CN102353526B - Device and method for detecting uniformity of plate color glass filter - Google Patents
Device and method for detecting uniformity of plate color glass filter Download PDFInfo
- Publication number
- CN102353526B CN102353526B CN2011101968340A CN201110196834A CN102353526B CN 102353526 B CN102353526 B CN 102353526B CN 2011101968340 A CN2011101968340 A CN 2011101968340A CN 201110196834 A CN201110196834 A CN 201110196834A CN 102353526 B CN102353526 B CN 102353526B
- Authority
- CN
- China
- Prior art keywords
- sample
- glass filter
- dull
- semiconductor laser
- display
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
The invention discloses a device and a method for detecting the uniformity of a plate color glass filter. The device comprises a semiconductor laser, wherein a beam expander, a sample clamp holder, an imaging lens and a charge coupled device (CCD) detector are sequentially arranged in the same optical axis along the direction of laser output by the semiconductor laser; the CCD detector is positioned on a focal plane of the imaging lens; the output end of the CCD detector is connected with the input end of a display; and the sample clamp holder is used for clamping a plate color glass filter to be detected. In the invention, a dynamic image is acquired by horizontally moving the plate color glass filter to be detected, so that the non-uniformity of the color glass filter is determined. The device has a simple structure, a simple and convenient measurement method and an ideal detection effect and can be used for batch detection.
Description
Technical field
The present invention relates to glass, particularly the inhomogeneity pick-up unit of a kind of dull and stereotyped colour glass filter and method.
Background technology
In high power laser light and the research of general laser, laser has higher peak power and energy density.In the process that laser parameter is diagnosed, need to carry out a certain proportion of decay to meet the input range demand of measuring equipment to sample beam, the coloured glass of different model has specific transmission coefficient to the laser of different wave length, is usually used in tested light beam is carried out the strength retrogression; Simultaneously, specific coloured glass is also non-by photometry for isolation natural light and other.When coloured glass is used for laser parameter measurement, during especially for the diagnosis of spatial parameter, for fear of colour glass filter, introduce extra intensity modulation, need to adopt the uniform colour glass filter of optical property.The unevenness of colour glass filter mainly comprises: the internal stress unevenness of introducing in process causes optical property inhomogeneous; Impurity and other unevenness.Therefore need to carry out homogeneity to the dull and stereotyped colour glass filter that is used for laser parameter measurement and detect, filter out the sample of satisfying the demand.
Summary of the invention
Subject matter to be solved by this invention, be to provide the inhomogeneity pick-up unit of a kind of dull and stereotyped colour glass filter and method, to realize the inhomogeneity fast detecting of dull and stereotyped colour glass filter.
Technical solution of the present invention is as follows:
The inhomogeneity pick-up unit of a kind of dull and stereotyped colour glass filter, comprise semiconductor laser, its characteristics are: the laser direction along described semiconductor laser output is beam expander, sample holder, imaging len and the ccd detector of same optical axis successively, described ccd detector is positioned at the focal plane of described imaging len, the input end of the output termination display of described ccd detector, described sample holder is for dull and stereotyped colour glass filter clamping to be measured.
Described sample holder is adjustable coaxial lens mount.
For the ease of observing measurement image, the semiconductor laser wavelength that uses should be in the high printing opacity spectrum zone of dull and stereotyped coloured glass; Sample holder, because the coloured flat board that uses generally is processed as circle, adopt adjustable coaxial lens mount as sample holder, imaging lens is imaged on described ccd detector surface with sample plane, show on input display, with the homogeneity of monitoring transmissivity.
Utilize the inhomogeneity pick-up unit of described dull and stereotyped colour glass filter to carry out the inhomogeneity detection method of dull and stereotyped colour glass filter, its characteristics are that the method comprises the following steps:
1., with dull and stereotyped colour glass filter to be measured, referred to as sample, be placed on described sample holder;
2. open semiconductor laser, make the picture of observing described sample on described display;
3. during the described sample of vertical optical axis transverse shifting, observe the light and shade band line that moves with sample, little blackening or speck with the sample transverse shifting on display, show that described sample transmitance is inhomogeneous; Do not observe on display light and shade band line, little blackening or speck with the sample transverse shifting, sample is uniform.
The present invention adopts the method for transverse shifting sample, distinguishes sample unevenness and light beam unevenness., although semiconductor laser has the output of stable and uniform, before inserting sample,, due to the local unevenness of laser instrument and the unevenness of imaging system optical element, can observe some flaw points and light intensity non-uniform areas on monitor.After inserting sample and the transverse shifting sample, can observe the defect that moves with sample on display screen,, if any internal stress, there will be a light and shade band line that distributes along stress direction, with the sample transverse shifting, these structures show that transmitance is inhomogeneous if any some little blackenings or speck.
The mechanism of adjustable coaxial lens mount as clamped sample adopted in this invention, can install quickly and easily and dismantle sample, do not need strict vertical incidence sample owing to detecting light beam, so the sample clamping mechanism does not need complicated governor motion.
