CN102798740A - Probe and auxiliary test jig thereof - Google Patents
Probe and auxiliary test jig thereof Download PDFInfo
- Publication number
- CN102798740A CN102798740A CN2011101397664A CN201110139766A CN102798740A CN 102798740 A CN102798740 A CN 102798740A CN 2011101397664 A CN2011101397664 A CN 2011101397664A CN 201110139766 A CN201110139766 A CN 201110139766A CN 102798740 A CN102798740 A CN 102798740A
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- shell
- probe
- contact pin
- jack
- pin
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Abstract
The invention discloses a probe which comprises a main body and an auxiliary test jig. The main body comprises a pin, a body and a conductor, wherein the pin is arranged on the body and non-electrically connected with the body. The auxiliary test jig comprises a shell, a pin which is connected with the shell, a first input wire and a second input wire, wherein the pin is fixed at one end of the shell; a jack is arranged at the other end of the shell; the pin is electrically connected with the jack; both the pin and the jack are non-electrically connected with the shell; and one ends of the first and second input wires are electrically connected with the pin and the shell, respectively. The pin of the main body is used for being inserted into the jack of the auxiliary test jig. According to the invention, the first and second input wires respectively contact a point to be tested and a ground point which is close to the point to be tested as much as possible and the probe does not need to contact the point to be tested, so that the probe can be far away from the interference of magnetic components, then the correctness of the measurement is improved and the mobility of the probe during the measurement is increased.
Description
Technical field
The present invention relates to a kind of probe and subtest tool thereof.
Background technology
In the test process of electronic product, in general all can measure the electrical specification of each electronic devices and components through oscillograph, to detect the whether standard of book up to specification of measured result.When oscillograph is tested; Generally can select the shortest ground wire mensuration for use; Promptly through being connected in oscillographic probe, utilize the anodal contact pin contact measured point on the probe, utilization removes to contact as close as possible earth point around tested point around the negative pole coil on the probe.Yet this method needs probe is contacted with tested point when measuring, and so possibly cause probe to cause signal and waveform distortion away from magnet assembly disturbs, and gives when measuring and makes troubles.
Summary of the invention
In view of above content, be necessary to provide a kind of probe that is convenient for measuring and subtest tool thereof.
A kind of probe; Comprise a main body and a subsidiary tool, said main body comprises a contact pin, a body and a lead, and said contact pin is arranged on the said body and is non-electric-connecting with said body; Said subsidiary tool comprises contact pin and first, second incoming line that a shell, is connected with said shell; Said contact pin is fixed in an end of said shell, and a jack is opened in the other end of said shell, and said contact pin is electrically connected with said jack; Said contact pin and said jack and said shell are all non-to be electrical connected, and an end of said first and second incoming line is electrical connected with said contact pin and shell respectively.
A kind of probe subtest tool; Comprise contact pin and first, second incoming line that a shell, is connected with said shell, said contact pin is fixed in an end of said shell, and a jack is opened in the other end of said shell; Said contact pin is electrically connected with said jack; Said contact pin and said jack and said shell are all non-to be electrical connected, and an end of said first and second incoming line is electrical connected with said contact pin and shell respectively, and said jack is in order to the contact pin of ccontaining probe main body.
Probe of the present invention is through the earth point with first and second an incoming line difference contact measured point and an as close as possible said tested point; And needn't contact said tested point with probe; Thereby make the probe can be away from the interference of magnet assembly; Improve the accuracy of measuring, increased the movability of probe when measuring.
Description of drawings
Fig. 1 is the split figure of probe preferred embodiments of the present invention, and this probe comprises a main body and a subtest tool.
Fig. 2 is the stereographic map of subtest tool among Fig. 1.
Fig. 3 is the user mode figure of probe of the present invention.
The main element symbol description
| |
10 |
| Contact |
100、202 |
| |
102 |
| |
104 |
| The |
20 |
| |
200 |
| Jack | 204 |
| First, second |
206、208 |
Following embodiment will combine above-mentioned accompanying drawing to further specify the present invention.
Embodiment
Please refer to Fig. 1 and Fig. 2, the preferred embodiments of probe of the present invention comprises a main body 10 and a subtest tool 20.
Said main body 10 comprises a contact pin 100, a body 102 and a lead 104.Said contact pin 100 is arranged on the said body 102 and is non-electric-connecting with said body 102, and said lead 104 is used for the negative signal of the positive signal of said contact pin 100 and said body 102 is passed to oscillograph (figure does not show).Said subtest tool 20 comprises contact pin 202 and first, second incoming line 206,208 that a shell 200, is connected with said shell 200.Said shell roughly in a tubular form.Said contact pin 202 is fixed in an end of said shell 200, and a jack 204 is opened in the other end of said shell 200.Said contact pin 202 is electrically connected with said jack 204, and said contact pin 202 and said jack 204 are electrical connected with said shell 200 is all non-.One end of said first and second incoming line 206,208 is electrical connected with said contact pin 202 and shell 200 respectively.
See also Fig. 3, during use, in the said jack 204 of contact pin 100 insertions with said main body 10, so that said contact pin 100 and body 102 are electrical connected with said jack 204 and said shell 200 respectively.Respectively said first incoming line 206 is contacted with tested point (figure does not show) afterwards; With said second incoming line, 208 contacts as close as possible earth point around said tested point, so can the signal of tested point be transferred to oscillographic measurement port through said first and second incoming line 206,208.
And; The present invention also can be set in a heat-shrinkable T bush 30 junction of said main body 10 and said shell 200; So that said main body 10 and said subsidiary tool 20 firmly combine, make said probe when measuring, to move freely and can not influence the transmission of signal when measuring.
Probe of the present invention is through the earth point with first and second an incoming line difference contact measured point and an as close as possible said tested point; And needn't contact said tested point with probe; Thereby make the probe can be away from the interference of magnet assembly; Improve the accuracy of measuring, increased probe movability when measuring.
Claims (5)
1. probe; Comprise a main body and a subtest tool; Said main body comprises a contact pin, a body and a lead, and said contact pin is arranged on the said body and is non-electric-connecting with said body, and said subtest tool comprises contact pin and first, second incoming line that a shell, is connected with said shell; Said contact pin is fixed in an end of said shell; One jack is opened in the other end of said shell, and said contact pin is electrically connected with said jack, and said contact pin and said jack and said shell are all non-to be electrical connected; One end of said first and second incoming line is electrical connected with said contact pin and shell respectively, and the contact pin of said main body is used to insert in the jack of said subtest tool.
2. probe as claimed in claim 1 is characterized in that: said probe also comprises a heat-shrinkable T bush, in the time of in the jack of main body contact pin insertion subtest tool, is set in the junction of main body and subtest tool.
3. probe as claimed in claim 1 is characterized in that: said shell in a tubular form.
4. probe subtest tool; Comprise contact pin and first, second incoming line that a shell, is connected with said shell, said contact pin is fixed in an end of said shell, and a jack is opened in the other end of said shell; Said contact pin is electrically connected with said jack; Said contact pin and said jack and said shell are all non-to be electrical connected, and an end of said first and second incoming line is electrical connected with said contact pin and shell respectively, and said jack is in order to the contact pin of ccontaining probe main body.
5. probe subtest tool as claimed in claim 4, said shell in a tubular form.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011101397664A CN102798740A (en) | 2011-05-27 | 2011-05-27 | Probe and auxiliary test jig thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011101397664A CN102798740A (en) | 2011-05-27 | 2011-05-27 | Probe and auxiliary test jig thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102798740A true CN102798740A (en) | 2012-11-28 |
Family
ID=47197909
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011101397664A Pending CN102798740A (en) | 2011-05-27 | 2011-05-27 | Probe and auxiliary test jig thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102798740A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106124887A (en) * | 2016-06-14 | 2016-11-16 | 合肥联宝信息技术有限公司 | A kind of anti-static electricity interference probe |
-
2011
- 2011-05-27 CN CN2011101397664A patent/CN102798740A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106124887A (en) * | 2016-06-14 | 2016-11-16 | 合肥联宝信息技术有限公司 | A kind of anti-static electricity interference probe |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20121128 |