CN103196570A - Measuring device of ultrafast optical pulse time wave form - Google Patents
Measuring device of ultrafast optical pulse time wave form Download PDFInfo
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- CN103196570A CN103196570A CN201310103586XA CN201310103586A CN103196570A CN 103196570 A CN103196570 A CN 103196570A CN 201310103586X A CN201310103586X A CN 201310103586XA CN 201310103586 A CN201310103586 A CN 201310103586A CN 103196570 A CN103196570 A CN 103196570A
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Abstract
A measuring device of an ultrafast optical pulse time wave form achieves a breakthrough of an existing and traditional streak camera based on photovoltaic conversion and provides time resolution with picosecond magnitude, a measurable time span with hundreds of picosecond magnitude and a measurable dynamic range of 10<3>-10<5> at the same time. The device mainly comprises an optical waveguide unit, a pump light system and a reading system of a high dynamic range, wherein a functional layer of the optical waveguide unit adopts an Al<0.24>Ga<0.76>As /GaAs/Al<0.24>Ga<0.76>As/GaAs/Al <0.24>Ga<0.76>As structure. Two GaAs sandwich layers form two arms of a MZ interferometer. The measuring device has the biggest advantages of solving the technical problems that the prior art is hard to provide with a big dynamic range, time resolution and a measurable time span at the same time, and stability and reliability of vacuum devices are bad.
Description
Technical field
The present invention relates to ultrafast pulse and measure, particularly a kind of measurement mechanism of ultrafast optical pulse time waveform.
Background technology
Traditional streak camera mainly by striped manage mutually, high tension circuit, trigger-delay circuit, image capturing system and application software etc. partly form.Its principle of work is: the flashlight scioptics focus on the slit place and form image, carry out opto-electronic conversion at photocathode then, thereby have formed the electron beam of space distribution, accelerate through accelerating net again, focus at focusing electrode and have sent into deflection system.After the electron beam that is accelerated entered deflection system, the scanning voltage of external circuit control is linear decrease from high to low, and the deflection angle of electron beam constantly changes under the scanning voltage effect, expands to space distribution in time.Realize that light signal is converted into electric signal and measures.Yet traditional streak camera is based on the electronic deflection technology, mutual repulsion namely is subjected to the restriction of space charge effect between the electronics of high-speed motion, and along with the increase of signal light intensity, the pulse of record has the broadening phenomenon, when obtaining high time resolution, dynamic range also is restricted.
Technology 1[Tian Jinshou formerly, Wang Tao, full light solid streak camera, patent of invention, publication number: 102364396A] and first technology 2[John E.Heebner, Method For Ultrafast Optical Deflection Enabling Optical Recording Serrated or Grated Lighted Illumination, Patent No:US7587103B2] can reach the temporal resolution of ps magnitude, have high dynamic range simultaneously.But but the Measuring Time span is difficult to break through 100ps, and need be at optical waveguide top layer plating prism wedge array gold film, the technological operation complexity, and coating technique is strict, and the effect of plated film directly has influence on the temporal resolution that can survey flashlight, dynamic range.And simple based on the full striations camera structure of Ma Zehede interference technique and guide technology, when having high time resolution and high dynamic range, but the Measuring Time span also be improved, have in ultrafast diagnostic techniques field widely and to use.
Summary of the invention
The object of the present invention is to provide a kind of ultrafast optical pulse time waveform meter, this device has high dynamic range, high temporal resolution and the high characteristics of time span that can measure.
Technical solution of the present invention is as follows:
A kind of ultrafast optical pulse time waveform meter mainly comprises: the pump light system, and the read-out system of optical waveguide cellular system and high dynamic range, wherein the structure of optical waveguide is
Al
0.24Ga
0.76As/GaAs/Al
0.24Ga
0.76As/GaAs/Al
0.24Ga
0.76As/GaAs substrate, two-layer GaAs sandwich layer constitutes two arms that MZ interferes.The incident of pump light vertical direction, in optical waveguide, be focused into the linear light spot by the coupling column lens, the flashlight glancing incidence is to optical waveguide, and two-layer GaAs sandwich layer is the optical channel of flashlight, and inciding pump light in the optical waveguide and the optical direction of flashlight has certain included angle.When the whole pulse of flashlight is filled in ducting layer, there is not the place of pump light photograph in the optical waveguide sandwich layer, the initial phase difference of two arms of MZ is (2k+1) * π (k is integer), it is zero that flashlight is interfered the back light intensity through MZ, is in the delustring state; The place that the pump light photograph is arranged, because optical non-linear effect, the relative index of refraction of two arms of MZ can change, the energy density of control pump light makes the flashlight of output interfere stack, strengthens after MZ interferes.Process post lens focus on the flashlight in the optical waveguide, because there is an angle in the optical direction of pump light and flashlight, pump light is radiated at the different time sheet of flashlight, the pulse front edge of flashlight part and then interfere enhancing along part for a moment in the different time is measured thereby the waveform in the time domain is converted in the spatial domain.
