CN102999405A - 电脑主板测试装置及测试方法 - Google Patents
电脑主板测试装置及测试方法 Download PDFInfo
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- CN102999405A CN102999405A CN2011102750494A CN201110275049A CN102999405A CN 102999405 A CN102999405 A CN 102999405A CN 2011102750494 A CN2011102750494 A CN 2011102750494A CN 201110275049 A CN201110275049 A CN 201110275049A CN 102999405 A CN102999405 A CN 102999405A
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- 238000012360 testing method Methods 0.000 title claims abstract description 75
- 238000000034 method Methods 0.000 title description 3
- 230000015654 memory Effects 0.000 claims abstract description 37
- 238000010998 test method Methods 0.000 claims description 14
- 230000002950 deficient Effects 0.000 claims description 12
- 230000007257 malfunction Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000004088 simulation Methods 0.000 description 1
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Abstract
Description
电脑主板测试装置 | 100 |
电脑主板 | 200 |
内存通道 | 210 |
插槽 | 211 |
CPU | 250 |
存储器 | 110 |
开关芯片 | 130 |
输入引脚 | 131 |
输出引脚 | 132 |
控制引脚 | 133 |
微控制器 | 150 |
测试模块 | 170 |
报警模块 | 190 |
Claims (10)
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CN201110275049.4A CN102999405B (zh) | 2011-09-16 | 2011-09-16 | 电脑主板测试装置 |
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CN201110275049.4A CN102999405B (zh) | 2011-09-16 | 2011-09-16 | 电脑主板测试装置 |
Publications (2)
Publication Number | Publication Date |
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CN102999405A true CN102999405A (zh) | 2013-03-27 |
CN102999405B CN102999405B (zh) | 2016-11-23 |
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CN201110275049.4A Active CN102999405B (zh) | 2011-09-16 | 2011-09-16 | 电脑主板测试装置 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103594122A (zh) * | 2013-11-13 | 2014-02-19 | 福建联迪商用设备有限公司 | 一种用于实现存储卡接口测试的逻辑替代方法和电路 |
CN104281147A (zh) * | 2014-10-24 | 2015-01-14 | 上海自仪泰雷兹交通自动化系统有限公司 | 一种轨道交通信号设备的内部信号故障测试装置 |
CN105022684A (zh) * | 2014-04-23 | 2015-11-04 | 鸿富锦精密工业(深圳)有限公司 | 电子装置及其智能分析故障的方法 |
CN116244129A (zh) * | 2023-03-09 | 2023-06-09 | 中科可控信息产业有限公司 | 内存性能测试方法、装置及计算机设备 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20060002712A (ko) * | 2004-07-03 | 2006-01-09 | 삼성전자주식회사 | 메모리 테스트 장치 |
CN101089640A (zh) * | 2006-06-16 | 2007-12-19 | 鸿富锦精密工业(深圳)有限公司 | 多个电池插槽测试系统及方法 |
CN101354673A (zh) * | 2007-07-27 | 2009-01-28 | 佛山市顺德区顺达电脑厂有限公司 | 内存之spd芯片错误信息仿真装置 |
CN101364198A (zh) * | 2007-08-08 | 2009-02-11 | 英业达股份有限公司 | 读卡接口的测试治具及其测试方法 |
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2011
- 2011-09-16 CN CN201110275049.4A patent/CN102999405B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20060002712A (ko) * | 2004-07-03 | 2006-01-09 | 삼성전자주식회사 | 메모리 테스트 장치 |
CN101089640A (zh) * | 2006-06-16 | 2007-12-19 | 鸿富锦精密工业(深圳)有限公司 | 多个电池插槽测试系统及方法 |
CN101354673A (zh) * | 2007-07-27 | 2009-01-28 | 佛山市顺德区顺达电脑厂有限公司 | 内存之spd芯片错误信息仿真装置 |
CN101364198A (zh) * | 2007-08-08 | 2009-02-11 | 英业达股份有限公司 | 读卡接口的测试治具及其测试方法 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103594122A (zh) * | 2013-11-13 | 2014-02-19 | 福建联迪商用设备有限公司 | 一种用于实现存储卡接口测试的逻辑替代方法和电路 |
CN103594122B (zh) * | 2013-11-13 | 2016-08-17 | 福建联迪商用设备有限公司 | 一种用于实现存储卡接口测试的逻辑替代方法和电路 |
CN105022684A (zh) * | 2014-04-23 | 2015-11-04 | 鸿富锦精密工业(深圳)有限公司 | 电子装置及其智能分析故障的方法 |
CN104281147A (zh) * | 2014-10-24 | 2015-01-14 | 上海自仪泰雷兹交通自动化系统有限公司 | 一种轨道交通信号设备的内部信号故障测试装置 |
CN104281147B (zh) * | 2014-10-24 | 2016-08-17 | 上海自仪泰雷兹交通自动化系统有限公司 | 一种轨道交通信号设备的内部信号故障测试装置 |
CN116244129A (zh) * | 2023-03-09 | 2023-06-09 | 中科可控信息产业有限公司 | 内存性能测试方法、装置及计算机设备 |
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CN102999405B (zh) | 2016-11-23 |
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