CN103718063B - 基于铽的探测器闪烁体 - Google Patents

基于铽的探测器闪烁体 Download PDF

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Publication number
CN103718063B
CN103718063B CN201280037639.6A CN201280037639A CN103718063B CN 103718063 B CN103718063 B CN 103718063B CN 201280037639 A CN201280037639 A CN 201280037639A CN 103718063 B CN103718063 B CN 103718063B
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CN
China
Prior art keywords
scintillator
array
imaging system
light output
radiation
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CN201280037639.6A
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English (en)
Chinese (zh)
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CN103718063A (zh
Inventor
C·R·龙达
N·康拉茨
H·奥兰德
H·施赖讷马赫尔
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Koninklijke Philips NV
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Koninklijke Philips Electronics NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
    • C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
    • C09K11/77—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
    • C09K11/7766—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals containing two or more rare earth metals
    • C09K11/7767—Chalcogenides
    • C09K11/7769—Oxides
    • C09K11/7771—Oxysulfides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
    • G01T1/2023—Selection of materials
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pulmonology (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Luminescent Compositions (AREA)
  • Conversion Of X-Rays Into Visible Images (AREA)
CN201280037639.6A 2011-07-28 2012-07-03 基于铽的探测器闪烁体 Active CN103718063B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161512452P 2011-07-28 2011-07-28
US61/512,452 2011-07-28
PCT/IB2012/053372 WO2013014557A1 (en) 2011-07-28 2012-07-03 Terbium based detector scintillator

Publications (2)

Publication Number Publication Date
CN103718063A CN103718063A (zh) 2014-04-09
CN103718063B true CN103718063B (zh) 2017-04-26

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ID=46545429

Family Applications (1)

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CN201280037639.6A Active CN103718063B (zh) 2011-07-28 2012-07-03 基于铽的探测器闪烁体

Country Status (6)

Country Link
US (1) US9322935B2 (cg-RX-API-DMAC7.html)
EP (1) EP2737340B1 (cg-RX-API-DMAC7.html)
JP (1) JP6215825B2 (cg-RX-API-DMAC7.html)
CN (1) CN103718063B (cg-RX-API-DMAC7.html)
RU (1) RU2605518C2 (cg-RX-API-DMAC7.html)
WO (1) WO2013014557A1 (cg-RX-API-DMAC7.html)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105738939B (zh) * 2016-04-01 2019-03-08 西安电子科技大学 基于碳化硅PIN二极管结构的β辐照闪烁体探测器
CN115932932A (zh) * 2022-11-03 2023-04-07 宁波虔东科浩光电科技有限公司 一种闪烁体探测阵列的信号处理方法及成像设备

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0235387A2 (en) * 1985-12-30 1987-09-09 General Electric Company Radiation detector employing solid state scintillator material and preparation methods therefor
CN1111603A (zh) * 1994-01-26 1995-11-15 西门子公司 一种半透明度高的发光材料制造方法
WO2007004099A1 (en) * 2005-07-05 2007-01-11 Philips Intellectual Property & Standards Gmbh Gd2o2s: pr for ct with a very short afterglow due to the use of yb as a scavenger for eu
CN101107206A (zh) * 2004-05-17 2008-01-16 皇家飞利浦电子股份有限公司 荧光陶瓷及其制备方法
CN101253128A (zh) * 2005-07-25 2008-08-27 圣戈本陶瓷及塑料股份有限公司 稀土氧硫化物闪烁体及其生产方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3974389A (en) * 1974-11-20 1976-08-10 Gte Sylvania Incorporated Terbium-activated rare earth oxysulfide X-ray phosphors
JP2928677B2 (ja) * 1991-06-21 1999-08-03 株式会社東芝 Ｘ線検出器およびｘ線検査装置
US5882547A (en) 1996-08-16 1999-03-16 General Electric Company X-ray scintillators and devices incorporating them
JP3777486B2 (ja) 1997-07-08 2006-05-24 株式会社日立メディコ 蛍光体及びそれを用いた放射線検出器及びｘ線ｃｔ装置
JP3741302B2 (ja) * 1998-05-06 2006-02-01 日立金属株式会社 シンチレータ
US7282713B2 (en) * 2004-06-10 2007-10-16 General Electric Company Compositions and methods for scintillator arrays
WO2006111900A2 (en) 2005-04-19 2006-10-26 Philips Intellectual Property & Standards Gmbh Procedure to obtain gd2o2s: pr for ct with a very short afterglow
JP2009523689A (ja) 2006-01-18 2009-06-25 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 単軸加熱プレス及びフラックス助剤を用いるｇｏｓセラミックの生産方法
US20100231892A1 (en) * 2006-08-15 2010-09-16 Koninklijke Philips Electronics N. V. Method of measuring and/or judging the afterglow in ceramic materials and detector
CN101573309B (zh) 2006-12-20 2013-05-29 皇家飞利浦电子股份有限公司 轴向热压方法
US8294112B2 (en) 2008-08-08 2012-10-23 Koninklijke Philips Electronics N.V. Composite scintillator including a micro-electronics photo-resist
EP3447802B1 (en) * 2009-06-17 2021-04-21 The Regents Of The University Of Michigan Photodiode and other sensor structures in flat-panel x-ray imagers and method for improving topological uniformity of the photodiode and other sensor structures in flat-panel x-ray imagers based on thin-film electronics
JP2012185123A (ja) * 2011-03-08 2012-09-27 Sony Corp 放射線撮像装置および放射線撮像装置の製造方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0235387A2 (en) * 1985-12-30 1987-09-09 General Electric Company Radiation detector employing solid state scintillator material and preparation methods therefor
CN1111603A (zh) * 1994-01-26 1995-11-15 西门子公司 一种半透明度高的发光材料制造方法
CN101107206A (zh) * 2004-05-17 2008-01-16 皇家飞利浦电子股份有限公司 荧光陶瓷及其制备方法
WO2007004099A1 (en) * 2005-07-05 2007-01-11 Philips Intellectual Property & Standards Gmbh Gd2o2s: pr for ct with a very short afterglow due to the use of yb as a scavenger for eu
CN101253128A (zh) * 2005-07-25 2008-08-27 圣戈本陶瓷及塑料股份有限公司 稀土氧硫化物闪烁体及其生产方法

Also Published As

Publication number Publication date
WO2013014557A1 (en) 2013-01-31
EP2737340B1 (en) 2019-04-24
US9322935B2 (en) 2016-04-26
EP2737340A1 (en) 2014-06-04
RU2014107693A (ru) 2015-09-10
RU2605518C2 (ru) 2016-12-20
CN103718063A (zh) 2014-04-09
JP2014529060A (ja) 2014-10-30
JP6215825B2 (ja) 2017-10-18
US20140177783A1 (en) 2014-06-26

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