CN102728562A - Testing and sorting device for vertical light emitting diode - Google Patents
Testing and sorting device for vertical light emitting diode Download PDFInfo
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- CN102728562A CN102728562A CN2011100918310A CN201110091831A CN102728562A CN 102728562 A CN102728562 A CN 102728562A CN 2011100918310 A CN2011100918310 A CN 2011100918310A CN 201110091831 A CN201110091831 A CN 201110091831A CN 102728562 A CN102728562 A CN 102728562A
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Abstract
A testing and sorting device for a vertical light emitting diode relates to the field of photoelectric technology. The device of the present invention includes a disc to be tested, a test disc, a sorting disc and a testing system. The structure of the device is characterized in that the disc to be tested, the test disc and the sorting disc are all discs capable of rotating, moving horizontally and vertically. The disc to be tested arranged at one side of the test disc is provided with a chip, and the sorting disc is placed at the other side of the test disc. An upper surface of the test disc is provided with a plurality of placing grooves in a circle, and each placing groove bottom is connected to a vacuum tube. A probe and a needle are arranged at a position corresponding to a placing groove at a test position and above the test disc, and the probe and the needle are respectively connected with the testing system. A test suction nozzle capable of rotating transposition is arranged between the disc to be tested and the test disc, and a sorting suction nozzle capable of rotating transposition is arranged between the sorting disc and the test disc. The device of the invention can automatically realize testing and sorting operation on a vertical LED chip, and has the advantages of simple operation and high efficiency.
Description
Technical field
The present invention relates to field of photoelectric technology, especially for the testing, sorting device of vertical LED.
Background technology
The led light source of environmental protection will be used for lighting field, and high-power, high efficiency is the key element that makes it be able to popularize.The led chip of traditional structure is also claimed positive assembling structure LED, and its two electrodes are in same one side.A kind of led chip of vertical stratification in addition, its upper/lower electrode is distributed in two faces of epitaxial wafer.
In the prior art to the testing, sorting equipment major part of led chip to positive assembling structure.Mode roughly is; The positive assembling structure led chip sapphire that cuts, is cracked into single core grain is simultaneously adhered on the blue film; Prick two electrodes that are positioned at one side respectively with two probes, record its photo, the employing classifying rules that formulation is good in advance is divided into several classifications with the chip of these different photoelectric properties; A classification becomes a bin, exports a sorting document then.The information that the document comprises have the relative coordinate of chip on blue film, affiliated bin with and photoelectric characteristic.This document is transferred to screening installation, and screening installation can be according to these information, goes to accomplish the testing, sorting process on the blue film with the bin under it of die grading one by one.The led chip of vertical stratification is because its electrode is positioned at the both sides of chip, and it is impracticable adopting the mode of testing on traditional blue film, because blue film is an insulator, the bottom electrode that adheres on the blue film can't be connected to testing power supply.And the testing, sorting equipment that is exclusively used in the pipelining form of light emitting diode (LED) chip with vertical structure is not also seen the public reported mistake both at home and abroad.
Summary of the invention
To the deficiency that exists in the above-mentioned prior art, the purpose of this invention is to provide a kind of testing, sorting device that is used for vertical LED.It can realize test and separation operation to light emitting diode (LED) chip with vertical structure automatically, has characteristics simple to operate, that efficient is high.
In order to reach the foregoing invention purpose, technical scheme of the present invention realizes with following dual mode:
Mode one
A kind of testing, sorting device that is used for vertical LED, it comprises dish to be tested, test panel, separator plate and test macro.Its design feature is that said dish to be tested, test panel and separator plate all are made as disk rotatable, that move horizontally and move up and down.Place on the dish to be tested of test panel one side and be equipped with chip, separator plate places the opposite side of test panel.Test panel upper surface one circle is uniformly distributed with a plurality of standing grooves, and each standing groove bottom connects vacuum tube.The test panel top is equipped with probe and probe with the corresponding position of the standing groove of test position, and probe is connected with test macro respectively with probe.Be provided with the test suction nozzle that can rotate transposition between dish to be tested and the test panel, be provided with the sorting suction nozzle that can rotate transposition between separator plate and the test panel.
