CN103107774B - A kind of method improving constant-temperature crystal oscillator frequency stability - Google Patents
A kind of method improving constant-temperature crystal oscillator frequency stability Download PDFInfo
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- CN103107774B CN103107774B CN201310004045.1A CN201310004045A CN103107774B CN 103107774 B CN103107774 B CN 103107774B CN 201310004045 A CN201310004045 A CN 201310004045A CN 103107774 B CN103107774 B CN 103107774B
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Abstract
The invention discloses a kind of method improving constant-temperature crystal oscillator frequency stability, comprise step: S1. is at selected Primary Component position, constant-temperature crystal oscillator inside and sensing point, be bonded on sensing point by temperature sensing line electrode, its other end is connected to computer by data acquisition unit; S2. constant-temperature crystal oscillator is installed and put into insulating box; S3., the temperature range of insulating box and warm variable slope are set, in continuous two circulations, utilize the temperature data of each sensing point of computer recording, corresponding output frequency and current value.The present invention is that the design of high stability constant-temperature crystal oscillator is had laid a good foundation, and makes the designer of constant-temperature crystal oscillator minimizing to the dependence of experience and the design cycle of constant-temperature crystal oscillator is shortened greatly, improving the Stability index of constant-temperature crystal oscillator, ensure designing quality.The method have simple to operate, highly sensitive, precision is good, judge the feature such as accurately and reliably, the constant-temperature crystal oscillator designing high stability for designer provides reliable data.
Description
Technical field
The present invention relates to the constant-temperature crystal oscillator of field of electronic materials, be specifically related to the method for testing that a kind of constant-temperature crystal oscillator internal temperature improves constant-temperature crystal oscillator frequency stability.
Background technology
High stability crystal oscillator is the basis of metering, utilizing thermostat that the temperature of crystal is remained on the crystal oscillator made in certain temperature range is exactly constant-temperature crystal oscillator, the constant-temperature crystal oscillator of high stability uses often in now widely used product, particularly stability be 10E-9 the crystal oscillator of this magnitude of 10E-10, be substantially all constant-temperature crystal oscillator.In order to improve the frequency stability of constant-temperature crystal oscillator, when constant-temperature crystal oscillator designs the heat channel structural design of especially constant-temperature crystal oscillator, accurately understanding the exact temperature of the inner each key point of constant-temperature crystal oscillator, is a direction of industry effort always.
The history of decades has been walked in the design theory of constant-temperature crystal oscillator by China, there is very much progress, but the factors such as the crystal oscillator of design high stability relies on the experience of designer always, studies external sample, theory calculate and individual's sensation, actual test is not done to the constant temperature situation in thermostat, result in the deficiency such as design cost increase, cycle length, technical experience.
Summary of the invention
The technical problem to be solved in the present invention is to provide the method for the actual temperature of the inner several key position of a kind of actual measurement constant-temperature crystal oscillator.
For solving the problems of the technologies described above, the technical solution used in the present invention is: a kind of method improving constant-temperature crystal oscillator frequency stability, comprises the following steps:
S1. at the selected sensing point in constant-temperature crystal oscillator inside, by the electrodes adhere of temperature sensing line one end on sensing point, the other end of temperature sensing line is connected on computer by data acquisition unit, and according to the title of each sensing point of sequence number record of detection line and position;
S2. constant-temperature crystal oscillator is arranged on test fixture, and after connecting digital ammeter and frequency counter, puts it in insulating box;
S3., Range of measuring temp and the probe temperature point of insulating box are set, in this temperature range, the temperature of each sensing point of constant-temperature crystal oscillator are gathered, input computer, record constant-temperature crystal oscillator at the corresponding output frequency of each probe temperature point and current value simultaneously.
Wherein, in described step S1, constant-temperature crystal oscillator covers perforate, the temperature sensing line of test constant-temperature crystal oscillator internal detection point passes and does encapsulation process from this hole, and the electrodes adhere of its one end is on the sensing point of constant-temperature crystal oscillator inside.
Wherein, in described step S1, the sensing point that constant-temperature crystal oscillator inside is selected comprises crystal resonator position, power tube position, thermistor position, variable capacitance diode position and vibration Inductive position, and 2 to 3 points are selected in each position.
Wherein, in described step S1, the number of the sensing point that constant-temperature crystal oscillator inside is selected is determined according to the wire diameter of the size in hole and temperature sensing line.
Wherein, in described step S2, the initial temperature arranging insulating box is 25 DEG C, and constant-temperature crystal oscillator powers up work with this understanding and starts test after 1 hour again.
Wherein, in described step S3, the Range of measuring temp arranging insulating box is-40 DEG C to 85 DEG C, tests from-40 DEG C, the warm variable Rate of setting insulating box.
Wherein, in described step S3, keep when the temperature of insulating box reduces to-40 DEG C first just testing for 30 minutes.
Wherein, in described step S3, probe temperature point is followed successively by-40 DEG C ,-30 DEG C ,-20 DEG C ,-10 DEG C, 0 DEG C, 10 DEG C, 20 DEG C, 30 DEG C, 40 DEG C, 50 DEG C, 60 DEG C, 70 DEG C, 80 DEG C and 85 DEG C; Utilize computer recording constant-temperature crystal oscillator when the data of each probe temperature point, constant-temperature crystal oscillator is kept 30 minutes at-40 DEG C, respectively keeps 15 minutes at other 13 temperature spots.
Wherein, in described step S3, in two-40 DEG C to 85 DEG C test loop, constant-temperature crystal oscillator is tested continuously, and the warm variable Rate of insulating box during retest, can be changed.
The beneficial effect adopting technique scheme to produce is: the present invention is based on electrode detector sampling method, temperature sensing electrode high-temp glue is bonded in constant-temperature crystal oscillator inside, multiple sensing point is formed in constant-temperature crystal oscillator inside, the temperature of each sensing point is read by temperature data acquisition card, and as required to these data analysis, process, determine best crystal resonator position, power tube position, thermistor position, variable capacitance diode position, vibration Inductive position, obtain an optimum thermostat structure like this, make the ambient temperature variable quantity of crystal resonator minimum, the temperature stability of constant-temperature crystal oscillator is best, according to testing the data arrived, temperature compensation device can also be added, makes the temperature stability of constant-temperature crystal oscillator better.The design work of constant-temperature crystal oscillator thermostat is instructed by said process.
The present invention is that the design of high stability constant-temperature crystal oscillator is had laid a good foundation, and makes the designer of constant-temperature crystal oscillator can save a large amount of time, greatly shortens the design cycle of constant-temperature crystal oscillator, ensures designing quality.And have simple to operate, highly sensitive, precision is good, judge the feature such as accurately and reliably, is particularly useful for the constant-temperature crystal oscillator of design stability degree compared with high target.
Accompanying drawing explanation
Fig. 1 is method of testing schematic diagram of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is further detailed explanation.
Material prepares:
(1) experiment constant-temperature crystal oscillator, upper cover is with holes;
(2) constant-temperature crystal oscillator test fixture, during test, constant-temperature crystal oscillator adds electrical testing;
(3) numerical frequency counting and digital ammeter;
(4) 15, temperature sensing line, long 2 to 3 meters of every root, line length is suitable to be suitable for, and be numbered every root line, mark is carried out at online two;
(5) data acquisition board two pieces (model: Agilent34901A or other), temperature data acquisition device one (model: Agilent34970A);
(6) insulating box one, warm variable Rate is controlled;
(7) computer and corresponding software;
(8) power supply and other connecting lines.
Specific embodiment of the invention step comprises:
S1. at the inner selected temperature sensing point of constant-temperature crystal oscillator: the upper cover perforate of constant-temperature crystal oscillator; Select in constant-temperature crystal oscillator inside and comprise crystal resonator position, power tube position, thermistor position, variable capacitance diode position and vibration Inductive position 5 positions, 2 to 3 points are selected in each position, and the number of sensing point is determined according to the wire diameter of the size in hole and temperature sensing line.Because line (sensing point) can have an impact to the temperature field of constant-temperature crystal oscillator inside too much, the internal heat of line (sensing point) constant-temperature crystal oscillator very little may be distributed outward from upper cap bore, all can affect test effect; Open constant-temperature crystal oscillator upper cover, by temperature sensing line through the hole that constant-temperature crystal oscillator covers, with high-temp glue by the electrodes adhere of temperature sensing line on selected sensing point, after bonding, according to the sequence number registration sensing point position of line, cover constant-temperature crystal oscillator upper cover, do the best possible encapsulation process.
Other one end of all temperature sensing lines is all connected on a blocks of data capture card, and its sequence number is registered, record sensing point position and title, by two blocks of data capture card data inserting collectors, turn-on data collector, confirms the correctness of each digital independent; Data acquisition unit is connected to computer, is read the temperature data of each data snooping point by computer.
S2. constant-temperature crystal oscillator is arranged on test fixture, and after connecting digital ammeter and frequency counter, puts it in insulating box; And these equipment are all connected on computer, method of testing schematic diagram as shown in Figure 1.Open insulating box, test fixture, digital frequency meter, digital ammeter, temperature data acquisition device and computer and related software.The initial temperature arranging insulating box is 25 DEG C, and constant-temperature crystal oscillator powers up work with this understanding and starts test after 1 hour again.
S3. the Range of measuring temp arranging insulating box is-40 DEG C to 85 DEG C, and probe temperature point is followed successively by-40 DEG C ,-30 DEG C ,-20 DEG C ,-10 DEG C, 0 DEG C, 10 DEG C, 20 DEG C, 30 DEG C, 40 DEG C, 50 DEG C, 60 DEG C, 70 DEG C, 80 DEG C and 85 DEG C; Test from-40 DEG C, the warm variable Rate of setting insulating box is 1 DEG C/min, keeps just testing for 30 minutes when the temperature of insulating box reduces to-40 DEG C first; Utilize computer acquisition and record constant-temperature crystal oscillator when the temperature of each probe temperature point, output frequency and current value, constant-temperature crystal oscillator being kept 30 minutes at-40 DEG C, respectively keeps 15 minutes at other 13 temperature spots.
For ensureing the accuracy of test data, in two-40 DEG C to 85 DEG C test loop, constant-temperature crystal oscillator is tested continuously, and the warm variable Rate of insulating box during retest, can be changed, such as, be set as 3 DEG C/min, repeat above-mentioned test process, use computer recording corresponding data equally.
S4. as required aggregation process analysis is carried out to every data of computer recording, as drawn time graph, draw the inner best crystal resonator position of constant-temperature crystal oscillator, power tube position, thermistor position, variable capacitance diode position, vibration Inductive position, obtain a best thermostat structure, make the stability of constant-temperature crystal oscillator reach best.
Claims (9)
1. improve a method for constant-temperature crystal oscillator frequency stability, it is characterized in that: said method comprising the steps of:
S1. at the selected sensing point in constant-temperature crystal oscillator inside, by the electrodes adhere of temperature sensing line one end on sensing point, the other end of temperature sensing line is connected on computer by data acquisition unit, and according to the title of each sensing point of sequence number record of detection line and position;
S2. constant-temperature crystal oscillator is arranged on test fixture, and after connecting digital ammeter and frequency counter, puts it in insulating box;
S3., Range of measuring temp and the probe temperature point of insulating box are set, in this temperature range, the temperature of each sensing point of constant-temperature crystal oscillator are gathered, input computer, record constant-temperature crystal oscillator at the corresponding output frequency of each probe temperature point and current value simultaneously;
S4. as required aggregation process analysis is carried out to every data of computer recording, draw time graph, draw the inner best crystal resonator position of constant-temperature crystal oscillator, power tube position, thermistor position, variable capacitance diode position, vibration Inductive position, obtain a best thermostat structure, make the stability of constant-temperature crystal oscillator reach best.
2. a kind of method improving constant-temperature crystal oscillator frequency stability according to claim 1, it is characterized in that: in described step S1, constant-temperature crystal oscillator covers perforate, the temperature sensing line of test constant-temperature crystal oscillator internal detection point passes and does encapsulation process from this hole, and the electrodes adhere of its one end is on the sensing point of constant-temperature crystal oscillator inside.
3. a kind of method improving constant-temperature crystal oscillator frequency stability according to claim 1, it is characterized in that: in described step S1, the sensing point position that constant-temperature crystal oscillator inside is selected comprises crystal resonator position, power tube position, thermistor position, variable capacitance diode position and vibration Inductive position, and 2 to 3 sensing points are selected in each sensing point position.
4. a kind of method improving constant-temperature crystal oscillator frequency stability according to claim 3, is characterized in that: in described step S1, and the number of the sensing point that constant-temperature crystal oscillator inside is selected is determined according to the wire diameter of the size in hole and temperature sensing line.
5. a kind of method improving constant-temperature crystal oscillator frequency stability according to claim 1, is characterized in that: in described step S2, and the initial temperature arranging insulating box is 25 DEG C, and constant-temperature crystal oscillator powers up work with this understanding and starts test after 1 hour again.
6. a kind of method improving constant-temperature crystal oscillator frequency stability according to claim 1, it is characterized in that: in described step S3, the Range of measuring temp arranging insulating box is-40 DEG C to 85 DEG C, tests from-40 DEG C, the warm variable Rate of setting insulating box.
7. a kind of method improving constant-temperature crystal oscillator frequency stability according to claim 6, is characterized in that: in described step S3, keeps just testing for 30 minutes when the temperature of insulating box reduces to-40 DEG C first.
8. a kind of method improving constant-temperature crystal oscillator frequency stability according to claim 6, it is characterized in that: in described step S3, probe temperature point is followed successively by-40 DEG C ,-30 DEG C ,-20 DEG C ,-10 DEG C, 0 DEG C, 10 DEG C, 20 DEG C, 30 DEG C, 40 DEG C, 50 DEG C, 60 DEG C, 70 DEG C, 80 DEG C and 85 DEG C; Utilize computer recording constant-temperature crystal oscillator when the data of each probe temperature point, constant-temperature crystal oscillator is kept 30 minutes at-40 DEG C, respectively keeps 15 minutes at other 13 temperature spots.
9. a kind of method improving constant-temperature crystal oscillator frequency stability according to claim 6, it is characterized in that: in described step S3, in two-40 DEG C to 85 DEG C test loop, constant-temperature crystal oscillator is tested continuously, and the warm variable Rate of insulating box during retest, can be changed.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104467674B (en) * | 2014-12-29 | 2017-11-21 | 电子科技大学 | A kind of voltage controlled temperature compensated crystal oscillator |
| CN106501304B (en) * | 2016-09-30 | 2018-12-07 | 河北远东通信系统工程有限公司 | A kind of determination method of constant-temperature crystal oscillator optimum temperature coefficient point |
| CN107884608B (en) * | 2017-11-02 | 2020-10-23 | 钜泉光电科技(上海)股份有限公司 | Electric energy meter control system and clock correction method |
| CN110907712B (en) * | 2019-12-23 | 2021-11-23 | 贵州航天计量测试技术研究所 | Adapter and test system for testing phase noise of crystal oscillator |
| CN113759187B (en) * | 2021-01-07 | 2023-05-05 | 大唐移动通信设备有限公司 | Method, device and system for detecting frequency hopping failure of crystal oscillation caused by wafer pollution |
| CN114826155B (en) * | 2022-05-05 | 2022-12-30 | 深圳市金科泰通信设备有限公司 | Temperature compensation method, system and terminal equipment |
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| CN201429673Y (en) * | 2009-07-02 | 2010-03-24 | 广州市天马电讯科技有限公司 | Integral test system for crystal oscillator |
| CN102035466A (en) * | 2010-12-22 | 2011-04-27 | 广东大普通信技术有限公司 | Oven controlled crystal oscillator with temperature stability enhancement |
| CN102565530A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automatic measuring instrument for crystal inflection point of oven-controlled crystal oscillator (OCXO) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN201429673Y (en) * | 2009-07-02 | 2010-03-24 | 广州市天马电讯科技有限公司 | Integral test system for crystal oscillator |
| CN102035466A (en) * | 2010-12-22 | 2011-04-27 | 广东大普通信技术有限公司 | Oven controlled crystal oscillator with temperature stability enhancement |
| CN102565530A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automatic measuring instrument for crystal inflection point of oven-controlled crystal oscillator (OCXO) |
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