CN103713218A - Crystal oscillator temperature characteristic automatic measuring method and system - Google Patents
Crystal oscillator temperature characteristic automatic measuring method and system Download PDFInfo
- Publication number
- CN103713218A CN103713218A CN201310739265.9A CN201310739265A CN103713218A CN 103713218 A CN103713218 A CN 103713218A CN 201310739265 A CN201310739265 A CN 201310739265A CN 103713218 A CN103713218 A CN 103713218A
- Authority
- CN
- China
- Prior art keywords
- crystal oscillator
- temperature
- measuring unit
- frequency measurement
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Oscillators With Electromechanical Resonators (AREA)
Abstract
The invention discloses a crystal oscillator temperature characteristic automatic measuring method and system. The method includes the steps that a plurality of temperature test points of a crystal oscillator to be tested are set; temperature adjusting signals are sequentially generated according to the temperature test points and sent to a crystal oscillation measurement unit to adjust environment temperature provided by the crystal oscillation measurement unit for the crystal oscillator to be tested; when the environment temperature of the crystal oscillation measurement unit reaches the temperature test points, frequency measurement signals are generated and sent to the crystal oscillation measurement unit, and frequency measurement values, in the crystal oscillation measurement unit, of the crystal oscillator to be tested are acquired; frequency measurement values corresponding to all the temperature test points are acquired, data processing is conducted on the frequency measurement values, and temperature characteristic indexes of the crystal oscillator to be tested are obtained. The problems that due to manual involvement in a crystal oscillator temperature characteristic test, temperature points of the test are not accurately set, errors exist in manual data processing, misjudgment is easily caused and production efficiency is low are solved.
Description
Technical field
The present invention relates to computer data and process and automatic measurement field, relate in particular to a kind of crystal oscillator temperature characterisitic method for automatic measurement and system.
Background technology
Quartz oscillator is the oscillator of a kind of high precision, high stability, is widely used in all kinds of oscillatory circuits such as colour TV, computing machine, telepilot.Quartz oscillator is divided into the several types such as non-Temp .-compensation type crystal oscillator, temperature compensating crystal oscillator, voltage controlled crystal oscillator and crystal oscillator with constant temperature control.Wherein, crystal oscillator with constant temperature control is current frequency stability and the highest crystal oscillator of degree of accuracy, it is all very good in the performance of the aspects such as ageing rate, temperature stability, long-term stability and short-term stability, is the quartz-like crystal oscillator more widely using at present.Because the oscillating characteristic of quartz crystal is along with the variation of temperature changes in oscillator, so crystal oscillator with constant temperature control is when temperature change, can stability that holding frequency be very important, therefore, the temperature characterisitic of crystal oscillator with constant temperature control is its very important parameter.
At present, the temperature property test of crystal oscillator is to adopt manual control testing apparatus and carry out, and changes test environment and the test condition of testing apparatus by artificial mode, and by manual image data, then completes calculating and the judgement of test result.But, follow application to improve constantly the performance requirement of crystal oscillator, current test mode often cannot reach the application testing requirement of crystal oscillator, for example: the temperature spot of test arrange not accurate enough, test condition can not meet, there is error in artificial data processing, easily cause misjudgment and production efficiency low inferior.
Summary of the invention
In view of this, the invention provides a kind of crystal oscillator temperature characterisitic automatic test approach and system.Solved that condition not accurate enough, test can not meet, artificial data processing exists error because the temperature spot of the artificial test that participates in crystal oscillator temperature property test and bring arranges, easily caused misjudgment and the low inferior problem of production efficiency.
In first aspect, the embodiment of the present invention provides a kind of crystal oscillator temperature characterisitic method for automatic measurement, comprising:
A plurality of temperature test points of crystal oscillator to be measured are set;
According to described a plurality of temperature test points, produce successively temperature adjustment signal, send to crystal oscillator measuring unit, take and adjust the environment temperature that described crystal oscillator measuring unit provides as crystal oscillator to be measured;
When the environment temperature of described crystal oscillator measuring unit often reaches a temperature test point, produce frequency measurement signal, send to crystal oscillator measuring unit, obtain the frequency measurement of crystal oscillator to be measured in described crystal oscillator measuring unit;
Obtain each frequency measurement corresponding with the whole temperature test points that arrange, described each frequency measurement is carried out to data processing, obtain the temperature characterisitic index of described crystal oscillator to be measured.
