CN102694077B - 一种铜铟镓硒薄膜太阳能电池的制备方法 - Google Patents
一种铜铟镓硒薄膜太阳能电池的制备方法 Download PDFInfo
- Publication number
- CN102694077B CN102694077B CN201210192751.9A CN201210192751A CN102694077B CN 102694077 B CN102694077 B CN 102694077B CN 201210192751 A CN201210192751 A CN 201210192751A CN 102694077 B CN102694077 B CN 102694077B
- Authority
- CN
- China
- Prior art keywords
- target
- power density
- carried out
- sputter
- absorbed layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000002360 preparation method Methods 0.000 title claims abstract description 12
- 239000010409 thin film Substances 0.000 title abstract description 6
- HVMJUDPAXRRVQO-UHFFFAOYSA-N copper indium Chemical compound [Cu].[In] HVMJUDPAXRRVQO-UHFFFAOYSA-N 0.000 title abstract description 4
- ZZEMEJKDTZOXOI-UHFFFAOYSA-N digallium;selenium(2-) Chemical compound [Ga+3].[Ga+3].[Se-2].[Se-2].[Se-2] ZZEMEJKDTZOXOI-UHFFFAOYSA-N 0.000 title abstract 2
- 239000000758 substrate Substances 0.000 claims abstract description 18
- 238000000137 annealing Methods 0.000 claims abstract description 11
- 229910052750 molybdenum Inorganic materials 0.000 claims abstract description 9
- 239000011733 molybdenum Substances 0.000 claims abstract description 9
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 claims abstract description 8
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims abstract description 7
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 4
- 238000000034 method Methods 0.000 claims description 42
- 238000004544 sputter deposition Methods 0.000 claims description 22
- 239000011669 selenium Substances 0.000 claims description 15
- 229910045601 alloy Inorganic materials 0.000 claims description 13
- 239000000956 alloy Substances 0.000 claims description 13
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 10
- 229910052725 zinc Inorganic materials 0.000 claims description 10
- 239000011701 zinc Substances 0.000 claims description 10
- 239000011248 coating agent Substances 0.000 claims description 9
- 238000000576 coating method Methods 0.000 claims description 9
- 229910052711 selenium Inorganic materials 0.000 claims description 9
- 229910006404 SnO 2 Inorganic materials 0.000 claims description 7
- 238000001755 magnetron sputter deposition Methods 0.000 claims description 5
- 230000007423 decrease Effects 0.000 claims description 4
- 238000010438 heat treatment Methods 0.000 claims description 4
- MRNHPUHPBOKKQT-UHFFFAOYSA-N indium;tin;hydrate Chemical group O.[In].[Sn] MRNHPUHPBOKKQT-UHFFFAOYSA-N 0.000 claims description 4
