CN102507990B - Fixture of electrified test in dielectric material for satellite - Google Patents
Fixture of electrified test in dielectric material for satellite Download PDFInfo
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- CN102507990B CN102507990B CN201110315815.5A CN201110315815A CN102507990B CN 102507990 B CN102507990 B CN 102507990B CN 201110315815 A CN201110315815 A CN 201110315815A CN 102507990 B CN102507990 B CN 102507990B
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Abstract
The invention discloses a fixture of an electrified test in a dielectric material for a satellite, belonging to the field of test. The fixture is rectangular and is mainly composed of a box body, an upper cover plate and a lower cover plate, wherein the box body is made of a 2Al2 aluminum alloy; eight and more than eight first grooves with the depth of more than 15 mm are uniformly arrayed at the front side of the box body; the gap reserved between the adjacent first grooves is more than or equal to 3 mm and the gap reserved between each first groove and the edge of the box body is more than or equal to 3 mm; each first groove is further provided with a second groove and a through hole is arranged at the bottom of each second groove; grooves with the depth of more than or equal to 35 mm are arranged at positions at the back side of the box body, wherein the positions correspond to the first grooves at the front side; the upper cover plate is an aluminum plate with the thickness of 1 mm; the lower cover plate is an aluminum plate with the thickness of 5 mm; and through holes are arranged at the positions corresponding to the grooves of the box body. The fixture provided by the invention has the advantages of capability of preventing mutual discharging interference between samples, high reliability, realization of simultaneous measurement of a plurality of the samples, and capabilities of greatly shortening a test period and improving the test efficiency.
Description
Technical field
The present invention relates to the fixture of electrified test in dielectric material for a kind of star, belong to field tests.
Background technology
During satellite transit, suffer severe space radiation environment, particularly during sun aggravating activities, on the orbit of satellite, produce the electronics of high flux, high energy (0.1～10MeV), high energy electron has very strong penetration capacity, can penetrate the screen layer of satellite, enters inside satellite, and it is inner to be deposited on inner conductor and high insulating material, and set up highfield, when the highfield of setting up surpass material bear threshold value time, will generating material in electric discharge.
The interior electric discharge meeting of dielectric material produces serious influence to the safety and reliability of satellite transit.In occurring on the one hand, the moment of electric discharge can release energy, and can cause dielectric material damage at the position of electric discharge, causes the strength of materials to decline, and changes the parameter of optical material, and the material volatilizing pollutes material, affects the life and reliability that satellite is used.During what is more important electric discharge, follow the electromagnetic wave of transmitting can be coupled into by material internal metal connecting line, antenna etc. the internal circuit of satellite, cause Data flipping, produce wrong data receiver and transmitting, if particularly produce wrong satellite steering order, may produce serious consequence to satellite.
From launching a man-made satellite., people have just carried out the interior charged research of dielectric material.The variation of dielectric material performance index under radiation parameter, particularly because the interior charged electric discharge causing will directly have influence on transmission and the reception of circuit signal.The risk that on satellite, widely used dielectric material discharges in space exists is larger, need to carry out charged effect test in material, optimizes reasonably dielectric material and the electrode structure form of anti-interior charged effect.Interior charged effect ground simulation test needs high-energy electron accelerator, present stage is mainly the performance parameter of monocyte sample and measures, this spends a large amount of human and material resources and financial resources, therefore stable in the urgent need to developing, be suitable in ground, with the device of electric analogy testing, shortening the test period, improving test efficiency reliably.
Summary of the invention
For at present interior charged effect simulated experiment, once can only measure single sample, cause spending a large amount of human and material resources and the defect of financial resources, the object of the present invention is to provide the fixture of electrified test in dielectric material for a kind of star, the phase mutual interference of discharging between can anti-sample of this fixture, reliability is high, can realize Multi-example and measure simultaneously, can greatly shorten the test period, improve test efficiency.
Object of the present invention is realized by following technical scheme:
A fixture for electrified test in dielectric material for star, described fixture is cuboid, mainly box body, upper cover plate and lower cover, consists of, wherein, box body material therefor is 2A12 aluminium alloy; Box body front has 8 above the first grooves evenly to arrange, and each first depth of groove is 15mm; Between adjacent two the first grooves, distance is more than or equal to 3mm, and between the first groove and box body edge, distance is more than or equal to 3mm; Each first bottom portion of groove is also provided with second groove, is used for placing resistance; Each second bottom portion of groove has a through hole, for sub-miniature A connector is installed; The box body back side is being provided with positive the first groove relevant position the groove that the degree of depth is more than or equal to 35mm, and in the second groove, through hole runs through box body back side groove; Upper cover plate is the aluminium sheet of thick 1mm, for elimination low-energy electron; Lower cover is the aluminium sheet of thick 5mm, is having through hole for coaxial wire is passed with the corresponding position of groove, the box body back side; During use, box body, upper cover plate and lower cover are fixedly connected with.
Use fixture of the present invention, the method step that carries out electrified test in dielectric material is as follows:
The first step, checks recirculated water, the circuit of vacuum target chamber and electron gun, oscillograph consumer, the signal connecting line road of test; Vacuum target chamber is positioned in concrete shield chamber;
Second step, sub-miniature A connector is installed in fixture, resistance is placed in the second groove, one end is connected with sub-miniature A connector, again sample is placed in box body the first groove, sample and fixture insulation, sample is connected with the resistance other end, coaxial wire one end is connected with sub-miniature A connector, and the other end oscillograph outdoor with concrete shield is connected;
The 3rd step, is individually fixed in upper cover plate and lower cover the upper and lower surface of box body, and fixture is positioned over to vacuum target chamber over against electron beam, the position parallel with electron impact window, vacuumizes and makes system vacuum to 5.4x10
-3below Pa, open electron gun power supply, carry out interior charging test.
Beneficial effect
1. the fixture of electrified test in dielectric material for a kind of star of the present invention, in this fixture, between adjacent two the first grooves, distance is more than or equal to 3mm, when sample is positioned in the first different grooves, each first groove is similar to metallic shielded room, this metallic shielded room can reduce the electromagnetic conduction of dielectric material discharge generation and coupling effect, prevent electric discharge interference, reliability is high;
2. the fixture of electrified test in dielectric material for a kind of star of the present invention, this fixture contains 8 the first above grooves, can realize Multi-example and measure simultaneously, can greatly shorten the test period, improve test efficiency.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of the fixture box body of electrified test in dielectric material for a kind of star;
Fig. 2 is the vertical view of the fixture box body of electrified test in dielectric material for a kind of star;
Fig. 3 is that Fig. 2 is along the sectional view of A-A direction;
Fig. 4 is the upward view of the fixture lower cover of electrified test in dielectric material for a kind of star;
Fig. 5 is the attached view of the fixture upper cover plate of electrified test in dielectric material for a kind of star;
Fig. 6 is the schematic diagram of charging test in the fixture of electrified test in dielectric material for a kind of star;
Wherein, 1-box body, 2-teflon cushion block, 3-vacuum target chamber, 4-concrete shield chamber, 5-electron beam, 6-oscillograph.
Embodiment
Below in conjunction with the drawings and specific embodiments in detail the present invention is described in detail, but is not limited to this.
Embodiment
As shown in Figure 1, the fixture of electrified test in dielectric material for a kind of star, described fixture is cuboid, mainly box body 1, upper cover plate and lower cover, consists of, wherein, the long 259mm of box body 1, wide 133mm, high 80mm, material therefor is 2A12 aluminium alloy, uses integral body to draw miller skill and processes; Box body 1 front have 8 square the first grooves in two separate ranks rule arrange, the long 60mm of each the first groove, wide 60mm, dark 15mm; Distance 3mm between two adjacent the first grooves, any the first groove and box body 1 Edge Distance are 5mm, each first groove center is also provided with square second groove, is used for placing resistance; The long 40mm of each the second groove, 40mm, dark 20mm; Each second bottom portion of groove has a through hole, for sub-miniature A connector is installed; Box body 1 back side is being provided with the 3rd groove with positive the first groove relevant position, the long 60mm of the 3rd groove, wide 60mm, dark 15mm, box body 1 back side is being provided with the 4th groove with positive the second groove relevant position, the long 40mm of the 4th groove, 40mm, dark 25mm, the second bottom portion of groove through hole runs through the 4th bottom portion of groove; Upper cover plate is long 259mm, wide 133mm, and the aluminium sheet of thick 1mm, for elimination low-energy electron; Lower cover is long 259mm, wide 133mm, and the aluminium sheet of thick 5mm, is opening with the 3rd corresponding position of groove, box body 1 back side
through hole for coaxial wire is passed; Box body 1 front, box body 1 back side, upper cover plate and lower cover are respectively equipped with corresponding 15 screws in position, are fixed by screws in together.
Use fixture of the present invention, the method step that carries out electrified test in dielectric material is as follows:
The first step, checks recirculated water, the circuit of vacuum target chamber 3 and electron gun, oscillograph 6 consumers, the signal connecting line road of test; Vacuum target chamber 3 is positioned in concrete shield chamber 4;
Second step, sub-miniature A connector is installed in fixture, resistance is placed in the second groove, one end is connected with sub-miniature A connector, and the both sides of Arbitrary Relative in the first groove by two teflon cushion blocks, 2 use adhesive tape bonding in test specimen box make sample and fixture insulation, sample is placed on to teflon cushion block 2 tops in box body the first groove, sample is connected with the resistance other end, and coaxial wire one end is connected with sub-miniature A connector, and the other end is connected with the oscillograph 6 outside concrete shield chamber 4;
The 3rd step, is screwed respectively the upper and lower surface in box body by upper cover plate and lower cover, and fixture is positioned over to vacuum target chamber 3 over against electron beam 5, the position parallel with electron impact window, vacuumizes and makes system vacuum to 5.4x10
-3below Pa, open electron gun power supply, carry out interior charging test.
The present invention includes but be not limited to above embodiment, every any being equal to of carrying out under the principle of spirit of the present invention, replaces or local improvement, all will be considered as within protection scope of the present invention.
Claims (2)
1. a fixture for electrified test in dielectric material for star, is characterized in that: described fixture is cuboid, and mainly box body (1), upper cover plate and lower cover, consist of, wherein, box body (1) material therefor is 2A12 aluminium alloy; Box body (1) front has 8 above the first grooves evenly to arrange, and each first depth of groove is 15mm; Between adjacent two the first grooves, distance is more than or equal to 3mm, and between the first groove and box body (1) edge, distance is more than or equal to 3mm; Each first bottom portion of groove is also provided with second groove, and each second bottom portion of groove has a through hole; Box body (1) back side is being provided with positive the first groove relevant position the groove that the degree of depth is more than or equal to 35mm, and in the second groove, through hole runs through box body (1) back side groove; Upper cover plate is the aluminium sheet of thick 1mm; Lower cover is the aluminium sheet of thick 5mm, is having through hole with the corresponding position of groove, box body (1) back side; During use, box body (1), upper cover plate are fixedly connected with lower cover.
2. adopt a kind of star claimed in claim 1 with the fixture of electrified test in dielectric material, to carry out a method for electrified test in dielectric material, it is characterized in that: described method step is as follows:
The first step, checks recirculated water, the circuit of vacuum target chamber (3) and electron gun, oscillograph (6) consumer, the signal connecting line road of test; Vacuum target chamber (3) is positioned in concrete shield chamber (4);
Second step, sub-miniature A connector is installed in fixture, resistance is placed in the second groove, one end is connected with sub-miniature A connector, again sample is placed in box body (1) first groove, sample and fixture insulation, and be connected with the resistance other end, coaxial wire one end is connected with sub-miniature A connector, and the other end oscillograph (6) outer with concrete shield chamber (4) is connected;
The 3rd step, is individually fixed in upper cover plate and lower cover the upper and lower surface of box body (1), and fixture is positioned over to vacuum target chamber (3) over against electron beam (5), the position parallel with electron impact window, vacuumizes and makes system vacuum to 5.4x10
-3below Pa, open electron gun power supply, carry out interior charging test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110315815.5A CN102507990B (en) | 2011-10-18 | 2011-10-18 | Fixture of electrified test in dielectric material for satellite |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110315815.5A CN102507990B (en) | 2011-10-18 | 2011-10-18 | Fixture of electrified test in dielectric material for satellite |
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| Publication Number | Publication Date |
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| CN102507990A CN102507990A (en) | 2012-06-20 |
| CN102507990B true CN102507990B (en) | 2014-04-02 |
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| CN201110315815.5A Active CN102507990B (en) | 2011-10-18 | 2011-10-18 | Fixture of electrified test in dielectric material for satellite |
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Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104237316B (en) * | 2014-09-05 | 2016-08-24 | 兰州空间技术物理研究所 | A kind of device charged in tested media material |
| CN115902540A (en) * | 2022-11-04 | 2023-04-04 | 电子科技大学长三角研究院(湖州) | Device and method for testing medium deep charge and discharge under electron radiation |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101470150A (en) * | 2007-12-28 | 2009-07-01 | 中国航天科技集团公司第五研究院第五一〇研究所 | Electrification simulating and predicting method for dielectric material spacing |
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| US20040032247A1 (en) * | 2002-08-14 | 2004-02-19 | Han-Ying Chen | Modified construct of testing fixture to improve hermetic seal |
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Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101470150A (en) * | 2007-12-28 | 2009-07-01 | 中国航天科技集团公司第五研究院第五一〇研究所 | Electrification simulating and predicting method for dielectric material spacing |
Non-Patent Citations (6)
| Title |
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| 乌江等.航天器抗内带电介质改性方法.《中国空间科学技术》.2010,(第2期),49-54. |
| 卫星内带电效应地面试验技术研究;张超等;《航天器环境工程》;20090831;第26卷(第4期);317-320 * |
| 张超等.卫星内带电效应地面试验技术研究.《航天器环境工程》.2009,第26卷(第4期),317-320. |
| 秦晓刚等.航天介质材料寿命的电性能评估技术.《真空与低温》.2007,第13卷(第4期),198-201. |
| 航天介质材料寿命的电性能评估技术;秦晓刚等;《真空与低温》;20071231;第13卷(第4期);198-201 * |
| 航天器抗内带电介质改性方法;乌江等;《中国空间科学技术》;20100430(第2期);49-54 * |
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