Description of drawings
Fig. 1 is the inhomogeneity pick-up unit schematic diagram of the dull and stereotyped colour glass filter of the present invention
In figure: the 1-semiconductor laser; 2-beam-expanding collimation device; 3-is adjustable coaxial lens mount; The 4-sample; The 5-imaging len; The 6-CCD detector; The 7-display.
Embodiment
The invention will be further described below in conjunction with embodiment and accompanying drawing, but should not limit the scope of the invention with this.
Fig. 1 is the inhomogeneity pick-up unit schematic diagram of the dull and stereotyped colour glass filter of the present invention, as seen from the figure, the inhomogeneity pick-up unit of the dull and stereotyped colour glass filter of the present invention, comprise semiconductor laser 1, laser direction along described semiconductor laser 1 output is the beam-expanding collimation device 2 of same optical axis successively, sample holder 3, imaging len 5 and ccd detector 6, described ccd detector 6 is positioned at the focal plane of described imaging len 5, the output termination display 7 of described ccd detector 6, described sample holder 3 is for dull and stereotyped colour glass filter 4 clampings to be measured.Described sample holder 3 is adjustable coaxial lens mount.
Utilize above-mentioned device to carry out the inhomogeneity detection method of dull and stereotyped colour glass filter, it is characterized in that the method comprises the following steps:
1., with dull and stereotyped colour glass filter to be detected, be designated hereinafter simply as sample 4 and be placed on described sample holder 3;
2. open described semiconductor laser 1, suitably adjust light path, make the picture of observing described sample on described display 7;
3. during the described sample of vertical optical axis transverse shifting, observe on display 7 light and shade band line, little blackening or speck with the sample transverse shifting, show that the transmitance of described sample is inhomogeneous; Do not observe on display 7 light and shade band line, little blackening or speck with the sample transverse shifting, this sample is uniform.
According to the transmitted spectrum scope of colour glass filter to be measured, select corresponding semiconductor laser 1, make the laser that semiconductor laser sends can see through 10% above energy.The trade mark that is used for cut-off nature visible light of producing take Shanghai coloured glass factory is as HWB760 infrared transmission visible absorbance glass as example, thickness is 3mm, to the following wavelength cut-off of 700nm, the transmissivity T of 760nm place〉85%, the above transmissivity of 800nm reaches 90%, select the DPIR-3050 of Photoptech company semiconductor laser as detection light source, work centre wavelength 1064nm, output power 50mW.The laser that semiconductor laser 1 sends after beam expander 2, obtains the light beam suitable with testing sample 4 bores., take 30mm bore sample as example, need 1mm bore laser amplifier to the 20-40mm bore, to the not strict demand of collimation that detects light.Sample 4 is clamped on adjustable coaxial lens mount 3, and this is adjustable, and coaxial lens mount is applicable to 5-50mm bore sample clamping, due to general colour glass filter less than the 50mm bore, so this adjustable coaxial lens mount meets the laboratory primary demand.Detection light through the colour glass filter modulation is imaged on through camera lens 5 on the photosurface of ccd detector 6, shows after ccd detector 6 gathers and on display 7, for the staff, observes.It should be noted that and the rear surface of sample 4 clearly must be imaged on the photosurface of ccd detector 6, can observe the heterogeneity details of colour glass filter.The level adjustable coaxial lens mount 3 that moves around, can observe the image of sample 4 on display 7.If sample 4 is desirable, without flaws such as internal stress and bad points, the zone in ccd detector 6 visual fields can not change there being n.s. to pass through two kinds of contrasts in situation so., if change, illustrated that flaw exists.When mobile example, those move with sample and mobile imagery zone is exactly the sample defect areas.Can judge flaw pattern and the order of severity by repeatedly coming and going to move, and then filter out more uniform colour glass filter.
Claims (3)
1. inhomogeneity pick-up unit of dull and stereotyped colour glass filter, comprise semiconductor laser (1), it is characterized in that: the laser direction along described semiconductor laser (1) output is beam-expanding collimation device (2), sample holder (3), imaging len (5) and the ccd detector (6) of same optical axis successively, described ccd detector (6) is positioned at the focal plane of described imaging len (5), the output termination display (7) of described ccd detector (6), the dull and stereotyped colour glass filter (4) that described sample holder (3) clamping is to be measured.
2. the inhomogeneity pick-up unit of dull and stereotyped colour glass filter according to claim 1, it is characterized in that: described sample holder (3) is adjustable coaxial lens mount.
3. utilize device claimed in claim 1 to carry out the inhomogeneity detection method of dull and stereotyped colour glass filter, it is characterized in that the method comprises the following steps:
1., with dull and stereotyped colour glass filter to be detected, be designated hereinafter simply as sample (4) and be placed on described sample holder (3);
2. open described semiconductor laser (1), suitably adjust light path, make the picture of observing described sample on described display (7);
3. during the described sample of vertical optical axis transverse shifting (4), observe on display (7) light and shade band line, little blackening or speck with the sample transverse shifting, show that the transmitance of described sample (4) is inhomogeneous; Do not observe on display (7) light and shade band line, little blackening or speck with the sample transverse shifting, this sample (4) is uniform.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2011101968340A CN102353526B (en) | 2011-07-14 | 2011-07-14 | Device and method for detecting uniformity of plate color glass filter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2011101968340A CN102353526B (en) | 2011-07-14 | 2011-07-14 | Device and method for detecting uniformity of plate color glass filter |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102353526A CN102353526A (en) | 2012-02-15 |
CN102353526B true CN102353526B (en) | 2013-11-20 |
Family
ID=45577136
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2011101968340A Expired - Fee Related CN102353526B (en) | 2011-07-14 | 2011-07-14 | Device and method for detecting uniformity of plate color glass filter |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN102353526B (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105699056B (en) * | 2016-02-22 | 2019-10-18 | 中国科学院上海光学精密机械研究所 | Device and method for detecting intensity and phase transmission distribution of colored glass filter |
CN107153000B (en) * | 2017-06-20 | 2023-10-31 | 中国地质大学(武汉) | Portable filter optical performance detection device and detection method thereof |
CN108037137A (en) * | 2018-02-01 | 2018-05-15 | 山东山大天维新材料有限公司 | The non-destructive testing device and detection method of bulletproof halmet of composite material structural homogeneity |
CN110618136A (en) * | 2019-10-24 | 2019-12-27 | 北京石晶光电科技股份有限公司 | Stripe detector for artificial optical quartz crystal material |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1677073A (en) * | 2004-04-02 | 2005-10-05 | 力特光电科技股份有限公司 | Bias pole piece detecting method |
JP2008196916A (en) * | 2007-02-09 | 2008-08-28 | Olympus Imaging Corp | Optical element evaluation method, optical surface evaluation method, and optical surface evaluation device |
JP2010185773A (en) * | 2009-02-12 | 2010-08-26 | Olympus Corp | Measuring method for lens transmissivity distribution and apparatus of same |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6457142A (en) * | 1987-08-28 | 1989-03-03 | Toshiba Corp | Apparatus for inspecting characteristic of optical part |
JPH02185192A (en) * | 1989-01-12 | 1990-07-19 | Toshiba Corp | Uniformity evaluation device |
JP3098715B2 (en) * | 1996-08-27 | 2000-10-16 | 東京パフ株式会社 | Method of manufacturing cosmetic applicator and cosmetic applicator |
-
2011
- 2011-07-14 CN CN2011101968340A patent/CN102353526B/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1677073A (en) * | 2004-04-02 | 2005-10-05 | 力特光电科技股份有限公司 | Bias pole piece detecting method |
JP2008196916A (en) * | 2007-02-09 | 2008-08-28 | Olympus Imaging Corp | Optical element evaluation method, optical surface evaluation method, and optical surface evaluation device |
JP2010185773A (en) * | 2009-02-12 | 2010-08-26 | Olympus Corp | Measuring method for lens transmissivity distribution and apparatus of same |
Also Published As
Publication number | Publication date |
---|---|
CN102353526A (en) | 2012-02-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7973921B2 (en) | Dynamic illumination in optical inspection systems | |
CN102353526B (en) | Device and method for detecting uniformity of plate color glass filter | |
CN108051443B (en) | Device and method for measuring glass stress and defects | |
TWI431262B (en) | Method for inspecting stain in polarizer due to uneven dyeing and automatic inspection system using the same | |
CN103245670B (en) | Defect detection device and defect detection method of optical element | |
CN106442538A (en) | Optical element damage detecting device and method based on polarization imaging | |
JP5645142B2 (en) | Unevenness automatic inspection device and inspection method for polarizing plate using color difference analysis | |
CN201569492U (en) | Instrument for detecting optical fiber field distribution | |
CN106970049B (en) | Transmission distribution measuring system and method | |
CN105699056B (en) | Device and method for detecting intensity and phase transmission distribution of colored glass filter | |
CN202548063U (en) | System for automatically acquiring light-transmitting image of optic fiber plate | |
CN207407823U (en) | A kind of big visual field sample thickness measuring device | |
CN104122266B (en) | Solar silicon wafers high-speed line scanning photoluminescence imaging detection device | |
KR101440975B1 (en) | Automatic inspection apparatus for stain in the polarizing plate using color difference analysis | |
CN115219480B (en) | Phase-locked low-light-level microscopic imaging method and device | |
CN111122397A (en) | Optical material performance detection device | |
CN116297352A (en) | Quality evaluation and calibration method for confocal fluorescence microscope | |
KR101516351B1 (en) | Apparatus for measuring transparency | |
CN204422434U (en) | A kind of found range industrial endoscope probe being provided with illumination compensation device | |
CN104596652B (en) | A kind of adjustable ultrashort pulse instrument for measuring the optical pulse of temporal resolution | |
CN209387248U (en) | A kind of flare testing light source and device | |
CN102269716A (en) | Test method for optical damage of microzone, and apparatus thereof | |
CN212458837U (en) | Brightness distribution measuring device | |
CN218121783U (en) | Perovskite subassembly film defect detecting device | |
CN214707830U (en) | Anti-electromagnetic interference image monitoring device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20131120 Termination date: 20160714 |