Described pump light system is short pulse pump light system, and the pumping light wavelength is 776nm～874nm, and energy density is 50uJ/cm
2～300uJ/cm
2
The photon energy of described flashlight is less than the bandwidth of GaAs.
The described angle that incides the optical direction of pump light linear light spot in the optical waveguide and flashlight is 5 degree～60 degree.
Described read-out system is high dynamic range, high-resolution linear array detector.
Of the present invention have advantage to be:
1, the present invention has abandoned the electron-beam deflection system that the traditional streak camera based on the image converter tube technology adopts, employing induces the relative index of refraction of two sandwich layers of optical waveguide to change by pump light control photo-generated carrier, again in conjunction with the MZ interference technique, the measurement of the waveform in the time domain is reproduced in the spatial domain, is the existence of space charge effect thereby eliminated the bottleneck factor that traditional streak camera can't possess high temporal resolution and high dynamic range simultaneously.
2, the device developed of the present invention can provide the temporal resolution that has picosecond magnitude simultaneously, the time span surveyed and 10 of hundred picosecond magnitudes
3-10
5The dynamic range measured.
Description of drawings
Fig. 1 is the fundamental diagram of the novel ultrafast optical pulse time waveform meter of the present invention.
Among the figure:
The flashlight of 1-glancing incidence; 2-post lens; The pump light of 3-vertical incidence; 4-through the pump light of post lens focusing and the angle of the flashlight direction of propagation; 5-focus on the hot spot of the pump light in the optical waveguide by the post lens; 12-high-resolution linear array detector; 14-be used for the post lens that pump light focuses on; 15-optical waveguide.
Fig. 2 is the enlarged drawing of optical waveguide among Fig. 1 (15) structure.
Among the figure:
6-Al
0.24Ga
0.76As; 7-GaAs, of horse pool interferometer; 8-Al
0.24Ga
0.76As;
9-GaAs, another of horse pool interferometer; 10-Al
0.24Ga
0.76As; 11-post lens; 13-substrate GaAs;
Embodiment
Below in conjunction with embodiment and accompanying drawing apparatus of the present invention are further specified, but should not limit protection scope of the present invention with this.
See also Fig. 1 earlier, as seen from the figure, the measurement mechanism of the ultrafast optical pulse time waveform of the present invention.Two waveguide core layer form a Ma Zehede (MZ) interferometer in optical waveguide, and two arms of MZ interferometer are respectively 7 in Fig. 1 and 9.The initial phase difference of two arms of MZ is (2k+1) * π (k is integer), does not add the pump light 3 of vertical incidence, when flashlight 1 passes through the MZ interferometer, reaches the delustring state, and exit end does not have the flashlight outgoing.When adding pump light 3, the pump light 5 that focuses on through post lens 14 impinges perpendicularly in the optical waveguide, and meanwhile, the whole optical pulse time waveform of flashlight 1 flatly is injected into two arms of the MZ interferometer in the optical waveguide.Because nonlinear effect, pump light induces two sandwich layer relatives index of refraction to change, and namely two of the MZ interferometer arms 7 and 9 relative index of refraction change, and the energy density of control pump light makes the flashlight of output interfere stack, and output intensity increases.Because there is an angle in the direction of propagation of pump light and flashlight, pump light is radiated at the different time sheet of flashlight, and the pulse front edge part of flashlight is for a moment interfered enhancing along part in the different time with the back.The time domain waveform of flashlight is converted into the waveform in the spatial domain, is converged by post lens 11 again, surveys by high-resolution linear array detector 12.
