CN103323734A - Circuit short/open testing method of flexible circuit boards - Google Patents
Circuit short/open testing method of flexible circuit boards Download PDFInfo
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- CN103323734A CN103323734A CN2013102612101A CN201310261210A CN103323734A CN 103323734 A CN103323734 A CN 103323734A CN 2013102612101 A CN2013102612101 A CN 2013102612101A CN 201310261210 A CN201310261210 A CN 201310261210A CN 103323734 A CN103323734 A CN 103323734A
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Abstract
The invention provides a circuit short/open testing method of flexible circuit boards. The method comprises the following steps that a. a flexible circuit board without a short circuit/an open circuit is selected as a standard board, the inductance of a circuit to be tested is tested, a standard inductance value is obtained; b. a flexible circuit board with a short circuit/an open circuit is selected, an inductance changing threshold value is obtained; c. other flexible circuit boards to be tested are selected, and the inductance of circuits to be tested is tested, so that whether the circuits are short circuits/open circuits are judged. The method has the advantages that when a leading wire is a single wire and has multiple circles, if a short circuit exists between the circles, the short circuit can be tested. By testing the inductance value, the short circuit/the open circuit can be tested at one time, testing accuracy is high, and testing efficiency is high.
Description
Technical field
The present invention relates to the measuring technology of flexible PCB.
Background technology
In the short-circuit test of existing flexible PCB (FPC), generally be by at flexible PCB (FPC) two ends design test pin, judge the short circuit of circuit by the conducting situation of energising measurement circuit.Adopt this method, when wire is single line and when multi-turn is arranged, circle with enclose between just can not test out if there is short circuit.
Simultaneously, existing measurement jig is when the open circuit of test flexible PCB (FPC), short-circuit conditions to circuit can't detect simultaneously, and there is line children in flexible PCB (FPC), and traditional tool method of testing can not be told this kind unfavorable condition.
Summary of the invention
For this reason, the present invention is for overcoming above-mentioned the deficiencies in the prior art, and a kind of line short of flexible PCB/open test method is provided.
The present invention realizes that the technical scheme that goal of the invention adopts is: a kind of line short of flexible PCB/open test method may further comprise the steps:
A. the flexible PCB of selecting not have short/open is treated the inductance on survey line road and is measured as on-gauge plate, obtains the standard inductance value;
B. select the flexible PCB of short/open, identical circuit to be measured is carried out inductance measure, obtain the short/open inductance value, relatively draw the inductance change threshold by short/open inductance value and described standard inductance value;
C. select other flexible PCBs to be measured, treat the survey line road and carry out inductance mensuration, obtain measuring inductance value, described mensuration inductance value and described standard inductance value are compared, if exceed described inductance change threshold, then judge described line short/open circuit, do not judge that then described circuit does not have short/open if exceed described inductance change threshold.
Particularly, described inductance change threshold is+5% or-5%.
The invention has the beneficial effects as follows: the line short by flexible PCB of the present invention/open test method, when wire is single line and when multi-turn is arranged, circle with enclose between also can test out if there is short circuit.By the test to inductance value, can also measure once short/open, not only test accuracy is high but also testing efficiency is higher.
Description of drawings
Fig. 1 is the process flow diagram of the line short/open test method of embodiment of the invention flexible PCB;
Embodiment
Below, describe the present invention by reference to the accompanying drawings.
A kind of line short of flexible PCB/open test method, its process flow diagram may further comprise the steps referring to accompanying drawing 1:
A. the flexible PCB of selecting not have short/open is treated the inductance on survey line road and is measured as on-gauge plate, obtains the standard inductance value;
B. select the flexible PCB of short/open, identical circuit to be measured is carried out inductance measure, obtain the short/open inductance value, relatively draw the inductance change threshold by short/open inductance value and described standard inductance value;
C. select other flexible PCBs to be measured, treat the survey line road and carry out inductance mensuration, obtain measuring inductance value, described mensuration inductance value and described standard inductance value are compared, if exceed described inductance change threshold, then judge described line short/open circuit, do not judge that then described circuit does not have short/open if exceed described inductance change threshold.
The present invention is described in detail below in conjunction with specific embodiment.
