CN102254178B - 图像处理设备、图像处理方法和计算机程序 - Google Patents

图像处理设备、图像处理方法和计算机程序 Download PDF

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Publication number
CN102254178B
CN102254178B CN201110131814.5A CN201110131814A CN102254178B CN 102254178 B CN102254178 B CN 102254178B CN 201110131814 A CN201110131814 A CN 201110131814A CN 102254178 B CN102254178 B CN 102254178B
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China
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pixel
image
distribution range
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multivalue
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Chinese (zh)
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CN102254178A (zh
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佐伯和人
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Keyence Corp
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Keyence Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

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  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN201110131814.5A 2010-05-21 2011-05-20 图像处理设备、图像处理方法和计算机程序 Expired - Fee Related CN102254178B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010117092A JP5469532B2 (ja) 2010-05-21 2010-05-21 画像処理装置、画像処理方法及びコンピュータプログラム
JP2010-117092 2010-05-21

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CN102254178A CN102254178A (zh) 2011-11-23
CN102254178B true CN102254178B (zh) 2016-03-30

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US (1) US8594416B2 (https=)
JP (1) JP5469532B2 (https=)
CN (1) CN102254178B (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5956814B2 (ja) * 2012-04-20 2016-07-27 株式会社キーエンス 外観検査装置、外観検査方法及びコンピュータプログラム
JP6037125B2 (ja) 2013-02-18 2016-11-30 株式会社サタケ 光学式粒状物選別機
US11158039B2 (en) * 2015-06-26 2021-10-26 Cognex Corporation Using 3D vision for automated industrial inspection
JP7077631B2 (ja) * 2018-01-18 2022-05-31 コニカミノルタ株式会社 画像検査装置および画像形成システム
CN110057325B (zh) * 2019-04-26 2020-06-23 湖南大学 一种基于成像仿真的表面粗糙度检测方法及计算设备
CN110310275B (zh) * 2019-07-02 2021-09-28 芜湖启迪睿视信息技术有限公司 一种基于图像处理的链式传送带缺陷检测方法
CN111652319A (zh) * 2020-06-09 2020-09-11 创新奇智(广州)科技有限公司 一种布匹缺陷检测方法及装置
EP3933528B1 (en) * 2020-06-30 2024-10-02 Bull SAS Predicting system in additive manufacturing process by machine learning algorithms

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101107512A (zh) * 2005-01-28 2008-01-16 Ykk株式会社 物品的外观检查装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3749090B2 (ja) 2000-07-06 2006-02-22 大日本スクリーン製造株式会社 パターン検査装置
JP3741672B2 (ja) 2002-07-08 2006-02-01 株式会社アドイン研究所 画像特徴学習型欠陥検出方法、欠陥検出装置及び欠陥検出プログラム
JP2005265661A (ja) 2004-03-19 2005-09-29 Ovit:Kk 画像処理方法およびその装置
JP4935109B2 (ja) * 2005-03-17 2012-05-23 オムロン株式会社 基板検査装置並びにその検査ロジック設定方法および検査ロジック設定装置
JP2007114843A (ja) * 2005-10-18 2007-05-10 Denso Corp 良否判定装置
US8103087B2 (en) * 2006-01-20 2012-01-24 Hitachi High-Technologies Corporation Fault inspection method
JP5028014B2 (ja) * 2006-02-08 2012-09-19 株式会社日立ハイテクノロジーズ パターン検査方法及びその装置
JP2008139074A (ja) * 2006-11-30 2008-06-19 Rozefu Technol:Kk 画像の欠陥検出方法
JP4943304B2 (ja) * 2006-12-05 2012-05-30 株式会社 Ｎｇｒ パターン検査装置および方法
JP2008139262A (ja) * 2006-12-05 2008-06-19 Omron Corp 欠陥検査方法およびその方法を用いた検査装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101107512A (zh) * 2005-01-28 2008-01-16 Ykk株式会社 物品的外观检查装置

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Publication number Publication date
JP5469532B2 (ja) 2014-04-16
JP2011243139A (ja) 2011-12-01
CN102254178A (zh) 2011-11-23
US20110286659A1 (en) 2011-11-24
US8594416B2 (en) 2013-11-26

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