CN103631688A - Method and system for testing interface signal - Google Patents
Method and system for testing interface signal Download PDFInfo
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- CN103631688A CN103631688A CN201310656645.6A CN201310656645A CN103631688A CN 103631688 A CN103631688 A CN 103631688A CN 201310656645 A CN201310656645 A CN 201310656645A CN 103631688 A CN103631688 A CN 103631688A
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Abstract
The invention discloses a method and a system for testing an interface signal, relates to the technical field of data communication, and aims to solve the problem of high testing workload in the conventional testing process of an interface signal of a line card back plate and remarkably increase the testing efficiency. The specific embodiment of the invention comprises the following steps simulating a testing signal of a signal set to be tested on a line card logic control unit, and transmitting the testing signal to a line card interface testing unit; processing the testing signal according to a preset requirement by using the line card interface testing unit, transmitting the processed testing signal to a testing back plate including loopback of the signal set to be tested, returning a new testing signal passing through the loopback to the line card logic control unit by using the testing back plate, and judging to complete interface signal testing. The technical scheme of the invention is mainly applied to a line card production testing flow.
Description
Technical field
The present invention relates to data communication technology field, relate in particular to a kind of method and system of test interface signal.
Background technology
At present, machine frame communication device adopts more common platform design, make the line card (LPU card, Line Processing Unit) of same type can be applied to different machine frame communication facilitiess, thereby met difference in functionality demand and the upgrading demand of machine frame communication device.Because function, the performance of machine frame are different, the backplane interface signal that often inserts different machine frames is also different, so just need to carry out production test to determine whether the backplane interface signal of line card mates with machine frame to line card.At present, the mode that line card production test adopts insertion machine frame to carry out system test is carried out.Because line card can be applied to different machine frame communication facilitiess, when line card is only inserted in while testing on a kind of machine frame, the situation that just there will be the test leakage of backplane interface signal, and then can cause this line card to apply time, there will be the situation of cisco unity malfunction on other machine frame communication facilities.And to avoid above-mentioned test leakage problem, just line card must be tested one by one on all machine frames that mate, will certainly strengthen test job amount like this, cause the problem that testing efficiency is low, cost is high, so in the urgent need to finding a kind of more simple, easy-operating detection method to solve the problems referred to above.
Summary of the invention
Embodiments of the invention provide a kind of method and system of test interface signal, when test line card backplane interface signal, have solved the large problem of test job amount in existing test process, have significantly improved testing efficiency.
For achieving the above object, embodiments of the invention adopt following technical scheme:
A method for test interface signal, is applied to the machine frame communication device that contains testing backboard, and line card to be measured is connected by back panel connector with described testing backboard, and described line card to be measured at least comprises: line card logic control element, line card interface testing unit; Described method comprises:
The test signal of described line card logic control element simulation measured signal group, and described test signal is sent to described line card interface testing unit;
Described line card interface testing unit is processed described test signal according to preset requirement, and the test signal after processing is sent to described testing backboard, and described testing backboard comprises for by the test channel of measured signal group loopback;
Described line card logic control element receives the new test signal that described testing backboard returns.
A kind of system of test interface signal, described system comprises machine frame communication device and the line card to be measured that contains testing backboard, described line card to be measured is connected by back panel connector with described testing backboard, and described line card to be measured at least comprises line card logic control element, line card interface testing unit;
Described line card logic control element, for simulating the test signal of measured signal group, and sends to described line card interface testing unit by described test signal;
Described line card interface testing unit, for according to preset requirement, described test signal being processed, and sends to described testing backboard by the test signal after processing, and described testing backboard comprises for by the test channel of measured signal group loopback;
Described line card logic control element, the new test signal of also returning for receiving described testing backboard.
The method and system of the test interface signal that the embodiment of the present invention provides, the test signal of online card logic control module simulation measured signal group, and this test signal is sent to line card interface testing unit; And then line card interface testing unit is processed test signal according to preset requirement, and the test signal after processing is sent to the testing backboard that comprises measured signal group loopback, and then this testing backboard is by returning to line card to be measured through the new test signal of above-mentioned loopback, completes interface signal test by judgement.In prior art, line card to be measured must be tested and compared one by one on all machine frame type equipments that mate, the test job amount that has solved prior art existence is large, the problem that testing efficiency is low, when test line card backplane interface signal, significantly improved testing efficiency.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, to the accompanying drawing of required use in embodiment or description of the Prior Art be briefly described below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skills, do not paying under the prerequisite of creative work, can also obtain according to these accompanying drawings other accompanying drawing.
The method flow diagram of a kind of test interface signal that Fig. 1 provides for one embodiment of the invention;
The method flow diagram of a kind of test interface signal that Fig. 2 provides for another embodiment of the present invention;
The method flow diagram of a kind of test interface signal based on instantiation that Fig. 3 provides for another embodiment of the present invention;
The composition schematic diagram of a kind of test interface signal system that Fig. 4-1 provides for another embodiment of the present invention;
The composition schematic diagram of a kind of line card to be measured that Fig. 4-2 provide for another embodiment of the present invention;
The composition schematic diagram of the another kind of test interface signal system that Fig. 4-3 provide for another embodiment of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is only the present invention's part embodiment, rather than whole embodiment.Embodiment based in the present invention, those of ordinary skills, not making the every other embodiment obtaining under creative work prerequisite, belong to the scope of protection of the invention.
One embodiment of the invention provides a kind of method of test interface signal, preferably, the method is applied to the machine frame communication device that contains testing backboard, line card to be measured is connected by back panel connector with testing backboard, and this line card to be measured at least comprises: line card logic control element, line card interface testing unit.
As shown in Figure 1, the method comprises:
101, the test signal of line card logic control element simulation measured signal group, and this test signal is sent to line card interface testing unit.
Preferably,
Line card logic control element, is CPLD(Complex Programmable Logic Device, CPLD), the logic control device such as single-chip microcomputer, for simulating the test signal that sends or receive measured signal group.This line card logic control element can adopt existing on line card or be to realize the control device that test purpose of the present invention is added.
Line card interface testing unit, the new device for test interface signal and the circuit adding on line card to be measured, preferably, it is the analog interface for signal testing defining on the back panel connector of line card to be measured, and the buffering of signal, the device such as latch, be mainly used in providing interface and signalling channel for line card logic control element and being communicated with of test signal between testing backboard.
102, line card interface testing unit is processed test signal according to preset requirement, and the test signal after processing is sent to testing backboard.
Wherein, testing backboard comprises for by the passage of measured signal group loopback, in this backplane interface, compatibility has defined all variety classes backplane interface signals that same line card to be measured is supported, line card to be measured like this can complete the test of total interface signal on this testing backboard.
What deserves to be explained is, wherein according to preset requirement, test signal is processed, is that the test signal for line card interface testing unit is sent can receive by tested backboard.
103, line card logic control element receives the new test signal that testing backboard returns.
Wherein, new test signal refers to, the test signal of the test signal of simulation measured signal group after the measured signal group passage loopback through in testing backboard.
The method of the test interface signal that the embodiment of the present invention provides, the test signal of online card logic control module simulation measured signal group, and this test signal is sent to line card interface testing unit; And then line card interface testing unit is processed test signal according to preset requirement, and the test signal after processing is sent to the testing backboard that comprises measured signal group loopback, and then this testing backboard is by returning to line card through the new test signal of above-mentioned loopback, completes interface signal test by judgement.In prior art, line card must be tested and compared one by one on all machine frames that mate, the test job amount that has solved prior art existence is large, and the problem that testing efficiency is low, when test line card backplane interface signal, has significantly improved testing efficiency.
Further, another embodiment of the present invention provides a kind of method of test interface signal, has described the method for more complete test interface signal in this embodiment, and as shown in Figure 2, the method comprises:
201, line card logic control element receives test command.
Wherein, at least comprise measured signal group sign in test command, which kind of signal is used to indicate line card logic control element will simulate.
202, the test signal of line card logic control element simulation measured signal group, and this test signal is sent to line card interface testing unit
203, line card interface testing unit is processed test signal according to preset requirement, and the test signal after processing is sent to testing backboard.
204, line card logic control element receives the new test signal that testing backboard returns.
205, line card logic control element compares this new test signal and the test signal of sending, to determine that whether new test signal is consistent with test signal.
What deserves to be explained is, when confirming that comparative result is consistent, determine that line card to be measured is normal in this interface signal group to be measured.
At present, take line card A as example explanation, this line card A both can be used on backboard A, can on backboard B, use again, but owing to using on backboard A and backboard B, the function of line card A is distinguishing, and then while using on backboard A and backboard B, the backplane interface signal of this line card A is used also not identical.Such as, the backplane interface signal of line card A has defined 3 groups of signals altogether, i.e. signal group A, signal group B and signal group C.When this line card A is used on backboard A, only used signal group A and signal group B, and the LPU groove position of backboard A signal group A and two groups of backplane interface signals of signal group B have also only been defined; When line card A is used on backboard B, only used signal group A and signal group C, and the LPU groove position of backboard A signal group A and two groups of backplane interface signals of signal group C have also only been defined.In carry out LPU line card production testing process according to existing solution, when this line card A only detects on backboard A, whether normally so just cannot detect backplane interface signal group C, in this case, when this line card A is used on backboard B, will have risk.In like manner, if this line card A only detects on backboard B, whether normally cannot detect backplane interface signal group B, also just can not guarantee that this line card A is normally used on backboard A.Or this line card A tests respectively on backboard A and backboard B, also just there will be test job amount large, the problem that testing efficiency is low.
In order to address the above problem, the technical scheme that another embodiment of the present invention provides can be applied to test as follows in line card backplane interface signal configuration, this framework at least comprises the machine frame communication device that contains testing backboard, line card to be measured is connected by back panel connector with testing backboard, and this line card to be measured at least comprises: line card logic control element, line card interface testing unit.Framework based on above-mentioned, as shown in Figure 3, the method for the test interface signal that the embodiment of the present invention provides comprises:
301, line card logic control element receives the test command of signal group C.
Wherein, line card logic control element is the devices such as CPLD on line card to be measured or single-chip microcomputer.
302, the test command that line card logic control element basis receives, the test signal of simulating signal group C, and this test signal is sent to line card interface testing unit.
Preferably, this line card logic control element is simulated the test signal of signal group C to be sent according to the frame format of signal group C.
303, line card interface testing unit is processed this test signal according to preset requirement, then by backplane interface connector, the signal of handling well is sent to testing backboard.
Wherein, preset requirement is to set according to the type of line card, such as, for the line card for Dynamic Signal, this preset requirement can be passed through the upper level default of this line card, and better simply or for the line card of stationary singnal, this preset requirement is set by manufacturer is unified for function.The processing herein relating to comprises but is not defined as, and test signal is carried out to the processing such as level conversion, signal latch, so that the signal reception form of the test signal form that this line card interface testing unit sends and testing backboard to be measured matches.Concrete, if the test signal of sending is 5V, and at testing backboard, can only receive the signal of 3.3V, need signal to carry out level conversion.
Wherein, testing backboard is on the basis of backboard A, integrated the interface signal of backboard B, the proprietary interface signal group C of backboard B has been added to the C signal group loopback passage of a test use at the connector place of line card A groove to be measured position, other signal does not need to change, and this signal group loopback does not affect the normal use of line card A on this testing backboard.That is to say, when normal use, the function of this testing backboard is identical with the function of backboard A, and this testing backboard is not a kind of backboard newly increasing outside backboard A, backboard B, but the upgrading of carrying out on the basis of backboard A can substitute backboard A completely and use.The loopback of the C signal group of adding on testing backboard is a test channel, thereby can utilize the interface signal of method of testing of the present invention C signal group of compatibility test backboard B on this newly-generated testing backboard, on this backboard, the interface signal method of testing of original backboard A is directly tested according to existing conventional method.
304, testing backboard carries out loopback by the test signal of the simulation receiving, and by back panel connector, this signal is turned back to line card to be measured.
305, the analog test signal that line card to be measured returns judges.
What deserves to be explained is, the judgement of herein carrying out is used for determining that line card A goes up this partial function and whether back panel connector is normal, and so far the circuit of whole signal group C and the simulation test of function complete.
Concrete, this judgement can be that the default test item of signal is judged, if the test signal of returning is identical with the test signal of the signal group C sending at the numerical value of this default detection, this semiotic function and back panel connector that line card A is described are normal, this line card A can normally be used on backboard A and backboard B, otherwise, when the test signal of returning different from the test signal of sending before, such as, the signal value of the test signal that line card logic testing unit sends out is 1000, the signal value returning receiving is 800, illustrate that this line card A exists risk while using on backboard B.
Further, what deserves to be explained is, the present embodiment be take and comprised that one group of signal group loopback describes as example on testing backboard, but when line card to be measured can be used simultaneously on multiple backboard, now on testing backboard, can comprise accordingly multi-signal group loopback, further, when these signal groups on testing backboard are tested, need to test according to the function of these signal groups, when they are the complete uncorrelated signal group of function, can test these signal groups simultaneously.If it is relevant that the function of the signal group that these are to be measured is logic, so just need to test according to its logical relation.
To sum up to of the present invention, carry into execution a plan and the description of existing example, that is to say, this line card to be measured can be used on two kinds of different backboards, and the semiotic function to be tested of take is uncorrelated is example, if use traditional method of testing, if will complete the detection to the backplane interface of this line card, need on two kinds of backboards, carry out respectively a functional test.And use the embodiment of the present invention that above-mentioned method of testing is provided, this line card to be measured only need to be tested and just can complete all backplane interface signal testings on a kind of backboard, the efficiency of production testing is just doubled like this, only has half of classic method detection time.In like manner, when a kind of line card to be measured is applicable to three kinds of different backboards, this patent can shorten to detection time only has 1/3 of traditional detection method.Meanwhile, owing to having avoided repeatedly plug and the switch electricity of LPU line card on different backboards, the loss in the life-span of line card has also been played to certain reducing effect.
Another embodiment of the present invention provides a kind of system of test interface signal, and as shown in Fig. 4-1, this system comprises machine frame communication device 01 and the line card to be measured 02 that contains testing backboard 43, and line card 02 to be measured is connected by back panel connector 03 with testing backboard 43.As shown in Fig. 4-2, this line card 02 to be measured comprises: line card logic control element 41, line card interface testing unit 42.
Line card logic control element 41, for simulating the test signal of measured signal group, and sends to line card interface testing unit 42 by this test signal.
Line card interface testing unit 42, for according to preset requirement, test signal being processed, and sends to testing backboard 43 by the test signal after processing.
Wherein, testing backboard 43 comprises for by the test channel of measured signal group loopback.
Line card logic control element 41, also states for receiving the new test signal that testing backboard 43 returns.
Optionally, new test signal, the test signal of the test signal that refers to simulation measured signal group after the measured signal group passage loopback through in testing backboard 43.
Optionally, as shown in Fig. 4-3, machine frame communication device 01 also comprises main control card 44.
Further alternative, line card logic control element 41, also, for before the test signal in simulation measured signal group, receives the test command that main control card 44 sends; Also, for after receiving new test signal, this new test signal and the test signal sending are before compared, to determine that whether new test signal is consistent with the test signal of simulation.
Wherein, in test command, at least comprise measured signal group sign.
Optionally, line card interface testing unit 42, is also used to line card logic control element 41 and being communicated with of test signal between testing backboard 43 that interface and signalling channel are provided.
The system of a kind of test interface signal that the embodiment of the present invention provides, the test signal of online card logic control module simulation measured signal group, and after this test signal is sent to line card interface testing unit; Line card interface testing unit is processed test signal according to preset requirement, and the test signal after processing is sent to the testing backboard that comprises measured signal group loopback, and then this testing backboard is by returning to line card logic control element through the new test signal of above-mentioned loopback, completes interface signal test by judgement.In prior art, line card must be tested and compared one by one on all machine frames that mate, the test job amount that has solved prior art existence is large, and the problem that testing efficiency is low, when test line card backplane interface signal, has significantly improved testing efficiency.
Through the above description of the embodiments, those skilled in the art can be well understood to the mode that the present invention can add essential common hardware by software and realize, and can certainly pass through hardware, but in a lot of situation, the former is better embodiment.Understanding based on such, the part that technical scheme of the present invention contributes to prior art in essence in other words can embody with the form of software product, this computer software product is stored in the storage medium can read, as the floppy disk of computing machine, hard disk or CD etc., comprise some instructions with so that computer equipment (can be personal computer, server, or the network equipment etc.) carry out the method described in each embodiment of the present invention.
The above; be only the specific embodiment of the present invention, but protection scope of the present invention is not limited to this, is anyly familiar with those skilled in the art in the technical scope that the present invention discloses; can expect easily changing or replacing, within all should being encompassed in protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of described claim.
Claims (10)
1. the method for a test interface signal, described method is applied to the machine frame communication device that contains testing backboard, it is characterized in that, line card to be measured is connected by back panel connector with described testing backboard, described line card to be measured at least comprises: line card logic control element, line card interface testing unit; Described method comprises:
The test signal of described line card logic control element simulation measured signal group, and described test signal is sent to described line card interface testing unit;
Described line card interface testing unit is processed described test signal according to preset requirement, and the test signal after processing is sent to described testing backboard, and described testing backboard comprises for by the test channel of measured signal group loopback;
Described line card logic control element receives the new test signal that described testing backboard returns.
2. the method for test interface signal according to claim 1, is characterized in that, before the test signal of described line card logic control element simulation measured signal group, also comprises:
Described line card logic control element receives test command, at least comprises described measured signal group sign in described test command.
3. the method for test interface signal according to claim 2, is characterized in that, after described line card logical block receives described new test signal, also comprises:
Test signal to described new test signal and described simulation compares, to determine that whether described new test signal is consistent with the test signal of described simulation.
4. according to the method for the test interface signal described in claims 1 to 3 any one, it is characterized in that, described new test signal, the test signal of the test signal that refers to described simulation measured signal group after the measured signal group passage loopback through in testing backboard.
5. the system of a test interface signal, it is characterized in that, described system comprises machine frame communication device and the line card to be measured that contains testing backboard, described line card to be measured is connected by back panel connector with described testing backboard, described line card to be measured at least comprises line card logic control element, line card interface testing unit;
Described line card logic control element, for simulating the test signal of measured signal group, and sends to described line card interface testing unit by described test signal;
Described line card interface testing unit, for according to preset requirement, described test signal being processed, and sends to described testing backboard by the test signal after processing, and described testing backboard comprises for by the test channel of measured signal group loopback;
Described line card logic control element, the new test signal of also returning for receiving described testing backboard.
6. the system of test interface signal according to claim 5, is characterized in that,
Described line card logic control element, also, for before the test signal in simulation measured signal group, receives test command, at least comprises described measured signal group sign in described test command.
7. the system of test interface signal according to claim 6, is characterized in that,
Described line card logic control element, also, for after receiving described new test signal, compares the test signal of described new test signal and described simulation, to determine that whether described new test signal is consistent with the test signal of described simulation.
8. according to the system of the test interface signal described in any one claim of claim 5 to 7, it is characterized in that, described new test signal, the test signal of the test signal that refers to described simulation measured signal group after the measured signal group passage loopback through in testing backboard.
9. the system of test interface signal according to claim 8, is characterized in that, described machine frame communication device also comprises main control card, and described main control card is for sending test command to described line card logic control element.
10. the system of test interface signal according to claim 8, is characterized in that, described line card interface testing unit is also used to line card logic control element and being communicated with of test signal between testing backboard that interface and signalling channel are provided.
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| CN109085489A (en) * | 2018-07-26 | 2018-12-25 | 烽火通信科技股份有限公司 | A kind of backboard function test system, design method and test method |
| CN109085489B (en) * | 2018-07-26 | 2020-07-28 | 烽火通信科技股份有限公司 | Back plate function test system, design method and test method |
| CN113037581A (en) * | 2019-12-24 | 2021-06-25 | 迈普通信技术股份有限公司 | Backboard channel testing method and device, board card and computer readable storage medium |
| CN113037581B (en) * | 2019-12-24 | 2024-02-27 | 迈普通信技术股份有限公司 | Backboard channel testing method and device, board card and computer readable storage medium |
| CN113472600A (en) * | 2020-03-31 | 2021-10-01 | 烽火通信科技股份有限公司 | Multi-node server testing method and system |
| CN113472600B (en) * | 2020-03-31 | 2022-09-02 | 烽火通信科技股份有限公司 | Multi-node server testing method and system |
| CN112965751A (en) * | 2021-03-04 | 2021-06-15 | 杭州迪普科技股份有限公司 | Main control board card for frame type equipment |
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