CN107884608B - Electric energy meter control system and clock correction method - Google Patents
Electric energy meter control system and clock correction method Download PDFInfo
- Publication number
- CN107884608B CN107884608B CN201711082139.5A CN201711082139A CN107884608B CN 107884608 B CN107884608 B CN 107884608B CN 201711082139 A CN201711082139 A CN 201711082139A CN 107884608 B CN107884608 B CN 107884608B
- Authority
- CN
- China
- Prior art keywords
- temperature
- module
- clock
- value
- main chip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R11/00—Electromechanical arrangements for measuring time integral of electric power or current, e.g. of consumption
- G01R11/02—Constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/04—Testing or calibrating of apparatus covered by the other groups of this subclass of instruments for measuring time integral of power or current
-
- G—PHYSICS
- G04—HOROLOGY
- G04F—TIME-INTERVAL MEASURING
- G04F8/00—Apparatus for measuring unknown time intervals by electromechanical means
- G04F8/02—Apparatus for measuring unknown time intervals by electromechanical means using an electromechanical oscillator
Abstract
The invention relates to the technical field of semiconductors, in particular to an electric energy meter control system and a clock correction method, which comprise the following steps: the MEMS crystal oscillator, the temperature sampling module, the clock compensation module, the clock measurement module and the storage module are sealed in the MEMS crystal oscillator; and a clock correction method, comprising: step S1, under a test environment of a first preset temperature value, processing by the processing module to obtain a corresponding temperature value and a frequency compensation value; step S2, increasing the temperature of the main chip to a second preset temperature value, and recording a corresponding temperature value and a frequency compensation value when a fixed value is increased in the process of temperature increase; step S3, adjusting the standard curve according to the recorded temperature compensation value, fitting to form an actual curve of the frequency compensation value corresponding to each temperature value in a preset temperature range, and storing the actual curve in a storage module; the real-time clock of the chip can be conveniently compensated and corrected while the internal encapsulation of the crystal oscillator is realized.
Description
Technical Field
The invention relates to the technical field of integrated circuits, in particular to an internally-sealed MEMS electric energy meter control system and a clock correction method.
Background
An electric energy meter is an instrument for measuring electric energy, also called watt-hour meter, fire meter, kilowatt-hour meter, and refers to instruments for measuring various electric quantities.
The existing electric energy meter control chip generally adopts an external crystal oscillator, because if an internal crystal oscillator is adopted, the crystal oscillator has the defects of large volume, more packaging process flows, more complex clock precision correction, poor long-term stability and the like. Specifically, when the real-time clock of the electric energy meter is inspected and printed, the real-time clock of the internal sealed crystal oscillator chip can meet the requirement of the inspection precision of the clock only through multipoint correction, the requirement on the correction environment is strict, and the temperature needs to be stable for a long time, so that the precision correction of the real-time clock can be carried out. Secondly, the volume of the internal sealed crystal oscillator is relatively large and cannot be packaged in a small packaging chip. Finally, the clock is placed in a low-temperature or high-temperature environment for a long time, so that the clock precision is easy to deteriorate and is difficult to recover.
Disclosure of Invention
Aiming at the problems, the invention provides an electric energy meter control system which comprises a main chip, wherein an MEMS crystal oscillator for generating an initial clock signal is packaged in the main chip; further comprising:
the temperature sampling module is used for collecting the temperature of the main chip and outputting a temperature signal reflecting the temperature;
the clock compensation module is respectively connected with the MEMS crystal oscillator and the temperature sampling module and is used for receiving the initial clock signal and the temperature signal, compensating the initial clock signal according to the temperature signal, outputting a compensation clock signal and outputting the temperature signal;
the clock measurement module is connected with a standard clock module outside the main chip and used for outputting a standard clock signal output by the standard clock module;
a storage module;
the processing module is respectively connected with the clock compensation module, the clock measurement module and the storage module so as to receive and fit the compensation clock signal, the temperature signal and the standard clock signal to form an actual curve of the frequency compensation value corresponding to each temperature value, and the actual curve is stored in the storage module;
the processing module is also connected with an external load module so as to control the operation of the load module according to the clock frequency obtained by the actual curve stored in the storage module.
In the electric energy meter control system, the load module is connected to the processing module through a bus extender.
In the electric energy meter control system, the MEMS crystal oscillator is an MEMS crystal oscillator.
A clock correction method is applied to the electric energy meter control system, wherein a standard curve of the frequency compensation value corresponding to the temperature value within a preset temperature range is prestored in the storage module of the electric energy meter control system; the clock correction method comprises the following steps:
step S1, in a test environment of a first preset temperature value, processing by the processing module to obtain the corresponding temperature value and the frequency compensation value;
step S2, increasing the temperature of the main chip to a second preset temperature value, and recording the corresponding temperature value and the frequency compensation value when a fixed value is increased in the process of temperature increase;
and step S3, adjusting the standard curve according to the recorded temperature compensation value, fitting to form an actual curve of the frequency compensation value corresponding to each temperature value in the preset temperature range, and storing the actual curve in the storage module.
In the clock correction method, in step S2, the specific method for controlling the temperature rise includes:
and controlling the load capacity of the load module to increase at a constant speed, and recording at fixed intervals, so that the temperature value of the main chip is increased by a fixed value compared with the temperature value recorded at the previous time during recording.
In the clock correction method, the preset temperature range is [ -40 ℃,80 ℃ ].
In the clock calibration method, the first preset temperature value is 22 to 24 ℃.
In the clock correction method, the second preset temperature value is 27 to 29 ℃.
Has the advantages that: the electric energy meter control system and the clock correction method provided by the invention can realize crystal oscillator internal sealing and can conveniently compensate and correct the real-time clock of the chip.
Drawings
FIG. 1 is a schematic diagram of an electric energy meter control system according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a clock calibration method according to an embodiment of the present invention.
Detailed Description
The invention is further illustrated with reference to the following figures and examples.
Example one
In a preferred embodiment, as shown in fig. 1, a control system of an electric energy meter is provided, which comprises a main chip, wherein a MEMS crystal oscillator 1 for generating an initial clock signal is packaged in the main chip; the method can also comprise the following steps:
the temperature sampling module 10 is used for collecting the temperature of the main chip and outputting a temperature signal reflecting the temperature;
the clock compensation module 20 is respectively connected with the MEMS crystal oscillator 1 and the temperature sampling module 10, and is used for receiving an initial clock signal and a temperature signal, compensating the initial clock signal according to the temperature signal, outputting a compensation clock signal and simultaneously outputting the temperature signal;
the clock measurement module 30 is connected with a standard clock module outside the main chip and used for outputting a standard clock signal output by the standard clock module;
a storage module 40;
the processing module 50 is respectively connected with the clock compensation module 20, the clock measurement module 30 and the storage module 40, so as to receive and form an actual curve of the frequency compensation value corresponding to each temperature value by fitting according to the compensation clock signal, the temperature signal and the standard clock signal, and store the actual curve in the storage module 40;
the processing module 50 is also connected to an external load module to control the operation of the load module according to the clock frequency to which the actual profile stored in the memory module 40 is applied.
In the above technical solution, the standard clock signal collected by the clock measurement module 30 can be used as a reference, and the compensation clock signal output by the clock compensation module 20 is compared with the standard clock signal, so as to obtain the condition of the MEMS crystal oscillator 1 after temperature compensation; the storage module can also store a standard curve of the frequency compensation value relative to the temperature value, and the actual curve can be obtained by adjusting the standard curve according to the compensation clock signal, the temperature signal and the limited number of temperature values and frequency compensation values acquired by the standard clock signal; the high-precision real-time clock electric energy meter control chip based on the MEMS internal sealing technology can provide very high clock precision within an industrial temperature range, is easy to package on the other side, and has lower packaging cost than a common internal sealing crystal oscillator. Because the MEMS crystal oscillator 1 has smaller volume, the MEMS crystal oscillator can be internally sealed in a small packaged chip, and the key can be closely attached to a chip wafer without influencing the function of the chip. The influence of temperature hysteresis of an electric energy meter control chip of the internally sealed MEMS crystal oscillator 1 is within 0.02ppm, and the influence of severe environment temperature change on clock precision is small, so that the clock precision can be quickly corrected; the technology of the control chip of the internally sealed MEMS crystal oscillator electric energy meter comprises the following steps: the MEMS crystal oscillator 1 is packaged on a wafer of a chip and is in close contact with the wafer through a glue, so as to ensure that the MEMS varies with the environmental change of the wafer of the chip, for example, the temperature collected by the temperature sensor is consistent with the temperature of the MEMS crystal oscillator 1. Because the volume of the MEMS crystal oscillator 1 is small (420 um 380um 120um), the temperature of the MEMS crystal oscillator 1 can respond to the temperature change of the wafer of the chip quickly, so the impact of high and low temperature has little influence on the frequency of the MEMS crystal oscillator. The MEMS driving module is internally provided with a frequency compensation module, and can adjust a frequency compensation value in time so as to output an accurate frequency value.
In a preferred embodiment, the load module may be coupled to the processing module 50 via a bus extender 60.
In a preferred embodiment, the MEMS crystal 1 may be a MEMS (Micro-electro mechanical systems, MEMS) crystal.
Example two
In a preferred embodiment, as shown in fig. 2, a clock calibration method is further provided, wherein the clock calibration method can be applied to the electric energy meter control system shown in fig. 1, and a standard curve of the frequency compensation value corresponding to the temperature value within a preset temperature range can be prestored in the storage module 40 of the electric energy meter control system; the clock correction method may include:
step S1, under a test environment with a first preset temperature value, processing by the processing module 50 to obtain a corresponding temperature value and a frequency compensation value;
step S2, increasing the temperature of the main chip to a second preset temperature value, and recording a corresponding temperature value and a frequency compensation value when a fixed value is increased in the process of temperature increase;
step S3, adjusting the standard curve according to the recorded temperature compensation value, fitting to form an actual curve of the frequency compensation value corresponding to each temperature value within the preset temperature range, and storing the actual curve in the storage module 40.
The clock correction method solves various problems of the internal sealed crystal oscillator in clock correction, so that the technology of the internal sealed crystal oscillator can be applied to the electric energy meter control chip.
In a preferred embodiment, in step S2, the specific method for controlling the temperature rise includes:
and controlling the load capacity of the load module to increase at a constant speed, and recording at fixed intervals, so that the temperature value of the main chip is increased by a fixed value when being recorded compared with the temperature value recorded at the previous time.
In a preferred embodiment, the predetermined temperature range is [ -40 ℃,80 ℃ ] within which a temperature compensation value is required for each temperature value, so that a corresponding clock frequency is provided for each temperature value.
In a preferred embodiment, the first predetermined temperature value may be 22-24 ℃, such as 22 ℃, 23 ℃, or 24 ℃.
In a preferred embodiment, the second predetermined temperature is 27-29 ℃, such as 27 ℃, 28 ℃, or 29 ℃.
In summary, the electric energy meter control system and the clock correction method provided by the present invention include: the device comprises a temperature sampling module, a clock compensation module, a clock measurement module and a storage module; the clock correction method is characterized in that a standard curve of a frequency compensation value corresponding to a temperature value in a preset temperature range is prestored in a storage module of the electric energy meter control system; the clock correction method comprises the following steps: step S1, under a test environment of a first preset temperature value, processing by the processing module to obtain a corresponding temperature value and a frequency compensation value; step S2, increasing the temperature of the main chip to a second preset temperature value, and recording a corresponding temperature value and a frequency compensation value when a fixed value is increased in the process of temperature increase; step S3, adjusting the standard curve according to the recorded temperature compensation value, fitting to form an actual curve of the frequency compensation value corresponding to each temperature value in a preset temperature range, and storing the actual curve in a storage module; the real-time clock of the chip can be conveniently compensated and corrected while the internal encapsulation of the crystal oscillator is realized.
While the specification concludes with claims defining exemplary embodiments of particular structures for practicing the invention, it is believed that other modifications will be made in the spirit of the invention. While the above invention sets forth presently preferred embodiments, these are not intended as limitations.
Various alterations and modifications will no doubt become apparent to those skilled in the art after having read the above description. Therefore, the appended claims should be construed to cover all such variations and modifications as fall within the true spirit and scope of the invention. Any and all equivalent ranges and contents within the scope of the claims should be considered to be within the intent and scope of the present invention.
Claims (7)
1. An electric energy meter control system comprises a main chip and is characterized in that an MEMS crystal oscillator for generating an initial clock signal is packaged in the main chip, and the MEMS crystal oscillator is packaged on a wafer of the main chip and is in close contact with the wafer of the main chip through a colloid; further comprising:
the temperature sampling module is used for collecting the temperature of the main chip and outputting a temperature signal reflecting the temperature;
the clock compensation module is respectively connected with the MEMS crystal oscillator and the temperature sampling module and is used for receiving the initial clock signal and the temperature signal, compensating the initial clock signal according to the temperature signal, outputting a compensation clock signal and outputting the temperature signal;
the clock measurement module is connected with a standard clock module outside the main chip and used for outputting a standard clock signal output by the standard clock module;
a storage module;
the processing module is respectively connected with the clock compensation module, the clock measurement module and the storage module so as to receive and fit the compensation clock signal, the temperature signal and the standard clock signal to form an actual curve of the frequency compensation value corresponding to each temperature value, and the actual curve is stored in the storage module;
the processing module is also connected with an external load module to control the operation of the load module according to the clock frequency obtained by the actual curve stored in the storage module, and the temperature of the main chip is increased by controlling the load capacity of the load module to increase at a constant speed;
the MEMS crystal oscillator further comprises a driving module, and a frequency compensation module is arranged in the driving module.