In second aspect, the embodiment of the present invention provides a kind of crystal oscillator temperature characterisitic automatic measurement system, the measure-controlling unit being connected and crystal oscillator measuring unit, wherein:
Described measure-controlling unit comprises:
Subelement is set, for a plurality of temperature test points of crystal oscillator to be measured are set;
Temperature is adjusted subelement, for according to described a plurality of temperature test points, produces successively temperature adjustment signal, sends to crystal oscillator measuring unit, take and adjusts the environment temperature that crystal oscillator measuring unit provides as crystal oscillator to be measured;
Frequency measurement subelement, while often reaching a temperature test point for the environment temperature when described crystal oscillator measuring unit, produces frequency measurement signal, sends to crystal oscillator measuring unit, to obtain the frequency measurement of crystal oscillator to be measured in described crystal oscillator measuring unit;
Data processing subelement, for obtaining each frequency measurement corresponding with the whole temperature test points that arrange, carries out data processing to described each frequency measurement, obtains the temperature characterisitic index of described crystal oscillator to be measured;
Described crystal oscillator measuring unit comprises:
Temperature control parts, for the temperature adjustment signal producing according to described measure-controlling unit, adjust the environment temperature that described crystal oscillator measuring unit provides for crystal oscillator to be measured;
Frequency measurement parts, for the frequency measurement signal producing according to described measure-controlling unit, measure the frequency values of crystal oscillator to be measured in described crystal oscillator measuring unit.
The embodiment of the present invention is by being undertaken integrated by crystal oscillator measuring unit and measure-controlling unit, use measure-controlling unit to control the environment temperature that crystal oscillator measuring unit provides for crystal oscillator to be measured, automatically gather the frequency measurement of the crystal oscillator to be measured at specific environment temperature, when crystal oscillator completes after test in its whole probe temperature interval, measure-controlling unit carries out data processing to each frequency measurement, obtain the technological means of the temperature characterisitic index of described crystal oscillator to be measured, solved because the temperature spot of the artificial test that participates in crystal oscillator temperature property test and bring arranges not accurate enough, the condition of test can not meet, there is error in artificial data processing, easily cause misjudgment, the low inferior problem of production efficiency, whole crystal oscillator test process is completed automatically, reached minimizing human input, the technique effect that reduces measuring error and enhance productivity.
Accompanying drawing explanation
Fig. 1 is the process flow diagram of a kind of crystal oscillator temperature characterisitic automatic test approach of first embodiment of the invention;
Fig. 2 is the process flow diagram of a kind of crystal oscillator temperature characterisitic automatic test approach of second embodiment of the invention;
Fig. 3 is the software interface schematic diagram of man-machine interaction of the crystal oscillator temperature characterisitic automatic test approach of second embodiment of the invention;
Fig. 4 is the structural drawing of a kind of crystal oscillator temperature characterisitic Auto-Test System of third embodiment of the invention.
Embodiment
In order to make the object, technical solutions and advantages of the present invention clearer, below in conjunction with accompanying drawing, the specific embodiment of the invention is described in further detail.Be understandable that, specific embodiment described herein is only for explaining the present invention, but not limitation of the invention.It also should be noted that, for convenience of description, in accompanying drawing, only show part related to the present invention but not full content.
The first embodiment
Fig. 1 is the process flow diagram of a kind of crystal oscillator temperature characterisitic automatic test approach of first embodiment of the invention, the method of the present embodiment can be carried out by crystal oscillator temperature characterisitic Auto-Test System, and this system comprises measure-controlling unit and the crystal oscillator measuring unit of mutual cooperation.The method of the present embodiment is specifically carried out by measure-controlling unit, comprises the steps:
In the present embodiment, tester is to a plurality of temperature test points that crystal oscillator to be measured is set in measure-controlling unit.
Wherein, described a plurality of temperature test points can be determined by initial temperature, final temperature and temperature incremental steps are set.For example: it is 25 ℃ that initial temperature is set, and final temperature is 70 ℃, and temperature incremental steps is 5 ℃.Can so definite temperature test point be respectively 25 ℃, 30 ℃, 35 ℃, 40 ℃, 45 ℃, 50 ℃, 55 ℃, 60 ℃, 65 ℃ and 70 ℃.
Certainly, the mode that it will be understood by those skilled in the art that a plurality of temperature test points that crystal oscillator to be measured is set can also be taked other mode, such as: set gradually required a plurality of temperature test points etc., this is not limited.
In the present embodiment, measure-controlling unit, according to a plurality of temperature test points that arrange in step 110, produces temperature adjustment signal successively, sends to crystal oscillator measuring unit, take and adjusts the environment temperature that described crystal oscillator measuring unit provides as crystal oscillator to be measured.
In the present embodiment, the crystal oscillator to be measured that crystal oscillator measuring unit is portion placed within provides the environment temperature of test use.
Wherein, in crystal oscillator measuring unit, include temperature control parts, such as: thermistor, thermopair, platinum resistance or integrated temperature switch etc., preferably, controllable temperature switch, measure-controlling unit is by send corresponding temperature adjustment signal to temperature control parts, and then adjusts the environment temperature that described crystal oscillator measuring unit provides for crystal oscillator to be measured.
In the present embodiment, in order to make the frequency measurement of crystal oscillator to be measured more accurate, need to make crystal oscillator measuring unit be stabilized in after a temperature test point, then crystal oscillator to be measured is carried out to corresponding frequency measurement.Therefore, whether the described environment temperature that judges described crystal oscillator measuring unit reaches a temperature test point and can specifically comprise:
When measure-controlling unit sends after temperature adjustment signal to crystal oscillator measuring unit, obtain continuously a plurality of environment temperatures of described crystal oscillator measuring unit; The default deviation temperature range that is all positioned at described predetermined temperature test point place when the environment temperature continuous, predetermined number of obtaining (for example, ± 1 ℃, ± 2 ℃ etc.) time, the environment temperature of determining described crystal oscillator measuring unit reaches described predetermined temperature test point, or;
When measure-controlling unit sends after temperature adjustment signal to crystal oscillator measuring unit, interval predetermined time, the environment temperature of determining described crystal oscillator measuring unit reaches described predetermined temperature test point, that is to say, without judging again, interval is after predetermined time, and the environment temperature that measure-controlling unit is considered as described crystal oscillator measuring unit reaches described predetermined temperature test point.
For example, when measure-controlling unit sends to crystal oscillator measuring unit after the temperature adjustment signal of temperature adjustment to 55 ℃, (for example start to obtain continuously environment temperature in crystal oscillator measuring unit, every 1s, obtain once), when the predetermined number of obtaining continuously (for example, 20) environment temperature while being all positioned at the scope of 55 ℃ ± 1 ℃, determine that the environment temperature of crystal oscillator measuring unit reaches the temperature test point of 55 ℃, or;
When measure-controlling unit sends to crystal oscillator measuring unit after the temperature adjustment signal of temperature adjustment to 55 ℃, wait for predetermined one end time, for example, and 10 minutes, 15 minutes or 20 minutes etc., the environment temperature of acquiescence crystal oscillator measuring unit reaches the temperature test point of 55 ℃.
Certainly, it will be understood by those skilled in the art that and can also take other form to judge that whether the environment temperature of described crystal oscillator measuring unit reaches a temperature test point, does not limit this.
In the present embodiment, crystal oscillator measuring unit comprises frequency measurement parts, for the frequency measurement signal producing according to measure-controlling unit, measures the frequency values of crystal oscillator to be measured in described crystal oscillator measuring unit.
Wherein, under each temperature test point, can measure a frequency values of crystal oscillator to be measured as described frequency measurement; Also can after a plurality of frequency values of continuous coverage crystal oscillator to be measured, average, using this mean value as described frequency measurement; Also after can a plurality of frequency values of continuous coverage crystal oscillator to be measured, average after screening out outlier wherein, using this mean value as described frequency measurement etc., this is not limited.
In the present embodiment, measure-controlling unit obtains each frequency measurement corresponding to whole temperature test points arranging with tester.For example, as shown in table 1 is a kind of whole temperature test points of setting and the corresponding table of each frequency measurement.
Table 1
| Temperature test point (℃) | Frequency measurement (MHz) |
| 50 | 29.56492 |
| 55 | 29.56490 |
| 60 | 29.56486 |
| 65 | 31.56492 |
| 70 | 29.56495 |
In the present embodiment, can to each frequency measurement, carry out data processing by the mode of computation of mean values and variance, also can pass through calculated rate converted quantity
mode each frequency measurement is carried out to data processing.F is the nominal value of crystal oscillator oscillation frequency to be measured, and Δ f is the difference of frequency measurement and said frequencies nominal value.
Wherein, before each frequency measurement is carried out to data processing, can also, according to predetermined filtering algorithm, first screen out the outlier in each frequency measurement.For example, setting nominal value is 30MHz, if predetermined filtering algorithm is: the frequency measurement of the be greater than ± 1MHz that departs from nominal value is all considered as to outlier: putting corresponding frequency measurement with the temperature test of 65 ℃ in table 1 is outlier.
The embodiment of the present invention is by being undertaken integrated by crystal oscillator measuring unit and measure-controlling unit, use measure-controlling unit to control the environment temperature that crystal oscillator measuring unit provides for crystal oscillator to be measured, automatically gather the frequency measurement of the crystal oscillator to be measured at specific environment temperature, when crystal oscillator completes after test in its whole probe temperature interval, measure-controlling unit carries out data processing to each frequency measurement, obtain the technological means of the temperature characterisitic index of described crystal oscillator to be measured, solved because the temperature spot of the artificial test that participates in crystal oscillator temperature property test and bring arranges not accurate enough, the condition of test can not meet, there is error in artificial data processing, easily cause misjudgment, the low inferior problem of production efficiency, whole crystal oscillator test process is completed automatically, reached minimizing human input, the technique effect that reduces measuring error and enhance productivity.
On the basis of technique scheme, describedly obtain each frequency measurement corresponding with the whole temperature test points that arrange, described each frequency measurement is carried out to data processing, after obtaining the temperature characterisitic index of described crystal oscillator to be measured, also comprise: according to the temperature characterisitic index of the described crystal oscillator to be measured obtaining, determine that whether described crystal oscillator to be measured is qualified.
For example, predetermined temperature characterisitic standard is:
when the amount of frequency translation of calculating each frequency measurement of crystal oscillator to be measured is all less than 1.5, determine that current crystal oscillator to be measured is qualified; Otherwise defective.
Or, the scope of each predetermined frequency measurement average is [31,32], the scope of each predetermined frequency measurement variance is [0.5,0.5], when calculating the average of each frequency measurement of crystal oscillator to be measured and variance and meet predetermined average scope and variance scope, determine that current crystal oscillator to be measured is qualified; Otherwise defective.
On the basis of above-mentioned each technical scheme, described method also comprises: obtain the first verification data of storing in described crystal oscillator measuring unit; When the second verification msg of the local storage of the described first verification data obtaining and test macro is when consistent, judge that described test macro is normal with communicating by letter of described crystal oscillator measuring unit.Arrange like this benefit time, increased the checking to measure-controlling unit and crystal oscillator measuring unit communication reliability, can eliminate the impact on crystal oscillator temperature property test result due to the communication failure between measure-controlling unit and crystal oscillator measuring unit.Further improved the reliability of automatic test.
On the basis of above-mentioned each technical scheme, described method also comprises: according to standard temperature value, adjust the environment temperature of described crystal oscillator measuring unit; When the ambient temperature measurement value of described crystal oscillator measuring unit and described standard temperature are worth when consistent, judge that the temperature control parts in described crystal oscillator measuring unit are normal.Arrange like this benefit time, increased the checking of the temperature control part reliability in crystal oscillator measuring unit, can eliminate the impact on crystal oscillator temperature property test result due to the fault of the temperature control parts in crystal oscillator measuring unit.Further improved the reliability of automatic test.
The second embodiment
Figure 2 illustrates the process flow diagram of a kind of crystal oscillator temperature characterisitic automatic test approach of second embodiment of the invention, the present embodiment be take the various embodiments described above as basis, by crystal oscillator temperature characterisitic automatic test approach corresponding to four functional modules, comprise system configuration module, hardware controls module, test service process module and data processing module, wherein, test service process module calls hardware controls module and carries out real-time monitoring and running; Test service process module calls hardware controls module and carries out real-time data acquisition; Test data is carried out to intellectual analysis to data processing module and result is judged.As shown in Figure 2, described method specifically comprises the steps:
In the present embodiment, crystal oscillator Research on Automatic Measuring System of Temperature is according to the crystal oscillator of current loading, the test request of its temperature characterisitic of automatic acquisition (index such as temperature range);
Then start hardware testing equipment and by the communication interface of hardware controls, make testing apparatus run to crystal oscillator in first test condition in whole probe temperature interval;
Equipment to be tested is stable to be reached after test condition, and the automatic log-on data drainage pattern of software systems gathers the real-time representation of data of crystal oscillator feeding back by testing apparatus automatically, and data acquisition completes, and completes the test of this test condition; Then enter next test condition, testing apparatus is set and arrives test condition;
Repeat above step until complete the test condition in all temperature ranges;
Test macro enters data screening and intelligent decision pattern, and the data that collect according to test process, draw test result.
Accordingly, figure 3 illustrates a kind of software interface schematic diagram of man-machine interaction of crystal oscillator temperature characterisitic automatic test approach of second embodiment of the invention.
The embodiment of the present invention is by being undertaken integrated by crystal oscillator measuring unit and measure-controlling unit, use measure-controlling unit to control the environment temperature that crystal oscillator measuring unit provides for crystal oscillator to be measured, automatically gather the frequency measurement of the crystal oscillator to be measured at specific environment temperature, when crystal oscillator completes after test in its whole probe temperature interval, measure-controlling unit carries out data processing to each frequency measurement, obtain the technological means of the temperature characterisitic index of described crystal oscillator to be measured, solved because the temperature spot of the artificial test that participates in crystal oscillator temperature property test and bring arranges not accurate enough, the condition of test can not meet, there is error in artificial data processing, easily cause misjudgment, the low inferior problem of production efficiency, whole crystal oscillator test process is completed automatically, reached minimizing human input, the technique effect that reduces measuring error and enhance productivity.
The 3rd embodiment
Figure 4 illustrates the structural drawing of a kind of crystal oscillator temperature characterisitic Auto-Test System of third embodiment of the invention.As shown in Figure 4, described system comprises:
The measure-controlling unit 41 being connected and crystal oscillator measuring unit 42, wherein:
Described measure-controlling unit 41 comprises:
Subelement is set, for a plurality of temperature test points of crystal oscillator to be measured are set;
Temperature is adjusted subelement, for according to described a plurality of temperature test points, produces successively temperature adjustment signal, sends to crystal oscillator measuring unit, take and adjusts the environment temperature that crystal oscillator measuring unit provides as crystal oscillator to be measured;
Frequency measurement subelement, while often reaching a temperature test point for the environment temperature when described crystal oscillator measuring unit, produces frequency measurement signal, sends to crystal oscillator measuring unit, to obtain the frequency measurement of crystal oscillator to be measured in described crystal oscillator measuring unit;
Data processing subelement, for obtaining each frequency measurement corresponding with the whole temperature test points that arrange, carries out data processing to described each frequency measurement, obtains the temperature characterisitic index of described crystal oscillator to be measured;
Described crystal oscillator measuring unit 42 comprises:
Temperature control parts, for the temperature adjustment signal producing according to described measure-controlling unit, adjust the environment temperature that described crystal oscillator measuring unit provides for crystal oscillator to be measured;
Frequency measurement parts, for the frequency measurement signal producing according to described measure-controlling unit, measure the frequency values of crystal oscillator to be measured in described crystal oscillator measuring unit.The embodiment of the present invention is by being undertaken integrated by crystal oscillator measuring unit and measure-controlling unit, use measure-controlling unit to control the environment temperature that crystal oscillator measuring unit provides for crystal oscillator to be measured, automatically gather the frequency measurement of the crystal oscillator to be measured at specific environment temperature, when crystal oscillator completes after test in its whole probe temperature interval, measure-controlling unit carries out data processing to each frequency measurement, obtain the technological means of the temperature characterisitic index of described crystal oscillator to be measured, solved because the temperature spot of the artificial test that participates in crystal oscillator temperature property test and bring arranges not accurate enough, the condition of test can not meet, there is error in artificial data processing, easily cause misjudgment, the low inferior problem of production efficiency, whole crystal oscillator test process is completed automatically, reached minimizing human input, the technique effect that reduces measuring error and enhance productivity.
The crystal oscillator temperature characterisitic method for automatic measurement that the crystal oscillator temperature characterisitic automatic measurement system that the embodiment of the present invention provides can provide for carrying out any embodiment of the present invention.
Obviously, it will be understood by those skilled in the art that above-mentioned each module of the present invention or each step can be by server implementations as above.Alternatively, the embodiment of the present invention can realize by the executable program of computer installation, thereby they can be stored in memory storage and be carried out by processor, described program can be stored in a kind of computer-readable recording medium, the above-mentioned storage medium of mentioning can be ROM (read-only memory), disk or CD etc.; Or they are made into respectively to each integrated circuit modules, or a plurality of modules in them or step are made into single integrated circuit module realize.Like this, the present invention is not restricted to the combination of any specific hardware and software.
The foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, to those skilled in the art, the present invention can have various changes and variation.All any modifications of doing, be equal to replacement, improvement etc., within protection scope of the present invention all should be included within spirit of the present invention and principle.
Claims (9)
1. a crystal oscillator temperature characterisitic method for automatic measurement, is characterized in that, comprising:
A plurality of temperature test points of crystal oscillator to be measured are set;
According to described a plurality of temperature test points, produce successively temperature adjustment signal, send to crystal oscillator measuring unit, take and adjust the environment temperature that described crystal oscillator measuring unit provides as crystal oscillator to be measured;
When the environment temperature of described crystal oscillator measuring unit often reaches a temperature test point, produce frequency measurement signal, send to crystal oscillator measuring unit, obtain the frequency measurement of crystal oscillator to be measured in described crystal oscillator measuring unit;
Obtain each frequency measurement corresponding with the whole temperature test points that arrange, described each frequency measurement is carried out to data processing, obtain the temperature characterisitic index of described crystal oscillator to be measured.
2. crystal oscillator temperature characterisitic method for automatic measurement according to claim 1, it is characterized in that, when the described environment temperature when described crystal oscillator measuring unit often reaches a temperature test point, produce frequency measurement signal, send to crystal oscillator measuring unit, the frequency measurement of obtaining crystal oscillator to be measured in described crystal oscillator measuring unit specifically comprises:
Obtain continuously a plurality of environment temperatures of described crystal oscillator measuring unit;
When the environment temperature continuous, predetermined number of obtaining is all positioned at the default deviation temperature range at described predetermined temperature test point place, determine that the environment temperature of described crystal oscillator measuring unit reaches described predetermined temperature test point;
Produce frequency measurement signal, send to crystal oscillator measuring unit, obtain the frequency measurement of crystal oscillator to be measured in described crystal oscillator measuring unit.
