CN103235252B - The matrix detection circuit of LED test - Google Patents
The matrix detection circuit of LED test Download PDFInfo
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- CN103235252B CN103235252B CN201310130693.1A CN201310130693A CN103235252B CN 103235252 B CN103235252 B CN 103235252B CN 201310130693 A CN201310130693 A CN 201310130693A CN 103235252 B CN103235252 B CN 103235252B
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- 238000012360 testing method Methods 0.000 title claims abstract description 48
- 238000001514 detection method Methods 0.000 title claims abstract description 44
- 239000011159 matrix material Substances 0.000 title claims abstract description 19
- 239000000523 sample Substances 0.000 claims description 102
- 238000013519 translation Methods 0.000 claims description 10
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- 238000010586 diagram Methods 0.000 description 22
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Abstract
A matrix detection circuit for LED test, comprises N number of constant voltage supply IV
1, IV
2, IV
3iV
n, wherein n be more than or equal to 1 positive integer, and one is touched like earth terminal 0V; N+1 output terminal O
1, O
2, O
3o
n+1, wherein n be more than or equal to 1 positive integer; Describedly touch like earth terminal 0V, and each described constant voltage supply IV
1, IV
2, IV
3iV
nrespectively by switch and each described output terminal O of respective parallel connection
1, O
2, O
3o
n+1connect; By the combination opened or closed of described switch, the positive pole of the same sequence number LED be detected can be made to connect with same constant voltage supply all the time, and the negative pole of same sequence number LED connect all the time like earth terminal 0V with described touching.When the present invention can be implemented in the LED chip detecting same batch, the LED chip of no matter coming from vibrating disk is forward or oppositely, the LED chip of same sequence number can be lighted with same constant voltage supply, overcome the defect that the forward voltage error of in prior art same batch is excessive; Analogue ground is set, at least can saves a constant voltage supply.
Description
Technical field
The present invention relates to a kind of LED testing circuit, particularly a kind of cost is low, the matrix detection circuit of the LED test that the LED forward voltage consistance detected is good.
Background technology
Led needs to detect before dispatching from the factory, and dispatches from the factory, to meet the different requirements of client, there is not any problem for its detection of the LED of single form light splitting according to the result detected after classifying; In order to meet the special requirement of client, also get more and more with the LED component of plurality of LEDs various combination together light splitting now, for electricity and the optical performance test of the LED component of this many combinations, general employing the following two kinds mode, one is parallel, a kind of copolar formula.
Below for three chip led, parallel and defect that is copolar formula test circuit is described respectively; Be the schematic diagram of existing parallel survey mode as shown in Figure 15 and Figure 16, in figure, P1 to P6 represents the first constant-current constant-voltage circuit respectively to the 6th constant-current constant-voltage circuit; T1 to T3 is three test pin of probe A, and T4 to T6 is three test pin of probe B; In figure, A represents LED anode, and K represents LED negative electrode (lower same).In probe A and probe B one group test pin is fixing, and another group test pin can the translation of relatively-stationary test pin, as shown in figure 15, tested assembly D1, D2 and D3(D1, D2 with D3 represents three LED respectively) anode A test pin with three of probe A respectively and be connected, suppose that probe A fixes, then probe B can in probe A translation, in probe A, the anode of D1 meets test pin T1, the anode of D2 meets test pin T2, the anode of D3 meets test pin T3, and provide high ordinary telegram stream by the flat pin of height of the first constant-current constant-voltage circuit P1 to the 3rd constant-current constant-voltage circuit P3 respectively, and tested assembly D1, the negative electrode K of D2 with D3 tests pin with three of probe B respectively and is connected, and be connected with the low flat pin of P4 to P6, so, record tested assembly D1, the electricity of D2 and D3 and optical property, but, if from the tested assembly D1 that vibrating disk is come, D2 and D3 direction is contrary, this phenomenon is very common, so with existing testing circuit just as shown in Figure 16, tested assembly D1, D2 and D3(D1, D2 with D3 represents three LED respectively) anode A test pin with three of probe B respectively and be connected, wherein the anode of D1 meets test pin T4, the anode of D2 meets test pin T5, the anode of D3 meets test pin T6, and provide high ordinary telegram stream by the flat pin of the height of P4 to P6 respectively, and tested assembly D1, the negative electrode K of D2 with D3 tests pin with three of probe A respectively and is connected, and be connected with the low flat pin of P1 to P3.Relatively example shown in Figure 15 and Figure 16, be not difficult to find out, (be commonly referred to forward to detect) under the detected state shown in Figure 15, tested assembly D1, D2 and D3 provide high ordinary telegram stream by the flat pin of height of the first constant-current constant-voltage circuit P1 to the 3rd constant-current constant-voltage circuit P3 respectively; And (inverse detection is commonly referred to) under the detected state shown in Figure 16, tested assembly D1, D2 and D3 provide high ordinary telegram stream by the flat pin of height of the 4th constant-current constant-voltage circuit P4 to the 6th constant-current constant-voltage circuit P6 respectively; In other words, when testing forward or backwards, tester needs to switch constant-current constant-voltage circuit, so will introduce the error between different constant-current constant-voltage circuit, cause the forward voltage error of the test of the examined product of same batch excessive, be not suitable for the accuracy requirement at present to this index of LED.
Be the schematic diagram of existing copolar formula test mode shown in Figure 17 and Figure 18, in figure, P1 to P4 represents the first constant-current constant-voltage circuit respectively to the 4th constant-current constant-voltage circuit; When forward detects, as shown in figure 17, low flush end is connect by the first constant-current constant-voltage circuit P1, other three pin connect the second to the 4th constant voltage supply respectively, provide high ordinary telegram stream to detect by the second to the 4th constant voltage supply, and when inverse detection, as shown in figure 18, but connecing low flush end by the 3rd constant-current constant-voltage circuit P3, other three pin connect first, second and the 4th constant voltage supply respectively, provide high ordinary telegram stream to detect by first, second and the 4th constant voltage supply; There is above-mentioned problem equally in such structure, namely when testing forward or backwards, need to switch constant-current constant-voltage circuit, the error between different constant-current constant-voltage circuit can be introduced, cause the forward voltage error of the examined product of same batch excessive, be also not suitable for the accuracy requirement at present to this index of LED.
In addition, above-mentioned is, and parallel and copolar formula test circuit all exists at least will use a constant-current constant-voltage circuit more, causes pick-up unit to increase the problem of cost.
More than analyze only for three chip led, to the explanation in addition of existing parallel and copolar formula testing circuit, in fact existing parallel with copolar formula testing circuit in n LED(n be more than or equal to 1 positive integer) detection all there is above-mentioned identical problem, namely need to switch constant-current constant-voltage circuit, the error between different constant-current constant-voltage circuit can be introduced, cause the forward voltage error of the examined product of same batch excessive, be also not suitable for the accuracy requirement at present to this index of LED; And be that parallel and copolar formula test circuit all exists and at least will use a constant-current constant-voltage circuit more, cause pick-up unit to increase the problem of cost.Herein, for the testing circuit except three chip LEDs, do not analyze in detail, please reader analyze voluntarily.
Summary of the invention
In order to overcome the problems referred to above, the present invention provides a kind of LED forward voltage consistance of detection good to society, and at least can less by the matrix detection circuit that the LED of a constant-current constant-voltage circuit tests.
Technical scheme of the present invention is: the matrix detection circuit providing a kind of LED to test, and comprises N number of constant voltage supply IV
1, IV
2, IV
3iV
n, wherein n be more than or equal to 1 positive integer, an and analogue ground 0V; N+1 output terminal O
1, O
2, O
3o
n+1, wherein n be more than or equal to 1 positive integer; Described analogue ground 0V, and each described constant voltage supply IV
1, IV
2, IV
3iV
nrespectively by switch and each described output terminal O of respective parallel connection
1, O
2, O
3o
n+1connect; By the combination opened or closed of described switch, the positive pole of the same sequence number LED be detected can be made to connect with same constant voltage supply all the time, and the negative pole of same sequence number LED connect all the time with described analogue ground 0V.
As improvement of the present invention, also comprise the first probe groups and the second probe groups, described output terminal O
1, O
2, O
3o
n+1a part connect with the probe of described first probe groups, described output terminal O
1, O
2, O
3o
n+1another part connect with the probe of described second probe groups.
As improvement of the present invention, described first probe groups or the second probe groups are fixed, and described second probe groups or the first probe groups are relative to the first probe groups or the second probe groups translation.
As improvement of the present invention, described N number of constant voltage supply is 1,2 or 3 constant voltage supplies.
The present invention also provides a kind of LED matrix detection circuit of testing, and comprises N number of constant voltage supply IV
1, IV
2, IV
3iV
n, wherein n be more than or equal to 1 positive integer and an analogue ground 0V; 2n output terminal O
1, O
2, O
32O
n, wherein n be more than or equal to 1 positive integer; Described analogue ground 0V, and each described constant voltage supply IV
1, IV
2, IV
3iV
nrespectively by switch and each described output terminal O of respective parallel connection
1, O
2, O
32O
nconnect; By the combination opened or closed of described switch, the positive pole of the same sequence number LED be detected can be made to connect with same constant voltage supply all the time, and the negative pole of same sequence number LED connect all the time with described analogue ground 0V.
As improvement of the present invention, also comprise the first probe groups and the second probe groups, described output terminal O
1, O
2, O
32O
na part connect with the probe of described first probe groups, described output terminal O
1, O
2, O
32O
nanother part connect with the probe of described second probe groups.
As improvement of the present invention, described first probe groups or the second probe groups are fixed, and described second probe groups or the first probe groups are relative to the first probe groups or the second probe groups translation.
As improvement of the present invention, described N number of constant voltage supply is 1,2 or 3 constant voltage supplies.
The present invention adopts matrix form circuit, by the various combination of switch, when can be implemented in the LED chip detecting same batch, the LED chip of no matter coming from vibrating disk is forward or oppositely, the LED chip of same sequence number can be lighted with same constant voltage supply, overcome in prior art owing to providing high ordinary telegram former with different constant current constant voltage sources to the examined product of same batch, and cause the forward voltage error of same batch excessive, be not suitable for the defect at present to the accuracy requirement of this index of LED; Meanwhile, analogue ground is set, at least can saves a constant voltage supply, reach the object reduced costs.
Accompanying drawing explanation
Fig. 1 is the structural representation (copolar formula) of an embodiment of the present invention circuit theory.
Fig. 2 is the circuit principle structure schematic diagram (two LED copolars) of a kind of concrete use of Fig. 1.
Fig. 3 is the particular circuit configurations schematic diagram that the forward of Fig. 2 detects.
Fig. 4 is the particular circuit configurations schematic diagram of the inverse detection of Fig. 2.
Fig. 5 is the circuit principle structure schematic diagram (three LED copolars) that the another kind of Fig. 1 specifically uses.
Fig. 6 is the particular circuit configurations schematic diagram that the forward of Fig. 5 detects.
Fig. 7 is the particular circuit configurations schematic diagram of the inverse detection of Fig. 5.
Fig. 8 is the structural representation (parallel) of the another kind of embodiment circuit theory of the present invention.
Fig. 9 is the circuit principle structure schematic diagram (two LED parallel connections) of a kind of concrete use of Fig. 8.
Figure 10 is the particular circuit configurations schematic diagram that the forward of Fig. 9 detects.
Figure 11 is the particular circuit configurations schematic diagram of the inverse detection of Fig. 9.
Figure 12 is the circuit principle structure schematic diagram (three LED parallel connections) that the another kind of Fig. 8 specifically uses.
Figure 13 is the particular circuit configurations schematic diagram that the forward of Figure 12 detects.
Figure 14 is the particular circuit configurations schematic diagram of the inverse detection of Figure 12.
Figure 15 is the circuit principle structure schematic diagram that the parallel forward of existing three LED detects.
Figure 16 is the circuit principle structure schematic diagram of existing three parallel inverse detection of LED.
Figure 17 is the circuit principle structure schematic diagram that existing three LED copolar formula forwards detect.
Figure 18 is the circuit principle structure schematic diagram of existing three LED copolar formula inverse detection.
Embodiment
Refer to Fig. 1, Fig. 1 is the structural representation (copolar formula) of an embodiment of the present invention circuit theory, is the matrix detection circuit that a kind of LED tests, comprises N number of constant voltage supply IV shown in figure
1, IV
2, IV
3iV
n, wherein n be more than or equal to 1 positive integer, an and analogue ground 0V; N+1 output terminal O
1, O
2, O
3o
n+1, wherein n be more than or equal to 1 positive integer; Described analogue ground 0V, and each described constant voltage supply IV
1, IV
2, IV
3iV
nrespectively by switch and each described output terminal O of respective parallel connection
1, O
2, O
3o
n+1connect, wherein, the first constant voltage supply IV
1by the first constant voltage supply IV
1the first switch S 11 and output terminal O
1connect, by second switch S21 and output terminal O
2connect By the n-th switch S n1 and output terminal O
nconnect; By the (n+1)th switch S (n+1) n and output terminal O
n+1connect; Second constant voltage supply IV
2by the second constant voltage supply IV
2the first switch S 12 and output terminal O
1connect, by second switch S22 and output terminal O
2connect By the n-th switch S n2 and output terminal O
nconnect; By the (n+1)th switch S (n+2) n and output terminal O
n+1connect; N-th constant voltage supply IV
nby the n-th constant voltage supply IV
nthe first switch S 1n and output terminal O
1connect, by second switch S2n and output terminal O
2connect By the n-th switch S nn and output terminal O
nconnect; By the (n+1)th switch S (n+n) n and output terminal O
n+1connect; Described analogue ground 0V is by the first switch S 1(n+1 of analogue ground 0V) and output terminal O
1connect, by second switch S2(n+1) and output terminal O
2connect By the n-th switch S n(n+1) and output terminal O
nconnect; By the (n+1)th switch S (n+ (n+1)) n and output terminal O
n+1connect; Connection like this, can by combination (the concrete array mode opened or closed of different switch, illustrate below), the positive pole of the same sequence number LED be detected can be made to connect with same constant voltage supply all the time, and the negative pole of same sequence number LED connects with described analogue ground 0V all the time, a constant voltage supply at least can be saved.In the present embodiment, be each described constant voltage supply IV described in Fig. 1
1, IV
2, IV
3iV
n, and described analogue ground 0V and each described output terminal O
1, O
2, O
3o
n+1a switch is had to connect, in fact, for every platform detector, different according to its object detected, partial switch wherein can be used just can to realize, and do not need all switches, like this, can be more cost-saving.The switch of the present embodiment can be electronic switch, as metal-oxide-semiconductor etc., can be also mechanical switch, as relay etc.Preferably, the described N number of constant voltage supply in the present embodiment can be 1,2 or 3 constant voltage supplies.
In the present invention, the first probe groups 1 and the second probe groups 2 can also be comprised, described output terminal O
1, O
2, O
3o
n+1a part connect with the probe of described first probe groups 1, described output terminal O
1, O
2, O
3o
n+1another part connect with the probe of described second probe groups 2; Described first probe groups 1 or the second probe groups 2 are fixed, and described second probe groups 2 or the first probe groups 1 can relative to the first probe groups 1 or the second probe groups 2 translations.
Refer to Fig. 2 to Fig. 4, what Fig. 2 to Fig. 4 disclosed is to detect two LED, and the testing circuit schematic diagram of the negative pole copolar of two LED.As shown in Figure 2, detecting two LED only needs two constant voltage supplies, i.e. the first constant voltage supply IV
1with the second constant voltage supply IV
2, and an analogue ground 0V, its connected mode is the first constant voltage supply IV
1by the first constant voltage supply IV
1the first switch S 11 and output terminal O
1connect, by second switch S21 and output terminal O
2connect; By the 3rd switch S 31 and output terminal O
3connect; Second constant voltage supply IV
2by the second constant voltage supply IV
2the first switch S 12 and output terminal O
1connect, by second switch S22 and output terminal O
2connect; By the 3rd switch S 32 and output terminal O
3connect; Described analogue ground 0V is by first switch S 14 and the output terminal O of analogue ground 0V
1connect, by second switch S24 and output terminal O
2connect; By the 3rd switch S 34 and output terminal O
3connect.
Referring to Fig. 3, is the physical circuit of the forward of circuit shown in Fig. 2 in two LED detections when detecting shown in Fig. 3.In Fig. 3, output terminal O
1be connected with the first pin T11 of the first probe assembly 1, the crus secunda T12 room of the first probe assembly 1, output terminal O
2be connected with the crus secunda T22 of the second probe assembly 2, output terminal O
3be connected with the first pin T21 of the second probe assembly 2, when the forward shown in Fig. 3 detects, the LED D1 positive pole in detected LED and output terminal O
2connect; 2nd LED D2 positive pole and output terminal O
3connect; One LED D1 negative pole and the 2nd LED D2 negative pole copolar, and with output terminal O
1connect; At this moment, the first constant current constant voltage source IV is closed
1second switch S21, by the first constant current constant voltage source IV
1kopin voltage is provided to a LED D1; Close the second constant current constant voltage source IV
2the 3rd switch S 32, by the second constant current constant voltage source IV
2kopin voltage is provided to the 2nd LED D2; Light a LED D1 and the 2nd LED D2 to realize detecting.
Referring to Fig. 4, is the physical circuit during inverse detection of circuit shown in Fig. 2 in two LED detections shown in Fig. 4.Because existing vibrating disk designs, when LED is reverse, just in time replace in the position of a described LED D1 and the 2nd LED D2, therefore, in Fig. 4, and the LED D1 positive pole in detected LED and output terminal O
3connect; 2nd LED D2 positive pole and output terminal O
1connect; One LED D1 negative pole and the 2nd LED D2 negative pole copolar, and with output terminal O
2connect; At this moment, closedown first constant current constant voltage source IV is only needed
1the 3rd switch S 31, or by the first constant current constant voltage source IV
1kopin voltage is provided to a LED D1; Close the second constant current constant voltage source IV
2the first switch S 12, or by the second constant current constant voltage source IV
2kopin voltage is provided to the 2nd LED D2; Light a LED D1 and the 2nd LED D2 to realize detecting.
Refer to Fig. 5 to Fig. 7, what Fig. 5 to Fig. 7 disclosed is to detect three LED, and the testing circuit schematic diagram of the negative pole copolar of three LED.As shown in Figure 5, detecting three LED only needs three constant voltage supplies, i.e. the first constant voltage supply IV
1, the second constant voltage supply IV2 and the second constant voltage supply IV3, an and analogue ground 0V, its connected mode is the first constant voltage supply IV
1by the first constant voltage supply IV
1the first switch S 11 and output terminal O
1connect, by second switch S21 and output terminal O
2connect; By the 3rd switch S 31 and output terminal O
3connect, by the 4th switch S 41 and output terminal O
4connect; Second constant voltage supply IV
2by the second constant voltage supply IV
2the first switch S 12 and output terminal O
1connect, by second switch S22 and output terminal O
2connect; By the 3rd switch S 32 and output terminal O
3connect, by the 4th switch S 42 and output terminal O
4connect; 3rd constant voltage supply IV
3by the 3rd constant voltage supply IV
3the first switch S 13 and output terminal O
1connect, by second switch S23 and output terminal O
2connect; By the 3rd switch S 33 and output terminal O
3connect, by the 4th switch S 43 and output terminal O
4connect; Described analogue ground 0V is by first switch S 14 and the output terminal O of analogue ground 0V
1connect, by second switch S24 and output terminal O
2connect; By the 3rd switch S 34 and output terminal O
3connect, by the 4th switch S 44 and output terminal O
4connect.
Referring to Fig. 6, is the physical circuit of the forward of circuit shown in Fig. 5 in three LED detections when detecting shown in Fig. 6.In Fig. 6, output terminal O
1be connected with the first pin T11 of the first probe assembly 1, output terminal O
2be connected with the crus secunda T12 of the first probe assembly 1, output terminal O
3be connected with the crus secunda T22 of the second probe assembly 2, output terminal O
4be connected with the first pin T21 of the second probe assembly 2, when the forward shown in Fig. 6 detects, the LED D1 positive pole in detected LED and output terminal O
2connect; 2nd LED D2 positive pole and output terminal O
3connect, the 3rd LED D3 positive pole and output terminal O
4connect; One LED D1 negative pole, the 2nd LED D2 negative pole and the 2nd LED D2 negative pole copolar, and with output terminal O
1connect; At this moment, the first constant current constant voltage source IV is closed
1second switch S21, by the first constant current constant voltage source IV
1kopin voltage is provided to a LED D1; Close the second constant current constant voltage source IV
2the 3rd switch S 32, by the second constant current constant voltage source IV
2there is provided Kopin voltage to the 2nd LED D2, close the 3rd constant current constant voltage source IV
3the 4th switch S 43, by the second constant current constant voltage source IV
3kopin voltage is provided to the 2nd LED D3; Light a LED D1, the 2nd LED D2 and the 2nd LED D3 to realize detecting.
Referring to Fig. 7, is the physical circuit during inverse detection of circuit shown in Fig. 5 in three LED detections shown in Fig. 7.Because existing vibrating disk designs, when LED is reverse, just in time replace in the position of a described LED D1 and the 3rd LED D3, therefore, in Fig. 7, and the LED D1 positive pole in detected LED and output terminal O
4connect; 2nd LED D2 positive pole and output terminal O
1connect, the 3rd LED D3 positive pole and output terminal O
2connect; One LED D1 negative pole, the 2nd LED D2 negative pole and the 2nd LED D2 negative pole copolar, and with output terminal O
3connect; At this moment, closedown first constant current constant voltage source IV is only needed
1the 4th switch S 41, or by the first constant current constant voltage source IV
1kopin voltage is provided to a LED D1; Close the second constant current constant voltage source IV
2the first switch S 12, or by the second constant current constant voltage source IV
2there is provided Kopin voltage to the 2nd LED D2, close the 3rd constant current constant voltage source IV
3second switch S23, or by the 3rd constant current constant voltage source IV
3kopin voltage is provided to the 2nd LED D3; Light a LED D1, the 2nd LED D2 and the 2nd LED D3 to realize detecting.
As mentioned above, the present invention only needs the combination opened or closed changing different switches, just can realize the LED for same sequence number, no matter forward detect or in inverse detection time, Kopin voltage can be provided by same constant current constant voltage source, overcome owing to providing high ordinary telegram former with different constant current constant voltage sources to the examined product of same batch in prior art, and cause the forward voltage error of same batch excessive, be not suitable for the defect at present to the accuracy requirement of this index of LED; Meanwhile, analogue ground is set, a constant voltage supply can be saved, reach the object reduced costs.
Refer to Fig. 8, the matrix detection circuit (parallel) that the present invention also provides a kind of LED to test, comprises N number of constant voltage supply IV
1, IV
2, IV
3iV
n, wherein n be more than or equal to 1 positive integer and an analogue ground 0V; 2n output terminal O
1, O
2, O
32O
n, wherein n be more than or equal to 1 positive integer; Described analogue ground 0V, and each described constant voltage supply IV
1, IV
2, IV
3iV
nrespectively by switch and each described output terminal O of respective parallel connection
1, O
2, O
32O
nconnect; By the combination opened or closed of described switch, the positive pole of the same sequence number LED be detected can be made to connect with same constant voltage supply all the time, and the negative pole of same sequence number LED connect all the time with described analogue ground 0V.
In Fig. 8, the first constant voltage supply IV
1by the first constant voltage supply IV
1the first switch S 11 and output terminal O
1connect, by second switch S21 and output terminal O
2connect, by the 3rd switch S 31 and output terminal O
3connect, by the 4th switch S 41 and output terminal O
4connect By 2(n-1) switch S 2(n-1) 1 with output terminal O
2(n-1)connect; By 2n switch S 2n1 and output terminal O
2nconnect; Second constant voltage supply IV
2by the second constant voltage supply IV
2the first switch S 12 and output terminal O
1connect, by second switch S22 and output terminal O
2connect, by the 3rd switch S 32 and output terminal O
3connect, by the 4th switch S 42 and output terminal O
4connect By 2(n-1) switch S 2(n-1) 2 with output terminal O
2(n-1)connect; By 2n switch S 2n2 and output terminal O
2nconnect; N-th constant voltage supply IV
nby the n-th constant voltage supply IV
nthe first switch S 1n and output terminal O
1connect, by second switch S2n and output terminal O
2connect, by the 3rd switch S 3n and output terminal O
3connect, by the 4th switch S 4n and output terminal O
4connect By 2(n-1) switch S 2(n-1) n and output terminal O
2(n-1)connect; By 2n switch S 2nn and output terminal O
2nconnect; Described analogue ground 0V is by the first switch S 1(n+1 of analogue ground 0V) and output terminal O
1connect, by second switch S2(n+1) and output terminal O
2connect, the 3rd switch S 3(n+1) and output terminal O
3connect, by the 4th switch S 4(n+1) and output terminal O
4connect By 2(n-1) switch S 2(n-1) (n+1) and output terminal O
2(n-1)connect; By 2n switch S 2n (n+1) and output terminal O
2nconnect; Connection like this, can by combination (the concrete array mode opened or closed of different switch, illustrate below), the positive pole of the same sequence number LED be detected can be made to connect with same constant voltage supply all the time, and the negative pole of same sequence number LED connects with described analogue ground 0V all the time, a constant voltage supply at least can be saved.In the present embodiment, be each described constant voltage supply IV described in Fig. 1
1, IV
2, IV
3iV
n, and described analogue ground 0V and each described output terminal O
1, O
2, O
3o
2na switch is had to connect, in fact, for every platform detector, different according to its object detected, partial switch wherein can be used just can to realize, and do not need all switches, like this, can be more cost-saving.The switch of the present embodiment can be electronic switch, as metal-oxide-semiconductor etc., can be also mechanical switch, as relay etc.Preferably, the described N number of constant voltage supply in the present embodiment can be 1,2 or 3 constant voltage supplies.
In the present invention, the first probe groups 1 and the second probe groups 2 can also be comprised, described output terminal O
1, O
2, O
3o
n+1a part connect with the probe of described first probe groups 1, described output terminal O
1, O
2, O
3o
n+1another part connect with the probe of described second probe groups 2; Described first probe groups 1 or the second probe groups 2 are fixed, and described second probe groups 2 or the first probe groups 1 can relative to the first probe groups 1 or the second probe groups 2 translations.
Refer to Fig. 9 to Figure 11, what Fig. 9 to Figure 11 disclosed is the testing circuit schematic diagram that can detect two LED parallel connections.As shown in Figure 9, detecting two LED only needs two constant voltage supplies, i.e. the first constant voltage supply IV
1with the second constant voltage supply IV
2, and an analogue ground 0V, its connected mode is the first constant voltage supply IV
1by the first constant voltage supply IV
1the first switch S 11 and output terminal O
1connect, by second switch S21 and output terminal O
2connect; By the 3rd switch S 31 and output terminal O
3connect, by the 4th switch S 41 and output terminal O
4connect; Second constant voltage supply IV
2by the second constant voltage supply IV
2the first switch S 12 and output terminal O
1connect, by second switch S22 and output terminal O
2connect; By the 3rd switch S 32 and output terminal O
3connect, by the 4th switch S 42 and output terminal O
4connect; Described analogue ground 0V is by first switch S 14 and the output terminal O of analogue ground 0V
1connect, by second switch S24 and output terminal O
2connect; By the 3rd switch S 34 and output terminal O
3connect, by the 3rd switch S 44 and output terminal O
4connect.
Referring to Figure 10, is the physical circuit of the forward of circuit shown in Fig. 9 in two LED detections when detecting shown in Figure 10.In Figure 10, output terminal O
1be connected with the first pin T11 of the first probe assembly 1, output terminal O
2be connected with the crus secunda T12 of the first probe assembly 1, output terminal O
3be connected with the crus secunda T22 of the second probe assembly 2, output terminal O
4be connected with the first pin T21 of the second probe assembly 2, when the forward shown in Figure 10 detects, the LED D1 positive pole in detected LED and output terminal O
1connect; 2nd LED D2 positive pole and output terminal O
2connect; One LED D1 negative pole and output terminal O
4connect and the 2nd LED D2 negative pole and output terminal O
3connect; Close the first constant current constant voltage source IV
1the first switch S 11, by the first constant current constant voltage source IV
1kopin voltage is provided to a LED D1; Close the second constant current constant voltage source IV
2second switch S22, by the second constant current constant voltage source IV
2kopin voltage is provided to the 2nd LED D2; Close the 3rd switch S 34 and the 3rd switch S 44 of analogue ground 0V, a LED D1 and the 2nd LED D2 just can be made to form loop, light a LED D1 and the 2nd LED D2 and realize detecting.
Referring to Figure 11, is the physical circuit during inverse detection of circuit shown in Fig. 9 in two LED detections shown in Figure 11.Because existing vibrating disk designs, when LED is reverse, just in time replace in the position of a described LED D1 and the 2nd LED D2, therefore, and Tu11Zhong, the LED D1 positive pole in detected LED and output terminal O
4connect; 2nd LED D2 positive pole and output terminal O
1connect; One LED D1 negative pole and the 2nd LED D2 negative pole copolar, and with output terminal O
3connect; At this moment, closedown first constant current constant voltage source IV is only needed
1the 3rd switch S 31, or by the first constant current constant voltage source IV
1kopin voltage is provided to a LED D1; Close the second constant current constant voltage source IV
2the 4th switch S 42, or by the second constant current constant voltage source IV
2kopin voltage is provided to the 2nd LED D2; Light a LED D1 and the 2nd LED D2 to realize detecting.
Refer to Figure 12 to Figure 14, what Figure 12 to Figure 14 disclosed is the testing circuit schematic diagram that can detect three parallel connection LEDs.As shown in figure 12, detecting three LED only needs three constant voltage supplies, i.e. the first constant voltage supply IV
1, the second constant voltage supply IV
2with the second constant voltage supply IV
3, and an analogue ground 0V, its connected mode is the first constant voltage supply IV
1by the first constant voltage supply IV
1the first switch S 11 and output terminal O
1connect, by second switch S21 and output terminal O
2connect; By the 3rd switch S 31 and output terminal O
3connect, by the 4th switch S 41 and output terminal O
4connect, by the 5th switch S 51 and output terminal O
5connect, by the 6th switch S 61 and output terminal O
6connect; Second constant voltage supply IV
2by the second constant voltage supply IV
2the first switch S 12 and output terminal O
1connect, by second switch S22 and output terminal O
2connect; By the 3rd switch S 32 and output terminal O
3connect, by the 4th switch S 42 and output terminal O
4connect, by the 5th switch S 52 and output terminal O
5connect, by the 6th switch S 62 and output terminal O
6connect; 3rd constant voltage supply IV
3by the 3rd constant voltage supply IV
3the first switch S 13 and output terminal O
1connect, by second switch S23 and output terminal O
2connect; By the 3rd switch S 33 and output terminal O
3connect, by the 4th switch S 43 and output terminal O
4connect, by the 5th switch S 53 and output terminal O
5connect, by the 6th switch S 63 and output terminal O
6connect; Described analogue ground 0V is by first switch S 14 and the output terminal O of analogue ground 0V
1connect, by second switch S24 and output terminal O
2connect; By the 3rd switch S 34 and output terminal O
3connect, by the 4th switch S 44 and output terminal O
4connect, by the 5th switch S 54 and output terminal O
5connect, by the 6th switch S 64 and output terminal O
6connect.
Referring to Figure 13, is the physical circuit of the forward of circuit shown in Figure 12 in three LED detections when detecting shown in Figure 13.In Figure 13, output terminal O
1be connected with the first pin T11 of the first probe assembly 1, output terminal O
2be connected with the crus secunda T12 of the first probe assembly 1, output terminal O
3be connected with the tripod T13 of the first probe assembly 1, output terminal O
4be connected with the tripod T23 of the second probe assembly 2, output terminal O
5be connected with the crus secunda T22 of the second probe assembly 2, output terminal O
6be connected with the first pin T21 of the second probe assembly 2, when the forward shown in Figure 13 detects, the LED D1 positive pole in detected LED and output terminal O
1connect; 2nd LED D2 positive pole and output terminal O
2connect, the 3rd LED D3 positive pole and output terminal O
3connect; One LED D1 negative pole and output terminal O
6connection, the 2nd LED D2 negative pole and output terminal O
5connect, the 2nd LED D2 negative pole and output terminal O
4connect; At this moment, the first constant current constant voltage source IV is closed
1the first switch S 11, by the first constant current constant voltage source IV
1kopin voltage is provided to a LED D1; Close the second constant current constant voltage source IV
2second switch S22, by the second constant current constant voltage source IV
2there is provided Kopin voltage to the 2nd LED D2, close the 3rd constant current constant voltage source IV
3the 3rd switch S 33, by the second constant current constant voltage source IV
3kopin voltage is provided to the 2nd LED D3; Close the 4th switch S 44 of analogue ground 0V, the 5th switch S 54 and the 6th switch S 64, a LED D1, the 2nd LED D2 and the 3rd LED D3 just can be made to form loop, light a LED D1, the 2nd LED D2 and the 2nd LED D3 and realize detecting.
Referring to Figure 14, is the physical circuit during inverse detection of circuit shown in Figure 12 in three LED detections shown in Figure 14.Because existing vibrating disk designs, when LED is reverse, just in time replace in the position of a described LED D1 and the 3rd LED D3, therefore, and Tu14Zhong, the LED D1 positive pole in detected LED and output terminal O
4connect; 2nd LED D2 positive pole and output terminal O
5connect, the 3rd LED D3 positive pole and output terminal O
6connect; One LED D1 negative pole and output terminal O
3connection, the 2nd LED D2 negative pole and output terminal O
2connect and the 2nd LED D3 negative pole and output terminal O
1connect; At this moment, closedown first constant current constant voltage source IV is only needed
1the 4th switch S 41, or by the first constant current constant voltage source IV
1kopin voltage is provided to a LED D1; Close the second constant current constant voltage source IV
2the 5th switch S 52, or by the second constant current constant voltage source IV
2there is provided Kopin voltage to the 2nd LED D2, close the 3rd constant current constant voltage source IV
3the 6th switch S 63, or by the 3rd constant current constant voltage source IV
3kopin voltage is provided to the 2nd LED D3; Light a LED D1, the 2nd LED D2 and the 2nd LED D3 to realize detecting.
In the present patent application file, although only to copolar or the parallel connection of two LED and three LED, the detection of application the present invention program, be illustrated by reference to the accompanying drawings, but, for the detection of a LED, and the detection of more than three LED copolar or association, scheme given by the present invention is also effective, and reader can analyze voluntarily, repeats no more here.
In sum, the present invention adopts matrix form circuit, by the various combination of switch, when can be implemented in the LED chip detecting same batch, the LED chip of no matter coming from vibrating disk is forward or oppositely, can light the LED chip of same sequence number with same constant voltage supply, the forward voltage error overcoming the examined product of in prior art same batch is excessive, is not suitable for the defect at present to the accuracy requirement of this index of LED; Meanwhile, analogue ground is set, at least can saves a constant voltage supply, reach the object reduced costs.
Claims (8)
1. a matrix detection circuit for LED test, is characterized in that: comprise n constant voltage supply (IV1, IV2, IV3 ... IVn, wherein n be more than or equal to 1 positive integer) and one touch like earth terminal (0V); N+1 output terminal (O1, O2, O3 ... On+1, wherein n be more than or equal to 1 positive integer); N(n+1) individual switch, is divided into n+1 group; Describedly touch like earth terminal (0V), and each described constant voltage supply (IV1, IV2, IV3 ... IVn) respectively by switches set and each described output terminal (O1, O2, O3 of respective parallel connection ... On+1) connect; Wherein, the first constant voltage supply (IV
1) by the first constant voltage supply (IV
1) the first switch (S11) and the first output terminal (O
1) connect, by second switch (S21) and the second output terminal (O
2) connect By the n-th switch (Sn1) and the n-th output terminal (O
n) connect; By (n+1) switch (S (n+1) n) with the (n+1)th output terminal (O
n+1) connect; Second constant voltage supply (IV
2) by the second constant voltage supply (IV
2) the first switch (S12) and the first output terminal (O
1) connect, by second switch (S22) and the second output terminal (O
2) connect By the n-th switch (Sn2) and the n-th output terminal (O
n) connect; By the (n+1)th switch (S (n+2) n) with the (n+1)th output terminal (O
n+1) connect; N-th constant voltage supply (IV
n) by the n-th constant voltage supply (IV
n) the first switch (S1n) and the first output terminal (O
1) connect, by second switch (S2n) and the second output terminal (O
2) connect By the n-th switch (Snn) and the n-th output terminal (O
n) connect; By the (n+1)th switch (S (n+n) n) with the (n+1)th output terminal (O
n+1) connect; Describedly to touch like earth terminal (0V) by touching the first switch (S1(n+1) like earth terminal (0V)) with the first output terminal (O
1) connect, by second switch (S2(n+1)) and the second output terminal (O
2) connect By the n-th switch (Sn(n+1)) and the n-th output terminal (O
n) connect; By the (n+1)th switch (S (n+ (n+1)) n) with the (n+1)th output terminal (O
n+1) connect; By the combination opened or closed of described switch, the positive pole of the same sequence number LED be detected can be made to connect with same constant voltage supply all the time, and the negative pole of same sequence number LED connect all the time like earth terminal (0V) with described touching.
2. the matrix detection circuit of LED test according to claim 1, it is characterized in that: also comprise the first probe groups and the second probe groups, described output terminal (O1, O2, O3 ... On+1) a part connects with the probe of described first probe groups, described output terminal (O1, O2, O3 ... On+1) another part connects with the probe of described second probe groups.
3. the matrix detection circuit of LED test according to claim 1 and 2, it is characterized in that: described first probe groups is fixed, described second probe groups is relative to the first probe groups translation, or the second probe groups is fixed, and the first probe groups is relative to the second probe groups translation.
4. the matrix detection circuit of LED test according to claim 1 and 2, is characterized in that: described N number of constant voltage supply is 1,2 or 3 constant voltage supplies.
5. a matrix detection circuit for LED test, is characterized in that: comprise n constant voltage supply (IV
1, IV
2, IV
3iV
n, wherein n be more than or equal to 1 positive integer) and one touch like earth terminal (0V); 2n(n+1) individual switch, is divided into 2(n+1) group; 2n output terminal (O
1, O
2, O
32O
n, wherein n be more than or equal to 1 positive integer); Describedly touch like earth terminal (0V), and each described constant voltage supply (IV
1, IV
2, IV
3iV
n) respectively by the switches set of respective parallel connection and each described output terminal (O
1, O
2, O
32O
n) connect; Wherein, the first constant voltage supply (IV
1) by the first constant voltage supply (IV
1) the first switch (S11) and the first output terminal (O
1) connect, by second switch (S21) and the second output terminal (O
2) connect By the n-th switch (Sn1) and the n-th output terminal (O
n) connect; By (n+1) switch (S (n+1) n) with the (n+1)th output terminal (O
n+1) connect; Second constant voltage supply (IV
2) by the second constant voltage supply (IV
2) the first switch (S12) and the first output terminal (O
1) connect, by second switch (S22) and the second output terminal (O
2) connect By the n-th switch (Sn2) and the n-th output terminal (O
n) connect; By the (n+1)th switch (S (n+2) n) with the (n+1)th output terminal (O
n+1) connect; N-th constant voltage supply (IV
n) by the n-th constant voltage supply (IV
n) the first switch (S1n) and the first output terminal (O
1) connect, by second switch (S2n) and the second output terminal (O
2) connect By the n-th switch (Snn) and the n-th output terminal (O
n) connect; By the (n+1)th switch (S (n+n) n) with the (n+1)th output terminal (O
n+1) connect; Describedly to touch like earth terminal (0V) by touching the first switch (S1(n+1) like earth terminal (0V)) with the first output terminal (O
1) connect, by second switch (S2(n+1)) and the second output terminal (O
2) connect By the n-th switch (Sn(n+1)) and the n-th output terminal (O
n) connect; By the (n+1)th switch (S (n+ (n+1)) n) with the (n+1)th output terminal (O
n+1) connect; By the combination opened or closed of described switch, the positive pole of the same sequence number LED be detected can be made to connect with same constant voltage supply all the time, and the negative pole of same sequence number LED connect all the time like earth terminal (0V) with described touching.
6. the matrix detection circuit of LED test according to claim 5, is characterized in that: also comprise the first probe groups and the second probe groups, described output terminal (O
1, O
2, O
32O
n) a part connect with the probe of described first probe groups, described output terminal (O
1, O
2, O
32O
n) another part connect with the probe of described second probe groups.
7. the matrix detection circuit of the LED test according to claim 5 or 6, it is characterized in that: described first probe groups is fixed, described second probe groups is relative to the first probe groups translation, or the second probe groups is fixed, and the first probe groups is relative to the second probe groups translation.
8. the matrix detection circuit of the LED test according to claim 5 or 6, is characterized in that: a described n constant voltage supply is 1,2 or 3 constant voltage supplies.
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|---|---|---|---|
| CN201310130693.1A CN103235252B (en) | 2013-04-15 | 2013-04-15 | The matrix detection circuit of LED test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310130693.1A CN103235252B (en) | 2013-04-15 | 2013-04-15 | The matrix detection circuit of LED test |
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| Publication Number | Publication Date |
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| CN103235252A CN103235252A (en) | 2013-08-07 |
| CN103235252B true CN103235252B (en) | 2015-10-21 |
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|---|---|---|---|
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61288436A (en) * | 1985-06-17 | 1986-12-18 | Hitachi Ltd | Switching matrix structure |
| CN102170726A (en) * | 2011-01-28 | 2011-08-31 | 创维液晶器件(深圳)有限公司 | LED constant current power supply panel |
| CN102928760A (en) * | 2012-10-31 | 2013-02-13 | 许伟清 | Light-emitting diode (LED) ageing test system and method |
| CN202798541U (en) * | 2012-07-10 | 2013-03-13 | 河北钢铁股份有限公司邯郸分公司 | Device for realizing commutation of motor in one shot |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006153793A (en) * | 2004-12-01 | 2006-06-15 | Agilent Technol Inc | Switching matrix for semiconductor characteristics measuring device |
-
2013
- 2013-04-15 CN CN201310130693.1A patent/CN103235252B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61288436A (en) * | 1985-06-17 | 1986-12-18 | Hitachi Ltd | Switching matrix structure |
| CN102170726A (en) * | 2011-01-28 | 2011-08-31 | 创维液晶器件(深圳)有限公司 | LED constant current power supply panel |
| CN202798541U (en) * | 2012-07-10 | 2013-03-13 | 河北钢铁股份有限公司邯郸分公司 | Device for realizing commutation of motor in one shot |
| CN102928760A (en) * | 2012-10-31 | 2013-02-13 | 许伟清 | Light-emitting diode (LED) ageing test system and method |
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| CN103235252A (en) | 2013-08-07 |
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Address after: 1st-3rd, 5th-8th Floor, Building A, Tea Tree, Tongfuyu Industrial Park, Inner Ring Road, Sanwei Community, Hangcheng Street, Baoan District, Shenzhen, Guangdong, China Patentee after: Shenzhen Biaopu Semiconductor Co.,Ltd. Address before: Floor 9-10, Zone 13, West Tea West Huafeng Industrial Zone, West Tea West, Bao'an District, Shenzhen, Guangdong 518000 Patentee before: SHENZHEN BIAOPU SEMICONDUCTOR TECHNOLOGY Co.,Ltd. |
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