CN103792484A - 手机pcb板测试装置 - Google Patents
手机pcb板测试装置 Download PDFInfo
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- CN103792484A CN103792484A CN201410034955.9A CN201410034955A CN103792484A CN 103792484 A CN103792484 A CN 103792484A CN 201410034955 A CN201410034955 A CN 201410034955A CN 103792484 A CN103792484 A CN 103792484A
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CN201410034955.9A CN103792484B (zh) | 2014-01-24 | 2014-01-24 | 手机pcb板测试装置 |
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CN201410034955.9A CN103792484B (zh) | 2014-01-24 | 2014-01-24 | 手机pcb板测试装置 |
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CN103792484A true CN103792484A (zh) | 2014-05-14 |
CN103792484B CN103792484B (zh) | 2016-09-28 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104931742A (zh) * | 2015-07-14 | 2015-09-23 | 苏州高新区世纪福科技有限公司 | Pcba射频隔离装置 |
CN105127108A (zh) * | 2015-09-21 | 2015-12-09 | 昆山迈致治具科技有限公司 | 手机屏幕柔性电路板测试设备 |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003194852A (ja) * | 2001-12-26 | 2003-07-09 | Toppan Printing Co Ltd | 半導体回路検査治具 |
CN101150948A (zh) * | 2007-10-30 | 2008-03-26 | 中兴通讯股份有限公司 | 塑料屏蔽罩 |
CN201282485Y (zh) * | 2008-08-05 | 2009-07-29 | 深圳市天立通信息技术有限公司 | 对讲机机芯屏蔽罩结构 |
TW201031936A (en) * | 2009-02-17 | 2010-09-01 | Quanta Comp Inc | Testing system and testing method |
US20110050267A1 (en) * | 2009-08-28 | 2011-03-03 | Stmicroelectronics S.R.L. | Electromagnetic shield for testing integrated circuits |
CN202149910U (zh) * | 2011-06-17 | 2012-02-22 | 惠州Tcl移动通信有限公司 | 电磁屏蔽箱的针板升降结构 |
CN103412250A (zh) * | 2013-07-24 | 2013-11-27 | 昆山迈致治具科技有限公司 | 一种pcb板限位测试治具 |
CN203350303U (zh) * | 2013-07-24 | 2013-12-18 | 昆山迈致治具科技有限公司 | 一种用于测试手机pcb板针点导通的测试治具 |
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2014
- 2014-01-24 CN CN201410034955.9A patent/CN103792484B/zh active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003194852A (ja) * | 2001-12-26 | 2003-07-09 | Toppan Printing Co Ltd | 半導体回路検査治具 |
CN101150948A (zh) * | 2007-10-30 | 2008-03-26 | 中兴通讯股份有限公司 | 塑料屏蔽罩 |
CN201282485Y (zh) * | 2008-08-05 | 2009-07-29 | 深圳市天立通信息技术有限公司 | 对讲机机芯屏蔽罩结构 |
TW201031936A (en) * | 2009-02-17 | 2010-09-01 | Quanta Comp Inc | Testing system and testing method |
US20110050267A1 (en) * | 2009-08-28 | 2011-03-03 | Stmicroelectronics S.R.L. | Electromagnetic shield for testing integrated circuits |
CN202149910U (zh) * | 2011-06-17 | 2012-02-22 | 惠州Tcl移动通信有限公司 | 电磁屏蔽箱的针板升降结构 |
CN103412250A (zh) * | 2013-07-24 | 2013-11-27 | 昆山迈致治具科技有限公司 | 一种pcb板限位测试治具 |
CN203350303U (zh) * | 2013-07-24 | 2013-12-18 | 昆山迈致治具科技有限公司 | 一种用于测试手机pcb板针点导通的测试治具 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104931742A (zh) * | 2015-07-14 | 2015-09-23 | 苏州高新区世纪福科技有限公司 | Pcba射频隔离装置 |
CN105127108A (zh) * | 2015-09-21 | 2015-12-09 | 昆山迈致治具科技有限公司 | 手机屏幕柔性电路板测试设备 |
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Publication number | Publication date |
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CN103792484B (zh) | 2016-09-28 |
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Address after: 215121 Suzhou high tech Zone, Kunlun, No. 189 Jiangsu Road Applicant after: SUZHOU HI-TECH ZONE SIFO TECHNOLOGY CO., LTD. Address before: Suzhou City, Jiangsu province 215121 Industrial Park Weiting Double Road No. 2 Applicant before: SiFO Technology Co., Ltd. |
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Address after: 215000 No. 189 Kunlun Shan Road, Suzhou high tech Zone, Jiangsu Patentee after: SIFO TECHNOLOGY (SND) CO., LTD. Address before: 215121 Kunlunshan Road 189, Suzhou High-tech Zone, Jiangsu Province Patentee before: SUZHOU HI-TECH ZONE SIFO TECHNOLOGY CO., LTD. |