CN103312329A - Correcting method and corrector used for sampling time mismatch of time-interweaving ADC (analog to digital converter) - Google Patents

Correcting method and corrector used for sampling time mismatch of time-interweaving ADC (analog to digital converter) Download PDF

Info

Publication number
CN103312329A
CN103312329A CN2013101954385A CN201310195438A CN103312329A CN 103312329 A CN103312329 A CN 103312329A CN 2013101954385 A CN2013101954385 A CN 2013101954385A CN 201310195438 A CN201310195438 A CN 201310195438A CN 103312329 A CN103312329 A CN 103312329A
Authority
CN
China
Prior art keywords
time
adc
mismatch
channel
interleaved
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN2013101954385A
Other languages
Chinese (zh)
Other versions
CN103312329B (en
Inventor
宁宁
李靖
李天柱
胡勇
王成碧
眭志凌
刘皓
于奇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Electronic Science and Technology of China
Original Assignee
University of Electronic Science and Technology of China
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Electronic Science and Technology of China filed Critical University of Electronic Science and Technology of China
Priority to CN201310195438.5A priority Critical patent/CN103312329B/en
Publication of CN103312329A publication Critical patent/CN103312329A/en
Application granted granted Critical
Publication of CN103312329B publication Critical patent/CN103312329B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Analogue/Digital Conversion (AREA)
  • Compression, Expansion, Code Conversion, And Decoders (AREA)

Abstract

The present invention relates to microelectric techniques, particularly relate to a kind of time-interleaved analog-digital converter (ADC), more particularly to for time-interleaved ADC sampling time mismatch bearing calibration and corrector. Method of the present invention: mainly being made the difference by the numeral output to time-interleaved ADC adjacency channel, and residual quantity Ei [k] is acquired, and characterizes the actual samples time slot between adjacency channel with the mean value Ai after the summation of its absolute value, The standard sample time slot between adjacency channel is characterized, is passed through Each channel sample time mismatch amount is obtained, relative error Bi is filtered through AAR finally and eliminates statistical error, clock generating unit is fed back to after summation and adjusts channel sample clock, to realize the negative-feedback regu- lation of sampling time mismatch. Beneficial effects of the present invention are that can effectively improve and guarantee the performance of the time-interleaved analog-digital converter of multichannel, and have the advantages that complexity is low, hardware spending is small and is easily achieved. Present invention is particularly suitable for high-speed low-power-consumption analog-to-digital conversions.

Description

Bearing calibration and adjuster for time-interleaved ADC sampling time mismatch
Technical field
The present invention relates to microelectric technique, relate to specifically a kind of time-interleaved analog to digital converter (ADC), particularly relate to bearing calibration and adjuster for time-interleaved ADC sampling time mismatch.
Background technology
Along with the continuous progress of integrated circuit fabrication process, at a high speed, the digital circuit of high integration obtained the development of advancing by leaps and bounds, digital signal processing capability constantly strengthens.In order to meet the demand of high-speed digital circuit, the speed that how to improve analog to digital converter becomes the focus that integrated circuit (IC) design person pays close attention to.
A kind of a plurality of analog to digital converters are together in parallel, and the A/D conversion system that utilizes staggered clock that it is taken turns to operate is by extensive concern.Its feature is to be operated in lower frequency in the situation that maintain each sub-adc converter, makes whole speed get a promotion, and therefore is called as time-interleaved analog to digital converter (Time-interleaved ADC).
M channel time interweave analog to digital converter basic structure as shown in Figure 1, each passage comprises a sampling switch and a sub-ADC, operating frequency is f s/ M, by staggered coming of the sampling time by each channel sample switch, make the operating frequency of whole system be increased to f s(work period T s=1/f s), thereby improve the speed of time-interleaved analog to digital converter.
In theory, port number is more, and the operating rate of time-interleaved analog to digital converter is faster.But, in fact, there are the non-ideal factors such as sampling time mismatch (Timing mismatch), gain mismatch (Gain mismatch), imbalance mismatch (Offset mismatch) and bandwidth mismatch (Bandwidth mismatch) between each passage sub-adc converter, had a strong impact on the dynamic property of whole analog to digital converter.
Summary of the invention
Technical problem to be solved by this invention is to propose a kind of bearing calibration and adjuster for time-interleaved ADC sampling time mismatch.
The present invention solves the problems of the technologies described above adopted technical scheme: the bearing calibration for time-interleaved ADC sampling time mismatch, it is characterized in that, and comprise the following steps:
A. time-interleaved ADC is changed input signal;
B. obtain the sampling time gap between adjacency channel ADC according to the numeral output of time-interleaved each passage of ADC;
C. obtain the sampling time gap between all adjacency channel ADC, and obtain the standard sample time slot between adjacency channel ADC according to all sampling time gaps;
D. obtain the amount of mismatch of each channel sample time according to sampling time gap and the standard sample time slot of each passage;
E. amount of mismatch is fed back to clock generating unit, regulate the sampling clock of respective channel.
Concrete, step b also comprises:
B1. the adjacency channel ADC numeral output collected is asked to poor .
Figure BDA00003236463500028
suppose to gather for incoming frequency be f insinusoidal signal x (t), produce each passage numeral and be output as: Y=[y 1[k], y 2[k] ..., y m[k]] (k=1,2 ..., P), the total number of channels that wherein M is time-interleaved ADC, P means the single channel sampling number, to adjacency channel ADC numeral, output asks difference to be: E 1 [ k ] = y 2 [ k ] - y 1 [ k ] E 2 [ k ] = y 3 [ k ] - y 2 [ k ] · · · · · · E M [ k ] = y 1 [ k + 1 ] - y M [ k ] , (k=1,2,…,P);
B2. the difference E to obtaining ithe absolute value summation of [k] is averaged and obtains A i, A ibe characterized by the sampling time gap between adjacency channel ADC, A i = | E i | ‾ = 1 P Σ k = 1 N | E i [ k ] | (i=1,2,…,M)。
Concrete, step c also comprises: to all A isummation is averaged and obtains
Figure BDA00003236463500023
(i=1,2 ..., M), be characterized by the standard sample time slot between adjacency channel ADC.
Concrete, steps d also comprises: to all A iwith
Figure BDA00003236463500025
it is poor to do, and obtains:
B i = A i - A ‾
= | E i | ‾ - 1 4 Σ i = 1 4 | E i | ‾
B ifor the relative error of sampling time gap between adjacency channel ADC and standard sample time slot, i.e. each channel sample time mismatch amount.
Concrete, step e also comprises: by relative error B ieliminate statistical error through cumulative sum replacement module filtered, feed back to vairable delay line after summation and regulate the channel sample clock, realize that the negative feedback of sampling time mismatch is regulated.
Be used for the adjuster of the bearing calibration of time-interleaved ADC sampling time mismatch, comprise time-interleaved ADC, data processing unit, feedback unit and clock unit, described data processing unit is connected with feedback unit with time-interleaved ADC respectively,
Described data processing unit is processed in real time to the output data of time-interleaved ADC, and the data after processing are outputed to feedback unit;
The data that described feedback unit transmits according to data processing unit, carry out feedback operation, and signal feedback is arrived to the clock unit.
Beneficial effect of the present invention is can effectively improve and guarantee the performance of the time-interleaved analog to digital converter of multichannel, and have advantages of that complexity is low, hardware spending is little and be easy to realize.
The accompanying drawing explanation
Fig. 1 is the interweave schematic diagram of analog to digital converter of traditional M channel time;
The schematic flow sheet that Fig. 2 is method of the present invention;
Fig. 3 is the M channel time ADC sample graph that interweaves;
The schematic diagram that Fig. 4 is the time-interleaved analog to digital converter of traditional four-way;
Fig. 5 is the time-interleaved ADC transformation curve of four-way;
Fig. 6 is not for existing the E of sampling time during mismatch i(i=1,2,3,4) distribution map;
There is the E of sampling time during mismatch in Fig. 7 i(i=1,2,3,4) distribution map;
Fig. 8 is A i(i=1,2,3,4) and △ T/T sfunctional relation;
The sampling time mismatch repair loop that Fig. 9 designs for the present invention;
Figure 10 is B ithe analogous diagram restrained after overcorrect;
Figure 11 is the SNR figure before proofreading and correct;
Figure 12 is the SNR figure after proofreading and correct.
Embodiment
Below according to drawings and embodiments, the present invention is described in further detail:
It is poor that the present invention does by the output of the numeral to time-interleaved ADC adjacency channel, tries to achieve residual quantity E i[k], with the average A after its absolute value summation icharacterize the actual samples time slot between adjacency channel,
Figure BDA00003236463500031
characterize the standard sample time slot between adjacency channel, therefore
Figure BDA00003236463500032
obtain each channel sample time mismatch amount, finally by relative error B ieliminate statistical error through AAR filtering, feed back to clock generating unit adjusting channel sample clock after summation, thereby realize the negative feedback adjusting of sampling time mismatch.
The key step of method of the present invention is as shown in Figure 2:
1, incoming frequency is f insinusoidal signal x (t), time-interleaved ADC carries out normal conversion to x (t), produces each passage numeral output Y=[y 1[k], y 2[k] ..., y m[k]] (k=1,2 ..., P) as shown in Figure 3.The total number of channels that wherein M is time-interleaved ADC, P means the single channel sampling number.
2, to adjacency channel ADC numeral output do poor, E 1 [ k ] = y 2 [ k ] - y 1 [ k ] E 2 [ k ] = y 3 [ k ] - y 2 [ k ] · · · · · · E M [ k ] = y 1 [ k + 1 ] - y M [ k ] (k=1,2,…,P);
3, to difference E ithe absolute value summation of [k] is averaged and obtains A i, in order to characterize the sampling time gap between adjacency channel ADC, A i = | E i | ‾ = 1 P Σ k = 1 N | E i [ k ] | (i=1,2,…,M);
4, to all A isummation is averaged and obtains
Figure BDA00003236463500042
Figure BDA00003236463500043
(i=1,2 ..., M), in order to characterize standard sample time slot between adjacency channel ADC;
5, according to the above-mentioned A tried to achieve iwith
Figure BDA00003236463500044
by all A iwith
Figure BDA00003236463500045
it is poor to do,
B i = A i - A ‾
= | E i | ‾ - 1 4 Σ i = 1 4 | E i | ‾
Obtain the relative error B of actual samples time slot and standard sample time slot between adjacency channel ADC ithereby, symbolize each channel sample time mismatch amount.
6, by relative error B ithrough the AAR(cumulative sum, reset) module filtered elimination statistical error, finally feed back to vairable delay line adjusting channel sample clock after summation, thereby realize the negative feedback adjusting of sampling time mismatch.
Embodiment:
