CN102928760A - Light-emitting diode (LED) ageing test system and method - Google Patents
Light-emitting diode (LED) ageing test system and method Download PDFInfo
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Abstract
The invention discloses a light-emitting diode (LED) ageing test system which comprises a visual man-machine interaction module, a microprocessor module, a tested module and a testing module. The visual man-machine interaction module is used for selecting a testing mode, inputting testing parameters corresponding to the testing mode and displaying the testing mode and/or the testing parameters; the microprocessor module is used for receiving the testing mode and the corresponding testing parameters, calculating the testing parameters to obtain calculating results and outputting the results; the tested module is used for receiving the calculating results, achieving a tested mode corresponding to the testing mode to obtain the tested parameters and outputting the tested parameters; and the testing module is used for receiving control of the microprocessor module and testing the tested module according to the received tested parameters to obtain simulation testing results. The simulation testing results are read by the microprocessor module and then processed into data testing results, and then the simulation testing results are displayed on the visual man-machine interaction module. The LED ageing test system can test a plurality of LEDs simultaneously in on-line mode, and is full in function and high in efficiency. The invention further discloses an LED ageing testing method.
Description
Technical field
The present invention relates to LED photoelectricity test technical field, more particularly, relate to a kind of LED aging testing system and method for testing thereof.
Background technology
It is little and the life-span is long that LED has power, especially outstanding especially aspect energy-conservation.Happen current energy shortage, the development of LED obtains the energetically support of country, develops soon especially at these several years.LED uses very extensive aspect illumination, wherein relates to the fields such as commerce, family, automotive lighting.
Usually in theory, can reach 100,000 hours the serviceable life of LED, in the past few years, the LED product that we touch, life-span is all very short, comprise street lamp, desk lamp, light pipe etc., a lot of LED lamps just occur after lighting the very short time that brightness is dimmed, brightness irregularities, change color even non-luminous phenomenon.This has many-sided reason, all can cause the generation of above-mentioned phenomenon such as operation circuit, heat dissipation design etc., is exactly the problem of LED itself but a chief reason is arranged, and this also is the development that has restricted the LED industry simultaneously.
At present, for LED lamp built-in problem, industry adopts usually before LED produces line, it is carried out burn-in test, its method is for being placed on the LED that lights in baking box or the refrigerator, go to light LED a period of time with forward steady current mode or direct impulse current system, then LED is taken out in the ageing environment temperature of baking box or refrigerator, go to survey again the parameter of LED on the testing tool under the normal temperature condition.These test parameters comprise the parameters such as forward voltage drop value, reverse leakage value, brightness value and color.Test and rear the underproof LED lamp of parameter is picked out, but the LED that picks out through this test is after formally making the lamp decoration finished product, LED still aforesaid bad phenomenon can occur.Former because carry out aging separating with test LED at present, having ignored LED itself has specific temperature characterisitic; Under different temperature, its forward voltage drop value is different with the reverse leakage value, present this aging techniques and test mode are not considered the temperature characterisitic of LED and the method for testing of LED forward voltage drop and reverse leakage comprehensively, and in ageing process, to take out lamp for several times, measurement parameter, put back to and continue to wear out, efficient is not high.
Therefore, need a kind of LED aging testing system and method for testing thereof, adopt new aging techniques and test mode to solve the existing problem of above-mentioned prior art.
Summary of the invention
The object of the present invention is to provide a kind of LED aging testing system, the parameter of on-line testing plurality of LEDs in aging process, secondly can carry out multiple reversal is tested reverse leakage value from plurality of LEDs to impact aging with a default frequency of impact in bulk to plurality of LEDs, choose more exactly electric leakage hidden danger or the unsettled LED of electrical leakage are arranged, it is alternately aging to carry out forward and reverse impact with an alternating frequency of setting to plurality of LEDs at last, function more comprehensively, efficient is higher.
To achieve these goals, the invention provides a kind of LED aging testing system, this test macro comprises:
Visual man-machine interactive module is used for selecting a test pattern and the input test parameter corresponding with it, shows described test pattern and/or described test parameter;
Microprocessor module is used for receiving described test pattern and corresponding test parameter, calculates that described test parameter obtains result of calculation and with its output;
Tested module is used for receiving described result of calculation and realizes the tested pattern corresponding with described test pattern, obtains tested parameter and with its output;
Test module, be used for accepting the control of described microprocessor module and obtain the simulation test result according to the described tested module of described tested parameter testing that receives, described simulation test result reads and is treated to the digital test result via described microprocessor module, and described digital test result outputs to described visual man-machine interactive module and by its demonstration.
Further, described test macro also comprises temperature control modules, is used for the design temperature control model described tested module is carried out temperature control, and wherein, described temp-controled mode is chosen as one of normal temperature, low temperature, high temperature or high low temperature circulation pattern.
Further, described tested module comprises multipath controllable constant current source, multichannel controllable voltage source, multichannel gate-controlled switch and LED multi-path burn-in test seat; Described microprocessor module is exported described result of calculation to multipath controllable constant current source and multichannel controllable voltage source, and the Enable Pin of the control Enable Pin of multipath controllable constant current source or multichannel controllable voltage source, multichannel gate-controlled switch with an alternating frequency of setting LED multi-path burn-in test seat to be carried out forward current, reverse voltage alternately aging, and make LED multi-path burn-in test seat realize the tested pattern corresponding with described test pattern.
Further, described controllable voltage source is comprised of the first operational amplifier and the first resistance, described controlled constant current source is by the second operational amplifier, the second resistance, the 3rd resistance and triode form, described gate-controlled switch is by Switching Power Supply, the PMOS pipe, the NMOS pipe, the electronic switch that the 4th resistance and the 5th resistance form, wherein, one end of the first resistance is connected in the output terminal of the first operational amplifier, the other end connects the negative pole of the first operational amplifier and the negative terminal of connection and described LED burn-in test seat, and the positive pole of the first operational amplifier is used for receiving a given reverse voltage value; The second resistance is connected between the output terminal and transistor base of the second operational amplifier, the emitter of the negative pole connecting triode of the second operational amplifier also is connected in an end of the 3rd resistance, the electrical ground connection of the other end of the 3rd resistance, the positive pole of the second operational amplifier is used for receiving a given forward current value, and the collector of triode is connected in the negative terminal of LED burn-in test seat; The output terminal of described Switching Power Supply connects the source electrode of PMOS pipe, the drain electrode of PMOS pipe connects the drain electrode of NMOS pipe and is connected in the anode of described LED burn-in test seat, the electrical ground connection of the source electrode of NMOS pipe, the 4th resistance is connected between the source electrode and grid of PMOS pipe, the 5th resistance is connected between the source electrode and grid of NMOS pipe, and the grid of the grid of PMOS pipe and NMOS pipe is connected to described microprocessor module.
Further, described controlled constant current source and controllable voltage source is separate or collaborative work.
Further, described test module comprises LED multi-path current signal matrix commutation circuit, LED multi-path voltage signal matrix commutation circuit, LED multi-path leakage current treatment circuit and LED multi-path forward voltage treatment circuit; Described LED multi-path current signal matrix commutation circuit, described LED multi-path voltage signal matrix commutation circuit are comprised of respectively analog switch chip CD4051, CD4052, control described microprocessor module described LED multi-path current signal matrix commutation circuit and LED multi-path voltage signal matrix commutation circuit realize the signal combination of described analog switch chip CD4051 and CD4052, thereby described tested parameter are input to LED multi-path leakage current treatment circuit or LED multi-path forward voltage processing circuit processes becomes the described simulation test result of 0 ~ 3.3 volt of voltage and with its output.
Further, the integrated analog to digital converter that is provided with in the inside of described microprocessor module, described analog to digital converter is described digital test result's digital signal with described simulation test result's analog signal conversion.
Further, described visual man-machine interactive module is comprised of LCD screen, touch-screen, mode selection switch and RGB switch; Described mode selection switch is selected the arbitrary test pattern in constant current aging mode, forward impact aging mode, forward and reverse impact aging pattern, forward voltage drop detecting pattern and the reverse leakage detecting pattern; Described touch-screen arranges the test parameter of described test pattern, and described LCD screen display is shown described test pattern and/or described test parameter and/or described digital test result; Described RGB switch is set to the arbitrary working method in red LED work, green LED work, blue led work, red green LED work, reddish blue LED work, turquoise LED work and the RGB look LED work.
The present invention also provides a kind of LED ageing testing method, and this method of testing may further comprise the steps:
(a) select a test pattern and the input test parameter corresponding with described test pattern by visual man-machine interactive module, show described test pattern and/or described test parameter;
(b) microprocessor module receives described test pattern and described test parameter, calculates that described test parameter obtains result of calculation and with its output;
(c) described micro treatment module is controlled tested module and it is worn out, and described tested module receives described result of calculation and realizes the tested pattern corresponding with described test pattern, obtains tested parameter and with its output;
(d) test module is accepted the control of described microprocessor module and is obtained the simulation test result according to the described tested module of described tested parameter testing that receives, described simulation test result reads and is treated to the digital test result via described microprocessor module, and described digital test result outputs to described visual man-machine interactive module and by its demonstration.
Further, temperature control modules is used for the design temperature control model described tested module is carried out temperature control, and wherein, described temp-controled mode is chosen as one of normal temperature, low temperature, high temperature or high low temperature circulation pattern.
Further, described tested module comprises multipath controllable constant current source, multichannel controllable voltage source, multichannel gate-controlled switch and LED multi-path burn-in test seat; Described microprocessor module is exported described result of calculation to multipath controllable constant current source and multichannel controllable voltage source, and the Enable Pin of the control Enable Pin of multipath controllable constant current source or multichannel controllable voltage source, multichannel gate-controlled switch with an alternating frequency of setting LED multi-path burn-in test seat to be carried out forward current, reverse voltage alternately aging, and make LED multi-path burn-in test seat realize the tested pattern corresponding with described test pattern.
Further, described controllable voltage source is comprised of the first operational amplifier and the first resistance, described controlled constant current source is by the second operational amplifier, the second resistance, the 3rd resistance and triode form, described gate-controlled switch is by Switching Power Supply, the PMOS pipe, the NMOS pipe, the electronic switch that the 4th resistance and the 5th resistance form, wherein, one end of the first resistance is connected in the output terminal of the first operational amplifier, the other end connects the negative pole of the first operational amplifier and the negative terminal of connection and described LED burn-in test seat, and the positive pole of the first operational amplifier is used for receiving a given reverse voltage value; The second resistance is connected between the output terminal and transistor base of the second operational amplifier, the emitter of the negative pole connecting triode of the second operational amplifier also is connected in an end of the 3rd resistance, the electrical ground connection of the other end of the 3rd resistance, the positive pole of the second operational amplifier is used for receiving a given forward current value, and the collector of triode is connected in the negative terminal of LED burn-in test seat; The output terminal of described Switching Power Supply connects the source electrode of PMOS pipe, the drain electrode of PMOS pipe connects the drain electrode of NMOS pipe and is connected in the anode of described LED burn-in test seat, the electrical ground connection of the source electrode of NMOS pipe, the 4th resistance is connected between the source electrode and grid of PMOS pipe, the 5th resistance is connected between the source electrode and grid of NMOS pipe, and the grid of the grid of PMOS pipe and NMOS pipe is connected to described microprocessor module.
Further, described controlled constant current source and controllable voltage source is separate or collaborative work.
Further, described test module comprises LED multi-path current signal matrix commutation circuit, LED multi-path voltage signal matrix commutation circuit, LED multi-path leakage current treatment circuit and LED multi-path forward voltage treatment circuit; Described LED multi-path current signal matrix commutation circuit, described LED multi-path voltage signal matrix commutation circuit are comprised of respectively analog switch chip CD4051, CD4052, control described microprocessor module described LED multi-path current signal matrix commutation circuit and LED multi-path voltage signal matrix commutation circuit realize the signal combination of described analog switch chip CD4051 and CD4052, thereby described tested parameter are input to LED multi-path leakage current treatment circuit or LED multi-path forward voltage processing circuit processes becomes the described simulation test result of 0 ~ 3.3 volt of voltage and with its output.
Further, the integrated analog to digital converter that is provided with in the inside of described microprocessor module, described analog to digital converter is described digital test result's digital signal with described simulation test result's analog signal conversion.
Further, described visual man-machine interactive module is comprised of LCD screen, touch-screen, mode selection switch and RGB switch; Described mode selection switch is selected the arbitrary test pattern in constant current aging mode, forward impact aging mode, forward and reverse impact aging pattern, forward voltage drop detecting pattern and the reverse leakage detecting pattern; Described touch-screen arranges the test parameter of described test pattern, and described LCD screen display is shown described test pattern and/or described test parameter and/or described digital test result; Described RGB switch is set to the arbitrary working method in red LED work, green LED work, blue led work, red green LED work, reddish blue LED work, turquoise LED work and the RGB look LED work.
The beneficial effect of LED aging testing system of the present invention and method of testing thereof: the parameter of on-line testing plurality of LEDs in aging process, secondly can carry out multiple reversal is tested reverse leakage value from plurality of LEDs to impact aging with a default frequency of impact in bulk to plurality of LEDs, choose more exactly electric leakage hidden danger or the unsettled LED of electrical leakage are arranged, it is alternately aging to carry out forward and reverse impact with an alternating frequency of setting to plurality of LEDs at last, function more comprehensively, efficient is higher.
Description of drawings
Fig. 1 is the synoptic diagram of the LED aging testing system of the embodiment of the invention.
Fig. 2 is the controlled constant current source of the embodiment of the invention and the electrical block diagram of controllable voltage source.
Fig. 3 is the process flow diagram of the LED ageing testing method of the embodiment of the invention.
Embodiment
Technological means and the effect thereof taked in order further to set forth the present invention are described in detail below in conjunction with embodiments of the invention and accompanying drawing thereof, and wherein, identical label represents identical parts all the time.
The explanation of words more of the present invention below at first is described, constant current is aging: LED is lighted aging with fixing forward current; Forward impact is aging: with the direct impulse electric current LED is carried out discontinuous cycle and light aging; Forward and reverse impact aging: LED is replaced aging with direct impulse electric current and reverse impulse voltage.
As shown in Figure 1, the LED aging testing system can be tested plurality of LEDs simultaneously, and this test macro comprises: visual man-machine interactive module 1, microprocessor module 2, tested module 3 and test module 4; Wherein, the user selects a test pattern by visual man-machine interactive module 1, this test pattern is shown on the visual man-machine interactive module 1, according to the test pattern that shows on the visual man-machine interactive module 1, the user arranges an input test parameter corresponding with the test pattern that shows by visual man-machine interactive module 1, and test parameter is also shown by visual man-machine interactive module 1; Microprocessor module 2 receives the test pattern of user selections and the test parameter of input, and the test parameter that calculates input obtains result of calculation and with its output; Tested module 3 is accepted the control of microprocessor module 2 and is received result of calculation and realize the tested pattern corresponding with the test pattern of user selection, obtains tested parameter and with its output; Test module 4 is accepted the control of microprocessor module 2 and is obtained the simulation test result according to the tested module of tested parameter testing that receives, the simulation test result reads and is treated to the digital test result via microprocessor module 2, and the digital test result outputs to visual man-machine interactive module 1 and by its demonstration.
Preferably, the LED aging testing system also can comprise temperature control modules 5, it is used for the design temperature control model tested module 3 is carried out temperature control, wherein, temp-controled mode may be selected to be one of normal temperature pattern, low temperature mode, high temperature mode or high low temperature circulation pattern, the temperature range of normal temperature pattern is 20 degree ~ 30 degree, the temperature range of low temperature mode is-45 degree～-35 degree, the temperature range of high temperature mode is 100 degree ~ 140 degree, and high low temperature circulation pattern is to constantly circulation between 140 degree at-45 degree.
Preferably, visual man-machine interactive module 1 can comprise LCD screen 11, touch-screen 12, mode selection switch 13 and RGB switch 14; Wherein, mode selection switch 13 can be selected the arbitrary test pattern in constant current aging mode, forward impact aging mode, positive and negative impact aging pattern, forward voltage drop detecting pattern and the reverse leakage detecting pattern; Touch-screen 12 can be according to the test pattern setting test parameter corresponding with test pattern of selecting; LCD screen 11 can show test pattern and/or the test parameter of setting and/or the digital test result that the tested module 3 of test module 4 tests obtains of selection; According to the kind of the LED of user's needs tests, RGB switch 14 can be set to the arbitrary working method in red LED work, green LED work, blue led work, red green LED work, reddish blue LED work, turquoise LED work and the RGB look LED work.
Preferably, when the test parameter corresponding with the test pattern of user selection is set, be not limited to use touch-screen 12 to arrange, such as button or button etc. can be set test parameter be set.
Preferably, microprocessor module 2 can comprise single-chip microcomputer 21 and the analog to digital converter 22 that is integrated in single-chip microcomputer 21; Single-chip microcomputer 21 preferred 32 single-chip microcomputers, but be not limited to this, for example can be 4 single-chip microcomputers, 8 single-chip microcomputers or 16 are single-chip microcomputer, 32 single-chip microcomputers have stronger data-handling capacity, control each functional module (visual man-machine interactive module 1, tested module 3 and test module 4); Analog to digital converter 22 is converted to digital test result's signal for the simulation test result's that the tested module 3 of test module 4 tests is obtained signal under the control of single-chip microcomputer 21, the digital test result is shown with LCD shield on 11.
Preferably, tested module 3 can comprise multipath controllable constant current source 32, multichannel controllable voltage source 31, multichannel gate-controlled switch 33 and LED multi-path burn-in test seat 34, plurality of LEDs places LED multi-path burn-in test seat, 32 single-chip microcomputers 21 receive the test pattern of user selection and the test parameter of setting, then the test parameter computing is obtained result of calculation and output to controlled constant current source 32 and controllable voltage source 31, and then one of the Enable Pin of 32 single-chip microcomputer 21 control multipath controllable constant current sources 32 or Enable Pin 32 of multichannel controllable voltage source wear out with the plurality of LEDs that multichannel gate-controlled switch 33 is opposite to LED multi-path burn-in test seat 34, it is aging that aging techniques can be constant current, forward impact wears out or carries out forward impact with an alternating frequency of setting, reverse impact is alternately aging, make simultaneously LED multi-path burn-in test seat 34 realize the tested pattern corresponding with the test pattern of selection, obtain tested parameter and with its output.
Preferably, controlled constant current source 32 and controllable voltage source 31 can be worked to LED independently, also can work in coordination with same LED work is independent of each other, here collaborative refers to that controlled constant current source 32 and controllable voltage source 31 switch fast with an alternating frequency of setting and to same LED work, so that the forward voltage drop value of LED and reverse leakage value can on-line testings.
Preferably, test module 4 can comprise LED multi-path current signal matrix commutation circuit 41, LED multi-path voltage signal matrix commutation circuit 42, LED multi-path leakage current treatment circuit 43 and LED multi-path forward voltage treatment circuit 44, is used for testing the plurality of LEDs that places on the LED multi-path burn-in test seat 34; LED multi-path current signal matrix commutation circuit 41 and LED multi-path voltage signal matrix commutation circuit 42 are by analog switch chip CD4051, CD4052 forms respectively, 32 single-chip microcomputers 21 are controlled the signal combination of LED multi-path current signal matrix commutation circuits 41 and LED multi-path voltage signal matrix commutation circuit 42 realization analog switch chip CD4051 and CD4052, thereby tested parameter is input to the simulation test result that LED multi-path leakage current treatment circuit 43 or many LED forward voltage treatment circuit 44 are processed into 0 ~ 3.3 volt of voltage, the integrated peripheral hardware analog to digital converter 22 of 32 single-chip microcomputers 21 reads the simulation test result and it is treated to the digital test result, and the digital test result is shown on the LCD screen 11.
As shown in Figure 2, be the controlled constant current source of embodiments of the invention and the electrical block diagram of controllable voltage source.Controllable voltage source 31 is comprised of the first operational amplifier A 1 and the first resistance R 1, controlled constant current source 32 is by the second operational amplifier A 2, the second resistance R 2, the 3rd resistance R 3 and triode Q form, gate-controlled switch 33 is by Switching Power Supply, PMOS manages Q1, NMOS manages Q2, the electronic switch that the 4th resistance R 4 and the 5th resistance R 5 form, wherein, one end of the first resistance R 1 is connected in the output terminal of the first operational amplifier A 1, the other end connects the negative pole of the first operational amplifier A 1 and the negative terminal of connection and LED burn-in test seat 34, and the positive pole of the first operational amplifier A 1 is used for receiving a given reverse voltage value; The second resistance R 2 is connected between the base stage of the output terminal of the second operational amplifier A 2 and triode Q, the emitter of the negative pole connecting triode Q of the second operational amplifier A 2 also is connected in an end of the 3rd resistance R 3, the electrical ground connection of the other end of the 3rd resistance R 3, the positive pole of the second operational amplifier A 2 is used for receiving a given forward current value, and the collector of triode Q is connected in the negative terminal of LED burn-in test seat 34; The output terminal of Switching Power Supply connects the source electrode of PMOS pipe Q1, the drain electrode of PMOS pipe Q1 connects the drain electrode of NMOS pipe Q2 and is connected in the anode of LED burn-in test seat 34, the electrical ground connection of source electrode of NMOS pipe Q2, the 4th resistance R 4 is connected between the source electrode and grid of PMOS pipe Q1, the 5th resistance R 5 is connected between the source electrode and grid of NMOS pipe Q2, and the grid of the grid of PMOS pipe Q1 and NMOS pipe Q2 is connected to microprocessor module 2.When microprocessor module 2 control PMOS pipe Q1 conductings, NMOS pipe Q2 cut-off, will that LED burn-in test seat 34 is carried out forward impact be aging so that controllable current source 32 carries out work; When microprocessor module 2 control PMOS pipe Q1 cut-off, NMOS pipe Q2 conducting, will that LED burn-in test seat 34 is carried out reverse impact be aging so that controllable current source 31 carries out work; Microprocessor module 2 also can switch conducting or the cut-off that PMOS pipe Q1, NMOS manage Q2 by an alternating frequency of setting fast, it is alternately aging to realize that LED burn-in test seat 34 is carried out forward and reverse impact, this alternating frequency can be one minute 100 times, 300 times, 600 times, 900 times or other is arbitrarily by the set frequency of user.
Preferably, microprocessor module 2 outputs to controlled constant current source 32 and controllable voltage source 31 through computing with result of calculation according to the test pattern that input is set by visual man-machine interactive module 1 and test parameter, and control the Enable Pin of controlled constant current source 32 or controllable voltage source 31, gate-controlled switch 33, so that controllable voltage source 31 and controlled constant current source 32 are worked to LED respectively independently, also can same LED work be independent of each other an alternating frequency of setting, the forward voltage drop value of LED or reverse leakage value realize the tested pattern corresponding with the test pattern of input, so that can obtain test in aging.
Preferably, LED aging testing system of the present invention adopts multipath controllable constant current source 32, multichannel controllable voltage source 31 and multichannel gate-controlled switch 33, realizes plurality of LEDs is tested simultaneously under the control of microprocessor module 2.
As shown in Figure 3, be the process flow diagram of the LED ageing testing method of embodiments of the invention.In step S1, the user selects a test pattern by mode selection switch 11, by touch-screen 12 test parameter corresponding with the test pattern of selecting is set, and LCD screen 11 shows described test pattern and/or described test parameter.
(c) described micro treatment module is controlled tested module and it is worn out, and described tested module receives described result of calculation and realizes the tested pattern corresponding with described test pattern, obtains tested parameter and with its output;
(d) test module is accepted the control of described microprocessor module and is obtained the simulation test result according to the described tested module of described tested parameter testing that receives, described simulation test result reads and is treated to the digital test result via described microprocessor module, and described digital test result outputs to described visual man-machine interactive module and by its demonstration.
In step S2, receive test pattern and test parameters by 32 single-chip microcomputers 21 in the microprocessor module 2, the computing test parameter obtains result of calculation and with its output;
In step S3, export described result of calculation to multipath controllable constant current source 32 and multichannel controllable voltage source 31 by 32 single-chip microcomputers 21 in the microprocessor module 2, and the Enable Pin of control multipath controllable constant current source 32 or the Enable Pin of multichannel controllable voltage source 31, it is aging or forward impact aging or set alternating frequency with one to carry out forward and reverse impact alternately aging that a plurality of LED on 33 pairs of LED multi-path burn-in tests of multichannel gate-controlled switch seat 34 carry out constant current, and make LED multi-path burn-in test seat 34 realize the tested pattern corresponding with test pattern, obtain tested parameter and with its output.
In step S4, LED multi-path current signal matrix commutation circuit 41 and LED multi-path voltage signal matrix commutation circuit 42 are by analog switch chip CD4051, CD4052 forms respectively, 32 single-chip microcomputers 21 are controlled the signal combination of LED multi-path current signal matrix commutation circuits 41 and LED multi-path voltage signal matrix commutation circuit 42 realization analog switch chip CD4051 and CD4052, thereby tested parameter is input to the simulation test result that LED multi-path leakage current treatment circuit 43 or LED multi-path forward voltage treatment circuit 44 are processed into 0 ~ 3.3 volt of voltage, integrated peripheral hardware analog to digital converter 22 through 32 single-chip microcomputers 21 reads and processes, and is the digital test result with the simulation test results conversion and is shown on the LCD screen 11.
In sum, LED aging testing system of the present invention and method of testing thereof, the parameter of on-line testing plurality of LEDs in aging process, secondly can carry out multiple reversal is tested reverse leakage value from plurality of LEDs to impact aging with a default frequency of impact in bulk to plurality of LEDs, choose more exactly electric leakage hidden danger or the unsettled LED of electrical leakage are arranged, it is alternately aging to carry out forward and reverse impact with an alternating frequency of setting to plurality of LEDs at last, function more comprehensively, efficient is higher.
The present invention is described by above-mentioned related embodiment, yet above-described embodiment does not limit the scope of the invention only for implementing example of the present invention.Every spirit and interior modification and impartial setting of category that is contained in claims includes within the scope of the invention.
Claims (16)
1. a LED aging testing system is characterized in that, comprising:
Visual man-machine interactive module is used for selecting a test pattern and the input test parameter corresponding with it, shows described test pattern and/or described test parameter;
Microprocessor module is used for receiving described test pattern and corresponding test parameter, calculates that described test parameter obtains result of calculation and with its output;
Tested module is used for receiving described result of calculation and realizes the tested pattern corresponding with described test pattern, obtains tested parameter and with its output;
Test module, be used for accepting the control of described microprocessor module and obtain the simulation test result according to the described tested module of described tested parameter testing that receives, described simulation test result reads and is treated to the digital test result via described microprocessor module, and described digital test result outputs to described visual man-machine interactive module and by its demonstration.
2. test macro according to claim 1, it is characterized in that, described test macro also comprises temperature control modules, be used for the design temperature control model described tested module is carried out temperature control, wherein, described temp-controled mode is chosen as one of normal temperature, low temperature, high temperature or high low temperature circulation pattern.
3. test macro according to claim 1 is characterized in that, described tested module comprises multipath controllable constant current source, multichannel controllable voltage source, multichannel gate-controlled switch and LED multi-path burn-in test seat; Described microprocessor module is exported described result of calculation to multipath controllable constant current source and multichannel controllable voltage source, and the Enable Pin of the control Enable Pin of multipath controllable constant current source or multichannel controllable voltage source, multichannel gate-controlled switch with an alternating frequency of setting LED multi-path burn-in test seat to be carried out forward current, reverse voltage alternately aging, and make LED multi-path burn-in test seat realize the tested pattern corresponding with described test pattern.
4. test macro according to claim 3, it is characterized in that, described controllable voltage source is comprised of the first operational amplifier and the first resistance, described controlled constant current source is by the second operational amplifier, the second resistance, the 3rd resistance and triode form, described gate-controlled switch is by Switching Power Supply, the PMOS pipe, the NMOS pipe, the electronic switch that the 4th resistance and the 5th resistance form, wherein, one end of the first resistance is connected in the output terminal of the first operational amplifier, the other end connects the negative pole of the first operational amplifier and the negative terminal of connection and described LED burn-in test seat, and the positive pole of the first operational amplifier is used for receiving a given reverse voltage value; The second resistance is connected between the output terminal and transistor base of the second operational amplifier, the emitter of the negative pole connecting triode of the second operational amplifier also is connected in an end of the 3rd resistance, the electrical ground connection of the other end of the 3rd resistance, the positive pole of the second operational amplifier is used for receiving a given forward current value, and the collector of triode is connected in the negative terminal of LED burn-in test seat; The output terminal of described Switching Power Supply connects the source electrode of PMOS pipe, the drain electrode of PMOS pipe connects the drain electrode of NMOS pipe and is connected in the anode of described LED burn-in test seat, the electrical ground connection of the source electrode of NMOS pipe, the 4th resistance is connected between the source electrode and grid of PMOS pipe, the 5th resistance is connected between the source electrode and grid of NMOS pipe, and the grid of the grid of PMOS pipe and NMOS pipe is connected to described microprocessor module.
5. according to claim 3 or 4 described test macros, it is characterized in that described controlled constant current source and controllable voltage source is separate or collaborative work.
6. test macro according to claim 1, it is characterized in that described test module comprises LED multi-path current signal matrix commutation circuit, LED multi-path voltage signal matrix commutation circuit, LED multi-path leakage current treatment circuit and LED multi-path forward voltage treatment circuit; Described LED multi-path current signal matrix commutation circuit, described LED multi-path voltage signal matrix commutation circuit are comprised of respectively analog switch chip CD4051, CD4052, control described microprocessor module described LED multi-path current signal matrix commutation circuit and LED multi-path voltage signal matrix commutation circuit realize the signal combination of described analog switch chip CD4051 and CD4052, thereby described tested parameter are input to LED multi-path leakage current treatment circuit or LED multi-path forward voltage processing circuit processes becomes the described simulation test result of 0 ~ 3.3 volt of voltage and with its output.
7. according to claim 1 or 6 described test macros, it is characterized in that, the integrated analog to digital converter that is provided with in the inside of described microprocessor module, described analog to digital converter is described digital test result's digital signal with described simulation test result's analog signal conversion.
8. test macro according to claim 1 is characterized in that, described visual man-machine interactive module is comprised of LCD screen, touch-screen, mode selection switch and RGB switch; Described mode selection switch is selected the arbitrary test pattern in constant current aging mode, forward impact aging mode, forward and reverse impact aging pattern, forward voltage drop detecting pattern and the reverse leakage detecting pattern; Described touch-screen arranges the test parameter of described test pattern, and described LCD screen display is shown described test pattern and/or described test parameter and/or described digital test result; Described RGB switch is set to the arbitrary working method in red LED work, green LED work, blue led work, red green LED work, reddish blue LED work, turquoise LED work and the RGB look LED work.
9. a LED ageing testing method is characterized in that, described method of testing comprises:
(a) select a test pattern and the input test parameter corresponding with described test pattern by visual man-machine interactive module, show described test pattern and/or described test parameter;
(b) microprocessor module receives described test pattern and described test parameter, calculates that described test parameter obtains result of calculation and with its output;
(c) described micro treatment module is controlled tested module and it is worn out, and described tested module receives described result of calculation and realizes the tested pattern corresponding with described test pattern, obtains tested parameter and with its output;
(d) test module is accepted the control of described microprocessor module and is obtained the simulation test result according to the described tested module of described tested parameter testing that receives, described simulation test result reads and is treated to the digital test result via described microprocessor module, and described digital test result outputs to described visual man-machine interactive module and by its demonstration.
10. method of testing according to claim 9, it is characterized in that, by temperature control modules design temperature control model described tested module is carried out temperature control, wherein, described temp-controled mode is chosen as one of normal temperature, low temperature, high temperature or high low temperature circulation pattern.
11. method of testing according to claim 9 is characterized in that, described tested module comprises multipath controllable constant current source, multichannel controllable voltage source, multichannel gate-controlled switch and LED multi-path burn-in test seat; Described microprocessor module is exported described result of calculation to multipath controllable constant current source and multichannel controllable voltage source, and the Enable Pin of the control Enable Pin of multipath controllable constant current source or multichannel controllable voltage source, multichannel gate-controlled switch with an alternating frequency of setting LED multi-path burn-in test seat to be carried out forward current, reverse voltage alternately aging, and make LED multi-path burn-in test seat realize the tested pattern corresponding with described test pattern.
12. method of testing according to claim 11, it is characterized in that, described controllable voltage source is comprised of the first operational amplifier and the first resistance, described controlled constant current source is by the second operational amplifier, the second resistance, the 3rd resistance and triode form, described gate-controlled switch is by Switching Power Supply, the PMOS pipe, the NMOS pipe, the electronic switch that the 4th resistance and the 5th resistance form, wherein, one end of the first resistance is connected in the output terminal of the first operational amplifier, the other end connects the negative pole of the first operational amplifier and the negative terminal of connection and described LED burn-in test seat, and the positive pole of the first operational amplifier is used for receiving a given reverse voltage value; The second resistance is connected between the output terminal and transistor base of the second operational amplifier, the emitter of the negative pole connecting triode of the second operational amplifier also is connected in an end of the 3rd resistance, the electrical ground connection of the other end of the 3rd resistance, the positive pole of the second operational amplifier is used for receiving a given forward current value, and the collector of triode is connected in the negative terminal of LED burn-in test seat; The output terminal of described Switching Power Supply connects the source electrode of PMOS pipe, the drain electrode of PMOS pipe connects the drain electrode of NMOS pipe and is connected in the anode of described LED burn-in test seat, the electrical ground connection of the source electrode of NMOS pipe, the 4th resistance is connected between the source electrode and grid of PMOS pipe, the 5th resistance is connected between the source electrode and grid of NMOS pipe, and the grid of the grid of PMOS pipe and NMOS pipe is connected to described microprocessor module.
13. according to claim 11 or 12 described method of testings, it is characterized in that described controlled constant current source and controllable voltage source is separate or collaborative work.
14. method of testing according to claim 9, it is characterized in that described test module comprises LED multi-path current signal matrix commutation circuit, LED multi-path voltage signal matrix commutation circuit, LED multi-path leakage current treatment circuit and LED multi-path forward voltage treatment circuit; Described LED multi-path current signal matrix commutation circuit, described LED multi-path voltage signal matrix commutation circuit are comprised of respectively analog switch chip CD4051, CD4052, control described microprocessor module described LED multi-path current signal matrix commutation circuit and LED multi-path voltage signal matrix commutation circuit realize the signal combination of described analog switch chip CD4051 and CD4052, thereby described tested parameter are input to LED multi-path leakage current treatment circuit or LED multi-path forward voltage processing circuit processes becomes the described simulation test result of 0 ~ 3.3 volt of voltage and with its output.
15. according to claim 9 or 14 described method of testings, it is characterized in that, the integrated analog to digital converter that is provided with in the inside of described microprocessor module, described analog to digital converter is described digital test result's digital signal with described simulation test result's analog signal conversion.
16. method of testing according to claim 9 is characterized in that, described visual man-machine interactive module is comprised of LCD screen, touch-screen, mode selection switch and RGB switch; Described mode selection switch is selected the arbitrary test pattern in constant current aging mode, forward impact aging mode, forward and reverse impact aging pattern, forward voltage drop detecting pattern and the reverse leakage detecting pattern; Described touch-screen arranges the test parameter of described test pattern, and described LCD screen display is shown described test pattern and/or described test parameter and/or described digital test result; Described RGB switch is set to the arbitrary working method in red LED work, green LED work, blue led work, red green LED work, reddish blue LED work, turquoise LED work and the RGB look LED work.
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