CN109116211A - A kind of segmentation of test and excitation and coding method - Google Patents

A kind of segmentation of test and excitation and coding method Download PDF

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CN109116211A
CN109116211A CN201810710712.0A CN201810710712A CN109116211A CN 109116211 A CN109116211 A CN 109116211A CN 201810710712 A CN201810710712 A CN 201810710712A CN 109116211 A CN109116211 A CN 109116211A
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test
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CN109116211B (en
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陈传东
魏榕山
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Fuzhou University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M7/00—Conversion of a code where information is represented by a given sequence or number of digits to a code where the same, similar or subset of information is represented by a different sequence or number of digits
    • H03M7/02—Conversion to or from weighted codes, i.e. the weight given to a digit depending on the position of the digit within the block or code word
    • H03M7/04—Conversion to or from weighted codes, i.e. the weight given to a digit depending on the position of the digit within the block or code word the radix thereof being two

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Abstract

The present invention relates to a kind of segmentation of test and excitation and coding methods.The coding method includes test and excitation segmentation and segment data coding mode；Firstly, every 8 data of each segmentation then according to the compatibility between the test data of each segmentation, are encoded to 5 data by test and excitation progress homogenous segmentations operation.The present invention can reduce test and excitation and input the chip input port quantity for needing to occupy parallel, can also reduce the transmission time of test and excitation.

Description

A kind of segmentation of test and excitation and coding method
Technical field
The present invention relates to digital integrated electronic circuit testing fields, especially Design for testability of digital integrated circuits field, and in particular to A kind of segmentation of test and excitation and coding method.
Background technique
Digital integrated electronic circuit sweep test at this stage is completed all by using the method for automatic test equipment (ATE) The sweep test of test vector.The test for completing a test vector needs to undergo test and excitation scanning input, test response life At and test response output three processes.Two principal elements for influencing digit chip testing cost are test data storage overheads With test application time expense, existing Test Vectors Compression coding method can preferably reduce test data storage overhead, But it is had some limitations in the quick output facet for rapidly inputting and testing response of test and excitation.Common test vector Compaction coding method mainly has PR code, Huffman code, FDR code, 9C code, BM code and EFDR code etc., these methods can obtain compared with Good compression effectiveness, can be effectively reduced the storage overhead of test data.But test vector is completed after compressed encoding The test of one test vector, the serial input of test and excitation need to occupy the test application time close to 50%.
Based on this, the input for needing to occupy is inputted parallel in order to reduce the transmission time of test and excitation and reduce test and excitation Port number, the invention proposes a kind of new test and excitation segmentations and coding method, in one or two test period of ATE It is interior, 8 bit tests can be rapidly input using 5 input ports of chip and are motivated, and test and excitation scanning input is greatly reduced Clock periodicity.
Summary of the invention
The purpose of the present invention is to provide a kind of segmentations of test and excitation and coding method, this method can reduce test and excitation The chip input port quantity that parallel input needs to occupy, can also reduce the transmission time of test and excitation.
To achieve the above object, the technical scheme is that a kind of segmentation of test and excitation and coding method, test is swashed It encourages and carries out homogenous segmentations operation, then, according to the compatibility between the test data of each segmentation, by 8 digits of each segmentation According to being encoded to 5 data.
It in an embodiment of the present invention, further include after 8 data of each segmentation are encoded to 5 data, using chip 5 input terminals complete 8 bit tests excitation input.
In an embodiment of the present invention, the compatibility definition mode between test data is as follows: by 8 digits of current fragment Compared according to 8 data with previous segmentation according to position, if if corresponding two data bit is identical or current fragment in It is promisingxThe data bit of position, then defining the data bit or those data bit has compatibility.
In an embodiment of the present invention, describedxValue will not influence sweep test failure and cover in position i.e. current fragment data The data bit of lid rate.
In an embodiment of the present invention, the mode for 8 data of each segmentation being encoded to 5 data is as follows:
If the data of test and excitation current fragment are expressed as with 8 datat 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 ,t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Middle n Data bit has compatibility, andt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 In bexData after the data bit of position is set to 1 are useds 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It indicates,t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Data after coding are usede 5 e 4 e 3 e 2 e 1 It indicates, with previous decoded test and excitation segmentation pair Than the number of data bits that current fragment needs to negate is usedpIt indicates, value range is；
?In the case where, indicate current fragment data and previous decoded data comparison, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data in the digit that needs to negate be 0,e 5 e 4 e 3 It is encoded to 000, in this casee 2 e 1 Value can To be ignored, it can directly use the decoding data of previous segmentation as the decoding data of current fragment；?The case where Lower decoding circuit only needs the test period of an ATE；
?In the case where, indicate the data of current fragment compared with the data of previous segmentation, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data in only a needs negate, that is, share 8 kinds of states；When the data hair that current fragment negates Life existst 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Low four when,e 5 e 4 e 3 001 is encoded to,e 2 e 1 Binary form according tot 4 t 3 t 2 t 1 Position into Row binary coding；When the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 High four when,e 5 e 4 e 3 It is 010,e 2 e 1 Binary form according tot 8 t 7 t 6 t 5 Position carry out binary coding；?In the case where decoding circuit only need one The test period of a ATE；
?In the case where, compared with indicating the data that the data of current fragment are segmented with upper one, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data there is multidigit to need inversion operation, in order to reduce the complexity of decoding circuit, with two ATE's Test period completes the transmission of segment data,e 5 It is arranged to flag bit and regular coding is 1, in first test week of ATE It will in phasee 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , will in the second period of ATEe 4 e 3 e 2 e 1 It is encoded ass 8 s 7 s 6 s 5 ；
First segmentation of test and excitation it is unified according toThe case where execute coding.
In an embodiment of the present invention, 8 data of each segmentation are encoded to the specific implementation step of 5 data such as Under:
(1) will be in each segmentation of test and excitationxThe data bit of position sets 1, and calculates the number of fragments of current test stimulus, WithkIt indicates；
(2) according toThe case where, first segment data of test and excitation is encoded, that is, is updateds 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It will for first segment datae 5 It is encoded to 1, it will in first test periode 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , second test Period wille 4 e 3 e 2 e 1 It is encoded tos 8 s 7 s 6 s 5 ；
(3) it is calculated according to the latter segment datapValue, ifStep (4) are skipped to, ifSkip to step (5)；IfSkip to step (6)；
(4) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 e 4 e 3 It is encoded to 000, go to step (7)；
(5) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 e 4 e 3 001 is encoded to, e 2 e 1 According toFeelings Condition is encoded, and go to step (7)；
(6) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 It is encoded to 1, it will in first test periode 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , second test period wille 4 e 3 e 2 e 1 It is encoded tos 8 s 7 s 6 s 5 , go to step (7)；
(7) return step (3), repetitive operation, until the last one segmentation, and after the completion of the last one segment encoding, it wille 5 e 4 e 3 It is encoded to 011.
In an embodiment of the present invention, existIn the case where, when the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Low four when,e 2 e 1 Binary form according tot 4 t 3 t 2 t 1 Position carry out binary-coded mode If are as follows:t 1 To need the position negated, thene 2 e 1 It is 00；Ift 2 To need the position negated, thene 2 e 1 It is 01；Ift 3 Needs negate Position, thene 2 e 1 It is 10；Ift 4 To need the position negated, thene 2 e 1 It is 11；When the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 High four when,e 2 e 1 Binary form according tot 8 t 7 t 6 t 5 Position carry out binary-coded mode If are as follows:t 5 To need the position negated, thene 2 e 1 It is 00；Ift 6 To need the position negated, thene 2 e 1 It is 01；Ift 7 Needs negate Position, thene 2 e 1 It is 10；Ift 8 To need the position negated, thene 2 e 1 It is 11.
Compared to the prior art, the invention has the following advantages: the present invention is before guaranteeing test failure coverage rate It puts, it is possible to reduce test and excitation inputs the chip input port quantity for needing to occupy parallel, can also reduce test and excitation Transmission time.
Detailed description of the invention
Fig. 1 is the method for the present invention flow diagram.
Data compatibility definition mode schematic diagram of the Fig. 2 between adjacent sectional.
Specific embodiment
With reference to the accompanying drawing, technical solution of the present invention is specifically described.
As shown in Figure 1, test and excitation is uniformly divided the present invention provides a kind of segmentation of test and excitation and coding method Every 8 data of each segmentation then, according to the compatibility between the test data of each segmentation, are encoded to 5 by section operation Data.
In Fig. 2, incompatible test data is indicated with grey between adjacent sectional, compatible test number between adjacent sectional It is indicated according to white.
Test and excitation is carried out homogenous segmentations operation, then, according to each point by a kind of segmentation of test and excitation and coding method 8 data of each segmentation are encoded to 5 data by the compatibility between the test data of section.
It in an embodiment of the present invention, further include after 8 data of each segmentation are encoded to 5 data, using chip 5 input terminals complete 8 bit tests excitation input.
In an embodiment of the present invention, the compatibility definition mode between test data is as follows: by 8 digits of current fragment Compared according to 8 data with previous segmentation according to position, if if corresponding two data bit is identical or current fragment in It is promisingxThe data bit of position, then defining the data bit or those data bit has compatibility.
In an embodiment of the present invention, describedxValue will not influence sweep test failure and cover in position i.e. current fragment data The data bit of lid rate.
In an embodiment of the present invention, the mode for 8 data of each segmentation being encoded to 5 data is as follows:
If the data of test and excitation current fragment are expressed as with 8 datat 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 ,t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Middle n Data bit has compatibility, andt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 In bexData after the data bit of position is set to 1 are useds 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It indicates,t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Data after coding are usede 5 e 4 e 3 e 2 e 1 It indicates, with previous decoded test and excitation segmentation pair Than the number of data bits that current fragment needs to negate is usedpIt indicates, value range is；
?In the case where, indicate current fragment data and previous decoded data comparison, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data in the digit that needs to negate be 0,e 5 e 4 e 3 It is encoded to 000, in this casee 2 e 1 Value can To be ignored, it can directly use the decoding data of previous segmentation as the decoding data of current fragment；?The case where Lower decoding circuit only needs the test period of an ATE；
?In the case where, indicate the data of current fragment compared with the data of previous segmentation, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data in only a needs negate, that is, share 8 kinds of states；When the data hair that current fragment negates Life existst 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Low four when,e 5 e 4 e 3 001 is encoded to,e 2 e 1 Binary form according tot 4 t 3 t 2 t 1 Position into Row binary coding；When the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 High four when,e 5 e 4 e 3 It is 010,e 2 e 1 Binary form according tot 8 t 7 t 6 t 5 Position carry out binary coding；?In the case where decoding circuit only need one The test period of a ATE；
?In the case where, when the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 Low four when,e 2 e 1 's Binary form according tot 4 t 3 t 2 t 1 Position carry out binary-coded mode are as follows: ift 1 To need the position negated, thene 2 e 1 For 00；Ift 2 To need the position negated, thene 2 e 1 It is 01；Ift 3 To need the position negated, thene 2 e 1 It is 10；Ift 4 Needs negate Position, thene 2 e 1 It is 11；When the data that current fragment negates occurt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 High four when,e 2 e 1 Binary system shape Formula according tot 8 t 7 t 6 t 5 Position carry out binary-coded mode are as follows: ift 5 To need the position negated, thene 2 e 1 It is 00；Ift 6 For The position for needing to negate, thene 2 e 1 It is 01；Ift 7 To need the position negated, thene 2 e 1 It is 10；Ift 8 To need the position negated, thene 2 e 1 It is 11；
?In the case where, compared with indicating the data that the data of current fragment are segmented with upper one, current fragmentt 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 8 data there is multidigit to need inversion operation, in order to reduce the complexity of decoding circuit, with two ATE's Test period completes the transmission of segment data,e 5 It is arranged to flag bit and regular coding is 1, in first test week of ATE It will in phasee 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , will in the second period of ATEe 4 e 3 e 2 e 1 It is encoded ass 8 s 7 s 6 s 5 ；
First segmentation of test and excitation it is unified according toThe case where execute coding.
In an embodiment of the present invention, 8 data of each segmentation are encoded to the specific implementation step of 5 data such as Under:
(1) will be in each segmentation of test and excitationxThe data bit of position sets 1, and calculates the number of fragments of current test stimulus, WithkIt indicates；
(2) according toThe case where, first segment data of test and excitation is encoded, that is, is updateds 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It will for first segment datae 5 It is encoded to 1, it will in first test periode 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , second test Period wille 4 e 3 e 2 e 1 It is encoded tos 8 s 7 s 6 s 5 ；
(3) it is calculated according to the latter segment datapValue, ifStep (4) are skipped to, ifSkip to step (5)；IfSkip to step (6)；
(4) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 e 4 e 3 It is encoded to 000, go to step (7)；
(5) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 e 4 e 3 001 is encoded to, e 2 e 1 According toFeelings Condition is encoded, and go to step (7)；
(6) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 It, will for the latter segment datae 5 It is encoded to 1, it will in first test periode 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , second test period wille 4 e 3 e 2 e 1 It is encoded tos 8 s 7 s 6 s 5 , go to step (7)；
(7) return step (3), repetitive operation, until the last one segmentation, and after the completion of the last one segment encoding, it wille 5 e 4 e 3 It is encoded to 011.
The following are specific implementation processes of the invention.
The technical solution of test and excitation segmentation and coding method of the invention is: firstly, test and excitation has been carried out uniformly The segmentation width of staged operation, test and excitation is fixed as 8.Secondly, according to the compatibility between the test data of each segmentation, 8 data of each segmentation are encoded to 5 data, within one or two clock cycle of automatic test equipment (ATE), are made The excitation input of 8 bit tests is completed with 5 input terminals of chip, chip interior increases corresponding decoding circuit, realizes survey Examination excitation is rapidly input.Below with reference to coding truth table detail parameters technical solution of the present invention:
Test vector is made of test and excitation and test response, and certain data bit in test and excitation, value is 0 or value is 1 will not influence the fault coverage of sweep test, these data bit be known as "x"bits.Test and excitation is after segmentation, Mei Gefen The data bit width of section is 8, and the data compatibility of this research is defined as follows: by 8 data of current fragment and previous segmentation 8 data compared according to position, if corresponding two bits are identical or the data of current fragment be "x" position, then This double figures is defined with compatibility.
Staged operation is carried out to test and excitation in such a way that data width is 8, each segment data width is 8, Can fix after coding using 5 indicates.Assuming that coding before data with "t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 " indicate, after coding Data with "e 5 e 4 e 3 e 2 e 1 " indicate, "t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 " in "x" position be set to 1 after data use “s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 " indicate, it is compared with the test data of a upper decoded segmentation, current fragment needs the data negated Bit quantity is usedpIt indicates, value range is。
?In the case where, compared with indicating the data being segmented with upper one, current fragment "t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 ”8 Position data only have a needs to negate, and share 8 kinds of states.Whene 5 e 4 e 3 The data negated are indicated when being encoded as 3 ' b001 Occur "t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 " low four, usee 2 e 1 Binary form to "t 4 t 3 t 2 t 1 " position carry out binary system volume Code；Whene 5 e 4 e 3 Indicated when being encoded as 3 ' b010 the data that negate occur "t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 " it is four high, usee 2 e 1 Binary form to "t 8 t 7 t 6 t 5 " position carry out binary coding.Detailed coding mode is as shown in table 1:
In table 1,e 5 e 4 e 3 Presentation code result it is 3 high,e 2 e 1 Low 2 of presentation code result, Clock cycle indicate solution The clock periodicity measurer that code circuit needs.?In the case where, expression and previous decoded data comparison, current point The digit that section needs to negate is 0,e 5 e 4 e 3 3 ' b000 are encoded to, in this casee 2 e 1 Value can be ignored, and can directly make Decoding data of the decoding data being segmented with one as current fragment；
?In the case where, compared with indicating the data being segmented with upper one, 8 data of current fragment have multidigit needs to take Inverse operations completes the transmission of segment data with the test period of two ATE to reduce the complexity of decoding circuit,e 5 It is set It is set to flag bit and regular coding is 1, it will in a cycle of ATEe 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , the second of ATE It will in a periode 4 e 3 e 2 e 1 It is encoded ass 8 s 7 s 6 s 5 .First segmentation of test and excitation it is unified according toThe case where execute volume Code.Detailed coding mode is as shown in table 2:
Encryption algorithm of the invention is described as follows:
(1) test and excitation it is all "x" position all sets 1, fixed segments data width is 8, calculates point of current test stimulus Segment number is usedkIt indicates；
(2) according to step (6), first segment data is encoded；
(3) it is calculated according to next segment datapValue, ifStep (4) are skipped to, ifSkip to step (5)；IfSkip to step (6)；
(4) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 , wille 5 e 4 e 3 It is encoded to 3 ' b000；
(5) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 , wille 5 e 4 e 3 3 ' b001 are encoded to, e 2 e 1 It is encoded according to table 1；
(6) it updatess 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 , wille 5 It is encoded to 1, it will in first test periode 4 e 3 e 2 e 1 It is encoded tos 4 s 3 s 2 s 1 , Second test period wille 4 e 3 e 2 e 1 It is encoded tos 8 s 7 s 6 s 5 ；
(7) return step (3), repetitive operation will after the completion of the last one segment encodinge 5 e 4 e 3 It is encoded to 3 ' b011；
Illustrate coding method in order to apparent, a detailed test and excitation cataloged procedure is as shown in table 3, the data of each segmentation Bit wide is 8, shares 16 segmentations.
Test and excitation in table 3 shares 16 segmentations, and each segmentation width is 8, and first segment data is 8 ' B11x00xx1, the whole that first is segmented "x" become 8 ' b11100111 behind position 1, according toMode encode, need Want two ATE test clock cycles, a cycle handlee 5 1 is encoded to,e 4 e 3 e 2 e 1 Low four of 8 ' b11100111 are encoded to, Second period wille 5 1 is encoded to,e 4 e 3 e 2 e 1 It is encoded to the four high of 8 ' b11100111.Second segment data is 8 ' B11xxxx01, by the whole of the segmentation "x" become 8 ' b11111101 behind position 1, by second segment data and the first point Segment data step-by-step comparison, discovery shares 3 data and needs inversion operation, so corresponding, belong toCoding feelings Condition is encoded according to the coding method of table 2.Third segment data is 8 ' bx1xx11xx, by the whole of the segmentation "x" position After setting 1,s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 Value be 8 ' b11111111, the data and a upper segment data are compared, discovery only needs It is rights 2 Carrying out inversion operation can be completed the transmission of test data, belong toThe case where, according to the coding method of table 2 and table 1, It wille 5 e 4 e 3 001 is encoded to,e 2 e 1 It is encoded to 01.4th segment data is 8 ' bxxx1x1xx, by the whole of the segmentation "x" position After setting 1,s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 Value be 8 ' b11111111, the data of current fragment and it is upper one segmentation data complete one It causes, the operative position for not needing to negate belongs toThe case where, it, will according to the coding method of table 2e 5 e 4 e 3 e 2 e 1 It is encoded to 5 ' b000xx.Test and excitation in table 3 shares 16 segmentations, and the coding mode of subsequent segment data is similar with above-mentioned three kinds of situations Processing.Each segment data bit wide is 8, shares 128 bit test data, needs 128 ATE altogether according to serial transmission mode Test period uses the coding method of this research, it is only necessary to which 24 ATE test clock cycles are completed, and 81.3% transmission has been saved Time.
The above are preferred embodiments of the present invention, all any changes made according to the technical solution of the present invention, and generated function is made When with range without departing from technical solution of the present invention, all belong to the scope of protection of the present invention.

Claims (7)

1.一种测试激励分段及编码方法，其特征在于，将测试激励进行均匀分段操作，而后，根据每一分段的测试数据之间的相容性，将每一分段的8位数据编码为5位数据。1. a test excitation segment and coding method, it is characterized in that, test excitation is carried out to even segment operation, then, according to the compatibility between the test data of each segment, the 8 bits of each segment are Data is encoded as 5-bit data. 2.根据权利要求2所述的一种测试激励分段及编码方法，其特征在于，还包括将每一分段的8位数据编码为5位数据后，使用芯片的5个输入端完成8位测试激励的输入。2. a kind of test excitation segment according to claim 2 and coding method, it is characterized in that, also comprise after the 8-bit data of each segment is encoded into 5-bit data, use 5 input ends of chip to complete 8. Bit test stimulus input. 3.根据权利要求2所述的一种测试激励分段及编码方法，其特征在于，测试数据之间的相容性定义方式如下：将当前分段的8位数据和前一个分段的8位数据按照位置进行对比，若对应的两数据位相同或者若当前分段中有为x位的数据位，则定义该数据位或该些数据位具有相容性。3. a kind of test excitation segment according to claim 2 and coding method, it is characterised in that the compatibility definition mode between the test data is as follows: the 8-bit data of the current segment and the 8 bits of the previous segment The bit data is compared according to the position. If the corresponding two data bits are the same or if there are x -bit data bits in the current segment, it is defined that the data bit or these data bits are compatible. 4.根据权利要求3所述的一种测试激励分段及编码方法，其特征在于，所述x位即当前分段数据中取值不会影响扫描测试故障覆盖率的数据位。4 . The test excitation segmentation and coding method according to claim 3 , wherein the x bits are the data bits whose value in the current segment data does not affect the scan test fault coverage ratio. 5 . 5.根据权利要求3所述的一种测试激励分段及编码方法，其特征在于，将每一分段的8位数据编码为5位数据的方式如下：5. a kind of test excitation segment and coding method according to claim 3, is characterized in that, the mode that the 8-bit data of each segment is encoded into 5-bit data is as follows: 设测试激励当前分段的数据用8位数据表示为t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 ，t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 中n个数据位具有相容性，且t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 中为x位的数据位被置1后的数据用s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 表示，t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 编码后的数据用e 5 e 4 e 3 e 2 e 1 表示，与前一个解码后的测试激励分段对比，当前分段需要取反的数据位数量用p表示，其取值范围是；Let the data of the current segment of the test excitation be represented by 8-bit data as n in t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 , t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 The data bits are compatible, and the data bits of the x -bit in t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 are set to 1. The data is used s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 means, t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 coded data is represented by e 5 e 4 e 3 e 2 e 1 , compared with the previous decoded test excitation segment , the number of data bits to be inverted in the current segment is represented by p , and its value range is ; 在 的情况下，表示当前分段的数据与前一个解码后的数据对比，当前分段t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 的8位数据中需要取反的位数为0，e 5 e 4 e 3 编码为000，该情况下的e 2 e 1 取值可以被忽略，可以直接使用前一个分段的解码数据作为当前分段的解码数据；在的情况下解码电路仅需一个ATE的测试周期；exist In the case of , indicating that the data of the current segment is compared with the previous decoded data, the number of bits to be inverted in the 8-bit data of the current segment t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 is 0, e 5 e 4 e 3 is encoded as 000, the value of e 2 e 1 in this case can be ignored, and the decoded data of the previous segment can be directly used as the decoded data of the current segment; In the case of the decoding circuit, only one ATE test cycle is required; 在的情况下，表示当前分段的数据与前一个分段的数据相比，当前分段t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 的8位数据中只有一位需要取反，即共有8种状态；当当前分段取反的数据发生在t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 的低四位时，e 5 e 4 e 3 编码为001，e 2 e 1 的二进制形式根据t 4 t 3 t 2 t 1 的位置进行二进制编码；当当前分段取反的数据发生在t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 的高四位时，e 5 e 4 e 3 为010，e 2 e 1 的二进制形式根据t 8 t 7 t 6 t 5 的位置进行二进制编码；在的情况下解码电路仅需一个ATE的测试周期；exist In the case of , comparing the data of the current segment with the data of the previous segment, only one bit of the 8-bit data of the current segment t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 needs to be inverted , that is, there are 8 states; when the current segmented inversion data occurs in the lower four bits of t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 , e 5 e 4 e 3 is encoded as 001, e The binary form of 2 e 1 is binary coded according to the position of t 4 t 3 t 2 t 1 ; when the current segmented inverted data occurs in the high four of t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 bit, e 5 e 4 e 3 is 010, the binary form of e 2 e 1 is binary coded according to the position of t 8 t 7 t 6 t 5 ; In the case of the decoding circuit, only one ATE test cycle is required; 在 的情况下，表示当前分段的数据与上一个分段的数据相比，当前分段t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 的8位数据有多位需要取反操作，为了减少解码电路的复杂性，用两个ATE的测试周期完成分段数据的传输，e 5 被设置为标志位并固定编码为1，在ATE的第一个测试周期内将e 4 e 3 e 2 e 1 编码为s 4 s 3 s 2 s 1 ，在ATE的第二个周期内将e 4 e 3 e 2 e 1 被编码为s 8 s 7 s 6 s 5 ；exist In the case of , it means that the data of the current segment is compared with the data of the previous segment. There are many bits of the 8-bit data of the current segment t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 that need to be inverted. , in order to reduce the complexity of the decoding circuit, the transmission of segmented data is completed with two test cycles of ATE, e 5 is set as a flag bit and fixedly encoded as 1, and e 4 e 3 is set to e 4 e 3 in the first test cycle of ATE e 2 e 1 is encoded as s 4 s 3 s 2 s 1 , and e 4 e 3 e 2 e 1 is encoded as s 8 s 7 s 6 s 5 in the second cycle of ATE; 测试激励的第一个分段统一按照的情况执行编码。The first segment of the test stimulus is uniformly case to perform encoding. 6.根据权利要求5所述的一种测试激励分段及编码方法，其特征在于，将每一分段的8位数据编码为5位数据的具体实现步骤如下：6. a kind of test excitation segment according to claim 5 and coding method, it is characterised in that the 8-bit data of each segment is encoded as the concrete implementation step of 5-bit data as follows: （1）将测试激励的每一分段中为x位的数据位均置1，并计算当前测试激励的分段数量，用k表示；(1) Set the data bits of x bits in each segment of the test stimulus to 1, and calculate the number of segments of the current test stimulus, which is represented by k ; （2）按照的情况，对测试激励的第一个分段数据进行编码，即更新s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 为第一个分段数据将e 5 编码为1，在第一个测试周期将e 4 e 3 e 2 e 1 编码为s 4 s 3 s 2 s 1 ，第二个测试周期将e 4 e 3 e 2 e 1 编码为s 8 s 7 s 6 s 5 ；(2) According to In the case of , encode the first segment data of the test excitation, that is, update s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 to encode e 5 as 1 for the first segment data. One test cycle encodes e 4 e 3 e 2 e 1 as s 4 s 3 s 2 s 1 , and the second test cycle encodes e 4 e 3 e 2 e 1 as s 8 s 7 s 6 s 5 ; （3）根据后一个分段数据计算p的值，若跳至步骤（4），若跳至步骤（5）；若跳至步骤（6）；(3) Calculate the value of p according to the latter segmented data, if Skip to step (4), if Skip to step (5); if Skip to step (6); （4）更新s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 为后一个分段数据，将e 5 e 4 e 3 编码为000，跳转至步骤（7）；(4) Update s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 to the next segmented data, encode e 5 e 4 e 3 as 000, and jump to step (7); （5）更新s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 为后一个分段数据，将e 5 e 4 e 3 编码为001， e 2 e 1 根据的情况进行编码，跳转至步骤（7）；(5) Update s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 to the next segment data, encode e 5 e 4 e 3 as 001, and e 2 e 1 according to code, and jump to step (7); （6）更新s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 为后一个分段数据，将e 5 编码为1，在第一个测试周期将e 4 e 3 e 2 e 1 编码为s 4 s 3 s 2 s 1 ，第二个测试周期将e 4 e 3 e 2 e 1 编码为s 8 s 7 s 6 s 5 ，跳转至步骤（7）；(6) Update s 8 s 7 s 6 s 5 s 4 s 3 s 2 s 1 to the next segment data, encode e 5 as 1, and encode e 4 e 3 e 2 e 1 in the first test cycle is s 4 s 3 s 2 s 1 , the second test cycle encodes e 4 e 3 e 2 e 1 as s 8 s 7 s 6 s 5 , and jumps to step (7); （7）返回步骤（3），重复操作，直至最后一个分段，并在最后一个分段编码完成后，将e 5 e 4 e 3 编码为011。(7) Return to step (3), repeat the operation until the last segment, and encode e 5 e 4 e 3 as 011 after the encoding of the last segment is completed. 7.根据权利要求5或6所述的一种测试激励分段及编码方法，其特征在于，在的情况下，当当前分段取反的数据发生在t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 的低四位时，e 2 e 1 的二进制形式根据t 4 t 3 t 2 t 1 的位置进行二进制编码的方式为：若t 1 为需要取反的位，则e 2 e 1 为00；若t 2 为需要取反的位，则e 2 e 1 为01；若t 3 为需要取反的位，则e 2 e 1 为10；若t 4 为需要取反的位，则e 2 e 1 为11；当当前分段取反的数据发生在t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 的高四位时，e 2 e 1 的二进制形式根据t 8 t 7 t 6 t 5 的位置进行二进制编码的方式为：若t 5 为需要取反的位，则e 2 e 1 为00；若t 6 为需要取反的位，则e 2 e 1 为01；若t 7 为需要取反的位，则e 2 e 1 为10；若t 8 为需要取反的位，则e 2 e 1 为11。7. a kind of test excitation segmentation and coding method according to claim 5 or 6, is characterized in that, in In the case of , when the current segmented inversion data occurs in the lower four bits of t 8 t 7 t 6 t 5 t 4 t 3 t 2 t 1 , the binary form of e 2 e 1 is based on t 4 t 3 t 2 The binary encoding method for the position of t 1 is: if t 1 is the bit that needs to be inverted, then e 2 e 1 is 00; if t 2 is the bit that needs to be inverted, then e 2 e 1 is 01; if t 3 For the bit that needs to be inverted, then e 2 e 1 is 10; if t 4 is the bit that needs to be inverted, then e 2 e 1 is 11; when the current segment inverted data occurs at t 8 t 7 t 6 t When the upper four bits of 5 t 4 t 3 t 2 t 1 are used, the binary form of e 2 e 1 is binary-coded according to the position of t 8 t 7 t 6 t 5 : if t 5 is the bit that needs to be inverted, Then e 2 e 1 is 00; if t 6 is the bit that needs to be negated, then e 2 e 1 is 01; if t 7 is the bit that needs to be negated, then e 2 e 1 is 10; if t 8 is the bit that needs to be negated If the bit is reversed, e 2 e 1 is 11.
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