- 239000004411 aluminium Substances 0.000 claims description 3
- 230000003247 decreasing effect Effects 0.000 claims description 3
- 229910052760 oxygen Inorganic materials 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 2
- 239000002184 metal Substances 0.000 claims description 2
- 150000002751 molybdenum Chemical class 0.000 claims description 2
- FGUUSXIOTUKUDN-IBGZPJMESA-N C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 Chemical compound C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 FGUUSXIOTUKUDN-IBGZPJMESA-N 0.000 claims 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 abstract 4
- 239000011787 zinc oxide Substances 0.000 abstract 2
- 239000010408 film Substances 0.000 description 17
- 238000004519 manufacturing process Methods 0.000 description 13
- 239000007789 gas Substances 0.000 description 7
- 239000000463 material Substances 0.000 description 7
- 150000001875 compounds Chemical class 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 229910000928 Yellow copper Inorganic materials 0.000 description 4
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 4
- 238000005987 sulfurization reaction Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000001704 evaporation Methods 0.000 description 3
- 230000008020 evaporation Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 229940065287 selenium compound Drugs 0.000 description 3
- 229910052793 cadmium Inorganic materials 0.000 description 2
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- XIMIGUBYDJDCKI-UHFFFAOYSA-N diselenium Chemical compound [Se]=[Se] XIMIGUBYDJDCKI-UHFFFAOYSA-N 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 238000003912 environmental pollution Methods 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 238000010248 power generation Methods 0.000 description 2
- 230000001172 regenerating effect Effects 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 238000004062 sedimentation Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000005361 soda-lime glass Substances 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 240000002329 Inga feuillei Species 0.000 description 1
- 238000003915 air pollution Methods 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000002860 competitive effect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- TXKMVPPZCYKFAC-UHFFFAOYSA-N disulfur monoxide Inorganic materials O=S=S TXKMVPPZCYKFAC-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000002803 fossil fuel Substances 0.000 description 1
- QNWMNMIVDYETIG-UHFFFAOYSA-N gallium(ii) selenide Chemical compound [Se]=[Ga] QNWMNMIVDYETIG-UHFFFAOYSA-N 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 231100000004 severe toxicity Toxicity 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- XTQHKBHJIVJGKJ-UHFFFAOYSA-N sulfur monoxide Chemical compound S=O XTQHKBHJIVJGKJ-UHFFFAOYSA-N 0.000 description 1
- 238000010189 synthetic method Methods 0.000 description 1
- 239000002341 toxic gas Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0623—Sulfides, selenides or tellurides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/186—Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
- H01L31/1864—Annealing
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3492—Variation of parameters during sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
- C23C14/352—Sputtering by application of a magnetic field, e.g. magnetron sputtering using more than one target
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
- H01L31/0322—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312 comprising only AIBIIICVI chalcopyrite compounds, e.g. Cu In Se2, Cu Ga Se2, Cu In Ga Se2
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/0328—Inorganic materials including, apart from doping materials or other impurities, semiconductor materials provided for in two or more of groups H01L31/0272 - H01L31/032
- H01L31/0336—Inorganic materials including, apart from doping materials or other impurities, semiconductor materials provided for in two or more of groups H01L31/0272 - H01L31/032 in different semiconductor regions, e.g. Cu2X/CdX hetero-junctions, X being an element of Group VI of the Periodic System
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
- H01L31/03923—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate including AIBIIICVI compound materials, e.g. CIS, CIGS
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
- H01L31/072—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN heterojunction type
- H01L31/0749—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN heterojunction type including a AIBIIICVI compound, e.g. CdS/CulnSe2 [CIS] heterojunction solar cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Abstract
本发明涉及一种铜铟镓硒薄膜太阳能电池的制备方法,其包括:a)在衬底上制备钼背电极;b)在该钼背电极上制备铜铟镓硒吸收层;c)进行退火处理;d)在铜铟镓硒吸收层上制备In2Se3或ZnS缓冲层;e)在所述In2Se3或ZnS缓冲层上制备本征氧化锌高阻抗层;f)在所述本征氧化锌高阻抗层上制备氧化铟锡薄膜低阻抗层;g)在氧化铟锡薄膜低阻抗层上制备铝电极。
Description
技术领域:
本发明涉及太阳能电池领域,更具体的,涉及一种铜铟镓硒薄膜太阳能电池吸收层的制备方法。
背景技术:
众所周知,铜铟镓硒化合物具有黄铜矿结构,可以制备在软性或刚性的衬底上作为太阳能发电的材料,由此制成的铜铟镓硒薄膜太阳能电池具有高稳定、低成本的优点。目前地球上可利用的能源日趋短少,而石化能源在使用过程中会排放碳、硫的氧化物造成空气污染并且加剧地球的温室效应,使地球的环境恶化气候异常,这已经是不争的事实了。因此开发无污染的可再生能源是当前世界各国的首要科研项目之一。而太阳能是无污染的能源,是可再生能源的最佳选择之一。太阳能的开发利用首要的是开发可以产生将太阳能高效率转换成电能的材料。
铜铟镓硒化合物材料是具有黄铜矿结构的化合物半导体材料,其为直接带隙材料,能吸收波长范围较大的太阳光,且具有自调变自身组成以形成p-n结的特性,是公认的作为太阳能电池吸收层的最佳材料之一,例如铜铟镓二硒(Cu(InGa)Se2),简称CIGS,为目前具有最高光吸收能力的半导体材料。由于CIGS的高光吸收率优势,使得CIGS吸收层的厚度在1~2μm即可,以一般粗略估算,在量产制造时,CIGS材料的费用只需要0.03美元/瓦,因此极具竞争优势,有望使太阳能发电可以与传统的石化燃料发电成本相同甚至更低。因此如何制备低成本、高效率的铜铟镓硒太阳能薄膜电池,是目前最值得开发研究的课题之一。
CIGS薄膜太阳能电池有两个优点:1是光电转换层可以很薄,为几微米;二是其带隙(禁带宽度)可以通过Ga(镓)在铜铟镓硒化合物的比例含量来调控。根据现有技术,Ga和In的比例与带隙(Eg)存在如下的关系,Eg(eV)=1.02+0.67y+0.11y(y-1),其中y=In/(Ga+In)的原子含量比例。理论说明,单一带隙的太阳能电池不能最大限度的利用太阳能,也就是光子能量太小的产生不了电子-空穴对,能量太大的光子也只能激发一个电子-空穴对,多余的能量只能转化成不利于太阳能电池效率的热而已。因此从提高太阳电池效率的角度考虑,希望太阳能电池有很多的带隙以尽量吸收更多的太阳能,而CIGS化合物的带隙的可调特性恰恰可以实现如此的设想。在制备CIGS薄膜时可以调节Ga的含量比例。增加Ga的比例,CIGS化合物的禁带带隙会升高。
现有文献中已记载制备CIGS薄膜的方法主要有:(1)硒化法,(2)叠层法,(3)多源(二或三源)蒸发法,(4)溅射法,(5)沉积法,(6)喷涂法,(7)旋涂法,(8)真空加热合成法等。而这(1)硒化法,(2)叠层法,(3)多源(二或三源)蒸发法,(4)溅射法皆在某个工艺流程中需要对CIGS薄膜进行硫化或硒化处理,通过硫化或硒化处理可以使S、Se原子经扩散作用与Cu-In-Ga进行反应以生成CuInGaSe化合物,此过程称为硫化或硒化。
硒化制备具有黄铜矿结构的薄膜太阳能电池的方法存在着一些缺点例如生产周期长、耗能多、消耗Se多、Se的蒸汽有剧毒及Se的分布不均匀,Se存在梯度等等。
另外对于调控Ga的梯度分布工艺,上述的各种工艺方法比较难以一步到位的实现。例如美国的NREL实验室开发的三阶段共蒸发法,其实现Ga呈上述的带隙梯度A或V字形带隙梯度是在三个阶段不同的元素参与蒸发反应,工艺非常复杂且需要实时控制精准方能实现。此种方法虽然可以制备高转换效率的太阳能薄膜电池,但是不利于低成本、大面积、规模化的生产。
发明内容
本发明提供一种铜铟镓硒薄膜太阳能电池的制备方法,其包括:
a)在衬底上制备钼背电极;
b)在该钼背电极上制备铜铟镓硒吸收层:利用真空磁控溅射法,采用CuInxGa1-xSe2合金靶进行溅射,设x=0的CuGaSe2合金靶为靶1,设x=0.8至0.6的CuInxGa1-xSe2合金靶为靶2,首先以高功率密度4W/cm2至8W/cm2之间的任意高功率密度对靶1先溅射2至4分钟,接着再对靶1和靶2进行共溅射,此时对靶2进行溅射的初始功率密度为0.3W/cm2至1W/cm2之间任意的低功率密度,而对靶1进行溅射的高功率密度设置成在工作中连续递减,在对靶1和靶2进行共溅射的状态下,当对靶1进行溅射的功率密度连续递减时,与此同时对靶2进行溅射的功率密度则为连续递增,最后直至对靶1进行溅射的功率密度递减至0.3W/cm2至1W/cm2之间的任意低功率密度,对靶2进行溅射的功率密度递增至4W/cm2至8W/cm2之间的任意高功率密度,执行共溅射的时间为30-60分钟,使得铜铟镓硒吸收层中的Ga浓度形成梯度,其在该吸收层与Mo背电极接触的一侧的浓度最高,在该吸收层的相对另一侧的浓度最低;
c)进行退火处理:在真空室内以快速加热方式对铜铟镓硒吸收层进行退火处理,其温度为400℃至600℃,退火时间为55至90秒;
d)在铜铟镓硒吸收层上制备In2Se3或ZnS缓冲层,其厚度为80至120纳米;
e)在所述In2Se3或ZnS缓冲层上制备本征氧化锌高阻抗层,其厚度为0.1至0.5微米;
f)在所述本征氧化锌高阻抗层上制备氧化铟锡薄膜低阻抗层,其厚度为0.3至0.8微米;
g)在氧化铟锡薄膜低阻抗层上制备铝电极。
其中:所述铜铟镓硒吸收层的厚度为1.5微米至2微米。
其中:在执行步骤b)中,溅射腔体内的工作压力为1×10-4Torr,衬底的温度保持在350℃至450℃之间的任意温度。
其中:在执行步骤d)中,利用真空磁控溅射法,采用In2Se3或ZnS合金靶,真空磁控溅射的工作压力为1-5×10-3Torr并通入Ar气体,衬底的温度保持在室温。
其中:在执行步骤e)中,利用射频真空磁控溅射法,靶材为本征氧化锌,射频真空磁控溅射的工作压力为1-5×10-3Torr,工作频率为400K~2MHz,并通入Ar气体,衬底的温度保持在室温。
其中:利用真空直流磁控溅射法,靶材为氧化铟锡In2O3:SnO2,In2O3:SnO2的质量比为9∶1,真空直流磁控溅射的工作压力为1-5×10-3Torr,并通入掺有2%至5%O2的Ar气体,衬底的温度保持室温。
根据本发明的方法,无硒化工艺流程及无镉的In2Se3或ZnS缓冲层,不但可以避免H2Se、H2S的有毒气体,并且使用无镉的化合物,既符合环保又可降低成本,并且使得生产工艺设备简单能源消耗小,生产周期短等优势。
本发明与现有技术相比有以下优点:本发明所有的工艺皆为干式工艺流程,工艺过程不使用化学溶剂与溶液。太阳能电池的吸收层制备采用一步操作即可得到稳定结晶的吸收层,不再需要对吸收层进行硒化或硫化的工业程序,大大缩短了生产周期,减少了生产设备,也避免了生产过程中的环境污染和潜在的危险。本发明的工艺步骤简化,能源消耗小,因此降低了生产成本。
附图说明
图1是本发明的制备铜铟镓硒薄膜太阳能电池吸收层的方法的流程图;
图2是对根据本发明的方法制备的太阳能电池吸收层所做的二次离子质谱(SIMS)分析曲线图。
具体实施方式
图1是本发明的制备铜铟镓硒薄膜太阳能电池吸收层的方法的流程图,如图所示:
首先在衬底上制备背电极。所述衬底可以选择钠钙玻璃或者不锈钢薄片,一般选用1-3mm厚的钠钙玻璃或者0.2mm厚不锈钢薄片。采用磁控溅射法沉积0.8微米厚的钼(Mo)金属作为背电极。
接着在背电极上制备吸收层:本发明采用双靶共溅射来制备吸收层,该靶为CuInxGa1-xSe2合金靶,为了说明方便,可以设x=0的CuGaSe2合金靶为靶1,设x=0.8至0.6的CuInxGa1-xSe2合金靶为靶2,例如Cu(In0.7Ga0.3)Se2合金靶2。首先以高功率密度4W/cm2至8W/cm2之间的任意高功率密度对靶1先溅射2至4分钟,接着再对靶1和靶2进行共溅射,此时对靶2进行溅射的初始功率密度为0.3W/cm2至1W/cm2之间任意的低功率密度,而对靶1进行溅射的高功率密度设置成在工作中连续递减。由于此时对靶1和靶2进行共溅射,而且为了确保铜铟镓硒吸收层中的Ga浓度形成梯度,将对靶1和靶2进行溅射的功率密度设计成为:当对靶1进行溅射的功率密度连续递减时,与此同时对靶2进行溅射的功率密度则为连续递增,最后直至对靶1进行溅射的功率密度递减至0.3W/cm2至1W/cm2之间的任意低功率密度,对靶2进行溅射的功率密度递增至4W/cm2至8W/cm2之间的任意高功率密度。执行共溅射的时间为30至60分钟,使得在钼背电极上沉积铜铟镓硒吸收层的厚度为1.5微米至2微米。溅射腔体内的工作压力为1×10-4Torr,衬底的温度保持在350℃至450℃之间的任意温度。根据该工艺,使得铜铟镓硒吸收层中的Ga浓度形成梯度,其在该吸收层与Mo背电极接触的一侧的浓度最高,在该吸收层的相对另一侧的浓度最低。
随后进行退火处理:在真空室内以快速加热方式对铜铟镓硒吸收层进行退火处理,其温度为400℃至600℃,退火时间为55至90秒。在退火过程中不需要通入任何气体。经过退火处理的铜铟镓硒吸收层具有黄铜矿结构,并通过热能进行局部离子扩散,提高结晶状态,提高太阳能电池主吸收层的光伏发电效率。
再接着在吸收层上制备缓冲层:利用真空磁控溅射法,采用In2Se3或ZnS合金靶,溅射沉积In2Se3或ZnS缓冲层,真空磁控溅射的工作压力为1-5×10-3Torr并通入Ar气体,衬底的温度保持在室温。所述In2Se3或ZnS缓冲层的沉积厚度为80至120纳米。
再接着在缓冲层上制备本征氧化锌高阻抗层:利用射频真空磁控溅射法,靶材为本征氧化锌(ZnO),射频真空磁控溅射的工作压力为1-5×10-3Torr,工作频率为400K~2MHz,并通入Ar气体,衬底的温度保持在室温。所述本征氧化锌高阻抗层的沉积厚度为0.1至0.5微米。
再接着在本征氧化锌高阻抗层上制备氧化铟锡(In2O3:SnO2)薄膜低阻抗层:利用真空直流磁控溅射法,靶材为氧化铟锡(In2O3:SnO2),In2O3:SnO2的质量比为9∶1,真空直流磁控溅射的工作压力为1-5×10-3Torr,并通入掺有2%至5%O2的Ar气体,衬底的温度保持室温。所述氧化铟锡薄膜低阻抗层的沉积厚度为0.3至0.8微米。
最后在氧化铟锡薄膜低阻抗层上制备铝电极:利用Al靶材,通过溅射法制备Al电极,最终得到具有Ga的浓度梯度的铜铟镓硒薄膜太阳能电池。
图2是对根据本发明的方法制备的太阳能电池吸收层所做的二次离子质谱(SIMS)分析曲线图。Ga的浓度在Mo背电极侧最高,然后到CIGS薄膜表面递减,表明具有梯度分布的禁带宽度。
本发明与现有技术相比有以下优点:本发明所有的工艺皆为干式工艺流程,工艺过程不使用化学溶剂与溶液。太阳能电池的吸收层制备采用一步操作即可得到稳定结晶的吸收层,不再需要对吸收层进行硒化或硫化的工艺程序,大大缩短了生产周期,减少了生产设备,也避免了生产过程中的环境污染和潜在的危险。本发明的工艺步骤简化,能源消耗小,因此降低了生产成本。
Claims (2)
1.一种铜铟镓硒薄膜太阳能电池的制备方法,其包括:
a)在衬底上制备钼背电极:采用磁控溅射法沉积0.8微米厚的钼(Mo)金属作为背电极;
b)在该钼背电极上制备铜铟镓硒吸收层:利用真空磁控溅射法,采用CuInxGa1-xSe2合金靶进行溅射,设x=0的CuGaSe2合金靶为靶1,设x=0.8至0.6的CuInxGa1-xSe2合金靶为靶2,首先以高功率密度4W/cm2至8W/cm2之间的任意高功率密度对靶1先溅射2至4分钟,接着再对靶1和靶2进行共溅射,此时对靶2进行溅射的初始功率密度为0.3W/cm2至1W/cm2之间任意的低功率密度,而对靶1进行溅射的高功率密度设置成在工作中连续递减,在对靶1和靶2进行共溅射的状态下,当对靶1进行溅射的功率密度连续递减时,与此同时对靶2进行溅射的功率密度则为连续递增,最后直至对靶1进行溅射的功率密度递减至0.3W/cm2至1W/cm2之间的任意低功率密度,对靶2进行溅射的功率密度递增至4W/cm2至8W/cm2之间的任意高功率密度,执行共溅射的时间为30至60分钟,使得铜铟镓硒吸收层中的Ga浓度形成梯度,其在该吸收层与Mo背电极接触的一侧的浓度最高,在该吸收层的相对另一侧的浓度最低;
c)进行退火处理:在真空室内以快速加热方式对铜铟镓硒吸收层进行退火处理,其温度为400℃至600℃,退火时间为55至90秒;
d)在铜铟镓硒吸收层上制备In2Se3或ZnS缓冲层,其厚度为80至120纳米;
e)在所述In2Se3或ZnS缓冲层上制备本征氧化锌高阻抗层,其厚度为0.1至0.5微米;
f)在所述本征氧化锌高阻抗层上制备氧化铟锡薄膜低阻抗层,其厚度为0.3至0.8微米;
g)在氧化铟锡薄膜低阻抗层上制备铝电极;
在执行步骤b)中,溅射腔体内的工作压力为1×10-4Torr,衬底的温度保持在350℃至450℃之间的任意温度;
在执行步骤d)中,利用真空磁控溅射法,采用In2Se3或ZnS合金靶,真空磁控溅射的工作压力为1-5×10-3Torr并通入Ar气体,衬底的温度保持在室温;
在执行步骤e)中,利用射频真空磁控溅射法,靶材为本征氧化锌,射频真空磁控溅射的工作压力为1-5×10-3Torr,工作频率为400K~2MHz,并通入Ar气体,衬底的温度保持在室温;
在执行步骤f)中,利用真空直流磁控溅射法,靶材为氧化铟锡In2O3:SnO2,In2O3:SnO2的质量比为9:1,真空直流磁控溅射的工作压力为1-5×10-3Torr,并通入掺有2%至5%O2的Ar气体,衬底的温度保持室温。
2.如权利要求1所述的制备方法,其特征在于:所述铜铟镓硒吸收层的厚度为1.5微米至2微米。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210192751.9A CN102694077B (zh) | 2012-06-11 | 2012-06-11 | 一种铜铟镓硒薄膜太阳能电池的制备方法 |
EP13804992.9A EP2860768B1 (en) | 2012-06-11 | 2013-04-11 | Method for preparing copper indium gallium diselenide thin-film solar cell |
PCT/CN2013/074072 WO2013185506A1 (zh) | 2012-06-11 | 2013-04-11 | 一种铜铟镓硒薄膜太阳能电池的制备方法 |
US14/153,026 US8969124B2 (en) | 2012-06-11 | 2014-01-11 | Method for fabricating Cu—In—Ga—Se film solar cell |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210192751.9A CN102694077B (zh) | 2012-06-11 | 2012-06-11 | 一种铜铟镓硒薄膜太阳能电池的制备方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102694077A CN102694077A (zh) | 2012-09-26 |
CN102694077B true CN102694077B (zh) | 2014-08-06 |
Family
ID=46859423
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201210192751.9A Active CN102694077B (zh) | 2012-06-11 | 2012-06-11 | 一种铜铟镓硒薄膜太阳能电池的制备方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US8969124B2 (zh) |
EP (1) | EP2860768B1 (zh) |
CN (1) | CN102694077B (zh) |
WO (1) | WO2013185506A1 (zh) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102694077B (zh) | 2012-06-11 | 2014-08-06 | 林刘毓 | 一种铜铟镓硒薄膜太阳能电池的制备方法 |
CN102751388B (zh) * | 2012-07-18 | 2015-03-11 | 林刘毓 | 一种铜铟镓硒薄膜太阳能电池的制备方法 |
US9520507B2 (en) | 2014-12-22 | 2016-12-13 | Sunpower Corporation | Solar cells with improved lifetime, passivation and/or efficiency |
CN105355718A (zh) * | 2015-11-20 | 2016-02-24 | 中国电子科技集团公司第十八研究所 | 一种铜铟镓硒太阳电池窗口层的制备方法 |
CN105826424B (zh) * | 2015-12-24 | 2017-12-22 | 云南师范大学 | 一种铜锌锡硫薄膜的制备方法 |
CN108179387A (zh) * | 2017-12-28 | 2018-06-19 | 清远先导材料有限公司 | 一种铜铟镓硒基系列靶材的制备方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5477088A (en) * | 1993-05-12 | 1995-12-19 | Rockett; Angus A. | Multi-phase back contacts for CIS solar cells |
CN101838788A (zh) * | 2010-05-06 | 2010-09-22 | 深圳丹邦投资集团有限公司 | 一种原位生长Cu2SixSn1-xS3光伏薄膜的方法 |
CN102054897A (zh) * | 2009-10-27 | 2011-05-11 | 成都先锋材料有限公司 | 多元素合金单一靶材制备薄膜太阳能电池的方法 |
CN102237439A (zh) * | 2010-04-22 | 2011-11-09 | 台湾积体电路制造股份有限公司 | 太阳能电池的制造方法 |
CN102290339A (zh) * | 2011-10-07 | 2011-12-21 | 南昌航空大学 | 铜铟镓硒靶材连续溅射制备cigs太阳电池吸收层的新工艺 |
CN102306666A (zh) * | 2011-09-28 | 2012-01-04 | 中国建材国际工程集团有限公司 | 一种具有梯度能带的铜铟镓硒太阳能电池及其制备方法 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4288641B2 (ja) * | 2000-08-17 | 2009-07-01 | 本田技研工業株式会社 | 化合物半導体成膜装置 |
AU2003275239A1 (en) * | 2002-09-30 | 2004-04-23 | Miasole | Manufacturing apparatus and method for large-scale production of thin-film solar cells |
US20100059385A1 (en) * | 2008-09-06 | 2010-03-11 | Delin Li | Methods for fabricating thin film solar cells |
US20130230933A1 (en) * | 2008-09-06 | 2013-09-05 | Soltrium Technology, Ltd. Shenzhen | Methods for fabricating thin film solar cells |
US10347473B2 (en) * | 2009-09-24 | 2019-07-09 | The United States Of America, As Represented By The Secretary Of The Navy | Synthesis of high-purity bulk copper indium gallium selenide materials |
CN101728461B (zh) * | 2009-11-06 | 2011-08-17 | 清华大学 | 一种制备薄膜太阳能电池吸收层的方法 |
CN101814553B (zh) * | 2010-03-05 | 2011-10-05 | 中国科学院上海硅酸盐研究所 | 光辅助方法制备铜铟镓硒薄膜太阳电池光吸收层 |
US20120132281A1 (en) * | 2010-11-26 | 2012-05-31 | Nexpower Technology Corporation | Thin-film solar cell and manufacturing method thereof |
US20130164885A1 (en) * | 2011-12-21 | 2013-06-27 | Intermolecular, Inc. | Absorbers For High-Efficiency Thin-Film PV |
US8586457B1 (en) * | 2012-05-17 | 2013-11-19 | Intermolecular, Inc. | Method of fabricating high efficiency CIGS solar cells |
CN102694077B (zh) * | 2012-06-11 | 2014-08-06 | 林刘毓 | 一种铜铟镓硒薄膜太阳能电池的制备方法 |
CN102751388B (zh) * | 2012-07-18 | 2015-03-11 | 林刘毓 | 一种铜铟镓硒薄膜太阳能电池的制备方法 |
US20140113403A1 (en) * | 2012-08-27 | 2014-04-24 | Intermolecular Inc. | High efficiency CZTSe by a two-step approach |
-
2012
- 2012-06-11 CN CN201210192751.9A patent/CN102694077B/zh active Active
-
2013
- 2013-04-11 EP EP13804992.9A patent/EP2860768B1/en active Active
- 2013-04-11 WO PCT/CN2013/074072 patent/WO2013185506A1/zh active Application Filing
-
2014
- 2014-01-11 US US14/153,026 patent/US8969124B2/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5477088A (en) * | 1993-05-12 | 1995-12-19 | Rockett; Angus A. | Multi-phase back contacts for CIS solar cells |
CN102054897A (zh) * | 2009-10-27 | 2011-05-11 | 成都先锋材料有限公司 | 多元素合金单一靶材制备薄膜太阳能电池的方法 |
CN102237439A (zh) * | 2010-04-22 | 2011-11-09 | 台湾积体电路制造股份有限公司 | 太阳能电池的制造方法 |
CN101838788A (zh) * | 2010-05-06 | 2010-09-22 | 深圳丹邦投资集团有限公司 | 一种原位生长Cu2SixSn1-xS3光伏薄膜的方法 |
CN102306666A (zh) * | 2011-09-28 | 2012-01-04 | 中国建材国际工程集团有限公司 | 一种具有梯度能带的铜铟镓硒太阳能电池及其制备方法 |
CN102290339A (zh) * | 2011-10-07 | 2011-12-21 | 南昌航空大学 | 铜铟镓硒靶材连续溅射制备cigs太阳电池吸收层的新工艺 |
Non-Patent Citations (2)
Title |
---|
Study of the effect of gallium grading in Cu(In,Ga)Se2;T. Dullweber等;《Thin Solid Film》;20001231;第361-362卷;第478-481页 * |
T.Dullweber等.StudyoftheeffectofgalliumgradinginCu(In Ga)Se2.《Thin Solid Film》.2000 |
Also Published As
Publication number | Publication date |
---|---|
EP2860768A4 (en) | 2016-02-17 |
US8969124B2 (en) | 2015-03-03 |
EP2860768A1 (en) | 2015-04-15 |
US20150017755A1 (en) | 2015-01-15 |
CN102694077A (zh) | 2012-09-26 |
EP2860768B1 (en) | 2017-06-07 |
WO2013185506A1 (zh) | 2013-12-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Jäger-Waldau | Progress in chalcopyrite compound semiconductor research for photovoltaic applications and transfer of results into actual solar cell production | |
CN102751388B (zh) | 一种铜铟镓硒薄膜太阳能电池的制备方法 | |
CN102054897B (zh) | 多元素合金单一靶材制备薄膜太阳能电池的方法 | |
CN102694077B (zh) | 一种铜铟镓硒薄膜太阳能电池的制备方法 | |
CN101789469B (zh) | 铜铟镓硒硫薄膜太阳电池光吸收层的制备方法 | |
US20100243043A1 (en) | Light Absorbing Layer Of CIGS Solar Cell And Method For Fabricating The Same | |
WO2011040645A1 (en) | Photoelectric conversion device, method for producing the same, and solar battery | |
CN106653898B (zh) | 一种czts太阳能电池 | |
Waleed et al. | Performance improvement of solution-processed CdS/CdTe solar cells with a thin compact TiO 2 buffer layer | |
Mandati et al. | Copper chalcopyrites for solar energy applications | |
CN108401469B (zh) | 太阳能电池及其制造方法 | |
Saha | A status review on Cu2ZnSn (S, Se) 4-based thin-film solar cells | |
Paire et al. | Chalcogenide Thin‐Film Solar Cells | |
CN103469170B (zh) | 一种用于薄膜太阳能电池的溅射靶 | |
Wu et al. | Characterization of Cu (In, Ga) Se2 thin films prepared via a sputtering route with a following selenization process | |
CN102709393A (zh) | 用铜锌锡硫化合物单一靶材制备薄膜太阳能电池的方法 | |
JP2017059656A (ja) | 光電変換素子および太陽電池 | |
CN102005487B (zh) | 一种柔性薄膜太阳电池用光吸收层材料及其制备方法 | |
CN108389934A (zh) | 一种运用一步溅射法制备铜铟镓硒太阳电池的方法 | |
CN103474514B (zh) | 铜铟镓硒太阳能电池的制备方法 | |
TW201427054A (zh) | 光電變換元件及其製造方法、光電變換元件的緩衝層的製造方法與太陽電池 | |
KR102212042B1 (ko) | 원자층 증착법으로 형성된 버퍼층을 포함하는 태양전지 및 이의 제조방법 | |
CN102646746A (zh) | 碲锌镉/铜铟镓硒叠层太阳能电池 | |
CN105932093A (zh) | 一种高质量cigs薄膜太阳能电池吸收层的制备方法 | |
CN105870254B (zh) | 一种双靶直流共溅射制备铜铟镓硒吸收层的方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant |