CN103608671B - 表面电荷测量 - Google Patents

表面电荷测量 Download PDF

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Publication number
CN103608671B
CN103608671B CN201280027695.1A CN201280027695A CN103608671B CN 103608671 B CN103608671 B CN 103608671B CN 201280027695 A CN201280027695 A CN 201280027695A CN 103608671 B CN103608671 B CN 103608671B
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China
Prior art keywords
sample
measurement
detector
sample holder
electrolyte
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CN201280027695.1A
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English (en)
Chinese (zh)
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CN103608671A (zh
Inventor
杰森·科比特
弗雷泽·麦克尼尔·沃森
罗伯特·杰克
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Malvern Panalytical Ltd
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Malvern Instruments Ltd
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Publication date
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Priority to CN201610324224.7A priority Critical patent/CN105891304B/zh
Publication of CN103608671A publication Critical patent/CN103608671A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416—Systems
    • G01N27/447—Systems using electrophoresis
    • G01N27/44704—Details; Accessories
    • G01N27/44717—Arrangements for investigating the separated zones, e.g. localising zones
    • G01N27/44721—Arrangements for investigating the separated zones, e.g. localising zones by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24—Arrangements for measuring quantities of charge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • G01N2021/513—Cuvettes for scattering measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416—Systems
    • G01N27/447—Systems using electrophoresis

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  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Molecular Biology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Optical Measuring Cells (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
CN201280027695.1A 2011-06-15 2012-06-13 表面电荷测量 Active CN103608671B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610324224.7A CN105891304B (zh) 2011-06-15 2012-06-13 表面电荷测量

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161497385P 2011-06-15 2011-06-15
US61/497,385 2011-06-15
PCT/GB2012/051336 WO2012172330A1 (en) 2011-06-15 2012-06-13 Surface charge measurement

Related Child Applications (1)

Application Number Title Priority Date Filing Date
CN201610324224.7A Division CN105891304B (zh) 2011-06-15 2012-06-13 表面电荷测量

Publications (2)

Publication Number Publication Date
CN103608671A CN103608671A (zh) 2014-02-26
CN103608671B true CN103608671B (zh) 2016-05-18

Family

ID=46582723

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201280027695.1A Active CN103608671B (zh) 2011-06-15 2012-06-13 表面电荷测量
CN201610324224.7A Active CN105891304B (zh) 2011-06-15 2012-06-13 表面电荷测量

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN201610324224.7A Active CN105891304B (zh) 2011-06-15 2012-06-13 表面电荷测量

Country Status (6)

Country Link
US (4) US9829525B2 (enExample)
EP (1) EP2721399B1 (enExample)
JP (1) JP6023184B2 (enExample)
CN (2) CN103608671B (enExample)
DK (1) DK2721399T3 (enExample)
WO (1) WO2012172330A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103954850B (zh) * 2014-04-22 2017-01-04 重庆大学 一种运动控制机构外置的表面电荷测量系统和测量方法
US11002655B2 (en) 2015-09-23 2021-05-11 Malvern Panalytical Limited Cuvette carrier
WO2017051149A1 (en) 2015-09-23 2017-03-30 Malvern Instruments Limited Particle characterisation
CN105628685B (zh) * 2015-12-30 2019-04-23 宁德时代新能源科技股份有限公司 一种锂离子电池芯中电解液分布的测定方法
GB201604460D0 (en) * 2016-03-16 2016-04-27 Malvern Instr Ltd Dynamic light scattering
US10365198B2 (en) 2016-04-21 2019-07-30 Malvern Panalytical Limited Particle characterization
WO2018132306A1 (en) 2017-01-10 2018-07-19 Vermeer Manufacturing Company Systems and methods for dosing slurries to remove suspended solids
EP3379232A1 (en) 2017-03-23 2018-09-26 Malvern Panalytical Limited Particle characterisation
CN106950438B (zh) * 2017-04-28 2023-06-02 中国科学院地球化学研究所 非接触式空间粒子带电检测装置及方法
CN109358239A (zh) * 2018-10-17 2019-02-19 国网天津市电力公司电力科学研究院 一种用于交流电缆空间电荷测试的相位匹配电路
CN109557388A (zh) * 2018-11-23 2019-04-02 国网天津市电力公司电力科学研究院 基于lipp法的高分辨率空间电荷测试系统
CN110346657B (zh) * 2019-06-28 2021-09-03 同济大学 一种自适应调整电极夹具装置
CN110456171B (zh) * 2019-08-05 2020-11-06 清华大学 电晕放电导体表面电场强度的测量方法及装置
JP7440331B2 (ja) * 2020-04-16 2024-02-28 大塚電子株式会社 ゼータ電位測定用治具
JP7813177B2 (ja) * 2022-04-13 2026-02-12 大塚電子株式会社 ゼータ電位測定用治具セット

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0990888A2 (en) * 1998-09-29 2000-04-05 Horiba, Ltd. Apparatus and method for measuring a particle size distribution
EP1154266A2 (en) * 2000-04-29 2001-11-14 Malvern Instruments Limited Mobility and effects arising from surface charge
CN1517704A (zh) * 2003-01-21 2004-08-04 三星电子株式会社 利用交流电场和T通道测定ζ电势的方法和装置
US20040251134A1 (en) * 2003-02-25 2004-12-16 Mitsunao Sekiwa Electrophoretic mobility measuring apparatus
US20060114467A1 (en) * 2004-12-01 2006-06-01 Particle Sizing Systems, Inc. Methods and apparatus for electrophoretic mobility determination using phase light scattering analysis
WO2010041082A2 (en) * 2008-10-09 2010-04-15 Malvern Instruments Limited Apparatus for high-throughput suspension measurements

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US5214342A (en) * 1991-10-21 1993-05-25 Yang Kei Wean C Two-dimensional walker assembly for a scanning tunneling microscope
JP2924815B2 (ja) 1996-09-27 1999-07-26 日本電気株式会社 ゼータ電位測定装置
JP2001264282A (ja) 2000-03-16 2001-09-26 Kobe Steel Ltd 金属材表面のゼータ電位測定方法およびゼータ電位測定装置、金属材の表面特性の評価方法
JP4456301B2 (ja) 2001-07-18 2010-04-28 株式会社堀場製作所 粒子径分布測定装置
EP1562042A3 (en) * 2004-01-22 2007-02-21 Ionalytics Corporation Method and apparatus for FAIMS for In-Line analysis of multiple samples
JP4528014B2 (ja) * 2004-04-05 2010-08-18 株式会社日立ハイテクノロジーズ 試料検査方法
BRPI0402805A (pt) * 2004-05-25 2006-01-17 Jose Augusto Pedro Lima Sistema para medição de propriedades térmicas de fluidos
US20080204716A1 (en) * 2005-03-07 2008-08-28 Michael Trainer Methods and apparatus for determining characteristics of particles
JP4944859B2 (ja) 2008-09-26 2012-06-06 株式会社堀場製作所 粒子物性測定装置
JP2010101705A (ja) * 2008-10-22 2010-05-06 Horiba Ltd 粒子物性測定装置
US8441638B2 (en) 2010-02-26 2013-05-14 Wyatt Technology Corporation Apparatus to measure particle mobility in solution with scattered and unscattered light
JP5411096B2 (ja) 2010-08-31 2014-02-12 株式会社堀場製作所 粒子物性測定セル及び粒子物性測定装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0990888A2 (en) * 1998-09-29 2000-04-05 Horiba, Ltd. Apparatus and method for measuring a particle size distribution
EP1154266A2 (en) * 2000-04-29 2001-11-14 Malvern Instruments Limited Mobility and effects arising from surface charge
CN1517704A (zh) * 2003-01-21 2004-08-04 三星电子株式会社 利用交流电场和T通道测定ζ电势的方法和装置
US20040251134A1 (en) * 2003-02-25 2004-12-16 Mitsunao Sekiwa Electrophoretic mobility measuring apparatus
US20060114467A1 (en) * 2004-12-01 2006-06-01 Particle Sizing Systems, Inc. Methods and apparatus for electrophoretic mobility determination using phase light scattering analysis
WO2010041082A2 (en) * 2008-10-09 2010-04-15 Malvern Instruments Limited Apparatus for high-throughput suspension measurements

Also Published As

Publication number Publication date
JP2014518379A (ja) 2014-07-28
US11079420B2 (en) 2021-08-03
EP2721399B1 (en) 2017-04-19
CN105891304A (zh) 2016-08-24
US20200072888A1 (en) 2020-03-05
JP6023184B2 (ja) 2016-11-09
US20150022212A1 (en) 2015-01-22
US10274528B2 (en) 2019-04-30
US9829525B2 (en) 2017-11-28
CN103608671A (zh) 2014-02-26
CN105891304B (zh) 2018-10-23
EP2721399A1 (en) 2014-04-23
US20180059160A1 (en) 2018-03-01
US20170356943A1 (en) 2017-12-14
DK2721399T3 (en) 2017-07-10
WO2012172330A1 (en) 2012-12-20

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