The course of work of the present invention is as follows:
Two sandwich layer GaAs structures of optical waveguide form two arms of horse pool interferometer, and flashlight flatly incides in the optical waveguide, and when the whole burst length, waveform was filled in optical waveguide, pump light passed through the post Lens Coupling in optical waveguide.The angle of the hot spot of pump light and the direction of propagation of flashlight is between 5 °～60 °, the initial phase difference of two arms of MZ is (2k+1) * π (k is integer), does not have the place of pump light photograph, when flashlight passes through the MZ interferometer, reach the delustring state, exit end does not have the flashlight outgoing.When having pump light to shine, because nonlinear effect, pump light induces two sandwich layer relatives index of refraction to change, the relative index of refraction that is two arm GaAs of MZ interferometer changes, the energy density of control pump light makes the flashlight of output interfere stack, and output intensity increases.Because there is an angle in the direction of propagation of pump light and flashlight, pump light is radiated at the different time sheet of flashlight, the pulse front edge of flashlight part and then interfere enhancing along part for a moment in the different time is measured thereby the waveform in the time domain is converted in the spatial domain.
Claims (3)
1. the measurement mechanism of a ultrafast optical pulse time waveform, the formation that it is characterized in that this device: the light path at flashlight sets gradually the first post lens (2), the gallium arsenide optical waveguide, the second post lens (11) and high-resolution linear array detector (12), the second post lens (14) are set directly over the gallium arsenide optical waveguide, pump light (3) is focused into a linear light spot (5) through the 3rd post lens (14) and impinges perpendicularly in the described optical waveguide, described linear light spot (5) and linear flashlight the angle of optical direction be θ, described gallium arsenide optical waveguide constitute gallium aluminium arsenic/gallium arsenide/gallium aluminium arsenic/gallium arsenide/gallium aluminium arsenic/gallium arsenide substrate (6,7,8,9,10,13), be specially Al
0.24Ga
0.76As/GaAs/Al
0.24Ga
0.76As/GaAs/Al
0.24Ga
0.76As/GaAs, wherein two-layer GaAs constitutes the sandwich layer (7,9) of two optical waveguides, three layers of Al
0.24Ga
0.76As constitutes the covering (6,8,10) of two optical waveguides respectively, two two arms (7,9) that the GaAs sandwich layer is Ma Zehede (MZ) interferometer.
2. the measurement mechanism of ultrafast optical pulse time waveform according to claim 1 is characterized in that the wavelength coverage of described pump light (3) between 776nm～874nm, and energy density is at 50uJ/cm
2～300uJ/cm
2Between.
3. the measurement mechanism of ultrafast optical pulse time waveform according to claim 1, the angle theta that it is characterized in that the optical direction of described pump light and flashlight is 5 °～60 °.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103837241A (en) * | 2014-03-26 | 2014-06-04 | 中国工程物理研究院激光聚变研究中心 | Laser pulse waveform meter |
| CN104280140A (en) * | 2014-10-09 | 2015-01-14 | 中国科学院上海光学精密机械研究所 | Measurement device for time waveform and signal to noise ratio of single ultrafast pulse |
| CN106444346A (en) * | 2016-10-31 | 2017-02-22 | 中国科学院西安光学精密机械研究所 | Terahertz-driven sub-femtosecond time-resolved streak camera |
| CN106918395A (en) * | 2017-03-28 | 2017-07-04 | 中国工程物理研究院激光聚变研究中心 | A kind of method for diagnosing ultrashort pulse focousing field spatial and temporal distributions characteristic |
| CN109632705A (en) * | 2019-01-15 | 2019-04-16 | 西安文理学院 | Single-shot femtosecond time resolution absorption spectrum measuring apparatus |
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| US4886331A (en) * | 1988-03-17 | 1989-12-12 | Environmental Research Institute Of Michigan | Thermo-optically induced waveguide |
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2013
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103837241A (en) * | 2014-03-26 | 2014-06-04 | 中国工程物理研究院激光聚变研究中心 | Laser pulse waveform meter |
| CN104280140A (en) * | 2014-10-09 | 2015-01-14 | 中国科学院上海光学精密机械研究所 | Measurement device for time waveform and signal to noise ratio of single ultrafast pulse |
| CN106444346A (en) * | 2016-10-31 | 2017-02-22 | 中国科学院西安光学精密机械研究所 | Terahertz-driven sub-femtosecond time-resolved streak camera |
| CN106444346B (en) * | 2016-10-31 | 2018-12-14 | 中国科学院西安光学精密机械研究所 | A kind of sub- femtosecond time resolution streak camera of Terahertz driving |
| CN106918395A (en) * | 2017-03-28 | 2017-07-04 | 中国工程物理研究院激光聚变研究中心 | A kind of method for diagnosing ultrashort pulse focousing field spatial and temporal distributions characteristic |
| CN109632705A (en) * | 2019-01-15 | 2019-04-16 | 西安文理学院 | Single-shot femtosecond time resolution absorption spectrum measuring apparatus |
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|---|---|
| CN103196570B (en) | 2015-05-13 |
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