WO2017202246A1

WO2017202246A1 - Auxiliary device for use in voltage waveform measurement, and voltage waveform measurement device

Info

Publication number: WO2017202246A1
Application number: PCT/CN2017/085071
Authority: WO
Inventors: 刘澎湖
Original assignee: 深圳市中兴微电子技术有限公司
Priority date: 2016-05-25
Filing date: 2017-05-19
Publication date: 2017-11-30
Also published as: CN205786902U

Abstract

An auxiliary device for use in voltage waveform measurement, and a voltage waveform measurement device. The auxiliary device comprises a first support rod (4), a second support rod (5), and a third support rod (6). The first support rod (4), second support rod (5), and third support rod (6) are connected via a connecting component (7) to form a three-pronged support. A probe holder is disposed at the first support rod (4), and fixes, to the first support rod (4), a probe handle (1) of an oscilloscope probe. The auxiliary device is utilized to simplify a process of measuring a voltage waveform, increasing efficiency and accuracy of voltage waveform measurement.

Description

Voltage ripple test aid and voltage ripple test device

Cross-reference to related applications

The present application is based on a Chinese patent application filed on Apr. 25, 2016, the entire disclosure of which is hereby incorporated by reference.

Technical field

The utility model relates to the technical field of electronic device testing, in particular to a voltage ripple test auxiliary device and a voltage ripple test device.

Background technique

Ripple is a phenomenon caused by voltage fluctuation of DC stabilized power supply. Because DC stabilized power supply is generally formed by AC power supply through rectification, voltage regulation, filtering, etc., this inevitably makes DC stability There are some AC components, and the AC component superimposed on the DC stability is called ripple. The composition of the ripple is more complicated. Its shape is generally a harmonic like a sine wave with a frequency higher than the power frequency, and sometimes it may be a pulse wave with a narrow width.

In the process of producing or inspecting electronic devices, in order to detect performance parameters of electronic devices, it is often necessary to perform voltage ripple testing on electronic devices. Among them, the use of oscilloscopes to test voltage ripple is one of the most common methods in the prior art. However, the existing method of testing voltage ripple with an oscilloscope has the following two drawbacks: First, although the oscilloscopes purchased on the market usually have probes, there is basically no bracket for the fixed probe, and the technician usually needs Hold the probe with your hand to make the probe touch the tested electronic device for voltage ripple test. However, the phenomenon of hand shake caused by the technician during the test will cause interference to the accuracy of the test result. Second, the voltage pattern In the wave test, in order to make the loop composed of the electronic device under test, the probe and the probe ground wire shorter, The smaller the electromagnetic noise entering the voltage ripple, the more it is necessary to repeatedly solder the ground wire to connect the probe ground clamp when debugging or testing the voltage ripple in different places of the board. This is not only time-consuming, but also easy to damage the board. .

Summary of the invention

In view of this, the embodiments of the present invention are expected to provide a voltage ripple test auxiliary device and a voltage ripple test device, which can simplify the voltage ripple test process and improve the efficiency and accuracy of the voltage ripple test.

In order to achieve the above object, the technical solution of the present invention is implemented as follows:

The utility model provides a voltage ripple test auxiliary device, which comprises a first pillar, a second pillar and a third pillar; the first pillar, the second pillar and the third pillar are connected by a hinge member to form a trigeminal bracket type. The first pillar is provided with a probe clip; the probe clamp fixes the probe of the oscilloscope probe to the first pillar.

In the above solution, the second pillar is a conductive rod; the probe ground wire clamp of the oscilloscope probe is clamped on the conductive rod; and the bottom end of the conductive rod is connected to the cathode of the electronic device to be tested.

In the above solution, the bottom end of the conductive bar is covered with a conductive sponge.

In the above solution, the probe holder includes a first probe holder and a second probe holder.

In the above solution, the height of the first probe clip is greater than the height of the second probe clip.

In the above solution, the first probe clip and the second probe clip are obliquely fixed to the side where the second pillar is located.

In the above solution, the top end of the first pillar is provided with a first handle; and the top end of the second pillar is provided with a second handle.

In the above solution, an elastic clip is disposed between the first pillar and the second pillar.

In the above solution, the bottom of the third pillar is a circular arc.

In the above solution, the first pillar and the third pillar are insulating rods.

The utility model also provides a voltage ripple testing device, comprising an oscilloscope and the voltage pattern A wave test aid; the oscilloscope includes an oscilloscope probe; the oscilloscope probe includes a probe, a probe, and a probe ground clamp.

The voltage ripple test auxiliary device and the voltage ripple test device provided by the embodiments of the present invention fix the probe of the oscilloscope probe through the three-prong bracket structure composed of the first pillar, the second pillar and the third pillar, thereby reducing the probe. During the voltage ripple test, the operator needs to hold the probe to perform the test operation, which can effectively prevent the measurement error caused or introduced by human factors, improve the efficiency and accuracy of the voltage ripple test; in addition, the oscilloscope probe The probe ground clamp is directly clamped on the second pillar having the conductive function. When debugging or testing the voltage ripple in different places of the single board, the welding ground wire is not required to be repeated on the single board, which simplifies the testing process and Can effectively reduce the risk of damage to the board.

DRAWINGS

FIG. 1 is a schematic structural diagram of a voltage ripple test auxiliary device according to an embodiment of the present invention.

detailed description

1 is a schematic structural diagram of a voltage ripple test auxiliary device according to an embodiment of the present invention. As shown in FIG. 1 , the device includes a first pillar 4, a second pillar 5, and a third pillar 6; The two pillars 5 and the third pillars 6 are connected by a hinge member 7 to form a three-prong bracket type; the first pillar 4 is provided with a probe holder; the probe holder fixes the probe 1 of the oscilloscope probe to the first pillar 4.

Here, the oscilloscope is used to measure and display the voltage ripple of the electronic device under test; the oscilloscope probe is an electronic device that connects the electronic device to be tested and the input end of the oscilloscope, and belongs to a fixed matching device of the oscilloscope for acquiring a voltage ripple signal. The oscilloscope probe includes a probe 1, a probe 2, and a probe ground clamp 3.

Here, the hinge member 7 can be a rivet or other movable adjustable fixture.

In an embodiment of the present invention, in order to facilitate adjustment of the distance between the first pillar 4, the second pillar 5, and the third pillar 6 and/or the angle between the first pillars 4, The size and/or shape of the three-legged bracket formed by the two pillars 5 and the third pillars 6 is adapted to the condition of the position of the electronic device to be tested. The top end of the first pillar 4 is provided with a first handle 10, and the top end of the second pillar 5 A second handle 11 is provided.

In an embodiment of the present invention, in order to make the distance between the first pillar 4 and the second pillar 5 not change when measuring the electronic device to be tested, the first pillar 4 and the second pillar 5 are disposed between Elastic clip 12.

Here, the elastic clip 12 may have one end disposed between the position where the first handle 10 is located and the position of the hinge member 7, and the other end disposed between the position where the second handle 11 is located and the position of the hinge member 7; the elastic clip 12 may also be provided at one end between the bottom end of the first strut 4 and the position of the hinge member 7, and the other end between the bottom end of the second strut 5 and the position of the hinge member 7.

In the embodiment of the present invention, in order to prevent the third pillar 6 that mainly serves as a support from sliding, and the position of the third pillar 6 is easily adjusted, the bottom of the third pillar 6 has a circular arc shape.

In an embodiment of the present invention, in order to enable the probe 1 to be stably fixed on the first pillar 4, the probe holder includes a first probe holder 8 and a second probe holder 9; The distance between the second probe clamp 9 and the bottom of the first pillar 4 is smaller than the distance between the first probe clamp 8 and the bottom of the first pillar 4; since the two ends of the probe 1 are generally not the same size, that is, the probe 1 The end near the probe 2 is generally larger than the diameter of the end of the clamp 3 near the probe, so that the probe 1 is tilted downward as much as possible during the measurement, so that the probe 2 is sufficiently in contact with the anode of the electronic device under test. Therefore, the height of the first probe clip 8 perpendicular to the first pillar 4 is greater than the height of the second probe clamp 9 perpendicular to the first pillar 4, that is, the height of the first probe clamp 8 can be set larger than the second probe. The height of the bar clamp 9; in addition, in order to facilitate the measurement process, the first probe bar 8 and the second probe bar 9 may be provided The tilting is fixed to the side where the second pillar 5 is located.

Here, the probe holder is fixed in motion, and the position of the probe holder can be adjusted according to the needs of the probe 1; the probe holder can also be replaced by other devices having a fixing function; the probe holder The number can also be two or more.

In an embodiment of the present invention, when the probe 1 is fixed to the first pillar 4 by the probe clip, the tip end of the probe 2 generally exceeds the bottom end of the first pillar 4, in order to facilitate the measurement process, The length of the first strut 4 may be set shorter than the length of the second strut 5.

When using the device to measure the voltage ripple of the electronic device, the operation steps can be as follows: turn on the oscilloscope and set the oscilloscope parameters, including setting the input mode of the probe to AC coupling, setting the oscilloscope bandwidth to 20 MHz, and setting the display mode to persistence. Connect the BNC connector of the oscilloscope probe to the corresponding input interface on the oscilloscope; fix the probe 1 to the first post 4 through the first probe holder 8 and the second probe holder 9; adjust the first probe holder 8. The position of the second probe clip 9 changes the position of the probe 1 on the first pillar 4, and adjusts the first pillar 4, the second pillar 5, and the third pillar by holding the first handle 10 and the second handle 11. 6 the distance between each other and / or the angle between each other, thereby changing the shape of the trigeminal support, so that the probe 2 is just in full contact with the anode of the electronic device under test; the probe ground clamp 3 and the The ground connection of the circuit where the electronic device is located begins to measure the voltage ripple of the electronic device under test.

This embodiment is to solve the problem of separately welding the ground wire from the circuit each time when the voltage ripple of the electronic device distributed in different positions in the measurement circuit in the first embodiment is solved. In this embodiment, the second pillar 5 is set to have Conductive function, conductive rod that can be used directly as a ground wire. 1 is a schematic structural diagram of a voltage ripple test auxiliary device according to an embodiment of the present invention. As shown in FIG. 1 , the device includes a first pillar 4, a second pillar 5, and a third pillar 6; The two pillars 5 and the third pillars 6 are connected by a hinge member 7 to form a three-prong bracket type; the first pillar 4 is provided with a probe holder; the probe holder fixes the probe 1 of the oscilloscope probe to the first pillar 4.

Here, the oscilloscope is used to measure and display the voltage ripple of the electronic device under test; the oscilloscope The probe is an electronic device that connects the tested electronic device to the input end of the oscilloscope, and is a fixed matching device of the oscilloscope for acquiring a voltage ripple signal; the oscilloscope probe includes a probe 1, a probe 2, and a probe ground clamp 3 .

Here, the hinge member 7 can be a rivet or other movable adjustable fixture.

In an embodiment of the present invention, in order to enable the probe 1 to be stably fixed on the first pillar 4, the probe holder includes a first probe holder 8 and a second probe holder 9; The distance between the second probe clamp 9 and the bottom of the first pillar 4 is smaller than the distance between the first probe clamp 8 and the bottom of the first pillar 4; since the two ends of the probe 1 are generally not the same size, that is, the probe 1 Approaching One end of the needle 2 is generally larger than the diameter of one end of the clamp 3 near the probe, so that the probe 1 is tilted as far as possible downward during the measurement, so that the probe 2 is sufficiently in contact with the anode of the electronic device under test, therefore, The height of the first probe bar 8 perpendicular to the first pillar 4 is greater than the height of the second probe clamp 9 perpendicular to the first pillar 4, that is, the height of the first probe clamp 8 can be set larger than the second probe clamp. In addition, in order to facilitate the measurement process, the first probe holder 8 and the second probe holder 9 may be disposed to be obliquely fixed to the position side of the second pillar 5.

In an embodiment of the present invention, the second pillar 5 is a conductive rod. Here, when the second pillar 5 is a conductive rod, when the voltage ripple test is performed on the electronic device, the bottom end of the conductive rod is connected to the cathode of the electronic device under test, and the probe ground clip 3 is sandwiched. The conductive rods are arranged so as to avoid the loops formed by the electronic device under test, the probe and the probe ground in the system board or the terminal board, so that each time it needs to be separately from the single board. The problem of soldering the ground wire.

In an embodiment of the present invention, in order to improve the accuracy of the voltage ripple test, the bottom end of the conductive bar is covered with a conductive sponge.

Here, the conductive sponge can play a role of thickening the ground line due to the large contact area; research experiments show that the thicker the ground line, the higher the accuracy of the voltage ripple test.

In an embodiment of the present invention, the first pillar 4 and the third pillar 6 are insulating rods.

Here, the first pillar 4 and the third pillar 6 are insulated rods to avoid introducing external noise into the voltage ripple during the measurement process, thereby reducing the accuracy of the measurement result; the insulating rod may be a plastic rod, A rubber rod or the like has one or more of electrical insulating functions.

When using the device to measure the voltage ripple of the electronic device, the operation steps can be as follows: turn on the oscilloscope and set the oscilloscope parameters, including setting the input mode of the probe to AC coupling, setting the oscilloscope bandwidth to 20 MHz, and setting the display mode to persistence. Connect the BNC connector of the oscilloscope probe to the corresponding input interface on the oscilloscope; fix the probe 1 to the first post 4 through the first probe holder 8 and the second probe holder 9; adjust the first probe holder 8. The position of the second probe clip 9 changes the position of the probe 1 on the first pillar 4, and adjusts the first pillar 4, the second pillar 5, and the third pillar by holding the first handle 10 and the second handle 11. 6 the distance between each other and / or the angle between each other, thereby changing the shape of the trigeminal support, so that the probe 2 is just in full contact with the anode of the electronic device under test; the probe ground clamp 3 is clamped to the material On the second pillar 5 of the metal rod, the conductive sponge covered by the bottom end of the second pillar 5 is in full contact with the cathode of the electronic device under test, and the first pillar 4 and the second pillar 5 are clamped by the elastic clamp 12 Tested electron Member, starts measuring the voltage ripple of the electronic devices being tested.

The above is only the preferred embodiment of the present invention and is not intended to limit the scope of the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and scope of the present invention are included in the scope of the present invention.

Industrial applicability

Claims

A voltage ripple test assisting device, the device comprising a first pillar (4), a second pillar (5), a third pillar (6); the first pillar (4), the second pillar (5), The third pillar (6) is connected by a hinge member (7) to form a trigeminal bracket type; the first pillar (4) is provided with a probe holder; the probe clamp fixes the probe of the oscilloscope probe (1) to the On the first pillar (4).
The device according to claim 1, wherein the second pillar (5) is a conductive rod; the probe ground clamp (3) of the oscilloscope probe is clamped on the conductive rod; the bottom end of the conductive rod is The cathode connection of the electronic device under test.
The device according to claim 2, wherein the bottom end of the conductive bar is covered with a conductive sponge.
Apparatus according to any one of claims 1 to 3, wherein the probe holder comprises a first probe holder (8) and a second probe holder (9).
The device according to claim 4, wherein the height of the first probe clip (8) is greater than the height of the second probe clip (9).
The apparatus according to claim 4, wherein said first probe holder (8) and said second probe holder (9) are obliquely fixed to a position side of said second pillar (5).
The device according to any one of claims 1 to 3, wherein a top end of the first pillar (4) is provided with a first handle (10); a top end of the second pillar (5) is provided with a second handle (11).
The device according to any one of claims 1 to 3, wherein an elastic clip (12) is disposed between the first pillar (5) and the second pillar (6).
The device according to any one of claims 1 to 3, wherein the bottom of the third pillar (6) is of a circular arc shape.
The device according to any one of claims 1 to 3, wherein the first pillar (4) and the third pillar (6) are insulating rods.
A voltage ripple testing device comprising an oscilloscope and any one of claims 1 to 10 The voltage ripple test aid device; the oscilloscope includes an oscilloscope probe; the oscilloscope probe includes a probe (1), a probe (2), and a probe ground clamp (3).