CN110687363A - SFP port test fixture - Google Patents
SFP port test fixture Download PDFInfo
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- CN110687363A CN110687363A CN201810724707.5A CN201810724707A CN110687363A CN 110687363 A CN110687363 A CN 110687363A CN 201810724707 A CN201810724707 A CN 201810724707A CN 110687363 A CN110687363 A CN 110687363A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04Q—SELECTING
- H04Q1/00—Details of selecting apparatus or arrangements
- H04Q1/18—Electrical details
- H04Q1/20—Testing circuits or apparatus; Circuits or apparatus for detecting, indicating, or signalling faults or troubles
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Abstract
The invention provides an SFP port test fixture, which is used for selectively coupling a mainboard to be tested with a processing unit and a switch module to an external SFP device. The SFP port test fixture includes a control interface and a plurality of interfaces. The first interface is connected to the TX interface of the SFP connecting port to be tested, and the second interface is connected to the RX interface of the SFP connecting port to be tested. The control interface is coupled to the processing unit of the mainboard to be tested, and determines the data transmission mode between the first interface and the second interface according to the control signal of the processing unit. In addition, when the data transmission mode is set to the first data transmission mode, the SFP port test fixture will send the data inputted to the first interface back to the second interface for the data return test of the SFP connection port to be tested.
Description
Technical Field
The invention relates to an SFP (Small Form-factor plug interface) port test fixture, in particular to an SFP port test fixture applicable to various test modes.
Background
Generally, to ensure that the communication modules or communication data ports (e.g., SFP ports) of the computer device or the server device can be used normally, before the design process is developed and produced, each communication data port is connected to other communication data ports or other communication modules in different ways, and data is transmitted and received in different connection ways to determine whether each communication data port is operating normally. In detail, the tester must replace the connection device or test board between the communication data ports according to the different test types to make the transmission method of the test data meet the test purpose.
Conventionally, in order to deal with different tests, a plurality of different connection test boards need to be manufactured, which not only greatly increases the cost of the test, but also increases the trouble of replacement and management for the tester.
Disclosure of Invention
The present invention provides a test fixture for SFP port suitable for multiple test modes.
To solve the above technical problem, an SFP port testing fixture for coupling a motherboard to be tested, the motherboard to be tested includes a processing unit and a Switch module (Switch), the Switch module has an SFP connection port to be tested, the SFP port testing fixture includes: a first interface for connecting to the TX interface of the SFP connection port to be tested; a second interface for connecting to the RX interface of the SFP connection port to be tested; and a control interface coupled to the processing unit of the tested motherboard for receiving a control signal of the processing unit, wherein the SFP port test fixture determines a data transmission mode of the first interface and the second interface according to the control signal, and when the data transmission mode is set to a first data transmission mode, the SFP port test fixture outputs data input to the first interface from the second interface so as to enable data of a TX interface of the tested SFP connection port to be sent back to an RX interface of the tested SFP connection port.
Preferably, the processing unit executes a first test program to perform the following steps: generating a first control signal to the control interface to set the data transmission mode to the first data transmission mode; controlling the switch module to transmit a test data through the TX interface of the SFP connection port to be tested; and determining whether the RX interface of the SFP port of the switch module receives the test data. In addition, the processing unit executes the first test program to further perform the following steps: when the RX interface of the SFP connection port to be tested receives the test data, outputting a test normal message through a display unit; and generating a test abnormal message through the display unit when the RX interface of the SFP connection port to be tested does not receive the test data within a period of time.
Preferably, the SFP port test fixture further comprises: a third interface for coupling to a TX interface of an SFP port of an SFP device; and a fourth interface for coupling to the RX interface of the SFP connection port of the SFP device, wherein when the data transmission mode is set to a second data transmission mode, the SFP port test fixture outputs data input to the first interface from the third interface so that data of the TX interface of the SFP connection port to be tested is transmitted to the TX interface of the SFP connection port of the SFP device, and the SFP port test fixture outputs data input to the fourth interface from the second interface so that data of the RX interface of the SFP connection port of the SFP device is transmitted to the RX interface of the SFP connection port to be tested.
Preferably, the processing unit executes a second test program to perform the following steps: generating a second control signal to the control interface to set the data transmission mode to the second data transmission mode; controlling the switch module to send a test data to the SFP device through the TX interface of the SFP connection port to be tested; and determining whether the RX interface of the SFP port of the switch module receives a response data corresponding to the test data from the SFP device. When the SFP device receives the test data, the SFP device generates the response data according to the test data. In addition, the processing unit executes the second test program to further perform the following steps: when the RX interface of the SFP connection port to be tested receives the response data, outputting a test normal message through a display unit; and generating a test abnormal message through the display unit when the RX interface of the SFP connection port to be tested does not receive the response data within a period of time.
Preferably, the control interface is communicatively coupled to the processor unit via an I2C interface.
Preferably, the SFP port test fixture further includes an FPGA executing a program code to determine a data transmission mode of the first interface and the second interface according to the control signal.
Compared with the prior art, the SFP test fixture can be switched to a proper connection mode according to different test modes, not only simplifies the test procedure, but also greatly reduces the manufacturing cost of producing a large amount of corresponding fixtures along with different tests in the past.
[ description of the drawings ]
FIG. 1 is a diagram illustrating a data transmission mode of an SFP port test system according to an embodiment of the invention.
FIG. 2 is a diagram illustrating another data transmission mode of the SFP port test system according to an embodiment of the invention.
FIG. 3 is a flowchart illustrating the SFP port test operating in a test mode according to an embodiment of the present invention.
FIG. 4 is a flowchart illustrating the operation of the SFP port test in another test mode according to an embodiment of the present invention.
[ detailed description ] embodiments
Referring to fig. 1, the SFP port testing system 100 includes a motherboard 10 to be tested, an SFP device 20, and an SFP port testing fixture 30. The motherboard 10 to be tested includes a processing unit 12 and a Switch module (Switch) 14. The processing unit 12 may be a basic input/output system (BIOS), a central processing unit (cpu), a Baseboard Management Controller (BMC), or the like. The switch module 14 may have several SFP ports, each of which has at least one TX interface and one RX interface, for example, if the SFP port is QSFP standard, it may have four TX interfaces and four RX interfaces. In addition, SFP device 20 is an electronic device having SFP ports, such as a server device, a network switch, etc. For illustrative purposes, the switch module 14 is illustrated and described as SFP ports S1-1 and S1-2 each having a TX interface and an RX interface, and the SFP device 20 is illustrated as SFP ports S2-1 and S2-2 each having a TX interface and an RX interface, but not limiting the invention.
The SFP port test fixture 30 includes several interfaces P1, P2, P3, P4, P5, P6, P7, P8, and a control interface Pc. In the present embodiment, the interface P1 of the SFP port test fixture 30 is coupled to the TX interface of the SFP port S1-1 of the switch module 14, and the interface P2 is coupled to the RX interface of the SFP port S1-1 of the switch module 14. Interface P3 is coupled to the RX interface of SFP port S2-1 of SFP device 20, and interface P4 is coupled to the TX interface of SFP port S2-1 of SFP device 20. Interface P5 of the SFP port test fixture 30 is coupled to the TX interface of SFP port S1-2 of the switch module 14, and interface P6 is coupled to the RX interface of SFP port S1-2 of the switch module 14. Interface P7 is coupled to the RX interface of SFP port S2-2 of SFP device 20, and interface P8 is coupled to the TX interface of SFP port S2-2 of SFP device 20.
In addition, the control interface Pc of the SFP port test fixture 30 is coupled to the processor unit 12 of the motherboard 10 to be tested, and the SFP port test fixture 30 receives the control signal of the processor unit 12 through the control interface Pc to switch the data transmission mode among the interfaces P1, P2, P3, P4, P5, P6, P7, and P8. In the present embodiment, the control interface Pc is communicatively connected to the processor unit 12 via an I2C interface, the processing unit 12 is a Master (Master) and the SFP port test fixture 30 is a Slave (Slave), and the processing unit 12 sends a control signal to switch the data transmission mode of the SFP port test fixture 30. In detail, when it is tested whether the SFP port S1-1 of the switch module 14 can normally perform Loopback (Loopback) data transmission, the processing unit 12 can transmit a corresponding control signal to the control interface Pc to switch to the first data transmission mode, as shown in fig. 1. Accordingly, the SFP port test tool 30 outputs the data inputted to the interface P1 from the interface P2 so as to return the data outputted from the TX interface of the SFP port S1-1 to the RX interface of the SFP port S1-1. Meanwhile, in the first data transmission mode, the SFP port test tool 30 outputs the data inputted to the interface P5 from the interface P6 so that the data outputted from the TX interface of the SFP port S1-2 is sent back to the RX interface of the SFP port S1-2.
On the other hand, when the SFP port S1-1 of the switch module 14 is to be tested whether it can normally perform data transmission with an external SFP device (e.g., SFP device 20), the processing unit 12 can send a corresponding control signal to the control interface Pc to switch the second data transmission mode, as shown in fig. 2. Accordingly, the SFP port test tool 30 outputs the data inputted to the interface P1 from the interface P3 and outputs the data inputted to the interface P2 from the interface P4, in other words, the data of the TX interface of the SFP port S1-1 is transmitted to the RX interface of the SFP port S2-1 and the data of the TX interface of the SFP port S2-1 is transmitted to the RX interface of the SFP port S1-1. Meanwhile, in the second data transmission mode, the SFP port test tool 30 outputs the data inputted to the interface P5 from the interface P7 and outputs the data inputted to the interface P6 from the interface P8, i.e., the data of the TX interface of the SFP port S1-2 is transmitted to the RX interface of the SFP port S2-2 and the data of the TX interface of the SFP port S2-2 is transmitted to the RX interface of the SFP port S1-2.
In another embodiment, the data transmission modes of SFP ports S1-1 and S1-2 can be set respectively, for example, SFP port S1-1 is set to the second data transmission mode, SFP port S1-2 is set to the first data transmission mode, SFP port test fixture 30 outputs data inputted to interface P1 from interface P3 to transmit data of TX interface of SFP port S1-1 to RX interface of SFP port S2-1, and transmits data inputted to interface P2 to interface P4 to transmit data of TX interface of SFP port S2-1 to RX interface of SFP port S1-1, and simultaneously, SFP port test fixture 30 outputs data inputted to interface P5 from interface P6 to transmit data of TX interface of SFP port S1-2 back to RX interface of SFP port S1-2. Vice versa, the SFP port S1-1 may be set to the first data transfer mode, and the SFP port S1-2 may be set to the second data transfer mode. In some embodiments, the data transmission switching of the SFP port test fixture 30 can be realized by the microprocessor, the FPGA, the CPLD executing corresponding program codes or by any logic device capable of performing the operation, and the processing unit 12 can generate control signals of any format, type, and instruction corresponding to the SFP port test fixture 30 to perform the data transmission mode switching.
The following describes the testing operation flow in the first data transmission mode of the SFP port testing system of the present invention with reference to FIG. 1 and FIG. 3. For simplicity, the SFP port S1-1 of the switch module 14 is only used as an example for testing, however, each SFP port of the switch module 14 can be tested simultaneously, sequentially or independently in the following steps of the operation flow.
First, in step S302, the processing unit 12 executes a first test procedure to perform a data loopback test of the SFP port S1-1 of the switch module 14. Then, in step S304, the processing unit transmits a first control signal corresponding to the first data transmission mode to the SFP port test fixture 30.
Next, in step S306, the SFP port test fixture 30 switches the data transmission mode to the first data transmission mode, and the SFP port test fixture 30 outputs the data inputted to the interface P1 from the interface P2 to return the data of the TX interface of the SFP port S1-1 to the RX interface of the SFP port S1-1. In step S308, the processing unit 12 controls the switch module 14 to transmit the test data through the TX interface of the SFP port S1-1. It should be appreciated that, since the SFP port test fixture 30 has set the interfaces P1 and P2 to be the first data transmission mode in step S306, the test data transmitted by the TX interface of the SFP port S1-1 will be sent back to the RX interface of the SFP port S1-1 through the interfaces P1 and P2 of the SFP port test fixture 30 under the normal operation of the switch module 14.
In step S310, the processing unit 12 determines whether the RX interface of the SFP port S1-1 of the switch module 14 has received the test data transmitted from the TX interface of the SFP port S1-1 within a period of time. If yes, the processing unit 12 continues to output test normal information in step S312. Otherwise, in step S314, the processing unit 12 outputs the test exception information. It should be understood that the processing unit 12 can output the test information or generate a corresponding data output of the test information for storage in any memory unit through a display unit (not shown) communicatively connected thereto, but the present invention is not limited to the form of the test information output.
The following describes the testing operation flow in the second data transmission mode of the SFP port testing system of the present invention with reference to FIG. 1 and FIG. 4. For simplicity, the SFP port S1-1 of the switch module 14 is only used as an example for testing, however, each SFP port of the switch module 14 can be tested simultaneously, sequentially or independently in the following steps of the operation flow.
First, in step S402, the processing unit 12 executes a second test procedure to perform data transmission test of the SFP port S1-1 of the switch module 14 and the SFP port S2-1 of the SFP device 20. Then, in step S404, the processing unit transmits a second control signal corresponding to the second data transmission mode to the SFP port test fixture 30.
Next, in step S406, the SFP port test fixture 30 switches the data transmission mode to the second data transmission mode, the SFP port test fixture 30 outputs the data inputted to the interface P1 from the interface P3 to transmit the data of the TX interface of the SFP port S1-1 to the RX interface of the SFP port S2-1, and outputs the data inputted to the interface P2 from the interface P4 to transmit the data of the TX interface of the SFP port S2-1 to the RX interface of the SFP port S1-1. In step S408, the processing unit 12 controls the switch module 14 to transmit the test data through the TX interface of the SFP port S1-1. It should be appreciated that, since the SFP port test tool 30 has set the interfaces P1 and P2 to the second data transmission mode in step S406, under the condition that the switch module 14 is operating normally, the test data transmitted by the TX interface of the SFP port S1-1 will be transmitted to the RX interface of the SFP port S2-1 through the interfaces P1 and P3 of the SFP port test tool 30, and the SFP device 20 will transmit the response data back from the TX interface of the SFP port S2-1 according to the test data, and the response data will be transmitted to the RX interface of the SFP port S1-1 through the interfaces P4 and P2 of the SFP port test tool 30.
In step S410, processing unit 12 determines whether the RX interface of SFP port S1-1 of switch module 14 has received response data returned from SFP device 20 according to the test data within a period of time. If yes, the processing unit 12 continues to output the test normal information in step S412. Conversely, in step S414, the processing unit 12 outputs the test exception information. It should be understood that the processing unit 12 can output the test information or generate the corresponding test result data for storage in any memory unit through a display unit (not shown) communicatively connected thereto, but the present invention is not limited to the form of the test result output.
In summary, the testing tool of the present invention can be switched to an appropriate connection mode according to different testing modes, which not only simplifies the testing procedure, but also greatly reduces the manufacturing cost of the prior art that a large number of corresponding tools must be produced with different tests.
The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention, and all the changes or substitutions should be covered within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (8)
1. An SFP port test fixture for coupling a motherboard to be tested, the motherboard to be tested including a processing unit and a switch module, the switch module having an SFP connection port to be tested, the SFP port test fixture comprising:
a first interface for connecting to the TX interface of the SFP connection port to be tested;
a second interface for connecting to the RX interface of the SFP connection port to be tested; and
a control interface coupled to the processing unit of the motherboard to be tested and used for receiving a control signal of the processing unit,
the SFP port test tool determines a data transmission mode of the first interface and the second interface according to the control signal,
when the data transmission mode is set to a first data transmission mode, the SFP port test fixture outputs the data input to the first interface from the second interface so as to enable the data of the TX interface of the SFP connection port to be tested to be sent back to the RX interface of the SFP connection port to be tested.
2. The SFP port test fixture of claim 1, wherein the processing unit performs a first test procedure to perform the following steps:
generating a first control signal to the control interface to set the data transmission mode to the first data transmission mode;
controlling the switch module to transmit a test data through the TX interface of the SFP connection port to be tested; and
judging whether the RX interface of the SFP connection port to be tested of the switch module receives the test data.
3. The SFP port test fixture of claim 2, wherein the processing unit executing the first test procedure further performs the steps of:
when the RX interface of the SFP connection port to be tested receives the test data, outputting a test normal message through a display unit; and
when the RX interface of the SFP port to be tested does not receive the test data within a period of time, a test abnormal message is outputted through the display unit.
4. The SFP port test fixture of claim 1, further comprising:
a third interface for coupling to a TX interface of an SFP port of an SFP device; and
a fourth interface for coupling to the RX interface of the SFP port of the SFP device,
when the data transmission mode is set to a second data transmission mode, the SFP port test fixture outputs the data input to the first interface from the third interface so that the data of the TX interface of the SFP connection port to be tested is transmitted to the TX interface of the SFP connection port of the SFP device, and the SFP port test fixture outputs the data input to the fourth interface from the second interface so that the data of the RX interface of the SFP connection port of the SFP device is transmitted to the RX interface of the SFP connection port to be tested.
5. The SFP port test fixture of claim 4, wherein the processing unit performs a second test procedure to perform the following steps:
generating a second control signal to the control interface to set the data transmission mode to the second data transmission mode;
controlling the switch module to send a test data to the SFP device through the TX interface of the SFP connection port to be tested; and
determining whether the RX interface of the SFP port of the switch module receives a response data corresponding to the test data from the SFP device,
when the SFP device receives the test data, the SFP device generates the response data according to the test data.
6. The SFP port test fixture of claim 5, wherein the processing unit executing the second test procedure further performs the steps of:
when the RX interface of the SFP connection port to be tested receives the response data, outputting a test normal message through a display unit; and
when the RX interface of the SFP port to be tested does not receive the response data within a period of time, a test abnormal message is outputted through the display unit.
7. The SFP port test fixture of claim 1, wherein the control interface is communicatively coupled to the processor unit via an I2C interface.
8. The SFP port test fixture of claim 1, further comprising an FPGA executing a program code to determine a data transmission mode of the first interface and the second interface according to the control signal.
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CN112865858A (en) * | 2021-01-15 | 2021-05-28 | 苏州浪潮智能科技有限公司 | SFP interface-based board card error reporting detection system and method |
CN114077236A (en) * | 2020-08-20 | 2022-02-22 | 黄湘豪 | Non-invasive communication inspection and control device |
CN114113852A (en) * | 2021-11-25 | 2022-03-01 | 太仓市同维电子有限公司 | Test method and system for verifying whether optical port AC coupling capacitor is out of piece or not |
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