CN102261953B - 照度传感器 - Google Patents
照度传感器 Download PDFInfo
- Publication number
- CN102261953B CN102261953B CN201110099267.7A CN201110099267A CN102261953B CN 102261953 B CN102261953 B CN 102261953B CN 201110099267 A CN201110099267 A CN 201110099267A CN 102261953 B CN102261953 B CN 102261953B
- Authority
- CN
- China
- Prior art keywords
- voltage
- photodetector
- mentioned
- illuminance transducer
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005070 sampling Methods 0.000 claims abstract description 14
- 238000012423 maintenance Methods 0.000 claims abstract description 4
- 230000000007 visual effect Effects 0.000 claims description 6
- 238000004519 manufacturing process Methods 0.000 claims description 2
- 238000005286 illumination Methods 0.000 abstract description 16
- 238000010586 diagram Methods 0.000 description 6
- 230000005669 field effect Effects 0.000 description 4
- 238000012544 monitoring process Methods 0.000 description 4
- 230000003534 oscillatory effect Effects 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J1/46—Electric circuits using a capacitor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Light Receiving Elements (AREA)
Abstract
Description
Claims (7)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010099068A JP5695338B2 (ja) | 2010-04-22 | 2010-04-22 | 照度センサ |
JP2010-099068 | 2010-04-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102261953A CN102261953A (zh) | 2011-11-30 |
CN102261953B true CN102261953B (zh) | 2016-01-13 |
Family
ID=44815007
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201110099267.7A Expired - Fee Related CN102261953B (zh) | 2010-04-22 | 2011-04-20 | 照度传感器 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8723097B2 (zh) |
JP (1) | JP5695338B2 (zh) |
KR (1) | KR101844064B1 (zh) |
CN (1) | CN102261953B (zh) |
TW (1) | TWI499761B (zh) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6049488B2 (ja) * | 2013-02-14 | 2016-12-21 | エスアイアイ・セミコンダクタ株式会社 | センサ回路 |
TWI484464B (zh) * | 2013-02-22 | 2015-05-11 | Au Optronics Corp | 光感測裝置 |
US8836377B1 (en) * | 2013-03-13 | 2014-09-16 | Texas Instruments Incorporated | Sampled reference supply voltage supervisor |
FR3007856B1 (fr) * | 2013-06-27 | 2016-09-16 | Continental Automotive France | Dispositif de traitement d'un signal provenant d'une thermopile et procede associe |
CN105095800B (zh) * | 2014-05-08 | 2018-07-20 | 中芯国际集成电路制造(上海)有限公司 | 光检测器 |
CN109870233B (zh) | 2017-12-05 | 2020-11-03 | 上海耕岩智能科技有限公司 | 光侦测薄膜、光侦测器件、光侦测装置 |
CN114034384B (zh) * | 2021-11-19 | 2023-10-13 | 恒玄科技(上海)股份有限公司 | 一种光电采样组件及可穿戴设备 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4533257A (en) * | 1982-12-16 | 1985-08-06 | Kabushiki Kaisha Suwa Seikosha | Analog electric timepiece |
US6038049A (en) * | 1996-11-25 | 2000-03-14 | Sharp Kabushiki Kaisha | Waveform-shaping circuit and a data-transmitting apparatus using such a circuit |
US7189953B2 (en) * | 2003-02-26 | 2007-03-13 | Seiko Instruments Inc. | Signal processing circuit, image sensor IC, and signal processing method |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55158677A (en) * | 1979-05-29 | 1980-12-10 | Hitachi Ltd | Light-signal sensor |
US5117118A (en) * | 1988-10-19 | 1992-05-26 | Astex Co., Ltd. | Photoelectric switch using an integrated circuit with reduced interconnections |
JPH05122158A (ja) * | 1991-10-24 | 1993-05-18 | Sharp Corp | 光電変換装置 |
JP2000332546A (ja) * | 1999-05-18 | 2000-11-30 | Sharp Corp | 受光アンプ回路 |
US6919549B2 (en) * | 2003-04-11 | 2005-07-19 | Canesta, Inc. | Method and system to differentially enhance sensor dynamic range |
JP2004349985A (ja) * | 2003-05-21 | 2004-12-09 | Sharp Corp | 固体撮像装置およびその駆動方法 |
JP2005241306A (ja) * | 2004-02-24 | 2005-09-08 | Matsushita Electric Works Ltd | 明るさセンサ |
JP3974902B2 (ja) * | 2004-02-27 | 2007-09-12 | 三菱電機株式会社 | 熱型赤外線検出素子 |
JP2006040976A (ja) * | 2004-07-22 | 2006-02-09 | Hamamatsu Photonics Kk | 光検出器 |
JP4443390B2 (ja) | 2004-11-24 | 2010-03-31 | コーデンシ株式会社 | 半導体光検出装置 |
JP4720275B2 (ja) * | 2005-04-27 | 2011-07-13 | ソニー株式会社 | 撮像装置 |
JP4308170B2 (ja) * | 2005-06-10 | 2009-08-05 | 本田技研工業株式会社 | イメージセンサ |
CN2816766Y (zh) * | 2005-06-16 | 2006-09-13 | 郑国恩 | 一种可见光照度传感器 |
US7435943B1 (en) * | 2007-03-29 | 2008-10-14 | Avago Technologies Ecbu Ip Pte Ltd | Color sensor with infrared correction having a filter layer blocking a portion of light of visible spectrum |
JP5305387B2 (ja) * | 2007-12-25 | 2013-10-02 | セイコーインスツル株式会社 | 光検出装置、及び画像表示装置 |
JP2009158569A (ja) * | 2007-12-25 | 2009-07-16 | Seiko Instruments Inc | 光検出半導体装置、光検出装置、及び画像表示装置 |
-
2010
- 2010-04-22 JP JP2010099068A patent/JP5695338B2/ja not_active Expired - Fee Related
-
2011
- 2011-04-07 US US13/082,058 patent/US8723097B2/en not_active Expired - Fee Related
- 2011-04-11 TW TW100112454A patent/TWI499761B/zh not_active IP Right Cessation
- 2011-04-18 KR KR1020110035535A patent/KR101844064B1/ko active IP Right Grant
- 2011-04-20 CN CN201110099267.7A patent/CN102261953B/zh not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4533257A (en) * | 1982-12-16 | 1985-08-06 | Kabushiki Kaisha Suwa Seikosha | Analog electric timepiece |
US6038049A (en) * | 1996-11-25 | 2000-03-14 | Sharp Kabushiki Kaisha | Waveform-shaping circuit and a data-transmitting apparatus using such a circuit |
US7189953B2 (en) * | 2003-02-26 | 2007-03-13 | Seiko Instruments Inc. | Signal processing circuit, image sensor IC, and signal processing method |
Also Published As
Publication number | Publication date |
---|---|
US20110260041A1 (en) | 2011-10-27 |
JP2011228590A (ja) | 2011-11-10 |
KR20110118083A (ko) | 2011-10-28 |
JP5695338B2 (ja) | 2015-04-01 |
US8723097B2 (en) | 2014-05-13 |
TW201226866A (en) | 2012-07-01 |
CN102261953A (zh) | 2011-11-30 |
KR101844064B1 (ko) | 2018-03-30 |
TWI499761B (zh) | 2015-09-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160330 Address after: Chiba County, Japan Patentee after: SEIKO INSTR INC Address before: Chiba County, Japan Patentee before: Seiko Instruments Inc. |
|
CP01 | Change in the name or title of a patent holder |
Address after: Chiba County, Japan Patentee after: EPPs Lingke Co. Ltd. Address before: Chiba County, Japan Patentee before: SEIKO INSTR INC |
|
CP01 | Change in the name or title of a patent holder | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160113 Termination date: 20210420 |
|
CF01 | Termination of patent right due to non-payment of annual fee |