2. The electric energy meter control system of claim 1, wherein the load module is coupled to the processing module via a bus extender.
3. A clock calibration method applied to the electric energy meter control system according to any one of claims 1 to 2, wherein a standard curve of the frequency compensation value corresponding to the temperature value within a preset temperature range is pre-stored in the storage module of the electric energy meter control system; the clock correction method comprises the following steps:
step S1, in a test environment of a first preset temperature value, processing by the processing module to obtain the corresponding temperature value and the frequency compensation value;
step S2, increasing the temperature of the main chip to a second preset temperature value, and recording the corresponding temperature value and the frequency compensation value when a fixed value is increased in the process of temperature increase;
and step S3, adjusting the standard curve according to the recorded temperature compensation value, fitting to form an actual curve of the frequency compensation value corresponding to each temperature value in the preset temperature range, and storing the actual curve in the storage module.
4. The clock correction method according to claim 3, wherein in step S2, the specific method for controlling the temperature rise is:
and controlling the load capacity of the load module to increase at a constant speed, and recording at fixed intervals, so that the temperature value of the main chip is increased by a fixed value compared with the temperature value recorded at the previous time during recording.
5. The clock correction method of claim 3, wherein the preset temperature range is [ -40 ℃,80 ℃ ].
6. The clock correction method according to claim 3, wherein the first preset temperature value is 22-24 ℃.
7. The clock correction method of claim 3, wherein the second preset temperature value is 27-29 ℃.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711082139.5A CN107884608B (en) | 2017-11-02 | 2017-11-02 | Electric energy meter control system and clock correction method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711082139.5A CN107884608B (en) | 2017-11-02 | 2017-11-02 | Electric energy meter control system and clock correction method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107884608A CN107884608A (en) | 2018-04-06 |
| CN107884608B true CN107884608B (en) | 2020-10-23 |
Family
ID=61779128
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711082139.5A Active CN107884608B (en) | 2017-11-02 | 2017-11-02 | Electric energy meter control system and clock correction method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107884608B (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110729985B (en) * | 2018-07-17 | 2023-04-25 | 中芯国际集成电路制造(北京)有限公司 | Clock signal generation circuit and electronic equipment |
| CN111796235B (en) * | 2020-06-28 | 2022-10-14 | 司浩天 | Assessment method for gateway table with high utilization rate |
| CN111934678B (en) * | 2020-09-28 | 2021-01-05 | 深圳英集芯科技有限公司 | Method for automatically calibrating clock frequency in chip and related product |
| CN112383301B (en) * | 2020-10-16 | 2023-03-24 | 歌尔科技有限公司 | Method and device for calibrating clock frequency of crystal oscillator and electronic equipment |
| CN112229469A (en) * | 2020-10-20 | 2021-01-15 | 苏州工业园区清源华衍水务有限公司 | Remote-transmission valve-controlled water meter |
| CN114089258B (en) * | 2021-11-10 | 2023-12-26 | 河南源网荷储电气研究院有限公司 | Clock acceleration simulation operation method and system for intelligent electric energy meter |
| CN114167343B (en) * | 2021-12-03 | 2023-05-26 | 深圳友讯达科技股份有限公司 | Crystal oscillator frequency adjustment method based on exhaustion intelligent electric meter |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6995622B2 (en) * | 2004-01-09 | 2006-02-07 | Robert Bosh Gmbh | Frequency and/or phase compensated microelectromechanical oscillator |
| JP4379441B2 (en) * | 2006-07-18 | 2009-12-09 | トヨタ自動車株式会社 | Power supply system, vehicle equipped with the same, power storage device temperature rise control method, and computer-readable recording medium storing a program for causing a computer to execute power storage device temperature rise control |
| CN101303401B (en) * | 2008-07-01 | 2010-06-23 | 威胜集团有限公司 | RTC regulating apparatus of electrical energy meter and RTC automatic compensation correcting method |
| CN101769990B (en) * | 2008-12-26 | 2012-06-20 | 鸿富锦精密工业（深圳）有限公司 | System and method for testing temperature rising characteristic of motor |
| CN201788227U (en) * | 2010-09-01 | 2011-04-06 | 宁波三星电气股份有限公司 | Electric energy meter |
| CN102176112B (en) * | 2010-11-29 | 2013-04-24 | 江苏林洋电子股份有限公司 | Method for achieving accurate clock timing by arranging RTC (real time clock) in MCU (micro control unit) |
| CN102435975B (en) * | 2011-11-07 | 2015-01-21 | 中国电力科学研究院 | Clock calibration method of intelligent cost control electric energy meter |
| JP5306512B1 (en) * | 2012-04-27 | 2013-10-02 | ラピスセミコンダクタ株式会社 | Semiconductor device, measuring instrument, and correction method |
| CN202676805U (en) * | 2012-06-18 | 2013-01-16 | 沈阳时尚实业有限公司 | Electric energy meter integrated with high precision real time clock |
| JP6081286B2 (en) * | 2012-07-09 | 2017-02-15 | 日本電波工業株式会社 | Crystal oscillator with temperature chamber |
| CN202918242U (en) * | 2012-09-12 | 2013-05-01 | 无锡华润矽科微电子有限公司 | High precision digital temperature compensation oscillator circuit structure with built-in crystal oscillator |
| CN103107774B (en) * | 2013-01-07 | 2016-01-20 | 河北远东通信系统工程有限公司 | A kind of method improving constant-temperature crystal oscillator frequency stability |
| CN104218891A (en) * | 2013-06-05 | 2014-12-17 | 上海华虹集成电路有限责任公司 | Closed-loop temperature compensation device for clock crystal oscillator |
| CN103499803B (en) * | 2013-09-09 | 2015-09-09 | 扬州万泰电子科技有限公司 | A kind of method improving precision of built-in real-time clock of electric energy meter MCU |
| CN204086515U (en) * | 2014-06-26 | 2015-01-07 | 珠海中慧微电子有限公司 | For the multifunction timepiece tester that electric energy meter detects |
| CN106154135B (en) * | 2015-04-10 | 2019-01-18 | 上海贝岭股份有限公司 | A kind of calibrated tester and method of interior envelope crystal oscillator chip |
| CN205384318U (en) * | 2015-12-24 | 2016-07-13 | 珠海中慧微电子股份有限公司 | Clock circuit of electric energy meter |
-
2017
- 2017-11-02 CN CN201711082139.5A patent/CN107884608B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN107884608A (en) | 2018-04-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107884608B (en) | Electric energy meter control system and clock correction method | |
| US7674035B2 (en) | Digital temperature sensors and calibration thereof | |
| CN101750170B (en) | Calibration system and calibration method of temperature sensor chip | |
| US20150106048A1 (en) | Method for detecting power interruption duration of an electronic device | |
| EP3239673B1 (en) | Semiconductor device, temperature sensor and power supply voltage monitor | |
| CN103234689A (en) | Circuit of high-accuracy pressure transmitter | |
| CN106154135B (en) | A kind of calibrated tester and method of interior envelope crystal oscillator chip | |
| CN104678340A (en) | Measuring error correction method and system for magnetometer | |
| CN113503988A (en) | Temperature sensor calibration method and system and temperature sensor | |
| CN104970776A (en) | Body temperature detection method and high-precision dynamic calibration electronic thermometer device | |
| CN212253981U (en) | Temperature test and compensation system of strain sensor | |
| US10298210B2 (en) | Apparatus and method for temperature measurement and/or calibration via resonant peaks in an oscillator | |
| CN114035024A (en) | System and method for testing real-time clock chip | |
| US7490025B2 (en) | Integrated circuit with self-proofreading function, measuring device using the same and method for self-recording parameter | |
| CN105258767A (en) | High precision weighing system of electronic balance | |
| US20200271535A1 (en) | Sensor module, sensor system, and abnormality determination method of inertial sensor | |
| JP2000338193A (en) | Integrated circuit, and physical quantity detecting system | |
| CN107621610B (en) | Device and method for measuring internal resistance of storage battery | |
| JPS61112938A (en) | Compensation circuit of semiconductive pressure sensor | |
| CN105784210A (en) | Measuring method of MEMS device residual stress and system thereof | |
| CN102506966B (en) | Correcting device for flow system | |
| CN216246925U (en) | MEMS pressure sensor chip capable of reducing output drift | |
| CN112198915B (en) | Satellite double-super-platform magnetic levitation electric drive temperature compensation method and system | |
| CN117346827A (en) | Intelligent signal processing method of sensing chip and sensing chip | |
| Maudie et al. | Challenges of MEMS device characterization in engineering development and final manufacturing |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |