CN103760393A - Method and system for monitoring discharge pulse of satellite charge-and-discharge effect - Google Patents
Method and system for monitoring discharge pulse of satellite charge-and-discharge effect Download PDFInfo
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- CN103760393A CN103760393A CN201310722855.0A CN201310722855A CN103760393A CN 103760393 A CN103760393 A CN 103760393A CN 201310722855 A CN201310722855 A CN 201310722855A CN 103760393 A CN103760393 A CN 103760393A
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Abstract
The invention relates to a method and system for monitoring a discharge pulse of a satellite charge-and-discharge effect. The method for monitoring the discharge pulse of the satellite charge-and-discharge effect comprises the steps that a test sample is placed on a sample platform, a conductive coating on the reverse side of the test sample is connected with a signal cable and a sampling resistor, and a first current probe and a second current probe are placed on the signal cable, and are connected with an oscilloscope and a recording instrument respectively; the sample platform is vacuumized to be in a vacuum state by using a vacuum system, an electronic gun is started, high-energy electrons are generated, and radiation is carried out on the test sample through the high-energy electrons; the oscilloscope and the recording instrument are started, the waveform of the discharge pulse is collected by using the oscilloscope, and the discharge waveform is recorded by the recording instrument. According to the method and system for monitoring the discharge pulse of the satellite charge-and-discharge effect, simultaneous monitoring of the waveform of electrostatic discharge and the frequency of electrostatic discharge can be achieved, the method and system are applicable to tests of the discharge pulse in a satellite charge-and-discharge effect simulation test, and comprehensive discharge pulse information is provided for the satellite charge-and-discharge effect simulation test.
Description
Technical field
The present invention relates to field tests, relate in particular to a kind of monitoring method and monitoring system of satellite charging and discharging effects discharge pulse.
Background technology
Under the environmental activities such as space plasma, high energy electron and solar radiation, will stored charges and set up electric field in satellite material surface and inside, when electric field intensity exceedes material breakdown threshold value, will produce static discharge.Discharge pulse will puncture components and parts and functional material, cause satellite electron system works extremely and material property degradation.When static discharge occurs in high-power power supply-distribution system, may bring out secondary discharge, cause power supply-distribution system short circuit, destroy satellite energy resource system.Therefore electrostatic discharge pulses is characteristic parameter important in charge and discharge process, grasps discharge pulse characteristic significant for the physical process of analyzing charging and discharging effects.
It is random that charging and discharging effects produces static discharge, may produce continuously several discharge pulses, especially along with raising and the functional requirement of satellite technology, a new generation's satellite will adopt the energy resource system of high-power, owing to there being higher voltage difference between high-voltage power supply and distribution system both positive and negative polarity, easily produce static discharge frequently, also may bring out the secondary discharge between high-voltage power supply and distribution system both positive and negative polarity, cause the loss of satellite power even to completely lose.
In document " simulation experiment study of space sun battle array secondary discharge, Li Kai etc., Acta Physica Sinica ", utilize current probe and oscillograph monitoring static discharge waveform, under electron gain bundle irradiation, high pressure sun array once discharges and secondary discharge waveform.But in static discharge situation frequently, the method in document can only be monitored static discharge waveform, may be in waveform storing process waveform and the number of times of mistakes and omissions static discharge, thereby the accuracy of impact experiment.
Summary of the invention
Provide hereinafter about brief overview of the present invention, to the basic comprehension about some aspect of the present invention is provided.Should be appreciated that this general introduction is not about exhaustive general introduction of the present invention.It is not that intention is determined key of the present invention or pith, and nor is it intended to limit the scope of the present invention.Its object is only that the form of simplifying provides some concept, using this as the preorder in greater detail of discussing after a while.
The invention provides a kind of satellite charging and discharging effects discharge pulse monitoring method and monitoring system, can realize static discharge waveform and number of times Simultaneous Monitoring, be applicable to the test of discharge pulse in the simulated experiment of satellite charging and discharging effects, for charging and discharging effects simulation test provides comparatively comprehensively discharge pulse information.
On the one hand, the invention provides a kind of monitoring method of satellite charging and discharging effects discharge pulse, comprising:
Test sample is positioned over to sample stage, the conductive coating at the described test sample back side is connected with signal cable and sampling resistor, and on described signal cable, place the first current probe and the second current probe, described the first current probe is connected with registering instrument with oscillograph respectively with the second current probe;
Use vacuum system by the described sample stage state that is evacuated, and unlocking electronic rifle, produce high energy electron, test sample with described high energy electron irradiation;
Open oscillograph and registering instrument, utilize described oscillograph to gather the waveform of discharge pulse, utilize described registering instrument to record discharge waveform.
On the other hand, the present invention also provides a kind of satellite charging and discharging effects discharge pulse monitoring system, comprising:
Sample stage, for placing test sample;
Test sample, the conductive coating at the described test sample back side is connected with sampling resistor with signal cable, is placed with the first current probe and the second current probe on described signal cable;
Oscillograph and registering instrument, described oscillograph is connected with the second current probe with the first current probe on signal cable respectively with registering instrument; Described oscillograph is for gathering the waveform of discharge pulse, and described registering instrument is used for recording static discharge waveform;
Electron gun, for generation of high energy electron, tests sample described in described high energy electron irradiation.
Monitoring method and the monitoring system of satellite charging and discharging effects discharge pulse provided by the invention, comprehensive utilization current probe, oscillograph and registering instrument are monitored static discharge waveform and number of times in satellite charging and discharging effects simulation test, for charging and discharging effects simulation test provides comparatively comprehensively discharge pulse information, there is static discharge waveform and number of times Simultaneous Monitoring.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, to the accompanying drawing of required use in embodiment or description of the Prior Art be briefly described below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skills, do not paying under the prerequisite of creative work, can also obtain according to these accompanying drawings other accompanying drawing.
Fig. 1 is satellite charging and discharging effects electrostatic discharge pulses monitoring method process flow diagram of the present invention;
Fig. 2 is satellite charging and discharging effects electrostatic discharge pulses test macro schematic diagram of the present invention.
Reference numeral:
1-electron gun; 2-sample stage; 3-sample; 4-conductive coating;
5-signal cable; 6-the first current probe; 7-the second current probe;
8-oscillograph; 9-registering instrument; 10-sampling resistor.
Embodiment
For making object, technical scheme and the advantage of the embodiment of the present invention clearer, below in conjunction with the accompanying drawing in the embodiment of the present invention, technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is the present invention's part embodiment, rather than whole embodiment.The element of describing in an accompanying drawing of the present invention or a kind of embodiment and feature can combine with element and feature shown in one or more other accompanying drawing or embodiment.It should be noted that for purposes of clarity, in accompanying drawing and explanation, omitted expression and the description of unrelated to the invention, parts known to persons of ordinary skill in the art and processing.Based on the embodiment in the present invention, the every other embodiment that those of ordinary skills obtain under the prerequisite of not paying creative work, belongs to the scope of protection of the invention.
Embodiment mono-:
The invention provides a kind of satellite charging and discharging effects discharge pulse monitoring method, be illustrated in figure 1 monitoring method process flow diagram of the present invention, comprise step:
S11: test sample is positioned over to sample stage, the conductive coating at the described test sample back side is connected with signal cable and sampling resistor, and on described signal cable, place the first current probe and the second current probe, described the first current probe is connected with registering instrument with oscillograph respectively with the second current probe;
S12: use vacuum system by the described sample stage state that is evacuated, and unlocking electronic rifle, produce high energy electron, test sample with described high energy electron irradiation;
S13: open oscillograph and registering instrument, utilize described oscillograph to gather the waveform of discharge pulse, utilize described registering instrument to record discharge waveform.
First test sample is placed on sample stage, described test sample is, there is conductive coating at the test sample back side, and optional, described conductive coating is metallic copper, and copper metal has good electrical property.Kapton material can be used in the electric insulation of motor, magnetic wire, aircraft and guided missile wiring and flat flexible cable; Due to its intrinsic barrier, also can be used for making the fire prevention interlayer of aircraft and boats and ships.
Conductive coating is connected with sampling resistor with signal cable, described signal cable is connected with the first current probe and the second current probe, described conductive coating is used for obtaining the discharge pulse signal in test sample, and is transferred to the first current probe and the second current probe by signal cable.Optionally, the resistance of described sampling resistor is 50 Ω.
Signal cable is connected with two current probes, in order next to connect two kinds of testing tools, oscillograph and registering instrument, reception by two kinds of instruments to signal, can to static discharge waveform and number of times in test, monitor, for charging and discharging effects simulation test provides comparatively comprehensively discharge pulse information simultaneously.
Described the first current probe is connected with oscillograph, the second current probe is connected with registering instrument, the pulse signal that above-mentioned conductive coating receives is transferred to current probe by signal cable, described current probe is transferred to signal oscillograph and registering instrument again, described oscillograph gathers the waveform of discharge pulse, record static discharge waveform with described registering instrument, by signal cable, signal is transferred to the first and second current probes, oscillograph and registering instrument record record respectively static discharge waveform and number of times, have realized the Simultaneous Monitoring of static discharge waveform and number of times.
Use vacuum system by the sample stage state that is evacuated, the present invention is to provide the monitoring method of satellite charging and discharging effects discharge pulse, discharging and recharging all under vacuum environment, so in method provided by the invention, test specimen platform also needs the state of being evacuated to test of satellite.Optionally, its vacuum tightness requires to be better than 5.0 × 10
-4pa.In the present embodiment, vacuum tightness will remain on 10
-4pa.Keep such vacuum tightness to be conducive to the accuracy of test.
Unlocking electronic rifle, produces high energy electron, and with described high-energy electron irradiation test sample kapton material, the energy range of the high energy electron of generation is 0.8-2MeV.In the present embodiment, the energy of the high energy electron that electron gun is produced is controlled at 1.0MeV.
Optionally, described electron gun is electron accelerator, and the high-energy electron irradiation test sample of its generation, causes electric charge to accumulate at described test sample material internal, and set up electric field, when electric field intensity exceedes discharge threshold, electrostatic breakdown can occur, and produces discharge pulse.
Above-mentioned oscillograph is connected with the second current probe with the first current probe respectively with registering instrument, opens described oscillograph and registering instrument, records the electrostatic discharge pulses signal of kapton material production.
Embodiment bis-:
Be illustrated in figure 2 satellite charging and discharging effects discharge pulse test macro schematic diagram, described satellite charging and discharging effects discharge pulse monitoring system comprises:
Sample stage 2, for placing test sample;
Test sample 3, the conductive coating 3 at described test sample 3 back sides is connected with sampling resistor 10 with signal cable 3, is placed with the first current probe 6 and the second current probe 7 on described signal cable 3;
Oscillograph 8 and registering instrument 9, described oscillograph 8 is connected with the second current probe 7 with the first current probe 6 on signal cable 3 respectively with registering instrument 9; Described oscillograph is for gathering the waveform of discharge pulse, and described registering instrument is used for recording static discharge waveform;
Electron gun 1, for generation of high energy electron, tests sample described in described high-energy electron irradiation.
First test sample 3 is positioned on sample stage 2, described test sample is kapton material, and described kapton material, because of its intrinsic barrier, can be used for making the fire prevention interlayer of aircraft and boats and ships.Then the conductive coating 4 at the described test sample back side is connected with signal cable 5 and sampling resistor 10, and on cable, places two current probes 6 and 7, the signal of described the first current probe 6 and the second current probe 7 is input to respectively oscillograph 8 and registering instrument 9.
Signal cable is connected with two current probes, in order next to connect two kinds of testing tools, oscillograph and registering instrument, reception by two kinds of instruments to signal, can to static discharge waveform and number of times in test, monitor, for charging and discharging effects simulation test provides comparatively comprehensively discharge pulse information simultaneously.
Optionally, the resistance of described sampling resistor is 50 Ω, and test sample 3 back sides conductive coating be copper metal, copper metal has good electrical property.Described conductive coating is connected with signal cable and sampling resistor, by described conductive coating, obtains the discharge pulse signal in sample, and transfer to current probe by signal cable.Described current probe is connected with registering instrument with oscillograph, and the signal that current probe receives is gathered by oscillograph and registering instrument, can realize the Simultaneous Monitoring of static discharge waveform and number of times.
The waveform that the above-mentioned oscillograph being connected with the second current probe 7 with the first current probe 6 and registering instrument are respectively used to gather the waveform of discharge pulse and record static discharge.Carry out the collection of signal data with oscillograph and registering instrument simultaneously, can monitor waveform and the number of times of electrostatic discharge pulses simultaneously, the discharge pulse information obtaining is comparatively comprehensive.
In system, also include electron gun, described electron gun is electron accelerator, the high-energy electron irradiation test sample 3 of its generation, cause electric charge to accumulate at described test sample material internal, and set up electric field, when electric field intensity exceedes discharge threshold, can there is electrostatic breakdown, produce discharge pulse.The energy range of the high energy electron that described electron gun produces need be controlled at 0.8-2MeV.In the present embodiment, described energy is controlled to 1.0MeV.
Before unlocking electronic rifle, also need by vacuum system the described sample stage state that is evacuated, described vacuum tightness requires to be better than 5.0 × 10
-4pa.Because the present invention is the monitoring to discharge pulse in satellite charging and discharging effects, need under the environment of vacuum, complete, so will sample stage be evacuated by vacuum system, in the present embodiment, vacuum tightness will remain on 10
-4pa, has good test effect to the monitoring of discharge pulse.
Then unlocking electronic rifle 1, the high-energy electron irradiation test sample 3 that produce power is 1.0MeV, kapton material, records respectively the waveform of discharge pulse and the waveform of static discharge with oscillograph and registering instrument that the first current probe and the second current probe connect.
Monitoring method and the detection system of the satellite charging and discharging effects discharge pulse that the present invention announces, comprehensive utilization current probe, oscillograph and registering instrument, static discharge waveform and number of times in satellite charging and discharging effects simulation test are monitored, for charging and discharging effects simulation test provides comparatively comprehensively discharge pulse information, can Simultaneous Monitoring static discharge waveform and number of times.
In the embodiment such as apparatus and method of the present invention, obviously, each parts or each step reconfigure after can decomposing, combine and/or decomposing.These decomposition and/or reconfigure and should be considered as equivalents of the present invention.Simultaneously, in the above in the description of the specific embodiment of the invention, for a kind of embodiment, describe and/or the feature that illustrates can be used in same or similar mode in one or more other embodiment, combined with the feature in other embodiment, or substitute the feature in other embodiment.
Finally it should be noted that: although described above the present invention and advantage thereof in detail, be to be understood that in the case of not exceeding the spirit and scope of the present invention that limited by appended claim and can carry out various changes, alternative and conversion.And scope of the present invention is not limited only to the specific embodiment of the described process of instructions, equipment, means, method and step.One of ordinary skilled in the art will readily appreciate that from disclosure of the present invention, can use carry out with the essentially identical function of corresponding embodiment described herein or obtain process, equipment, means, method or step result essentially identical with it, that existing and will be developed future according to the present invention.Therefore, appended claim is intended to comprise such process, equipment, means, method or step in their scope.
Claims (10)
1. a satellite charging and discharging effects discharge pulse monitoring method, is characterized in that, comprising:
Test sample is positioned over to sample stage, the conductive coating at the described test sample back side is connected with signal cable and sampling resistor, and on described signal cable, place the first current probe and the second current probe, described the first current probe is connected with registering instrument with oscillograph respectively with the second current probe;
Use vacuum system by the described sample stage state that is evacuated, and unlocking electronic rifle, produce high energy electron, test sample with described high energy electron irradiation;
Open oscillograph and registering instrument, utilize described oscillograph to gather the waveform of discharge pulse, utilize described registering instrument to record discharge waveform.
2. satellite charging and discharging effects discharge pulse monitoring method according to claim 1, is characterized in that, the conductive coating at the described test sample back side is metallic copper.
3. satellite charging and discharging effects discharge pulse monitoring method according to claim 1, is characterized in that, by the described sample stage state that is evacuated, its vacuum tightness requires to be better than 5.0 × 10
-4pa.
4. satellite charging and discharging effects discharge pulse monitoring method according to claim 1, is characterized in that, described electron gun is electron accelerator.
5. satellite charging and discharging effects discharge pulse monitoring method according to claim 1, is characterized in that, described high energy electron energy range is 0.8-2MeV.
6. a satellite charging and discharging effects discharge pulse monitoring system, is characterized in that, comprising:
Sample stage, for placing test sample;
Test sample, the conductive coating at the described test sample back side is connected with sampling resistor with signal cable, is placed with the first current probe and the second current probe on described signal cable;
Oscillograph and registering instrument, described oscillograph is connected with the second current probe with the first current probe on signal cable respectively with registering instrument; Described oscillograph is for gathering the waveform of discharge pulse, and described registering instrument is used for recording static discharge waveform;
Electron gun, for generation of high energy electron, tests sample described in described high-energy electron irradiation.
7. satellite charging and discharging effects discharge pulse monitoring system according to claim 6, is characterized in that, the conductive coating at the described test sample back side is metallic copper.
8. satellite charging and discharging effects discharge pulse monitoring system according to claim 6, is characterized in that, described sample stage is vacuumized by vacuum system, and described vacuum tightness requires to be better than 5.0 × 10
-4pa.
9. satellite charging and discharging effects discharge pulse monitoring system according to claim 6, is characterized in that, described electron gun is electron accelerator.
10. satellite charging and discharging effects discharge pulse monitoring system according to claim 6, is characterized in that, described high energy electron energy range is 0.8-2MeV.
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| CN201310722855.0A CN103760393A (en) | 2013-12-24 | 2013-12-24 | Method and system for monitoring discharge pulse of satellite charge-and-discharge effect |
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| CN201310722855.0A CN103760393A (en) | 2013-12-24 | 2013-12-24 | Method and system for monitoring discharge pulse of satellite charge-and-discharge effect |
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Cited By (4)
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| CN104535868A (en) * | 2015-01-09 | 2015-04-22 | 中国人民解放军军械工程学院 | Electrostatic discharge test device under electromagnetic pulse radiation environment |
| CN109142924A (en) * | 2015-10-01 | 2019-01-04 | 景祝强 | A kind of charge and discharge analogy method induced based on electronics |
| CN112731083A (en) * | 2020-12-28 | 2021-04-30 | 南京三乐集团有限公司 | High-throughput satellite K-waveband space traveling wave tube multistage depressed collector micro-discharge detection method |
| CN113193446A (en) * | 2021-06-02 | 2021-07-30 | 中国科学院微小卫星创新研究院 | Satellite platform single-machine electrical interconnection system |
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| CN1553207A (en) * | 2003-12-18 | 2004-12-08 | 西安交通大学 | High-frequency wide-band local discharging on-line monitoring method in gas insulative converting station |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104535868A (en) * | 2015-01-09 | 2015-04-22 | 中国人民解放军军械工程学院 | Electrostatic discharge test device under electromagnetic pulse radiation environment |
| CN109142924A (en) * | 2015-10-01 | 2019-01-04 | 景祝强 | A kind of charge and discharge analogy method induced based on electronics |
| CN112731083A (en) * | 2020-12-28 | 2021-04-30 | 南京三乐集团有限公司 | High-throughput satellite K-waveband space traveling wave tube multistage depressed collector micro-discharge detection method |
| CN113193446A (en) * | 2021-06-02 | 2021-07-30 | 中国科学院微小卫星创新研究院 | Satellite platform single-machine electrical interconnection system |
| CN113193446B (en) * | 2021-06-02 | 2022-12-09 | 中国科学院微小卫星创新研究院 | Satellite platform single-machine electrical interconnection system |
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Inventor after: Li Detian Inventor after: Chen Yifeng Inventor after: Qin Xiaogang Inventor after: Yang Shengsheng Inventor after: Shi Liang Inventor after: Liu Qing Inventor after: Tang Daotan Inventor after: Wang Jun Inventor before: Chen Yifeng Inventor before: Li Detian Inventor before: Qin Xiaogang Inventor before: Yang Shengsheng Inventor before: Shi Liang Inventor before: Liu Qing Inventor before: Tang Daotan Inventor before: Wang Jun |
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Application publication date: 20140430 |