Mode two
A kind of testing, sorting device that is used for vertical LED, it comprises dish to be tested, test panel, separator plate and test macro.Said dish to be tested and separator plate all are made as disk rotatable, that move horizontally and move up and down, place on the dish to be tested of test panel one side and are equipped with chip, and separator plate places the opposite side of test panel.Test panel upper surface one circle is uniformly distributed with a plurality of standing grooves, and each standing groove bottom connects vacuum tube, and the test panel top is equipped with the probe and the probe that can move horizontally and move up and down, and probe is connected with test macro respectively with probe.Be provided with the test suction nozzle that can rotate transposition between dish to be tested and the test panel, be provided with the sorting suction nozzle that can rotate transposition between separator plate and the test panel.
The present invention has following beneficial effect owing to adopted above-mentioned structure:
1. a kind of device that is used for the light emitting diode (LED) chip with vertical structure testing, sorting is provided, a difficult problem that can't automatic test after having solved present light emitting diode (LED) chip with vertical structure and dissociating;
2. apparatus of the present invention have been given full play to the advantage of continuous productive process, couple together and can work simultaneously chip testing and sorting are organic, can effectively improve the speed of testing, sorting.
Below in conjunction with the accompanying drawing and the specific embodiment the present invention is described further.
Description of drawings
Fig. 1 is a structural representation of the present invention.
Specific embodiment
Embodiment one
Referring to Fig. 1, the present invention includes dish to be tested 102, test panel 104, separator plate 110 and test macro 108.Dish to be tested 102, test panel 104 and the disk of separator plate 110 for rotating, move horizontally and move up and down.Dish 102 to be tested places on the side of test panel 104 and puts chip 101, and separator plate 110 places the opposite side of test panel 104.Test panel 104 upper surfaces one circle is uniformly distributed with a plurality of standing grooves 105, and each standing groove 105 bottom connects vacuum tube.The corresponding position of the standing groove 105 of test panel 104 tops and test position is equipped with probe 107 and probe 106, and probe 107 is connected with test macro 108 respectively with probe 106.Be provided with the test suction nozzle 103 that can rotate transposition between dish 102 to be tested and the test panel 104, be provided with the sorting suction nozzle 109 that can rotate transposition between separator plate 110 and the test panel 104.
Testing, sorting step when the present invention uses is:
The first step: the chip 101 after expanding crystalline substance is positioned on the dish 102 to be tested, and dish 102 to be tested can be selected the general blue film of industry for use.By test suction nozzle 103 chip 101 is drawn to the standing groove 105 of test panel 104 test positions.Then, test panel 104 raises, and the test position vacuum is opened.The probe 107 of test position top distinguishes according to predefined test pattern in the test macro 108 whether the position, the left and right sides of chip 101 and the anglec of rotation be suitable.
Second step; Test panel 104 rises; And move a correction according to the chip of distinguishing 101 situations; Finally make the electrode on the chip 101 can accurately run into probe 106, the photoelectric characteristic of beginning test chip 101 generates these chip 101 pairing bin attribute shelves and preservation according to predefined minute bin condition then.Whenever test the photoelectric characteristic of a chip 101, test panel 104 rotates a step-length, makes next vacant standing groove 105 be positioned at test position, supplies test suction nozzle 103 to draw next chip 101 and is placed in this standing groove 105.
In the 3rd step, test panel 104 descends and chip 101 is rotated to sort location, and the sort location vacuum is closed.Sort location is provided with the sorting camera, and the sorting camera is distinguished the position of this chip 101 according to predefined test pattern, and computer can access the corresponding bin attribute shelves of this chip 101 according to the step-length number that test panel 104 rotates.Sorting suction nozzle 109 is drawn the chip 101 of sort location to separator plate 110.When need changing separator plate 110, test panel 104 can stop operating, and treats that new separator plate 110 rotates after in place more again.
In the 4th step, repeat above step and can finally accomplish testing, sorting a plurality of chips 101.
