CN113399291A - Automatic analysis and screening system and method for high and low temperature test data of quartz crystal oscillator - Google Patents

Automatic analysis and screening system and method for high and low temperature test data of quartz crystal oscillator Download PDF

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CN113399291A
CN113399291A CN202110457487.6A CN202110457487A CN113399291A CN 113399291 A CN113399291 A CN 113399291A CN 202110457487 A CN202110457487 A CN 202110457487A CN 113399291 A CN113399291 A CN 113399291A
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low temperature
quartz crystal
module
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CN113399291B (en
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王翌
陈林彬
刘明红
屈兰清
武少雄
刘晓庆
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Wuhan Hitrusty Electronics Co ltd
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Wuhan Hitrusty Electronics Co ltd
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
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    • B07C5/34—Sorting according to other particular properties
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    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/003—Environmental or reliability tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
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Abstract

The invention discloses an automatic analysis and screening system for high and low temperature test data of a quartz crystal oscillator. It comprises a hardware system and a software system; the hardware system comprises a high-low temperature test system, a network switch and a program control computer; the high-low temperature test system transmits the high-low temperature characteristic temperature test data of the quartz crystal resonator to the program control computer through the network switch; the program control computer respectively transmits the data to a human-computer interaction visual interface and a software system; the software system automatically screens the temperature measurement data of the high and low temperature characteristics of the quartz crystal resonator and feeds back the screening information to the program control computer; the software system comprises a data remote acquisition module, a data standardization processing module, a workshop section information identification module, a screening parameter configuration module, an automatic screening module and a data processing and storage module. The invention has the advantage of realizing accurate and efficient screening of temperature measurement data. The invention also discloses an analysis and screening method of the automatic analysis and screening system for the high and low temperature test data of the quartz crystal oscillator.

Description

Automatic analysis and screening system and method for high and low temperature test data of quartz crystal oscillator
Technical Field
The invention relates to the production and manufacture of a quartz crystal resonator, in particular to an automatic analysis and screening system for high and low temperature test data of a quartz crystal resonator. The invention also relates to an analysis and screening method of the automatic analysis and screening system for the high and low temperature test data of the quartz crystal oscillator.
Background
The quartz crystal resonator/crystal oscillator is widely applied to the fields of military and civil communication radio stations, Beidou satellites, lunar exploration engineering, weaponry, radar communication and the like, such as aerospace, aviation, war industry and the like by virtue of the characteristics of small volume, light weight, high stability and reliability, long service life, low aging rate and the like.
The W-2200/W-2800 high and low temperature test system produced by the company is a universal device used by most manufacturers in the global crystal oscillator industry, and belongs to a key device special for the crystal oscillator industry. Although the equipment system has the temperature measurement data output function, the data analysis and screening are manually carried out, and the batch production of high and low temperature test procedures is not facilitated. The high and low temperature characteristics of the quartz crystal resonator directly influence the reliability and stability of the work of the oscillating circuit of a customer product, the traditional high and low temperature characteristic temperature measurement data operation and screening process are mostly manually carried out, manual data check is carried out on the high and low temperature characteristic temperature measurement data of each product, and the product indexes are screened one by one according to the conditions after the operation. Because the working temperature range of the quartz crystal resonator is wide, the acquisition amount of each batch of temperature measurement data is large, the working strength of testing and screening personnel is high, the manual screening method has low working efficiency and high labor cost, the condition of misjudgment and missing judgment is easily generated when the temperature measurement data is manually screened, and the accurate, quick and effective screening production of the military products is difficult to realize in batch production. The accurate and efficient screening of the temperature measurement data is an important link of quality control in the high-low temperature screening production of the quartz crystal resonator, and is directly related to the rejection of unqualified products, and the qualified products are transferred to the subsequent screening link.
Therefore, there is a need to develop a system and a method for screening high and low temperature characteristic temperature measurement data of quartz crystal resonators, which can realize accurate, fast and effective screening in mass production.
Disclosure of Invention
The first purpose of the invention is to provide an automatic analysis and screening system for high and low temperature test data of a quartz crystal oscillator, which can accurately, efficiently, accurately, quickly and effectively screen temperature measurement data in batch production, and effectively control the risk of misjudgment and missed judgment in manual screening.
The second purpose of the invention is to provide an analysis and screening method of the automatic analysis and screening system for the high and low temperature test data of the quartz crystal oscillator, which is used for accurately and efficiently screening the temperature test data, eliminating unqualified products and transferring the qualified products to a subsequent screening process.
In order to achieve the first object of the present invention, the technical solution of the present invention is: the automatic analysis and screening system of the high and low temperature test data of the quartz crystal oscillator is characterized in that: comprises a hardware system and a software system; the hardware system comprises a high-low temperature test system, a network switch and a program control computer; the high-low temperature test system adopts the automatic screening system in the invention, and performs data acquisition and data batch screening judgment through remote acquisition of the switch;
the high-low temperature test system transmits the high-low temperature characteristic temperature test data of the quartz crystal resonator to the program control computer through the network switch;
the program control computer respectively transmits the data to a human-computer interaction visual interface (namely a human-computer interaction friendly interface) and a software system; the software system automatically screens the temperature measurement data of the high and low temperature characteristics of the quartz crystal resonator and feeds back the screening information to the program control computer;
the software system has a good human-computer interaction visual operation interface, a program control computer installed with the software system remotely collects temperature measurement data on the high-low temperature test system through a network switch to realize automatic screening judgment of high-low temperature characteristic test data of batch products one by one, and screening information is output in a spreadsheet format;
the software system comprises a data remote acquisition module, a data standardization processing module, a workshop section information identification module, a screening parameter configuration module, an automatic screening module and a data processing and storing module;
the human-computer interaction visual interface is used for displaying the current working state of the automatic analysis and screening system of the quartz crystal oscillator high-low temperature test data, and/or displaying the processing progress of the automatic data screening, and simultaneously providing a system for processing and prompting misoperation and corresponding help;
the data remote acquisition module is used for acquiring high-low temperature characteristic data and acquiring a temperature measurement data source file of the high-low temperature test system through a computer network;
the Data standardization processing module is used for carrying out standardization processing on the temperature measurement Data of the table Crystal Data in the source database file which is acquired remotely; assuming that a high-low temperature test system tests 508 products in one-time operation, each product tests at least 10 groups of data in different temperature states, namely the high-low temperature test system operates at least 5000 pieces of original data output at one time, the data are sorted by data information and format through a data standardization module in the invention, and the data of the same product at different temperatures are classified, collected and ordered according to the sequence from low temperature to high temperature, so that an automatic screening module can conveniently carry out batch judgment; the progress risk and the inspection risk identification of the high-low temperature measurement data of the quartz crystal resonator are realized, tens of thousands of pieces of temperature measurement data acquired by testing the same batch of high-low temperature equipment are screened in batches under the conditions of different temperature ranges, different models and specifications and different characteristics, the processing efficiency is high, and the judgment accuracy is high;
the workshop section information identification module is used for reading and identifying reference nominal frequencies, test Configuration, workshop section number and station number of the table Setup File heads, the General Storage and Configuration in the source database File which is remotely collected;
the screening parameter configuration module is used for directly providing screening parameters and condition information for a user and simultaneously supporting calling or storing a screening parameter configuration scheme;
the automatic screening module (for data analysis and judgment) is used for operating the high-low temperature characteristic related test data of the quartz crystal resonator according to the general specification of the GJB 2138A quartz crystal element, screening the product temperature measurement data according to the screening parameters and condition requirements set by a user, and judging whether the product temperature measurement data conforms to the frequency-temperature characteristic curve rule of the AT cutting wafer; the wafer temperature characteristic curve is a cubic curve, under the condition that the working frequency of the crystal oscillator has positive bias and negative bias under the high and low temperature states, the automatic screening module can directly judge the product data with the full positive bias or the full negative bias as unqualified;
the data processing and storing module is used for directly providing screening information for the user, and the screening result is automatically stored in an EXCEL spreadsheet format; the screening detail consists of a station number, a temperature range, upper and lower parameter limits and test data information in a station number working table; the screening result consists of the pass/fail segment number, the station number and the total number in the statistical information worksheet.
All controls consist of the object-based programming language Visual Basic, ACCESS database, EXCEL spreadsheet, and GJB 2138A-2015 Quartz Crystal element general Specification related parameter algorithms.
In the technical scheme, the screening parameter configuration module provides screening parameters and condition information for a user to set relevant parameters and conditions according to requirements before screening temperature measurement data; and the user sets related parameters and conditions according to needs before screening temperature measurement data.
In the above technical solutions, the relevant parameters and conditions include Frmax(maximum value of frequency deviation), Frmin(minimum frequency deviation), Δ Fr (variation in frequency deviation), Rrmax(maximum value of resonance resistance), RrminThe temperature control method comprises the following steps of (minimum value of resonance resistance), delta Rr (variation of resonance resistance), adjacent temperature delta Fr (variation of adjacent temperature frequency), adjacent temperature delta Rr (variation of adjacent temperature resistance), low-temperature pole, high-temperature pole, fitting error, upper and lower temperature limits, upper and lower parameter limits and the like.
In the technical scheme, a temperature measurement data source file of the high and low temperature test system is an ACCESS database file;
the network switch is a TP-Link network switch.
In the technical scheme, the data remote acquisition module acquires the high-low temperature characteristic data of the quartz crystal resonators produced in batches at the same time.
In order to achieve the second object of the present invention, the technical solution of the present invention is: the analysis and screening method of the automatic analysis and screening system for the high and low temperature test data of the quartz crystal oscillator is characterized in that: comprises the following steps of (a) carrying out,
the method comprises the following steps: opening application software, selecting a menu bar, a file, opening, selecting a source database of the high and low temperature test system to be imported from a popped file selection dialog box, and directly identifying and displaying a complete path of the selected source database, a file name of the operation process of the high and low temperature test system and the operation test time of the high and low temperature test system in the data source of the Frame control;
step two: the number of processing work sections for loading high and low temperature test data to be analyzed and screened is automatically identified in the work section information of the Frame control, a corresponding work section number is selected, and the Label control automatically reads the temperature measurement reference frequency, the temperature measurement parameter configuration and the test station number corresponding to the work section number;
step three: selecting related parameters (such as Frmax, Frmin, delta F, Rrmax, Rrmin, delta Rr, adjacent temperature delta F, adjacent temperature delta Rr, low-temperature pole, high-temperature pole and fitting error) from the screening conditions of the Frame control to set the upper and lower limits of the temperature range and the upper and lower limits of the parameters, finishing setting the related parameters and conditions and confirming the accuracy;
step four: selecting other work section numbers in the work section information table, and repeating the step three to set related parameters and conditions until all the work section numbers are set;
step five: confirming the information of the workshop section, clicking a screening button to start operation after relevant parameters and conditions are set, and carrying out operation and screening judgment by a computer background according to a screening scheme set in ListView; displaying the current screening work section number, the work station number, the parameter condition and the screening progress in the StatusBar control;
step six: when the StatusBar control displays "screening completed! Screening data file … … ", indicating that screening was normally complete; after the screening is finished, the application program automatically stores the screening result in the EXCEL spreadsheet format under the corresponding drive letter path; the stored EXCEL spreadsheet is automatically opened, and the section numbers, the station numbers and the total number of the qualified products and the unqualified products are respectively displayed in the statistical information worksheet; generating work tables of corresponding numbers of work stations according to the numbers of the work stations, and displaying the product screening setting conditions and the calculation return data of the work stations in each work table of the work stations;
step seven: and (4) rejecting unqualified products by high and low temperature characteristic testing and screening personnel according to the data in the statistical information worksheet, and transferring qualified products to a subsequent screening process.
