CN103140770B - 自主校准的磁场传感器和电流传感器 - Google Patents

自主校准的磁场传感器和电流传感器 Download PDF

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Publication number
CN103140770B
CN103140770B CN201180032144.XA CN201180032144A CN103140770B CN 103140770 B CN103140770 B CN 103140770B CN 201180032144 A CN201180032144 A CN 201180032144A CN 103140770 B CN103140770 B CN 103140770B
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China
Prior art keywords
magnetic field
circuit
current
sensor
ref
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Chinese (zh)
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CN103140770A (zh
Inventor
G·M·阿尼利
M·帕斯特尔
安德里亚·阿基比尔
M·卡亚尔
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Lyme Electronics (china) Co Ltd
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Liaisons Electroniques Mecaniques LEM SA
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0017—Means for compensating offset magnetic fields or the magnetic flux to be measured; Means for generating calibration magnetic fields
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G01R33/0029—Treating the measured signals, e.g. removing offset or noise
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G01R33/0035—Calibration of single magnetic sensors, e.g. integrated calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Measuring Magnetic Variables (AREA)
CN201180032144.XA 2010-06-30 2011-06-27 自主校准的磁场传感器和电流传感器 Active CN103140770B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP10168027A EP2402777B1 (en) 2010-06-30 2010-06-30 Autonomously calibrated magnetic field sensor
EP10168027.0 2010-06-30
PCT/IB2011/052817 WO2012001612A1 (en) 2010-06-30 2011-06-27 Autonomously calibrated magnetic field sensor

Publications (2)

Publication Number Publication Date
CN103140770A CN103140770A (zh) 2013-06-05
CN103140770B true CN103140770B (zh) 2015-11-25

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CN201180032144.XA Active CN103140770B (zh) 2010-06-30 2011-06-27 自主校准的磁场传感器和电流传感器

Country Status (5)

Country Link
US (1) US9404991B2 (https=)
EP (1) EP2402777B1 (https=)
JP (1) JP5864566B2 (https=)
CN (1) CN103140770B (https=)
WO (1) WO2012001612A1 (https=)

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CN105093148B (zh) * 2014-05-20 2018-08-21 中国人民解放军63973部队 一种电磁脉冲磁场探头时域校准方法
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CN104459571B (zh) * 2014-12-17 2017-07-07 海伯森技术（深圳）有限公司 基于非晶态合金材料的磁场传感器的驱动电路及其应用方法
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CN105823502B (zh) * 2016-03-14 2018-06-19 深圳怡化电脑股份有限公司 一种传感器老化补偿电路及其方法
JP6724459B2 (ja) * 2016-03-23 2020-07-15 Tdk株式会社 磁気センサ
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JP6734138B2 (ja) * 2016-07-22 2020-08-05 旭化成エレクトロニクス株式会社 電流センサおよび電流センサの制御方法
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CN110542870B (zh) * 2019-08-08 2021-08-24 宁波中车时代传感技术有限公司 霍尔传感器集成芯片灵敏度和零点温漂的补偿电路及方法
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CN112666509B (zh) * 2021-01-04 2024-11-05 中国电力科学研究院有限公司 一种适用于磁敏电流传感器的补偿系统及方法
JP7570248B2 (ja) * 2021-02-12 2024-10-21 株式会社アドバンテスト 磁場発生器の制御装置、試験装置、及び磁場制御方法
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CN101379384A (zh) * 2006-02-03 2009-03-04 皇家飞利浦电子股份有限公司 带有基准单元的磁传感器装置

Also Published As

Publication number Publication date
CN103140770A (zh) 2013-06-05
US9404991B2 (en) 2016-08-02
EP2402777A1 (en) 2012-01-04
WO2012001612A1 (en) 2012-01-05
JP5864566B2 (ja) 2016-02-17
EP2402777B1 (en) 2013-01-09
US20130093412A1 (en) 2013-04-18
JP2013533480A (ja) 2013-08-22

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Effective date of registration: 20200106

Address after: 28 Linhe street, China Linhe Industrial Zone, Shunyi District, Beijing

Patentee after: Lyme Electronics (China) Co., Ltd.

Address before: Fribourg

Patentee before: Lem Liaisons Electron Mec