CN203705493U - Oscilloscope probe for testing ripple waves - Google Patents
Oscilloscope probe for testing ripple waves Download PDFInfo
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- CN203705493U CN203705493U CN201320856284.5U CN201320856284U CN203705493U CN 203705493 U CN203705493 U CN 203705493U CN 201320856284 U CN201320856284 U CN 201320856284U CN 203705493 U CN203705493 U CN 203705493U
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- 239000000523 sample Substances 0.000 title claims abstract description 233
- 238000012360 testing method Methods 0.000 title claims abstract description 92
- 238000005538 encapsulation Methods 0.000 claims description 12
- 239000003990 capacitor Substances 0.000 abstract 1
- 238000009434 installation Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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Abstract
The utility model belongs to the testing field and provides an oscilloscope probe for testing ripple waves. The oscilloscope probe comprises a connector connected with an oscilloscope, a signal probe and a grounding probe. The signal probe is connected with the connector via a cable. The signal probe comprises a probe body and a signal feeler pin. The oscilloscope probe is characterized in that the grounding probe comprises a transverse supporting arm and a vertical grounding feeler pin. The transverse supporting arm is connected with the probe body. The length of the transverse supporting arm is matched with the distance between the power supply pin and the grounding pin of an output capacitor of a to-be-tested circuit. The oscilloscope probe is accurate in test result. When the oscilloscope probe is used for testing ripple waves, the double-hand operation is not required. Therefore, the operation is very convenient.
Description
Technical field
The utility model relates to field tests, relates in particular to a kind of oscilloprobe of testing ripple.
Background technology
The oscilloprobe of the test ripple of prior art comprises the connector, signal probe and the grounded probe that are connected with oscillograph, wherein, signal probe is connected with connector by cable with grounded probe, grounded probe is fixing grounded probe, because a grounded probe will be suitable for the electric capacity of various encapsulation specifications, therefore grounded probe adopts longer ground wire.While using oscilloprobe test ripple, hand of tester is held signal probe and is contacted with the signal testing point of tested electronic equipment, and another hand is held grounded probe and contacted with earth point.In the time of test ripple, often require the earth terminal of probe putting nearest ground from signal testing, because grounded probe is longer, therefore in the time of the smaller electric capacity of test package specification, the earth terminal of probe is positioned at the ground away from from signal testing point, therefore can introduce interference, cause waveform ripple very large, exist the ripple accuracy of test not high, the problem that error is very large, and due to needs bimanualness, therefore inconvenient operation.
Utility model content
The purpose of this utility model is to provide a kind of oscilloprobe of testing ripple, and the oscilloprobe that is intended to the test ripple that solves prior art exists the ripple accuracy of test not high, and error is very large, the problem of inconvenient operation.
The utility model provides a kind of oscilloprobe of testing ripple, described oscilloprobe comprises: the connector, signal probe and the grounded probe that are connected with oscillograph, wherein, described signal probe is connected with described connector by cable, described signal probe comprises probe body and signal probe, described grounded probe comprises cross-brace arm and vertical grounded probe, described cross-brace arm is connected with described probe body, and the distance between the power pins of the length of described cross-brace arm and the output capacitance of circuit under test and ground pin is mated.
Further, described grounded probe comprises that cross-brace arm and vertical grounded probe are specially:
Described grounded probe comprises integrated multiple ground connection probe, described multiple ground connection probe is positioned at around the probe body of described signal probe, interval preset distance between described ground connection probe, each ground connection probe is for connecing a kind of output capacitance that encapsulates specification, and each ground connection probe comprises cross-brace arm and vertical grounded probe;
Distance between the power pins of the length of described cross-brace arm and the output capacitance of circuit under test and ground pin is mated and is specially:
Distance between the length of cross-brace arm of each ground connection probe and a kind of power pins of output capacitance of the circuit under test that encapsulates specification and ground pin is mated.
Further, described grounded probe comprises that cross-brace arm and vertical grounded probe are specially:
Described grounded probe comprises the total arm of cross-brace and vertical grounded probe;
Described cross-brace arm is connected and is specially with described probe body:
The total arm of cross-brace of described grounded probe is connected with the probe body of described signal probe;
Distance between the power pins of the length of described cross-brace arm and the output capacitance of circuit under test and ground pin is mated and is specially:
The total arm of described cross-brace has multiple flexible connections position, multiple active connection parts bit interval preset distance, described vertical grounded probe is arranged on any one and is flexibly connected position, each flexible connection position is to being a cross-brace arm between the probe body of described signal probe, the power pins of the length of each cross-brace arm and a kind of output capacitance of the circuit under test that encapsulates specification and the distance between pin mate.
In the utility model, because the distance between the length of cross-brace arm of grounded probe and the power pins of the output capacitance of circuit under test and ground pin is mated, therefore grounded probe is the position that is connected on immediate ground, and therefore the result of test is the most accurate.And because grounded probe has cross-brace arm, therefore while circuit under test being carried out to ripple test, do not need bimanualness, as long as one holds the probe body part of signal probe, the signal probe of oscilloprobe and vertical grounded probe are connected on respectively to the two ends of the output capacitance of circuit under test, therefore operation is very easy, flexible.
Accompanying drawing explanation
Fig. 1 is the oscilloprobe schematic diagram of the test ripple that provides of the utility model embodiment mono-.
Fig. 2 is the oscilloprobe schematic diagram of the test ripple that provides of the utility model embodiment bis-.
Fig. 3 is the oscilloprobe schematic diagram of the test ripple that provides of the utility model embodiment tri-.
Embodiment
In order to make the purpose of this utility model, technical scheme and beneficial effect clearer, below in conjunction with drawings and Examples, the utility model is further elaborated.Should be appreciated that specific embodiment described herein is only in order to explain the utility model, and be not used in restriction the utility model.
For technical scheme described in the utility model is described, describe below by specific embodiment.
embodiment mono-:
Refer to Fig. 1, the oscilloprobe 1 of the test ripple that the utility model embodiment mono-provides comprises: the connector 11, signal probe 12 and the grounded probe 13 that are connected with oscillograph, wherein, signal probe 12 is connected with connector 11 by cable 14, signal probe 12 comprises probe body 121 and signal probe 122, and grounded probe 13 comprises cross-brace arm 131 and vertical grounded probe 132.The cross-brace arm 131 of grounded probe 13 is flexibly connected with the probe body 121 of signal probe 12, the mode being flexibly connected can be those skilled in the art the movable connection method of thinkable multiple prior art, the active connection place with probe body 121 of for example cross-brace arm 131 is annulus of non-closure, when installation, by the mode of extruding, the annulus of non-closure is inserted in to probe body 121; Or, the active connection place with probe body 121 of cross-brace arm 131 is closed annulus, when installation, annulus is inserted in to probe body 121 from signal probe 122 positions, the active connection place with cross-brace arm 131 of probe body 121 has multiple projections, so that cross-brace arm 131 is fixed in probe body 121.Distance between the length of cross-brace arm 131 of grounded probe 13 and the power pins of the output capacitance of circuit under test and ground pin is mated.The power pins of output capacitance and ground pin may be positioned at both sides or the homonymy of the encapsulation of output capacitance, if the power pins of output capacitance and ground pin are positioned at the both sides of the encapsulation of output capacitance, the package length of the length of cross-brace arm 131 and the output capacitance of circuit under test equates substantially.The active connection place of the probe body 121 of signal probe 12 and the cross-brace arm 131 of grounded probe 13 equates with the length of vertical grounded probe 132 substantially to the distance of signal probe 122, and ripple test is carried out at the two ends that are connected on output capacitance to facilitate.Due to the plurality of specifications that is packaged with of output capacitance, for example 0201,0402,0603 etc., and because the cross-brace arm 131 of grounded probe 13 and the probe body 121 of signal probe 12 are flexibly connected, the oscilloprobe 1 of the test ripple therefore providing for the utility model embodiment mono-, the grounded probe 13 of multiple different size can also be provided, the length of cross-brace arm 131 of the grounded probe 13 of every kind of specification and a kind of power pins of output capacitance of specification and the ground distance between pin is mated, and carries out ripple test to be connected in the output capacitance of different size.
When circuit under test is carried out to ripple test, the signal probe of oscilloprobe 1 122 and vertical grounded probe 132 are connected on respectively to the two ends of the output capacitance of circuit under test, because the distance between the length of cross-brace arm 131 of grounded probe 13 and the power pins of the output capacitance of circuit under test and ground pin is mated, therefore grounded probe is the position that is connected on immediate ground, and therefore the result of test is the most accurate.And because grounded probe 13 has cross-brace arm 131, therefore while circuit under test being carried out to ripple test, do not need bimanualness, as long as one holds probe body 121 parts of signal probe 12, the two ends that the signal probe of oscilloprobe 1 122 and vertical grounded probe 132 are connected on respectively to the output capacitance of circuit under test, therefore operation is very easy.
embodiment bis-:
Refer to Fig. 2, the oscilloprobe 2 of the test ripple that the utility model embodiment bis-provides comprises: the connector 21 being connected with oscillograph, signal probe 22 and a grounded probe 23, wherein, signal probe 22 is connected with connector 21 by cable 24, signal probe 22 comprises probe body 221 and signal probe 222, grounded probe 23 comprises integrated multiple ground connection probe, multiple ground connection probes are positioned at around the probe body 221 of signal probe 22, interval preset distance between ground connection probe, each ground connection probe is for connecing a kind of output capacitance that encapsulates specification, each ground connection probe comprises cross-brace arm 231 and vertical grounded probe 232.The cross-brace arm 231 of grounded probe 23 is connected with the probe body 221 of signal probe 22, connected mode can be flexibly connected or be fixedly connected with, the mode being flexibly connected can be those skilled in the art the movable connection method of thinkable multiple prior art, the active connection place with probe body 221 of for example cross-brace arm 231 is annulus of non-closure, when installation, by the mode of extruding, the annulus of non-closure is inserted in to probe body 221; Or, the active connection place with probe body 221 of cross-brace arm 231 is closed annulus, when installation, annulus is inserted in to probe body 221 from signal probe 222 positions, the active connection place with cross-brace arm 231 of probe body 221 has multiple projections, so that cross-brace arm 231 is fixed in probe body 221.Distance between the length of cross-brace arm 231 of each ground connection probe and a kind of power pins of output capacitance of the circuit under test that encapsulates specification and ground pin is mated.The power pins of output capacitance and ground pin may be positioned at both sides or the homonymy of the encapsulation of output capacitance, if the power pins of output capacitance and ground pin are positioned at the both sides of the encapsulation of output capacitance, the length of the cross-brace arm 231 of each ground connection probe equates substantially with a kind of package length of output capacitance of the circuit under test that encapsulates specification.The active connection place of the probe body 221 of signal probe 22 and the cross-brace arm 231 of grounded probe 23 equates with the length of vertical grounded probe 232 substantially to the distance of signal probe 222, and ripple test is carried out at the two ends that are connected on output capacitance to facilitate.
The grounded probe 23 of the oscilloprobe 2 of the test ripple providing due to the utility model embodiment bis-comprises multiple integrated ground connection probes, the length of cross-brace arm 231 of each ground connection probe and a kind of power pins of output capacitance of the circuit under test that encapsulates specification and the distance between pin mate, therefore can be connected in the output capacitance of different size and carry out ripple test.
When circuit under test is carried out to ripple test, the signal probe of oscilloprobe 2 222 and vertical grounded probe 232 are connected on respectively to the two ends of the output capacitance of circuit under test, in the time that test another kind encapsulates the output capacitance of circuit under test of specification, rotate grounded probe 23, make signal probe 222 and another vertical grounded probe 232 be connected on the two ends of the output capacitance of the circuit under test of another kind of encapsulation specification.Because the distance between the length of cross-brace arm 231 of grounded probe 23 and the power pins of the output capacitance of circuit under test and ground pin is mated, therefore grounded probe is the position that is connected on immediate ground, and therefore the result of test is the most accurate.And because grounded probe 23 has cross-brace arm 231, therefore while circuit under test being carried out to ripple test, do not need bimanualness, as long as one holds probe body 221 parts of signal probe 22, the signal probe of oscilloprobe 2 222 and vertical grounded probe 232 are connected on respectively to the two ends of the output capacitance of circuit under test, therefore operation is very easy, flexible.
embodiment tri-:
Refer to Fig. 3, the oscilloprobe 3 of the test ripple that the utility model embodiment tri-provides comprises: the connector 31, signal probe 32 and the grounded probe 33 that are connected with oscillograph, wherein, signal probe 32 is connected with connector 31 by cable 34, signal probe 32 comprises probe body 321 and signal probe 322, and grounded probe 33 comprises the total arm 331 of cross-brace and vertical grounded probe 332.The total arm 331 of cross-brace of grounded probe 33 is connected with the probe body 321 of signal probe 32, connected mode can be flexibly connected or be fixedly connected with, the mode being flexibly connected can be those skilled in the art the movable connection method of thinkable multiple prior art, the active connection place with probe body 321 of the total arm 331 of for example cross-brace is annulus of non-closure, when installation, by the mode of extruding, the annulus of non-closure is inserted in to probe body 321; Or, the active connection place with probe body 321 of the total arm 331 of cross-brace is closed annulus, when installation, annulus is inserted in to probe body 321 from signal probe 322 positions, the active connection place with the total arm 331 of cross-brace of probe body 321 has multiple projections, so that total cross-brace arm 331 is fixed in probe body 321.The total arm 331 of cross-brace has multiple flexible connections position 333, multiple flexible connections position 333 interval preset distances, vertical grounded probe 332 can be arranged on any one and be flexibly connected position 333, each flexible connection position 333 is between the probe body 321 of signal probe 32 being a cross-brace arm, and the distance between power pins and the ground pin of the length of each cross-brace arm and a kind of output capacitance of the circuit under test that encapsulates specification is mated.The power pins of output capacitance and ground pin may be positioned at both sides or the homonymy of the encapsulation of output capacitance, if the power pins of output capacitance and ground pin are positioned at the both sides of the encapsulation of output capacitance, the length of cross-brace arm equates substantially with a kind of package length of output capacitance of the circuit under test that encapsulates specification.The active connection place of the probe body 321 of signal probe 32 and the total arm 331 of cross-brace of grounded probe 33 equates with the length of vertical grounded probe 332 substantially to the distance of signal probe 322, and ripple test is carried out at the two ends that are connected on output capacitance to facilitate.
The grounded probe 33 of the oscilloprobe 3 of the test ripple providing due to the utility model embodiment tri-comprises the total arm 331 of cross-brace and vertical grounded probe 332, the total arm 331 of cross-brace has multiple flexible connections position 333, multiple flexible connections position 333 interval preset distances, vertical grounded probe 332 can be arranged on any one and be flexibly connected position 333, each flexible connection position 333 is between the probe body 321 of signal probe 32 being a cross-brace arm, distance between the power pins of the length of each cross-brace arm and a kind of output capacitance of the circuit under test that encapsulates specification and ground pin is mated, therefore can be connected in the output capacitance of different size and carry out ripple test.
When circuit under test is carried out to ripple test, the signal probe of oscilloprobe 3 322 and vertical grounded probe 332 are connected on respectively to the two ends of the output capacitance of circuit under test, in the time that test another kind encapsulates the output capacitance of circuit under test of specification, grounded probe 332 is taken off from being flexibly connected position 333, reinstall to another and be flexibly connected position 333, make signal probe 322 and vertical grounded probe 332 be connected on the two ends of the output capacitance of the circuit under test of another kind of encapsulation specification.Because the distance between the length of cross-brace arm of grounded probe 33 and the power pins of the output capacitance of circuit under test and ground pin is mated, therefore grounded probe is the position that is connected on immediate ground, and therefore the result of test is the most accurate.And because grounded probe 33 has the total arm 331 of cross-brace, therefore while circuit under test being carried out to ripple test, do not need bimanualness, as long as one holds probe body 321 parts of signal probe 32, the signal probe of oscilloprobe 3 322 and vertical grounded probe 332 are connected on respectively to the two ends of the output capacitance of circuit under test, therefore operation is very easy, flexible.
The foregoing is only preferred embodiment of the present utility model; not in order to limit the utility model; all any modifications of doing within spirit of the present utility model and principle, be equal to and replace and improvement etc., within all should being included in protection domain of the present utility model.
Claims (10)
1. test the oscilloprobe of ripple for one kind, described oscilloprobe comprises: the connector, signal probe and the grounded probe that are connected with oscillograph, wherein, described signal probe is connected with described connector by cable, described signal probe comprises probe body and signal probe, it is characterized in that, described grounded probe comprises cross-brace arm and vertical grounded probe, described cross-brace arm is connected with described probe body, and the distance between the power pins of the length of described cross-brace arm and the output capacitance of circuit under test and ground pin is mated.
2. oscilloprobe as claimed in claim 1, is characterized in that, described cross-brace arm is to be flexibly connected with described probe body.
3. oscilloprobe as claimed in claim 2, it is characterized in that, described oscilloprobe also comprises the grounded probe of multiple different size, and the distance between the length of cross-brace arm of the grounded probe of every kind of specification and a kind of power pins of output capacitance of specification and ground pin is mated.
4. the oscilloprobe as described in claims 1 to 3 any one, it is characterized in that, if the power pins of output capacitance and ground pin are positioned at the both sides of the encapsulation of output capacitance, the package length of the length of described cross-brace arm and the output capacitance of circuit under test equates substantially.
5. oscilloprobe as claimed in claim 1, is characterized in that, described grounded probe comprises that cross-brace arm and vertical grounded probe are specially:
Described grounded probe comprises integrated multiple ground connection probe, described multiple ground connection probe is positioned at around the probe body of described signal probe, interval preset distance between described ground connection probe, each ground connection probe is for connecing a kind of output capacitance that encapsulates specification, and each ground connection probe comprises cross-brace arm and vertical grounded probe;
Distance between the power pins of the length of described cross-brace arm and the output capacitance of circuit under test and ground pin is mated and is specially:
Distance between the length of cross-brace arm of each ground connection probe and a kind of power pins of output capacitance of the circuit under test that encapsulates specification and ground pin is mated.
6. oscilloprobe as claimed in claim 5, is characterized in that, described cross-brace arm is to be flexibly connected or to be fixedly connected with described probe body.
7. the oscilloprobe as described in claim 5 or 6, it is characterized in that, if the power pins of output capacitance and ground pin are positioned at the both sides of the encapsulation of output capacitance, the length of the cross-brace arm of described each ground connection probe equates substantially with a kind of package length of output capacitance of the circuit under test that encapsulates specification.
8. the oscilloprobe as described in claim 1 or 5, is characterized in that, described probe body equates substantially with junction to the distance of described signal probe and the length of described vertical grounded probe of described cross-brace arm.
9. oscilloprobe as claimed in claim 1, is characterized in that, described grounded probe comprises that cross-brace arm and vertical grounded probe are specially:
Described grounded probe comprises the total arm of cross-brace and vertical grounded probe;
Described cross-brace arm is connected and is specially with described probe body:
The total arm of cross-brace of described grounded probe is connected with the probe body of described signal probe;
Distance between the power pins of the length of described cross-brace arm and the output capacitance of circuit under test and ground pin is mated and is specially:
The total arm of described cross-brace has multiple flexible connections position, multiple active connection parts bit interval preset distance, described vertical grounded probe is arranged on any one and is flexibly connected position, each flexible connection position is to being a cross-brace arm between the probe body of described signal probe, the power pins of the length of each cross-brace arm and a kind of output capacitance of the circuit under test that encapsulates specification and the distance between pin mate.
10. oscilloprobe as claimed in claim 9, it is characterized in that, if the power pins of output capacitance and ground pin are positioned at the both sides of the encapsulation of output capacitance, the length of described each cross-brace arm equates substantially with a kind of package length of output capacitance of the circuit under test that encapsulates specification.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320856284.5U CN203705493U (en) | 2013-12-23 | 2013-12-23 | Oscilloscope probe for testing ripple waves |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320856284.5U CN203705493U (en) | 2013-12-23 | 2013-12-23 | Oscilloscope probe for testing ripple waves |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203705493U true CN203705493U (en) | 2014-07-09 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320856284.5U Expired - Lifetime CN203705493U (en) | 2013-12-23 | 2013-12-23 | Oscilloscope probe for testing ripple waves |
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| Country | Link |
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| CN (1) | CN203705493U (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106019169A (en) * | 2016-05-11 | 2016-10-12 | 深圳市优必选科技有限公司 | power supply ripple noise test probe and test method |
| WO2017152567A1 (en) * | 2016-03-09 | 2017-09-14 | 中兴通讯股份有限公司 | Oscilloscope probe, method, apparatus and system for testing ripple |
| WO2017202246A1 (en) * | 2016-05-25 | 2017-11-30 | 深圳市中兴微电子技术有限公司 | Auxiliary device for use in voltage waveform measurement, and voltage waveform measurement device |
| CN108089037A (en) * | 2016-11-11 | 2018-05-29 | 弗兰克公司 | Magnetic coupling is grounded reference probe |
| CN109521232A (en) * | 2018-11-20 | 2019-03-26 | 闻泰通讯股份有限公司 | Oscilloprobe auxiliary test unit |
-
2013
- 2013-12-23 CN CN201320856284.5U patent/CN203705493U/en not_active Expired - Lifetime
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017152567A1 (en) * | 2016-03-09 | 2017-09-14 | 中兴通讯股份有限公司 | Oscilloscope probe, method, apparatus and system for testing ripple |
| CN107179428A (en) * | 2016-03-09 | 2017-09-19 | 中兴通讯股份有限公司 | Test oscilloprobe, method, the apparatus and system of ripple |
| CN106019169A (en) * | 2016-05-11 | 2016-10-12 | 深圳市优必选科技有限公司 | power supply ripple noise test probe and test method |
| WO2017202246A1 (en) * | 2016-05-25 | 2017-11-30 | 深圳市中兴微电子技术有限公司 | Auxiliary device for use in voltage waveform measurement, and voltage waveform measurement device |
| CN108089037A (en) * | 2016-11-11 | 2018-05-29 | 弗兰克公司 | Magnetic coupling is grounded reference probe |
| CN108089037B (en) * | 2016-11-11 | 2021-09-28 | 弗兰克公司 | Magnetic coupling ground reference probe |
| CN109521232A (en) * | 2018-11-20 | 2019-03-26 | 闻泰通讯股份有限公司 | Oscilloprobe auxiliary test unit |
| CN109521232B (en) * | 2018-11-20 | 2023-09-19 | 闻泰通讯股份有限公司 | Auxiliary test device for oscilloscope probe |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140709 |
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| CX01 | Expiry of patent term |