The Frame control, the Commbo control, the ListView control, the StatuBar control and other controls are all standard controls in Visual Basic, programming design needs to be carried out on the standard controls, relevant information is extracted into relevant controls, and the Visual Basic belongs to computer programming languages and is the prior art; the programming design is customized on the computer as needed.
The invention has the following advantages:
(1) the screening function of the application program can automatically screen in batches, reduce manual misjudgment and improve efficiency, and can identify abnormal parameters and abnormal temperature points in any temperature range of high and low temperatures of the crystal oscillator;
(2) the multi-condition screening scheme can be used for comprehensive screening of special temperature range and special precision requirements of small-tolerance crystal oscillators in special application fields;
(3) the method carries out progress risk and inspection risk identification on the screening of the high-low temperature measurement data of the quartz crystal resonator, and has the advantages that tens of thousands of pieces of temperature measurement data acquired by testing the same batch of high-low temperature equipment are screened in batches under the conditions of different temperature ranges, different models, specifications and different characteristics, the screening result is output to an EXCEL spreadsheet according to a preset screening scheme, and the EXCEL spreadsheet is stored, checked and edited under the same path of a source database; the automatic screening system for the high-low temperature characteristic temperature measurement data of the quartz crystal resonator realizes efficient and accurate batch production of high-low temperature characteristic tests of the quartz crystal resonator; the misjudgment and missed judgment risks existing in the manual screening are effectively controlled;
(4) the invention adopts the data remote acquisition module to acquire the test data of the high and low temperature test system, adopts the data standardization processing module to read the test data, standardizes the data and then acquires effective data, adopts the automatic screening module to customize screening judgment parameters of different conditions for the acquired data according to the requirements of users, realizes the screening of the test data by an automatic judgment mode, and has high processing efficiency and high judgment accuracy; the problems of low efficiency and low accuracy of the traditional method that each row of data is judged through manual confirmation and identification are solved; the invention has been in the high and low temperature test equipment of our company and tried out for more than 2 years, the system operates steadily, the data identification judges accurately; especially, on the aspect of multi-condition judgment, the working efficiency and the accuracy are greatly improved.
Drawings
FIG. 1 is a frame diagram of the design of the automatic screening software for testing the high and low temperature characteristics of the quartz crystal resonator.
FIG. 2 is a human-computer interaction interface of the automatic screening software for testing the high and low temperature characteristics of the quartz crystal resonator.
FIG. 3 is an interface for setting the automatic screening parameters for the high and low temperature characteristics of the quartz crystal resonator according to the present invention.
FIG. 4 is an interface for setting the automatic screening parameters for the high and low temperature characteristic test of the software extended crystal oscillator according to the present invention.
FIG. 5 is a diagram of the configuration information identifying the high and low temperature test data and other relevant parameters in the temperature measurement database according to the present invention.
FIG. 6 is a diagram of Crystal Data in a source database file with Data collected remotely according to the present invention.
FIG. 7 is a structural diagram of an automatic analysis and screening system for high and low temperature test data of a quartz crystal oscillator according to the present invention.
Detailed Description
The embodiments of the present invention will be described in detail with reference to the accompanying drawings, which are not intended to limit the present invention, but are merely exemplary. While the advantages of the invention will be clear and readily understood by the description.
The invention will be described in detail by taking the automatic screening of the high-low temperature characteristic temperature measurement data applied to a certain batch of quartz crystal resonators as an embodiment, and has a guiding function for the automatic screening of the high-low temperature characteristic temperature measurement data applied to other batches of quartz crystal resonators.
Example 1
512 quartz crystal resonators in the batch are provided in the embodiment; the selected screening parameters and conditions are Frmax、Frmin、ΔFr、Rrmax、RrminDelta Rr, adjacent temperature delta Fr, adjacent temperature delta Rr, low temperature pole, high temperature pole, fitting error, upper and lower temperature limits and upper and lower parameter limits.
The high and low temperature test system in the embodiment is a commercial product, and is an American S & A high and low temperature test system (W-2200/W-2800); the equipment can test the parameters of the crystal oscillator product in a high-temperature and low-temperature state and output test data in a file form, but does not have the capability of analyzing data and screening and judging the data according to the requirements of users.
The method is generally applied to high-low temperature test equipment of two types of U.S. S & A company W2200 and W2800, and the equipment belongs to special equipment in the crystal oscillator industry; the purpose of W2200 and W2800 tests is to measure the parameters of products with different temperature states, the working principle is the same, except that W2200 is used for testing passive products, W2800 is used for testing active products, the two types of products are tested, and the parameter index requirements are different.
The invention is only suitable for US S & A high and low temperature test systems (W2200 and W2800), the two types of devices are most popular in the crystal oscillator industry at present, and the devices have industrial limitations.
In this embodiment, the automatic analysis and screening system for the high and low temperature test data of the quartz crystal oscillator includes a hardware system and a software system;
the hardware system comprises a high-low temperature test system, a network switch and a program control computer;
the software system comprises a data remote acquisition module, a data standardization processing module, a workshop section information identification module, a screening parameter configuration module, an automatic screening module and a data processing and storing module; the good human-computer interaction visual interface displays the current working state of the system in the automatic data screening process and also can display the processing progress of the automatic data screening; meanwhile, a system for processing and prompting misoperation and a corresponding help system are provided (as shown in FIG. 1, FIG. 1 is used for visually displaying a hardware system and software system framework and a human-computer interaction interface of the invention).
In the embodiment, the data remote acquisition module provides source data for the data standardization processing module; the workshop section information identification module automatically identifies and imports workshop section quantity, the reference frequency and the test configuration; the screening parameter configuration module is used for setting a screening scheme with multiple screening conditions; the automatic screening module automatically screens the product temperature measurement data one by one according to a set screening scheme; and the data processing and storing module is used for storing the screening result into a corresponding file and displaying the screening result in system software.
In this embodiment, the data remote acquisition module acquires the W-2200/W-2800 high and low temperature test system test data source file through a common control in Visual Basic via a computer local area network, and the file format is an ACCESS database file.
In this embodiment, the high and low temperature test data and other relevant parameter configuration information need to be identified in 20 tables of the temperature measurement database, as shown in fig. 5;
in this embodiment, the Data normalization module performs normalization one-to-one correspondence processing on test Data of table Crystal Data in a source database file, where the Data is remotely acquired, and the table Crystal Data is shown in fig. 6;
in this embodiment, the section information identification module reads and identifies reference nominal frequencies, test configurations, and the number of sections in a source database File remotely acquired by collecting data through a Commbo control and a Label control in Visual Basic.
In this embodiment, the filtering parameter configuration module directly provides filtering parameter information for the user: setting relevant parameters by a user before data screening according to needs, and setting a screening parameter configuration scheme such as parameters like Frmax, Frmin, delta F, Rrmax, Rrmin, delta RR, adjacent temperature delta F, adjacent temperature delta RR, low temperature pole, high temperature pole, fitting error, upper and lower temperature limits, upper and lower parameter limits and the like through a ListView control, Commbo control and a TextBox control in Visual Basic; and meanwhile, the configuration scheme of adding, deleting and storing the screening parameters is supported.
In this embodiment, the automatic screening module reads test Data of table Crystal Data in the source database file by calling an OpenDatabase function. Performing background operation on the test data related to the high and low temperature characteristics of the product according to the general specification of the GJB 2138A quartz crystal element, then screening the temperature measurement data of the product according to a screening scheme set by a user in a ListView control in Visual Basic, and meanwhile, judging whether the change rule of the temperature measurement data conforms to the frequency-temperature characteristic curve rule of the AT cutting wafer.
In this embodiment, the data processing and storing module directly provides screening information for a user, the screening result is automatically saved as an EXCEL format file by using file names of the same path and the same path of a source database by means of workflow and save methods, and the screening details are composed of a station number, a temperature range, upper and lower limits of parameters, test data information and the like in a worksheet of EXCEL file station numbers; the screening result consists of the qualified/unqualified station numbers and the total number in the EXCEL file statistical information worksheet.
In this embodiment, all controls consist of the object-based programming language Visual Basic, ACCESS database, EXCEL spreadsheet, and GJB 2138A-2015 quartz crystal element general specification related parameter algorithms.
In this embodiment, all the controls consist of object-based programming language Visual Basic, ACCESS database, EXCEL spreadsheet, and GJB 2138A quartz crystal element general specification related parameter algorithms.
In this embodiment, a main interface of temperature measurement data screening software for high and low temperature characteristics of a quartz crystal resonator developed by using Visual Basic software (i.e., an automatic screening software man-machine interaction interface for high and low temperature characteristic tests of a quartz crystal resonator) is shown in fig. 2, and a menu bar mainly includes two function bars: l, file import, which is mainly responsible for importing a target source file, 2, parameter configuration, and mainly responsible for setting relevant parameters and linking relevant fields of the source file.
As shown in fig. 1, the automatic screening method for high-temperature and low-temperature characteristic temperature measurement data of a quartz crystal resonator in the present embodiment includes the following steps,
the method comprises the following steps: opening application software, selecting a menu bar, a file, opening, selecting a source database of the high and low temperature test system to be imported from a popped file selection dialog box, and directly identifying and displaying a complete path of the selected source database, a file name of the operation process of the high and low temperature test system and the operation test time of the high and low temperature test system in the data source of the Frame control;
step two: the number of processing work sections loaded with the batch of high and low temperature test data can be automatically identified in the work section information of the Frame control, a corresponding work section number is selected, and the Label control automatically reads the temperature measurement reference frequency, the temperature measurement parameter configuration and the test work station number corresponding to the work section number;
step three: selecting relevant parameters (such as Frmax, Frmin, delta F, Rrmax, Rrmin, delta Rr, adjacent temperature delta F, adjacent temperature delta Rr, low-temperature pole, high-temperature pole and fitting error) from the screening conditions of the Frame control to set the upper and lower limits of the temperature range and the upper and lower limits of the parameters, and confirming the accuracy after the relevant parameters and the conditions are set (the automatic screening parameter setting definition of the high-low temperature characteristic test of the quartz crystal resonator in the embodiment is shown in figures 3 and 4);
step four: selecting other work section numbers in the work section information table, and repeating the step three to set related parameters and conditions until all the work section numbers are set;
step five: and confirming the information of the workshop section, clicking a screening button to start operation after the relevant parameters and conditions are set, and calculating and screening and judging by a computer background according to a screening scheme set in ListView. Displaying the current screening work section number, the work station number, the parameter condition and the screening progress in the StatusBar control;
step six: when the StatusBar control displays "screening completed! Screening data file … … ", indicating that screening was normally complete; after the screening is finished, the application program automatically stores the screening result in the EXCEL spreadsheet format under the corresponding drive letter path; the stored EXCEL spreadsheet is automatically opened, and the section numbers, the station numbers and the total number of the qualified products and the unqualified products are respectively displayed in the statistical information worksheet; generating work tables of corresponding numbers of work stations according to the numbers of the work stations, and displaying the product screening setting conditions and the calculation return data of the work stations in each work table of the work stations;
step seven: and (4) rejecting unqualified products by high and low temperature characteristic testing and screening personnel according to the data in the statistical information worksheet, and transferring qualified products to a subsequent screening process.
And (4) conclusion: in the embodiment, by adopting the screening system and the screening method, automatic batch screening is realized, manual misjudgment is reduced, efficiency is improved, and identification of abnormal parameters and abnormal temperature points in any temperature range of high and low temperatures of the crystal oscillator is realized.
Example 2
The automatic analysis and screening system and the screening method for the high and low temperature test data of the quartz crystal oscillator are the same as those in embodiment 1; the difference lies in that: in this embodiment, multiple condition analysis and determination (as shown in fig. 1) are adopted, and the screening condition and multiple parameter conditions in the range participate in data screening and determination at the same time.
And (4) conclusion: in the embodiment, the screening system and the screening method provided by the invention not only realize automatic batch screening, reduce manual misjudgment and improve efficiency, but also realize identification of abnormal parameters and abnormal temperature points in any temperature range of high and low temperatures of the crystal oscillator.
In fig. 1, a single condition means that only one parameter condition is set and judged to be satisfied;
the multiple conditions refer to that the screening conditions and multiple parameter conditions in the range in the figure 1 are set to participate in data screening judgment at the same time, and if any parameter does not meet the requirement, the judgment is that the parameter does not meet the requirement.
The multi-condition screening scheme can be used for comprehensive screening of special temperature range and special precision requirements of small-tolerance crystal oscillators in special (namely, application occasions with high precision requirements) application fields; the special application field mainly relates to military communication of special application occasions such as wireless communication, intelligent security, industrial remote control and the like, and because the crystal oscillator has the characteristic that the frequency precision can be changed under the high and low temperature states, the requirements of multiple conditions on different temperature range parameters can be provided for some application occasions with high requirements on the precision. Taking wireless communication as an example, the communication is divided into a transmitting end and a receiving end, and the higher the signal matching precision of the transmitting end and the receiving end is, the better the response speed of communication signals, the transmission distance and the signal quality are. The frequency precision of the crystal oscillator can influence the matching precision of a transmitting and receiving signal end, the product of the type not only meets the precision requirement of minus 40 to plus 85 +/-30 ppm, but also carries out high-precision frequency matching of +/-3 ppm according to the using environment temperature of a client product, and can classify, package and mark according to different high-precision ranges required by the client to meet the client requirement.
FIG. 3 is a W2200 device suitable for use with US S & A for passive products; FIG. 4 is a W2800 device suitable for use with the US S & A company for active products; due to different applicable objects, the calculation modes and the judgment bases of the acquisition, analysis and screening judgment of the images in the images 3 and 4 are different.
FIG. 5 shows original operation settings and test data of the high-low test system, and the relevant parameters in FIG. 5 automatically generate the corresponding ACCESS source table; FIG. 6 is a field name and data type in an ACCESS source table; fig. 5 and 6 are definitions on us S & a high and low temperature test equipment. The invention adopts US S & A high and low temperature test equipment to acquire effective test data.
Other parts not described belong to the prior art.

Claims (6)

1. The automatic analysis and screening system of the high and low temperature test data of the quartz crystal oscillator is characterized in that: comprises a hardware system and a software system; the hardware system comprises a high-low temperature test system, a network switch and a program control computer;
the high-low temperature test system transmits the high-low temperature characteristic temperature test data of the quartz crystal resonator to the program control computer through the network switch;
the program control computer respectively transmits the data to a human-computer interaction visual interface and a software system; the software system automatically screens the high-low temperature characteristic temperature measurement data of the quartz crystal resonator and feeds back the screening information to the program control computer;
the software system comprises a data remote acquisition module, a data standardization processing module, a workshop section information identification module, a screening parameter configuration module, an automatic screening module and a data processing and storing module;
the human-computer interaction visual interface is used for displaying the current working state of the automatic analysis and screening system and/or displaying the processing progress of automatic data screening, and meanwhile processing, prompting and corresponding help for misoperation;
the data remote acquisition module is used for acquiring a temperature measurement data source file of the high and low temperature test system through a computer network;
the Data standardization processing module is used for carrying out standardization processing on the temperature measurement Data of the table Crystal Data in the source database file which is acquired remotely;
the workshop section information identification module is used for reading and identifying reference nominal frequencies, test Configuration, workshop section number and station number of the table Setup File heads, the General Storage and Configuration in the source database File which is remotely collected;
the screening parameter configuration module is used for directly providing screening parameters and condition information for a user and simultaneously supporting calling or storing a screening parameter configuration scheme;
the automatic screening module is used for calculating the test data related to the high-low temperature characteristics of the quartz crystal resonator according to the general specification of the GJB 2138A quartz crystal element, screening the product temperature measurement data according to the screening parameters and condition requirements set by a user, and judging whether the product temperature measurement data conforms to the frequency-temperature characteristic curve rule of the AT cutting wafer;
the data processing and storing module is used for directly providing screening information for the user, and the screening result is automatically stored in an EXCEL spreadsheet format; the screening detail consists of a station number, a temperature range, upper and lower parameter limits and test data information in a station number working table; the screening result consists of the pass/fail segment number, the station number and the total number in the statistical information worksheet.
2. The system for automatically analyzing and screening high and low temperature test data of the quartz crystal oscillator according to claim 1, wherein: the screening parameter configuration module provides screening parameters and condition information for a user to set relevant parameters and conditions according to requirements before screening temperature measurement data; and the user sets related parameters and conditions according to needs before screening temperature measurement data.
3. The system for automatically analyzing and screening high and low temperature test data of the quartz crystal oscillator according to claim 2, wherein: relevant parameters and conditions include Frmax、Frmin、ΔFr、Rrmax、RrminDelta Rr, adjacent temperature delta Fr, adjacent temperature delta Rr, low temperature pole, high temperature pole, fitting error, upper and lower temperature limits and upper and lower parameter limits.
4. The automatic analysis and screening system for high and low temperature test data of the quartz crystal oscillator according to claim 3, characterized in that: the temperature measurement data source file of the high and low temperature test system is an ACCESS database file;
the network switch is a TP-Link network switch.
5. The automatic analysis and screening system for high and low temperature test data of the quartz crystal oscillator according to claim 4, characterized in that: and the data remote acquisition module is used for simultaneously acquiring high-temperature and low-temperature characteristic data of quartz crystal resonators produced in batches.
6. The method for analyzing and screening the quartz crystal oscillator high and low temperature test data according to any one of claims 1 to 5, wherein: comprises the following steps of (a) carrying out,
the method comprises the following steps: opening application software, selecting a menu bar, a file, opening, selecting a source database of the high and low temperature test system to be imported from a popped file selection dialog box, directly identifying and displaying a complete path of the selected source database in a data source of a Frame control, and running process file names and running test time of the high and low temperature test system;
step two: automatically identifying the number of processing work sections loaded with high and low temperature test data to be analyzed and screened in the Commbo control in the work section information of the Frame control, selecting a corresponding work section number, and automatically reading the temperature measurement reference frequency, the temperature measurement parameter configuration and the test work station number of the corresponding work section number by the Label control;
step three: selecting related parameters from the screening conditions of the Frame control to set the upper and lower limits of the temperature range and the upper and lower limits of the parameters, and confirming the accuracy after the setting of the related parameters and the conditions is finished;
step four: selecting other work section numbers in the work section information table, and repeating the step three to set related parameters and conditions until all the work section numbers are set;
step five: confirming the information of the workshop section, clicking a screening button to start operation after relevant parameters and conditions are set, and carrying out operation and screening judgment by a computer background according to a screening scheme set in ListView; displaying the current screening work section number, the work station number, the parameter condition and the screening progress in the StatusBar control;
step six: after the screening is finished, the application program automatically stores the screening result in the EXCEL spreadsheet format under the corresponding drive letter path; the stored EXCEL spreadsheet is automatically opened, and the section numbers, the station numbers and the total number of the qualified products and the unqualified products are respectively displayed in the statistical information worksheet; generating work tables of corresponding numbers of work stations according to the numbers of the work stations, and displaying the product screening setting conditions and the calculation return data of the work stations in each work table of the work stations;
step seven: and (4) rejecting unqualified products by high and low temperature characteristic testing and screening personnel according to the data in the statistical information worksheet, and transferring qualified products to a subsequent screening process.
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