CN103107774A - Method capable of improving constant temperature crystal oscillator frequency stability - Google Patents
Method capable of improving constant temperature crystal oscillator frequency stability Download PDFInfo
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- CN103107774A CN103107774A CN2013100040451A CN201310004045A CN103107774A CN 103107774 A CN103107774 A CN 103107774A CN 2013100040451 A CN2013100040451 A CN 2013100040451A CN 201310004045 A CN201310004045 A CN 201310004045A CN 103107774 A CN103107774 A CN 103107774A
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Abstract
The invention discloses a method capable of improving constant temperature crystal oscillator frequency stability. The method capable of improving constant temperature crystal oscillator frequency stability comprises the following steps: 1.choosing key device positions and testing points inside the constant temperature crystal oscillator, attaching temperature testing wire electrodes to the testing points, the other end of the temperature testing wire is connected with a computer through a data collecting device, 2.installing the constant temperature crystal oscillator and placing the constant temperature crystal oscillator into a constant temperature box, 3.and setting temperature range and temperature change slope of the constant temperature box, and recording temperature data, corresponding output frequencies and current values of all the testing points. The method capable of improving the constant temperature crystal oscillator frequency stability lays a good foundation for the design of the constant temperature crystal oscillator with high stability, so that reliance on experience of a constant temperature crystal oscillator designer is weakened, a design cycle of the constant temperature crystal oscillator is greatly shortened, stability index of the constant temperature crystal oscillator is improved, and design quality is guaranteed. The method capable of improving the constant temperature crystal oscillator frequency stability is easy to operate, high in sensitivity, high in accuracy, accurate and reliable in judgment and the like, and reliable data is provided for the designer to design constant temperature crystal oscillator with high stability .
Description
Technical field
The present invention relates to the constant-temperature crystal oscillator of field of electronic materials, be specifically related to the method for testing that a kind of constant-temperature crystal oscillator internal temperature improves the constant-temperature crystal oscillator frequency stability.
Background technology
The high stability crystal oscillator is the basis of metering, utilizing thermostat that the temperature of crystal is remained on the crystal oscillator of making in certain temperature range is exactly constant-temperature crystal oscillator, the constant-temperature crystal oscillator of high stability is to use often in now widely used product, particularly stability be 10E-9 the crystal oscillator of this magnitude of 10E-10, be substantially all constant-temperature crystal oscillator.In order to improve the frequency stability of constant-temperature crystal oscillator, when constant-temperature crystal oscillator designs the heat channel structural design of constant-temperature crystal oscillator especially, accurately understand the definite temperature of inner each key point of constant-temperature crystal oscillator, be a direction of industry effort always.
The history of decades is being walked by China aspect the design theory of constant-temperature crystal oscillator, very much progress is arranged, but the crystal oscillator of design high stability relies on the factors such as the external sample of designer's experience, research, theoretical calculating and individual's sensation always, constant temperature situation in thermostat is not done actual test, caused the deficiencies such as design cost increase, cycle length, technical experience.
Summary of the invention
The technical problem to be solved in the present invention is to provide the method for the actual temperature of the inner several key positions of a kind of actual measurement constant-temperature crystal oscillator.
For solving the problems of the technologies described above, the technical solution used in the present invention is: a kind of method that improves the constant-temperature crystal oscillator frequency stability comprises the following steps:
S1. at the inner selected sensing point of constant-temperature crystal oscillator, the electrode of temperature sensing line one end is bonded on sensing point, the other end of temperature sensing line is connected on computer by data acquisition unit, and title and the position of recording each sensing point according to the sequence number of surveying line;
S2. constant-temperature crystal oscillator is arranged on test fixture, and after connecting digital ammeter and frequency counter, puts it in insulating box;
S3., Range of measuring temp and the probe temperature point of insulating box are set, in this temperature range, the temperature of each sensing point of constant-temperature crystal oscillator are gathered, input computer records constant-temperature crystal oscillator simultaneously at the corresponding output frequency of each probe temperature point and current value.
Wherein, in described step S1, cover perforate on constant-temperature crystal oscillator, the temperature sensing line of the inner sensing point of test constant-temperature crystal oscillator passes and does encapsulation process from this hole, and the electrode of one end is bonded on the sensing point of constant-temperature crystal oscillator inside.
Wherein, in described step S1, the inner selected sensing point of constant-temperature crystal oscillator comprises crystal resonator position, power tube position, thermistor position, variable capacitance diode position and vibration inductance position, and 2 to 3 points are selected in each position.
Wherein, in described step S1, the number of the inner sensing point of selecting of constant-temperature crystal oscillator is determined according to the size in hole and the wire diameter of temperature sensing line.
Wherein, in described step S2, the initial temperature that insulating box is set is 25 ℃, and constant-temperature crystal oscillator powers up with this understanding work and begins test after 1 hour again.
Wherein, in described step S3, the Range of measuring temp that insulating box is set is-40 ℃ to 85 ℃, begins test, the warm variable Rate of setting insulating box from-40 ℃.
Wherein, in described step S3, when reducing to-40 ℃ first, the temperature of insulating box keeps just doing in 30 minutes test.
Wherein, in described step S3, the probe temperature point is followed successively by-40 ℃ ,-30 ℃ ,-20 ℃ ,-10 ℃, 0 ℃, 10 ℃, 20 ℃, 30 ℃, 40 ℃, 50 ℃, 60 ℃, 70 ℃, 80 ℃ and 85 ℃; Utilize the computer recording constant-temperature crystal oscillator when the data of each probe temperature point, constant-temperature crystal oscillator was kept 30 minutes at-40 ℃, respectively kept 15 minutes at other 13 temperature spots.
Wherein, in described step S3, in two-40 ℃ to 85 ℃ test loop, constant-temperature crystal oscillator is tested continuously, and can be changed the warm variable Rate of insulating box during retest.
the beneficial effect that adopts technique scheme to produce is: the present invention is based on the electrode detector sampling method, the temperature sensing electrode is bonded in constant-temperature crystal oscillator inside with high-temp glue, at a plurality of sensing points of the inner formation of constant-temperature crystal oscillator, read the temperature of each sensing point by the temperature data acquisition card, and as required to these data analysis, process, determine best crystal resonator position, the power tube position, the thermistor position, the variable capacitance diode position, vibration inductance position, obtain like this thermostat structure of an optimum, make the ambient temperature variable quantity of crystal resonator minimum, the temperature stability of constant-temperature crystal oscillator is best, the data that can also arrive according to test add the temperature compensating device, make the temperature stability of constant-temperature crystal oscillator better.Instruct the design work of constant-temperature crystal oscillator thermostat by said process.
The present invention is that the design of high stability constant-temperature crystal oscillator is had laid a good foundation, and makes the designer of constant-temperature crystal oscillator can save a large amount of time, greatly shortens the design cycle of constant-temperature crystal oscillator, guarantees designing quality.And have simple to operate, highly sensitive, precision is good, judge and to wait accurately and reliably characteristics, is particularly useful for the design stability degree than the constant-temperature crystal oscillator of high target.
Description of drawings
Fig. 1 is method of testing schematic diagram of the present invention.
Embodiment
The present invention is further detailed explanation below in conjunction with the drawings and specific embodiments.
Material is prepared:
(1) constant-temperature crystal oscillator is used in experiment, and upper cover is with holes;
(2) constant-temperature crystal oscillator test fixture, during test, constant-temperature crystal oscillator adds electrical testing;
(3) numerical frequency counting and digital ammeter;
(4) the temperature sensing line is 15, and every long 2 to 3 meters, and line length is suitable to be suitable for, and every line is numbered, and mark is carried out at online two;
(5) two of data acquisition board (model: Agilent 34901A or other), (model: Agilent34970A) of temperature data acquisition device;
(6) insulating box is one, and warm variable Rate is controlled;
(7) computer and corresponding software;
(8) power supply and other connecting lines.
Concrete implementation step of the present invention comprises:
S1. at the inner selected temperature sensing point of constant-temperature crystal oscillator: the upper cover perforate of constant-temperature crystal oscillator; In inner selected crystal resonator position, power tube position, thermistor position, variable capacitance diode position and the vibration position, 5 of positions of inductance of comprising of constant-temperature crystal oscillator, 2 to 3 points are selected in each position, and the number of sensing point is determined according to the size in hole and the wire diameter of temperature sensing line.Because line (sensing point) can exert an influence to the temperature field of constant-temperature crystal oscillator inside too much, line (sensing point) internal heat of constant-temperature crystal oscillator very little may distribute outward from the upper cover hole, all can affect the test effect; Open the constant-temperature crystal oscillator upper cover, the temperature sensing line is passed the hole that covers on constant-temperature crystal oscillator, be bonded on selected sensing point with the electrode of high-temp glue with the temperature sensing line, after bonding, sequence number registration sensing point position according to line covers the constant-temperature crystal oscillator upper cover, and encapsulation process does the best possible.
An other end of all temperature sensing lines all is connected on a blocks of data capture card, and its sequence number is registered, record sensing point position and title, on two blocks of data capture card data inserting collectors, the turn-on data collector is confirmed the correctness that each data reads; Data acquisition unit is connected to computer, reads the temperature data of each data snooping point by computer.
S2. constant-temperature crystal oscillator is arranged on test fixture, and after connecting digital ammeter and frequency counter, puts it in insulating box; And these equipment all are connected on computer method of testing schematic diagram as shown in Figure 1.Open insulating box, test fixture, digital frequency meter, digital ammeter, temperature data acquisition device and computer and related software.The initial temperature that insulating box is set is 25 ℃, and constant-temperature crystal oscillator powers up with this understanding work and begins test after 1 hour again.
S3., the Range of measuring temp that insulating box is set is-40 ℃ to 85 ℃, and the probe temperature point is followed successively by-40 ℃ ,-30 ℃ ,-20 ℃ ,-10 ℃, 0 ℃, 10 ℃, 20 ℃, 30 ℃, 40 ℃, 50 ℃, 60 ℃, 70 ℃, 80 ℃ and 85 ℃; Begin to test from-40 ℃, the warm variable Rate of setting insulating box is 1 ℃/min, keeps just doing in 30 minutes test when the temperature of insulating box is reduced to-40 ℃ first; Utilize computer acquisition and record constant-temperature crystal oscillator when the temperature of each probe temperature point, output frequency and current value, constant-temperature crystal oscillator was kept 30 minutes at-40 ℃, respectively kept 15 minutes at other 13 temperature spots.
For guaranteeing the accuracy of test data, in two-40 ℃ to 85 ℃ test loop, constant-temperature crystal oscillator is tested continuously, and can be changed the warm variable Rate of insulating box during retest, for example be set as 3 ℃/min, repeat above-mentioned test process, use equally the computer recording corresponding data.
S4. as required every data of computer recording are carried out the aggregation process analysis, as draw time graph, draw constant-temperature crystal oscillator inner best crystal resonator position, power tube position, thermistor position, variable capacitance diode position, vibration inductance position, obtain the thermostat structure an of the best, make the stability of constant-temperature crystal oscillator reach best.
Claims (9)
1. method that improves the constant-temperature crystal oscillator frequency stability is characterized in that: said method comprising the steps of:
S1. at the inner selected sensing point of constant-temperature crystal oscillator, the electrode of temperature sensing line one end is bonded on sensing point, the other end of temperature sensing line is connected on computer by data acquisition unit, and title and the position of recording each sensing point according to the sequence number of surveying line;
S2. constant-temperature crystal oscillator is arranged on test fixture, and after connecting digital ammeter and frequency counter, puts it in insulating box;
S3., Range of measuring temp and the probe temperature point of insulating box are set, in this temperature range, the temperature of each sensing point of constant-temperature crystal oscillator are gathered, input computer records constant-temperature crystal oscillator simultaneously at the corresponding output frequency of each probe temperature point and current value.
2. a kind of method that improves the constant-temperature crystal oscillator frequency stability according to claim 1, it is characterized in that: in described step S1, cover perforate on constant-temperature crystal oscillator, the temperature sensing line of the inner sensing point of test constant-temperature crystal oscillator passes and does encapsulation process from this hole, the electrode of one end is bonded on the sensing point of constant-temperature crystal oscillator inside.
3. a kind of method that improves the constant-temperature crystal oscillator frequency stability according to claim 1, it is characterized in that: in described step S1, the inner selected sensing point of constant-temperature crystal oscillator comprises crystal resonator position, power tube position, thermistor position, variable capacitance diode position and vibration inductance position, and 2 to 3 points are selected in each position.
4. a kind of method that improves the constant-temperature crystal oscillator frequency stability according to claim 3 is characterized in that: in described step S1, the number of the inner selected sensing point of constant-temperature crystal oscillator is determined according to the size in hole and the wire diameter of temperature sensing line.
5. a kind of method that improves the constant-temperature crystal oscillator frequency stability according to claim 1, it is characterized in that: in described step S2, the initial temperature that insulating box is set is 25 ℃, constant-temperature crystal oscillator powers up with this understanding work and begins test after 1 hour again.
6. a kind of method that improves the constant-temperature crystal oscillator frequency stability according to claim 1, it is characterized in that: in described step S3, the Range of measuring temp that insulating box is set is-40 ℃ to 85 ℃, begins test from-40 ℃, sets the warm variable Rate of insulating box.
7. a kind of method that improves the constant-temperature crystal oscillator frequency stability according to claim 6, is characterized in that: in described step S3, keep just doing in 30 minutes test when the temperature of insulating box is reduced to-40 ℃ first.
8. a kind of method that improves the constant-temperature crystal oscillator frequency stability according to claim 6, it is characterized in that: in described step S3, the probe temperature point is followed successively by-40 ℃ ,-30 ℃ ,-20 ℃ ,-10 ℃, 0 ℃, 10 ℃, 20 ℃, 30 ℃, 40 ℃, 50 ℃, 60 ℃, 70 ℃, 80 ℃ and 85 ℃; Utilize the computer recording constant-temperature crystal oscillator when the data of each probe temperature point, constant-temperature crystal oscillator was kept 30 minutes at-40 ℃, respectively kept 15 minutes at other 13 temperature spots.
9. a kind of method that improves the constant-temperature crystal oscillator frequency stability according to claim 6, it is characterized in that: in described step S3, in two-40 ℃ to 85 ℃ test loop, constant-temperature crystal oscillator is tested continuously, and can be changed the warm variable Rate of insulating box during retest.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104467674A (en) * | 2014-12-29 | 2015-03-25 | 电子科技大学 | Voltage-controlled temperature compensation crystal oscillator |
| CN106501304A (en) * | 2016-09-30 | 2017-03-15 | 河北远东通信系统工程有限公司 | A kind of determination method of constant-temperature crystal oscillator optimum temperature coefficient point |
| CN107884608A (en) * | 2017-11-02 | 2018-04-06 | 钜泉光电科技(上海)股份有限公司 | A kind of electric energy meter control system and clock correction method |
| CN110907712A (en) * | 2019-12-23 | 2020-03-24 | 贵州航天计量测试技术研究所 | Adapter and test system for testing phase noise of crystal oscillator |
| CN113759187A (en) * | 2021-01-07 | 2021-12-07 | 大唐移动通信设备有限公司 | Method, device and system for detecting frequency hopping failure of crystal oscillator caused by wafer pollution |
| CN114826155A (en) * | 2022-05-05 | 2022-07-29 | 深圳市金科泰通信设备有限公司 | Temperature compensation method, system and terminal equipment |
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| CN201429673Y (en) * | 2009-07-02 | 2010-03-24 | 广州市天马电讯科技有限公司 | Integral test system for crystal oscillator |
| CN102035466A (en) * | 2010-12-22 | 2011-04-27 | 广东大普通信技术有限公司 | Oven controlled crystal oscillator with temperature stability enhancement |
| CN102565530A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automatic measuring instrument for crystal inflection point of oven-controlled crystal oscillator (OCXO) |
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| CN201429673Y (en) * | 2009-07-02 | 2010-03-24 | 广州市天马电讯科技有限公司 | Integral test system for crystal oscillator |
| CN102035466A (en) * | 2010-12-22 | 2011-04-27 | 广东大普通信技术有限公司 | Oven controlled crystal oscillator with temperature stability enhancement |
| CN102565530A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automatic measuring instrument for crystal inflection point of oven-controlled crystal oscillator (OCXO) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104467674A (en) * | 2014-12-29 | 2015-03-25 | 电子科技大学 | Voltage-controlled temperature compensation crystal oscillator |
| CN104467674B (en) * | 2014-12-29 | 2017-11-21 | 电子科技大学 | A kind of voltage controlled temperature compensated crystal oscillator |
| CN106501304A (en) * | 2016-09-30 | 2017-03-15 | 河北远东通信系统工程有限公司 | A kind of determination method of constant-temperature crystal oscillator optimum temperature coefficient point |
| CN106501304B (en) * | 2016-09-30 | 2018-12-07 | 河北远东通信系统工程有限公司 | A kind of determination method of constant-temperature crystal oscillator optimum temperature coefficient point |
| CN107884608A (en) * | 2017-11-02 | 2018-04-06 | 钜泉光电科技(上海)股份有限公司 | A kind of electric energy meter control system and clock correction method |
| CN110907712A (en) * | 2019-12-23 | 2020-03-24 | 贵州航天计量测试技术研究所 | Adapter and test system for testing phase noise of crystal oscillator |
| CN113759187A (en) * | 2021-01-07 | 2021-12-07 | 大唐移动通信设备有限公司 | Method, device and system for detecting frequency hopping failure of crystal oscillator caused by wafer pollution |
| CN114826155A (en) * | 2022-05-05 | 2022-07-29 | 深圳市金科泰通信设备有限公司 | Temperature compensation method, system and terminal equipment |
| CN114826155B (en) * | 2022-05-05 | 2022-12-30 | 深圳市金科泰通信设备有限公司 | Temperature compensation method, system and terminal equipment |
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