 2 of presentation code result, Clock cycle indicate solution
The clock periodicity measurer that code circuit needs.?In the case where, expression and previous decoded data comparison, current point
The digit that section needs to negate is 0,e 5 e 4 e 3 3 ' b000 are encoded to, in this casee 2 e 1 Value can be ignored, and can directly make
Decoding data of the decoding data being segmented with one as current fragment；
?In the case where, compared with indicating the data being segmented with upper one, 8 data of current fragment have multidigit needs to take
Inverse operations completes the transmission of segment data with the test period of two ATE to reduce the complexity of decoding circuit,e 5 It is set
It is set to flag bit and regular coding is 1, it will in a cycle of ATEe 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , the second of ATE
It will in a periode 4 e 3 e 2 e 1 It is encoded ass 8 s 7 s 6 s 5 .First segmentation of test and excitation it is unified according toThe case where execute volume
Code.Detailed coding mode is as shown in table 2:
Encryption algorithm of the invention is described as follows:
(1) test and excitation it is all "x" position all sets 1, fixed segments data width is 8, calculates point of current test stimulus
Segment number is usedkIt indicates；
(2) according to step (6), first segment data is encoded；
(3) it is calculated according to next segment datapValue, ifStep (4) are skipped to, ifSkip to step (5)；IfSkip to step (6)；
(4) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 , wille 5 e 4 e 3 It is encoded to 3 ' b000；
(5) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 , wille 5 e 4 e 3 3 ' b001 are encoded to, e 2 e 1 It is encoded according to table 1；
(6) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 , wille 5 It is encoded to 1, it will in first test periode 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 ,
Second test period wille 4 e 3 e 2 e 1 It is encoded tos 8 s 7 s 6 s 5 ；
(7) return step (3), repetitive operation will after the completion of the last one segment encodinge 5 e 4 e 3 It is encoded to 3 ' b011；
Illustrate coding method in order to apparent, a detailed test and excitation cataloged procedure is as shown in table 3, the data of each segmentation
Bit wide is 8, shares 16 segmentations.
Test and excitation in table 3 shares 16 segmentations, and each segmentation width is 8, and first segment data is 8 '
B11x00xx1, the whole that first is segmented "x" become 8 ' b11100111 behind position 1, according toMode encode, need
Want two ATE test clock cycles, a cycle handlee 5 1 is encoded to,e 4 e 3 e 2 e 1 Low four of 8 ' b11100111 are encoded to,
Second period wille 5 1 is encoded to,e 4 e 3 e 2 e 1 It is encoded to the four high of 8 ' b11100111.Second segment data is 8 '
B11xxxx01, by the whole of the segmentation "x" become 8 ' b11111101 behind position 1, by second segment data and the first point
Segment data step-by-step comparison, discovery shares 3 data and needs inversion operation, so corresponding, belong toCoding feelings
Condition is encoded according to the coding method of table 2.Third segment data is 8 ' bx1xx11xx, by the whole of the segmentation "x" position
After setting 1,s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 Value be 8 ' b11111111, the data and a upper segment data are compared, discovery only needs
It is rights 2 Carrying out inversion operation can be completed the transmission of test data, belong toThe case where, according to the coding method of table 2 and table 1,
It wille 5 e 4 e 3 001 is encoded to,e 2 e 1 It is encoded to 01.4th segment data is 8 ' bxxx1x1xx, by the whole of the segmentation "x" position
After setting 1,s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 Value be 8 ' b11111111, the data of current fragment and it is upper one segmentation data complete one
It causes, the operative position for not needing to negate belongs toThe case where, it, will according to the coding method of table 2e 5 e 4 e 3 e 2 e 1 It is encoded to 5 '
b000xx.Test and excitation in table 3 shares 16 segmentations, and the coding mode of subsequent segment data is similar with above-mentioned three kinds of situations
Processing.Each segment data bit wide is 8, shares 128 bit test data, needs 128 ATE altogether according to serial transmission mode
Test period uses the coding method of this research, it is only necessary to which 24 ATE test clock cycles are completed, and 81.3% transmission has been saved
Time.
The above are preferred embodiments of the present invention, all any changes made according to the technical solution of the present invention, and generated function is made
When with range without departing from technical solution of the present invention, all belong to the scope of protection of the present invention.
Claims (7)
1. a kind of test and excitation segmentation and coding method, which is characterized in that test and excitation is subjected to homogenous segmentations operation, then,
According to the compatibility between the test data of each segmentation, 8 data of each segmentation are encoded to 5 data.
2. a kind of test and excitation segmentation according to claim 2 and coding method, which is characterized in that further include by each point
After 8 data of section are encoded to 5 data, the input of 8 bit tests excitation is completed using 5 input terminals of chip.
3. a kind of test and excitation segmentation according to claim 2 and coding method, which is characterized in that between test data
Compatibility definition mode is as follows: 8 data of 8 data of current fragment and previous segmentation compared according to position,
If if corresponding two data bit is identical or current fragment in it is promisingxThe data bit of position, then define the data bit or those data
Position has compatibility.
4. a kind of test and excitation segmentation according to claim 3 and coding method, which is characterized in that describedxPosition is i.e. current
Value will not influence the data bit of sweep test fault coverage in segment data.
5. a kind of test and excitation segmentation according to claim 3 and coding method, which is characterized in that by the 8 of each segmentation
The mode that position data are encoded to 5 data is as follows:
If the data of test and excitation current fragment are expressed as with 8 datat 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 ,t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Middle n number
There is compatibility according to position, andt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 In bexData after the data bit of position is set to 1 are useds 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 Table
Show,t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Data after coding are usede 5 e 4 e 3 e 2 e 1 It indicates, is compared with previous decoded test and excitation segmentation,
The number of data bits that current fragment needs to negate is usedpIt indicates, value range is；
?In the case where, indicate current fragment data and previous decoded data comparison, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data in the digit that needs to negate be 0,e 5 e 4 e 3 It is encoded to 000, in this casee 2 e 1 Value can
To be ignored, it can directly use the decoding data of previous segmentation as the decoding data of current fragment；?The case where
Lower decoding circuit only needs the test period of an ATE；
?In the case where, indicate the data of current fragment compared with the data of previous segmentation, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data in only a needs negate, that is, share 8 kinds of states；When the data hair that current fragment negates
Life existst 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Low four when,e 5 e 4 e 3 001 is encoded to,e 2 e 1 Binary form according tot 4 t 3 t 2 t 1 Position into
Row binary coding；When the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 High four when,e 5 e 4 e 3 It is 010,e 2 e 1 Binary form according tot 8 t 7 t 6 t 5 Position carry out binary coding；?In the case where decoding circuit only need one
The test period of a ATE；
?In the case where, compared with indicating the data that the data of current fragment are segmented with upper one, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data there is multidigit to need inversion operation, in order to reduce the complexity of decoding circuit, with two ATE's
Test period completes the transmission of segment data,e 5 It is arranged to flag bit and regular coding is 1, in first test week of ATE
It will in phasee 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , will in the second period of ATEe 4 e 3 e 2 e 1 It is encoded ass 8 s 7 s 6 s 5 ；
First segmentation of test and excitation it is unified according toThe case where execute coding.
6. a kind of test and excitation segmentation according to claim 5 and coding method, which is characterized in that by the 8 of each segmentation
Position data are encoded to 5 data, and the specific implementation steps are as follows:
(1) will be in each segmentation of test and excitationxThe data bit of position sets 1, and calculates the number of fragments of current test stimulus,
WithkIt indicates；
(2) according toThe case where, first segment data of test and excitation is encoded, that is, is updateds 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1
It will for first segment datae 5 It is encoded to 1, it will in first test periode 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , second test
Period wille 4 e 3 e 2 e 1 It is encoded tos 8 s 7 s 6 s 5 ；
(3) it is calculated according to the latter segment datapValue, ifStep (4) are skipped to, ifSkip to step (5)；IfSkip to step (6)；
(4) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 e 4 e 3 It is encoded to 000, go to step (7)；
(5) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 e 4 e 3 001 is encoded to, e 2 e 1 According toThe case where
It is encoded, go to step (7)；
(6) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 It is encoded to 1, it will in first test periode 4 e 3 e 2 e 1
It is encoded tos 4 s 3 s 2 s 1 , second test period wille 4 e 3 e 2 e 1 It is encoded tos 8 s 7 s 6 s 5 , go to step (7)；
(7) return step (3), repetitive operation, until the last one segmentation, and after the completion of the last one segment encoding, it wille 5 e 4 e 3 It is encoded to 011.
7. a kind of test and excitation segmentation according to claim 5 or 6 and coding method, which is characterized in thatFeelings
Under condition, when the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Low four when,e 2 e 1 Binary form according tot 4 t 3 t 2 t 1 Position carry out binary-coded mode are as follows: ift 1 To need the position negated, thene 2 e 1 It is 00；Ift 2 To need to take
Anti- position, thene 2 e 1 It is 01；Ift 3 To need the position negated, thene 2 e 1 It is 10；Ift 4 To need the position negated, thene 2 e 1 It is 11；When
The data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 High four when,e 2 e 1 Binary form according tot 8 t 7 t 6 t 5 's
Position carries out binary-coded mode are as follows: ift 5 To need the position negated, thene 2 e 1 It is 00；Ift 6 To need the position negated, thene 2 e 1 It is 01；Ift 7 To need the position negated, thene 2 e 1 It is 10；Ift 8 To need the position negated, thene 2 e 1 It is 11.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810710712.0A CN109116211B (en) | 2018-07-03 | 2018-07-03 | Test excitation segmentation and coding method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810710712.0A CN109116211B (en) | 2018-07-03 | 2018-07-03 | Test excitation segmentation and coding method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109116211A true CN109116211A (en) | 2019-01-01 |
| CN109116211B CN109116211B (en) | 2020-11-03 |
Family
ID=64822471
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810710712.0A Expired - Fee Related CN109116211B (en) | 2018-07-03 | 2018-07-03 | Test excitation segmentation and coding method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109116211B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109933457A (en) * | 2019-03-08 | 2019-06-25 | 深圳忆联信息系统有限公司 | A kind of data-encoding scheme and its system reducing the SSD bit error rate |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101000367A (en) * | 2006-12-31 | 2007-07-18 | 合肥工业大学 | System chip test data compression method of block mark |
| CN102353894A (en) * | 2011-08-26 | 2012-02-15 | 哈尔滨工业大学 | Method for testing SOC (System On Chip) based on reference vector and bit mask |
-
2018
- 2018-07-03 CN CN201810710712.0A patent/CN109116211B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101000367A (en) * | 2006-12-31 | 2007-07-18 | 合肥工业大学 | System chip test data compression method of block mark |
| CN102353894A (en) * | 2011-08-26 | 2012-02-15 | 哈尔滨工业大学 | Method for testing SOC (System On Chip) based on reference vector and bit mask |
Non-Patent Citations (2)
| Title |
|---|
| 李渊: ""基于游程编码的测试向量压缩方法研究"", 《中国优秀硕士学位论文全文数据库 信息科技辑》 * |
| 郑浏旸: ""基于线性解压结构的低功耗测试方法研究"", 《中国优秀硕士学位论文全文数据库 信息科技辑》 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109933457A (en) * | 2019-03-08 | 2019-06-25 | 深圳忆联信息系统有限公司 | A kind of data-encoding scheme and its system reducing the SSD bit error rate |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109116211B (en) | 2020-11-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110602491B (en) | Intra-frame chroma prediction method, device and equipment and video coding and decoding system | |
| US10585944B2 (en) | Directed graph compression | |
| DE3784266T2 (en) | COMPRESSION OF MULTI-STAGE SIGNALS. | |
| US11537770B2 (en) | Quantum circuit embedding by simulated annealing | |
| CN110162290B (en) | Compression method for DeMURA data of OLED screen | |
| CN112994701A (en) | Data compression method and device, electronic equipment and computer readable medium | |
| US20190236415A1 (en) | Method of classification of an object and system thereof | |
| CN102353894A (en) | Method for testing SOC (System On Chip) based on reference vector and bit mask | |
| CN110620586B (en) | Data compression method and device and terminal equipment | |
| Becher et al. | Normal numbers and finite automata | |
| CN104038232A (en) | Testing data compression and decompression method based on secondary exclusive-or operation | |
| CN112200713A (en) | Business data processing method, device and equipment in federated learning | |
| CN109116211A (en) | A kind of segmentation of test and excitation and coding method | |
| CN110650339A (en) | Video compression method and device and terminal equipment | |
| CN110944212A (en) | Video frame reconstruction method and device and terminal equipment | |
| CN111083479A (en) | Video frame prediction method and device and terminal equipment | |
| EP4390660A1 (en) | Multi-input floating point number processing method and apparatus, processor and computer device | |
| GB2602570A (en) | Selecting encoding options | |
| CN113285720B (en) | Gene data lossless compression method, integrated circuit and lossless compression equipment | |
| CN114490547A (en) | Data compression method, device, equipment and medium | |
| CN104320659A (en) | Background modeling method, device and apparatus | |
| CN111083500A (en) | Video frame reconstruction method and device and terminal equipment | |
| US9615111B2 (en) | Complexity-adaptive compression of color images using binary arithmetic coding | |
| Iqbal et al. | Automatically defined functions for learning classifier systems | |
| Lam | Real-time lossless image compression by dynamic Huffman coding hardware implementation |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20201103 |