CN103776541A - Measuring mode selecting device and measuring mode selecting method - Google Patents
Measuring mode selecting device and measuring mode selecting method Download PDFInfo
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Abstract
The invention discloses a measuring mode selecting device and a measuring mode selecting method, and relates to the application field of a thermal imaging device, a thermal image processing device and infrared detection. A thermal imaging device in the prior art requires a user to set parameters such as types of constitution data or the display size or the like when being applied to different measurement purposes, which makes the operation to be tedious and difficult. According to the thermal imaging measuring mode selecting device and the thermal imaging measuring mode selecting method, a measuring mode is selected, and data types, position rules and combination parameters are automatically selected according to configuration information of the measuring mode, thereby enabling operations of the user to be simple.
Description
Technical field
Measurement pattern selecting arrangement of the present invention and measurement pattern system of selection, relate to thermal imagery device, thermal imagery treating apparatus, and the application of infrared detection.
Background technology
Patent documentation application number: 201210008404.6 disclose a kind of thermal imaging device, in infrared thermal imagery, overlapping demonstration represents the reference picture of the predetermined morphological feature of subject, user is using reference picture as the vision reference of taking subject thermal imagery, carry out the shooting of subject, can increase substantially shooting quality.
But in the time that the shooting of subject is had to multiple different measurement object, often need to adjust the shooting position of subject or different shooting distances, for example, user takes subject according to reference picture, when having found the position of query, need to further observe time, conventionally need to walk close to subject observes, at this moment, reference picture originally can not meet the use of observation, need user to reselect the composition data of reference picture or different location rule is set, to obtain the reference picture of the vision reference of tackling this shooting object, make operation become loaded down with trivial details, for unskilled user, how applicable reference picture is set and meets the needs of measuring, it is perplexing problem.
Therefore, understand need a kind of measurement pattern selecting arrangement, it can be realized easily according to different measurement objects, call the reference picture corresponding with measuring object in good time, reach without depending on the accumulation of experience and subjective idea unduly, can assist user to understand object and the requirement of infrared detection.
In addition, for infrared detection, also have some and Measurement and analysis Relevant Analysis region and analytical model, arranging of the analyzed area of prior art and analytical model need to rely on user to understand to arrange to the detection of subject.Wherein, analyzed area correspondence in infrared thermal imagery, need analyze position, the combination of the territory elements such as such as point, line, surface or multiple territory elements; Analytical model has represented that the thermal-image data determining based on analyzed area carries out provision discussion and obtains the analytical calculation rule that analysis result adopts, for example calculate maximum temperature, medial temperature, minimum temperature, degree etc., and, also can comprise that calculated relationship between each territory element is as temperature difference etc.In the time measuring object and change, need again to reset analyzed area and analytical model, execute-in-place is loaded down with trivial detailsly easily to make mistakes again.For above-mentioned reasons, user carries out simple analysis operation by rule of thumb at present, as in most cases, highest temperature automatic capturing is set, but this extensive analysis mode, the measurement result reference value while making to take lowers.
Further object, it can assist user to be convenient to obtain analyzed area and the analytical model for subject according to measuring object, obtains reliable analysis result;
Also unusual trouble of the setting of diagnostic rule, needs the understanding of user to subject diagnosis, complex operation; Further object, it can assist user to be convenient to obtain diagnostic rule according to measuring object, obtains the result of intelligent diagnostics.Thus, make common user also can reach good shooting level of skill, and make simple to operate.
Summary of the invention
The defect existing for prior art, the invention provides a kind of measurement pattern selecting arrangement and measurement pattern system of selection, the measurement pattern information corresponding according to selected measurement pattern, carry out the control of the common demonstration of reference picture and infrared thermal imagery, described measurement pattern information at least comprises in the regulation specified type, location rule, display parameter of the composition data of reference picture.Using this reference picture as the vision reference of taking subject thermal imagery.Thus, make common user also can reach good shooting level of skill.
For this reason, by the following technical solutions, measurement pattern selecting arrangement, comprising in the present invention: acquisition unit, for obtaining thermal-image data; Measurement pattern selection portion, for State selective measurements pattern; Display control unit, shows reference picture and the infrared thermal imagery that the thermal-image data obtaining generates for controlling jointly, and described reference picture is arranged in infrared thermal imagery; Wherein, described display control unit, according to the selected measurement pattern of measurement pattern selection portion, carries out the control of the common demonstration of reference picture and infrared thermal imagery.Reach the beneficial effect of being convenient to select or convert according to measurement object reference picture effect.
Further, measurement pattern selecting arrangement, comprising: acquisition unit, for obtaining thermal-image data; Measurement pattern selection portion, for State selective measurements pattern; Display control unit, shows reference picture and the infrared thermal imagery that the thermal-image data obtaining generates for controlling jointly, and described reference picture is arranged in infrared thermal imagery; Thermal imagery analysis portion, analyzes for the thermal-image data that acquisition unit is obtained, and obtains analysis result; Wherein, described display control unit, according to selected measurement pattern, carries out the control of the common demonstration of reference picture and infrared thermal imagery, and/or described thermal imagery analysis portion is according to selected measurement pattern, the control of analyzing.Reach and be convenient to select or convert reference picture effect according to measuring object, and/or the beneficial effect of analyzed area and analytical model.
Further, acquisition unit, for obtaining thermal-image data; Measurement pattern selection portion, for State selective measurements pattern; Display control unit, shows reference picture and the infrared thermal imagery that the thermal-image data obtaining generates for controlling jointly, and described reference picture is arranged in infrared thermal imagery; Thermal imagery diagnosis portion, carries out analyzing and diagnosing for the thermal-image data that acquisition unit is obtained, and obtains diagnostic result; Wherein, described display control unit, according to selected measurement pattern, carries out the control of the common demonstration of reference picture and infrared thermal imagery, and/or described thermal imagery diagnosis portion, according to selected measurement pattern, carries out the control of analyzing and diagnosing.Reach and be convenient to select or convert reference picture according to measuring object, and/or the beneficial effect of analyzed area, analyzing and diagnosing rule.
Further, described reference picture has embodied the morphological feature of subject.Reach the beneficial effect of being convenient to reference to taking.
Further, there is subject Information Selection portion, for selecting subject information; Described display control unit is according to selected subject information, and the composition data of this subject information association based on storing in storage medium, specifies the composition data for obtaining reference picture.Reach subject information and the measurement pattern be convenient to according to selecting and obtained the beneficial effect of taking the photograph the applicable reference picture of bulk measurement object (further having analyzed area, analytical model, diagnostic rule) for this.
Further, there is measurement pattern information display control unit, make display part show the measurement pattern selection information relevant with measurement pattern for controlling, it can be the information of one or more combinations in word, icon, thumbnail that described measurement pattern is selected information.Reach to be convenient to understand and measured object and carry out the beneficial effect of State selective measurements pattern.
Further, described mode selection part response user selects the selection of information to measurement pattern, carry out State selective measurements pattern.
Further, subject Information Selection portion, for selecting subject information; Described measurement pattern information display control unit is according to selected subject information, and the composition data of this subject information association based on storing in storage medium, carrys out display measurement model selection information; Described measurement pattern selection information is the thumbnail that the composition data regulation specified type corresponding according to measurement pattern and location rule obtain, embodied the corresponding reference picture of measurement pattern with reference to effect.Reach and be convenient to the beneficial effect of State selective measurements pattern intuitively.
Measurement pattern system of selection of the present invention, comprising: obtaining step, for obtaining thermal-image data; Measurement pattern is selected step, for State selective measurements pattern; Show and control step, for controlling, reference picture and the infrared thermal imagery that the thermal-image data obtaining generates are shown jointly, described reference picture is arranged in infrared thermal imagery; Wherein, described demonstration control step is selected the selected measurement pattern of step according to measurement pattern, carries out the control of the common demonstration of reference picture and infrared thermal imagery.
Other aspects of the present invention and advantage will be set forth by instructions below.
Accompanying drawing explanation:
Fig. 1 is the block diagram of the electrical structure of the thermal imagery device of embodiment 1.
Fig. 2 is the external form figure of the thermal imagery device of embodiment 1.
Fig. 3 is the subject information of storing in storage medium and the enforcement schematic diagram of composition data.
Fig. 4 is composition data, analytical model, the diagnostic rule of the subject information of storing in storage medium and multiple types, the enforcement schematic diagram of measurement pattern.
Fig. 5 is the example of reference picture, and wherein 501 is to represent translucent reference picture, the common display case showing of infrared thermal imagery; The 502nd, represent the reference picture of subject edge contour, the display case of the common demonstration of infrared thermal imagery; The 503rd, represent the reference picture of subject texture, the display case of the common demonstration of infrared thermal imagery.
Fig. 6 is the common display case showing of analyzed area, infrared thermal imagery that represents prior art.
Fig. 7 is the common display case showing of reference picture, infrared thermal imagery that represents analyzed area and edge contour image.
Fig. 8 is the analyzed area F10 of representative processing acquisition and the common display case showing of reference picture, infrared thermal imagery that this transparent image TU1 forms.
Fig. 9 is the schematic diagram that the thermal imagery device of embodiment arranges menu.
Figure 10 is the schematic diagram that menu interface is set of object processing.
Figure 11 is the schematic diagram that menu interface is set of calculation and object.
Figure 12 has given an example 5 kinds by calculating or processing, the effect of the analyzed area of acquisition.
Figure 13 is the schematic diagram that menu interface is set that comprises the measurement pattern 1 of the configurations such as reference picture, analyzed area, analytical model, diagnostic rule.
Figure 14 is the schematic diagram that menu interface is set of analytical model corresponding to analyzed area, diagnostic rule.
Figure 15 comprises that the switching one of the measurement pattern 3 of the configurations such as reference picture, analyzed area, analytical model, diagnostic rule arranges the schematic diagram of menu interface.
Figure 16 comprises that the switching two of the measurement pattern 2 of the configurations such as reference picture, analyzed area, analytical model, diagnostic rule arranges the schematic diagram of menu interface.
Figure 17 is the control flow chart that represents an example measuring reference pattern.
Figure 18 for utilize selected (measurement pattern 1, measurement pattern 3, measurement pattern 2) to subject 1 take, the schematic diagram of the display interface of diagnostic procedure.
Figure 19 is the designated treatment process flow diagram of the composition data of reference picture.
Figure 20 is the position set handling process flow diagram of reference picture.
Figure 21 is definite processing flow chart of the composition data of analyzed area.
Figure 22 is definite processing flow chart of analytical model, diagnostic rule.
Figure 23 is the set handling that analyzed area is arranged in the location parameter of infrared thermal imagery.
Figure 24 is the position set handling process flow diagram of analyzed area.
Figure 25 is definite processing flow chart of synthetic parameters.
Figure 26 is the schematic diagram that measurement pattern is selected the display interface of information.
Figure 27 is the schematic diagram that measurement pattern is selected another display interface of information.
Figure 28 is the block diagram of the electrical structure of a kind of enforcement of the thermal imagery model selection system that connects and composes of thermal imagery treating apparatus 100 and thermal imagery filming apparatus 101.
Figure 29 is the schematic diagram of a kind of enforcement of the thermal imagery model selection system that connects and composes of thermal imagery treating apparatus 100 and thermal imagery filming apparatus 101.
Embodiment
With reference to accompanying drawing, embodiments of the present invention are described.Note, the embodiment that below will illustrate is for understanding better the present invention, and do not limit the scope of the invention, and can change over the various forms in the scope of the invention.Wherein, so-called thermal-image data, can be thermal imagery AD Value Data (data that for example infrared eye output signal obtains after AD conversion), or the view data of infrared thermal imagery, or the array data of temperature value, or other data that generate based on thermal imagery AD Value Data etc.The example of embodiment 1 using thermal imagery device 13 as measurement pattern selecting arrangement.
The structure of the thermal imagery device 13 of embodiment 1 is described with reference to figure 1.Fig. 1 is the block diagram of the electrical structure of the thermal imagery device 13 of embodiment.
Thermal imagery device 13 has shoot part 1, image processing part 2, aobvious control portion 3, display part 4, communication I/F5, interim storage part 6, storage card I/F7, storage card 8, flash memory 9, control part 10, operating portion 11, control part 10 is connected with above-mentioned appropriate section with data bus 12 by controlling, and is responsible for the overall control of thermal imagery device 13.Control part 10 is for example realized by CPU, MPU, SOC, programmable FPGA etc.
The processing of image processing part 2 for the thermal-image data obtaining by shoot part 1 is stipulated, the processing of image processing part 2 is as correction, interpolation, pseudo-color, synthetic, compression, decompress(ion) etc., is converted to and is suitable for showing the processing of using etc. data with, record.Image processing part 2 obtains the view data of infrared thermal imagery for shoot part 1 being taken to the processing of the thermal-image data enforcement regulation obtaining, for example, image processing part 2 is taken to shoot part 1 thermal-image data obtaining and is carried out the predetermined processing such as Nonuniformity Correction, interpolation, thermal-image data after predetermined processing is carried out to the color processing of puppet, obtain the view data of infrared thermal imagery; Pseudo-color a kind of embodiment of processing, for example determine corresponding pseudo-colored steel scope according to the setting range of the scope of thermal-image data (AD value) or AD value, view data using the concrete color value of thermal-image data correspondence in pseudo-colored steel scope as its respective pixel position in infrared thermal imagery, at this, gray scale infrared image can be considered as a kind of special case in pcolor picture.And, the record indication based on control part 10, image processing part 2 is for processing by thermal-image data compression according to the rules the thermal-image data obtaining after compression, and then this thermal-image data is recorded to as storage card 8 storage mediums such as grade.In addition, based on the control of control part 10, image processing part 2 is carried out the various processing relevant with image processing, for example, make the increase and decrease of pixel change the processing of view data size, for example shear treatment to view data; Image processing part 2 for example can adopt DSP or other microprocessors or programmable FPGA etc. to realize, or, also can be integrated with control part 10.
Show the control that control portion 3 carries out according to control part 10, the view data of carrying out the demonstration use that interim storage part 6 is stored is presented at display part 4.Particularly, show control portion 3 and there are VRAM, VRAM control module, signal generation unit etc., from VRAM, regularly read out under the control of control part 10, read and store into the view data of VRAM from interim storage part 6, the output of generation vision signal, is presented at display part 4.In thermal imagery device 13, display part 4 is as the example of display part.Be not limited to this, display part can also be other display device that are connected with thermal imagery device 13, and can there is no display part in the electrical structure of thermal imagery device 13 self.Showing control portion 3 can be integrated with image processing part 2 or control part 10.
Communication I/F5 is for example according to communication specifications such as USB, 1394, networks, thermal imagery device 13 is connected to the also interface of exchanges data with external device (ED), as external device (ED), for example, can enumerate personal computer, server, PDA(personal digital assistant device), other thermal imagery device, visible ray filming apparatus, memory storage etc.
Storage card I/F7, as the interface of storage card 8, on storage card I/F7, be connected with the storage card 8 as rewritable nonvolatile memory, be arranged in the draw-in groove of thermal imagery device 13 main bodys detachable, record the data such as thermal-image data according to the control of control part 10.
Flash memory 9, stores the program for controlling, and the various data that use in each several part control.
Operating portion 11: carry out various indication operations for user, or input the various operations such as set information, control part 10, according to the operation signal of operating portion 11, is carried out corresponding program.With reference to figure 2, operating portion 11 is described, provides that button that user operates records that key 21, switch key 22, focusing key 23, menu are strong 24, mode key 25, processing key 26, acknowledgement key 27, directionkeys 28, key position 29, playback key 30 etc.; Wherein, record key 21 for recording operation; Switch key 22 is for the synthesis of the blocked operation of object etc.; Focusing key 23 is for the operation of focusing; Menu strong 24 is for entering or exit the operation of menu mode; Mode key 25 is for entering or exit measurement reference pattern; Processing key 26 is for entering or exit cooked mode; Acknowledgement key 27 is for confirming operation; Directionkeys 28 is for carrying out the selection of menu entries etc.; Key position 29 is for entering or exit orientation detection pattern; Playback key 30 is for entering or exit playback mode.Be not limited to this, also can adopt touch-screen 31 or speech recognition component (not shown) etc. to realize relevant operation.
Below, the nouns such as the storage medium occurring herein, reference picture, composition data, morphosis data, auxiliary composition data, analyzed area, analytical model, calculating object, processing object, main object, location parameter, positional information, adaptive region, self-adaptation are described.
Storage medium, can be the storage medium in thermal imagery device 13, as non-volatile memory mediums such as flash memory 9, storage cards 8, and the volatile storage medium such as interim storage part 6; Can also be and wired or wireless other storage mediums that are connected of thermal imagery device 13, as by with communication I/F5 wired or wireless be connected other install as the storage medium in other memory storages, thermal imagery device, computer etc. or the storage medium of network destination.Preferably, the data in advance such as composition data be stored in thermal imagery device 13 or connected non-volatile memory medium (as flash memory 9) in.
Embody the reference picture of subject morphological feature, for example, with reference to the image of the common demonstration of the reference picture shown in figure 5 and infrared thermal imagery, the reference picture TU1(shown in 501 is translucent), embody the texture of subject, also embody the profile of subject, thereby, more lively easy to understand, such reference picture, the visible images of such as subject, infrared thermal imagery, the pre-rendered image that comprises the feature such as texture and profile, be generally translucent demonstration; Reference picture T1(edge contour image shown in 502, can be opaque or translucent), the reference picture W1(texture image shown in 503, can be opaque or translucent), other location of pixels beyond in lap position can show infrared thermal imagery by all-transparent.Morphological feature can be subject entirety or local morphological feature.
Composition data, refer to the composition data relevant with reference picture, analyzed area etc., it can be vector figure data, also can be dot array data, or include vector figure data and dot array data simultaneously, dot array data, for example, can be dot matrix image data, can be as the dot array data of thermal-image data etc.Composition data can be divided into morphosis data and auxiliary composition data; For obtaining as shown in Figure 5, the composition data that has embodied the reference picture of subject morphological feature is called morphosis data, the reference picture that has embodied morphological feature can be by one or more morphosis data, or morphosis data obtain in conjunction with auxiliary composition data; Being used for obtaining the composition data of reference picture that has embodied morphological feature can be one or more, but wherein at least comprises morphosis data.
Auxiliary composition data, in an embodiment, the composition data beyond morphosis data is called auxiliary composition data, for example, for obtaining analyzed area, analyzed area F1 as shown in Figure 6, the analyzed area that can arrange for prior art, but while using separately in shooting with reference to a little less than property.Preferably, jointly obtain reference picture by morphosis data and auxiliary composition data, jointly show with analyzed area image F1 and infrared thermal imagery with reference to the contour images T1 shown in figure 7, this prompting is provided, by promote T1 with reference to effect, and shortcoming a little less than having avoided F1 with reference to property.
In an embodiment, morphosis data in storage medium, have at least been stored.Composition data can be stored in storage medium as the form such as image file, graphic file with the corresponding file of composition data, can be to be stored in storage medium, the thermal-image data that also can be taken by thermal imagery device 13 etc. or also obtain through predetermined processing after making in outer computer.Also mode that can database is stored composition data, and composition data can corresponding specific fields storage.Preferred mode, auxiliary composition data and morphosis data are associated with storing at storage medium, and have stored the assigned position relation between the object of the two acquisition.
Analyzed area correspondence in infrared thermal imagery, need analyze position, the combination of the territory elements such as such as point, line, surface or multiple territory elements; In an embodiment, the composition data that is used for obtaining analyzed area can be morphosis data and/or auxiliary composition data.
With reference to the table (hereinafter referred to as table 3) shown in figure 3, a kind of preferred implementation of the composition data of storing in storage medium is described, store morphosis data of multiple subject information and each subject information association.Multiple subject information, the morphosis data (T1 composition data-T3 composition data etc.) that each subject information is corresponding, carry out association by table 3; In addition, if carry out associated mode by the index information (as filename etc.) of storing morphosis data in table 3, in storage medium also respective stored the file of morphosis data corresponding to index information (as filename etc.).Wherein, subject information is the information relevant with subject, for example, represent one or more combination of the information of subject place, type, numbering, title etc.In table 3, identical morphosis data that subject information (for example subject 3 in table 3, subject 4) that part is different is associated.In the occasion of infrared detection, often there are the different subjects that a large amount of profiles are identical, adopt the mode of subject information as shown in table 3 and morphosis data correlation to store morphosis data, being convenient to user selects according to on-the-spot cognitive subject information, the puzzlement of having avoided composition data to select mistake to cause, and can reduce data redundancy.
With reference to the table (hereinafter referred to as table 4) shown in figure 4, the another kind of preferred implementation of the composition data of storing in storage medium is described, store multiple composition datas of multiple subject information and each subject information association.As shown in table 4, (type of morphosis data has multiple composition datas of multiple subject information associations: benchmark 1, benchmark 2, the type of auxiliary composition data has: auxiliary 1, auxiliary 2), the analytical model information of " analytical model 1 " while obtaining analyzed area for auxiliary 1 composition data, obtain for all types of composition datas analyzed area time corresponding " analytical model 2 " analytical model information, the information of measurement pattern 1, the information of measurement pattern 2.Wherein, also stored the information of the assigned position relation between the object that the each composition data of same subject information association obtains, wherein assigned position relation refers to the relative position relation of regulation.Particularly, for example, under storage virgin state (be not subjected to displacement, the state of convergent-divergent, rotation under), the positional information of the object that the object that the composition data of the benchmark 2 of same subject information association, benchmark 3, auxiliary 1 type obtains obtains with respect to the composition data of benchmark 1 type respectively (coordinate position or also have size or also have the information of the anglec of rotation); In addition, assigned position relation can be also such form of expression, stores all types of objects and lay respectively at the positional information (coordinate position or also have the information of size, the anglec of rotation) of (for example, in infrared thermal imagery) in same reference system.In table 4, the information of assigned position relation is as an attribute of composition data, in addition, and the information of the assigned position relation that also can store separately.In addition, if carry out associated mode by the index information (as filename etc.) of storing composition data in table 4, in storage medium also respective stored the file of composition data corresponding to index information (as filename etc.).In table 4, the type storage of classifying according to the rules of various composition datas, the display effect classification of the object for example obtaining according to composition data, benchmark 1 correspondence profile, benchmark 2 correspondences the infrared thermal imagery of prior processing (for example local standard subject thermal imagery), auxiliary 1 correspondence pay close attention to region.In addition also can classify according to taking purposes, data type (vector figure data, dot array data) etc.; In addition, classification be not limited to single composition data, also can to multiple composition datas constitute classify.In addition, be not limited to the form of implementation of table 4, other embodiment for example, also can only be stored composition data with the form of graphic file, image file, or further adopt file to classify to these files in storage medium.
Although, as the embodiment of table 4, the information of the assigned position relation between the object that the composition data of pre-stored same subject information association obtains in storage medium; But also can not store, for example, give the relation of the assigned position between object by user, or give the relation of the assigned position between object by the default location rule of thermal imagery device 13.In addition, for the composition data that appointed object calculates and/or processing obtains, and appointed object or and appointed object there is the assigned position relation between other objects of assigned position relation, can be decided by corresponding computation rule, processing rule, for example, by the analyzed area obtaining after the distortion of profile convergent-divergent, the assigned position relation of itself and profile, can be decided by the basic point of convergent-divergent and distortion, convergent-divergent and deformation rate.Hereinafter, the assigned position relation between the object that composition data obtains, sometimes also referred to as the assigned position relation between composition data.
Assigned position relation (relative position relation of regulation) based between object, take two objects as example, can be arranged according to one of them object the location parameter (position or also comprise size, the anglec of rotation) of infrared thermal imagery, by keeping the two relative assigned position relation constant, the location parameter that another object is arranged in infrared thermal imagery (position or also comprise size, the anglec of rotation) is set.,, in the time of one of them displacement, the displacement that another object is identical, to keep the relative position of the two constant; In the time that size scaling occurs for one of them,, there is identical convergent-divergent in the basic point of another object based on identical, to keep the size of the two constant thereupon; When one of them rotates angle,, there is the identical anglec of rotation in the basic point of another object based on identical thereupon, to keep the relative rotation angle between the two constant.In special situation, for example an object is another object characteristic of correspondence point (characteristic coordinates point), and in the time that another object is subjected to displacement, identical displacement occurs this unique point thereupon; When another object is during with respect to convergent-divergent basic point convergent-divergent, using this convergent-divergent basic point as true origin, after unique point convergent-divergent with respect to the coordinate (X2 of this convergent-divergent basic point, Y2) equal the front coordinate (X1 with respect to this convergent-divergent basic point of this unique point convergent-divergent, Y1) be multiplied by convergent-divergent rate S, be (X1*S, Y1*S); When reference picture rotates angle P(as counterclockwise), the rotation basic point of unique point based on identical, there is the identical anglec of rotation thereupon, after unique point rotation with respect to the coordinate (X2 of this rotation basic point, Y2) with the front coordinate (X1 with respect to this rotation basic point of this unique point rotation, Y1) relation: (X2, Y2)=(X1cosP-Y1sinP, Y1cosP+X1sinP).
Analytical model has represented that the thermal-image data determining based on analyzed area carries out provision discussion and obtains the analytical calculation rule that analysis result adopts, be calculated as example with temperature value, as calculate maximum temperature, medial temperature, minimum temperature, degree etc., and, also can comprise that calculated relationship between each territory element is as temperature difference etc.But be not limited to the calculating in temperature value, can relate to the analytical calculation rule of the relevant various analyses of thermal-image data or infrared thermal imagery.
Preferably, the analytical model information relevant with analytical model in advance with corresponding composition data association store at storage medium, so that this composition data uses (associated a kind of mode, analytical model or also comprise that diagnostic rule can be used as the attribute information of this composition data) while obtaining analyzed area.Be convenient to like this prepare that complicated analyzed area and analytical model are analyzed and simple to operate.For different subject information, analytical model information can be different for identical or different composition data: in Fig. 4, associated " analytical model 1 " of composition data type " auxiliary 1 ", for the information (F1 pattern information) of the analytical model 1 of subject 1 for calculating: calculate (the analyzed area F1 that F1 composition data obtains, there is territory element S01, S02) maximum temperature of territory element S01 and the maximum temperature of S02, and the difference of S01 and S02 maximum temperature.And the information of the analytical model 1 of subject 2 (F2 pattern information) is: calculate medial temperature and maximum temperature in (the analyzed area F2 that F2 composition data obtains) region, and the difference of maximum temperature and medial temperature.For different subject information, analytical model information can be also general for identical or different composition data; As the information of analytical model 2, for calculating maximum temperature and the medial temperature in the analyzed area that determined composition data obtains, and the difference of maximum temperature and medial temperature; Be applicable to composition data institutes all in table 4 general, can be used as all analytical models of association of all types of composition datas.
Diagnostic rule, for diagnosis, portion obtains analysis result according to analysis portion, and diagnostic rule is diagnosed according to the rules, obtains diagnostic result.Preferably, diagnose according to the diagnostic rule of analytical model association, as the analytical model information in advance diagnostic rule information of association store corresponding according to the analytical model relevant with analysis, the diagnostic rule of acquisition is diagnosed.
Take the diagnostic rule 1 of analytical model 1 association as example: the information (F1 diagnostic rule) of diagnostic rule 1 has comprised correspondence analysis pattern 1(F1 analytical model) at least one diagnosis comparison and diagnosis threshold values; Further, as in power industry, expect directly to obtain the conclusion of diagnosis, 3 kinds of normal, the concerns to subject, defect (may be also a kind of or more than 3 kinds) situation, has respectively corresponding diagnosis threshold values and conclusion.Take the diagnostic rule 1(F1 diagnostic rule of subject 1) as example, comprising:
1) normal: the difference of S01 and S02 maximum temperature is less than 2 ℃; (normal: 2 ℃ of 2 ℃ of S01MAX-S02MAX < or S02MAX-S01MAX <)
2) pay close attention to: the difference of S01 and S02 maximum temperature is less than or equal to 4 ℃, is more than or equal to 2 ℃; (paying close attention to: 2≤S01MAX-S02MAX≤4 ℃ or 2≤S02MAX-S01MAX≤4 ℃)
3) difference of defect: S01 and S02 maximum temperature is greater than 4 ℃; (defect: 4 ℃ of 4 ℃ of S01MAX-S02MAX > or S02MAX-S01MAX >)
Obviously, same analytical model can be to there being the rule of one or more diagnosis, preferred, adopts the analytical model of association store in advance and corresponding diagnostic rule; Further, in diagnostic rule or be associated with diagnosis basis corresponding to conclusion, detailed defect type, defect level, processing suggestion etc.In diagnostic rule or be associated with diagnosis basis corresponding to conclusion, detailed defect type, defect level, processing suggestion etc.And the diagnostic rule 2 of analytical model 2 associations: the maximum temperature in analyzed area and the difference of medial temperature are less than 3 ℃ for normal, and other are defect; For analytical model 2 and diagnostic rule 2 can be not yet with association store such as subject information, composition datas in table 4, and be stored in the storage medium of thermal imagery device 13 as general analytical model and diagnostic rule.
Particularly, for example, control part 10(is as diagnosis portion for diagnostic process), the analysis result obtaining according to analysis, diagnosis threshold values in diagnostic rule corresponding to analytical model compares, and this diagnosis threshold values and analysis result, according to the comparison in diagnostic rule, are obtained to diagnostic result; The output of diagnostic result can be control signal, for example control part 10 is as notification unit, for example change, have light that pilot lamp produces, auditory tone cues, vibration etc. by the demonstration with word or image (comprising infrared thermal imagery, reference picture etc.) in display unit etc., as long as the appreciable method of user is included.Preferred mode, controls display part 4 diagnosis is shown, further, also the diagnosis threshold values relevant with diagnosis, diagnosis basis, defect type, defect level, processing suggestion etc. can be notified in the mode of user's energy perception such as word.Accordingly, the data correlation storage of these relevant data and diagnostic rule.
Measurement pattern, has represented and has measured the relevant pattern of object, measurement pattern correspondence measurement pattern information.User can be in menu State selective measurements pattern; Also specifically button, stir the forms such as rotary disk shutter and realize.In addition, also measurement pattern selection information can be presented to display part; Have measurement pattern display control unit (control part 10), make display part show the measurement pattern selection information relevant with measurement pattern for controlling, described measurement pattern selection portion response user selects the selection of information to measurement pattern, carry out State selective measurements pattern.For user select measurement pattern select information can be the users such as word (as the word of numeral, letter, Chinese character etc.), icon, thumbnail be easy to identify measurement object mode present as shown in figure 26; In addition, measurement pattern selects information also can directly embody measurement object, take power equipment as example, as measured oil level, measuring lower joint, downhole joint etc.
Measurement pattern information, the relevant information one of at least in diagnostic rule corresponding to regulation specified type, the location parameter of analyzed area, analytical model, the analytical model of the composition data of the regulation specified type that comprises the composition data that determines reference picture, the location parameter of reference picture, synthetic parameters, analyzed area; Preferably, be to comprise above-mentioned all information.For example in table 4, " the measurement pattern information 1 " of measurement pattern 1 has comprised following information, as shown in figure 13, and the type of the composition data of reference picture: " benchmark 1, auxiliary 1 "; Location rule: the main object of benchmark 1(), self-adaptation, adaptive region Z1, placed in the middle; Synthetic parameters: transparent rate is 1, benchmark 1(synthesizes order 1), the synthetic order 2 of auxiliary 1(); Analyzed area: assist 1, analytical model and diagnostic rule: analyzing and diagnosing 1.
