Intelligent diagnosis module for equipment
Technical Field
The invention relates to the technical field of intelligent diagnosis of equipment faults of a transformer substation, in particular to an intelligent diagnosis device and a diagnosis method thereof.
Background
The voltage heating type equipment comprises a high-voltage bushing, a lightning arrester, an insulator and the like, and because the temperature difference is small (0-4K), whether the equipment has temperature abnormality can be judged only by adjusting the temperature to a very narrow range on a transformer substation detection site, and the detection difficulty is high. At present, a main voltage heating fault diagnosis method of a power grid is judged by an image characteristic judgment method and a similar comparison method, but the situation that judgment of a detector on the same defect grade is divergent is often encountered, the same defect is not unified in judgment of severity of the defect in different eyes, is difficult to be unified in judgment of occurrence mechanism of the defect, is not unified in subsequent treatment judgment of the defect, and is mostly judged according to the experience of DL/T664-2016 or testers, but the content of DL/T664-2016 is not perfect, many definitions are fuzzy, and effective judgment on the defect is difficult to form. The discovery of the voltage heating type defects depends on the environment, the experience of operators and the operation level of accurate detection to a great extent, when the infrared thermograph of the voltage heating type equipment is collected, the quantity of the collected infrared thermographs is small, the obtained infrared thermographs are not standard, and meanwhile, the intelligent diagnosis on site cannot be carried out.
Disclosure of Invention
In order to solve the problems, the technical scheme adopted by the invention is as follows:
an equipment intelligent diagnosis module is applied to an intelligent thermal imager, and the device comprises an acquisition module, a display module and a control module, wherein the acquisition module is used for acquiring a list of equipment to be diagnosed according to a target measuring point determined in an infrared analysis platform, and the list of the equipment to be diagnosed comprises the name of the equipment to be diagnosed and the shooting sequence of the equipment to be diagnosed;
the device to be diagnosed comprises a shooting module, a judging module and a judging module, wherein the shooting module is used for sequentially shooting the device to be diagnosed according to the shooting sequence in a device list to be diagnosed to obtain an infrared thermograph of the device to be diagnosed, a shooting interface comprises a reference image of the device to be diagnosed, and the device to be diagnosed is shot according to the reference image of the device to be diagnosed to obtain the infrared thermograph matched with the reference image;
the extraction module is used for extracting equipment characteristic parameters in the infrared thermography, wherein the equipment characteristic parameters comprise equipment types, equipment voltage levels, equipment structures, measuring point quantity, measuring point distribution and measuring point results;
the diagnosis module is used for carrying out field diagnosis on the equipment characteristic parameters according to a fault diagnosis rule to obtain a diagnosis result of the equipment to be diagnosed, wherein the diagnosis result comprises whether the equipment to be diagnosed has a fault, a fault type, a fault part and a fault severity level, the fault diagnosis rule is a preset rule, and the fault diagnosis rule comprises a fault type, a threshold value corresponding to the fault type, a severity level range and a fault diagnosis logic rule.
Preferably, the fault diagnosis rule further includes a processing suggestion corresponding to the fault type and a fault reason corresponding to the fault type, the apparatus further includes a determining module, the diagnosis result is that a target fault exists, and the processing suggestion corresponding to the target fault and the fault reason corresponding to the target fault are determined according to the fault diagnosis rule. And the relevant personnel can timely process the target fault according to the processing suggestion.
Preferably, the fault diagnosis rule is an open structure, and is used for adding a new logic rule for fault diagnosis or a new fault type, and the new fault type corresponds to a new fault characteristic parameter and a new threshold value.
Preferably, the diagnosis module includes an extraction unit, configured to extract a target fault diagnosis rule according to a device type in the device feature parameter, where the target fault diagnosis rule is a fault diagnosis rule corresponding to the device type;
the calculation unit is used for carrying out weighted calculation on the measuring point results in the equipment characteristic parameters according to the fault diagnosis logic rules in the target fault diagnosis rules to obtain a comprehensive result;
the comparison unit is used for comparing the comprehensive result with a threshold corresponding to a target fault type and determining whether the equipment to be diagnosed has a fault and the target fault type;
the difference value calculation unit is used for performing difference value calculation on the comprehensive result and a threshold value corresponding to the target fault type to obtain a target difference value;
and the determining unit is used for determining the severity level of the target fault according to the severity level range to which the target difference value belongs.
An intelligent diagnosis method for equipment is characterized in that a list of equipment to be diagnosed is obtained according to target measuring points determined in an infrared analysis platform, wherein the list of the equipment to be diagnosed comprises the following components: the name of the equipment to be diagnosed, and the shooting sequence of the equipment to be diagnosed;
sequentially shooting the devices to be diagnosed according to the shooting sequence in the device list to be diagnosed to obtain infrared thermographs of the devices to be diagnosed, wherein the infrared thermographs are named according to names of the devices to be diagnosed, when shooting is carried out, reference images of the devices to be diagnosed are contained in a shooting interface, and the devices to be diagnosed are shot according to the reference images of the devices to be diagnosed to obtain the infrared thermographs matched with the reference images;
extracting equipment characteristic parameters in the infrared thermography, wherein the equipment characteristic parameters comprise equipment types, equipment voltage levels, equipment structures, measuring point number, measuring point distribution and measuring point results;
and performing field diagnosis on the equipment characteristic parameters according to a fault diagnosis rule to obtain a diagnosis result of the equipment to be diagnosed, wherein the diagnosis result comprises whether the equipment to be diagnosed has a fault, a fault type, a fault position and a fault severity level, the fault diagnosis rule is a preset rule, and the fault diagnosis rule comprises a fault type, a threshold value corresponding to the fault type, a severity level range and a fault diagnosis logic rule.
Preferably, the fault diagnosis rule further includes a processing suggestion corresponding to the fault type and a fault reason corresponding to the fault type, and after a diagnosis result of the device to be diagnosed is obtained, the method further includes determining a processing suggestion corresponding to the target fault and a fault reason corresponding to the target fault according to the fault diagnosis rule if the diagnosis result is that the target fault exists, so that relevant personnel can process the target fault in time according to the processing suggestion.
Preferably, the field diagnosis is performed on the equipment characteristic parameters according to the fault diagnosis rules, the obtaining of the diagnosis result of the equipment to be diagnosed comprises extracting target fault diagnosis rules according to the equipment type in the equipment characteristic parameters, the target fault diagnosis rule is a fault diagnosis rule corresponding to the equipment type, the measurement point results in the equipment characteristic parameters are subjected to weighted calculation according to the fault diagnosis logic rule in the target fault diagnosis rule, the comprehensive results are obtained and compared with the threshold corresponding to the target fault type, whether the equipment to be diagnosed has the fault or not is determined, the target fault type is determined, the comprehensive results and the threshold corresponding to the target fault type are subjected to difference calculation, the target difference is obtained, and the severity level of the target fault is determined according to the severity level range to which the target difference belongs.
Preferably, after the diagnosis result of the device to be diagnosed is obtained, the method further includes alarming to prompt relevant personnel if the diagnosis result indicates that the target fault exists.
Preferably, after the diagnosis result of the device to be diagnosed is obtained, the method further includes sending the infrared thermography of the device to be diagnosed and the diagnosis result to the infrared analysis platform, so that the infrared analysis platform performs intelligent analysis.
In summary, due to the adoption of the technical scheme, the invention has the beneficial effects that:
according to the intelligent diagnosis method for the equipment, the intelligent thermal imager obtains a list of the equipment to be diagnosed according to the target measuring point determined by the infrared analysis platform, further obtains the infrared thermograph named according to the name of the equipment to be diagnosed, shoots the equipment to be diagnosed according to the reference image of the equipment to be diagnosed in the shooting interface, can obtain the standard and uniform infrared thermograph, further can extract the equipment characteristic parameters in the infrared thermograph, finally carries out field diagnosis on the equipment characteristic parameters according to the fault diagnosis rule, obtains the diagnosis result of the equipment to be diagnosed, is good in real-time performance and high in intelligent degree, and solves the technical problems that the equipment infrared thermograph acquired by the existing front-end image acquisition equipment cannot meet the requirements easily and cannot carry out intelligent diagnosis according to the acquired equipment infrared thermograph.
Drawings
For a clearer explanation of the embodiments or technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the invention, and it is obvious for a person skilled in the art that other drawings can be obtained from the drawings without creative efforts.
Fig. 1 is a flowchart of a method for intelligent diagnosis of a device according to an embodiment of the present invention;
FIG. 2 is a flow chart of another method for intelligent diagnosis of a device according to an embodiment of the present invention;
fig. 3 is a flowchart of a method for performing field diagnosis on device characteristic parameters according to a fault diagnosis rule to obtain a diagnosis result of a device to be diagnosed, according to an embodiment of the present invention;
FIG. 4 is a functional block diagram of an apparatus for intelligent diagnosis of a device according to an embodiment of the present invention;
as shown in the above legend: an acquisition module 11; a photographing module 12; an extraction module 13; a diagnostic module 14.
Detailed Description
In order to facilitate an understanding of the invention, the invention is described in more detail below with reference to the accompanying drawings and specific examples. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The use of the terms "fixed," "left," "right," and the like in this description is for illustrative purposes only, and elements having similar structures are designated by the same reference numerals in the figures.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.
Example 1
An equipment intelligent diagnosis module is applied to an intelligent thermal imager, and the device comprises an acquisition module 11, a diagnosis module and a display module, wherein the acquisition module is used for acquiring a list of equipment to be diagnosed according to a target measuring point determined in an infrared analysis platform, and the list of the equipment to be diagnosed comprises the name of the equipment to be diagnosed and the shooting sequence of the equipment to be diagnosed;
the shooting module 12 is configured to sequentially shoot the devices to be diagnosed according to the shooting order in the device list to be diagnosed to obtain an infrared thermograph of the devices to be diagnosed, where a shooting interface includes a reference image of the devices to be diagnosed, and shoot the devices to be diagnosed according to the reference image of the devices to be diagnosed to obtain the infrared thermograph matched with the reference image;
the extraction module 13 is used for extracting device characteristic parameters in the infrared thermography, wherein the device characteristic parameters comprise device types, device voltage levels, device structures, measuring point number, measuring point distribution and measuring point results;
a diagnosis module 14, configured to perform field diagnosis on the device characteristic parameters according to a fault diagnosis rule to obtain a diagnosis result of the device to be diagnosed, where the diagnosis result includes whether the device to be diagnosed has a fault, a fault type, a fault location, and a severity level of the fault, the fault diagnosis rule is a preset rule, and the fault diagnosis rule includes a fault type, a threshold corresponding to the fault type, a severity level range, and a logic rule of fault diagnosis
Example 2
On the basis of embodiment 1, the fault diagnosis rule further includes a processing suggestion corresponding to the fault type and a fault reason corresponding to the fault type, the apparatus further includes a determining module, the diagnosis result is that a target fault exists, and the processing suggestion corresponding to the target fault and the fault reason corresponding to the target fault are determined according to the fault diagnosis rule.
Example 3
On the basis of the embodiment 1, the fault diagnosis rule is an open structure and is used for adding a new logic rule for fault diagnosis or a new fault type, and the new fault type corresponds to a new fault characteristic parameter and a new threshold value.
Example 4
On the basis of embodiment 1, the diagnosis module 14 includes an extracting unit, configured to extract a target fault diagnosis rule according to a device type in the device feature parameters, where the target fault diagnosis rule is a fault diagnosis rule corresponding to the device type;
the calculation unit is used for carrying out weighted calculation on the measuring point results in the equipment characteristic parameters according to the fault diagnosis logic rules in the target fault diagnosis rules to obtain a comprehensive result;
the comparison unit is used for comparing the comprehensive result with a threshold corresponding to a target fault type and determining whether the equipment to be diagnosed has a fault and the target fault type;
the difference value calculation unit is used for performing difference value calculation on the comprehensive result and a threshold value corresponding to the target fault type to obtain a target difference value;
and the determining unit is used for determining the severity level of the target fault according to the severity level range to which the target difference value belongs.
Example 5
An intelligent diagnosis method for equipment is characterized in that a list of equipment to be diagnosed is obtained according to target measuring points determined in an infrared analysis platform, wherein the list of the equipment to be diagnosed comprises the following components: the name of the equipment to be diagnosed, and the shooting sequence of the equipment to be diagnosed;
sequentially shooting the devices to be diagnosed according to the shooting sequence in the device list to be diagnosed to obtain infrared thermographs of the devices to be diagnosed, wherein the infrared thermographs are named according to names of the devices to be diagnosed, when shooting is carried out, reference images of the devices to be diagnosed are contained in a shooting interface, and the devices to be diagnosed are shot according to the reference images of the devices to be diagnosed to obtain the infrared thermographs matched with the reference images;
extracting equipment characteristic parameters in the infrared thermography, wherein the equipment characteristic parameters comprise equipment types, equipment voltage levels, equipment structures, measuring point number, measuring point distribution and measuring point results;
and performing field diagnosis on the equipment characteristic parameters according to a fault diagnosis rule to obtain a diagnosis result of the equipment to be diagnosed, wherein the diagnosis result comprises whether the equipment to be diagnosed has a fault, a fault type, a fault position and a fault severity level, the fault diagnosis rule is a preset rule, and the fault diagnosis rule comprises a fault type, a threshold value corresponding to the fault type, a severity level range and a fault diagnosis logic rule.
Example 6
On the basis of embodiment 5, the fault diagnosis rule further includes a processing suggestion corresponding to the fault type and a fault reason corresponding to the fault type, and after the diagnosis result of the device to be diagnosed is obtained, the method further includes determining a processing suggestion corresponding to the target fault and a fault reason corresponding to the target fault according to the fault diagnosis rule if the diagnosis result is that the target fault exists, so that relevant personnel can process the target fault in time according to the processing suggestion.
Example 7
On the basis of the embodiment 5, the equipment characteristic parameters are diagnosed on site according to the fault diagnosis rules, the obtained diagnosis result of the equipment to be diagnosed comprises the steps of extracting target fault diagnosis rules according to the equipment types in the equipment characteristic parameters, the target fault diagnosis rule is a fault diagnosis rule corresponding to the equipment type, the measurement point results in the equipment characteristic parameters are subjected to weighted calculation according to the fault diagnosis logic rule in the target fault diagnosis rule, the comprehensive results are obtained and compared with the threshold corresponding to the target fault type, whether the equipment to be diagnosed has the fault or not is determined, the target fault type is determined, the comprehensive results and the threshold corresponding to the target fault type are subjected to difference calculation, the target difference is obtained, and the severity level of the target fault is determined according to the severity level range to which the target difference belongs.
Example 8
On the basis of the embodiment 5, after the diagnosis result of the device to be diagnosed is obtained, if the diagnosis result is that a target fault exists, an alarm is given to prompt relevant personnel.
Example 9
On the basis of the embodiment 5, after the diagnosis result of the device to be diagnosed is obtained, the method further includes sending the infrared thermography of the device to be diagnosed and the diagnosis result to the infrared analysis platform, so that the infrared analysis platform performs intelligent analysis.
Further, the apparatus further comprises: and the alarm module is used for alarming to prompt related personnel if the diagnosis result shows that the target fault exists.
Further, the apparatus further comprises: and the sending module is used for sending the infrared thermal image and the diagnosis result of the equipment to be diagnosed to the infrared analysis platform so as to enable the infrared analysis platform to carry out intelligent analysis.
It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the system and the apparatus described above may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
The technical features mentioned above are combined with each other to form various embodiments which are not listed above, and all of them are regarded as the scope of the present invention described in the specification; also, modifications and variations may be suggested to those skilled in the art in light of the above teachings, and it is intended to cover all such modifications and variations as fall within the true spirit and scope of the invention as defined by the appended claims.