The time-interleaved ADC of the four-way of take is example, and as shown in Figure 4, its operation principle is: the sampling that four clocks that produced by DLL are given respectively four passages keeps module, and makes staggered the coming of operating time of the sampling maintenance module of each passage.Passage ADC will sample, and to convert frequency to be f for the output that keeps module s/ 8, the digital word of N position (wherein, f ssample frequency for whole time-interleaved ADC).The output of passage ADC is delivered in multiplexer, and converting the output of each passage ADC to frequency by multiplexer is f s/ 2 N bit digital output.
When interchannel does not exist the sampling time during mismatch, as shown in the solid line of vertical line in Fig. 5.Order:
E 1 [ k ] = y 2 [ k ] - y 1 [ k ] E 2 [ k ] = y 3 [ k ] - y 2 [ k ] E 3 [ k ] = y 4 [ k ] - y 3 [ k ] E 4 [ k ] = y 1 [ k + 1 ] - y 4 [ k ]
Due to life period mismatch not, E ithe distribution of (i=1,2,3,4) should be as shown in Figure 6.According to Statistics, its mean value A i = | E i | ‾ (i=1,2,3,4) should equate.
When life period mismatch △ T, situation shown in dotted lines in Figure 5 for example.The actual samples time of second channel, than ideal time advance, makes the one or two interchannel sampling interval T 1reduce the sampling interval T between the second triple channel 2increase, and its
He is constant the sampling interval of two adjacency channels.Due to T 1reduce E 1will reduce, and cause its mean value A 1also reduce.In contrast, T 2increase can make E 2increase, and cause its mean value A 2also increase.And E 3, E 4because of its sampling interval constant, its mean value A 3, A 4do not change yet.
Simulation result when there is sampling time mismatch △ T in second channel as shown in Figure 7.Comparison diagram 6 and Fig. 7 can find, due to life period mismatch △ T, E 1and E 2with respect to E 3with E 4skew has appearred.
Fig. 8 is by A i(i=1,2,3,4) are depicted as △ T/T sfunction, T wherein sfor the sampling period of time-interleaved ADC.Due to the time mismatch of second channel to A 3, A 4not impact, A 3, A 4remain unchanged.And A 1and A 2respectively along with the variation of △ T, dull increase and reducing.Because A ‾ = 1 4 Σ i = 1 4 A i Remain unchanged, B 1 = A 1 - A ‾ Be less than zero, B 2 = A 2 - A ‾ Be greater than zero,
Figure BDA00003236463500054
with all with
Figure BDA00003236463500056
increase and increase.Visible, the sampling time mismatch can be passed through B icharacterized and quantized.
According to above-mentioned principle, we have proposed a kind of digital Background calibration method of time-interleaved ADC sampling time mismatch.
As shown in Figure 9, by DLL, produce four phase clocks, deliver on each passage ADC via delay cell respectively.Passage ADC carries out sample conversion to simulation output and obtains numeral output y 1[k] (i=1,2,3,4).To adjacency channel numeral output do poor:
E 1 [ k ] = y 2 [ k ] - y 1 [ k ] E 2 [ k ] = y 3 [ k ] - y 2 [ k ] E 3 [ k ] = y 4 [ k ] - y 3 [ k ] E 4 [ k ] = y 1 [ k + 1 ] - y 4 [ k ]
K is the sampling period.To E ibe averaging and obtain
Figure BDA00003236463500058
(i=1,2,3,4), in order to characterize interchannel actual samples time slot.Because
Figure BDA00003236463500059
keep constant, so in order to characterize interchannel standard sample time slot.Therefore, relative error amount characterize and quantized interchannel relative sampling time mismatch.Utilize subsequently the AAR(cumulative sum to reset) module, the filtering statistical error is to B iimpact.Again through the cumulative summation of ACC() module carries out the cumulative sum maintenance to error, output digital code C i(i=1,2,3,4) carry out the time of delay of feedback regulation respective channel delay cell, thereby reduce the sampling time mismatch.
In order to verify this figure adjustment algorithm, utilize Matlab to build behavioral scaling model.Utilize Gaussian Profile (u=0, σ=0.01T s), four-way sampling time mismatch is set and is followed successively by 9.6ps ,-8.2ps, 12.5ps and 5.5ps.
Figure 10 shows that the convergence process of each channel sample mismatch time.At initial time, each passage has maximum amount of mismatch, and along with the carrying out of proofreading and correct, mismatch reduces gradually, finally goes to zero.
Figure 11, Figure 12 are respectively the signal noise harmonic ratio (SNDR) of the time-interleaved ADC before and after proofreading and correct.As shown in figure 11, before correction,
Figure BDA00003236463500061
with
Figure BDA00003236463500062
the frequency place, because the sampling time mismatch causes high-octane harmonic wave, SNDR is only 59.7dB, number of significant digit (ENOB) is 9.62bits; As shown in figure 12, after proofreading and correct, above-mentioned harmonic wave is suppressed fully, and SNDR increases to 73.8dB, and ENOB is 11.96bits.

Claims (6)

1. for the bearing calibration of time-interleaved ADC sampling time mismatch, it is characterized in that, comprise the following steps:
A. time-interleaved ADC is changed input signal;
B. obtain the sampling time gap between adjacency channel ADC according to the numeral output of time-interleaved each passage of ADC;
C. obtain the sampling time gap between all adjacency channel ADC, and obtain the standard sample time slot between adjacency channel ADC according to all sampling time gaps;
D. obtain the amount of mismatch of each channel sample time according to sampling time gap and the standard sample time slot of each passage;
E. amount of mismatch is fed back to clock generating unit, regulate the sampling clock of respective channel.
2. the bearing calibration for time-interleaved ADC sampling time mismatch according to claim 1, is characterized in that, step b also comprises:
B1. to the adjacency channel ADC that collects numeral, output asks poor, suppose collection for incoming frequency be f insinusoidal signal x (t), produce each passage numeral and be output as: Y=[y 1[k], y 2[k] ..., y m[k]] (k=1,2 ..., P), the total number of channels that wherein M is time-interleaved ADC, P means the single channel sampling number, to adjacency channel ADC numeral, output asks difference to be:
E 1 [ k ] = y 2 [ k ] - y 1 [ k ] E 2 [ k ] = y 3 [ k ] - y 2 [ k ] · · · · · · E M [ k ] = y 1 [ k + 1 ] - y M [ k ] , (k=1,2,…,P);
B2. the difference E to obtaining ithe absolute value summation of [k] is averaged and obtains A i, A ibe characterized by the sampling time gap between adjacency channel ADC, A i = | E i | ‾ = 1 P Σ k = 1 N | E i [ k ] | (i=1,2,…,M)。
3. the bearing calibration for time-interleaved ADC sampling time mismatch according to claim 2, is characterized in that, step c also comprises: to all A isummation is averaged and obtains
Figure FDA00003236463400013
(i=1,2 ..., M),
Figure FDA00003236463400014
be characterized by the standard sample time slot between adjacency channel ADC.
4. the bearing calibration for time-interleaved ADC sampling time mismatch according to claim 3, is characterized in that, steps d also comprises: to all A iwith
Figure FDA00003236463400015
it is poor to do, and obtains:
B i = A i - A ‾
= | E i | ‾ - 1 4 Σ i = 1 4 | E i | ‾
B ifor the relative error of sampling time gap between adjacency channel ADC and standard sample time slot, i.e. each channel sample time mismatch amount.
5. the bearing calibration for time-interleaved ADC sampling time mismatch according to claim 4, is characterized in that, step e also comprises: by relative error B ieliminate statistical error through cumulative sum replacement module filtered, feed back to vairable delay line after summation and regulate the channel sample clock.
6. for the adjuster of the bearing calibration of time-interleaved ADC sampling time mismatch as claimed in claim 1, comprise time-interleaved ADC, data processing unit, feedback unit and clock unit, described data processing unit is connected with feedback unit with time-interleaved ADC respectively
Described data processing unit is processed in real time to the output data of time-interleaved ADC, and the data after processing are outputed to feedback unit;
The data that described feedback unit transmits according to data processing unit, carry out feedback operation, and signal feedback is arrived to the clock unit.
CN201310195438.5A 2013-05-23 2013-05-23 Bearing calibration and corrector for time-interleaved ADC sampling time mismatch Active CN103312329B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310195438.5A CN103312329B (en) 2013-05-23 2013-05-23 Bearing calibration and corrector for time-interleaved ADC sampling time mismatch

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310195438.5A CN103312329B (en) 2013-05-23 2013-05-23 Bearing calibration and corrector for time-interleaved ADC sampling time mismatch

Publications (2)

Publication Number Publication Date
CN103312329A true CN103312329A (en) 2013-09-18
CN103312329B CN103312329B (en) 2016-08-10

Family

ID=49137178

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310195438.5A Active CN103312329B (en) 2013-05-23 2013-05-23 Bearing calibration and corrector for time-interleaved ADC sampling time mismatch

Country Status (1)

Country Link
CN (1) CN103312329B (en)

Cited By (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103684456A (en) * 2013-12-04 2014-03-26 电子科技大学 Method for correcting sampling time mismatch
CN103825612A (en) * 2014-01-17 2014-05-28 电子科技大学 Sampling clock mismatch background correction method based on time-to-digital converter
CN103944568A (en) * 2014-04-08 2014-07-23 北京时代民芯科技有限公司 Sampling clock generation circuit for multichannel time interleaving analog-digital converter
CN104901695A (en) * 2015-06-29 2015-09-09 合肥工业大学 Calibrating module for sampling time error of TIADC (Time-interleaved Analog To Digital Converter) and calculating method for calibrating module
CN104901694A (en) * 2015-04-13 2015-09-09 厦门市迅芯电子科技有限公司 High-speed and high-precision analog-to-digital conversion circuit
CN105262487A (en) * 2015-10-22 2016-01-20 合肥工业大学 Calibration module for TIADC system clock mismatch errors and calibration method
CN105871377A (en) * 2016-03-24 2016-08-17 南京天易合芯电子有限公司 Time domain interleaving analog-digital converter sample time mismatch calibration method and system
CN106154907A (en) * 2016-06-15 2016-11-23 北京航空航天大学 A kind of high speed high-accuracy data collection system based on time interleaving sampling
CN106385257A (en) * 2016-10-26 2017-02-08 苏州迅芯微电子有限公司 Calibration algorithm applied to time-interleaved analog-to-digital converter
CN106571823A (en) * 2016-11-10 2017-04-19 电子科技大学 Bandwidth mismatching optimization method for multi-channel time-interleaved analog-to-digital converter
CN103746695B (en) * 2013-12-27 2017-04-19 电子科技大学 Mismatch correction method of time-interleaved analog-to-digital converter inter-channel sampling time
CN106911331A (en) * 2017-02-04 2017-06-30 武汉科技大学 The digit check circuit and real time checking method of time-interleaved type ADC system
CN107911118A (en) * 2017-12-08 2018-04-13 成都聚利中宇科技有限公司 A kind of multi-channel sampling tracking keeps equipment and signal sampling method
CN110311678A (en) * 2019-07-18 2019-10-08 电子科技大学 A kind of time mismatch correcting circuit suitable for time-interleaved analog-digital converter
CN106992783B (en) * 2017-04-06 2019-12-06 电子科技大学 Sampling time mismatch correction method for time-interleaved ADC (analog to digital converter) based on binary search
CN110690902A (en) * 2019-09-25 2020-01-14 电子科技大学 Random truncation-based time-interleaved ADC mismatch optimization method
WO2020097939A1 (en) * 2018-11-16 2020-05-22 华为技术有限公司 Error correction method and time interleaved analog-to-digital converter
US10804919B1 (en) 2019-09-24 2020-10-13 Microsoft Technology Licensing, Llc Dynamic sequential approximation register (SAR) analog-to-digital converter (ADC) (SAR-ADC) clock delay calibration systems and methods
CN112865806A (en) * 2020-12-31 2021-05-28 安徽芯纪元科技有限公司 High-speed ADC parallel-serial conversion circuit
CN113517890A (en) * 2021-07-21 2021-10-19 电子科技大学 Extraction method for sampling time mismatch of time-interleaved ADC (analog to digital converter)
WO2021258987A1 (en) * 2020-06-22 2021-12-30 中兴通讯股份有限公司 Calibration method, calibration apparatus, time interleaved adc, electronic device, and readable medium
CN114244360A (en) * 2021-12-24 2022-03-25 电子科技大学 Analog domain compensation circuit for time-interleaved ADC
EP4068632A4 (en) * 2019-10-31 2023-12-13 Sanechips Technology Co., Ltd. Sampling clock phase mismatch error estimation method and apparatus, and storage medium

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070274607A1 (en) * 2006-04-12 2007-11-29 Jincheng Huang Method of Creating a Reflection Effect in an Image
WO2009098641A1 (en) * 2008-02-06 2009-08-13 Nxp B.V. Signal converter
CN101656538A (en) * 2009-08-21 2010-02-24 北京大学深圳研究生院 Lagrange interpolation method-based time mismatch real time compensation algorithm of time interlace analog digital converter (TIADC) system
CN101674087A (en) * 2009-09-27 2010-03-17 电子科技大学 Method for obtaining channel mismatching error of time alternative ADC system
CN101783683A (en) * 2008-12-29 2010-07-21 英特赛尔美国股份有限公司 Error estimation and correction in a two-channel time-interleaved analog-to-digital converter
CN102291141A (en) * 2011-04-22 2011-12-21 合肥工业大学 Time-interleaved split ADC (Analog-to-Digital Converter) calibration structure without redundant channel and adaptive calibration method thereof

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070274607A1 (en) * 2006-04-12 2007-11-29 Jincheng Huang Method of Creating a Reflection Effect in an Image
WO2009098641A1 (en) * 2008-02-06 2009-08-13 Nxp B.V. Signal converter
CN101783683A (en) * 2008-12-29 2010-07-21 英特赛尔美国股份有限公司 Error estimation and correction in a two-channel time-interleaved analog-to-digital converter
CN101656538A (en) * 2009-08-21 2010-02-24 北京大学深圳研究生院 Lagrange interpolation method-based time mismatch real time compensation algorithm of time interlace analog digital converter (TIADC) system
CN101674087A (en) * 2009-09-27 2010-03-17 电子科技大学 Method for obtaining channel mismatching error of time alternative ADC system
CN102291141A (en) * 2011-04-22 2011-12-21 合肥工业大学 Time-interleaved split ADC (Analog-to-Digital Converter) calibration structure without redundant channel and adaptive calibration method thereof

Cited By (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103684456A (en) * 2013-12-04 2014-03-26 电子科技大学 Method for correcting sampling time mismatch
CN103746695B (en) * 2013-12-27 2017-04-19 电子科技大学 Mismatch correction method of time-interleaved analog-to-digital converter inter-channel sampling time
CN103825612A (en) * 2014-01-17 2014-05-28 电子科技大学 Sampling clock mismatch background correction method based on time-to-digital converter
CN103944568B (en) * 2014-04-08 2017-06-13 北京时代民芯科技有限公司 A kind of sampling clock for the time-interleaved analog-digital converter of multichannel produces circuit
CN103944568A (en) * 2014-04-08 2014-07-23 北京时代民芯科技有限公司 Sampling clock generation circuit for multichannel time interleaving analog-digital converter
CN104901694A (en) * 2015-04-13 2015-09-09 厦门市迅芯电子科技有限公司 High-speed and high-precision analog-to-digital conversion circuit
CN104901694B (en) * 2015-04-13 2019-02-19 厦门市迅芯电子科技有限公司 A kind of high-speed, high precision analog to digital conversion circuit
CN104901695A (en) * 2015-06-29 2015-09-09 合肥工业大学 Calibrating module for sampling time error of TIADC (Time-interleaved Analog To Digital Converter) and calculating method for calibrating module
CN104901695B (en) * 2015-06-29 2017-09-29 合肥工业大学 A kind of calibration module and its calibration method for TIADC sampling time errors
CN105262487A (en) * 2015-10-22 2016-01-20 合肥工业大学 Calibration module for TIADC system clock mismatch errors and calibration method
CN105262487B (en) * 2015-10-22 2018-06-29 合肥工业大学 A kind of calibration module and its calibration method for TIADC system clock mismatch errors
CN105871377A (en) * 2016-03-24 2016-08-17 南京天易合芯电子有限公司 Time domain interleaving analog-digital converter sample time mismatch calibration method and system
CN105871377B (en) * 2016-03-24 2023-06-09 南京天易合芯电子有限公司 Calibration method and system for sampling time mismatch of time domain interleaving analog-to-digital converter
CN106154907A (en) * 2016-06-15 2016-11-23 北京航空航天大学 A kind of high speed high-accuracy data collection system based on time interleaving sampling
CN106154907B (en) * 2016-06-15 2018-08-14 北京航空航天大学 A kind of high speed high-accuracy data collection system based on time interleaving sampling
CN106385257A (en) * 2016-10-26 2017-02-08 苏州迅芯微电子有限公司 Calibration algorithm applied to time-interleaved analog-to-digital converter
CN106571823B (en) * 2016-11-10 2020-03-27 电子科技大学 Multi-channel time-interleaved analog-to-digital converter bandwidth mismatch optimization method
CN106571823A (en) * 2016-11-10 2017-04-19 电子科技大学 Bandwidth mismatching optimization method for multi-channel time-interleaved analog-to-digital converter
CN106911331A (en) * 2017-02-04 2017-06-30 武汉科技大学 The digit check circuit and real time checking method of time-interleaved type ADC system
CN106992783B (en) * 2017-04-06 2019-12-06 电子科技大学 Sampling time mismatch correction method for time-interleaved ADC (analog to digital converter) based on binary search
CN107911118A (en) * 2017-12-08 2018-04-13 成都聚利中宇科技有限公司 A kind of multi-channel sampling tracking keeps equipment and signal sampling method
WO2020097939A1 (en) * 2018-11-16 2020-05-22 华为技术有限公司 Error correction method and time interleaved analog-to-digital converter
US11476861B2 (en) 2018-11-16 2022-10-18 Huawei Technologies Co., Ltd. Error correction method and time-interleaved analog-to-digital converter
CN113016140A (en) * 2018-11-16 2021-06-22 华为技术有限公司 Error correction method and time-interleaved analog-to-digital converter
CN110311678B (en) * 2019-07-18 2021-06-08 电子科技大学 Time mismatch correction circuit suitable for time-interleaved analog-to-digital converter
CN110311678A (en) * 2019-07-18 2019-10-08 电子科技大学 A kind of time mismatch correcting circuit suitable for time-interleaved analog-digital converter
US10804919B1 (en) 2019-09-24 2020-10-13 Microsoft Technology Licensing, Llc Dynamic sequential approximation register (SAR) analog-to-digital converter (ADC) (SAR-ADC) clock delay calibration systems and methods
CN110690902A (en) * 2019-09-25 2020-01-14 电子科技大学 Random truncation-based time-interleaved ADC mismatch optimization method
EP4068632A4 (en) * 2019-10-31 2023-12-13 Sanechips Technology Co., Ltd. Sampling clock phase mismatch error estimation method and apparatus, and storage medium
WO2021258987A1 (en) * 2020-06-22 2021-12-30 中兴通讯股份有限公司 Calibration method, calibration apparatus, time interleaved adc, electronic device, and readable medium
CN112865806A (en) * 2020-12-31 2021-05-28 安徽芯纪元科技有限公司 High-speed ADC parallel-serial conversion circuit
CN113517890A (en) * 2021-07-21 2021-10-19 电子科技大学 Extraction method for sampling time mismatch of time-interleaved ADC (analog to digital converter)
CN114244360A (en) * 2021-12-24 2022-03-25 电子科技大学 Analog domain compensation circuit for time-interleaved ADC
CN114244360B (en) * 2021-12-24 2023-04-25 电子科技大学 Analog domain compensation circuit for time interleaving ADC