3. crystal oscillator temperature characterisitic method for automatic measurement according to claim 1, it is characterized in that, when the described environment temperature when described crystal oscillator measuring unit often reaches a temperature test point, produce frequency measurement signal, send to crystal oscillator measuring unit, the frequency measurement of obtaining crystal oscillator to be measured in described crystal oscillator measuring unit specifically comprises:
Interval, after predetermined time, determines that the environment temperature of described crystal oscillator measuring unit reaches described predetermined temperature test point;
Produce frequency measurement signal, send to crystal oscillator measuring unit, obtain the frequency measurement of crystal oscillator to be measured in described crystal oscillator measuring unit.
4. according to the crystal oscillator temperature characterisitic method for automatic measurement described in claim 1 or 2 or 3, it is characterized in that, described in obtain crystal oscillator to be measured in described crystal oscillator measuring unit frequency measurement specifically comprise:
Obtain a plurality of frequency measurement of crystal oscillator to be measured in described crystal oscillator measuring unit;
Using the frequency measurement of the mean value of described a plurality of frequency measurement crystal oscillator to be measured in described crystal oscillator measuring unit.
5. crystal oscillator temperature characterisitic method for automatic measurement according to claim 1, it is characterized in that, describedly obtain each frequency measurement corresponding with the whole temperature test points that arrange, described each frequency measurement is carried out to data processing, and the temperature characterisitic index that obtains described crystal oscillator to be measured specifically comprises:
Obtain each frequency measurement corresponding with the whole temperature test points that arrange, as the first measurement set;
According to predetermined filtering principle, screen out the outlier in described the first measurement set, obtain the second measurement set;
Calculate average and the variance of each frequency measurement in described the second measurement set, as the temperature characterisitic index of described crystal oscillator to be measured.
6. crystal oscillator temperature characterisitic method for automatic measurement according to claim 1, it is characterized in that, describedly obtain each frequency measurement corresponding with the whole temperature test points that arrange, described each frequency measurement is carried out to data processing, after obtaining the temperature characterisitic index of described crystal oscillator to be measured, also comprise: according to the temperature characterisitic index of the described crystal oscillator to be measured obtaining, determine that whether described crystal oscillator to be measured is qualified.
7. crystal oscillator temperature characterisitic method for automatic measurement according to claim 1, is characterized in that, described method also comprises:
Obtain the first verification data of storing in described crystal oscillator measuring unit;
When the second verification msg of the local storage of the described first verification data obtaining and test macro is when consistent, judge that described test macro is normal with communicating by letter of described crystal oscillator measuring unit.
8. crystal oscillator temperature characterisitic method for automatic measurement according to claim 1, is characterized in that, described method also comprises:
According to standard temperature value, adjust the environment temperature of described crystal oscillator measuring unit;
When the ambient temperature measurement value of described crystal oscillator measuring unit and described standard temperature are worth when consistent, judge that the temperature control parts in described crystal oscillator measuring unit are normal.
9. a crystal oscillator temperature characterisitic automatic measurement system, is characterized in that, comprising: the measure-controlling unit being connected and crystal oscillator measuring unit, wherein:
Described measure-controlling unit comprises:
Subelement is set, for a plurality of temperature test points of crystal oscillator to be measured are set;
Temperature is adjusted subelement, for according to described a plurality of temperature test points, produces successively temperature adjustment signal, sends to crystal oscillator measuring unit, take and adjusts the environment temperature that crystal oscillator measuring unit provides as crystal oscillator to be measured;
Frequency measurement subelement, while often reaching a temperature test point for the environment temperature when described crystal oscillator measuring unit, produces frequency measurement signal, sends to crystal oscillator measuring unit, to obtain the frequency measurement of crystal oscillator to be measured in described crystal oscillator measuring unit;
Data processing subelement, for obtaining each frequency measurement corresponding with the whole temperature test points that arrange, carries out data processing to described each frequency measurement, obtains the temperature characterisitic index of described crystal oscillator to be measured;
Described crystal oscillator measuring unit comprises:
Temperature control parts, for the temperature adjustment signal producing according to described measure-controlling unit, adjust the environment temperature that described crystal oscillator measuring unit provides for crystal oscillator to be measured;
Frequency measurement parts, for the frequency measurement signal producing according to described measure-controlling unit, measure the frequency values of crystal oscillator to be measured in described crystal oscillator measuring unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310739265.9A CN103713218A (en) | 2013-12-27 | 2013-12-27 | Crystal oscillator temperature characteristic automatic measuring method and system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310739265.9A CN103713218A (en) | 2013-12-27 | 2013-12-27 | Crystal oscillator temperature characteristic automatic measuring method and system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103713218A true CN103713218A (en) | 2014-04-09 |
Family
ID=50406345
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310739265.9A Pending CN103713218A (en) | 2013-12-27 | 2013-12-27 | Crystal oscillator temperature characteristic automatic measuring method and system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103713218A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104198846A (en) * | 2014-08-18 | 2014-12-10 | 广东大普通信技术有限公司 | Automatic testing method and system of aging characteristics of crystal oscillator |
| CN112306118A (en) * | 2020-10-21 | 2021-02-02 | 深圳市博迪科技开发有限公司 | Temperature control system and control method of aerosol generating device |
| CN113399291A (en) * | 2021-04-27 | 2021-09-17 | 武汉海创电子股份有限公司 | Automatic analysis and screening system and method for high and low temperature test data of quartz crystal oscillator |
| CN113759187A (en) * | 2021-01-07 | 2021-12-07 | 大唐移动通信设备有限公司 | Method, device and system for detecting frequency hopping failure of crystal oscillator caused by wafer pollution |
| CN116577596A (en) * | 2023-07-13 | 2023-08-11 | 麦斯塔微电子(深圳)有限公司 | Measuring method and measuring system of oscillator |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08248072A (en) * | 1995-03-13 | 1996-09-27 | Advantest Corp | Method and apparatus for measuring impedance characteristics of crystal oscillator |
| JP2006132999A (en) * | 2004-11-04 | 2006-05-25 | Hitachi Kokusai Electric Inc | Automatic testing system |
| US20070126430A1 (en) * | 2005-12-01 | 2007-06-07 | Electronics And Telecommunications Research Institute | System and method for testing power durability of saw filter |
| CN101604970A (en) * | 2009-07-02 | 2009-12-16 | 广州市天马电讯科技有限公司 | Self-fitting digital temperature compensation crystal oscillistor and system thereof and implementation method |
| CN101609126A (en) * | 2009-07-16 | 2009-12-23 | 东莞市大普通信技术有限公司 | The Auto-Test System of temperature compensating crystal oscillator |
| CN201571042U (en) * | 2009-07-02 | 2010-09-01 | 广州市天马电讯科技有限公司 | Self-refit digital temperature compensated crystal oscillator and system thereof |
| CN101860322A (en) * | 2010-05-10 | 2010-10-13 | 广东大普通信技术有限公司 | Automatic temperature controlled crystal oscillator |
| CN102096426A (en) * | 2010-12-14 | 2011-06-15 | 西安工业大学 | Device and method for searching quick start heating control curve of constant temperature crystal oscillator |
| CN102520278A (en) * | 2011-12-07 | 2012-06-27 | 中国电力科学研究院 | Device used for thermal stability and temperature rise test of transformer sleeve |
| CN102621381A (en) * | 2012-01-13 | 2012-08-01 | 平湖市电子有限公司 | Automatic temperature-frequency characteristic measuring instrument for thermostatic crystal oscillators |
| CN103105530A (en) * | 2013-01-08 | 2013-05-15 | 河北远东通信系统工程有限公司 | Detection method for frequency hopping changes of crystal oscillator |
-
2013
- 2013-12-27 CN CN201310739265.9A patent/CN103713218A/en active Pending
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08248072A (en) * | 1995-03-13 | 1996-09-27 | Advantest Corp | Method and apparatus for measuring impedance characteristics of crystal oscillator |
| JP2006132999A (en) * | 2004-11-04 | 2006-05-25 | Hitachi Kokusai Electric Inc | Automatic testing system |
| US20070126430A1 (en) * | 2005-12-01 | 2007-06-07 | Electronics And Telecommunications Research Institute | System and method for testing power durability of saw filter |
| CN101604970A (en) * | 2009-07-02 | 2009-12-16 | 广州市天马电讯科技有限公司 | Self-fitting digital temperature compensation crystal oscillistor and system thereof and implementation method |
| CN201571042U (en) * | 2009-07-02 | 2010-09-01 | 广州市天马电讯科技有限公司 | Self-refit digital temperature compensated crystal oscillator and system thereof |
| CN101609126A (en) * | 2009-07-16 | 2009-12-23 | 东莞市大普通信技术有限公司 | The Auto-Test System of temperature compensating crystal oscillator |
| CN101860322A (en) * | 2010-05-10 | 2010-10-13 | 广东大普通信技术有限公司 | Automatic temperature controlled crystal oscillator |
| CN102096426A (en) * | 2010-12-14 | 2011-06-15 | 西安工业大学 | Device and method for searching quick start heating control curve of constant temperature crystal oscillator |
| CN102520278A (en) * | 2011-12-07 | 2012-06-27 | 中国电力科学研究院 | Device used for thermal stability and temperature rise test of transformer sleeve |
| CN102621381A (en) * | 2012-01-13 | 2012-08-01 | 平湖市电子有限公司 | Automatic temperature-frequency characteristic measuring instrument for thermostatic crystal oscillators |
| CN103105530A (en) * | 2013-01-08 | 2013-05-15 | 河北远东通信系统工程有限公司 | Detection method for frequency hopping changes of crystal oscillator |
Non-Patent Citations (1)
| Title |
|---|
| 朱华兵等: "应用于精密振荡器的石英晶体温度特性研究", 《物理学报》 * |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104198846A (en) * | 2014-08-18 | 2014-12-10 | 广东大普通信技术有限公司 | Automatic testing method and system of aging characteristics of crystal oscillator |
| CN104198846B (en) * | 2014-08-18 | 2017-03-22 | 广东大普通信技术有限公司 | Automatic testing method and system of aging characteristics of crystal oscillator |
| CN112306118A (en) * | 2020-10-21 | 2021-02-02 | 深圳市博迪科技开发有限公司 | Temperature control system and control method of aerosol generating device |
| CN113759187A (en) * | 2021-01-07 | 2021-12-07 | 大唐移动通信设备有限公司 | Method, device and system for detecting frequency hopping failure of crystal oscillator caused by wafer pollution |
| CN113399291A (en) * | 2021-04-27 | 2021-09-17 | 武汉海创电子股份有限公司 | Automatic analysis and screening system and method for high and low temperature test data of quartz crystal oscillator |
| CN113399291B (en) * | 2021-04-27 | 2022-02-01 | 武汉海创电子股份有限公司 | Automatic analysis and screening system and method for high and low temperature test data of quartz crystal oscillator |
| CN116577596A (en) * | 2023-07-13 | 2023-08-11 | 麦斯塔微电子(深圳)有限公司 | Measuring method and measuring system of oscillator |
| CN116577596B (en) * | 2023-07-13 | 2024-05-07 | 麦斯塔微电子(深圳)有限公司 | Measuring method and measuring system of oscillator |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103713218A (en) | Crystal oscillator temperature characteristic automatic measuring method and system | |
| CN104143961B (en) | A kind of constant-temperature crystal oscillator transmitting frequency calibration method, apparatus and system | |
| CN104655327A (en) | Resistance type temperature sensor verification system and method | |
| CN113258288A (en) | Phased array antenna beam control device and control method | |
| CN102621381A (en) | Automatic temperature-frequency characteristic measuring instrument for thermostatic crystal oscillators | |
| CN104008033A (en) | System and method for I2C bus testing | |
| CN102342582B (en) | Verification method, verification system and calculation processor for detection precision of scan detection head | |
| CN116202656A (en) | Method and system for batch calibration of semiconductor temperature sensors | |
| CN105092095A (en) | Temperature calibrating method and device | |
| CN101977085A (en) | Method and system for controlling and calibrating TD-LTE terminal automatic frequency | |
| CN114167150A (en) | Test system and method for high-frequency phased array antenna | |
| CN114608678A (en) | Water meter calibration method and device based on pulse method | |
| CN115184759A (en) | Frequency/temperature characteristic test method and system for identifying excitatory hopping of crystal oscillator | |
| US9341658B2 (en) | Fast on-chip oscillator trimming | |
| CN103698639B (en) | Crystal oscillator waveform parameter automatic measurement system and method | |
| CN112067165A (en) | Temperature sensor precision testing system, testing method, testing device and storage medium | |
| CN104198846A (en) | Automatic testing method and system of aging characteristics of crystal oscillator | |
| KR102055055B1 (en) | Electronic Flow Meter and The Measurement Error Correcting Methode | |
| CN212391150U (en) | Temperature sensor precision test system | |
| CN113959511B (en) | Flow metering method, equipment, medium and product based on jet flow water meter | |
| CN106813703B (en) | A kind of method and apparatus of test product function | |
| CN214538177U (en) | Flow computer for automatic timing and automatic diagnosis of flowmeter | |
| CN103698599A (en) | Method and system for automatically measuring inflection point temperature of oven controlled crystal oscillator | |
| CN104280098B (en) | Ship liquid level sensor method of testing based on Labview | |
| CN110967615B (en) | Circuit board fault diagnosis device and method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20140409 |
|
| RJ01 | Rejection of invention patent application after publication |