CN103635859B - 成像光学单元 - Google Patents
成像光学单元 Download PDFInfo
- Publication number
- CN103635859B CN103635859B CN201280026502.0A CN201280026502A CN103635859B CN 103635859 B CN103635859 B CN 103635859B CN 201280026502 A CN201280026502 A CN 201280026502A CN 103635859 B CN103635859 B CN 103635859B
- Authority
- CN
- China
- Prior art keywords
- optical unit
- partial
- image formation
- optical
- imaging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0647—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0647—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors
- G02B17/0663—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors off-axis or unobscured systems in which not all of the mirrors share a common axis of rotational symmetry, e.g. at least one of the mirrors is warped, tilted or decentered with respect to the other elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0081—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means for altering, e.g. enlarging, the entrance or exit pupil
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70275—Multiple projection paths, e.g. array of projection systems, microlens projection systems or tandem projection systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Lenses (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161491523P | 2011-05-31 | 2011-05-31 | |
| DE102011076752A DE102011076752A1 (de) | 2011-05-31 | 2011-05-31 | Abbildende Optik |
| DE102011076752.5 | 2011-05-31 | ||
| US61/491,523 | 2011-05-31 | ||
| PCT/EP2012/059697 WO2012163794A1 (en) | 2011-05-31 | 2012-05-24 | Imaging optical unit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103635859A CN103635859A (zh) | 2014-03-12 |
| CN103635859B true CN103635859B (zh) | 2016-12-14 |
Family
ID=47173165
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280026502.0A Active CN103635859B (zh) | 2011-05-31 | 2012-05-24 | 成像光学单元 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9377608B2 (enExample) |
| EP (1) | EP2715452B1 (enExample) |
| JP (1) | JP6263800B2 (enExample) |
| KR (1) | KR102092363B1 (enExample) |
| CN (1) | CN103635859B (enExample) |
| DE (1) | DE102011076752A1 (enExample) |
| WO (1) | WO2012163794A1 (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9291751B2 (en) * | 2013-06-17 | 2016-03-22 | Carl Zeiss Smt Gmbh | Imaging optical unit and projection exposure apparatus for projection lithography comprising such an imaging optical unit |
| DE102018201170A1 (de) * | 2018-01-25 | 2019-07-25 | Carl Zeiss Smt Gmbh | Abbildende Optik für die EUV-Mikrolithographie |
| DE102023203224A1 (de) * | 2023-04-06 | 2024-10-10 | Carl Zeiss Smt Gmbh | Abbildende EUV-Optik zur Abbildung eines Objektfeldes in ein Bildfeld |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6307682B1 (en) * | 2000-02-16 | 2001-10-23 | Silicon Valley Group, Inc. | Zoom illumination system for use in photolithography |
| CN101836151A (zh) * | 2007-10-26 | 2010-09-15 | 卡尔蔡司Smt股份公司 | 成像光学系统、包括该类型的成像光学系统的用于微光刻的投射曝光设备、以及利用该类型的投射曝光设备生产微结构部件的方法 |
| CN103080841A (zh) * | 2010-08-25 | 2013-05-01 | 卡尔蔡司Smt有限责任公司 | 成像光学系统 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6314113A (ja) * | 1986-07-07 | 1988-01-21 | Matsushita Electric Ind Co Ltd | 微細パタ−ン投影光学系 |
| US4861148A (en) * | 1986-03-12 | 1989-08-29 | Matsushita Electric Industrial Co., Inc. | Projection optical system for use in precise copy |
| JPH1114913A (ja) * | 1997-06-23 | 1999-01-22 | Kazuo Kosho | 第1面に凹球面反射鏡を使用した望遠鏡。 |
| DE19809055A1 (de) * | 1998-03-04 | 1999-09-16 | Ernst Brinkmeyer | Zweistrahl-Interferometer zur Gitterherstellung in photosensitiven Materialien |
| US6943946B2 (en) * | 2003-05-01 | 2005-09-13 | Itt Manufacturing Enterprises, Inc. | Multiple aperture imaging system |
| JP4495942B2 (ja) * | 2003-10-20 | 2010-07-07 | リコー光学株式会社 | 結像光学系・画像形成装置・プリンターおよび画像読取装置 |
| KR100962911B1 (ko) | 2005-09-13 | 2010-06-10 | 칼 짜이스 에스엠테 아게 | 마이크로리소그라피 투영 광학 시스템, 디바이스 제작 방법 및 광학 표면을 설계하기 위한 방법 |
| DE102006014380A1 (de) * | 2006-03-27 | 2007-10-11 | Carl Zeiss Smt Ag | Projektionsobjektiv und Projektionsbelichtungsanlage mit negativer Schnittweite der Eintrittspupille |
| CN101379593A (zh) * | 2006-04-14 | 2009-03-04 | 株式会社尼康 | 曝光装置、元件制造方法以及曝光方法 |
| CN102819197B (zh) | 2007-10-26 | 2016-06-22 | 卡尔蔡司Smt有限责任公司 | 成像光学系统、投射曝光设备、微结构部件及其产生方法 |
| KR20100117281A (ko) * | 2009-04-24 | 2010-11-03 | 주식회사 프로텍 | Ldi용 다중 광 분할방법 및 장치 |
| JP5328512B2 (ja) * | 2009-06-24 | 2013-10-30 | 富士フイルム株式会社 | 露光装置 |
-
2011
- 2011-05-31 DE DE102011076752A patent/DE102011076752A1/de not_active Ceased
-
2012
- 2012-05-24 CN CN201280026502.0A patent/CN103635859B/zh active Active
- 2012-05-24 EP EP12724117.2A patent/EP2715452B1/en active Active
- 2012-05-24 WO PCT/EP2012/059697 patent/WO2012163794A1/en not_active Ceased
- 2012-05-24 JP JP2014513130A patent/JP6263800B2/ja active Active
- 2012-05-24 KR KR1020137030787A patent/KR102092363B1/ko active Active
-
2013
- 2013-11-14 US US14/080,743 patent/US9377608B2/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6307682B1 (en) * | 2000-02-16 | 2001-10-23 | Silicon Valley Group, Inc. | Zoom illumination system for use in photolithography |
| CN101836151A (zh) * | 2007-10-26 | 2010-09-15 | 卡尔蔡司Smt股份公司 | 成像光学系统、包括该类型的成像光学系统的用于微光刻的投射曝光设备、以及利用该类型的投射曝光设备生产微结构部件的方法 |
| CN103080841A (zh) * | 2010-08-25 | 2013-05-01 | 卡尔蔡司Smt有限责任公司 | 成像光学系统 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103635859A (zh) | 2014-03-12 |
| DE102011076752A1 (de) | 2012-12-06 |
| WO2012163794A1 (en) | 2012-12-06 |
| JP2014517349A (ja) | 2014-07-17 |
| JP6263800B2 (ja) | 2018-01-24 |
| EP2715452A1 (en) | 2014-04-09 |
| US9377608B2 (en) | 2016-06-28 |
| EP2715452B1 (en) | 2020-12-16 |
| KR102092363B1 (ko) | 2020-03-24 |
| US20140071418A1 (en) | 2014-03-13 |
| KR20140043732A (ko) | 2014-04-10 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |