CN106124887A - A kind of anti-static electricity interference probe - Google Patents
A kind of anti-static electricity interference probe Download PDFInfo
- Publication number
- CN106124887A CN106124887A CN201610425655.2A CN201610425655A CN106124887A CN 106124887 A CN106124887 A CN 106124887A CN 201610425655 A CN201610425655 A CN 201610425655A CN 106124887 A CN106124887 A CN 106124887A
- Authority
- CN
- China
- Prior art keywords
- probe
- static
- static electricity
- handle
- electricity interference
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
Abstract
The present invention provides a kind of anti-static electricity interference probe, and for being connected with static gun, described anti-static electricity interference probe includes: handle；It is positioned at described handle one end for the union joint electrically connected with described static gun；And be positioned on the described handle other end and electrically connect with described union joint for receiving the electromagnetic wave of described static gun generation and by the probe portion on the appointment region of described electromagenetic wave radiation to electronic device.The electromagnetic wave that static gun produces can be coupled in the appointment region of electronic product by the anti-static electricity interference probe of the present invention, prevents exterior static interference, improves electromagnetic energy utilization rate.
Description
Technical field
The present invention relates to a kind of probe, particularly to a kind of anti-static electricity interference probe.
Background technology
In daily life, if weather is the driest, such as the winter in the north, we usually can run into such existing
As: before Shui Jue during depilation clothing, dark is often heard crack the sound, and with blue spark.Take taxi to get off and close the door
Time, the pain as finger tip acupuncture can be felt suddenly.During schoolgirl's combing hair in morning, can scatter between hair as bewitched, this is just
It is the electrostatic that carried of human body.Above-mentioned several phenomenons are exactly result produced by static electricity on human body.
When accumulation of static electricity to a certain extent, releasing of electrostatic can be produced because of human contact's metal object.Such as, we make
When using notebook computer, because finger tapping keyboard, and cause the electrostatic leakage of human body to above the keyboard of notebook computer.Institute
With, in carrying out product design process, international EMC (Electro Magnetic Compatibility electromagnetic compatibility need to be met
Property) requirement of regulation, i.e. electronic product must be carried out ESD (antistatic interference) protection Design.But, prevent even if devising ESD
Protecting design, electronic product the most also there will be the problem of ESD, the most also there will be static interference point, the most often runs into this type of
During problem, where designer needs to resolve step by step the noise spot of problem.
At present, only disturb and be analyzed by having the unit simulation ESD of fixing interfering frequency, or directly pass through electrostatic
Rifle is directed to electronic device (such as bare board) and tests.If by have the unit simulation ESD of fixing interfering frequency disturb into
Row is analyzed, it is impossible to the situation that actually occurs of realistic simulation ESD, and easily produces erroneous judgement.And if by static gun be directed in
Mainboard carries out ESD problem test, all can be done by ESD in the spatial field in the range of centered by the rifle head of static gun
Disturb, be still difficult to judgement and be disturbed and where be a little present in.
Summary of the invention
Problem to be solved by this invention be to provide a kind of can by static gun produce electromagnetic wave be coupled to electronic product
Appointment region in, prevent the anti-static electricity interference probe of exterior static interference.
In order to solve the problems referred to above, the present invention provides a kind of anti-static electricity interference probe, for being connected with static gun, described
Anti-static electricity interference probe includes:
Handle；
It is positioned at described handle one end for the union joint electrically connected with described static gun；And
It is positioned on the described handle other end and electrically connects with described union joint for receiving what described static gun produced
Described electromagenetic wave radiation to electronic device is also specified the probe portion on region by electromagnetic wave.
As preferably, described probe portion includes the irradiator with probe, and described probe runs through described handle, its one end with
Described union joint electrically connects, and the other end stretches out described handle contours and becomes electromagenetic wave radiation end.
As preferably, described probe portion also includes the metal screen being connected and surrounding described electromagenetic wave radiation end with described handle
Cover cover.
As preferably, described electromagenetic wave radiation end is provided with metallic plate.
As preferably, also include that connecting line, the two ends of described connecting line are connected with described union joint and static gun respectively.
Having the beneficial effects that of the anti-static electricity interference probe of the present invention, it is possible to the electromagnetic wave that static gun produces is coupled to electricity
In the appointment region of sub-product, prevent couple interregional with this appointment of exterior static interference electromagnetic wave, avoid electromagnetic wave simultaneously
Diffuse to perimeter, improve the utilization rate of electromagnetic energy.
Accompanying drawing explanation
Fig. 1 is the structural representation of the anti-static electricity interference probe of the present invention.
Fig. 2 is structural representation when being connected with connecting line of the anti-static electricity interference probe of the present invention (metal not shown in figure
Plate).
Reference:
1-handle；2-union joint；3-connecting line；4-probe；5-metallic shield；6-metallic plate.
Detailed description of the invention
Describe the present invention below in conjunction with accompanying drawing.
As depicted in figs. 1 and 2, a kind of anti-static electricity interference probe, it is connected with static gun and coordinates electricity for static gun
Sub-product carries out EMC (Electro Magnetic Compatibility) test.This anti-static electricity interference probe includes:
Handle 1；
It is positioned at handle 1 one end for the union joint 1 electrically connected with static gun；Union joint 1 in the present embodiment is by one even
Wiring 3 is connected with static gun；
It is positioned on handle 1 other end and electrically connects with union joint 1 for receiving the electromagnetic wave of static gun generation (i.e.
Electrostatic wave) and by the probe portion on the appointment region of this electromagenetic wave radiation to electronic device.
Specifically, continuing with Fig. 1 and Fig. 2, this probe portion includes irradiator and the metallic shield 5 with probe 4, should
Probe 4 runs through handle 1, and its one end electrically connects with union joint 1, and the other end stretches out outside handle 1 and forms electromagenetic wave radiation end, electromagnetism
Wave radiation end is provided with metallic plate 6.This metallic plate 6 primarily serves the effect strengthening probe 4 electromagnetic radiation intensity of wave.This metallic plate
The shape and structure of 6 is unique, can be circular alternatively rectangle etc..Metallic shield 5 is connected with handle 1 and surrounds electromagenetic wave radiation
End and metallic plate 6.The shape and structure of this metallic shield 5 is not the most unique, can be hemispherical, it is possible to for cubic type.
During concrete operations, static gun is connected with anti-static electricity interference probe by connecting line 3, then anti-static electricity interference is visited
Rod is placed on electronic product and makes the uncovered of metallic shield 5 to rectify electronic product again, opens static gun, and now probe 4 is just
Can receive the electromagnetic wave that static gun sends, and electromagnetic wave is radiated to electronic product by metallic plate 6 be set by metallic shield 5 cover
In the region lived, metallic shield 5 utilizes the action principle of Faraday shield cage to enable electromagnetic wave to be coupled only on this region,
And make this region not by extraneous static interference, namely the interference range of electromagnetic wave on electronic product is controlled in metallic shield
Within the scope of cover 5 is covered and sets, if electronic product now operation irregularity, then illustrate that metallic shield 5 is covered the region set and is
The region of static interference ripple coupling, i.e. noise spot.
The anti-static electricity interference probe simple in construction of the present invention, easy to operate, it is greatly enhanced by arranging metallic shield 5
The test intensity of static gun and the accuracy of test, improve the utilization rate of electromagnetic energy simultaneously.
Above example is only the exemplary embodiment of the present invention, is not used in the restriction present invention, protection scope of the present invention
It is defined by the claims.The present invention can be made respectively in the essence of the present invention and protection domain by those skilled in the art
Planting amendment or equivalent, this amendment or equivalent also should be regarded as being within the scope of the present invention.
Claims (5)
1. an anti-static electricity interference probe, for being connected with static gun, it is characterised in that described anti-static electricity interference probe includes:
Handle；
It is positioned at described handle one end for the union joint electrically connected with described static gun；And
It is positioned on the described handle other end and electrically connects with described union joint for receiving the electromagnetism that described static gun produces
Described electromagenetic wave radiation to electronic device is also specified the probe portion on region by ripple.
Anti-static electricity interference probe the most according to claim 1, it is characterised in that described probe portion includes the spoke with probe
Emitter, described probe runs through described handle, and its one end electrically connects with described union joint, and the other end stretches out described handle contours and becomes electricity
Electromagnetic wave radiation end.
Anti-static electricity interference probe the most according to claim 2, it is characterised in that described probe portion also includes and described handle
It is connected and surrounds the metallic shield of described electromagenetic wave radiation end.
Anti-static electricity interference probe the most according to claim 3, it is characterised in that described electromagenetic wave radiation end is provided with metal
Plate.
Anti-static electricity interference probe the most according to claim 4, it is characterised in that also include connecting line, described connecting line
Two ends are connected with described union joint and static gun respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610425655.2A CN106124887A (en) | 2016-06-14 | 2016-06-14 | A kind of anti-static electricity interference probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610425655.2A CN106124887A (en) | 2016-06-14 | 2016-06-14 | A kind of anti-static electricity interference probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106124887A true CN106124887A (en) | 2016-11-16 |
Family
ID=57470358
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610425655.2A Pending CN106124887A (en) | 2016-06-14 | 2016-06-14 | A kind of anti-static electricity interference probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106124887A (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201037848Y (en) * | 2007-04-19 | 2008-03-19 | 沈芳珍 | Insulation testing probe |
| CN201075114Y (en) * | 2007-07-13 | 2008-06-18 | 苏州光韵达光电科技有限公司 | IC testing control tool |
| CN102375094A (en) * | 2010-08-19 | 2012-03-14 | 鸿富锦精密工业（深圳）有限公司 | Electromagnetic radiation measuring device |
| CN102798740A (en) * | 2011-05-27 | 2012-11-28 | 鸿富锦精密工业（深圳）有限公司 | Probe and auxiliary test jig thereof |
| CN203551722U (en) * | 2013-10-21 | 2014-04-16 | 合肥联宝信息技术有限公司 | ESD positioning device |
-
2016
- 2016-06-14 CN CN201610425655.2A patent/CN106124887A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201037848Y (en) * | 2007-04-19 | 2008-03-19 | 沈芳珍 | Insulation testing probe |
| CN201075114Y (en) * | 2007-07-13 | 2008-06-18 | 苏州光韵达光电科技有限公司 | IC testing control tool |
| CN102375094A (en) * | 2010-08-19 | 2012-03-14 | 鸿富锦精密工业（深圳）有限公司 | Electromagnetic radiation measuring device |
| CN102798740A (en) * | 2011-05-27 | 2012-11-28 | 鸿富锦精密工业（深圳）有限公司 | Probe and auxiliary test jig thereof |
| CN203551722U (en) * | 2013-10-21 | 2014-04-16 | 合肥联宝信息技术有限公司 | ESD positioning device |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20161116 |
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| RJ01 | Rejection of invention patent application after publication |