CN103139492B - 摄像装置、摄像方法以及监视系统 - Google Patents

摄像装置、摄像方法以及监视系统 Download PDF

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Publication number
CN103139492B
CN103139492B CN201210479143.6A CN201210479143A CN103139492B CN 103139492 B CN103139492 B CN 103139492B CN 201210479143 A CN201210479143 A CN 201210479143A CN 103139492 B CN103139492 B CN 103139492B
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China
Prior art keywords
image change
pixel
defect pixel
size
defect
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Expired - Fee Related
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CN201210479143.6A
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English (en)
Chinese (zh)
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CN103139492A (zh
Inventor
入之内明
飞鸟诚
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Hitachi Industry and Control Solutions Co Ltd
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Hitachi Industry and Control Solutions Co Ltd
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/61—Noise processing, e.g. detecting, correcting, reducing or removing noise the noise originating only from the lens unit, e.g. flare, shading, vignetting or "cos4"
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Studio Devices (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
CN201210479143.6A 2011-11-25 2012-11-22 摄像装置、摄像方法以及监视系统 Expired - Fee Related CN103139492B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011256898A JP5696026B2 (ja) 2011-11-25 2011-11-25 撮像装置、撮像方法および監視システム
JP2011-256898 2011-11-25

Publications (2)

Publication Number Publication Date
CN103139492A CN103139492A (zh) 2013-06-05
CN103139492B true CN103139492B (zh) 2016-06-29

Family

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Family Applications (1)

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CN201210479143.6A Expired - Fee Related CN103139492B (zh) 2011-11-25 2012-11-22 摄像装置、摄像方法以及监视系统

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Country Link
US (1) US8988562B2 (enExample)
JP (1) JP5696026B2 (enExample)
CN (1) CN103139492B (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI492621B (zh) * 2012-02-10 2015-07-11 Novatek Microelectronics Corp 適應性影像處理方法及其相關裝置
JP6242230B2 (ja) * 2014-02-12 2017-12-06 オリンパス株式会社 画像処理装置、内視鏡装置、画像処理装置の作動方法及び画像処理プログラム
TWI536319B (zh) * 2014-06-24 2016-06-01 瑞昱半導體股份有限公司 去雜訊方法以及影像系統
JP2017022671A (ja) * 2015-07-15 2017-01-26 ソニー株式会社 撮像装置および撮像方法、並びにプログラム
CN105407348B (zh) * 2015-11-18 2017-07-28 深圳怡化电脑股份有限公司 一种图像传感器的检测方法及系统
US10466576B2 (en) * 2017-10-20 2019-11-05 Himax Technologies Limited Method for controlling projector and associated electronic device
US20190202372A1 (en) * 2018-01-03 2019-07-04 Getac Technology Corporation Vehicular image pickup device and image capturing method
US10812708B2 (en) * 2019-02-22 2020-10-20 Semiconductor Components Industries, Llc Imaging systems with weathering detection pixels
CN112393804B (zh) * 2019-08-02 2022-04-05 杭州海康微影传感科技有限公司 一种图像校正的方法及装置
KR102790004B1 (ko) * 2020-10-12 2025-04-03 삼성전자주식회사 주파수 도메인을 이용한 이미지 센서의 검사 방법 및 이를 수행하는 검사 시스템

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002354340A (ja) * 2001-05-24 2002-12-06 Olympus Optical Co Ltd 撮像装置
JP2004134941A (ja) * 2002-10-09 2004-04-30 Matsushita Electric Ind Co Ltd 信号処理装置、信号処理方法、映像信号処理装置および映像信号処理方法
JP2006121478A (ja) * 2004-10-22 2006-05-11 Canon Inc 撮像装置
JP2006211069A (ja) * 2005-01-26 2006-08-10 Sony Corp 欠陥検出装置および欠陥検出方法、欠陥補正装置および欠陥補正方法、ならびに撮像装置

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09247548A (ja) 1996-03-12 1997-09-19 Toshiba Corp 固体撮像装置
KR100407158B1 (ko) * 2002-02-07 2003-11-28 삼성탈레스 주식회사 적외선 열상장비의 시변결점 보상방법 및 장치
US7446756B2 (en) * 2004-03-22 2008-11-04 Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. Apparatus for controlling the position of a screen pointer with low sensitivity to particle contamination
JP4479373B2 (ja) * 2004-06-28 2010-06-09 ソニー株式会社 イメージセンサ
JP2006245999A (ja) * 2005-03-03 2006-09-14 Konica Minolta Photo Imaging Inc 撮像装置、およびプログラム
JP5631325B2 (ja) * 2009-10-05 2014-11-26 キヤノン株式会社 撮像装置の欠陥検出方法及び撮像装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002354340A (ja) * 2001-05-24 2002-12-06 Olympus Optical Co Ltd 撮像装置
JP2004134941A (ja) * 2002-10-09 2004-04-30 Matsushita Electric Ind Co Ltd 信号処理装置、信号処理方法、映像信号処理装置および映像信号処理方法
JP2006121478A (ja) * 2004-10-22 2006-05-11 Canon Inc 撮像装置
JP2006211069A (ja) * 2005-01-26 2006-08-10 Sony Corp 欠陥検出装置および欠陥検出方法、欠陥補正装置および欠陥補正方法、ならびに撮像装置

Also Published As

Publication number Publication date
US8988562B2 (en) 2015-03-24
JP2013115449A (ja) 2013-06-10
JP5696026B2 (ja) 2015-04-08
US20130135501A1 (en) 2013-05-30
CN103139492A (zh) 2013-06-05

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Owner name: HITACHI INDUSTRIAL CONTROL SOLUTIONS LTD.

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Effective date: 20141127

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Effective date of registration: 20141127

Address after: Hitachi County of Ibaraki City, Japan

Applicant after: HITACHI INDUSTRY AND CONTROL SOLUTIONS, LTD.

Address before: Tokyo, Japan, Japan

Applicant before: Hitachi Ltd.

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CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160629

Termination date: 20171122