CN101064276A - Method for regulating integrate circuit parameter - Google Patents
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- CN101064276A CN101064276A CN 200610077186 CN200610077186A CN101064276A CN 101064276 A CN101064276 A CN 101064276A CN 200610077186 CN200610077186 CN 200610077186 CN 200610077186 A CN200610077186 A CN 200610077186A CN 101064276 A CN101064276 A CN 101064276A
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Abstract
A kind of calibrating method of integrated circuit parameters uses external device to calibrate the control and analogue parameters of internal circuit of the integrated circuit, firstly using the detecting mode of external device to detect whether the control and analogue parameters overstep the preset range, when it oversteps the preset range, the calibration value can be obtained by the calibrating mode, and the calibration value is input into the internal circuit of the integrated circuit, then the external circuit detects and calibrates newly, the action will repeat until the control and analogue parameters are in the preset value range. When the control and analogue parameters are in the preset range, the corresponding calibration value will be written into the nonvolatile memory of the integrated circuit. For above all, the invention can improve the accuracy of parameters of integrated circuit and decrease the cost.
Description
Technical field
The present invention relates to a kind of method for regulating integrate circuit parameter, relate in particular to a kind of method for regulating integrate circuit parameter that utilizes the control analog parameter of external device (ED) adjustment IC interior analog circuit.
Background technology
Progress along with semiconductor technology; accuracy for circuit output signal requires also more rigorous; yet; but still having error in manufacture process unavoidably produces; for example for the RC oscillating circuit 11 of integrated circuit 1 inside; the side-play amount that RC frequency of oscillation output valve takes place Shi Changhui surpasses the error ± 20% or more, therefore necessary can be by alignment step with offset correction to zone of reasonableness.See also Fig. 1, it is first kind of known method for regulating integrate circuit parameter.At first, add a plurality of Trim Pad12 (Trim Pad1, Trim Pad2......Trim Padn) at IC interior, when the frequency of oscillation output valve that detects RC oscillating circuit 11 exceeds the preset value scope, then utilize the mode of hardware blowout (Fuse), with error correction to acceptable scope.Yet this kind adjustment mode tends to the increase because of Trim Pad12 quantity for the integrated circuit that needs the superelevation accuracy, and improves hardware cost.
See also Fig. 2, it is second kind of known method for regulating integrate circuit parameter.Before finished product dispatches from the factory, utilize the internal simulation circuit 22 of 21 pairs of integrated circuits 2 of test pattern to test earlier, and make error correction according to test result, again by I/O unit 24 with revised adjustment value direct burning to the nonvolatile memory 23 of this integrated circuit 2.Generally speaking, this internal simulation circuit is RC oscillating circuit 221 and low-voltage testing circuit 222.In addition, if not volatile memory 23 adopts more cheap EPROM since its only can burning once, therefore be burned onto the numerical value of this nonvolatile memory and can't guarantee to be optimal values; If not volatile memory 23 adopts the higher EEPROM of price or other can repeat the nonvolatile memory of burning, because it has the characteristic of repetition burning, therefore causing primary burning value when factors such as generation process drift or circuit design are non-linear is not during for optimal values, then can utilize the deficiency of burning again to avoid EPROM to be caused, EPROM is high but its cost compares.
Comprehensively above-mentioned, therefore need a kind of method for regulating integrate circuit parameter, can take into account the consideration on accuracy and the manufacturing cost simultaneously, solve the deficiencies in the prior art.
Summary of the invention
Main purpose of the present invention is for providing a kind of method for regulating integrate circuit parameter, and the external device (ED) that its utilization has detecting pattern and an adjustment pattern improves the accuracy of output valve of the internal simulation circuit of integrated circuit.
For reaching above-mentioned purpose, the invention provides a kind of method for regulating integrate circuit parameter, it comprises the following steps: step 1, the input initial value is to the latch register (latch register) of this IC interior; Step 2 utilizes the internal simulation circuit of this integrated circuit to read the numerical value of last this latch register of input, and utilizes this numerical value to produce output valve; Step 3 is utilized the detecting pattern of external device (ED), detects this output valve; Step 4 judges whether this output valve exceeds the preset value scope, if this output valve exceeds this preset value scope and then carry out step 5, otherwise, then carry out step 6; Step 5 utilizes the adjustment pattern of this external device (ED) to obtain the adjustment value, and this adjustment value is imported in this latch register (latch register), turns back to step 2 again; Step 6, the numerical value that will import this latch register (latch register) at last writes the nonvolatile memory of this integrated circuit.
Preferably, this external device (ED) is cd-rom recorder or tester table, and this external device (ED) is for carrying out the device of this step 6.
Preferably, this internal simulation circuit is the RC oscillating circuit, and this output valve is a frequency of oscillation.
Preferably, this nonvolatile memory may be selected to be EPROM, EEPROM, FLASH ROM and other kind nonvolatile memory one of them.
For reaching above-mentioned purpose, the invention provides a kind of method for regulating integrate circuit parameter, it comprises the following steps: step 1, the input initial value is to the latch register (latch register) of this IC interior; Step 2 utilizes the internal simulation circuit of this integrated circuit to read the numerical value of last this latch register of input, and utilizes this numerical value to produce output valve; Step 3 is utilized the detecting pattern of external device (ED), detects this output valve; Step 4 judges whether the respective value of this output valve exceeds the preset value scope, if this output valve exceeds this preset value scope and then carry out step 5, otherwise, then carry out step 6; Step 5 utilizes the adjustment pattern of this external device (ED) to obtain the adjustment value, and this adjustment value is imported in this latch register (latch register), turns back to step 2 again; Step 6, the numerical value that will import this latch register (latch register) at last writes the nonvolatile memory of this integrated circuit.
Preferably, this external device (ED) is cd-rom recorder or tester table, and this external device (ED) is for carrying out the device of this step 6.
Preferably, this internal simulation circuit is a low-voltage testing circuit, and this output valve is level transition judgment signal, and this respective value is a practical power voltage.
Preferably, this nonvolatile memory may be selected to be EPROM, EEPROM, FLASH ROM and other kind nonvolatile memory one of them.
This shows that the present invention can improve the parameter accuracy of integrated circuit and reduce the manufacturing cost of integrated circuit.
Description of drawings
Fig. 1 is first kind of known method for regulating integrate circuit parameter.
Fig. 2 is second kind of known method for regulating integrate circuit parameter.
Fig. 3 is for using the integrated circuit block diagram of external device (ED) adjustment integrated circuit provided by the present invention.
Fig. 4 is the internal circuit configuration schematic diagram of the low-voltage testing circuit of Fig. 3.
Fig. 5 is the source data table of the default supply voltage value (VS) that low-voltage testing circuit read of Fig. 3.
Fig. 6 is the level transition judgment signal schematic diagram of the low-voltage testing circuit of Fig. 3.
Fig. 7 utilizes the present invention to come the flow chart of the frequency of oscillation output valve of adjustment RC oscillating circuit.
Fig. 8 utilizes the present invention to detect the flow chart of the low-voltage state switching points of low-voltage testing circuit.
Wherein, description of reference numerals is as follows:
1 integrated circuit
11 RC oscillating circuits
12 Trim?Pad
2 integrated circuits
21 test patterns
22 internal circuits
221 RC oscillating circuits
222 low-voltage testing circuits
23 nonvolatile memories
24 I/O units
3 integrated circuits
31 I/O units
32 nonvolatile memories
33 multiplexers
331 inputs
332 second inputs
34 signal input end
35 latch registers
36 internal circuits
361 RC oscillating circuits
3611 comparators
362 low-voltage testing circuits
4 cd-rom recorders
41 detecting patterns
42 adjustment patterns
43 burning patterns
The frequency of oscillation value adjusting process of 5 RC oscillating circuits
51～56 flow processs
The low-voltage state switching points adjusting process of 6 low-voltage testing circuits
61～66 flow processs
Embodiment
See also shown in Figure 3ly, it is for using the integrated circuit block diagram of external device (ED) adjustment integrated circuit provided by the present invention.Wherein this integrated circuit 3 comprises I/O unit 31, nonvolatile memory 32, multiplexer 33, signal input end 34, latch register (latch register) 35, and internal simulation circuit 36, and this internal simulation circuit 36 comprises RC oscillating circuit 361 and low-voltage testing circuit (LVD) 362.This multiplexer 33 is two pairs of multiplexers, also be that it has the first input end 331 and second input 332 and the output, this multiplexer is selected the data of first or second input are exported according to the difference of the value of statistical indicant (0 or 1) of signal input end 34, wherein this first input end 331 is electrically connected to an end of this nonvolatile memory 32, and the other end of this nonvolatile memory 32 is electrically connected to this I/O unit 31 again; And this second input 332 is electrically connected to this I/O unit 31.The input of this latch register 35 is electrically connected to the output of this multiplexer 33, the output of this latch register 35 then is electrically connected to the input of this RC oscillating circuit 361 and the input of this low-voltage testing circuit 362, can select to export to this RC oscillating circuit 361 or this low-voltage testing circuit 362 according to the difference (frequency of oscillation or supply voltage) of control analog parameter.
Wherein this external device (ED) is the cd-rom recorder 4 that has detecting pattern 41 and adjustment pattern 42 in, the frequency of oscillation value that the output that can utilize this detecting pattern 41 to detect these RC oscillating circuits 361 is exported, or the level transition judgment signal exported of the output of this low-voltage testing circuit 362.In the present embodiment,, yet be not limited thereto during practical application, can the device that utilizes tester table or other to have the burning function replaces though this external device (ED) is to explain with cd-rom recorder.
Wherein when this detecting pattern is detection RC oscillating circuit, detected frequency of oscillation value and preset value can be made comparisons, if this frequency of oscillation value exceeds the preset value scope, then switch to adjustment pattern 42 to obtain the adjustment value, and this adjustment value imported this I/O unit 31, yet if this frequency of oscillation value does not exceed the preset value scope, then needn't switch to this adjustment pattern 42, and can directly it be imported this I/O unit 31, and burning pattern 43 itself that utilize this cd-rom recorder 4 to have writes this nonvolatile memory 32.In like manner, when this detecting pattern 41 is when detecting low-voltage testing circuit 362, can detect level transition judgment signal, and pairing practical power voltage of this level transition judgment signal and preset value made comparisons, if this practical power voltage exceeds the preset value scope, then switch to adjustment pattern 42 to obtain the adjustment value, and this adjustment value imported this I/O unit 31, yet if pairing this practical power voltage of this level transition judgment signal does not exceed the preset value scope, then this practical power magnitude of voltage can be considered desirable low-voltage state switching points, therefore can switch to this adjustment pattern 42 again, and directly import this I/O unit 31, and burning pattern 43 itself that utilize this cd-rom recorder 4 to have writes this nonvolatile memory 32.
When above-mentioned adjustment pattern 42 starts, also simultaneously this value of statistical indicant is set as corresponding numerical value (being assumed to be 1), make multiplexer 33 can select the data of second input 332, in like manner, in the time needn't starting this adjustment pattern 42, this value of statistical indicant is set as corresponding numerical value (being assumed to be 0) too, makes multiplexer 33 can select the data of first input end 331.