As shown in the table 4 of Fig. 4, pre-stored measurement pattern information can be for all subject information in table 4, general measurement pattern information, for example " measurement pattern 2 "; Also can be for subject information part or all of in table 4, there is different respectively formations, for example " measurement pattern 1 "; Also can be that storage medium in thermal imagery device 13 is pre-stored for the applicable measurement pattern information of all subject information, and nonessential being stored in table 4 and subject information association.Wherein, measurement pattern information can comprise the relevant information difference one of at least in the location parameter, analytical model, diagnostic rule of regulation specified type, the analyzed area of the composition data of location parameter, synthetic parameters, the analyzed area of regulation specified type, the reference picture of the composition data of determined reference picture.The relevant information that measurement pattern information comprises can be specifying information as the specifying information of location parameter or location rule, synthetic parameters, analytical model, diagnostic rule one of them or multiple combinations; Also can be to comprise relevant configuration information for example according to subject information or the associated positional information of composition data, synthetic parameters, analytical model, diagnostic rule one of them or multiple configuration informations; Or the combination of these two kinds of situations.In addition, measurement pattern information, the parameter that also can only comprise part forms, regulation specified type, the analytical model of the composition data of regulation specified type, location rule, the analyzed area of the composition data of reference picture for example also can be only comprised, and synthetic parameters, diagnostic rule etc. arrange by user, or according to the configuration of the acquiescence of thermal imagery device 13.
Processing object, processing rule according to the rules, can obtain morphosis data by processing.Processing object can be the morphosis data " benchmark 1 " as shown in table 4 of storage in storage medium (flash memory 9), the morphosis data of " benchmark 2 " representative; Also can be thermal-image data or the infrared thermal imagery that the thermal imagery file in storage card 8 obtains; Also can using in interim storage part 6 take obtain thermal-image data or infrared thermal imagery as processing object.Processing object and processing rule can be pre-configured.One or more as sheared, in feature extraction (as threshold values scope is extracted, edge extracting), enhancing, filtering, pseudo-coloured silk, color adjustment etc. of the image processing example that described processing for example puts rules into practice to described processing object.Preferably, processing rule comprises that in " shearing ", " extraction of threshold values scope ", " edge extracting ", at least one is processed, and also can select multiple processing simultaneously.
Shear, be arranged in the data of share zone as extracted processing object.
Threshold values scope is extracted, and the data that processing object are positioned to threshold values scope are extracted; The form of expression of threshold values scope, for example: the colour code scope of thermal-image data AD value scope, infrared thermal imagery, the threshold values scope of temperature, tonal range, brightness range, color gamut etc., can be the threshold values scope prestoring, also can be carried out by user setting and the adjusting of threshold values scope.Its effect, temperature band or the color for example extracted in infrared thermal imagery (processing object) are brought acquisition reference picture or morphosis data, the pixel of for example extracting the particular color in visible images (processing object) obtains reference picture or morphosis data, and the pixel of for example extracting the specific AD value in thermal-image data (processing object) obtains reference picture or morphosis data.
Edge extracting processing, as the algorithm according to regulation, extracts the data of edge contour based on processing object.For example threshold values scope is according to the rules carried out binaryzation to infrared thermal imagery (processing object); Wherein, the threshold values scope of regulation can be the threshold values scope prestoring, also can show bianry image, by the setting of manually carrying out binaryzation threshold values scope, described threshold values scope for example arranges threshold values scope, tonal range, colour code scope of thermal-image data AD value scope, temperature etc.; Then, to the image after binary conversion treatment, carry out the processing of connected region; Then, connected region is carried out to edge detection process, obtain edge contour data.Further, also can carry out vectorized process to the edge contour data that obtain.
Calculating object, computation rule according to the rules, can obtain auxiliary composition data by computing.Calculating object for example, can be one or more in " benchmark 1 " shown in table 4, " benchmark 2 ", " auxiliary 1 ".Described computation rule at least comprises calculating object is carried out convergent-divergent, is out of shape, is cut apart, decile, calculating outsourcing rectangle, calculates one or more in inscribe rectangle, computing center's line, calculated characteristics point.In addition, the reference picture that user also can be based on showing display part 4 or the selection of synthetic object, specify calculating object; Also can arrange and give in the composition data of the point, line, surface between reference picture with assigned position relation and having specified by user.
Assigned position and given size, refer to that for the reference picture that has embodied morphological feature reference picture is arranged in position and the size of infrared thermal imagery, or also comprise the anglec of rotation.Its concrete form of expression can be the assigned position of coordinate system and the parameter of given size (but dropping on infrared thermal imagery display window) that is arranged in display part (display screen), can be also the assigned position of coordinate system and the parameter of given size that is arranged in the infrared thermal imagery of infrared thermal imagery display window.Also comprise this situation, position setting unit (control part 10) is only provided with reference picture and is arranged in the position of infrared thermal imagery, and acquiescence shows with original size, is also considered as being provided with assigned position and given size.
Location parameter, for the reference picture that has embodied morphological feature, refers to that reference picture is arranged in assigned position and the given size of infrared thermal imagery.For analyzed area, refer to that analyzed area is arranged in the position of infrared thermal imagery (for example analyzed area is situation a little), or also comprise size, or also comprise the anglec of rotation.Location parameter in embodiment, its concrete manifestation form can be the coordinate system location parameter (but dropping on infrared thermal imagery display window) that is arranged in display part (display screen); Also can be the location parameter that is arranged in the coordinate system of the infrared thermal imagery of infrared thermal imagery display window.
Positional information, for example positional information associated with composition data, can be the information of location parameter, can be also the information that obtains the location rule of location parameter.
Main object, in the time having multiple composition data with assigned position relation, the object that among can specifying, one or more composition datas obtain is as main object; When having specified main object, the location parameter that main object is arranged in infrared thermal imagery can be set, then, the assigned position relation based between other objects and main object and main object are arranged in the location parameter of infrared thermal imagery, other objects are set are arranged in the location parameter of infrared thermal imagery.
Adaptive region, is the regulation region in infrared thermal imagery, and for example in an embodiment, to be arranged in infrared thermal imagery, the window area Z1 placed in the middle of infrared thermal imagery 90% ratio, as adaptive region.
Self-adaptation, refer to the assigned address (or in addition stipulate the anglec of rotation) of self-adaptation object in adaptive region, carry out non-maximization convergent-divergent that overflow, that aspect ratio is fixing in adaptive region and obtain the size after self-adaptation, thereby can obtain, self-adaptation object is arranged in the assigned position of infrared thermal imagery and the position of given size arranges embodiment.Illustrate as example take self-adaptation object adaptive embodiment placed in the middle in Z1, calculate adaptive region Z1(size X1, Y1) with self-adaptation object (self-adaptation object original size X2, Y2,) X-axis, Y-axis ratio, choose the ratio of an axle less in X1/X2 and Y1/Y2, convergent-divergent rate based on self-adaptation object centers point time placed in the middle as self-adaptation object, thus, acquisition self-adaptation object is arranged in the location parameter of infrared thermal imagery.Self-adaptation object, for example analyzed area, reference picture, adopt self-adaptation to carry out setting position parameter, is convenient to standard and adjusts analyzed area, reference picture etc. be arranged in the location parameter of infrared thermal imagery.In the following embodiments, the self-adaptation of mentioning, all using self-adaptation object in Z1 self-adaptation placed in the middle as the example of implementing.
Synthetic object, according to showing the embodiment difference of controlling, with the common reference picture showing of infrared thermal imagery, for example, can be one or include and multiplely carry out synthetic synthetic object with infrared thermal imagery etc.Wherein, single synthetic object can be obtained by one or more composition datas.In the time obtaining a synthetic object by multiple composition datas, reference picture position setting unit can only arrange this synthetic object and be arranged in assigned position and the given size of infrared thermal imagery, and does not need the object that each composition data acquisition is set respectively to lay respectively at the location parameter in infrared thermal imagery.In the time that reference picture includes multiple synthetic object, reference picture position setting unit can arrange respectively each synthetic object and lay respectively at the location parameter in infrared thermal imagery.
Come to introduce in detail concrete operations and the control flow of embodiment 1 below.At this, suppose to have stored in flash memory 9 content as shown in Figure 4.This application scene is for example taken the subject of transformer station.After switching on power, control part 10 carries out the initialization of internal circuit, then, enter standby screening-mode, be that shoot part 1 is taken acquisition thermal-image data, shoot part 1 is taken the processing that the thermal-image data of acquisition stipulates by image processing part 2, be stored in interim storage part 6, control part 10 is carried out the control to showing control portion 3, make to show continuously infrared thermal imagery with dynamic image form on display part 4, at this state, whether control part 10 persistent surveillances have been switched to the processing of other patterns or have carried out power-off operation according to scheduled operation, if had, enter corresponding processing controls.
When user supresses Menu key, enter menu mode, display part 4 shows menu as shown in Figure 9.Menu item wherein in elected, shows corresponding configuration interface.Control part 10 has formed configuration section with operating portion 11 grades, and control part 10 responds user's operation signal, carries out corresponding demonstration and controls.
With reference to the configuration interface shown in Figure 10, " object processing CD1 " menu item is described, specify processing object and setting (increase, revise, delete) processing rule for user.
Composition data CD11: the information that shows selective composition data.The information of selective composition data for example obtains the type information of " benchmark 1 ", " benchmark 2 " from table 4, in addition, when there being other type information, the processing object type of for example specifying, in conjunction with the type information of the composition data of particular process rule representative, also shows the type information of selecting as for the election.
Processing object CD12: select the composition data as processing object for user, obviously, can select one or more morphosis data as processing object.
Process regular CD13: for user, the processing rule for processing object is set; Processing rule comprises processing algorithm and correlation parameter, choosing processing algorithm duration by acknowledgement key, display parameter hurdle is supplied to typing parameter (not shown).
With reference to the configuration interface shown in Figure 11, " calculation and object CD2 " menu item is described, select calculating object and (increase, revise, delete) computation rule is set for user.
Composition data CD21: the information that shows selective composition data.The information of selective composition data for example obtains the type information of " benchmark 1 ", " benchmark 2 ", " auxiliary 1 " from table 4, in addition, when there being other type information, the calculating object type of for example specifying is in conjunction with the type information of specific calculation rule representative, the processing object of for example specifying, in conjunction with the type information of particular process algorithm representative " benchmark 1(processing) ", also shows the type information of selecting as for the election.
Calculating object CD22: select calculating object for user; Obviously, can select one or more composition datas as calculating object, and the composition data that processing object processing can be obtained is as calculating object.
Computation rule CD23: select and arrange the computation rule for calculating object for user, computation rule comprises algorithm and correlation parameter, algorithm is convergent-divergent such as, distortion, calculated characteristics point, decile, outsourcing rectangle, inscribe rectangle, center line, the algorithm of envelope etc., the basic point of for example convergent-divergent of parameter and convergent-divergent rate, basic point and the deformation rate (as aspect ratio) of distortion, the calculating parameter of unique point (as calculated the central point of profile), the composition data type arranging based on unique point is (as point, line, face etc.) and size, the parameters relevant to algorithm such as the quantity of decile, choosing algorithm often by acknowledgement key, display parameter hurdle is supplied to typing parameter (not shown).Can select one or more computation rules to selected calculating object.
The effect of the analyzed area (or reference picture) of acquisition is described by calculating or processing with reference to Figure 12.
With reference to figure 12(101) shown in, using profile T1 composition data as calculating object, using the central point of profile T1 as basic point, carry out after convergent-divergent and distortion the analyzed area F101 of acquisition; Can be used for the Temperature Distribution in regulation region on analytical calculation subject body, reduce the impact of surrounding environment on assessment.
With reference to figure 12(102) shown in, using profile T1 composition data as calculating object, algorithm parameter is for carrying out 8 deciles, the analyzed area F102 of 8 deciles of acquisition; Can be used for analyzing the Temperature Distribution of subject body different piece.
With reference to figure 12(103), using profile T1 composition data as calculating object, algorithm parameter is for calculating outsourcing rectangle, the outsourcing rectangle F103 of acquisition; Can be used for the maximum temperature of analysis to measure subject, can reduce the impact of the high temp objects in background.
With reference to figure 12(104), being local infrared thermal imagery using TU1(TU1) composition data is as processing object, and processing rule is as edge contour extraction, the analyzed area F105 of the edge contour of acquisition, can be used for the maximum temperature of analysis to measure subject, can reduce the impact of the high temp objects in background.
With reference to figure 12(105), being local infrared thermal imagery using TU1(TU1) composition data is as processing object, processing rule as pixel (scope extraction) more than extraction set point of temperature threshold values, the analyzed area F105 of acquisition, can be used for subject characteristic portion to carry out analytical calculation.
In addition, " object processing CD1 " and the configuration menu of " calculation and object CD2 " also can be merged into a configuration interface, can select one or more processing rules to appointed object (as the thermal imagery file in composition data pre-stored in Fig. 4, storage card 8, take the thermal-image data etc. obtaining), and/or, select one or more computation rules, processing and/or calculating can be referred to as to be processed appointed object.In addition, also can only configure relevant processing rule or computation rule, and not point to specific composition data; For example configuration by default, is applicable to follow-up selected composition data.
With reference to the configuration interface shown in Figure 13, the configuration of " analysis configuration CD3 " is described.
" analysis configuration CD3 ": be chosen in and measure under the non-switching state of reference pattern for user, the regulation specified type of the relevant composition data of setting and reference picture, analyzed area, location rule, synthetic parameters, analytical model, diagnostic rule, measurement pattern etc.
Composition data CD31: the information that shows selective composition data, for example from table 4, obtain the type information of " benchmark 1 ", " benchmark 2 ", " auxiliary 1 ", in addition, when there being other type information, if the processing object type arranging at " object processing CD1 " is in conjunction with the type information of the regular representative of particular process " benchmark 1(processing) ", if the calculating object type arranging in " calculation and object CD2 " is in conjunction with the type information of specific calculation rule representative " benchmark 1(calculating) ", also show selective.
Reference picture CD32: select the composition data for obtaining reference picture for user.Can select one or more composition datas to obtain reference picture.
Location rule CD33: the relevant location rule of location parameter that is positioned at infrared thermal imagery for user's configuration and reference picture, analyzed area etc.;
Main object: select the composition data for obtaining main object.As can be seen from Fig. 13, main object can be selected from composition data CD31, obviously, can be the main object of the composition data acquisition of reference picture or other objects; Be used for obtaining the composition data of main object, it can be for example one or more in the composition data having below assigned position relation: the composition data of morphosis data, morphosis data correlation, in addition, also can obtain main object in conjunction with regulation computation rule by the calculating object based on specifying from morphosis data or its associated composition data, or processing object based on specifying obtains main object in conjunction with regulation processing rule from morphosis data.Conventionally set main object has represented the region that needs primary part observation, by converting main object, if realize reference picture, the conversion of analyzed area on different display positions, realizes different shooting objects.In addition, user also can be chosen in the reference picture (one or more of synthetic object wherein) that display part 4 shows, is used as main object.
When having specified main object, the assigned position relation based between other objects and main object and main object are arranged in the location parameter of infrared thermal imagery, other objects are set are arranged in the location parameter of infrared thermal imagery.When not specifying main object, the object that selected composition data obtains in " reference picture CD32 ", " analyzed area CD35 " arranges its location parameter according to location rule separately.
Wherein, self-adaptation: for configuring the position set-up mode of self-adaptive processing and specifying self-adaptation object.Choose self-adaptation, then length is pressed acknowledgement key 29, position, size, the anglec of rotation that adaptive region is arranged in infrared thermal imagery can be set, and self-adaptation object is arranged in position and the anglec of rotation of adaptive region.In this example, the window area placed in the middle of infrared thermal imagery 90% ratio is set as adaptive region, hereinafter to be referred as Z1, self-adaptation object in Z1, self-adaptation placed in the middle.Self-adaptation object can be selected from composition data CD31.
Wherein, assigned address: the location parameter that configures object that selected composition data obtains and be positioned at infrared thermal imagery for user.When user chooses " assigned address hurdle ", show input field (not shown), user can input object that selected composition data obtains position, size, the anglec of rotation in infrared thermal imagery.In the time all not inputting, also can default location, as the starting point upper left corner that is infrared thermal imagery, be of a size of original size, the anglec of rotation is 0.
Wherein, association: select this, by according to selected composition data associated positional information in advance, obtaining the object that this composition data obtains will be arranged in the location parameter of infrared thermal imagery.
Synthetic parameters CD34: for the reference picture of selected composition data acquisition and the synthetic parameters of infrared thermal imagery are set, synthetic parameters, as transparent rate, color, line style (not shown), synthetic order in the time that reference picture has multiple synthetic object etc., also can be selected the synthetic parameters associated with composition data.
Analyzed area CD35: for the type in user's Allocation Analysis region.User can select the composition data for obtaining analyzed area in composition data CD31; In addition, in being elected to, " analyzed area CD35 " the long acknowledgement key 29 of pressing, show the interface that arranges as shown in figure 14, and the analyzed area of " point ", " line ", " face " is set according to reference picture or infrared thermal imagery for user.In addition, the scope of analyzed area also can be set, take the T1 in Figure 14 as example, it is the region that is positioned at T1 that analyzed area can be set, or outside the region of T1, or on the edge contour of T1.
The composition data of analyzed area, morphosis data that can be based on storing in storage medium or the composition data of this morphosis data correlation obtain; Also can be the object of specifying in morphosis data based on storing in storage medium or associated composition data, computation rule and/or processing rule, carry out respective handling and obtain according to the rules; Can select one or more composition datas to obtain analyzed area; In addition, " point, line, surface " analyzed area also can manual operation arranging, owing to arranging according to reference picture, set analyzed area is convenient to follow-up use.Adopt the set-up mode of any analyzed area to be selected according to the object of infrared detection by user.Note, when in Allocation Analysis the region, can carry out artificial or automatic numbering (the blocked areas cell S 01, the S02 that have as the F1 in Figure 15) to the territory element in analyzed area, or pre-stored composition data can there is numbering separately, so that the numbering during as analyzed area.
Analytical model and diagnostic rule CD36: the corresponding analytical model of analyzed area and diagnostic rule corresponding to analytical model are set for user.Selective information for example obtains analyzing and diagnosing 1(analytical model 1 and associated diagnostic rule 1 thereof from table 4), analyzing and diagnosing 2(analytical model 2 and associated diagnostic rule 2 thereof) or pre-stored other analytical model and the information of diagnostic rule; In addition, elected in " analytical model and diagnostic rule CD36 " the long acknowledgement key of press, analytical model as shown in figure 14 of demonstration and diagnostic rule interface is set.
The interface that arranges of analyzed area, analytical model, diagnostic rule etc. is described with reference to Figure 14, adjustment hurdle SZ0, the analyzed area with analyzed area arrange hurdle SZ1, analytical model and diagnostic rule hurdle SZ2 etc. are set, and describe as an example of subject 1 and the set reference picture composition data T1 of measurement pattern as shown in figure 15 3 and analyzed area T1, F101 example.
Adjust in hurdle SZ0, for adjusting the assigned position relation between analyzed area and reference picture, conventionally will show reference picture and analyzed area, be convenient to adjust, in this example, be presented at the reference picture T1(benchmark 1 of selecting in " reference picture CD32 "), and the analyzed area F101 selecting in " analyzed area CD35 ", adjust in hurdle SZ0, user can carry out as reduced territory element, changing position, adjustment, change (point, line, surface) kind analyzed area, or new territory element is set.
Analyzed area arranges hurdle SZ1, point, line, surface is set and is analogous to the computation rule in " calculation and object CD1 " for the corresponding analyzed area of reference picture T1 being set, comprising, at this moment calculating object can be defaulted as reference picture T1.
Diagnostic rule arranges hurdle SZ2, and for analytical model and diagnostic rule are set, " region " wherein for example, for the numbering of the territory element that is chosen in SZ0 and shows: T1, F101; " pattern " is as the highest, minimum, medial temperature etc.; " calculating " as: add, subtract, multiplication and division; " comparison " as: be greater than, be less than etc., " threshold values " is diagnostic threshold values; " relation " as with or, the logical relation such as non-, in addition, also can have Information Selection or typing hurdle (not shown), for inputting diagnosis basis, defect type, defect level, processing suggestion.
Wherein, in the time of not typing " comparison " relation and " threshold values ", form analytical model, during as typing " comparison " relation and " threshold values ", formed analytical model and corresponding diagnostic rule (or can be regarded as the diagnostic rule with analytical model information).After setting the completion confirmation, can be with reference to the analyzed area of the composition data of image T1 and configuration (composition data and the assigned position relation with respect to reference picture T1, as analyzed area F101 is positioned at the location parameter of reference picture T1), analytical model, diagnostic rule association store be to recording medium, as be recorded in the table 4 of flash memory 9.
Measurement pattern CD37, for user's State selective measurements pattern, when user has selected measurement pattern 1, shows every content as shown in figure 13, the various setting operations such as user can modify, increases, deletion.In addition, user also can be by configuration newly-installed or that change, by choosing " storage measurement pattern CD5 ", save as new measurement pattern information, then will in measurement pattern option hurdle corresponding to " measurement pattern CD37 ", show newly-generated measurement pattern.
Switch CD4: measure reference pattern for being configured in, for example, under the common state showing of the reference picture that " analysis configuration CD3 " configures and infrared thermal imagery, while pressing a switch key 22, the configuration information relevant with switching object.With reference to the configuration interface shown in Figure 16, the configuration of " switching CD4 " is described, the type of the composition data of the type of the composition data of the reference picture that for example switches of configuration information switching, synthetic parameters, analyzed area, location rule, analytical model, diagnostic rule etc., can be wherein one or more conversion, obtain the configuration of different results of use.Concrete configuration project and " analysis configuration CD3 " roughly the same, have omitted explanation, and difference is also can there be infrared thermal imagery as switching object.Arrow switching in CD4: for (increase, revise, delete) switching law is set, for example, can enter the interface of next switching by arrow, configure the configuration information of more switching object.
In embodiment 1, user's shooting object, it is the overall thermal field distribution (being assumed to be the measurement object of measurement pattern 1 representative) that detects subject, and the thermal field distribution (the measurement objects of set measurement pattern 3 representatives) of the privileged site of detection subject, in addition, if also expect to find shadow of doubt, also will walk close to take the thin portion of subject entirety in primary part observation region (being assumed to be the measurement object of measurement pattern 2 representatives).Realize for convenience this testing goal, user has carried out the setting of measurement pattern.
User is by " analysis configuration CD3 " selection " measurement pattern information 1 ", and it configures as shown in figure 13, reference picture: " benchmark 1, auxiliary 1 "; Location rule: the main object of benchmark 1(), self-adaptation, adaptive region Z1, placed in the middle; Synthetic parameters: transparent rate is 1, benchmark 1(synthesizes order 1), the synthetic order 2 of auxiliary 1(), colors etc. can be given tacit consent to; Analyzed area: assist 1, analytical model and diagnostic rule: analyzing and diagnosing 1.
Configuration by " switch CD4 " " switching one ", there is no corresponding measurement pattern owing to detecting the measurement object that the thermal field of privileged site of subject distributes; So according to this measurement object, user has carried out configuration as shown in figure 11 at " calculation and object CD2 ", calculating object: " benchmark 1 ", computation rule: the convergent-divergent based on central point, distortion, be used for follow-up acquisition analyzed area F101.And, as shown in figure 14, to calculating the analyzed area F101 obtaining and having carried out the configuration of analytical model as the T1 of analyzed area.Then, when completing type, location rule, analytical model, the diagnostic rule configuration of composition data of type, synthetic parameters, analyzed area of composition data of the reference picture that comprises switching as shown in figure 15, choose " storage measurement pattern CD5 ", carry out association and save as new measurement pattern information 3, and be configured to " switch one ".
Then, configure and switched two, selected measurement pattern 2, as shown in figure 16.
Click switch key, by measurement pattern 1, switch to measurement pattern 3, then click, measurement pattern 2, then click the state of getting back to measurement pattern 1.Also can utilize directionkeys to carry out switching back and forth.
In addition, when composition data as shown in Figure 3 of box lunch, when not storing in advance the relevant measurement pattern information of measurement pattern in storage medium, the regulation specified type that user can configure relevant composition data by " analysis configuration CD3 " or " handover configurations CD4 " (comprises that user can pass through " calculation and object CD2 ", " object processing CD1 " first arranges the composition data that combines regulation processing rule and/or computation rule), location rule, synthetic parameters, analytical model, diagnostic rule etc., and store set measurement pattern information and measurement pattern by " storage measurement pattern CD5 ".
Although, in embodiment 1, using the composition data of part in table 4 as the example that configures reference picture and analyzed area.But obviously, by the above-mentioned explanation to Fig. 9-16, user can be according to the composition data in table 4, comprising can be by appointed object in conjunction with computation rule and/or processing rule, configure the reference picture of various different-effects and the analyzed area of dissection, the composition data of reference picture, location rule, synthetic parameters, analyzed area, analytical model, diagnostic rule difference one of at least, just may obtain the analysis configuration of the measurement pattern of different application purposes, the analysis configuration of switching by just can obtain the measurement pattern of different purposes and effect to the configuration of switching.
When completing setting operation, press acknowledgement key 27, control part 10 using set every configuration store in flash memory 9 (for example, as a configuration file), as after the default configuration of thermal imagery device 13, and do not need each use all to arrange once.Can be carried out by user the embodiment of relevant configuration although it should be noted that example; But being not limited to this, can be also such embodiment, if thermal imagery device 13 is in the time dispatching from the factory, has configured the relevant configuration of above-mentioned various processing, and has not needed user to carry out any artificial setting; Or in outer computer, configure completely, configuration file is loaded into thermal imagery device 13 before shooting; Or, carried out the configuration of the partial content of above-mentioned explanation by user.
Introduce the general function of thermal imagery device 13 below.Comprise:
Acquisition unit, for example shoot part 1, for taking acquisition thermal-image data.
Measurement pattern selection portion, for State selective measurements pattern; Can select the measurement pattern of acquiescence, or carry out State selective measurements pattern according to user's blocked operation, or the selection information of the measurement pattern of selecting according to user is carried out State selective measurements pattern.
Display control unit, shows reference picture and the infrared thermal imagery that the thermal-image data obtaining generates for controlling jointly, and described reference picture is arranged in infrared thermal imagery.
For example described display control unit has: reference picture designating unit, for the composition data of storing based on storage medium, specify the composition data relevant with obtaining reference picture; Reference picture position setting unit, is positioned at the location parameter of infrared thermal imagery for the reference picture obtaining based on specified composition data is set; Indicative control unit, for synthetic parameters according to the rules, shows jointly with reference to image and infrared thermal imagery.
Reference picture designating unit, is used to specify the composition data for obtaining reference picture; Wherein, composition data that can be based on storing in storage medium, specifies composition data, also can be appointed as composition data by taking the thermal-image data that obtains etc.; In preferred specified composition data, at least comprise morphosis data.In addition, also can specify multiple composition datas, multiple composition datas can be multiple morphosis data, or also can comprise auxiliary composition data.The composition data of appointment is described with reference to Figure 13:
Obviously, can be from " benchmark 1 ", " benchmark 2 ", " benchmark 3 " of storage, in " auxiliary 1 ", specify morphosis data relevant with the reference picture of embodiments feature, also can specify and at least comprise morphosis data at interior multiple composition datas; Also in can composition data " benchmark 1 ", " benchmark 2 ", " benchmark 3 " based on storage, specify by the composition data as processing object (morphosis data, or morphosis data and auxiliary composition data) in conjunction with the morphosis data of the regular representative of processing of regulation " benchmark 1(processing) "; Also can specify by the composition data as calculating object and obtain reference picture in conjunction with auxiliary composition data " benchmark 1(calculating) " and morphosis data of the computation rule representative of regulation; Also can process rule and/or regulation computation rule in conjunction with regulation by appointed object, obtain applicable reference picture.
Concrete specific mode, composition data that for example can specify default.Also can select composition data according to user's operation, as selected the selection of information to determine that in conjunction with the regulation of composition data type selects composition data according to user to subject; As composition data is selected in the selection of the identity information to composition data according to user; As basis selects to the operation of specific keys the composition data that this button is corresponding.Also can based on regulation trigger condition, come determine the composition data corresponding with this trigger condition.
Reference picture position setting unit, is positioned at the location parameter of infrared thermal imagery for the reference picture obtaining based on specified composition data is set.As can be location rule according to the rules carried out the location parameter of Lookup protocol reference picture; Composition data that for example can be based on storing in storage medium and associated positional information thereof, the reference picture that the composition data of described positional information representative is obtained will be arranged in the location parameter of infrared thermal imagery, and the reference picture that is set to this composition data acquisition will be arranged in the location parameter of infrared thermal imagery; Also adaptive region that can be according to the rules, carrys out Lookup protocol reference picture and is arranged in the location parameter of infrared thermal imagery; Also can first determine the main object with reference picture with assigned position relation, the location parameter that main object is arranged in infrared thermal imagery is set, then, assigned position relation based between reference picture and main object and main object are arranged in the location parameter of infrared thermal imagery, reference picture is set is arranged in the location parameter of infrared thermal imagery; Also the assigned address that can give tacit consent to according to thermal imagery device 13 arranges the location parameter of reference picture.The location parameter of reference picture also can be set according to the location parameter of user's typing in addition.
Indicative control unit, for synthetic parameters according to the rules, shows jointly with reference to image and infrared thermal imagery; There is numerous embodiments.
In the time that reference picture is a synthetic object, according to described assigned position, the infrared thermal imagery of taking the thermal-image data generation obtaining with shoot part is synthetic continuously, then controls with reference to the composograph of image and infrared thermal imagery and shows, realizes common demonstration.At this, can transparent rate according to the rules synthesize.The transparent rate of regulation, can be fixing value, can be for example the default value of storage in thermal imagery device 13 or by user by the settings of operating portion 11 or obtain in the attribute of composition data of synthetic object and deposited the information about transparent rate.The transparent rate of synthetic object, has represented when synthetic, for example, in the synthetic synthetic pixel obtaining of synthetic object and background (, infrared thermal imagery) shared ratio.For example, in the time being synthesized by a synthetic object and background, obtain the view data of synthesized image vegetarian refreshments according to " the view data x (transparent rate of 1-synthetic object) of the transparent rate+background of the view data x synthetic object of synthetic object ".In addition also comprise the parameter that transparent rate ought be set, i.e. representative acquiescence transparent rate 1.
A kind of embodiment, in the time having multiple synthetic object that need to be for example, with background (, infrared thermal imagery) synthetic, according to the synthetic order of each synthetic object and corresponding transparent rate, successively synthesizes processing and obtains final composograph, for example, having the synthetic order of synthetic object 1(is 1) and synthetic object 2(to synthesize order be 2), first synthetic object 1 is synthesized and obtains data " the view data x (transparent rate of 1-synthetic object 1) of the transparent rate+background of the view data x synthetic object 1 of synthetic object 1 " midway according to its transparent rate and background, then, synthetic object 2 is again synthesized and processed according to its transparent rate and described data midway, , the synthetic pixel that this processing obtains obtains according to following formula, transparent rate+data the * (transparent rate of 1-synthetic object 2) midway of synthetic object 2* synthetic object 2.
A kind of embodiment, the thermal-image data that the location of pixels according to reference picture in infrared thermal imagery obtains shooting carries out the optionally pseudo-color image that obtains demonstration of processing.Particularly, the for example view data using the view data of the reference picture in overlaid pixel position as the superimposed images of this location of pixels, the thermal-image data of overlaid pixel position is no longer carried out to the processing of pseudo-color conversion, only the thermal-image data beyond overlaid pixel position is carried out to the pseudo-color view data that obtains infrared thermal imagery of changing, generate the image of demonstration with this, in some applications can speed up processing.Be applicable to the reference picture of for example edge contour, the reference picture of processing by this way for hope or auxiliary object can add respective markers information in advance in the attribute of its composition data.Also can be with reference to the thermal-image data of the location of pixels in the corresponding thermal-image data of image, carry out the color processing of the puppet difference processing of the thermal-image data of putting as numerical digit with other, the color processing of puppet of for example different pseudo-colored steels, for example, after the thermal-image data of the location of pixels with reference in the corresponding thermal-image data of image being deducted to setting, carry out again the color processing of puppet etc., generate composograph.
A kind of embodiment, for example, determine the transparent rate of the reference picture part synthetic with it according to the threshold values interval range (as AD value scope) of taking the thermal-image data obtaining, particularly, for example be set to 0 with the transparent rate of the synthetic reference picture of the infrared thermal imagery that is positioned at threshold values interval range, outside threshold values interval range, be set to 1, avoid the infrared thermal imagery of part and parcel (in threshold values interval range) to be blocked.At this, the transparent rate of regulation, can be also the value changing.
Thermal imagery diagnosis portion, carries out analyzing and diagnosing for the thermal-image data that acquisition unit is obtained, and obtains analyzing and diagnosing result
For example described thermal imagery diagnosis portion has: analyzed area determining unit, for determining the composition data of analyzed area; Analyzed area position setting unit, is positioned at the location parameter of infrared thermal imagery for analyzed area is set; Analytic unit, based on the analyzed area of described location parameter, analytical model according to the rules, analyzes the thermal-image data obtaining (comprising the data that obtain after the thermal-image data predetermined processing to obtaining), obtains analysis result; Diagnosis unit, for obtaining analysis result according to analytic unit, diagnostic rule is diagnosed according to the rules, obtains diagnostic result.
Analyzed area determining unit, for determining the composition data of analyzed area, preferred analyzed area determining unit, from having the composition data of assigned position relation with the composition data of reference picture, is determined the composition data of analyzed area; As shown in figure 13, that obviously can from flash memory 9, store has in assigned position relation associated " benchmark 1 ", " benchmark 2 ", " auxiliary 1 " example, specifies one or more composition datas to obtain analyzed area; Also can, based on appointed object in conjunction with regulation processing rule and/or regulation computation rule, obtain the composition data of analyzed area.Preferably, the composition data that described appointed object is reference picture or there is the object of assigned position relation with the composition data of reference picture.In addition, the composition data that can have an assigned position relation according to the location rule of acquiescence is determined the composition data of analyzed area, for example from the composition data of the composition data association of reference picture (there is no pre-stored assigned position relation, the location rule of being given tacit consent to by thermal imagery device 13 and give assigned position relation), determine the composition data of analyzed area.
In addition also never determine, the composition data of analyzed area in the composition data of assigned position relation; For example, from and the associated composition data of the composition data of reference picture (between there is no pre-stored assigned position relation), determine the composition data of analyzed area; The location parameter of the two can be set by user; In addition also can determine according to the composition data of the analyzed area of user's operation setting (as point, line, surface).Owing to there being the reference of reference picture, therefore still facilitate many than prior art.
Analyzed area position setting unit, is positioned at the location parameter of infrared thermal imagery for analyzed area is set;
As can be location rule according to the rules carried out the location parameter of Lookup protocol analyzed area; Composition data that for example can be based on storing in storage medium and associated positional information thereof, the analyzed area that the composition data of described positional information representative is obtained will be arranged in the location parameter of infrared thermal imagery, and the analyzed area that is set to this composition data acquisition is arranged in the location parameter of infrared thermal imagery; Also adaptive region that can be according to the rules, carrys out Lookup protocol analyzed area and is arranged in the location parameter of infrared thermal imagery; Also can first determine the main object with analyzed area with assigned position relation, the location parameter that main object is arranged in infrared thermal imagery is set, then, assigned position relation based between analyzed area and main object and main object are arranged in the location parameter of infrared thermal imagery, analyzed area is set is arranged in the location parameter of infrared thermal imagery; Also the assigned address that can give tacit consent to according to thermal imagery device 13, for example location parameter of acquiescence arranges (at least comprise position or also have size or also have the anglec of rotation) location parameter of analyzed area.
In addition, also can operate according to user (as the location parameter of typing) and arrange the location parameter of analyzed area.
It should be noted that, the setting (definite, the location parameter setting of composition data) of analyzed area and reference picture can have different order, for example, analyzed area position setting unit, for be positioned at the location parameter of infrared thermal imagery according to the reference picture of reference picture position setting unit setting, and assigned position relation between reference picture and analyzed area, analyzed area be set be arranged in the location parameter of infrared thermal imagery.Reference picture position setting unit, for be positioned at the location parameter of infrared thermal imagery according to the analyzed area of analyzed area position setting unit setting, and assigned position relation between reference picture and analyzed area, arrange reference picture be arranged in infrared thermal imagery location parameter.Also can first determine the main object with analyzed area, reference picture with assigned position relation, the location parameter that main object is arranged in infrared thermal imagery is set, then, assigned position relation based between the two and main object and main object are arranged in the location parameter of infrared thermal imagery, analyzed area and reference picture are set are arranged in the location parameter of infrared thermal imagery.
Thermal imagery analytic unit, for the analyzed area based on described location parameter, analytical model according to the rules, the thermal-image data that acquisition unit is obtained (comprise described thermal-image data is carried out to the data that obtain after predetermined processing) is analyzed, and obtains analysis result.
Preferably, the analytical model of regulation, at least comprises one or more the combination in following situation:
1) the analytical model information of the composition data association based on determined analyzed area, and the analytical model arranging; For example, with the analytical model information of the composition data association store of analyzed area and the analytical model obtaining;
2) location rule or the associated analytical model information of positional information of the location parameter based on acquisition analyzed area, and the analytical model arranging; Because different analyses may exist analyzed area at different location parameter up conversions, obtain location rule or the associated analytical model information of positional information of location parameter, obtain analytical model, can play more flexibly and analyze.
3) in addition, when the composition data of analyzed area is when appointed object calculates and/or processing obtains, according to the analytical model information of corresponding calculating and/or processing rule association, and/or the analytical model information of appointed object association, and the analytical model obtaining.(region for example obtaining after profile distortion can adopt the analytical model of the calculating maximum temperature identical with profile) in some cases, also can be used as the analytical model information corresponding to composition data of this analyzed area, so that simple to operate.
In addition, can be also other acquiescences of thermal imagery device 13 or the analytical model by user's operation setting.Obviously, also can there is the analytical model of above-mentioned numerous embodiments simultaneously.
Take the temperature analysis embodiment concrete as example illustrates.Based on the control of control part 10, image processing part 2 is clapped shoot part 1
The thermal-image data of taking the photograph acquisition carries out predetermined processing as correction, interpolation, be arranged in the location parameter of infrared thermal imagery based on analyzed area, for example extract the thermal-image data that set analyzed area determines, carry out the conversion process of temperature value, obtain the temperature value that these thermal-image datas are corresponding, then, to the temperature value obtaining, carry out analytical calculation according to analytical model.For example calculate wherein maximal value, extract wherein maximum temperature value as analysis result.In the time that analyzed area comprises multiple territory element, as the analyzed area F1 in Fig. 6 has territory element S01, S02, successively to the thermal-image data in each territory element, carry out the conversion of temperature value and analyze, obtain the analysis result of each territory element, the analysis result of acquisition and the numbering association store of the territory element regulation region at interim storage part 6 will be calculated, then according to the analysis result of each territory element, according to the mutual relationship of each unit in analytical model, calculate the analysis result that obtains mutual relationship.
The above-mentioned restriction exemplifying not as the embodiment of analyzing and processing.For example, the thermal-image data in analyzed area being converted to the processing of temperature value, can be that thermal-image datas all in analyzed area is all converted to temperature value; The part thermal-image data that can be also regulation is converted to temperature value; Can also be according to calculating the different patterns such as the highest, minimum, medial temperature in analytical model, deciding the conversion to thermal-image data, be a part of thermal-image data in transformational analysis region, or all; If analytical model is in computational analysis region when maximum temperature, also can be for the thermal-image data in analyzed area, the size that first compares thermal-image data AD value, is converted to temperature value by wherein maximum AD value, and the thermal-image data in analyzed area all must be converted into temperature value.In addition, also comprise the situation that algorithm is different, for example, while calculating maximum temperature, not with single pixel but with the mean value of the AD value of the neighbor of specified quantity, the AD value of the neighbor of maximum average value is converted to temperature value, and using the mean value of the temperature value of this neighbor thermal-image data as maximum temperature value.Wherein, thermal-image data is converted to temperature value through predetermined processing, embodiment for example according to the radiation coefficient, environment temperature, humidity of the subject arranging, and AD value and the temperature of the distance of thermal imagery device 13 etc. and thermal-image data between conversion coefficient, by regulation conversion formula, obtain temperature value.In addition, the thermal-image data that analyzed area determines as shown in Figure 6, can be the thermal-image data in analytic unit S01, S02, also can be the thermal-image data outside analytic unit S01, S02, can be also the thermal-image data of the lines place pixel of analytic unit S01, S02.Can predetermine this attribute of the composition data of analyzed area.
In addition, for thermal imagery, analysis is not limited to thermal-image data to be converted to that temperature value carries out, and for example, can be converted to the situation that radiation energy value, gray-scale value, emissivity values etc. are analyzed; Obviously, obtained thermal-image data is analyzed, be not limited to single frames thermal-image data, for example multiframe thermal-image data to storage in interim storage part 6, or multiframe thermal-image data is carried out to integral operation obtain this frame thermal-image data after treatment and analyze; The present invention is equally applicable to these situations.
Diagnosis unit, for obtaining analysis result according to thermal imagery analytic unit, diagnostic rule is diagnosed according to the rules, obtains diagnostic result.As the analysis result obtaining according to analysis, according to diagnostic rule, analysis result and threshold values are compared, thereby obtain diagnostic result.
Wherein, the measurement pattern information that described display control unit is corresponding according to selected measurement pattern, carries out the control of the common demonstration of reference picture and infrared thermal imagery, and/or, the described thermal imagery diagnosis portion measurement pattern information corresponding according to selected measurement pattern, the control of diagnosing; Wherein, described measurement pattern packets of information is containing at least one the relevant information determining in the location parameter, analytical model, diagnostic rule of regulation specified type, analyzed area of regulation specified type, location parameter, synthetic parameters, analyzed area of composition data of reference picture.
When measurement pattern information corresponding to selected measurement pattern, when the relevant information of the regulation specified type that comprises the composition data that determines reference picture, the location parameter of reference picture, synthetic parameters one of them or multiple combinations, the relevant information that display control unit comprises according to measurement pattern information, determine accordingly composition data, the reference picture of reference picture location parameter, synthetic parameters one of them or multiple, and implement the common demonstration of reference picture and infrared thermal imagery with this; Carry out the control of the common demonstration of reference picture and infrared thermal imagery.
When measurement pattern information corresponding to selected measurement pattern, when the relevant information of the regulation specified type that comprises the composition data that determines analyzed area, the location parameter of analyzed area, analytical model, diagnostic rule one of them or multiple combinations, the relevant information that thermal imagery diagnosis portion comprises according to measurement pattern information, determine accordingly composition data, the analyzed area of analyzed area location parameter, analytical model, diagnostic rule one of them or multiple, and implement analysis and the diagnosis of the thermal-image data to being obtained with this; Carry out the control of analyzing and diagnosing.
And if there is no the situation (thermal imagery analysis portion) of diagnosis unit, when measurement pattern information corresponding to selected measurement pattern, when the relevant information of the regulation specified type that comprises the composition data that determines analyzed area, the location parameter of analyzed area, analytical model one of them or multiple combinations, the relevant information that thermal imagery analysis portion comprises according to measurement pattern information, determine accordingly composition data, the analyzed area of analyzed area location parameter, analytical model one of them or multiple, and implement the analysis of the thermal-image data to being obtained with this; The control of analyzing.
The control step of the measurement reference pattern of embodiment 1 is described with reference to the process flow diagram of Figure 17.In the present embodiment, user's operation is: enter measurement reference pattern by the mode key 25 of push portion 11 or the measurement pattern selection information of State selective measurements pattern, check analyzing and diagnosing result when pressing analysis key.
Steps A 01, at standby shooting state, control part 10 is implemented it and is controlled, and whether persistent surveillance user has selected measurement reference pattern.At this moment shooting angle, shooting distance obtains the infrared thermal imagery as shown in the display part interface 1801 of Figure 18, to the thermal imagery of subject 1 wherein, in the prior art, user can puzzle in the shooting distance of taking subject 1, take position, analyzed area setting, analytical model setting, diagnostic rule and arrange etc.For subject 1 is taken and the correctness of analysis etc. with reference to guaranteeing by reference to image, user measures reference pattern by mode key 25 or the menu setecting of push portion 11, automatically entered measurement pattern 1, in addition, also can show the options of selective measurement pattern, require user's State selective measurements pattern, or also can carry out measurement pattern setting; Enter steps A 02.
Steps A 02, control part 10 carries out the designated treatment of the composition data of reference picture.See in detail the step S101-S107 in Figure 19.
Steps A 03, control part 10 carries out reference picture and is arranged in the set handling of the location parameter of infrared thermal imagery.See in detail the step S201-S203 in Figure 20.
Steps A 04, control part 10 carries out the composition data of analyzed area and determines processing.See in detail the step S301-S303 in Figure 21.
Steps A 05, control part 10 carries out analytical model corresponding to analyzed area and diagnostic rule is determined processing.See in detail the step S401-S403 in Figure 22.
Steps A 06, control part 10 carries out analyzed area and is arranged in the set handling of the location parameter of infrared thermal imagery.See in detail the step S501-S503 in Figure 23.
Steps A 07, control part 10 carries out definite processing of synthetic parameters.See in detail the step S601-S603 in Figure 24.
Steps A 08, obtains thermal-image data, is sent to interim storage part 6 by taking the thermal-image data obtaining;
Steps A 09, control part 10 is controlled the composition data, location rule, the synthetic parameters that determine according to selected measurement pattern, the reference picture (T1, F1) that selected composition data (T1, F1 composition data) is obtained according to the set described given size of reference picture position setting unit, position in accordance with regulations, shows jointly with the infrared thermal imagery of taking the thermal-image data generation obtaining; Particularly, when selecting measurement pattern 1, composition data is T1 composition data and F1 composition data, by the reference picture (T1 and F1) obtaining through predetermined processing (as convergent-divergent processing etc.), position and infrared thermal imagery synthesize processing according to synthetic parameters according to the rules, leave synthetic view data in interim storage part 6, then, control part 10 is controlled, and is presented at display part 4 with reference to image and infrared thermal imagery.As shown in display interface 1803.Can find out between subject thermal imagery IR1 and contour images T1 and have larger difference, can imagine, as do not embody subject morphological feature reference picture with reference to means, the form of the subject thermal imagery IR1 that user takes and image space, size, the angle in infrared thermal imagery, be difficult to subjective assurance, not only easily omit focus measurement position, and cause arranging the complex operation of analyzed area, and if there is no the form reference of T1, F1's is very weak with reference to effect.Owing to first entering measurement pattern 1, also show the printed words of " pattern 1 ".
Steps A 10, carries out analyzing and processing, diagnostic process;
The analytical model determining according to selected measurement pattern, carries out analyzing and processing; Particularly, when selecting measurement pattern 1, based on set analyzed area F1, the analytical model determining according to measurement pattern 1, takes to shoot part 1 thermal-image data obtaining and analyzes, and obtains analysis result.As control image processing part 2 to analyzed area F1(S01, S02) thermal-image data (thermal-image data in S01, S02) that determined, be converted to the processing of temperature value, and calculate according to the analytical model of the associated F1 analytical model information acquisition of analyzed area F1; By the analysis result data calculating, as the maximum temperature of territory element S01, S02, and the analysis result such as the temperature difference between S01, S02 is stored in the regulation region of interim storage part 6.
Then, carry out diagnostic process; Particularly, for example, control part 10(is as diagnosis unit), the diagnostic rule determining according to selected measurement pattern, the analysis result obtaining according to analysis, the diagnosis threshold values corresponding with analytical model compares, and this diagnosis threshold values and analysis result, according to the comparison in diagnostic rule, are obtained to diagnostic result.
Steps A 11, does control part 10 detects to receive analyze indication? as judged whether to exit measurement reference pattern without entering steps A 13, as do not exited, get back to steps A 08, in steps A 09, jointly show with reference to image and the infrared thermal imagery of taking the thermal-image data acquisition obtaining, reflected the dynamic infrared thermal imagery of continuous shooting acquisition and the state that reference picture shows continuously.And in steps A 10, the thermal-image data of new acquisition is analyzed and diagnosed, and analysis and diagnostic result are replaced it to front analysis and diagnostic result, be stored in the regulation region of interim storage part 6.
User is according to the vision reference of contour images T1, by adjusting shooting distance, angle, the image space between optics and the subject 1 of thermal imagery device 13, make to obtain as (display interface 1804) subject thermal imagery IR1 in Figure 18 with contour images T1 visually in the matching status that overlaps.At this moment, user presses and analyzes key 26, enters next step.
Steps A 12, display analysis and diagnostic result; As shown in (display interface 1805) in Figure 18, the analysis and the diagnostic result J18 that are stored in regulation region are presented to display part 3, user is convenient to judge according to analysis and diagnostic result.But be not limited to this, also can not show, for example, export from communication interface I/F5 as analysis and the diagnostic result data of controlling other device actions.
Does steps A 13, judge whether to supress switch key?
As press, switch accordingly, get back to steps A 02, according to handover configurations one (measurement pattern 3): the composition data of determining T1 and F101 obtains reference picture, as shown in 1806 in Figure 18, and analysis and diagnostic result is presented to display part 4; Thus, user can be according to this analysis and diagnostic result, as judgement more comprehensively.
As again pressed, switch accordingly, get back to steps A 02, according to handover configurations two (measurement pattern 2): the composition data of determining T1 and F1 obtains reference picture, and using F1(analyzed area) as main object, F1(analyzed area is first set) be arranged in the location parameter of infrared thermal imagery, then, T1 be set be arranged in assigned position and the given size of infrared thermal imagery according to the position of F1; As shown in 1807 in Figure 18, and, due to the difference of shooting distance, different from 1805 of the analysis result of the infrared thermal imagery as shown in 1808, the temperature difference increases to 4.5, and diagnosis is changed to defect by concern, thus, user can be according to this analysis and diagnostic result, as judgement more comprehensively.
F1 is set to the display effect of main object, has represented the shooting analysis purpose that the maximization at the analysis position to F1 shows, notices that profile T1 part overflows, and meets application demand and can accept.According to the difference of measuring object etc., different main objects can be set and represent the region that needs primary part observation, be arranged in the assigned position of infrared thermal imagery and size and configure reference picture or analyzed area and be arranged in assigned position and the size of infrared thermal imagery according to main object, convenient flexible again.
In addition, be not limited to the conversion of location rule, switching can be reference picture, analyzed area, and the conversion of wherein one or more of synthetic parameters, analytical model etc., can reach different measurement or observing effects.
In addition, be not necessary for the embodiment of switching, also can be configured to specific keys in operating portion 11 corresponding with measurement pattern, or show the information relevant with measurement pattern at display part 4, as shown in figure 26 measurement pattern selection information; Be convenient to therefrom State selective measurements pattern (being the state of having selected measurement pattern 1 in Figure 26) of user.At this, it can be icon, word, thumbnail etc. that measurement pattern is selected information.
Steps A 13, judge whether to exit measurement reference pattern, as do not exit, get back to steps A 08, analyze key 26 as user does not discharge, in steps A 12, show real-time analysis and the diagnostic result of processing by analysis acquisition according to the thermal-image data of steps A 08 shooting acquisition, analyze key 26 as user discharges, show dynamic infrared thermal imagery and reference picture.
The designated treatment of the composition data of reference picture is described with reference to Figure 19.
Step S101, judges whether selected measurement pattern has the composition data of acquiescence, if any, jumping to step S107, control part 10 is selected the composition data of acquiescence; As nothing, enter step S102.
Step S102, the table 4 of control part 10 based on storage in flash memory 9, makes the assigned position of display part 4 show the subject selection information of specified quantity; Subject as shown in 1702 in Figure 17 is selected information list LB.
Step S103, then, according to the cognition of the subject 1 to floor, for example on-the-spot equipment direction board, is selected " subject 1 " shown on display part 4 by operating portion 11.In addition,, in the time that the subject information in table 4 is constituted by the attribute information of multiple attributes, by the demonstration of the attribute information (subject selection information) to the multiple attributes that form subject information and repeatedly selection, finally select subject information.
Step S104, then, control part 10 judges whether selected measurement pattern has the composition data of regulation specified type;
If any, control part 10 selects the composition data of subject information association corresponding to information to specify the subject of selecting according to user; For example, when having stored subject information and associated morphosis data thereof as shown in Figure 4 in flash memory 9, at step S107, for example ought select measurement pattern 1, according to selected measurement pattern 1, control part 10 is appointed as T1 composition data, F1 composition data the composition data of reference picture.
As no, the subject information association of for example selecting in step S103 the composition data of multiple types, selected measurement pattern is not provided with corresponding regulation specified type in advance, enters step S105.
Step S105, control part 10 makes display part 4 show that the identity information of each composition data selected again by user.Described identity information, as represented, the identity of its corresponding composition data selects information-related filename, numbering, thumbnail etc., for example, show the thumbnail that composition data is corresponding, selects for user, can select one or more.
Step S106, when user selects, enters step S107.
Step S107, reference picture designating unit is specified the composition data for obtaining reference picture.In this example, from flash memory 9, read T1, F1 composition data, comprise assigned position relation each other, be sent to interim storage part 6.
Above-mentioned embodiment, the composition data that reference picture specifying part is specified, can be the composition data of acquiescence; Or select the composition data of subject information association corresponding to information based on selected subject; Or, determine according to the rules type, the composition data of the multiple types based on storing in storage medium, determining wherein conforms with the regulations determines the composition data of type; Or the identity information of selecting composition data by user, specifies composition data.
In addition, when the composition data in storage medium does not have the form of the subject information associated with it, in above-mentioned steps, omit step S102, S103, has formed another kind of embodiment.And, step S102, the subject Information Selection step of S103 also can be used as a step before the composition data determining step of reference picture, and is not limited in the composition data determining step of reference picture.
Illustrate that with reference to Figure 20 reference picture is arranged in the set handling of the location parameter of infrared thermal imagery.
Step S201, control part 10 judges whether selected measurement pattern has the location rule of regulation, if had, jumps to step S203.If not, enter step S202.
Step S202, shows the menu that arranges as shown in Figure 9, and prompting accordingly, requires user's setting position rule.After completing, location rule is recorded in flash memory 9, as follow-up default configuration.
Step S203, arranges reference picture and is arranged in assigned position and the given size of infrared thermal imagery.
In the present embodiment, for example ought select measurement pattern 1, according to the location rule in measurement pattern 1, the type of main object is " benchmark 1 ", carry out self-adaptation and carry out computing reference image T1 and be arranged in the location parameter of infrared thermal imagery according to the middle position of adaptive region Z1, then, according to the assigned position relation between F1 and T1, determine the location parameter of F1 in infrared thermal imagery.As according to the location parameter of the assigned position relation of the two and reference picture T1, the convergent-divergent basic point using the convergent-divergent basic point (as central point) of T1 as F1, carries out convergent-divergent and obtains F1 and be arranged in the location parameter of infrared thermal imagery to be same as the convergent-divergent rate of T1 to F1.Above position set-up mode, user can not need to carry out manual operation, input the location parameter of reference picture, in the time taking, carry out Lookup protocol reference picture and be arranged in assigned position and the given size of infrared thermal imagery by thermal imagery device 13 location rule according to the rules, in guaranteeing the size and location specification of subject thermal imagery, make simple to operate.Be not limited to this, control part 10 also can determine that by position and the size of operating portion typing reference picture is arranged in position and the size of infrared thermal imagery based on user.
Definite processing of the composition data of analyzed area is described with reference to Figure 21.
Whether step S301, judge in selected measurement pattern and have the regulation of analyzed area to determine type; If any, jumping to step S303, control part 10 according to the rules definite type is determined analyzed area.As no, enter step S302.
Step S302, arranges analyzed area;
The composition data in Allocation Analysis region, as shown in Figure 9 menu is set, and prompting accordingly, or also show the hurdle that arranges of point, line, surface, requires user to arrange and the type of the composition data in selection analysis region.
Step S303, determines the composition data of analyzed area.
In the present embodiment, for example, due in selected measurement pattern 1, definite type of the regulation of analyzed area is " auxiliary 1 ", " F1 composition data " is defined as to the composition data of analyzed area.
Determining of the composition data of analyzed area, can determine the composition data of acquiescence, as automatically determined the composition data of analyzed area in conjunction with the regulation specified type of composition data according to the subject information of selecting; As the composition data of analyzed area is determined in the selection of the identity information to composition data according to user; As according to the operation of specific keys being selected to the composition data of the analyzed area that this button is corresponding.Also trigger condition that can be based on regulation, determines and the composition data of the analyzed area corresponding with this trigger condition obtains analyzed area.Composition data based on subject information association is determined the data of purchasing into of analyzed area, can be to select for obtaining the composition data of analyzed area from the composition data of subject information association, also can from the composition data of subject information association, specify (processing and/or calculating) object, the composition data of processing and/or calculating acquisition is appointed as to the composition data for obtaining analyzed area.
Definite processing of analytical model, diagnostic rule is described with reference to Figure 22.
Step S401, judges whether selected measurement pattern has the analytical model of appointment, diagnostic rule; If any, jumping to step S403, control part 10 is determined the analytical model of appointment and diagnostic rule; As nothing, enter step S402.
Step S402, controls the menu that arranges making as shown in figure 13, requires user to carry out the setting of analytical model, diagnostic rule etc.When being provided with after analytical model corresponding to analyzed area, diagnostic rule, by set being stored in interim storage part 6, in addition, also analytical model corresponding newly-installed analyzed area, diagnostic rule and subject information association can be kept in flash memory 9.For example be stored in table 4.As follow-up use.In addition also can, by analytical model pre-stored in thermal imagery device 13 and corresponding diagnostic rule etc., select.
Step S403, in the present embodiment, owing to having stipulated " analyzing and diagnosing 1 " in selected measurement pattern 1, is determined analyzing and diagnosing corresponding F1 composition data 1.
Illustrate that with reference to Figure 23 analyzed area is arranged in the set handling of the location parameter of infrared thermal imagery.
Step S501, control part 10 judges in selected measurement pattern, whether have the location rule of regulation or location parameter, jumps in this way step S503.As no, enter step S502.
Step S502, shows the menu that arranges as shown in Figure 9, requires user that the location rule of analyzed area is set.After completing, the location rule of the analyzed area of the type is recorded in flash memory 9, as follow-up default configuration.
Step S503, arranges analyzed area and is arranged in the location parameter of infrared thermal imagery according to location rule or location parameter.
In the present embodiment, according to the location rule of the reference picture in selected measurement pattern and analyzed area, in measurement pattern 1, the type of main object is benchmark 1, main object is according to the middle position of adaptive region Z1, self-adaptation is calculated the assigned position and the given size that are arranged in infrared thermal imagery, then according to the assigned position relation between analyzed area F1 and T1, determines position and the size of analyzed area F1 in infrared thermal imagery.Under measurement pattern 2 states, the type of main object is auxiliary 1, main object is according to the middle position of adaptive region Z1, self-adaptation is calculated the assigned position and the given size that are arranged in infrared thermal imagery, then, according to the assigned position relation between analyzed area F1 and T1, determine position and the size of T1 in infrared thermal imagery.
In addition, main object can also be that the composition data outside reference picture, analyzed area obtains, and analyzed area and reference picture all arrange location parameter separately according to main object.
In the time taking, location rule is according to the rules come Lookup protocol reference picture and analyzed area and is arranged in the location parameter of infrared thermal imagery, user can not need to carry out the location parameter of manual operation input analyzed area etc. etc., in guaranteeing the size and location specification of subject thermal imagery, make simple to operate.Be not limited to this, control part 10 also can determine that by the location parameter of operating portion typing reference picture and analyzed area are arranged in the location parameter of infrared thermal imagery based on user.
The set handling of reference picture synthetic parameters is described with reference to Figure 24.
Step S601, control part 10 judges in " measurement pattern 1 " whether have the synthetic parameters of regulation, if had, jumps to step S603, determines the synthetic parameters of regulation, if not, enters step S602.
Step S602, shows menu is set, example as shown in figure 13 menu " analysis configuration CD3 " is set, require user that synthetic parameters is set.After completing, synthetic parameters is recorded in flash memory 9, for example preservation associated with " measurement pattern information 1 ", as the formation of follow-up " measurement pattern information 1 ".
Step S603, display control unit, according to the synthetic parameters in measurement pattern information 1, arranges the synthetic synthetic parameters of reference picture T1 and infrared thermal imagery.
In addition, the position of determining (steps A 04), analyzed area that the composition data of (steps A 03), analyzed area is set about the position of the appointment (steps A 02) of the composition data of reference picture, reference picture arranges the relevant processing of the setting (steps A 07) of determining (steps A 05), synthetic parameters of (steps A 06), analytical model and diagnostic rule etc., to describe according to certain order of steps, but can there be various sequencings according to different embodiments, be not limited to the processing order described in embodiment.
In addition, in the present embodiment, measurement pattern 1, measurement pattern 2, measurement pattern 3, be the switching according to operating portion, display part is according to blocked operation, can show according to this multiple analyses and diagnostic result that the combination of multiple different analyzed areas and analytical model, diagnostic rule obtains.But do not limit therewith, display part multiple analyses that simultaneously display measurement pattern 1, measurement pattern 3 obtain and diagnostic result (also can be considered a total analyzed area and total analytical model and diagnostic rule), obviously, in some cases (as there is not contradiction in the information in measurement pattern, for example complementary or situation arranged side by side), select two or above different measurement pattern also to can be combined to a total measurement pattern.
In addition, in the present embodiment, carry out all the time analyzing and diagnosing processing, and continuous replacement analysis diagnostic result, in the time of the diagnostic annunciation indication that receives user, display analysis and diagnostic result; But also can be configured to the processing of just analyzing and diagnosing in the time pressing analysis key; Or analysis and diagnostic result also can show all the time and refresh; Or, also can only show diagnostic result, and display analysis result not.
In addition, as shown in Figure 180 3, also the subject thermal imagery IR1 in infrared thermal imagery is removed to mate in the position of capable of regulating reference picture, preferably, described reference picture reference picture position setting unit and analyzed area reference picture position setting unit, according to user's adjustment operate to change position that reference picture and analyzed area be arranged in infrared thermal imagery, size, the anglec of rotation one of at least, and keep the assigned position relation of the two constant.For example, while adjusting one of them, the identical change that another carries out according to the variation of the position of adjusting, size, the anglec of rotation, to keep the assigned position relation of the two constant.
It should be noted that, although introduced according to measurement pattern in embodiment 1, composition data to reference picture, analyzed area, definite embodiment of analytical model, position arrange the embodiment that arranges that embodiment, switching are set of embodiment, synthetic parameters, and can be configured these processing by user.But be not limited to this, for example, in the time that thermal imagery device 13 dispatches from the factory, one or a combination above in above-mentioned multiple setting have been configured, the location rule, synthetic parameters, definite mode of analyzed area, definite mode of analytical model of definite mode, the reference picture of reference picture for example, while dispatching from the factory, are configured, in use, according to the composition data in storage medium, automatically carry out definite embodiment of reference picture, analyzed area etc. according to the configuration of dispatching from the factory.Or, while dispatching from the factory, configure some projects, carried out the configuration of other parts by user.At this, above-mentioned advantage is performed as a series of representational embodiment operation, and arbitrary product of implementing embodiments of the present invention might not need to reach above-described all advantages simultaneously.
As mentioned above, in embodiment 1, according to the measurement pattern of selecting, in infrared thermal imagery, show the reference picture that has embodied the predetermined morphological feature of subject, using this reference picture as the vision reference of taking subject thermal imagery, and by this reference picture, analyzed area with according to analytical model corresponding to analyzed area, subject thermal imagery is analyzed, obtain and analyze and diagnostic result.And, user is easy to judge the state of reference picture and subject thermal imagery vision matching, at this moment, analyze, guaranteed the correctness of analyzing, and then, analysis and diagnostic result are diagnosed and observed, user's technical requirement is reduced, shooting speed improves, reduce the difficulty of diagnosis, simple to operate.Thus, make common user also can reach good shooting level of skill.
Carry out to introduce in detail the control flow of embodiment 2 below.Embodiment 2, for to have the thermal imagery device 13 identical with the structure shown in embodiment 1, has stored the control program that is different from embodiment 1 in flash memory 9, response user's analysis indication, will freeze to show and keep thermal-image data.And different from embodiment 1, measurement pattern 1 is identical with embodiment 1, and measurement pattern 2, measurement pattern 3 only have the configuration information about analyzed area, analytical model, diagnostic rule; First, user has selected measurement pattern 1 as the measurement pattern adopting in analysis to measure reference pattern.
With reference to Figure 25, control flow is described.
Step B01, whether control part 10 persistent surveillance users have selected measurement reference pattern.When user has selected measurement pattern 1, enter step B02.
Step B02, control part 10 carries out definite processing of the composition data of reference picture.See in detail the step S101-S107 in Figure 19.
Step B03, control part 10 carries out reference picture and is arranged in the set handling of the location parameter of infrared thermal imagery, sees in detail the step S201-S203 in Figure 20.
Step B04, control part 10 carries out definite processing of synthetic parameters, sees in detail the step S601-S603 in Figure 24.
Step B05, then, is sent to interim storage part 6 by taking the thermal-image data obtaining;
Step B06, the reference picture that specified composition data is obtained according to the set given size of reference picture position setting unit, position according to the rules, shows jointly with infrared thermal imagery.At this moment, as shown in Figure 180 3.
Step B07, judges whether user has carried out supressing analysis key 26, as nothing, gets back to step B04-B05, shows reference picture and takes the continuous synthetic image of the infrared thermal imagery obtaining.When user is by adjusting shooting distance, angle, the image space between optics and the subject 1 of thermal imagery device 13, make to obtain as (display interface 1804) subject thermal imagery IR1 in Figure 18 with contour images T1 visually in the matching status that overlaps.At this moment, user presses and analyzes key 26, enters next step.
Step B06, responds this operation, and the thermal-image data that step B04 is obtained remains on the regulation region of interim storage part 6; Or also step B05 is obtained to composograph or infrared thermal imagery and remains on the regulation region of interim storage part 6, composograph (or this infrared thermal imagery) is freezed to show.
Step B09, control part 10 carries out definite processing of the composition data of analyzed area.Refer to the step S301-S303 in Figure 21.
Step B10, control part 10 carries out definite processing of analytical model corresponding to analyzed area and diagnostic rule.See in detail the step S401-S403 in Figure 22.
Step B11, control part 10 carries out analyzed area and is arranged in the set handling of the location parameter of infrared thermal imagery.See in detail the step S501-S503 in Figure 23.
Step B12, kept thermal-image data is analyzed and diagnostic process, by the analysis result data obtaining, as the maximum temperature of territory element S01, S02, and the analysis result such as the temperature difference between S01, S02 and corresponding diagnostic result are stored in the regulation region of interim storage part 6.
Step B13, notification analysis and diagnostic result, in the present embodiment, be presented at display part 3 by analyzed area F1 and analysis and diagnostic result J17, as shown in display interface 1805.User is convenient to judge according to analysis and diagnostic result.But be not limited to this, also can not show, for example, export from communication I/F5 as the analysis and the diagnostic result data that offer other devices.Or only notify diagnostic result.
Step B14, judge whether user has selected other measurement pattern, as selected, get back to step B09, process accordingly, as nothing, enter next step, preferred, display part is shown as measurement pattern selectionbar as shown in figure 26, user can carry out the selection of measurement pattern, carries out different analyses.
Does step B15, judge whether to have discharged analysis key 22? as discharged, enter step B16, as do not discharged, get back to step B13, continue display analysis and diagnostic result.
Step B16, judges whether to exit measurement reference pattern, as otherwise get back to step B05, exit in this way measurement reference pattern.
As mentioned above, in the present embodiment 2, different from embodiment 1, user, under the state of reference picture and infrared thermal imagery vision matching, freezes to show infrared thermal imagery or composograph, according to the measurement pattern of selecting, analyze and the demonstration of analyzing and diagnosing result, guaranteed the correctness of analyzing.Said process is convenient to the analyzing and diagnosing in infrared shooting, and user's technical requirement is reduced, and shooting speed improves, and has reduced the difficulty of diagnosis, simple to operate.
The present embodiment is having in the thermal imagery device 13 identical with the structure shown in Fig. 1, in flash memory 9, store under playback mode, carry out the infrared thermal imagery to playback, the control program that carries out analyzed area setting and diagnosis by State selective measurements pattern, the control program of reference picture and adjustment reference picture further, is set.
An example for enforcement selects to need infrared data to be processed (for example, selecting to need thermal imagery file to be processed, the thermal-image data obtaining from storage card 8) in playback mode, control part 10 first judges the whether related and analyzed area of infrared data (frame), the information that reference picture etc. are relevant, for example, composition data with infra red data as-sodation preservation, the location parameter of reference picture or analyzed area, the identity information of composition data, subject information etc., if any, can be according to these information of association (as nothing, can make the relevant filename of identity information of the selective composition data showing, numbering, thumbnail etc., selected by user), and the measurement pattern of selecting is determined the reference picture with morphological feature, analyzed area, analytical model, diagnostic rule, then, the reference picture that embodies subject morphological feature is shown jointly with the infrared thermal imagery that needs infrared data to be processed to obtain, if, visually subject thermal imagery and reference picture match, can be according to corresponding analytical model and diagnostic rule, infrared data is analyzed and diagnosed, obtain and analyze and diagnostic result.If matching degree is not high, user also can carry out position, the size of reference picture, the adjustment of the anglec of rotation, remove to mate the subject thermal imagery in infrared thermal imagery, in the time of vision matching, determine the analyzed area with reference picture with assigned position relation, the analytical model then determining according to measurement pattern and diagnostic rule carry out analyzing and diagnosing.And, in diagnosis, can also select other measurement pattern, analyze and diagnose.
Be not limited to the thermal imagery device with shoot function, the present embodiment also can thermal imagery treating apparatus (display device using as computing machine, personal digital assistant, with the thermal imagery matched with devices of shoot function etc.) as the example of measurement pattern selecting arrangement, for the arrangement to infrared data (as thermal imagery file).
Although the present invention in embodiment 1 for thering is the thermal imagery device 13 of shoot function, obtain the function of thermal-image data and be not absolutely necessary but take for the present invention, the present invention also can be applicable to receive from outside and process the thermal imagery treating apparatus of thermal imagery transmission data etc.Described thermal imagery transmission data, for example, can be thermal-image data, can be the infrared thermal imagery that thermal-image data generates, and can be the thermal-image data after compression, can be the data etc. of compression infrared thermal imagery.The example of embodiment 4 using thermal imagery treating apparatus 100 as measurement pattern selecting arrangement.It is the block diagram of the electrical structure of a kind of enforcement of the thermal imagery disposal system that connects and composes of thermal imagery treating apparatus 100 and thermal imagery filming apparatus 101 with reference to Figure 28.
Thermal imagery treating apparatus 100 has communication interface 1, auxiliary storage portion 2, display part 3, RAM4, hard disk 5, operating portion 6 are connected and carry out entirety control with above-mentioned parts CPU7 by bus.As thermal imagery treating apparatus 100, can exemplify personal computer, personal digital assistant, with the matching used display device of thermal imagery filming apparatus etc. as an example.Thermal imagery treating apparatus 100, based on the control of CPU7, receives by communication interface 1 the thermal imagery transmission data that the thermal imagery filming apparatus 101 that is connected with thermal imagery treating apparatus 100 is exported.Communication interface 1, the thermal imagery transmission data of exporting for receiving continuously thermal imagery filming apparatus 101; Wherein, comprise and receive (the thermal imagery transmission data of being exported by thermal imagery filming apparatus 101 send by relay) the thermal imagery transmission data that send by relay; Meanwhile, also can be used as the communication interface that thermal imagery filming apparatus 101 is controlled.At this, communication interface 1 comprises the various wired or wireless communication interfaces on thermal imagery treating apparatus 100, as network interface, USB interface, 1394 interfaces, video interface etc.Auxiliary storage portion 2, the such as storage medium such as CD-ROM, storage card and relevant interface.Display part 3 is as liquid crystal display, and display part 3 can also be other displays that are connected with thermal imagery treating apparatus 100, and can there is no display in the electrical structure of thermal imagery treating apparatus 100 self.The memory buffer that RAM4 carries out interim storage as the thermal imagery transmission data that communication interface 1 is received, works as the working storage of CPU7 meanwhile, the data that temporary transient storage is processed by CPU7.In hard disk 5, store the program for controlling, and the various data that use in controlling.From thermal imagery device 13, remove shoot part 1 structure and thermal imagery treating apparatus 100 in addition roughly the same, obviously, by obtaining thermal imagery transmission data, be suitable for equally above-described embodiment.Therefore omitted the explanation of embodiment.
Wherein, CPU7 has also carried out the function of image processing part, obtain the view data of infrared thermal imagery for the processing of the thermal imagery transmission data enforcement regulation to receiving, the processing of regulation is as correction, interpolation, pseudo-color, synthetic, compression, decompress(ion) etc., is converted to and is suitable for showing the processing of using etc. data with, record.Wherein, CPU7 transmits the different-format of data according to thermal imagery, a kind of embodiment, for example, when the thermal imagery transmission data that receive are the thermal-image data of compression, the thermal imagery that the processing of regulation receives acquisition unit as CPU7 transmits data to carry out decompress(ion) and carries out corresponding predetermined processing; A kind of embodiment, corresponding predetermined processing after compression thermal-image data (thermal imagery transmission data) decompress(ion) is processed as puppet is color, obtain the view data of infrared thermal imagery, the various processing of the regulations such as in addition, the thermal imagery transmission data of the processing of regulation also as after decompress(ion) are proofreaied and correct, interpolation.Another kind of embodiment, for example, when the thermal imagery transmission data itself that receive have been the view data of the infrared thermal imagery of compression, decompress(ion) obtains the view data of infrared thermal imagery.Another embodiment, for example, when communication interface 1 receive be the infrared thermal imagery of simulation time, control obtain the view data of digital infrared thermal imagery after relevant A/D convertor circuit AD changes, be sent to interim storage part 6.
Thermal imagery filming apparatus 101 can be various types of thermal imagery filming apparatus, and it is for subject is taken, and heat outputting picture transmission data.See the electrical diagram of thermal imagery filming apparatus 101 in Figure 28, formed by communication interface 10, shoot part 20, flash memory 30, image processing part 40, RAM50, CPU60 etc.Wherein, CPU60 has controlled the overall action of thermal imagery filming apparatus 101, has stored the various data that use in control program and each several part control in flash memory 30.Shoot part 20 comprises not shown optics, driver part, thermal imagery sensor, signal pre-processing circuit, for taking acquisition thermal-image data.This thermal-image data is temporarily stored in RAM50, and after through image processing part 40(as DSP) through predetermined processing (as compression process etc.) after obtain thermal imagery transmit data, export through communication interface 10.According to the difference of design and use object, for example, the thermal imagery transmission data that thermal imagery filming apparatus 101 is exported can be the thermal-image datas after predetermined processing, also can be the view data (view data of the thermal imagery that thermal-image data generates) of thermal imagery, one or more of the data of the view data of thermal-image data or thermal imagery after prescribed form compression etc., is referred to as thermal imagery transmission data.At this, the thermal imagery transmission data of thermal imagery filming apparatus 101 for taking and exporting, it acts on the shoot part 1 in similar thermal imagery device 13.Figure 29 is the schematic diagram of a kind of enforcement of the thermal imagery disposal system that connects and composes of thermal imagery treating apparatus 100 and thermal imagery filming apparatus 101.Thermal imagery filming apparatus 101 adopts The Cloud Terrace etc. to be erected at detection vehicle, and the modes such as the LAN (Local Area Network) forming via the order wires such as private cable or wired with wireless mode are connected with thermal imagery treating apparatus 100.User watches and monitors subject thermal imagery by thermal imagery treating apparatus 100.Thermal imagery filming apparatus 101, connects and composes the data logging system in embodiment with thermal imagery treating apparatus 100, obtains thermal-image data for subject is taken, and heat outputting picture transmission data.
And it can be that various users are easy to identification and measure the word (letter, numeral, Chinese character) of object, icon, thumbnail etc. or its combination that measurement pattern is selected information.The mark of the measurement effect that described measurement pattern selection information also can represent, as the mark in Figure 27, represents the type of composition data and the location parameter in infrared thermal imagery (can embody is location parameter accurately or roughly); And further also can embody or also in conjunction with the reference picture of synthetic parameters with reference to effect, 2701 mark (corresponding measurement pattern 1), 2702 mark (corresponding measurement pattern 3), 2703 mark (corresponding measurement pattern 2); Obviously, these marks can be schematically, with corresponding measurement pattern information association storage, for example, are common to all subject information in table 4 in advance; Or can be also to generate according to selection to subject information etc., as according to composition data and location rule that measurement pattern determined, generate reference picture and/or analyzed area and be arranged in the thumbnail of the effect of infrared thermal imagery.Or can be also such mode, there is thumbnail and word, wherein thumbnail has embodied the type of composition data, explanatory note one of them or multiple combinations such as location rule, analytical model, diagnostic rule, measuring point, measurement object, can express simply to identify in conjunction with illustrative information.Above measurement pattern selects the example of information not form the restriction of measurement pattern being selected to information, in a word, can be that various energy represent or point out the measurement pattern of measuring object and/or measurement effect to select information.
Preferably, can adopt the mode of voice to notify, accordingly, the data of sound bank are stored (as being voice corresponding to analyzing and diagnosing result, or speech data corresponding to character becomes corresponding voice next life according to the content of analyzing and diagnosing result) in an embodiment, when selected measurement pattern packets of information is containing the regulation specified type of the composition data of decision reference picture, location parameter, the relevant information of synthetic parameters, the relevant information that described display control unit comprises according to measurement pattern information, carry out the composition data of designated reference image, the location parameter of reference picture is set, determine synthetic parameters, implement the common demonstration of reference picture and infrared thermal imagery, carry out the control of the common demonstration of reference picture and infrared thermal imagery.When selected measurement pattern packets of information is containing regulation specified type, location parameter, analytical model, the relevant information of diagnostic rule of composition data that determines analyzed area, the relevant information that thermal imagery diagnosis portion comprises according to measurement pattern information, determine analyzed area composition data, arrange analyzed area location parameter, determine analytical model, determine diagnostic rule, and the analytical model, the diagnostic rule that determine according to measurement pattern information, according to the analyzed area obtaining, obtained thermal-image data is implemented to analyze and diagnosis; Carry out the control of analyzing and diagnosing.Obviously, State selective measurements pattern is applicable to too the analyzing and processing of thermal-image data and (omits definite processing of diagnostic rule, diagnostic process), State selective measurements pattern is applicable to the demonstration control (omit location parameter, the analytical model of analyzed area, analyzed area, definite processing of diagnostic rule, and analyzing and processing, diagnostic process) of reference picture too.
In addition, also can realize the processing of the part or all of parts in embodiments of the present invention and control function with special circuit or general processor or programmable FPGA.
In addition the every profession and trade that, is also useful in infrared detection except power industry is extensively used.The above-mentioned described only embodiment for inventing, variously exemplify explanation and essence of an invention Composition of contents is not limited, those skilled in the art can carry out to embodiment other modifications and variations having read after instructions, and does not deviate from essence of an invention and scope.
Claims (22)
1. measurement pattern selecting arrangement, comprising:
Acquisition unit, for obtaining thermal-image data;
Measurement pattern selection portion, for State selective measurements pattern;
Display control unit, shows reference picture and the infrared thermal imagery that the thermal-image data obtaining generates for controlling jointly, and described reference picture is arranged in infrared thermal imagery;
Wherein, described display control unit, according to the selected measurement pattern of measurement pattern selection portion, carries out the control of the common demonstration of reference picture and infrared thermal imagery.
2. measurement pattern selecting arrangement as claimed in claim 1, is characterized in that,
Described display control unit has: reference picture designating unit, is used to specify the composition data relevant with reference picture; Position setting unit, is positioned at the location parameter of infrared thermal imagery for the reference picture obtaining based on specified composition data is set; Indicative control unit, for synthetic parameters according to the rules, shows jointly with reference to image and infrared thermal imagery;
The measurement pattern information that described display control unit is corresponding according to the selected measurement pattern of measurement pattern selection portion, carry out the control of the common demonstration of reference picture and infrared thermal imagery, described measurement pattern packets of information is containing the relevant information that determines in the location parameter, synthetic parameters of regulation specified type, reference picture of composition data of reference picture at least one.
3. measurement pattern selecting arrangement, comprising:
Acquisition unit, for obtaining thermal-image data;
Measurement pattern selection portion, for State selective measurements pattern;
Display control unit, shows reference picture and the infrared thermal imagery that the thermal-image data obtaining generates for controlling jointly, and described reference picture is arranged in infrared thermal imagery;
Thermal imagery analysis portion, analyzes for the thermal-image data that acquisition unit is obtained, and obtains analysis result;
Wherein, described display control unit, according to selected measurement pattern, carries out the control of the common demonstration of reference picture and infrared thermal imagery, and/or described thermal imagery analysis portion is according to selected measurement pattern, the control of analyzing.
4. measurement pattern selecting arrangement as claimed in claim 3, is characterized in that,
Described display control unit has: reference picture designating unit, is used to specify the composition data relevant with reference picture; Position setting unit, is positioned at the location parameter of infrared thermal imagery for the reference picture obtaining based on specified composition data is set; Indicative control unit, for synthetic parameters according to the rules, shows jointly with reference to image and infrared thermal imagery;
Described thermal imagery analysis portion has: analyzed area determining unit, for determining the composition data of analyzed area; Analyzed area position setting unit, is positioned at the location parameter of infrared thermal imagery for analyzed area is set; Analytic unit, based on the analyzed area of described location parameter, analytical model according to the rules, the thermal-image data that acquisition unit is obtained is analyzed, and obtains analysis result;
When measurement pattern information corresponding to selected measurement pattern, when the relevant information of the regulation specified type that comprises the composition data that determines reference picture, the location parameter of reference picture, synthetic parameters one of them or multiple combinations, the relevant information that display control unit comprises according to measurement pattern information, determine accordingly composition data, the reference picture of reference picture location parameter, synthetic parameters one of them or multiple, and implement the common demonstration of reference picture and infrared thermal imagery with this; Carry out the control of the common demonstration of reference picture and infrared thermal imagery;
When measurement pattern information corresponding to selected measurement pattern, when the relevant information of the regulation specified type that comprises the composition data that determines analyzed area, the location parameter of analyzed area, analytical model one of them or multiple combinations, the relevant information that thermal imagery analysis portion comprises according to measurement pattern information, determine accordingly composition data, the analyzed area of analyzed area location parameter, analytical model one of them or multiple, and implement the analysis of the thermal-image data to being obtained with this; The control of analyzing;
Wherein, described measurement pattern packets of information is containing the relevant information of at least one determining in location parameter, the analytical model of regulation specified type, analyzed area of composition data of location parameter, synthetic parameters, analyzed area of regulation specified type, reference picture of composition data of reference picture.
5. measurement pattern selecting arrangement, comprising:
Acquisition unit, for obtaining thermal-image data;
Measurement pattern selection portion, for State selective measurements pattern;
Display control unit, shows reference picture and the infrared thermal imagery that the thermal-image data obtaining generates for controlling jointly, and described reference picture is arranged in infrared thermal imagery;
Thermal imagery diagnosis portion, carries out analyzing and diagnosing for the thermal-image data that acquisition unit is obtained, and obtains diagnostic result;
Wherein, described display control unit, according to selected measurement pattern, carries out the control of the common demonstration of reference picture and infrared thermal imagery, and/or described thermal imagery diagnosis portion, according to selected measurement pattern, carries out the control of analyzing and diagnosing.
6. measurement pattern selecting arrangement as claimed in claim 5, is characterized in that,
Described display control unit has: reference picture designating unit, is used to specify the composition data relevant with reference picture; Position setting unit, is positioned at the location parameter of infrared thermal imagery for the reference picture obtaining based on specified composition data is set; Indicative control unit, for synthetic parameters according to the rules, shows jointly with reference to image and infrared thermal imagery;
Described thermal imagery diagnosis portion has: analyzed area determining unit, for determining the composition data of analyzed area; Analyzed area position setting unit, is positioned at the location parameter of infrared thermal imagery for analyzed area is set; Analytic unit, based on the analyzed area of described location parameter, analytical model according to the rules, the thermal-image data that acquisition unit is obtained is analyzed, and obtains analysis result; Diagnosis unit, for obtaining analysis result according to analytic unit, diagnostic rule is diagnosed according to the rules, obtains diagnostic result;
When measurement pattern information corresponding to selected measurement pattern, when the relevant information of the regulation specified type that comprises the composition data that determines reference picture, the location parameter of reference picture, synthetic parameters one of them or multiple combinations, the relevant information that display control unit comprises according to measurement pattern information, determine accordingly composition data, the reference picture of reference picture location parameter, synthetic parameters one of them or multiple, and implement the common demonstration of reference picture and infrared thermal imagery with this; Carry out the control of the common demonstration of reference picture and infrared thermal imagery;
When measurement pattern information corresponding to selected measurement pattern, when the relevant information of the regulation specified type that comprises the composition data that determines analyzed area, the location parameter of analyzed area, analytical model, diagnostic rule one of them or multiple combinations, the relevant information that thermal imagery diagnosis portion comprises according to measurement pattern information, determine accordingly composition data, the analyzed area of analyzed area location parameter, analytical model, diagnostic rule one of them or multiple, and implement analysis and the diagnosis of the thermal-image data to being obtained with this; Carry out the control of analyzing and diagnosing;
Wherein, described measurement pattern packets of information is containing the relevant information of at least one determining in the location parameter, analytical model, diagnostic rule of regulation specified type, analyzed area of composition data of location parameter, synthetic parameters, analyzed area of regulation specified type, reference picture of composition data of reference picture.
7. the measurement pattern selecting arrangement as described in claim 1-6 any one, is characterized in that having configuration section, carries out the configuration of the corresponding measurement pattern information of measurement pattern for user.
8. the measurement pattern selecting arrangement as described in claim 1-6 any one, is characterized in that, described reference picture has embodied the morphological feature of subject.
9. the measurement pattern selecting arrangement as described in claim 1-6 any one, it is characterized in that, described measurement pattern information at least comprises the relevant information of at least one in the regulation specified type of the composition data that determines reference picture and/or the location parameter of reference picture.
10. the measurement pattern selecting arrangement as described in claim 3-6 any one, is characterized in that,
Described measurement pattern information at least comprises the relevant information of at least one in location parameter, the analytical model of regulation specified type, analyzed area of the composition data that determines analyzed area.
11. measurement pattern selecting arrangements as described in claim 5-6 any one, is characterized in that,
Described measurement pattern information at least comprises the relevant information of at least one in the location parameter, analytical model, diagnostic rule of regulation specified type, the analyzed area of the composition data that determines analyzed area.
12. measurement pattern selecting arrangements as described in claim 1-6, is characterized in that having
Subject Information Selection portion, for selecting subject information;
Described display control unit is according to selected subject information, and the composition data of this subject information association based on storing in storage medium, specifies the composition data for obtaining reference picture.
13. measurement pattern selecting arrangements as described in claim 3-6 any one, is characterized in that,
Subject Information Selection portion, for selecting subject information;
Described thermal imagery analysis portion is according to selected subject information, the composition data of this subject information association based on storing in storage medium, the analytical model information of composition data association, regulation specified type and the analytical model of the composition data of the analyzed area determining according to selected measurement pattern, the control of analyzing; Described analytical model is the analytical model obtaining according to the analytical model information of the composition data association of specified analyzed area.
14. measurement pattern selecting arrangements as described in claim 5-6 any one, is characterized in that,
Subject Information Selection portion, for selecting subject information;
Described thermal imagery diagnosis portion is according to selected subject information, the diagnostic rule information of the composition data of this subject information association based on storing in storage medium, the analytical model information of composition data association and analytical model information association, and regulation specified type, analytical model, the diagnostic rule of the composition data of the analyzed area of selected measurement pattern decision, the control of diagnosing; Described analytical model is the analytical model obtaining according to the analytical model information of the composition data association of specified analyzed area; Described diagnostic mode is the analytical model information corresponding according to described analytical model, the diagnostic rule obtaining according to the diagnostic rule information of this analytical model information association.
15. measurement pattern selecting arrangements as described in claim 1-14 any one, it is characterized in that, there is measurement pattern information display control unit, make display part show the measurement pattern selection information relevant with measurement pattern for controlling, it can be the information of one or more combinations in word, icon, thumbnail that described measurement pattern is selected information.
16. measurement pattern selecting arrangements as claimed in claim 15, is characterized in that, described measurement pattern selection information has embodied measurement object and/or measurement effect.
17. measurement pattern selecting arrangements as described in claim 15-16 any one, is characterized in that described model selection
The response user of portion selects the selection of information to measurement pattern, carry out State selective measurements pattern.
18. measurement pattern selecting arrangements as claimed in claim 15, is characterized in that,
Subject Information Selection portion, for selecting subject information;
Described measurement pattern information display control unit is according to selected subject information, and the composition data of this subject information association based on storing in storage medium, carrys out display measurement model selection information; Described measurement pattern selection information is the thumbnail that the composition data regulation specified type corresponding according to measurement pattern and location rule obtain, embodied the corresponding reference picture of measurement pattern with reference to effect.
19. measurement pattern systems of selection, comprising:
Obtaining step, for obtaining thermal-image data;
Measurement pattern is selected step, for State selective measurements pattern;
Show and control step, for controlling, reference picture and the infrared thermal imagery that the thermal-image data obtaining generates are shown jointly, described reference picture is arranged in infrared thermal imagery;
Wherein, described demonstration control step is selected the selected measurement pattern of step according to measurement pattern, carries out the control of the common demonstration of reference picture and infrared thermal imagery.
20. measurement pattern systems of selection, comprising:
Obtaining step, for obtaining thermal-image data;
Measurement pattern is selected step, for State selective measurements pattern;
Show and control step, for controlling, reference picture and the infrared thermal imagery that the thermal-image data obtaining generates are shown jointly, described reference picture is arranged in infrared thermal imagery;
Thermal imagery analytical procedure, analyzes for the thermal-image data that obtaining step is obtained, and obtains analysis result;
Wherein, described demonstration control step, according to selected measurement pattern, is carried out the control of the common demonstration of reference picture and infrared thermal imagery, and/or described thermal imagery analytical procedure is according to selected measurement pattern, the control of analyzing.
21. measurement pattern systems of selection, comprising:
Obtaining step, for obtaining thermal-image data;
Measurement pattern is selected step, for State selective measurements pattern;
Show and control step, for controlling, reference picture and the infrared thermal imagery that the thermal-image data obtaining generates are shown jointly, described reference picture is arranged in infrared thermal imagery;
Thermal imagery diagnosis algorithm, carries out analyzing and diagnosing for the thermal-image data that obtaining step is obtained, and obtains diagnostic result;
Wherein, described demonstration control step, according to selected measurement pattern, is carried out the control of the common demonstration of reference picture and infrared thermal imagery, and/or described thermal imagery diagnosis algorithm, according to selected measurement pattern, carries out the control of analyzing and diagnosing.
22. measurement pattern systems of selection as described in claim 19-21 any one, it is characterized in that, there is measurement pattern information and show control step, make to show the measurement pattern selection information relevant with measurement pattern for controlling, it can be the information of one or more combinations in word, icon, thumbnail that described measurement pattern is selected information, has embodied measurement object and/or effect.
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|---|---|---|---|---|
| CN112881842A (en) * | 2021-01-25 | 2021-06-01 | 众智学府信息技术有限公司 | Intelligent diagnosis module for equipment |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2593173Y (en) * | 2003-05-14 | 2003-12-17 | 王兴华 | Infrared thermal imaging rapid thermometer |
| CN102538980A (en) * | 2012-01-12 | 2012-07-04 | 杭州美盛红外光电技术有限公司 | Thermal image device and shooting method for thermal image |
| CN102538974A (en) * | 2012-01-12 | 2012-07-04 | 杭州美盛红外光电技术有限公司 | Thermal image display device, thermal image display system and thermal image display method |
| CN102564607A (en) * | 2012-01-12 | 2012-07-11 | 杭州美盛红外光电技术有限公司 | Thermal imaging device and standard thermal image photographing method |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7924312B2 (en) * | 2008-08-22 | 2011-04-12 | Fluke Corporation | Infrared and visible-light image registration |
| CN102319059B (en) * | 2011-10-28 | 2013-03-27 | 北京天助基业科技发展有限公司 | Near-infrared fluorescence imaging surgery guide device and application thereof |
-
2013
- 2013-09-22 WO PCT/CN2013/083954 patent/WO2014044220A1/en active Application Filing
- 2013-09-22 CN CN201310433271.1A patent/CN103776541A/en not_active Withdrawn
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2593173Y (en) * | 2003-05-14 | 2003-12-17 | 王兴华 | Infrared thermal imaging rapid thermometer |
| CN102538980A (en) * | 2012-01-12 | 2012-07-04 | 杭州美盛红外光电技术有限公司 | Thermal image device and shooting method for thermal image |
| CN102538974A (en) * | 2012-01-12 | 2012-07-04 | 杭州美盛红外光电技术有限公司 | Thermal image display device, thermal image display system and thermal image display method |
| CN102564607A (en) * | 2012-01-12 | 2012-07-11 | 杭州美盛红外光电技术有限公司 | Thermal imaging device and standard thermal image photographing method |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112881842A (en) * | 2021-01-25 | 2021-06-01 | 众智学府信息技术有限公司 | Intelligent diagnosis module for equipment |
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Address after: Yuhang District of Hangzhou city in Zhejiang province 311113 Qixian Village Building 1 Liangzhu Street Bridge Applicant after: Mission Infrared Electro-optics Technology Co., Ltd. Address before: 310030 Zhejiang city of Hangzhou province Xihu District city Hongkong No. 386 thick Renlu 14 Building 3 floor Applicant before: Mission Infrared Electro-optics Technology Co., Ltd. |
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Application publication date: 20140507 |