CN102193258A - Wire defect judging device and wire defect judging methods - Google Patents
Wire defect judging device and wire defect judging methods Download PDFInfo
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- CN102193258A CN102193258A CN2010101200702A CN201010120070A CN102193258A CN 102193258 A CN102193258 A CN 102193258A CN 2010101200702 A CN2010101200702 A CN 2010101200702A CN 201010120070 A CN201010120070 A CN 201010120070A CN 102193258 A CN102193258 A CN 102193258A
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Abstract
The invention discloses a wire defect judging device of a flat display device, a wire defect judging method of the flat display device and a wire defect judging method of a liquid crystal display device, wherein the wire defect judging device is arranged between a shorting bar area and a display area of a flat display area and comprises a metal layer and a source layer, the source layer is covered by the metal layer and is connected with a driving wire of the display device, and the source layer conducts the driving wire of the display device when the metal layer is powered up. The wire defect judging device can classify the break circuit which is not needed to be repaired, therefore, the production time is reduced, the efficiency is increased and the cost is saved.
Description
Technical field
The present invention relates to display device, relate in particular to the line defect judgment means of flat display apparatus, the line defect determination methods of flat display apparatus and the line defect determination methods of liquid crystal indicator.
Background technology
Flat display apparatus comprises display panel, scanner driver and data driver.Turntable driving is to the multi-strip scanning line output scanning drive signal in turn that is formed on the display panel, data line output R, G, the B picture signal of data driver on display panel.The nonrestrictive example of flat display apparatus comprises liquid crystal indicator, field emission display device, plasma display, luminous display unit etc.In above-mentioned flat display apparatus, data line or drive wire broken string can make that display quality reduces greatly.Be example below with the liquid crystal indicator, the influence of this line defect to display quality is described, in the manufacture craft process of liquid crystal indicator, problems such as the quality of heavy film quality, the cleanliness factor of environment, static discharge (ElectrostaticDischarge or ESD), equipment all inevitably make sweep trace open circuit or provide the data line of voltage to open circuit and produce line defect to pixel.
Line defect occurs in the short bar zone of liquid crystal indicator, also occurs in short bar zone and outer peripheral areas.No matter line defect occurs in short bar zone or outer peripheral areas, can make that all display quality reduces greatly.
In the prior art, when there is line defect in outer peripheral areas, can repair by designing to repair to encircle, Fig. 1 illustrates and comprises the liquid crystal indicator of repairing ring that as shown in Figure 1, this liquid crystal indicator comprises that data line D1 is to data line Dn, reparation ring 1A, 1B.Reparation ring 1A and 1B are positioned at the periphery of viewing area, make with the material that is different from data line D1 to Dn, such as sweep trace metal, pixel electrode metal or the like.When the viewing area has data line to open circuit, such as data line D1 and data line D2, just can utilize reparation ring 1A and 1B to repair, first kind of mode is to carry out laser welding reparation ring 1A respectively and the line defect of repair data line D1 at S1 and S3 place, at S2 and S4 place with laser welding reparation ring 1B the line defect of repair data line D2; The second way be at S5 and S7 place with laser welding reparation ring 1B the line defect of repair data line D1, at S6 and S8 place with laser welding reparation ring 1A the line defect of repair data line D2.
But, when having line defect, can not repair ring by design and repair in the short bar zone, product can only be scrapped.Again because, short bar just uses in the test of system box section, end of test (EOT) is promptly ineffective, can not be used for as circuit path, therefore, the line defect in short bar zone can be not influential to the display quality of product, and present technology can not judge that line defect occurs in short bar zone and outer peripheral areas, therefore, the short bar zone exists the liquid crystal indicator of line defect also to be scrapped, and causes waste.And for fear of this waste, the way of taking usually is to spend a lot of time to judge that earlier line defect is in the short bar zone or in outer peripheral areas, and then with the product rejection of line defect in outer peripheral areas, this mode can cause time and cost waste.
Summary of the invention
The problem that the present invention solves is that prior art can't judge that line defect occurs in the short bar zone or the problem of outer peripheral areas.
For addressing the above problem, the invention provides a kind of line defect judgment means of flat display apparatus, the line defect judgment means of this flat display apparatus is arranged between the short bar zone and viewing area of described flat display apparatus, it comprises metal level and active layer, active layer covers metal level, and the drive wire of active layer and display device is connected, the drive wire of described active layer described display device of conducting when metal level powers up.
Alternatively, described metal level is a gate metal layer.
Alternatively, the metal of described gate metal layer is aluminium or aluminium neodymium alloy.
Alternatively, described metal level is positioned on the active layer or is positioned under the active layer.
Alternatively, the drive wire of the described display device that is connected with active layer is data line or sweep trace.
Alternatively, described active layer is an amorphous silicon layer.
Alternatively, described metal level and described short bar are positioned at same one deck.
A kind of aforesaid line defect judgment means judges that the method for line defect comprises the steps: the drive wire of described flat display apparatus is powered up, and judges whether to produce the broken string phenomenon; If there is drive wire to produce the broken string phenomenon, then the metal level to described line defect judgment means powers up, and judges whether the broken string phenomenon of described drive wire is eliminated; If the broken string phenomenon of described drive wire is eliminated, the broken string position of then judging described drive wire is in the short bar zone, otherwise the broken string position of then judging described drive wire is in outer peripheral areas.
Alternatively, described drive wire produces the broken string phenomenon and is meant under black picture display mode, and described drive wire broken string is shown as bright line.
Alternatively, described drive wire is sweep trace or data line.
A kind of line defect determination methods of liquid crystal indicator comprises the steps: to power up by the drive wire of short bar to described liquid crystal indicator, judges whether to occur the drive wire broken string and shows; Show that if broken string occurs all drive wires of conducting outside the short bar zone of described liquid crystal indicator judge the broken string of described drive wire shows whether eliminate; Eliminate if the broken string of described drive wire shows, the broken string position of then judging described drive wire is in the short bar zone, otherwise the broken string position of then judging described drive wire is in outer peripheral areas.
Alternatively, described drive wire produces the broken string demonstration and is meant under black picture display mode, and described drive wire broken string is shown as bright line.
Alternatively, all drive wires of described conducting comprise by all drive wires of excitation electron conducting.
Compared with prior art, the present invention has the following advantages:
The present invention at first powers up for the drive wire of liquid crystal indicator by short bar, judge whether to take place the broken string phenomenon, then the metal level of this judgment means is powered up and the described drive wire of conducting and judge whether described broken string phenomenon is eliminated (such as, the minimizing of the bar number of bright line) comes definite particular location (line defect occurs in short bar zone or outer peripheral areas) that breaks, like this, can screen the line defect position, and the flat display apparatus that only will need to repair chooses and adopts the method for previous designs reparation ring to repair, and need not be as prior art, exist the flat display apparatus of line defect to scrap in short bar zone or outer peripheral areas, saved cost, and, need not judge earlier that also there is line defect in which bar data line, judge the particular location of line defect then and select and repair or scrap, saved time and cost.
Description of drawings
Fig. 1 is the repair structure synoptic diagram of line defect in the prior art;
Fig. 2 is the cut-open view of judgment means of the line defect of liquid crystal indicator of the present invention;
Fig. 3 is the process flow diagram of determination methods of the line defect of liquid crystal indicator of the present invention;
Fig. 4 is the structural representation that the line defect judgment means of liquid crystal indicator of the present invention is used for first embodiment of liquid crystal indicator;
Fig. 5 is the structural representation that the line defect judgment means of liquid crystal indicator of the present invention is used for second embodiment of liquid crystal indicator;
Fig. 6 is the cut-open view of switch among Fig. 5.
Embodiment
The present inventor is in the process of making flat display apparatus, problems such as the quality of the heavy film quality of discovery, the cleanliness factor of environment, ESD, equipment all inevitably produce line broken circuit, this line broken circuit may be present in the short bar zone, also may be present in outer peripheral areas.And general determination methods only can judge which bar circuit or which bar circuit open circuit at present, and can not determine that line broken circuit occurs in outer peripheral areas or occurs in the short bar zone.
For this reason, see also Fig. 2 and Fig. 4, the invention provides a kind of line defect judgment means 400 of flat display apparatus.This judgment means is arranged between the short bar zone 200 and viewing area 100 of described flat display apparatus, it is outer near laser cut line 500 places to be arranged on short bar zone 200 more specifically, laser cut line 500 is from separatrix that display device cuts away with short bar, because, short bar test time with red, green or blue signal wire links together, test finish stick driving circuit (IC) after, this passes to each signal line with the signal demand of driving circuit and contradicts, can't realize colorful demonstration, therefore, need short bar be cut away along laser cut line 500, thereby, make each signal wire separately, short bar zone 200 comprises first short bar 11, second short bar 12 and the 3rd short bar 13.
See also Fig. 2 and Fig. 4, this flat display apparatus line defect judgment means 400 comprises metal level 401 and active layer 402.Described metal level 401 is a gate metal layer, perhaps is aluminium or aluminium neodymium alloy layer, and metal level 401 is positioned at same one deck with described short bar.Active layer 402 is amorphous silicon layer and covers on the described metal level 401 that the data line D1 that described active layer 402 connects described flat display apparatus is to data line Dn, and Fig. 2 only is signal, has shown that active layer 402 connects data line D1, data line D2 and data line D3.As Fig. 4 or shown in Figure 5, described data line and metal level 401 antarafacials and cross-shaped with metal level 401, it also is orthogonal straight line in two spaces of any formation in described judgment means 400 and the data line, and then, data line and metal level 401 also are the antarafacial homeotropic alignment, adopt in such a way, described judgment means 400 is to comprise metal level 401 from bottom to up, active layer 402 and the bottom grating structure that is positioned at the plurality of data line on the active layer 402, perhaps, described judgment means 400 also can be to comprise the plurality of data line from bottom to up, the top gate structure of active layer 402 and metal level 401, just described metal level 401 is positioned on the active layer 402 or is positioned under the active layer 402.
Corresponding, the present invention also provides the aforementioned line defect judgment means 400 of a kind of usefulness to judge the method for liquid crystal indicator line defect, and as shown in Figure 3, this method comprises the steps:
S11: power up by the drive wire of short bar, judge whether to occur the drive wire broken string and show to described liquid crystal indicator;
S12: show that if broken string occurs all drive wires of conducting outside the short bar zone of described liquid crystal indicator judge the broken string of described drive wire shows whether eliminate;
S13: if the broken string phenomenon of described drive wire is eliminated, the broken string position of then judging described drive wire is in the short bar zone, otherwise the broken string position of then judging described drive wire is in outer peripheral areas.
Below in conjunction with Fig. 3 and Fig. 4 and with described drive wire is that data line is an example, describe line defect determination methods of the present invention in detail, as shown in Figure 4, the liquid crystal indicator of present embodiment comprises viewing area 100, short bar zone 200 and the outer peripheral areas 300 between viewing area 100 and short bar zone 200.Data line D1 is drawn to data line Dn in viewing area 100.Outer peripheral areas 300 is between viewing area 100 and short bar zone 200.Short bar zone 200 comprises first short bar 11, second short bar 12 and the 3rd short bar 13.First short bar 11, second short bar 12 and the 3rd short bar 13 red in order to transmit respectively (R), green (G), blue (B) signal, just in use, the 100 data line D1 that draw are connected with short bar to data line Dn process outer peripheral areas 300 backs from the viewing area, such as, the data line that transmits danger signal all is connected with first short bar 11, the data line that transmits green all is connected with second stub 12, and the data line that transmits blue signal all is connected with the 3rd short bar 13.
See also Fig. 3 and Fig. 4, execution in step S11 powers up the drive wire of described liquid crystal display display device, judges whether to produce the broken string phenomenon.
Display device is the liquid crystal indicator under the normal white mode, just under situation about not powering up, and the liquid crystal indicator display white, under situation about powering up, liquid crystal indicator shows the pattern of black.Certainly, liquid crystal indicator is powered up, can directly power up described first short bar 11, second short bar 12 and the 3rd short bar 13, after powering up, electric current transfers to data line D1 to data line Dn by first short bar 11, second short bar 12 and the 3rd short bar 13, also can adopt other modes to power up and makes the viewing area display image.The off position of the data line D3 of tentation data line D1 to the data line Dn occurs in outer peripheral areas 300, the position that data line Dn-1 opens circuit 200 o'clock in the short bar zone, liquid crystal indicator under normal white mode, by first short bar 11, the data line D1 of second short bar 12 and 13 pairs of liquid crystal indicators of the 3rd short bar powers up to data line Dn, data line D1, D2, D4 to Dn-2, Dn powers up the back liquid crystal molecule and deflects, make light to see through, whole image is black, and in such cases, because data line D3, data line Dn-1 opens circuit, voltage can not pass through data line D3, data line Dn-1 acts on liquid crystal molecule makes liquid crystal molecule not deflect, thereby data line D3 and data line Dn-1 show two bright lines.Therefore, being judged as data line D3, data line Dn-1 has line defect to show phenomenon; If under the situation of energising, whole viewing area 100 does not have bright line, then, there is not the line defect phenomenon in data line D1 to data line Dn.
Please continue to consult Fig. 3 and Fig. 4, execution in step S12: if there is drive wire to produce the broken string phenomenon, then all drive wires of conducting outside the short bar zone of described liquid crystal indicator judge the broken string of described drive wire shows whether eliminate, judge whether the broken string phenomenon of described drive wire is eliminated.
When data line has the broken string phenomenon, in Fig. 4, there are line defect in data line D3 and data line Dn-1, at this moment, all drive wires of short bar zone conducting at described liquid crystal indicator adopt the metal level 401 to described judgment means 400 to power up, make active layer 402 produce excitation electron after metal level 401 energisings, under the effect of this excitation electron, data line D1, D2, D4 is switched on to data line Dn, the bright line at data line Dn-1 place disappears, the bright line at data line D3 place also exists, thereby, power up for short bar zone 200 outer data lines by the judgment means 400 that is arranged on short bar zone 200, the broken string phenomenon of described data line Dn-1 is eliminated, and the broken string phenomenon of data line D3 is not eliminated.
Please continue to consult Fig. 3 and Fig. 4, execution in step S13: if the broken string phenomenon of described drive wire is eliminated, the broken string position of then judging described drive wire is in the short bar zone, otherwise the broken string position of then judging described drive wire is in outer peripheral areas.
As can be known, the broken string phenomenon of data line has elimination from step S12, and then, the position that broken string takes place is in short bar zone 200.Because when power up the second time, bright line on the data line Dn-1 disappears and judgment means 400 is arranged on short bar zone 200, therefore, produce excitation electrons and conducting data line D1 to data line Dn the time at the active layer 402 of judgment means 400, the broken string position of data line Dn-1 apart from the distance of laser cut line 500 greater than the distance of judgment means 400 apart from laser cut line 500, data line Dn-1 is complete circuit for 100 one section to the viewing area, electric current can pass through, bright line can disappear, so, power up the back and under the situation that bright line disappears at the metal level 401 to judgment means 400, broken string position that can judgment data line Dn-1 is in short bar zone 200.After the end of test (EOT), it is preceding to stick driving circuit (IC), need data line D1 be cut off to data line Dn and first short bar 11, second short bar 12 and the 3rd short bar 13 along laser cut line 500, then data line D1 is connected with driving circuit to data line Dn, therefore, do not influence the concrete work of liquid crystal indicator even short bar zone 200 exists to open circuit yet, can judge that thus this product cannot scrap.And occur in the situation of outer peripheral areas 300 for off position as data line D3, repair ring by design to repair, if repair unsuccessful, then with product rejection.Therefore, by the present invention, can distinguishes data line generation line defect be in short bar zone 200 or in outer peripheral areas 300, and, screen out the particular location of broken string, then ring is repaired in the display device design of needs reparation and repaired, get nowhere, make reprisals again if repair, avoided waste, need not judge earlier that also there is line defect in which bar data line, judge the particular location of line defect then and select to repair or scrap, save time and cost.
See also Fig. 5 and Fig. 6, Fig. 5 and Fig. 6 are second embodiment of the present invention, and the liquid crystal indicator among this embodiment also comprises short bar zone 200, outer peripheral areas 300, first short bar 11, second short bar 12, the 3rd short bar 13 or the like.The difference of this embodiment and first embodiment is that described short bar zone 200 is provided with switch 600.
See also Fig. 6, described switch 600 comprises the metal level 601 and first active layer 602.Metal level 601 is same one deck with the metal level 401 of described judgment means 400.First active layer 602 is positioned on the metal level 601.The data line D1 that connects on first active layer 602 is to data line Dn, and data line D1 is connected to corresponding first short bar 11, second short bar 12 and the 3rd short bar 13 by a plurality of node NOD1 to NODn on first active layer 602 (among the figure only synoptic diagram two node NOD1, NOD2) to data line Dn.Described first active layer 602 is different with active layer 402 structures of judgment means 400, and first active layer 602 disconnects, and be not whole continuous face, and the active layer 402 of judgment means 400 is continuous faces.The principle of work of switch 600 is: electric current can not directly pass through it, and only after the energising of the grid (metal level 601) of switch, electric current could pass through, and during energising, because first active layer 602 is to disconnect, so, also mutual insulating between the data line.The benefit that switch 600 is set is the data line insulation with the short circuit originally mutually at the short bar place, and promptly mutually insulated between all data lines during metal level 601 no powers just need not cut like this before module group procedure, can effectively improve production capacity.In module group procedure, only need to give metal level 601 logical negative voltages, make it be in closed condition, just avoided the interactive problem of signal between the data line that short bar brings between the data line like this.
Please continue to consult Fig. 5, when utilizing judgment means 400 and judging the position of line defect in this embodiment with data line D1 and data line Dn broken string, at first power up to data line to switch 600 with by first short bar 11, second short bar 12 and the 3rd short bar 13, after switch 600 is powered up, switch 600 conductings, same, because data line D1 and data line Dn are broken string, under normal white mode, two bright lines can appear in display device.Then, metal level 401 to judgment means 400 powers up, at this moment, the electronics of active layer 402 is excited and conducting data line Dn, and the bright line of data line Dn disappears, the bright line of data line D1 does not disappear, and, because judgment means 400 is arranged on short bar zone 200, therefore, the position that data line Dn opens circuit is in short bar zone 200, and the position that data line D1 opens circuit is in outer peripheral areas 300.As described above, there is line defect in outer peripheral areas 300 and can't repairs successful product and scrap processing.
Above-mentioned two embodiment all are that data line is the determination methods that example illustrates this line defect with the drive wire, be understandable that, when described drive wire was sweep trace, this method still can be carried out line defect and be judged that this judgment means 400 still can be used to judge the line defect device.
In sum, all drive wires to described liquid crystal indicator power up earlier, when drive wire produces broken string demonstration phenomenon, metal level to described line defect judgment means powers up and institute's drive wire of conducting liquid crystal indicator, can learn the particular location of broken string in conjunction with the particular location of judgment means 400 settings.Thereby, with the examination of opening circuit that does not need to repair, need not exist the display device of line defect to scrap all as prior art, saved cost; In addition, also need not be as prior art, judge that earlier there is line defect in which bar data line, judge the particular location of line defect then and select to repair or scrap, saved time and cost.
In addition, similarly also comprise field emission display device with liquid crystal indicator, plasma display, luminous display unit or the like, such as, these devices all comprise data line or sweep trace, described sweep trace is applied drive signal and opens transistor, the pixel electrode that links to each other with transistor drain of the data of data line inputs and realize demonstration then, the data line or the sweep trace of said apparatus open circuit, therefore, extension as the foregoing description, the present invention also provides a kind of line defect determination methods of flat display apparatus, can be used for judging field emission display device, the line defect of plasma display and luminous display unit or the like.This method comprises the steps: the drive wire of described flat display apparatus is powered up, and judges whether to produce the broken string phenomenon, and in this step, described drive wire produces the broken string phenomenon and is meant under black picture display mode, and described drive wire broken string is shown as bright line; If there is drive wire to produce the broken string phenomenon, then the metal level to described line defect judgment means powers up, and judges whether the broken string phenomenon of described drive wire is eliminated; If the broken string phenomenon of described drive wire is eliminated, the broken string position of then judging described drive wire is in the short bar zone, otherwise the broken string position of then judging described drive wire is in outer peripheral areas.Described drive wire is sweep trace or data line.
The above only is a preferred embodiment of the present invention, does not constitute the qualification to protection domain of the present invention.Should be understood that, for those skilled in the art, under the prerequisite that does not break away from the principle of the invention, any modification of being done within the defined the spirit and scope of the invention of appended claims is equal to replacement and improvement etc., all should comprise in the present invention.
Claims (13)
1. the line defect judgment means of a flat display apparatus is characterized in that, described line defect judgment means is arranged between the short bar zone and viewing area of described flat display apparatus, and it comprises:
Metal level;
Active layer cover metal level, and the drive wire of active layer and display device is connected the drive wire of described active layer described display device of conducting when metal level powers up.
2. the line defect judgment means of flat display apparatus as claimed in claim 1 is characterized in that, described metal level is a gate metal layer.
3. the line defect judgment means of flat display apparatus as claimed in claim 2 is characterized in that, the metal of described gate metal layer is aluminium or aluminium neodymium alloy.
4. the line defect judgment means of flat display apparatus as claimed in claim 1 is characterized in that, described metal level is positioned on the active layer or is positioned under the active layer.
5. the line defect judgment means of flat display apparatus as claimed in claim 1 is characterized in that, the drive wire of the described display device that is connected with active layer is data line or sweep trace.
6. the line defect judgment means of flat display apparatus as claimed in claim 1 is characterized in that, described active layer is an amorphous silicon layer.
7. the judgment means of the line defect of flat display apparatus as claimed in claim 1 is characterized in that, described metal level and described short bar are positioned at same one deck.
8. an application rights requires each described line defect judgment means in 1 to 7 to judge the method for line defect, it is characterized in that, comprises the steps:
Drive wire to described flat display apparatus powers up, and judges whether to produce the broken string phenomenon;
If there is drive wire to produce the broken string phenomenon, then the metal level to described line defect judgment means powers up, and judges whether the broken string phenomenon of described drive wire is eliminated;
If the broken string phenomenon of described drive wire is eliminated, the broken string position of then judging described drive wire is in the short bar zone, otherwise the broken string position of then judging described drive wire is in outer peripheral areas.
9. the method for judgement line defect as claimed in claim 8 is characterized in that, described drive wire produces the broken string phenomenon and is meant under black picture display mode, and described drive wire broken string is shown as bright line.
10. the method for judgement line defect as claimed in claim 8 is characterized in that, described drive wire is sweep trace or data line.
11. the line defect determination methods of a liquid crystal indicator is characterized in that, comprises the steps:
Power up by the drive wire of short bar, judge whether to occur the drive wire broken string and show described liquid crystal indicator;
Show that if broken string occurs all drive wires of conducting outside the short bar zone of described liquid crystal indicator judge the broken string of described drive wire shows whether eliminate;
Eliminate if the broken string of described drive wire shows, the broken string position of then judging described drive wire is in the short bar zone, otherwise the broken string position of then judging described drive wire is in outer peripheral areas.
12. the line defect determination methods of liquid crystal indicator as claimed in claim 11 is characterized in that, described drive wire produces the broken string demonstration and is meant under black picture display mode, and described drive wire broken string is shown as bright line.
13. the line defect determination methods of liquid crystal indicator as claimed in claim 11 is characterized in that, all drive wires of described conducting comprise by all drive wires of excitation electron conducting.
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| CN107045994B (en) * | 2016-11-11 | 2019-12-10 | 上海天马微电子有限公司 | detection method and detection device of array substrate, array substrate and manufacturing method of array substrate |
| CN108121125A (en) * | 2018-01-24 | 2018-06-05 | 深圳市华星光电技术有限公司 | Display device failure analysis method |
| CN108121125B (en) * | 2018-01-24 | 2020-09-01 | 深圳市华星光电技术有限公司 | Method for analyzing display device failure |
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