CN102890730A - 一种集成电路版图验证中矩形包含规则的验证方法 - Google Patents
一种集成电路版图验证中矩形包含规则的验证方法 Download PDFInfo
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CN113642286A (zh) * | 2021-08-12 | 2021-11-12 | 长鑫存储技术有限公司 | 测试图形的验证方法、装置、设备及存储介质 |
Citations (5)
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US5062054A (en) * | 1988-03-10 | 1991-10-29 | Matsushita Electric Industrial Co., Ltd. | Layout pattern generation and geometric processing system for LSI circuits |
CN1604089A (zh) * | 2003-09-29 | 2005-04-06 | 北京中电华大电子设计有限责任公司 | 基于边的倒序树扫描线算法优化层次版图验证技术 |
US20090204930A1 (en) * | 2004-08-12 | 2009-08-13 | International Business Machines Corporation | Iphysical design system and method |
CN101593222A (zh) * | 2008-05-28 | 2009-12-02 | 北京华大九天软件有限公司 | 一种实现版图验证中密度检查的方法 |
CN101751494A (zh) * | 2008-12-04 | 2010-06-23 | 北京华大九天软件有限公司 | 一种基于倒序树扫描线算法的边投影优化方法 |
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Patent Citations (5)
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US5062054A (en) * | 1988-03-10 | 1991-10-29 | Matsushita Electric Industrial Co., Ltd. | Layout pattern generation and geometric processing system for LSI circuits |
CN1604089A (zh) * | 2003-09-29 | 2005-04-06 | 北京中电华大电子设计有限责任公司 | 基于边的倒序树扫描线算法优化层次版图验证技术 |
US20090204930A1 (en) * | 2004-08-12 | 2009-08-13 | International Business Machines Corporation | Iphysical design system and method |
CN101593222A (zh) * | 2008-05-28 | 2009-12-02 | 北京华大九天软件有限公司 | 一种实现版图验证中密度检查的方法 |
CN101751494A (zh) * | 2008-12-04 | 2010-06-23 | 北京华大九天软件有限公司 | 一种基于倒序树扫描线算法的边投影优化方法 |
Non-Patent Citations (1)
Title |
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肖军 等: "集成电路版图的电路提取", 《微电子学》 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN113642286A (zh) * | 2021-08-12 | 2021-11-12 | 长鑫存储技术有限公司 | 测试图形的验证方法、装置、设备及存储介质 |
CN113642286B (zh) * | 2021-08-12 | 2023-10-24 | 长鑫存储技术有限公司 | 测试图形的验证方法、装置、设备及存储介质 |
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