By above-mentioned circuit structure, suppose to wish to get the frequency of oscillation value of an accurate RC oscillating circuit 361, at first can import the frequency of oscillation initial value to this latch register 35, and then utilize RC oscillating circuit 361 to read this initial value and produce the frequency of oscillation value, and export this frequency of oscillation value to this cd-rom recorder 4, then, utilize the detecting pattern 41 of this cd-rom recorder 4 again, this frequency of oscillation value and preset value are compared, when if this frequency of oscillation value exceeds the preset value scope, then this cd-rom recorder 4 is switched to adjustment pattern 42, and the value of statistical indicant of integrated circuit 3 is made as 1, and begin this frequency of oscillation value is done the adjustment action to obtain the adjustment value, and this adjustment value is inputed to this I/O unit 31, at this moment, because this value of statistical indicant is 1, therefore multiplexer 33 can utilize second input 332 to go to read adjustment value on this I/O unit 31, and deposits this adjustment value in latch register 35.And then read this adjustment value and produce the frequency of oscillation value again from this latch register 35 by this RC oscillating circuit 361, then, again this cd-rom recorder 4 is switched to detecting pattern 31 and do to detect again.Above-mentioned action can be carried out repeatedly, till the frequency of oscillation value falls into the preset value scope, at this moment, owing to found best adjustment value, so this cd-rom recorder 4 just needn't switch to this adjustment pattern 42, this value of statistical indicant also can be reset to 0, so multiplexer 33 can utilize first input end 331, and should the best adjustment value write non-volatile memory 32.In addition, if when carrying out detecting pattern 41 for the first time, its frequency of oscillation value has fallen into the scope of preset value, then can utilize this cd-rom recorder 4 directly this initial value to be considered as best adjustment value and write non-volatile memory 32.
See also Fig. 4, it is the internal circuit configuration schematic diagram of the low-voltage testing circuit of Fig. 3.This low-voltage testing circuit 362 comprises first resistance (R1), second resistance (R2) and comparator 3611, can be used to detect the low-voltage state switching points of the supply voltage (VD) of any circuit.Wherein the difference of the default supply voltage value (VS) that can be imported according to this latch register 35 of this second resistance changes the practical power magnitude of voltage that A is ordered, and the practical power magnitude of voltage that A is ordered can be exported comparative result after making comparisons with the reference level of this comparator 3611 with the level transition judgment signal (0 or 1) of correspondence.
See also Fig. 5, it is the source data table of the default supply voltage value (VS) that low-voltage testing circuit read of Fig. 3.For instance, suppose that the default desirable low-voltage state switching points of low-voltage testing circuit is 3V, then can utilize 3V to be datum mark, set up a tables of data in advance, and then from this tables of data, select suitable numerical value to import this low-voltage testing circuit.
See also Fig. 6, it is the level transition judgment signal schematic diagram of the low-voltage testing circuit of Fig. 3.By this figure as can be known, when the practical power magnitude of voltage of ordering as A among Fig. 4 is 3V, when representing that promptly the low-voltage state switching points is 3V, so level transition judgment signal local discontinuous at 3V.
See also Fig. 3 to Fig. 5, for this low-voltage state switching points can be fallen in the set error range of preset value, at first, the default supply voltage value of 3V in this tables of data can be inputed to this latch register 35, and then utilize this low-voltage testing circuit 362 to read this value, and at practical power magnitude of voltage of A point generation, then the reference level of this practical power magnitude of voltage and this comparator is made comparisons, and produce level transition judgment signal according to the result after relatively, and then the detecting pattern that utilizes this external device (ED) detects this level transition judgment signal, and pairing this practical power voltage of this level transition judgment signal and preset value made comparisons, when if this practical power voltage exceeds the preset value scope, then this cd-rom recorder 4 is switched to adjustment pattern 42, and the value of statistical indicant of integrated circuit 3 is made as 1, and according to the difference of practical power magnitude of voltage and this preset value, choose suitable VS value as the adjustment value from the tables of data of Fig. 5, and this adjustment value inputed to this I/O unit 31, because follow-up processing operation is identical during all with this RC oscillating circuit of adjustment, so repeat no more.
See also Fig. 7, it is to utilize the present invention to come the flow chart of the frequency of oscillation output valve of adjustment RC oscillating circuit.In order to solve the deficiencies in the prior art, the invention provides a kind of method for regulating integrate circuit parameter, it comprises the following steps:
At first carry out step 51, the input initial value is to the latch register of this IC interior;
Carry out step 52 again, utilize the RC oscillating circuit of this IC interior to read the numerical value of last this latch register of input, and utilize this numerical value to produce the frequency of oscillation output valve;
Carry out step 53 again, utilize the detecting pattern of cd-rom recorder, detect this frequency of oscillation output valve;
Carry out step 54 again, judge whether this frequency of oscillation output valve exceeds the preset value scope, if exceeding this preset value scope then carry out step 55, otherwise, then carry out step 56; For example, suppose to wish to get the frequency of oscillation output valve of a 100MHz, at first, can earlier initial value be made as 100MHz, and preset value is made as ± 1% frequency of oscillation side-play amount, therefore if the detected frequency of oscillation output valve of detecting pattern scope between 99～101MHz, then be considered as satisfying specification requirement, yet during practical application, factor such as Chang Yinwei process drift or circuit design are non-linear, make the side-play amount of frequency of oscillation output valve exceed ± 1%, at this moment, then carry out step 55, otherwise, if side-play amount do not exceed ± and 1% o'clock, then carry out step 56;
Step 55 is utilized the adjustment pattern of this external device (ED), and this frequency of oscillation output valve of adjustment to be obtaining the adjustment value, and this adjustment value is imported in this latch register, turns back to step 55 again; For example, in step 53, suppose that the detected frequency of oscillation output valve of detecting pattern is 110MHz, this frequency of oscillation output valve is through after the comparison of step 54, because its value surpasses ± 1% preset value scope, therefore cd-rom recorder can be switched to the adjustment pattern, utilize mathematical algorithm (for example two fens approximatiosses) this frequency of oscillation output valve of adjustment of adjustment pattern again, and the adjustment value of adjustment gained deposited in this latch register, read this adjustment value as the frequency of oscillation output valve by this RC oscillating circuit from this latch register again, return step 53 and do to detect again, after the frequency of oscillation output valve falls into the preset value scope, carry out step 56 again.
Step 56 writes the value of importing this latch register at last the nonvolatile memory of this integrated circuit.
See also Fig. 8, it is to utilize the present invention to come the flow chart of the low-voltage state switching points of adjustment low-voltage testing circuit.In order to solve the deficiencies in the prior art, the invention provides a kind of method for regulating integrate circuit parameter, it comprises the following steps:
At first carry out step 61, the input initial value is to the latch register of this IC interior;
Carry out step 62 again, utilize the low-voltage testing circuit of this IC interior to read the numerical value of last this latch register of input, and utilize this numerical value to produce practical power voltage, this practical power voltage is the low-voltage state switching points, and then this practical power voltage and reference level made comparisons, to produce level transition judgment signal;
Carry out step 63 again, utilize the detecting pattern of cd-rom recorder, detect this level transition judgment signal;
Carry out step 64 again, judge whether the pairing practical power voltage of this level transition judgment signal exceeds the preset value scope, if exceeding this preset value scope then carry out step 65, otherwise, then carry out step 66; For example, the ideal value of supposing the low-voltage state switching points is 3V (that is to say that practical power voltage is necessary for 3V), at first, can earlier initial value be made as 3V, and to set up one be the tables of data of datum mark with 3V, suppose that this moment, preset value was made as ± 3% side-play amount, then when the detected low-voltage state switching points of detecting pattern is between 2.91～3.09V, can be considered and satisfy specification requirement, yet during practical application, factors such as Chang Yinwei process drift or circuit design are non-linear, make that the side-play amount of low-voltage state switching points exceeds ± 3%, at this moment, then carry out step 65, otherwise, if the side-play amount of the detected low-voltage state switching points of detecting pattern do not exceed ± 3% o'clock, then carry out step 66;
Yet the above only is preferred embodiment of the present invention, when not limiting the scope of the invention with this.Promptly the equalization of doing according to claim of the present invention generally changes and modifies, and will not break away from the spirit and scope of the present invention, and the former capital should be considered as further form of implementation of the present invention.
Claims (13)
1, a kind of method for regulating integrate circuit parameter comprises the following steps:
Step 1: the input initial value is to the latch register of this IC interior;
Step 2: utilize the internal simulation circuit of this integrated circuit to read the numerical value of last this latch register of input, and utilize this numerical value to produce output valve;
Step 3: utilize the detecting pattern of external device (ED), detect this output valve;
Step 4: judge whether this output valve exceeds the preset value scope, if exceeding this preset value scope then carry out step 5, otherwise, then carry out step 6;
Step 5: utilize the adjustment pattern of this external device (ED) to obtain the adjustment value, and this adjustment value is imported in this latch register, turn back to step 2 again; And
Step 6: will import this at last and latch the nonvolatile memory that temporary numerical value writes this integrated circuit.
2, method for regulating integrate circuit parameter according to claim 1, wherein this external device (ED) be cd-rom recorder and tester table one of them.
3, method for regulating integrate circuit parameter according to claim 2, wherein this external device (ED) is the device of execution in step 6.
4, method for regulating integrate circuit parameter according to claim 1, wherein this internal simulation circuit is the RC oscillating circuit.
5, method for regulating integrate circuit parameter according to claim 4, wherein this output valve is a frequency of oscillation.
6, method for regulating integrate circuit parameter according to claim 1, wherein this nonvolatile memory be EPROM, EEPROM and FLASH ROM one of them.
7, a kind of method for regulating integrate circuit parameter comprises the following steps:
Step 1: the input initial value is to the latch register of this IC interior;
Step 2: utilize the internal simulation circuit of this integrated circuit to read the numerical value of last this latch register of input, and utilize this numerical value to produce output valve;
Step 3: utilize the detecting pattern of external device (ED), detect this output valve;
Step 4: whether the respective value of judging this output valve exceeds the preset value scope, if exceeding this preset value scope then carry out step 5, otherwise, then carry out step 6;
Step 5: utilize the adjustment pattern of this external device (ED) to obtain the adjustment value, and this adjustment value is imported in this latch register, turn back to step 2 again; And
Step 6: will import this at last and latch the nonvolatile memory that temporary numerical value writes this integrated circuit.
8, method for regulating integrate circuit parameter according to claim 7, wherein this external device (ED) be cd-rom recorder and tester table one of them.
9, as claim the method for regulating integrate circuit parameter according to claim 8, wherein this external device (ED) is the device of execution in step 6.
10, method for regulating integrate circuit parameter according to claim 7, wherein this internal simulation circuit is a low-voltage testing circuit.
11, method for regulating integrate circuit parameter according to claim 10, wherein this output valve is a level transition judgment signal.
12, method for regulating integrate circuit parameter according to claim 10, wherein this respective value is a practical power voltage.
13, method for regulating integrate circuit parameter according to claim 7, wherein this nonvolatile memory be EPROM, EEPROM and FLASH ROM one of them.
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| CNB2006100771866A CN100429763C (en) | 2006-04-27 | 2006-04-27 | Method for regulating integrate circuit parameter |
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| CNB2006100771866A CN100429763C (en) | 2006-04-27 | 2006-04-27 | Method for regulating integrate circuit parameter |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103870616A (en) * | 2012-12-10 | 2014-06-18 | 上海华虹宏力半导体制造有限公司 | Parameter adjusting system for analog modules |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5428319A (en) * | 1993-11-29 | 1995-06-27 | Motorola, Inc. | Method and apparatus for providing a modified temperature compensation signal in a TCXO circuit |
| US6151238A (en) * | 1999-02-23 | 2000-11-21 | Microchip Technology, Inc. | Calibrating functions of an integrated circuit and storing calibration parameters thereof in a programmable fuse array |
| US6515464B1 (en) * | 2000-09-29 | 2003-02-04 | Microchip Technology Incorporated | Input voltage offset calibration of an analog device using a microcontroller |
| CN1228914C (en) * | 2002-11-09 | 2005-11-23 | 艾默生网络能源有限公司 | Frequency converter control method and device capable of inhibiting open-loop system oscillation |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103870616A (en) * | 2012-12-10 | 2014-06-18 | 上海华虹宏力半导体制造有限公司 | Parameter adjusting system for analog modules |
| CN103870616B (en) * | 2012-12-10 | 2017-06-06 | 上海华虹宏力半导体制造有限公司 | The parameter adjustment system of analog module |
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Granted publication date: 20081029 Termination date: 20200427 |