Embodiment two
The difference of the structure of the embodiment of the invention two and method and embodiment one is; Test panel 104 is fixed, and test suction nozzle 103, probe 107 and probe 106, sorting suction nozzle 109 are then accomplished testing, sorting through moving horizontally and moving up and down to each chip 101 on the test panel 104.
Under most of situation, the test suction nozzle 103 in apparatus of the present invention, test panel 104, sorting suction nozzle 109 are synchronization jobs, therefore can test simultaneously and sorting work, have improved operating efficiency.
Claims (2)
1. testing, sorting device that is used for vertical LED; It comprises dish to be tested (102), test panel (104), separator plate (110) and test macro (108); It is characterized in that; Said dish to be tested (102), test panel (104) and separator plate (110) all are made as disk rotatable, that move horizontally and move up and down; Place on the dish to be tested (102) of test panel (104) one sides and be equipped with chip (101); Separator plate (110) places the opposite side of test panel (104), and test panel (104) upper surface one circle is uniformly distributed with a plurality of standing grooves (105), and each standing groove (105) bottom connects vacuum tube; Test panel (104) top is equipped with probe (107) and probe (106) with the corresponding position of the standing groove (105) of test position; Probe (107) is connected with test macro (108) respectively with probe (106), is provided with the test suction nozzle (103) that can rotate transposition between dish to be tested (102) and the test panel (104), is provided with the sorting suction nozzle (109) that can rotate transposition between separator plate (110) and the test panel (104).
2. testing, sorting device that is used for vertical LED; It comprises dish to be tested (102), test panel (104), separator plate (110) and test macro (108); It is characterized in that; Said dish to be tested (102) and separator plate (110) all are made as disk rotatable, that move horizontally and move up and down; Place on the dish to be tested (102) of test panel (104) one sides and be equipped with chip (101); Separator plate (110) places the opposite side of test panel (104), and test panel (104) upper surface one circle is uniformly distributed with a plurality of standing grooves (105), and each standing groove (105) bottom connects vacuum tube; Test panel (104) top is equipped with the probe (107) and the probe (106) that can move horizontally and move up and down; Probe (107) is connected with test macro (108) respectively with probe (106), is provided with the test suction nozzle (103) that can rotate transposition between dish to be tested (102) and the test panel (104), is provided with the sorting suction nozzle (109) that can rotate transposition between separator plate (110) and the test panel (104).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011100918310A CN102728562A (en) | 2011-04-13 | 2011-04-13 | Testing and sorting device for vertical light emitting diode |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011100918310A CN102728562A (en) | 2011-04-13 | 2011-04-13 | Testing and sorting device for vertical light emitting diode |
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| CN102728562A true CN102728562A (en) | 2012-10-17 |
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| CN2011100918310A Pending CN102728562A (en) | 2011-04-13 | 2011-04-13 | Testing and sorting device for vertical light emitting diode |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103240229A (en) * | 2013-04-28 | 2013-08-14 | 嘉兴景焱智能装备技术有限公司 | Sorted storing device for IC (Integrated Circuit) test |
| CN105499155A (en) * | 2016-02-01 | 2016-04-20 | 先驱智能机械（深圳）有限公司 | Grasping and sorting method and sorting disc for objects |
| CN108982509A (en) * | 2018-05-29 | 2018-12-11 | 东莞盛翔精密金属有限公司 | A kind of rotary 360 degree of product burr detection devices |
| CN111243976A (en) * | 2020-03-17 | 2020-06-05 | 南京中电熊猫平板显示科技有限公司 | Detection and repair equipment and method |
| CN111804622A (en) * | 2020-07-14 | 2020-10-23 | 苏州鼎纳自动化技术有限公司 | Product classification unloading mechanism based on BIN rank |
| CN113441413A (en) * | 2021-06-04 | 2021-09-28 | 盐城东紫光电科技有限公司 | Have LED equipment of surveying and picking up function concurrently |
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| CN113441413A (en) * | 2021-06-04 | 2021-09-28 | 盐城东紫光电科技有限公司 | Have LED equipment of surveying and picking up function concurrently |
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Application publication date: 20121017 |