The principle of inductance measurement is that to utilize flexible PCB (FPC) be that metal material of copper and PI form among the present invention, after between the circuit open circuit/short circuit being arranged, the inductance value of conductor own can change, judge the bad of FPC (FPC) by the variation of inductance value, by mensuration and the comparison to defective products and non-defective unit inductance value, can set the inductance change threshold, to be used for checking short circuit or the open circuit situation between the circuit.
At first, the flexible PCB of selecting not have short circuit or open circuit carries out inductance measurement as on-gauge plate to it, and recording the standard inductance value is 22nH; Carry out inductance measurement by the flexible PCB to a plurality of short/open, can record the inductance variation range can not exceed+5% or-5%, therefore setting the inductance change threshold is+5% or-5%, and following table 1 is for to carry out the resulting data of inductance measurement to 100 groups of flexible PCBs to be measured:
Table 1
Standard value | 22nH | ? | ? | ? | ? | ? | ? | ? | ? |
Sequence number | Inductance value | Sequence number | Inductance value | Sequence number | Inductance value | Sequence number | Inductance value | Sequence number | Inductance value |
1 | 22.4 | 21 | 21.9 | 41 | 22.1 | 61 | 21.9 | 81 | 22.3 |
2 | 22.2 | 22 | 22.4 | 42 | 21.7 | 62 | 21.9 | 82 | 22.7 |
3 | 21.7 | 23 | 21.9 | 43 | 21.7 | 63 | 21.9 | 83 | 22.5 |
4 | 21.3 | 24 | 20.6 | 44 | 21.7 | 64 | 22.1 | 84 | 21.9 |
5 | 22.2 | 25 | 22 | 45 | 22.1 | 65 | 21.8 | 85 | 22.3 |
6 | 21.8 | 26 | 21.8 | 46 | 22.6 | 66 | 22 | 86 | 21.9 |
7 | 22.2 | 27 | 21.9 | 47 | 21.6 | 67 | 22.2 | 87 | 22.3 |
8 | 21.6 | 28 | 21.5 | 48 | 21.7 | 68 | 21.5 | 88 | 21.7 |
9 | 21.9 | 29 | 21.6 | 49 | 22.2 | 69 | 22 | 89 | 21.4 |
10 | 22.3 | 30 | 22.3 | 50 | 22.1 | 70 | 21.7 | 90 | 22.5 |
11 | 21.5 | 31 | 22.6 | 51 | 22.5 | 71 | 22.1 | 91 | 21.9 |
12 | 22.1 | 32 | 21.8 | 52 | 22.2 | 72 | 22.3 | 92 | 21.4 |
13 | 21.7 | 33 | 22.1 | 53 | 22.3 | 73 | 21.5 | 93 | 22.1 |
14 | 20.7 | 34 | 21.58 | 54 | 21.8 | 74 | 21.7 | 94 | 22.4 |
15 | 21.5 | 35 | 22.3 | 55 | 22.4 | 75 | 22.2 | 95 | 21.7 |
16 | 21.2 | 36 | 21.6 | 56 | 22.2 | 76 | 21.9 | 96 | 22.5 |
17 | 22.1 | 37 | 21.6 | 57 | 21.7 | 77 | 21.8 | 97 | 21.6 |
18 | 21.7 | 38 | 21.7 | 58 | 21.6 | 78 | 21.6 | 98 | 22.2 |
19 | 21.8 | 39 | 22.1 | 59 | 22.1 | 79 | 22.3 | 99 | 21.9 |
20 | 22.2 | 40 | 21.9 | 60 | 21.8 | 80 | 22.5 | 100 | 22.4 |
In the table 1, compare by inductance value and the inductance change threshold that will record, can judge that the 14th group, the 24th group flexible PCB is short/open, product is defective.
Line short by above-mentioned flexible PCB of the present invention/open test method, when wire is single line and when multi-turn is arranged, circle with enclose between just can test out if there is short circuit.By the test to inductance value, can also measure once short/open, not only test accuracy is high but also testing efficiency is higher.
The above only is preferred embodiment of the present invention, and is in order to limit the present invention, within the spirit and principles in the present invention not all, any modification of doing, is equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (2)
1. the line short of a flexible PCB/open test method may further comprise the steps:
A. the flexible PCB of selecting not have short/open is treated the inductance on survey line road and is measured as on-gauge plate, obtains the standard inductance value;
B. select the flexible PCB of short/open, identical circuit to be measured is carried out inductance measure, obtain the short/open inductance value, relatively draw the inductance change threshold by short/open inductance value and described standard inductance value;
C. select other flexible PCBs to be measured, treat the survey line road and carry out inductance mensuration, obtain measuring inductance value, described mensuration inductance value and described standard inductance value are compared, if exceed described inductance change threshold, then judge described line short/open circuit, do not judge that then described circuit does not have short/open if exceed described inductance change threshold.
2. the line short of flexible PCB according to claim 1/open test method, it is characterized in that: described inductance change threshold is+5% or-5%.
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CN2013102612101A CN103323734A (en) | 2013-06-27 | 2013-06-27 | Circuit short/open testing method of flexible circuit boards |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105717406A (en) * | 2014-12-19 | 2016-06-29 | 波音公司 | Automatic data bus wire integrity verification device |
CN108872830A (en) * | 2018-06-07 | 2018-11-23 | 苏州纳芯微电子股份有限公司 | A kind of single line test method for sensor conditioning chip |
CN109782110A (en) * | 2019-02-19 | 2019-05-21 | 深圳崇达多层线路板有限公司 | A kind of detection line girth sheets whether Duan Lu test method |
CN112858950A (en) * | 2021-01-21 | 2021-05-28 | 深圳市创新云网络科技有限公司 | Short circuit and open circuit detection method for anti-disassembly winding wire of touch screen |
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JPS59214779A (en) * | 1983-05-20 | 1984-12-04 | Mitsubishi Rayon Co Ltd | Detection of short-circuited point for printed circuit board |
JP2001330631A (en) * | 2000-05-24 | 2001-11-30 | Hioki Ee Corp | Circuit board inspecting method and device therefor |
CN101363884A (en) * | 2007-08-10 | 2009-02-11 | 富葵精密组件(深圳)有限公司 | Method for testing circuit board |
CN101581749A (en) * | 2008-05-16 | 2009-11-18 | 北大方正集团有限公司 | Method and system for circuit test of printed circuit board |
CN101846709A (en) * | 2009-03-23 | 2010-09-29 | 友达光电股份有限公司 | Short circuit test board for circuit of flexible circuit board and test method thereof |
CN102129004A (en) * | 2011-01-24 | 2011-07-20 | 苏州瀚瑞微电子有限公司 | Method for testing open circuit on PCB |
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2013
- 2013-06-27 CN CN2013102612101A patent/CN103323734A/en active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS59214779A (en) * | 1983-05-20 | 1984-12-04 | Mitsubishi Rayon Co Ltd | Detection of short-circuited point for printed circuit board |
JP2001330631A (en) * | 2000-05-24 | 2001-11-30 | Hioki Ee Corp | Circuit board inspecting method and device therefor |
CN101363884A (en) * | 2007-08-10 | 2009-02-11 | 富葵精密组件(深圳)有限公司 | Method for testing circuit board |
CN101581749A (en) * | 2008-05-16 | 2009-11-18 | 北大方正集团有限公司 | Method and system for circuit test of printed circuit board |
CN101846709A (en) * | 2009-03-23 | 2010-09-29 | 友达光电股份有限公司 | Short circuit test board for circuit of flexible circuit board and test method thereof |
CN102129004A (en) * | 2011-01-24 | 2011-07-20 | 苏州瀚瑞微电子有限公司 | Method for testing open circuit on PCB |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105717406A (en) * | 2014-12-19 | 2016-06-29 | 波音公司 | Automatic data bus wire integrity verification device |
CN105717406B (en) * | 2014-12-19 | 2020-03-17 | 波音公司 | Automatic data bus line integrity verification device |
US10859637B2 (en) | 2014-12-19 | 2020-12-08 | The Boeing Company | Automatic data bus wire integrity verification device |
CN108872830A (en) * | 2018-06-07 | 2018-11-23 | 苏州纳芯微电子股份有限公司 | A kind of single line test method for sensor conditioning chip |
CN109782110A (en) * | 2019-02-19 | 2019-05-21 | 深圳崇达多层线路板有限公司 | A kind of detection line girth sheets whether Duan Lu test method |
CN112858950A (en) * | 2021-01-21 | 2021-05-28 | 深圳市创新云网络科技有限公司 | Short circuit and open circuit detection method for anti-disassembly winding wire of touch screen |
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Application publication date: 20130925 |