CN102142284A - Memorizer test device for extensible sample memorizers - Google Patents
Memorizer test device for extensible sample memorizers Download PDFInfo
- Publication number
- CN102142284A CN102142284A CN2010101063921A CN201010106392A CN102142284A CN 102142284 A CN102142284 A CN 102142284A CN 2010101063921 A CN2010101063921 A CN 2010101063921A CN 201010106392 A CN201010106392 A CN 201010106392A CN 102142284 A CN102142284 A CN 102142284A
- Authority
- CN
- China
- Prior art keywords
- reservoir
- sample
- control module
- data
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a memorizer test device for extensible sample memorizers. The device comprises a plural test socket, a control module and a master controller, wherein the plural test socket is provided with a plural to-be-tested memorizer by way of accommodating, and the control module is electrically coupled with a sample memorizer; the master controller controls the control module to store sample data into the sample memorizer, then reads the sample data in the sample memorizer and stores the sample data (as data to be tested) into the plural to-be-tested memorizer; and controls the reading of the sample data and compares the sample data with the data (to be tested) stored in the plural to-be-tested memorizer one by one. Therefore, through the utilization of the memorizer test device disclosed by the invention, the test specification and the capacity of the sample memorizer can be expanded according to actual demands, and the sample data to be tested and compared can be changed arbitrarily through the access control of the control module.
Description
Technical field
The invention relates to a kind of reservoir testing apparatus of extendible sample reservoir, especially refer to a kind of semiconductor testing apparatus that is applicable to test volatility or non-volatile.
Background technology
Because at present the electronic multimedia product is popularized day by day, increase day by day for the demand of Storage Media.In addition, also along with technology constantly develops, the capacity of Storage Media becomes multiple to increase, and for example non-volatile such as Flash/Flash Card/EEPROM/XROM is from early stage 256MB, 512MB, 1GB....., and high capacity such as 8GB till now, 16GB, 32GB constantly are developed.Yet, with the testing apparatus of existing reservoir, in the face of more jumbo test specification the time, often have too many difficulties to cope with not apply and use, only constantly extension facility or assembly expend great amount of cost.
In detail, see also Fig. 1, Fig. 1 is the system architecture synoptic diagram of known reservoir testing apparatus.Known reservoir testing apparatus mainly comprises the controller 9 of testing oneself, a pattern reservoir plate 91 (PatternMemory Board is called for short PM Board) and plural proving installation (not shown).Wherein, each proving installation is electrically connected with a reservoir 92, and pattern reservoir plate 91 then stores the data of desiring to test.When testing, controller 9 control of testing oneself is the data in the pattern reservoir plate 91, writes/reservoir 92 of imprinting to the proving installation.Then, the controller 9 of testing oneself is compared reservoir 92, whether consistent with data in the pattern reservoir plate 91 more one by one.
Yet in the prior art, the capacity of the pattern reservoir plate 91 of reservoir testing apparatus is fixed.When the capacity of desiring to test reservoir during greater than the capacity of pattern reservoir plate 91, unless the specification of upgrading test equipment, otherwise can't test.In view of the above, according to the prior art of reservoir testing apparatus now,, have no other way once when facing memory capacity to be measured, have only by continuous extension facility specification greater than the specification of testing apparatus.Yet the specification of expansion or upgrading test equipment needs the whole product line of retardation, and time-consuming taking a lot of work influences production capacity, need expend surprising upgrade cost again.
Summary of the invention
The object of the present invention is to provide a kind of reservoir testing apparatus of extendible sample reservoir, to improve the defective that exists in the known technology.
For achieving the above object, the reservoir testing apparatus of extendible sample reservoir provided by the invention comprises: plural test bench, a control module, an and master controller.Wherein, plural test bench (DUT, Device Under Test) has been installed with plural reservoir to be measured.And the control module electric property coupling has a sample reservoir.In addition, master controller is electrically connected to plural test bench respectively, reaches control module.Wherein, this control module of main controller controls stores a sample data to sample reservoir, and this control module of main controller controls reads the sample data of sample reservoir and it is deposited in the plural reservoir to be measured be testing data.Again, this control module of main controller controls reads the sample data that stores in the sample reservoir and compares the testing data that stores in the plural reservoir to be measured one by one.Therefore, the present invention is by the setting of control module and sample reservoir, and test specification and sample reservoir capacity are expanded in visual actual demand, and can change the sample data of desiring to test comparison arbitrarily by the control access of control module.
