CN104143961B - A kind of constant-temperature crystal oscillator transmitting frequency calibration method, apparatus and system - Google Patents
A kind of constant-temperature crystal oscillator transmitting frequency calibration method, apparatus and system Download PDFInfo
- Publication number
- CN104143961B CN104143961B CN201410360260.XA CN201410360260A CN104143961B CN 104143961 B CN104143961 B CN 104143961B CN 201410360260 A CN201410360260 A CN 201410360260A CN 104143961 B CN104143961 B CN 104143961B
- Authority
- CN
- China
- Prior art keywords
- frequency
- crystal oscillator
- calibration
- output
- test condition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Abstract
The present invention relates to a kind of constant-temperature crystal oscillator transmitting frequency calibration method, apparatus and system.Read the test condition pre-set, and write crystal oscillator, read output frequency of the crystal oscillator under different test conditions, least square curve fit is carried out to test condition and the relation array of output frequency and obtains the polynomial function on the two, utilize polynomial function, calculate test condition corresponding to the calibration frequency of crystal oscillator, test condition corresponding to the calibration frequency is write into crystal oscillator, read output calibration frequency of the crystal oscillator under test condition corresponding to calibration frequency, output calibration frequency is verified, if output calibration frequency meets frequency accuracy scope, then calibration terminates；Otherwise, after the coefficient for adjusting polynomial function, continue executing with.The present invention can be automatically performed constant-temperature crystal oscillator frequency calibration, reduce measurement error, realize automatic, accurate calibration frequency, improve the purpose of production efficiency.
Description
Technical field
The present invention relates to crystal oscillator technologies field, more particularly to a kind of constant-temperature crystal oscillator transmitting frequency calibration method,
Apparatus and system.
Background technology
At present, the frequency accuracy calibration of constant-temperature crystal oscillator is carried out using manual control test equipment, passes through hand
The temperature value that work changes crystal oscillator changes its rate-adaptive pacemaker, then artificially determines whether to reach the frequency accuracy in crystal
In the range of.This inadequate science, not accurate enough by way of manual debugging changes crystal oscillator frequency parameter, it is easy to make
Into frequency accuracy is inaccurate or artificial Select Error, constant-temperature crystal oscillator is caused to be not reaching to the output accuracy of its requirement,
It can not even continue to ensure stable output；In addition, production efficiency is low, and the very big drawback of manual debugging, far from
The high performance index of constant-temperature crystal oscillator can be met.
The content of the invention
, can be certainly it is an object of the invention to propose a kind of constant-temperature crystal oscillator transmitting frequency calibration method, apparatus and system
It is dynamic to complete constant-temperature crystal oscillator frequency calibration, measurement error is reduced, automatic, accurate calibration frequency is realized, improves production efficiency
Purpose.
To use following technical scheme up to this purpose, the present invention：
A kind of constant-temperature crystal oscillator transmitting frequency calibration method, including：
The test condition that S1, reading are pre-configured with, writes crystal oscillator；
S2, read output frequency of the crystal oscillator under different test conditions；
S3, test condition and the relation array of output frequency progress least square curve fit are obtained on test-strips
The polynomial function of part and output frequency；
S4, using polynomial function, calculate test condition corresponding to the calibration frequency of crystal oscillator；
S5, test condition corresponding to the calibration frequency is write to crystal oscillator, output calibration frequency, realize calibration；
Wherein, the test condition includes the temperature value of the crystal oscillator work of simulation.
Wherein, the test condition that the step S1, reading are pre-configured with, writes crystal oscillator；It is brilliant with step S2, reading
Output frequency of the oscillation body device under different test conditions；Including：
The temperature initial value being pre-configured with is read, writes crystal oscillator, obtains the first output frequency of crystal oscillator,
Specially：The temperature initial value being pre-configured with is read, to after burning clock stabilization, temperature initial value is write into crystal oscillator；Repeatedly
Gather output frequency of the crystal oscillator under the conditions of temperature initial value；Using the way of median average filter to output frequency at
Reason, obtain the first output frequency of crystal oscillator；
After temperature initial value is progressively increased according to temperature step-length, crystal oscillator is write, obtains crystal oscillator successively not
Output frequency under synthermal.
Wherein, least square method curve plan is carried out in the step S3, to test condition and the relation array of output frequency
Conjunction is obtained on before the polynomial function of test condition and output frequency, in addition to：To test condition and the pass of output frequency
Coefficient sets carry out filtering screening.
Wherein, the step S4, using polynomial function, calculate test-strips corresponding to the calibration frequency of crystal oscillator
Part, it is specially：According to the calibration frequency of crystal oscillator, using polynomial function, temperature corresponding to calibration frequency is calculated；
The step S5, test condition corresponding to the calibration frequency is write to crystal oscillator, output calibration frequency is real
Now calibrate, including：
Temperature corresponding to the calibration frequency is write into crystal oscillator, reads the output of crystal oscillator at such a temperature
Calibration frequency；
If the output calibration frequency meets frequency accuracy scope, calibration terminates, and the calibration frequency is corresponding
Temperature parameter write-in crystal oscillator；Otherwise, after the coefficient of the polynomial function in set-up procedure S3, subsequent step is held successively
OK, if continuously the coefficient of the polynomial function in 5 set-up procedure S3 of circulation does not make output calibration frequency meet that frequency is accurate yet
Scope is spent, then return to step 2, subsequent step perform successively；
Output calibration frequency is not set to meet frequency accuracy scope yet if return to step 2 continuously circulates 3 times, calibration is lost
Lose, terminate calibration.
A kind of constant-temperature crystal oscillator frequency calibration device, including：
System configuration and writing unit, for reading the test condition being pre-configured with, write crystal oscillator；
Data acquisition unit, for reading output frequency of the crystal oscillator under different test conditions；
Data processing unit, for carrying out least square curve fit to the relation array of test condition and output frequency
Obtain the polynomial function on test condition and output frequency；
Calibration parameter unit, for using polynomial function, calculating test-strips corresponding to the calibration frequency of crystal oscillator
Part；
Calibration and authentication unit, for test condition corresponding to the calibration frequency to be write into crystal oscillator, export school
Quasi- frequency, realize calibration；
Wherein, the test condition includes the temperature value of the crystal oscillator work of simulation.
Wherein, the system configuration and writing unit and data acquisition unit, are specifically used for：Read the temperature being pre-configured with
Initial value is spent, writes crystal oscillator, obtains the first output frequency of crystal oscillator, is specially：Read the temperature being pre-configured with
Initial value is spent, to after burning clock stabilization, temperature initial value is write into crystal oscillator；Multi collect crystal oscillator originates in temperature
Output frequency under the conditions of value；Using the way of median average filter to output frequency processing, the first defeated of crystal oscillator is obtained
Go out frequency；
After temperature initial value is progressively increased according to temperature step-length, crystal oscillator is write, obtains crystal oscillator successively not
Output frequency under synthermal.
Wherein, in addition to data screening unit, for carrying out sieves to the relation array of test condition and output frequency
Choosing.
Wherein, the calibration parameter unit, is specifically used for：According to the calibration frequency of crystal oscillator, multinomial letter is utilized
Number, calculates temperature corresponding to calibration frequency；
The calibration and authentication unit, are specifically used for：
Temperature corresponding to the calibration frequency is write into crystal oscillator, reads the output of crystal oscillator at such a temperature
Calibration frequency；
If the output calibration frequency meets frequency accuracy scope, calibration terminates, and the calibration frequency is corresponding
Temperature parameter write-in crystal oscillator；Otherwise, after the coefficient for adjusting the polynomial function in data processing unit, subsequent cell
Perform successively, if continuously the coefficient of the polynomial function in 5 adjustment data processing units of circulation does not make output calibration frequency yet
Meet frequency accuracy scope, then returned data collecting unit, subsequent cell performs successively；
Output calibration frequency is not set to meet frequency accuracy scope yet if returned data collecting unit continuously circulates 3 times,
Calibration failure, terminates calibration.
A kind of constant-temperature crystal oscillator frequency calibration system, including：Test hardware device and by communication interface and test
The PC of hardware device connection；
The PC, for reading the test condition pre-set, control test hardware device writes test condition brilliant
Oscillation body device, output frequency of the crystal oscillator that read test hardware device returns under different test conditions, to test-strips
The relation array of part and output frequency carries out least square curve fit and obtained on the multinomial of test condition and output frequency
Formula function, using polynomial function, test condition corresponding to the calibration frequency of crystal oscillator is calculated, by the calibration frequency pair
The test condition answered is by controlling test hardware device to write crystal oscillator, the crystal oscillation that read test hardware device returns
Calibration is realized in output calibration frequency of the device under test condition corresponding to calibration frequency, checking；
The test hardware device, for receiving the test condition being pre-configured with of PC reading, and write crystal oscillation
Device, output frequency of the collection crystal oscillator under different test conditions feed back to PC, and for receiving PC transmission
Test condition corresponding to calibration frequency, and crystal oscillator is write, collection crystal oscillator is in test-strips corresponding to calibration frequency
Output calibration frequency under part feeds back to PC；
Wherein, the test condition includes the temperature value of the crystal oscillator work of simulation.
Beneficial effect：
A kind of constant-temperature crystal oscillator transmitting frequency calibration method of the present invention, apparatus and system.Its method includes：First
The test condition pre-set is read, and test condition is write into crystal oscillator, reads crystal oscillator in different test-strips
Output frequency under part, least square curve fit is carried out to test condition and the relation array of output frequency and obtained on surveying
The polynomial function of strip part and output frequency, using polynomial function, calculate and surveyed corresponding to the calibration frequency of crystal oscillator
Strip part, test condition corresponding to the calibration frequency is write into crystal oscillator, read crystal oscillator in calibration frequency pair
Output calibration frequency under the test condition answered, output calibration frequency is verified, if output calibration frequency meets frequency standard
Exactness scope, then calibration terminates, and temperature parameter corresponding to the calibration frequency is write into crystal oscillator；Otherwise, adjust more
After the coefficient of item formula function, continue executing with.The present invention can be automatically performed constant-temperature crystal oscillator frequency calibration, reduce measurement and miss
Difference, realize automatic, accurate calibration frequency, improve the purpose of production efficiency.
Brief description of the drawings
Fig. 1 is a kind of flow chart for constant-temperature crystal oscillator transmitting frequency calibration method that the embodiment of the present invention 1 provides.
Fig. 2 is a kind of structural representation for constant-temperature crystal oscillator frequency calibration device that the embodiment of the present invention 2 provides.
Fig. 3 is a kind of structural representation for constant-temperature crystal oscillator frequency calibration system that the embodiment of the present invention 3 provides.
In figure：
1-PC machines；2- tests hardware device.
Embodiment
Further illustrate technical scheme below in conjunction with the accompanying drawings and by embodiment.
Embodiment 1：
Fig. 1 is a kind of flow chart for constant-temperature crystal oscillator transmitting frequency calibration method that the embodiment of the present invention 1 provides.Such as Fig. 1
It is shown, a kind of constant-temperature crystal oscillator transmitting frequency calibration method of the present invention, including：
The test condition that S1, reading are pre-configured with, writes crystal oscillator；
S2, read output frequency of the crystal oscillator under different test conditions；
S3, test condition and the relation array of output frequency progress least square curve fit are obtained on test-strips
The polynomial function of part and output frequency；
S4, using polynomial function, calculate test condition corresponding to the calibration frequency of crystal oscillator；
S5, test condition corresponding to the calibration frequency is write to crystal oscillator, output calibration frequency, realize calibration；
Wherein, the test condition includes the temperature value of the crystal oscillator work of simulation.
First, the test condition of the crystal oscillator pre-set is read, test condition is then write into crystal oscillator,
Output frequency of the crystal oscillator under different test conditions is obtained, test condition and the relation array of output frequency are carried out most
Young waiter in a wineshop or an inn's squares curve is fitted to obtain the polynomial function on test condition and output frequency.Using polynomial function, calculate brilliant
Test condition corresponding to the calibration frequency of oscillation body device, test condition corresponding to the calibration frequency is write into crystal oscillator,
Output calibration frequency of the crystal oscillator under test condition corresponding to calibration frequency is read, output calibration frequency is tested
Card, if output calibration frequency meets frequency accuracy scope, calibration terminates, and by temperature parameter corresponding to the calibration frequency
Write crystal oscillator；Otherwise, after the coefficient for adjusting polynomial function, continue executing with.The present invention can be automatically performed constant temperature crystalline substance
Oscillation body device frequency calibration, measurement error is reduced, realize automatic, accurate calibration frequency, improve the purpose of production efficiency.
The test condition that the step S1, reading are pre-configured with, writes crystal oscillator；Shaken with step S2, reading crystal
Swing output frequency of the device under different test conditions；Including：
The temperature initial value being pre-configured with is read, writes crystal oscillator, obtains the first output frequency of crystal oscillator,
Specially：The temperature initial value being pre-configured with is read, to after burning clock stabilization, temperature initial value is write into crystal oscillator；Repeatedly
Gather output frequency of the crystal oscillator under the conditions of temperature initial value；Using the way of median average filter to output frequency at
Reason, obtain the first output frequency of crystal oscillator；
After temperature initial value is progressively increased according to temperature step-length, crystal oscillator is write, obtains crystal oscillator successively not
Output frequency under synthermal.
Because crystal oscillator is under the operating temperature of different simulations, its output frequency is different.By to crystal oscillator
The operating temperature of different simulations is write, obtains the output frequency under the operating temperature of different simulations.Detailed process is：It is first
First, temperature initial value is write to crystal oscillator, the first output frequency under the conditions of the temperature initial value is obtained, then in temperature
Add a step-length on the basis of degree initial value, the temperature after a step-length will be added to write crystal oscillator, read output frequency；So
After continue again plus a step-length, write crystal oscillator, read output frequency, circulate successively, at least more than ten times, obtain on
The two-dimentional relation array of temperature and output frequency.Curve is carried out to temperature and the relation array of output frequency by least square method
Fitting, obtains the polynomial function on the two.Then, using polynomial function, according to the calibration frequency of crystal oscillator, instead
Push away to obtain temperature corresponding to the calibration frequency, the temperature is then write into crystal oscillator so that crystal oscillator exports school
Quasi- frequency.It should be noted that temperature initial value is normal temperature, the burning clock is stable, refers to crystal oscillator and is energized to steady operation
Required time, usually, the burning clock of different crystal oscillators stablize required time difference, in the present invention, it is steady to burn clock
Fix time as 40 minutes.
Obtained in the step S3, to test condition and the relation array of output frequency progress least square curve fit
On before the polynomial function of test condition and output frequency, in addition to：To test condition and the relation array of output frequency
Carry out filtering screening.According to crystal oscillator frequency output characteristics itself, when some relation array goes out away from frequency output characteristics
When now abnormal, rejected, for example, when crystal oscillator output frequency and temperature are into incremental linear relationship, when some pass
When coefficient sets are away from this linearity curve, then reject.Its purpose be remain with, close to real relation array, after being advantageous to
It is continuous that the polynomial function most approached is searched out to relation array curve matching.
The step S4, using polynomial function, calculate test condition corresponding to the calibration frequency of crystal oscillator, specifically
For：According to the calibration frequency of crystal oscillator, using polynomial function, temperature corresponding to calibration frequency is calculated；Using above-mentioned
Fit on the write-in temperature of crystal oscillator and the polynomial function of output frequency, need to adjust according to crystal oscillator
Calibration frequency, carry out counter push away draw operating temperature corresponding to calibration frequency.Then the operating temperature is write into crystal oscillator,
Crystal oscillator is set to export calibration frequency.Preferably, the calibration frequency for adjustment after calibration frequency, it is contemplated that it is various because
The influence of element to the output calibration frequency, it is necessary to verify, if meet accurately to scope.
The step S5, test condition corresponding to the calibration frequency is write to crystal oscillator, output calibration frequency is real
Now calibrate, including：
Temperature corresponding to the calibration frequency is write into crystal oscillator, reads the output of crystal oscillator at such a temperature
Calibration frequency；
If the output calibration frequency meets frequency accuracy scope, calibration terminates, and the calibration frequency is corresponding
Temperature parameter write-in crystal oscillator；Otherwise, after the coefficient of the polynomial function in set-up procedure S3, subsequent step is held successively
OK, if continuously the coefficient of the polynomial function in 5 set-up procedure S3 of circulation does not make output calibration frequency meet that frequency is accurate yet
Scope is spent, then return to step 2, subsequent step perform successively；
Output calibration frequency is not set to meet frequency accuracy scope yet if return to step 2 continuously circulates 3 times, calibration is lost
Lose, terminate calibration.It should be noted that need the output calibration frequency to crystal oscillator at temperature corresponding to calibration frequency
Verified, if the output calibration frequency of crystal oscillator meets frequency accuracy scope, calibration terminates, otherwise, needs to return
After the coefficient of step S3 adjustment polynomial functions, subsequent step performs successively, if after the coefficient of adjustment polynomial function, it is resulting
The output calibration frequency of crystal oscillator be still unsatisfactory for frequency accuracy scope, then continue return to step S3 adjustment multinomials
The coefficient of function, if continuously the coefficient of the polynomial function in 5 set-up procedure S3 of circulation yet meets output calibration frequency
Frequency accuracy scope, illustrate to be possible to go wrong in data acquisition, then need return to step 2 to resurvey data, subsequently
Step performs successively；Output calibration frequency is not set to meet frequency accuracy scope, school yet if return to step 2 continuously circulates 3 times
Quasi- failure, terminates calibration.
In summary, it is seen then that a kind of constant-temperature crystal oscillator transmitting frequency calibration method of the present invention, can be automatically performed
Constant-temperature crystal oscillator frequency calibration, measurement error is reduced, realize automatic, accurate calibration frequency, improve the purpose of production efficiency.
Embodiment 2：Below be the embodiment of the present invention device embodiment, embodiment of the method for the invention, device embodiment,
System embodiment belongs to same design, and the detail content of not detailed description, may be referred in device embodiment, system embodiment
Above method embodiment.Fig. 2 is that a kind of structure for constant-temperature crystal oscillator frequency calibration device that the embodiment of the present invention 2 provides is shown
It is intended to.As shown in Fig. 2 a kind of constant-temperature crystal oscillator frequency calibration device of the present invention, including：
System configuration and writing unit, for reading the test condition being pre-configured with, write crystal oscillator；
Data acquisition unit, for reading output frequency of the crystal oscillator under different test conditions；
Data processing unit, for carrying out least square curve fit to the relation array of test condition and output frequency
Obtain the polynomial function on test condition and output frequency；
Calibration parameter unit, for using polynomial function, calculating test-strips corresponding to the calibration frequency of crystal oscillator
Part；
Calibration and authentication unit, for test condition corresponding to the calibration frequency to be write into crystal oscillator, export school
Quasi- frequency, realize calibration；
Wherein, the test condition includes the temperature value of the crystal oscillator work of simulation.
By system configuration and writing unit, the test condition of the crystal oscillator pre-set is read, and by test-strips
Part writes crystal oscillator, then obtains output frequency of the crystal oscillator under different test conditions by data acquisition unit
Rate, least square curve fit is carried out to test condition and the relation array of output frequency by data processing unit and closed
In test condition and the polynomial function of output frequency, by calibration parameter unit, the calibration frequency pair of crystal oscillator is calculated
The test condition answered, test condition corresponding to the calibration frequency is write into crystal oscillator, read crystal oscillator and calibrating
Output calibration frequency under test condition corresponding to frequency, output calibration frequency is verified by calibration and authentication unit,
If output calibration frequency meets frequency accuracy scope, calibration terminates, and temperature parameter corresponding to the calibration frequency is write
Enter crystal oscillator；Otherwise, after the coefficient for adjusting polynomial function, continue executing with.The present invention can be automatically performed constant temperature crystal
Oscillator frequency is calibrated, and reduces measurement error, is realized automatic, accurate calibration frequency, is improved the purpose of production efficiency.
The system configuration and writing unit and data acquisition unit, are specifically used for：Read the temperature starting being pre-configured with
Value, crystal oscillator is write, obtain the first output frequency of crystal oscillator, be specially：Read the temperature starting being pre-configured with
Value, to after burning clock stabilization, temperature initial value is write into crystal oscillator；Multi collect crystal oscillator is in temperature initial value condition
Under output frequency；Output frequency is handled using the way of median average filter, obtains the first output frequency of crystal oscillator；
After temperature initial value is progressively increased according to temperature step-length, crystal oscillator is write, obtains crystal oscillator successively not
Output frequency under synthermal.
Also include data screening unit, for carrying out filtering screening to the relation array of test condition and output frequency.
The calibration parameter unit, is specifically used for：According to the calibration frequency of crystal oscillator, polynomial function, meter are utilized
Calculate temperature corresponding to calibration frequency；
The calibration and authentication unit, are specifically used for：
Temperature corresponding to the calibration frequency is write into crystal oscillator, reads the output of crystal oscillator at such a temperature
Calibration frequency；
If the output calibration frequency meets frequency accuracy scope, calibration terminates, and the calibration frequency is corresponding
Temperature parameter write-in crystal oscillator；Otherwise, after the coefficient for adjusting the polynomial function in data processing unit, subsequent cell
Perform successively, if continuously the coefficient of the polynomial function in 5 adjustment data processing units of circulation does not make output calibration frequency yet
Meet frequency accuracy scope, then returned data collecting unit, subsequent cell performs successively；
Output calibration frequency is not set to meet frequency accuracy scope yet if returned data collecting unit continuously circulates 3 times,
Calibration failure, terminates calibration.
Embodiment 3：Below be the embodiment of the present invention system embodiment, embodiment of the method for the invention, device embodiment,
System embodiment belongs to same design, and the detail content of not detailed description, may be referred in device embodiment, system embodiment
Above method embodiment.Fig. 3 is that a kind of structure for constant-temperature crystal oscillator frequency calibration system that the embodiment of the present invention 3 provides is shown
It is intended to.As shown in figure 3, a kind of constant-temperature crystal oscillator frequency calibration system of the present invention, including：Test hardware device 2,
And the PC 1 being connected by communication interface with test hardware device 2；
The PC 1, for reading the test condition pre-set, control test hardware device 2 writes test condition
Crystal oscillator, output frequency of the crystal oscillator that read test hardware device 2 returns under different test conditions, to test
Condition and the relation array of output frequency carry out least square curve fit and obtained on the more of test condition and output frequency
Item formula function, using polynomial function, calculates test condition corresponding to the calibration frequency of crystal oscillator, by the calibration frequency
Corresponding test condition is by controlling test hardware device 2 to write crystal oscillator, the crystal that read test hardware device 2 returns
Calibration is realized in output calibration frequency of the oscillator under test condition corresponding to calibration frequency, checking；
The test hardware device 2, for receiving the test condition being pre-configured with of the reading of PC 1, and writes crystal and shakes
Device is swung, output frequency of the collection crystal oscillator under different test conditions feeds back to PC 1, and is sent out for receiving PC 1
Test condition corresponding to the calibration frequency sent, and crystal oscillator is write, collection crystal oscillator is in survey corresponding to calibration frequency
Output calibration frequency under the conditions of examination feeds back to PC 1；
Wherein, the test condition includes the temperature value of the crystal oscillator work of simulation.
It can be seen that a kind of constant-temperature crystal oscillator frequency calibration system of the present invention, including PC 1 and pass through communication
The test hardware device 2 of interface connection, the system pass through the test hardware device 2 and PC 1 of integrated constant-temperature crystal oscillator, energy
The testing procedure of constant-temperature crystal oscillator frequency calibration is enough automatically performed, calculates test data high efficiency smart automatically, including certainly
The test condition of dynamic accurate setting constant-temperature crystal oscillator, it is error free to read what constant-temperature crystal oscillator returned under test conditions
Test data, automaticdata filtering and screening, intelligent decision recurrence complete frequency calibration procedure, and hard eventually through control test
Test condition corresponding to part equipment 2 to constant-temperature crystal oscillator write-in calibration frequency.Automatic, accurate calibration frequency purpose is realized,
Artificial participation is reduced, production test efficiency is greatly improved.
In summary, a kind of constant-temperature crystal oscillator transmitting frequency calibration method of the present invention, apparatus and system, are bases
The frequency output characteristics of constant-temperature crystal oscillator, using iterative algorithm, by communication interface, control test hardware device 2 is automatic
Complete the relevant control of testing process, and the return data of collecting test hardware device 2 in real time.By return data in PC
The frequency output characteristics curve of test constant-temperature crystal oscillator, while intelligently filters and processing data are drawn on 1, and according to obtained number
According to, enter line frequency adjustment amplitude and calculate, completion frequency adjustment handling process.Entirely constant-temperature crystal oscillator test process is substantially
System is automatically performed, and reaches reduction measurement error, improves the purpose of production efficiency.It is as follows to calibrate flow, when constant temperature crystal vibrates
After device is normally placed into test hardware device 2, start testing process：According to the constant-temperature crystal oscillator currently loaded, PC
Machine 1, by communication mode, automatically controls test hardware device 2 and calibrated to crystal oscillator write frequency with test hardware device 2
Initial parameter values, i.e. test condition；Then the automatic start data acquisition scheme of PC 1, automatic data collection are anti-by testing hardware device 2
Real-time output frequency data of the constant-temperature crystal oscillator come under different test conditions are fed back to, data acquisition is completed；Pass through song
Line fits the frequency output characteristics curve on crystal oscillator, the frequency range calibrated as needed, by calibration output frequency
Test parameter corresponding to rate writes crystal oscillator, completes frequency accuracy calibration；Meanwhile system enters data screening and intelligence
Judgment model, the test parameter for finally meeting frequency accuracy scope is write into crystal oscillator.
The foregoing is only a preferred embodiment of the present invention, but protection scope of the present invention be not limited thereto,
Any one skilled in the art the invention discloses technical scope in, technique according to the invention scheme and its
Inventive concept is subject to equivalent substitution or change, should all be included within the scope of the present invention.
Claims (7)
- A kind of 1. constant-temperature crystal oscillator transmitting frequency calibration method, it is characterised in that including：The test condition that S1, reading are pre-configured with, writes crystal oscillator；S2, read output frequency of the crystal oscillator under different test conditions；Filtering screening is carried out to test condition and the relation array of output frequency；S3, test condition and the relation array of output frequency are carried out least square curve fit obtain on test condition with The polynomial function of output frequency；S4, using polynomial function, calculate test condition corresponding to the calibration frequency of crystal oscillator；S5, test condition corresponding to the calibration frequency is write to crystal oscillator, output calibration frequency, realize calibration；Wherein, the test condition includes the temperature value of the crystal oscillator work of simulation.
- A kind of 2. constant-temperature crystal oscillator transmitting frequency calibration method according to claim 1, it is characterised in thatThe test condition that the step S1, reading are pre-configured with, write-in crystal oscillator include：The temperature initial value being pre-configured with is read, to after burning clock stabilization, temperature initial value is write into crystal oscillator；Correspondingly, the output frequency of the step S2, reading crystal oscillator under different test conditions includes：Output frequency of the multi collect crystal oscillator under the conditions of temperature initial value；Using the way of median average filter to output Frequency processing, obtain the first output frequency of crystal oscillator；After temperature initial value is progressively increased according to temperature step-length, write-in crystal oscillator obtains crystal oscillator in different temperatures successively Under output frequency.
- A kind of 3. constant-temperature crystal oscillator transmitting frequency calibration method according to claim 1, it is characterised in that the step S4, using polynomial function, calculate test condition corresponding to the calibration frequency of crystal oscillator, be specially：According to crystal oscillation The calibration frequency of device, using polynomial function, calculate temperature corresponding to calibration frequency；The step S5, test condition corresponding to the calibration frequency is write to crystal oscillator, output calibration frequency, realize school Standard, including：Temperature corresponding to the calibration frequency is write into crystal oscillator, reads the output calibration of crystal oscillator at such a temperature Frequency；If the output calibration frequency meets frequency accuracy scope, calibration terminates, and will be warm corresponding to the calibration frequency Spend parameter read-in crystal oscillator；Otherwise, after the coefficient of the polynomial function in set-up procedure S3, subsequent step performs successively, If continuously the coefficient of the polynomial function in 5 set-up procedure S3 of circulation does not make output calibration frequency meet frequency accuracy model yet Enclose, then return to step S2, subsequent step performs successively；Output calibration frequency is not set to meet frequency accuracy scope, calibration failure, knot yet if return to step S2 continuously circulates 3 times Beam is calibrated.
- A kind of 4. constant-temperature crystal oscillator frequency calibration device, it is characterised in that including：System configuration and writing unit, for reading the test condition being pre-configured with, write crystal oscillator；Data acquisition unit, for reading output frequency of the crystal oscillator under different test conditions；Data screening unit, for carrying out filtering screening to the relation array of test condition and output frequency；Data processing unit, obtained for carrying out least square curve fit to the relation array of test condition and output frequency On test condition and the polynomial function of output frequency；Calibration parameter unit, for using polynomial function, calculating test condition corresponding to the calibration frequency of crystal oscillator；Calibration and authentication unit, for test condition corresponding to the calibration frequency to be write into crystal oscillator, output calibration frequency Rate, realize calibration；Wherein, the test condition includes the temperature value of the crystal oscillator work of simulation.
- 5. a kind of constant-temperature crystal oscillator frequency calibration device according to claim 4, it is characterised in that the system is matched somebody with somebody Put and writing unit is specifically used for：The temperature initial value being pre-configured with is read, to after burning clock stabilization, temperature initial value is write brilliant Oscillation body device；Correspondingly, the data acquisition unit is specifically used for：Multi collect crystal oscillator is defeated under the conditions of temperature initial value Go out frequency；Output frequency is handled using the way of median average filter, obtains the first output frequency of crystal oscillator；After temperature initial value is progressively increased according to temperature step-length, crystal oscillator is write, obtains crystal oscillator successively in not equality of temperature Output frequency under degree.
- A kind of 6. constant-temperature crystal oscillator frequency calibration device according to claim 4, it is characterised in that the calibration ginseng Counting unit, it is specifically used for：According to the calibration frequency of crystal oscillator, using polynomial function, calculate corresponding to calibration frequency Temperature；The calibration and authentication unit, are specifically used for：Temperature corresponding to the calibration frequency is write into crystal oscillator, reads the output calibration of crystal oscillator at such a temperature Frequency；If the output calibration frequency meets frequency accuracy scope, calibration terminates, and will be warm corresponding to the calibration frequency Spend parameter read-in crystal oscillator；Otherwise, after the coefficient for adjusting the polynomial function in data processing unit, subsequent cell is successively Perform, if continuously the coefficient of the polynomial function in 5 adjustment data processing units of circulation yet meets output calibration frequency Frequency accuracy scope, then returned data collecting unit, subsequent cell perform successively；Output calibration frequency is met frequency accuracy scope yet if returned data collecting unit continuously circulates 3 times, calibrate Failure, terminate calibration.
- A kind of 7. constant-temperature crystal oscillator frequency calibration system, it is characterised in that including：Test hardware device and pass through communication The PC that interface is connected with test hardware device；The PC, for reading the test condition pre-set, control test hardware device shakes test condition write-in crystal Swing device, output frequency of the crystal oscillator that read test hardware device returns under different test conditions, to test condition with The relation array of output frequency carries out filtering screening, and carries out least square curve fit and obtain on test condition and output The polynomial function of frequency, using polynomial function, test condition corresponding to the calibration frequency of crystal oscillator is calculated, by described in By controlling test hardware device to write crystal oscillator, read test hardware device returns test condition corresponding to calibration frequency Output calibration frequency of the crystal oscillator under test condition corresponding to calibration frequency, checking realizes calibration；The test hardware device, for receiving the test condition being pre-configured with of PC reading, and crystal oscillator is write, adopted Collect output frequency of the crystal oscillator under different test conditions and feed back to PC, and for receiving the calibration frequency of PC transmission Test condition corresponding to rate, and crystal oscillator is write, collection crystal oscillator is under test condition corresponding to calibration frequency Output calibration frequency feeds back to PC；Wherein, the test condition includes the temperature value of the crystal oscillator work of simulation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410360260.XA CN104143961B (en) | 2014-07-25 | 2014-07-25 | A kind of constant-temperature crystal oscillator transmitting frequency calibration method, apparatus and system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410360260.XA CN104143961B (en) | 2014-07-25 | 2014-07-25 | A kind of constant-temperature crystal oscillator transmitting frequency calibration method, apparatus and system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104143961A CN104143961A (en) | 2014-11-12 |
| CN104143961B true CN104143961B (en) | 2018-01-19 |
Family
ID=51853052
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410360260.XA Active CN104143961B (en) | 2014-07-25 | 2014-07-25 | A kind of constant-temperature crystal oscillator transmitting frequency calibration method, apparatus and system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104143961B (en) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104682953B (en) * | 2015-02-15 | 2018-08-03 | 大唐联仪科技有限公司 | A kind of error calibrating method and device of tuning circuit |
| CN105471522B (en) * | 2015-11-13 | 2018-01-23 | 太仓市同维电子有限公司 | A kind of frequency shifted calibration method based on statistics and indicatrix |
| CN105467242B (en) * | 2015-12-09 | 2018-10-02 | 王喜立 | A kind of the factory test system and adjustment method of digital temperature compensation crystal oscillistor |
| CN107819712A (en) * | 2016-09-12 | 2018-03-20 | 中兴通讯股份有限公司 | Local-oscillator leakage automatic calibrating method and device |
| CN106598022B (en) * | 2016-12-01 | 2019-02-26 | 南京中电熊猫晶体科技有限公司 | Constant-temperature crystal oscillator intelligence test vehicle control |
| CN107329399B (en) * | 2017-07-14 | 2020-08-25 | 成都天奥电子股份有限公司 | Low-power-consumption control method of satellite time service clock system and clock system |
| CN110740001A (en) * | 2018-07-18 | 2020-01-31 | 北京松果电子有限公司 | Crystal oscillator frequency calibration method and device and electronic equipment |
| CN110212863B (en) * | 2019-05-31 | 2024-02-13 | Oppo广东移动通信有限公司 | Method, apparatus, electronic device and storage medium for calibrating crystal oscillator |
| CN111628835B (en) * | 2020-04-22 | 2022-11-04 | 惠州高盛达科技有限公司 | Communication module correcting method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4344046A (en) * | 1979-03-09 | 1982-08-10 | Societe Suisse Pour L'industrie Horlogere Management Services S.A | Signal generator including high and low frequency oscillators |
| CN102830294A (en) * | 2011-06-13 | 2012-12-19 | 成都天奥电子股份有限公司 | Automatic regulating system used for microcomputer compensating crystal oscillator |
| CN103001583A (en) * | 2012-12-17 | 2013-03-27 | 华为技术有限公司 | Temperature compensation method and crystal oscillator |
| CN103036505A (en) * | 2012-12-19 | 2013-04-10 | 同方国芯电子股份有限公司 | High-accuracy temperature compensation crystal oscillator system and operational method thereof |
| CN103684255A (en) * | 2012-09-12 | 2014-03-26 | 无锡华润矽科微电子有限公司 | Judgment and control method for compensation and calibration of temperature-compensated crystal oscillator with built-in crystals |
-
2014
- 2014-07-25 CN CN201410360260.XA patent/CN104143961B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4344046A (en) * | 1979-03-09 | 1982-08-10 | Societe Suisse Pour L'industrie Horlogere Management Services S.A | Signal generator including high and low frequency oscillators |
| CN102830294A (en) * | 2011-06-13 | 2012-12-19 | 成都天奥电子股份有限公司 | Automatic regulating system used for microcomputer compensating crystal oscillator |
| CN103684255A (en) * | 2012-09-12 | 2014-03-26 | 无锡华润矽科微电子有限公司 | Judgment and control method for compensation and calibration of temperature-compensated crystal oscillator with built-in crystals |
| CN103001583A (en) * | 2012-12-17 | 2013-03-27 | 华为技术有限公司 | Temperature compensation method and crystal oscillator |
| CN103036505A (en) * | 2012-12-19 | 2013-04-10 | 同方国芯电子股份有限公司 | High-accuracy temperature compensation crystal oscillator system and operational method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104143961A (en) | 2014-11-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104143961B (en) | A kind of constant-temperature crystal oscillator transmitting frequency calibration method, apparatus and system | |
| CN109631973B (en) | Automatic calibration method and system for sensor | |
| CN109462446A (en) | A kind of RF calibration method, apparatus and computer readable storage medium | |
| CN104154987A (en) | Vibration wire type sensor reader measuring meter | |
| CN101359042B (en) | Auto calibration method for single-phase electronic type electric energy meter | |
| CN110988782B (en) | Calibration circuit and system, electric energy metering chip and metering device | |
| CN102565530A (en) | Automatic measuring instrument for crystal inflection point of oven-controlled crystal oscillator (OCXO) | |
| CN104950173B (en) | A kind of passive device equivalent circuit structure and measurement method of parameters and device | |
| CN101951634B (en) | Method and system for automatic power control calibration of TD-LTE terminal | |
| CN107370464A (en) | RF power amplification power compensating system and method | |
| CN110401499A (en) | For Fast Frequency Offset calibration method, device, equipment and the medium of radio-frequency module | |
| CN105572617B (en) | A kind of calibration system and method for pulse power standard | |
| CN106506101B (en) | A kind of receiver amplitude-frequency response automatized calibration method and device | |
| CN105628218A (en) | Optical module chip temperature calibration method | |
| CN102055539A (en) | Automated calibration method and equipment for meter output signal | |
| CN109164851A (en) | The temperature control automatic correction equipment and method of resistance class heat-producing device | |
| CN107272821A (en) | Calibration method of real-time clock and device, storage medium, electronic equipment | |
| CN105467242A (en) | A production testing system of digital temperature compensated crystal oscillators and a debugging method thereof | |
| CN106768243B (en) | A kind of quick lock in accurate weight method | |
| CN109444547B (en) | RFID chip impedance measuring method and device based on two-port network | |
| CN103107774A (en) | Method capable of improving constant temperature crystal oscillator frequency stability | |
| CN202614950U (en) | Time system for earthquake data acquisition | |
| CN103713218A (en) | Crystal oscillator temperature characteristic automatic measuring method and system | |
| CN103698639B (en) | Crystal oscillator waveform parameter automatic measurement system and method | |
| CN108982983A (en) | A kind of Resistance Thermal Noise test method and test macro |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 523000 Room 401 and 402, building 5, No. 24, industrial East Road, Songshanhu Park, Dongguan City, Guangdong Province Patentee after: Guangdong daguangxin Technology Co.,Ltd. Address before: 523808 buildings 13-16, small and medium-sized science and technology enterprise entrepreneurship Park, northern industrial city, Songshanhu science and Technology Industrial Park, Dongguan City, Guangdong Province Patentee before: Guangdong Dapu Telecom Technology Co.,Ltd. |
|
| CP03 | Change of name, title or address |