CN102494659A - Bearing device for detecting flatness of chamfer face of silicon ingot - Google Patents
Bearing device for detecting flatness of chamfer face of silicon ingot Download PDFInfo
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- CN102494659A CN102494659A CN2011104303300A CN201110430330A CN102494659A CN 102494659 A CN102494659 A CN 102494659A CN 2011104303300 A CN2011104303300 A CN 2011104303300A CN 201110430330 A CN201110430330 A CN 201110430330A CN 102494659 A CN102494659 A CN 102494659A
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- top cover
- base
- silicon ingot
- movable screw
- flatness
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Abstract
The invention discloses a bearing device for detecting the flatness of a chamfer face of a silicon ingot. The bearing device comprises a base, a movable screw and a top cover. A hollow cavity is arranged at the upper part of the base. A 'V'-shaped groove is arranged below the hollow cavity. The 'V'-shaped groove is of a right angle. A rectangular groove is arranged in the middle of the top cover. The movable screw is arranged at the top of the base. The top cover is arranged on the movable screw. The top cover is supported by the movable screw. The bearing device disclosed by the invention has the beneficial effects that: the bearing device can be used for assisting a flatness instrument to measure the flatness of the chamfer face after the photovoltaic silicon ingot is milled and chamfered; the bearing device disclosed by the invention is simple in structure, solves defects caused by judging the flatness of the chamfer face through naked eyes, and can effectively prevent abnormalities on the chamfer edge, such as unevenness, bright spots, broken edges and the like, which are caused by slicing.
Description
Technical field
The present invention relates to the instrument of processing photovoltaic silicon ingot; Be more particularly to a kind of bogey that detects silicon ingot fillet surface flatness, belong to mill auxiliary detection flatness instrument after the chamfering of photovoltaic silicon ingot and measure the aid field of fillet surface flatness.
Background technology
In the silicon materials process, the silicon ingot chamfering of milling is one critical process before the silicon materials cutting processing, the silicon ingot chamfering of milling, be according to customer requirement to carrying out processing in early stage around the silicon chip, reduce silicon chip and occur bad critical processes such as silicon falls, bright border all around.
At present in the photovoltaic silicon ingot is milled the chamfering field; Silicon ingot polished surface check dynamics improves constantly; But fillet surface is because the limitation of check, and never good method detects its quality, and bright border, the silicon on the fillet surface of section back falls and phenomenon such as concavo-convex causes scrapping of silicon chip.
Summary of the invention
The objective of the invention is to overcome above deficiency, a kind of bogey that detects silicon ingot fillet surface flatness is provided, it can measure the fillet surface flatness by auxiliary detection flatness instrument after the photovoltaic silicon ingot is milled chamfering.
A kind of bogey that detects silicon ingot fillet surface flatness comprises base, movable screw and top cover, is provided with cavity on the top of base; Below cavity, be provided with " V " shape groove; " V " shape groove is rectangular, in the middle of top cover, is provided with rectangular slot, on the top of base, is provided with movable screw; Be provided with top cover above the movable screw, movable screw is supporting top cover.
The bottom surface of described base is that the length of side is the square of 295～300mm, and the height of base is 285～295mm.
The end face of described top cover is that the length of side is the square of 320～330mm, and the thickness of top cover is 3～5mm, and the width of the rectangular slot in the middle of the top cover is 8～10mm, and length is 280～300mm.
Distance between the inferior horn end of described " V " shape groove and the bottom surface of base is 80～85mm, and the distance between the lower surface in the end face of base and the cavity is 160～165mm, and the thickness of the wall around the cavity is 38～40mm.
The number of movable screw is 4, is located at respectively on four angles at top of base.
The invention has the beneficial effects as follows: the present invention can measure the fillet surface flatness by auxiliary detection flatness instrument after the photovoltaic silicon ingot is milled chamfering.The present invention is simple in structure, solves the drawback of judging the fillet surface flatness with naked eyes, and that the back bevel edge that can effectively prevent to cut into slices occurs is concavo-convex, bright spot, to collapse limit etc. unusual.
Description of drawings
Fig. 1 is a structural representation of the present invention.
Fig. 2 is a vertical view of the present invention.
Embodiment
Below in conjunction with accompanying drawing the present invention is elaborated
A kind of bogey that detects silicon ingot fillet surface flatness comprises base 1, movable screw 4 and top cover 5, is provided with cavity 2 on the top of base 1; Below cavity 2, be provided with " V " shape groove 7; " V " shape groove 7 is rectangular, in the middle of top cover 5, is provided with rectangular slot 9, on the top of base 1, is provided with movable screw 4; Be provided with top cover 5 above the movable screw 4, movable screw 4 is supporting top cover 5.
The bottom surface of described base 1 is that the length of side is the square of 295～300mm, and the height of base 1 is 285～295mm.
The end face of described top cover 5 is that the length of side is the square of 320～330mm, and the thickness of top cover 5 is 3～5mm, and according to the chamfering requirement of current polycrystal silicon ingot 0.5～2mm, the width of the rectangular slot 9 in the middle of the top cover 5 is 8～10mm, and length is 280～300mm.
Distance between the inferior horn end of described " V " shape groove 7 and the bottom surface of base 1 is 80～85mm, and the distance between the lower surface in the end face of base 1 and the cavity 2 is 160～165mm, and the thickness of the wall around the cavity 2 is 38～40mm.
The number of movable screw 4 is 4, is located at respectively on four angles at top of base 1.
The present invention can measure the fillet surface flatness by auxiliary detection flatness instrument after the photovoltaic silicon ingot is milled chamfering.
The process of measuring the fillet surface flatness is:
1, silicon ingot 3 is placed in the base 1.Because: be provided with cavity 2 on the top of base 1, below cavity 2, be provided with " V " shape groove 7, " V " shape groove 7 is rectangular; So: silicon ingot 3 is placed on " V " shape groove 7, and the fillet surface of silicon ingot 3 is up.
2, cover top cover 5, through regulating four movable screws 4, thereby regulate the position of top cover 5, the horizontal level of adjustment top cover 5 and silicon ingot 3 fillet surfaces, up at grade, permissible error ± 3mm.
3, on top cover 5, place detection flatness instrument, use and detect the flatness that the flatness instrument is measured fillet surface on the silicon ingot 3.
Through stirring silicon ingot 3, can measure the flatness of 4 fillet surfaces.
In sum: the present invention is simple in structure, solves the drawback of judging the fillet surface flatness with naked eyes, and that the back bevel edge that can effectively prevent to cut into slices occurs is concavo-convex, bright spot, to collapse limit etc. unusual.The present invention can measure the fillet surface flatness by auxiliary detection flatness instrument after the photovoltaic silicon ingot is milled chamfering.
Claims (5)
1. a bogey that detects silicon ingot fillet surface flatness is characterized in that: comprise base, movable screw and top cover, be provided with cavity on the top of base; Below cavity, be provided with " V " shape groove; " V " shape groove is rectangular, in the middle of top cover, is provided with rectangular slot, on the top of base, is provided with movable screw; Be provided with top cover above the movable screw, movable screw is supporting top cover.
2. a kind of bogey that detects silicon ingot fillet surface flatness according to claim 1 is characterized in that: the bottom surface of described base is that the length of side is the square of 295～300mm, and the height of base is 285～295mm.
3. a kind of bogey that detects silicon ingot fillet surface flatness according to claim 1; It is characterized in that: the end face of described top cover is that the length of side is the square of 320～330mm; The thickness of top cover is 3～5mm; The width of the rectangular slot in the middle of the top cover is 8～10mm, and length is 280～300mm.
4. a kind of bogey that detects silicon ingot fillet surface flatness according to claim 1; It is characterized in that: the distance between the inferior horn end of described " V " shape groove and the bottom surface of base is 80～85mm; Distance between the lower surface in the end face of base and the cavity is 160～165mm, and the thickness of the wall around the cavity is 38～40mm.
5. a kind of bogey that detects silicon ingot fillet surface flatness according to claim 1 is characterized in that: the number of movable screw is 4, is located at respectively on four angles at top of base.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011104303300A CN102494659A (en) | 2011-12-21 | 2011-12-21 | Bearing device for detecting flatness of chamfer face of silicon ingot |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011104303300A CN102494659A (en) | 2011-12-21 | 2011-12-21 | Bearing device for detecting flatness of chamfer face of silicon ingot |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102494659A true CN102494659A (en) | 2012-06-13 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011104303300A Pending CN102494659A (en) | 2011-12-21 | 2011-12-21 | Bearing device for detecting flatness of chamfer face of silicon ingot |
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| CN (1) | CN102494659A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104215212A (en) * | 2013-05-28 | 2014-12-17 | 康宁精密素材株式会社 | Method of measuring flatness of chamfering table |
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| CN2935353Y (en) * | 2006-06-22 | 2007-08-15 | 鸿承科技股份有限公司 | Improved structure of image display frame |
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| CN201417130Y (en) * | 2009-04-20 | 2010-03-03 | 杭州永磁集团有限公司 | Measuring tool for measuring chamfer angle |
| CN201795768U (en) * | 2010-08-24 | 2011-04-13 | 宁波圣菲机械制造有限公司 | Measuring table for surface roughness measuring instrument of cone |
| CN201858953U (en) * | 2010-10-21 | 2011-06-08 | 北京现代汽车有限公司 | Vertex angle detector of cutter |
| CN201909612U (en) * | 2010-09-30 | 2011-07-27 | 南阳飞龙汽车零部件有限公司 | Checking fixture for planeness of large surface of exhaust manifold |
| CN202420472U (en) * | 2011-12-21 | 2012-09-05 | 江苏美科硅能源有限公司 | Bearing device for detecting silicon ingot chamfered face flatness |
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2011
- 2011-12-21 CN CN2011104303300A patent/CN102494659A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020140135A1 (en) * | 2001-03-28 | 2002-10-03 | Hideyuki Harada | Multilayered ceramic substrate production method |
| CN2843230Y (en) * | 2005-09-13 | 2006-12-06 | 鸿承科技股份有限公司 | Multiple-picture changeable display albun |
| CN2882433Y (en) * | 2005-09-13 | 2007-03-28 | 鸿承科技股份有限公司 | Two-picture fixed changable showing frame |
| CN2935353Y (en) * | 2006-06-22 | 2007-08-15 | 鸿承科技股份有限公司 | Improved structure of image display frame |
| CN101191718A (en) * | 2006-11-24 | 2008-06-04 | 深圳富泰宏精密工业有限公司 | Planarity checking platform |
| CN201417130Y (en) * | 2009-04-20 | 2010-03-03 | 杭州永磁集团有限公司 | Measuring tool for measuring chamfer angle |
| CN201795768U (en) * | 2010-08-24 | 2011-04-13 | 宁波圣菲机械制造有限公司 | Measuring table for surface roughness measuring instrument of cone |
| CN201909612U (en) * | 2010-09-30 | 2011-07-27 | 南阳飞龙汽车零部件有限公司 | Checking fixture for planeness of large surface of exhaust manifold |
| CN201858953U (en) * | 2010-10-21 | 2011-06-08 | 北京现代汽车有限公司 | Vertex angle detector of cutter |
| CN202420472U (en) * | 2011-12-21 | 2012-09-05 | 江苏美科硅能源有限公司 | Bearing device for detecting silicon ingot chamfered face flatness |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104215212A (en) * | 2013-05-28 | 2014-12-17 | 康宁精密素材株式会社 | Method of measuring flatness of chamfering table |
| CN104215212B (en) * | 2013-05-28 | 2017-06-09 | 康宁精密素材株式会社 | Method for measuring the flatness of chamfering platform |
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Application publication date: 20120613 |