Also Published As

Publication number Publication date
CN103312329B (en) 2016-08-10

Similar Documents

Publication Publication Date Title
CN103312329A (en) Correcting method and corrector used for sampling time mismatch of time-interweaving ADC (analog to digital converter)
CN102291141B (en) Time-interleaved split ADC (Analog-to-Digital Converter) calibration structure without redundant channel and adaptive calibration method thereof
CN103825612A (en) Sampling clock mismatch background correction method based on time-to-digital converter
CN103746695A (en) Mismatch correction method of time-interleaved analog-to-digital converter inter-channel sampling time
US9369142B2 (en) Multi-channel time-interleaved analog-to-digital converter
CN102761319B (en) Clock circuit capable of realizing stable duty ratio and phase calibration
CN103281083A (en) Successive approximation fully differential analog-digital converter with figure correction function and processing method thereof
CN104901695A (en) Calibrating module for sampling time error of TIADC (Time-interleaved Analog To Digital Converter) and calculating method for calibrating module
CN104283558B (en) High-speed comparator DC maladjustment digital assistant self-calibration system and control method
CN101783683A (en) Error estimation and correction in a two-channel time-interleaved analog-to-digital converter
CN103392297A (en) Pipelined ADC inter-stage error calibration
CN101192829A (en) A forward error compensation and correction method and device for streamline analog/digital converter
Luo et al. A 0.014 mm 2 10-bit 2GS/s time-interleaved SAR ADC with low-complexity background timing skew calibration
CN105187066B (en) Digital analog converter
US20140062735A1 (en) Asynchronous analog-to-digital converter having adapative reference control
CN106992784B (en) Sampling time mismatch correction method for time-interleaved ADC (analog to digital converter) based on correction direction judgment
CN106341133A (en) Dual-channel time interleaved asynchronous assembly line flash analog-to-digital converter
CN103684456A (en) Method for correcting sampling time mismatch
US8754797B2 (en) Asynchronous analog-to-digital converter having rate control
CN112564703B (en) Front-stage time error correction circuit of multipath time domain interleaved data converter
CN214125272U (en) Interleaved analog to digital converter system
CN100586025C (en) Multiply digital-analog conversion circuit and uses thereof
CN107359877B (en) All-digital blind compensation method for ultra-wideband signal time-interleaved sampling ADC (analog to digital converter)
CN106992783B (en) Sampling time mismatch correction method for time-interleaved ADC (analog to digital converter) based on binary search
CN201374690Y (en) Pipeline analog-to-digital converter

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant