CN102649116A - 用于分选电子部件的装置 - Google Patents

用于分选电子部件的装置 Download PDF

Info

Publication number
CN102649116A
CN102649116A CN2011101848739A CN201110184873A CN102649116A CN 102649116 A CN102649116 A CN 102649116A CN 2011101848739 A CN2011101848739 A CN 2011101848739A CN 201110184873 A CN201110184873 A CN 201110184873A CN 102649116 A CN102649116 A CN 102649116A
Authority
CN
China
Prior art keywords
parts
electronic unit
unit
feed arrangement
linear feed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2011101848739A
Other languages
English (en)
Chinese (zh)
Inventor
全成绿
朴埈模
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Top Engineering Co Ltd
LG Display Co Ltd
Original Assignee
Top Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Top Engineering Co Ltd filed Critical Top Engineering Co Ltd
Publication of CN102649116A publication Critical patent/CN102649116A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Environmental & Geological Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Optics & Photonics (AREA)
  • Specific Conveyance Elements (AREA)
  • Sorting Of Articles (AREA)
  • Feeding Of Articles To Conveyors (AREA)
CN2011101848739A 2011-02-28 2011-07-04 用于分选电子部件的装置 Pending CN102649116A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020110017648A KR101855886B1 (ko) 2011-02-28 2011-02-28 전자부품 분류장치
KR10-2011-0017648 2011-02-28

Publications (1)

Publication Number Publication Date
CN102649116A true CN102649116A (zh) 2012-08-29

Family

ID=46691335

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011101848739A Pending CN102649116A (zh) 2011-02-28 2011-07-04 用于分选电子部件的装置

Country Status (2)

Country Link
KR (1) KR101855886B1 (ko)
CN (1) CN102649116A (ko)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102836829A (zh) * 2012-09-19 2012-12-26 无锡红光微电子有限公司 To251/252分选机进料区保持块结构
CN103041995A (zh) * 2012-11-28 2013-04-17 东莞市凯昶德电子科技股份有限公司 连接器外壳引脚变形自动筛选机
CN103043422A (zh) * 2012-12-20 2013-04-17 广东志成华科光电设备有限公司 一种led分光机的供料装置
CN105478379A (zh) * 2014-10-02 2016-04-13 万润科技股份有限公司 电子元件分选方法及装置
CN103878126B (zh) * 2014-04-08 2017-01-04 苏州嘉大电子有限公司 一种led器件分选机
CN111468424A (zh) * 2020-04-21 2020-07-31 杭州晁松科技有限公司 一种能快速筛分led灯的流水生产检测装置
CN111515136A (zh) * 2020-04-09 2020-08-11 南京华群光电技术有限公司 一种气动筛选式零件表面检测装置
CN112642737A (zh) * 2021-01-25 2021-04-13 福州派利德电子科技有限公司 集成电路测试分选机送料分粒装置及控制方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104355069B (zh) * 2014-11-11 2017-01-18 苏州新豪轴承股份有限公司 一种无内圈滚针轴承自动分组系统
CN109597002B (zh) * 2018-12-28 2021-02-26 陈清尧 一种led测试检测装置

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10291623A (ja) * 1997-04-16 1998-11-04 Ishida Co Ltd 電磁フィーダー
US6079549A (en) * 1995-08-29 2000-06-27 Mrw Digit Electronicgerate Gmbh Driver unit for an electrically driven vibratory conveyor
JP2005219002A (ja) * 2004-02-06 2005-08-18 Unitec:Kk 素子分別収納装置
CN101811615A (zh) * 2010-04-20 2010-08-25 哈尔滨博实自动化设备有限责任公司 电磁驱动式振动输送机
CN201684732U (zh) * 2010-04-09 2010-12-29 福建省德传电子科技有限公司 全自动咪头测试机

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4906058B2 (ja) 2006-02-27 2012-03-28 株式会社 東京ウエルズ ワーク搬送システム
JP5045010B2 (ja) * 2006-07-19 2012-10-10 株式会社村田製作所 位置決め手段付き搬送装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6079549A (en) * 1995-08-29 2000-06-27 Mrw Digit Electronicgerate Gmbh Driver unit for an electrically driven vibratory conveyor
JPH10291623A (ja) * 1997-04-16 1998-11-04 Ishida Co Ltd 電磁フィーダー
JP2005219002A (ja) * 2004-02-06 2005-08-18 Unitec:Kk 素子分別収納装置
CN201684732U (zh) * 2010-04-09 2010-12-29 福建省德传电子科技有限公司 全自动咪头测试机
CN101811615A (zh) * 2010-04-20 2010-08-25 哈尔滨博实自动化设备有限责任公司 电磁驱动式振动输送机

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102836829A (zh) * 2012-09-19 2012-12-26 无锡红光微电子有限公司 To251/252分选机进料区保持块结构
CN103041995A (zh) * 2012-11-28 2013-04-17 东莞市凯昶德电子科技股份有限公司 连接器外壳引脚变形自动筛选机
CN103041995B (zh) * 2012-11-28 2014-07-16 东莞市凯昶德电子科技股份有限公司 连接器外壳引脚变形自动筛选机
CN103043422A (zh) * 2012-12-20 2013-04-17 广东志成华科光电设备有限公司 一种led分光机的供料装置
CN103043422B (zh) * 2012-12-20 2015-11-04 广东志成华科光电设备有限公司 一种led分光机的供料装置
CN103878126B (zh) * 2014-04-08 2017-01-04 苏州嘉大电子有限公司 一种led器件分选机
CN105478379A (zh) * 2014-10-02 2016-04-13 万润科技股份有限公司 电子元件分选方法及装置
CN111515136A (zh) * 2020-04-09 2020-08-11 南京华群光电技术有限公司 一种气动筛选式零件表面检测装置
CN111468424A (zh) * 2020-04-21 2020-07-31 杭州晁松科技有限公司 一种能快速筛分led灯的流水生产检测装置
CN111468424B (zh) * 2020-04-21 2021-07-30 临海龙威灯饰有限公司 一种能快速筛分led灯的流水生产检测装置
CN112642737A (zh) * 2021-01-25 2021-04-13 福州派利德电子科技有限公司 集成电路测试分选机送料分粒装置及控制方法

Also Published As

Publication number Publication date
KR20120098006A (ko) 2012-09-05
KR101855886B1 (ko) 2018-05-10

Similar Documents

Publication Publication Date Title
CN102649116A (zh) 用于分选电子部件的装置
JP5975556B1 (ja) 移載装置
TWI554767B (zh) 操作測試分選機的方法
CN102472790B (zh) 拾取设备以及具有该拾取设备的发光二极管芯片分选设备
CN101241869B (zh) 芯片测试分类机
JP5457085B2 (ja) ワーク搬送分類装置及びワーク搬送分類方法
CN104656007A (zh) 一种ccd精确定位的自动化针测设备
CN102980742A (zh) 发光元件的检测装置及检测方法
CN103379818A (zh) 抓持吸嘴以及电子部件安装装置
CN103794531A (zh) 裸芯排出装置
CN105182142A (zh) 一种探针测试装置
JPH0786376A (ja) 物品整列装置
KR101758472B1 (ko) 스마트폰용 멀티지그
CN102984641A (zh) 适用于音频测试治具的三轴移动机构
CN104973413A (zh) 用于置入磁体的设备
TWI516778B (zh) 用於分選機之加壓裝置及分選機
KR19980070664A (ko) 프로브 장치 및 프로브침의 연마 방법
CN102998565A (zh) 用于电子产品测试的流水线一体化装置
CN107918065B (zh) 指纹辨识电子组件测试装置及其测试设备
US20130125616A1 (en) Automated multi-orientation short drop test apparatuses and methods
US8179134B2 (en) Handling robot of magnetic head assembly, magnetic head test method and magnetic head tester
KR100992176B1 (ko) 캠 승강장치 및 이를 구비한 칩 분류장치
US8901947B2 (en) Probe out-of-position sensing for automated test equipment
CN102645331B (zh) 把手销钉检测治具
KR101855885B1 (ko) 전자부품 분류장치 및 전자부품 분류장치의 프로브유닛

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20120829