CN103870616B - The parameter adjustment system of analog module - Google Patents

The parameter adjustment system of analog module Download PDF

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Publication number
CN103870616B
CN103870616B CN201210529547.1A CN201210529547A CN103870616B CN 103870616 B CN103870616 B CN 103870616B CN 201210529547 A CN201210529547 A CN 201210529547A CN 103870616 B CN103870616 B CN 103870616B
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parameter
module
analog module
register
analog
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CN103870616A (en
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雷冬梅
赵锋
张爱东
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Shanghai Huahong Grace Semiconductor Manufacturing Corp
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Shanghai Huahong Grace Semiconductor Manufacturing Corp
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Abstract

This application discloses a kind of parameter adjustment system of analog module, including built-in self-test module, user function module, highway switching and multiple analog modules.All of analog module has multiple parameters altogether.The built-in self-test module is connected by register access bus with highway switching.The user function module is connected by register access bus with highway switching.It is connected also by register access bus between the highway switching and each analog module.The register access bus is made up of address bus, data/address bus, controlling bus.In the Parameter Modulation system of whole analog module, built-in one or more parameter registers only in each analog module.The quantity of built-in parameter register is the quantity of the parameter that the analog module has in each analog module.Each parameter register has unique register address.The application has that construction standard, area be small, line clearly advantage.

Description

The parameter adjustment system of analog module
Technical field
The application is related to a kind of application specific integrated circuit(ASIC, Application-specific integrated circuit), more particularly to a kind of system for adjusting the parameter of multiple analog modules.
Background technology
Fig. 1 is referred to, this is a kind of parameter adjustment system of existing analog module, including built-in self-test module 10, used Family functional module 20, highway switching 30 and multiple analog modules 40.Five analog modules are exemplarily represented in Fig. 1 40.All of analog module 40 is related to K parameter altogether, and K is the natural number more than 2, and each parameter also has different bit wides. K=9 is exemplarily represented in Fig. 1.
First group of parameter register 11 is built-in with built-in self-test module 10, its quantity is K, and size is corresponded respectively to The K bit wide of parameter, is respectively intended to preserve K parameter.Built-in self-test module 10 is opened by first group of data wire with bus switch 30 are closed to be connected.This first group of quantity of data wire is K, and size corresponds respectively to the K bit wide of parameter, is respectively intended to transmission K parameter.First group of data wire is exemplarily expressed as B1~B9 in Fig. 1.
Second group of parameter register 21 is built-in with user function module 20, its quantity is K, and size is corresponded respectively to The K bit wide of parameter, is respectively intended to preserve K parameter.User function module 20 is opened by second group of data wire with bus switch 30 are closed to be connected.This second group of quantity of data wire is K, and size corresponds respectively to the K bit wide of parameter, is respectively intended to transmission K parameter.Second group of data wire is exemplarily expressed as U1~U9 in Fig. 1.
It is connected by the 3rd group of data wire between highway switching 30 and all of analog module 40.This 3rd group of number It is K according to the quantity of line, size corresponds respectively to the K bit wide of parameter, is respectively intended to transmit K parameter.In Fig. 1 exemplarily 3rd group of data wire is expressed as P1~P9.But only have L radicals between highway switching 30 and each analog module 40 It is connected according to line, L is the quantity of the parameter involved by the analog module 40,1≤L≤K.
Bit wide in Fig. 1 per data lines is all represented by square brackets, after preceding one digit number subtracts rear one digit number in square brackets, Along with 1 being exactly the bit wide of the data lines.For example, [3:0] represent that bit wide is 4 bits.
The parameter adjustment system of the existing analog module shown in Fig. 1 has as a drawback that:
First, the bit wide of the quantity K of the parameter that is related to altogether of all analog modules, each parameter can be with analog module Quantity, type etc. and change.Change every time is accomplished by reconnecting three groups of data wires, the quantity that changes two groups of registers and big Small, adjustment highway switching inside switching circuit, causes connection complicated, error-prone, is unfavorable for standardization.
Second, respectively having one group of parameter register in built-in testing module and user function module, there is redundancy.
Third, highway switching is used for being switched between three groups of data wires, every group of data wire has K roots, when K's When value is larger, the switching circuit inside highway switching will become extremely complex.
The content of the invention
Technical problems to be solved in this application are to provide a kind of parameter adjustment system of analog module, clear in structure and face Product is smaller.
In order to solve the above technical problems, the parameter adjustment system of the application analog module includes built-in self-test module, user Functional module, highway switching and multiple analog modules;All of analog module has multiple parameters altogether;
The built-in self-test module is connected by register access bus with highway switching;
The user function module is connected by register access bus with highway switching;
It is connected also by register access bus between the highway switching and each analog module;
The register access bus is made up of address bus, data/address bus, controlling bus;
In the Parameter Modulation system of whole analog module, built-in one or more parameter registers only in each analog module Device;The quantity of built-in parameter register is the quantity of the parameter that the analog module has in each analog module;Each ginseng Number register all has unique register address.
Compared with the parameter adjustment system of existing analog module, the Stability Analysis of Structures of each module is no longer influenced by institute to the application There is the influence that the quantity K of the parameter involved by analog module and the bit wide of each parameter change, be conducive to standardization.And The parameter register of redundancy is reduced, cost has not only been saved, and reduce circuit area.For different type and quantity Analog module, the line relation between each module is simple, clear.
Brief description of the drawings
Fig. 1 is the structural representation of the parameter adjustment system of existing analog module;
Fig. 2 is the structural representation of the parameter adjustment system of the application analog module.
Description of reference numerals in figure:
10 is built-in self-test module;11 is first group of parameter register;20 is user function module;21 is second group of parameter Register;30 is highway switching;40 is analog module.
Specific embodiment
Fig. 2 is referred to, the parameter adjustment system of the application analog module includes built-in self-test module 10, user function module 20th, highway switching 30 and multiple analog modules 40.Five analog modules 40 are exemplarily represented in Fig. 2.All of mould Intend module 40 and be related to K parameter altogether, K is the natural number more than 2, and each parameter also has different bit wides.It is exemplary in Fig. 2 Represent K=9.
The parameter that the built-in testing module 10 is mainly used in test mode to each analog module 40 is adjusted, and surveys Output of the examination analog module 40 under relevant parameter, the final optimum working parameter for determining analog module 40.Built-in self-test module 10 generally also carry out other tests to each analog module 40.There is no parameter-embedded register in built-in self-test module 10.It is built-in Module of testing oneself 10 is connected by register access bus with highway switching 30.
The user function module 20 is used under non-test, mode, and corresponding parameter is set simultaneously to each analog module 40 According to the logic function normal work of design.Also without parameter-embedded register in user function module 20.User function mould Block 20 is connected by register access bus with highway switching 30.
It is connected also by register access bus between the highway switching 30 and each analog module 40.Bus Switching switch 30 is used to switch the register access bus of built-in testing module 10 and the register access of user function module 20 Bus, makes one of both be connected with the register access bus of each analog module 40.
The register access bus includes address bus, data/address bus, controlling bus.Preferably, the position of address bus A width of M, its maximum address 2 that can be representedM- 1 necessary >=maximum register address.The bit wide of data/address bus is N, and N is necessary The Breadth Maximum of >=parameter register.Controlling bus bit wide be 3 bits, including 1 bit reading writing signal line, the read-write of 1 bit The clock cable of gating signal line, 1 bit.
The analog module 40 be, for example, voltage control module, clock oscillator module etc., it is necessary to external input parameter with Control circuit inside adjustment analog module 40, makes the output of analog module 40 meet design requirement.In each analog module 40 In built-in L parameter register, L is the quantity of the parameter involved by the analog module 40,1≤L≤K.This L parameter register Size L parameter corresponding respectively to involved by the analog module 40, and be respectively intended to transmit this L parameter.All simulations The quantity summation of the parameter register in module 40 is K.These parameter registers provide the circuit work when institute of analog module 40 The parameter of needs.And these parameters can be read or be changed by the read-write of parameter register.Access to parameter register It is written and read using address, data, controlling bus access mode.Each parameter register corresponds to one uniquely in system Location.The L values of each analog module 40 can with difference, in Fig. 2 exemplarily by the L corresponding to five analog modules 40 on to Under be expressed as 2,1,2,2,2.
The parameter adjustment system of the analog module shown in Fig. 2 has two kinds of mode of operations:Test pattern and non-test, mode.
In test mode, tester table sends instruction to each simulation by the serial communication interface of built-in testing module 10 Module 40 carries out parameter adjustment and test.Now, register access bus of the highway switching 30 built-in testing module 10 Coupled together with each analog module 40.Built-in testing module 10 is read different parameter registers by different addresses Write, so as to control analog module 40 to be operated under different parameters.Built-in testing module 10 is generally built-in with to analog module 40 Test function module, it is possible to achieve the adjustment and setting of optimal parameter under the various states of system.
Under non-test, mode, highway switching 30 is connected to the register access bus of user function module 20 respectively Analog module 40.User function module 20 directly can be written and read according to different addresses to each parameter register.
Compared with the parameter adjustment system of existing analog module, the application has the following advantages that:
First, all no longer parameter-embedded register in built-in self-test module 10 and user function module 20, this cause this two The Stability Analysis of Structures of individual module, the quantity K of the parameter being no longer influenced by involved by all analog modules and the bit wide of each parameter become The influence of change, thus be conducive to standardization.
Second, two groups of parameter registers script being built in built-in self-test module 10 and user function module 20, change It is, by the built-in parameter register related to oneself of each analog module 40, to which reduce the parameter register of redundancy, not only Cost is saved, and has reduced circuit area.
Third, be connected by register access bus between each module and highway switching 30, register access Bus is made up of three parts --- address bus, data/address bus, controlling bus --- fixed.No matter analog module quantity, How type changes, and all without the switching circuit inside influence highway switching 30, nor affects on the deposit between each module Device accesses the annexation of bus.
Fourth, generally having a memory in the parameter adjustment system of the analog module(It is not shown), wherein store through Each parameter value of the analog module crossed after calibration.When each analog module works under these Parameter Conditions, state is optimal. When upper electric, system is firstly the need of reading the optimized parameter in the memory and be assigned to corresponding analog module.As a result of Register access bus structures, each uniquely parameter register address corresponds respectively to a parameter.System can while with Most fast speed reads optimized parameter from the memory, while being written to corresponding parameter register by register access bus In device, so as to reduce decoding treatment process and time, the correct setting of analog parameter after electricity is quickly completed, system is reached rapidly To normal operating conditions.
The preferred embodiment of the application is these are only, is not used to limit the application.Come for those skilled in the art Say, the application there can be various modifications and variations.It is all any modifications within spirit herein and principle, made, equivalent Replace, improve etc., should be included within the protection domain of the application.

Claims (6)

1. a kind of parameter adjustment system of analog module, including built-in self-test module, user function module, highway switching and Multiple analog modules;All of analog module has multiple parameters altogether;It is characterized in that:
The built-in self-test module is connected by register access bus with highway switching;
The user function module is connected by register access bus with highway switching;
It is connected also by register access bus between the highway switching and each analog module;
The register access bus is made up of address bus, data/address bus, controlling bus;
In the Parameter Modulation system of whole analog module, built-in one or more parameter registers only in each analog module; The quantity of built-in parameter register is the quantity of the parameter that the analog module has in each analog module;Each parameter is posted Storage all has unique register address.
2. the parameter adjustment system of analog module according to claim 1, it is characterized in that, the analog module includes voltage Control module, clock oscillator module.
3. the parameter adjustment system of analog module according to claim 1, it is characterized in that, the bit wide of the address bus is M, its maximum address 2 that can be representedMThe register address of -1 >=maximum;
The bit wide of the data/address bus is N, the maximum bit wide of N >=parameter register;
The bit wide of the controlling bus is 3 bits, including the reading writing signal line of 1 bit, the read-write gating signal line of 1 bit, 1 ratio Special clock cable.
4. the parameter adjustment system of analog module according to claim 1, it is characterized in that, it is built-in in all of analog module Parameter register quantity summation, equal to the number of parameters that all of analog module has altogether.
5. the parameter adjustment system of analog module according to claim 1, it is characterized in that, the parameter in each analog module The bit wide of register, the bit wide of the parameter having corresponding to the analog module.
6. the parameter adjustment system of analog module according to claim 1, it is characterized in that, the parameter of whole analog module is adjusted Whole system has two kinds of mode of operations;
In one mode of operation, register access bus and each analog module of the highway switching built-in testing module Register access bus is connected, and built-in testing module is written and read by different addresses to each parameter register;
In another operation mode, register access bus and each analog module of the highway switching user function module Register access bus be connected, user function module is written and read according to different addresses to each parameter register.
CN201210529547.1A 2012-12-10 2012-12-10 The parameter adjustment system of analog module Active CN103870616B (en)

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CN101064276A (en) * 2006-04-27 2007-10-31 盛群半导体股份有限公司 Method for regulating integrate circuit parameter
CN101183406A (en) * 2007-12-25 2008-05-21 盛科网络(苏州)有限公司 Method for establishing network chip module level function checking testing platform
CN102479553A (en) * 2010-11-25 2012-05-30 上海华虹Nec电子有限公司 Application-specific integrated circuit with multiple analog circuits requiring to be trimmed

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US7694202B2 (en) * 2004-01-28 2010-04-06 Micron Technology, Inc. Providing memory test patterns for DLL calibration
US7225379B2 (en) * 2004-04-23 2007-05-29 Oki Electric Industry Co., Ltd. Circuit and method for testing semiconductor device
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CN101799526B (en) * 2009-02-06 2012-12-12 杭州中科微电子有限公司 Method for calibrating high-precision RTC circuit in GPS receiver and module thereof
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Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101059546A (en) * 2006-04-18 2007-10-24 盛群半导体股份有限公司 System chip with multiple test mode and the test method
CN101064276A (en) * 2006-04-27 2007-10-31 盛群半导体股份有限公司 Method for regulating integrate circuit parameter
CN101183406A (en) * 2007-12-25 2008-05-21 盛科网络(苏州)有限公司 Method for establishing network chip module level function checking testing platform
CN102479553A (en) * 2010-11-25 2012-05-30 上海华虹Nec电子有限公司 Application-specific integrated circuit with multiple analog circuits requiring to be trimmed

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