Wherein, the storage volume of sample reservoir of the present invention can be more than or equal to the storage volume of plural number reservoir to be measured.In view of the above, complete test data can be provided, and obtain test result more accurately.Preferably, sample reservoir and plural reservoir to be measured have same size, mainly be because of using and the storage volume of reservoir to be measured, particle specification, operation frequency, and the sample reservoir of same sizes such as data frequency range, can obtaining testing result more accurately.And the imprinting that sample reservoir can be manufacturer to be provided has the sample reservoir of certain content or be big non-volatile of reservoir storage volume more to be measured (as Flash/EEPROM etc.) or volatility reservoir (as SRAM/DRAM etc.).
Moreover the present invention can also include an interface device (Hi-Fix), and it includes plural test bench and control module.That is interface device not only is provided with plural test bench, and interface device inside can ccontaining control module and sample reservoir.In view of the above, be placed in the interface device, conveniently to change or to expand by control module and sample reservoir.In addition, the present invention can also include a measuring head (Test Head), and it electrically connects interface device and master controller.Wherein, mainly electric connection of measuring head of the present invention in order to provide controlling signal and power supply to supply with.
In addition, master controller may command control module of the present invention reads the sample data that stores in the sample reservoir and also compares the testing data that stores in the plural reservoir to be measured one by one, when comparison does not meet, and the alerting of just output correspondence.Certainly, if comparison result is under the situation about meeting, also exportable one normal signal.And alerting can be the alerting of an acousto-optic electricity, also can be a comparison result flag, as PASS/FAIL.In addition, the present invention can also include a feeding-distribution device (Handler), and it electrically connects master controller.Feeding-distribution device is in order to picking and placeing plural reservoir to be measured in plural test bench, that is pick and place in order to provide, the sub-material after charging and the test etc.
Again and, but control module of the present invention can include a complexity program logic device (ComplexProgrammable Logic Device, abbreviation: but CPLD), assembly programmed logic gate array (FieldProgrammable Gate Array, abbreviation: FPGA) or other equivalent device.In view of the above, the visual actual demand of control module of the present invention, elasticity is set or the changed test specification.Wherein, control module is mainly in order to carry out work such as coordinate operation and control access between sample reservoir and master controller.
Preferably, the present invention can also include a central server, and it electrically connects by a network and master controller.Wherein, sample data is to offer sample reservoir by central server by network.In view of the above, can directly download the stored samples data by near-end network or the Internet, need not replace sample reservoir because of different test specifications or remove sample reservoir to other machine and carry out unnecessary programs such as imprinting different pieces of information, can significantly reduce manpower and time cost.
Another aspect of the present invention is a kind of reservoir testing apparatus of extendible sample reservoir, comprising: plural test bench, a control module and a master controller.It has been installed with plural reservoir to be measured wherein plural test bench.And the control module electric property coupling has a replaceable reservoir.Replaceable reservoir stores a sample data.And master controller is electrically connected to plural test bench and control module respectively.Wherein, the main controller controls control module read replaceable reservoir sample data and will deposit in and be testing data in the plural reservoir to be measured.Again, the main controller controls control module reads the sample data that stores in the replaceable reservoir and compares the testing data that stores in the plural reservoir to be measured one by one.In view of the above, the present invention is by the setting of control module and replaceable reservoir, the demand of visual actual test specification, and directly replace or adopt the replaceable reservoir that sample data is provided, but and the effect that reaches the elasticity change or set and expand.
Preferably, replaceable reservoir of the present invention is preferably and can directly plugs replacement, and it is conveniently directly replaced when the changed test specification.In addition, the storage volume of replaceable reservoir of the present invention can be the storage volume that is equal to or greater than plural reservoir to be measured, and it is good having same size with plural reservoir to be measured certainly.Wherein, the imprinting that can be manufacturer and provide of replaceable reservoir has the sample reservoir of certain content.
Description of drawings
Fig. 1 is the system architecture synoptic diagram of known reservoir testing apparatus.
Fig. 2 is the stereographic map of a preferred embodiment of the present invention reservoir testing apparatus.
Fig. 3 is the stereographic map of a preferred embodiment of the present invention interface device.
Fig. 4 is the system architecture diagram of a preferred embodiment of the present invention.
Primary clustering symbol description in the accompanying drawing:
1 interface device, 10 central servers, 2 test benches, 3 reservoirs to be measured, 31 data to be measured, 4 control modules, 5 sample reservoir, 50 replaceable reservoirs, 51 sample datas, 6 master controllers, 7 measuring heads, 8 feeding-distribution devices, 9 controllers of testing oneself, 91 pattern reservoir plates, 92 reservoirs, I network.
Embodiment
Please consult Fig. 2 simultaneously, Fig. 2 is the stereographic map of a preferred embodiment of the present invention reservoir testing apparatus.Reservoir testing apparatus as shown in Figure 2 wherein is electrically connected with an interface device 1 on the measuring head 7 (Test Head), the mainly electric connection in order to provide controlling signal and power supply to supply with of measuring head 7.And being provided with plural test bench 2 (DUT, Device Under Test) on the interface device 1, it is in order to be installed with plural reservoir to be measured 3, to test.In addition, being provided with a feeding-distribution device 8 (Handler) in interface device 1 top, is in order to picking and placeing plural reservoir to be measured 3 in plural test bench 2, that is is responsible for the tasks such as sub-material after the picking and placeing of reservoir 3 to be measured, charging and the test.
See also Fig. 3 and Fig. 4 again, Fig. 3 is the stereographic map of the reservoir testing apparatus one preferred embodiment interface device of the extendible sample reservoir of the present invention, and Fig. 4 is the system architecture diagram of a preferred embodiment of the present invention.Show a control module 4 among the figure in interface device 1 in addition, its electric property coupling has a sample reservoir 5.In the present embodiment, but control module 4 is a complexity program logic device (CPLD, Complex Programmable Logic Device), but it also can be assembly programmed logic gate array (FPGA, Field Programmable Gate Array) or other equivalent device.
Moreover, but no matter it mainly is because of its software, hardware or firmware all can change or set easily that the control module of present embodiment 4 adopts the complexity program logic device, tool elasticity, advantage such as extendible.Wherein, control module 4 is mainly in order to carry out work such as sample reservoir 5 and 6 coordinate operation of master controller, control access.And the storage volume of sample reservoir 5 is more than or equal to the storage volume of plural number reservoir 3 to be measured.In view of the above, just can provide complete test data, and obtain test result more accurately.
Wherein, sample reservoir 5 has same size with plural reservoir 3 to be measured, and specifications such as the storage volume of reservoir 3 for example to be measured, particle specification, operation frequency and data frequency range are all identical with sample reservoir 5, so can obtain testing result more accurately.Wherein, sample reservoir 5 can be manufacturer provides the reservoir of certain content is arranged or be big non-volatile of reservoir 3 storage volumes more to be measured (as Flash/EEPROM etc.) or volatility reservoir (as SRAM/DRAM) with imprinting.
In addition, show a master controller 6 among the figure, be electrically connected to plural test bench 2, feeding-distribution device 8 and control module 4 respectively.Wherein, this control module 4 of master controller 6 controls stores a sample data 51 to sample reservoir 5.Then, master controller 6 control control modules 4 read the sample data 51 of sample reservoir 5 and it are deposited in the plural reservoir to be measured 3 and are testing data 31.At last, master controller 6 these control modules 4 of control read the sample data 51 that stores in the sample reservoir 5 and compare the testing data 31 that stores in the plural reservoir to be measured 3 one by one.When comparison meets or do not meet, the alerting of all output correspondences.The alerting of present embodiment is that comparison result label, as comparison checking results such as Pass/Fail, and with its storage.Certainly, alerting also can be the alerting of an acousto-optic electricity.
In addition, showing a central server 10 among the figure again, is to electrically connect by a network I and master controller 6.The sample data 51 of present embodiment can be by central server 10 by network I to offer sample reservoir 5.In view of the above, present embodiment can directly be downloaded stored samples data 51 by near-end network or the Internet, need not replace sample reservoir 5 because of different test specifications, or remove sample reservoir 5 and carry out unnecessary programs such as imprinting different pieces of information to other machine, can significantly reduce manpower, and time cost.
Again and, another embodiment of reservoir testing apparatus of the extendible sample reservoir of the present invention includes plural test bench 2, control module 4 and master controller 6 etc. equally.Wherein, plural test bench 2 has been installed with plural reservoir to be measured 3; And control module 4 electric property couplings have a replaceable reservoir 50, and it stores a sample data 51.In the present embodiment, replaceable reservoir 50 be for can directly plug replacement, and it is conveniently directly replaced when the changed test specification.In addition, the storage volume of the replaceable reservoir 50 of present embodiment can be the storage volume that equals plural reservoir to be measured 3, wherein have same size with plural number reservoir 3 to be measured again, and the imprinting that provides for manufacturer to be measured the reservoir of the sample data 51 of certain content is arranged is good.
As for, 6 of master controllers are electrically connected to plural test bench 2 and control module 4 equally respectively.Wherein, these control modules 4 of master controller 6 control read replaceable reservoir 50 sample data 51 and will deposit in the plural reservoir to be measured 3 and be testing data 31.Then, master controller 6 control control modules 4 read the sample data 51 that stores in the replaceable reservoir 50 and compare the testing data 31 that stores in the plural reservoir to be measured 3 one by one.At last, comparison result is exported the comparison result flag equally as previous embodiment, as Pass/Fail etc., and with its storage.In view of the above, present embodiment is by the setting of control module 4 and replaceable reservoir 50, the demand of visual actual test specification, and directly replace or adopt the replaceable reservoir 50 that sample data 51 is provided, but and reach the elasticity change or set, expand, and cost-effective effect.
The foregoing description only is to give an example for convenience of description, and the interest field that the present invention advocated is from should but not only limiting to the foregoing description with described being as the criterion of claim scope of application.
Claims (10)
1. the reservoir testing apparatus of an extendible sample reservoir comprises:
The plural number test bench, it has been installed with plural reservoir to be measured;
One control module, its electric property coupling have a sample reservoir; And
One master controller, be electrically connected to this plural number test bench respectively, reach this control module, wherein, this control module of this main controller controls stores a sample data to this sample reservoir, this control module of this main controller controls reads this sample data of this sample reservoir and it is deposited in this plural number reservoir to be measured is a testing data, and this control module of this main controller controls reads this sample data that stores in this sample reservoir and compares this testing data that stores in this plural number reservoir to be measured one by one.
2. the reservoir testing apparatus of extendible sample reservoir according to claim 1, wherein, the storage volume of this sample reservoir is more than or equal to the storage volume of this plural number reservoir to be measured.
3. the reservoir testing apparatus of extendible sample reservoir according to claim 1 wherein, includes an interface device, and it includes this plural number test bench and this control module.
4. as the reservoir testing apparatus of extendible sample reservoir as described in the claim 3, wherein, include a measuring head, electrically connect this interface device and this master controller.
5. the reservoir testing apparatus of extendible sample reservoir according to claim 1, wherein, this control module of this main controller controls reads this sample data that stores in this sample reservoir and compares this testing data that stores in this plural number reservoir to be measured one by one, when comparison does not meet, the alerting of just output correspondence.
6. the reservoir testing apparatus of extendible sample reservoir according to claim 1, wherein, but this control module includes a complexity program logic device.
7. the reservoir testing apparatus of extendible sample reservoir according to claim 1, wherein, include a central server by the electric connection of a network and this master controller, wherein, this sample data by this central server by this network to offer this sample reservoir.
8. the reservoir testing apparatus of extendible sample reservoir according to claim 1 wherein, includes a feeding-distribution device, electrically connects this master controller, and this feeding-distribution device is in order to pick and place this plural number reservoir to be measured in this plural number test bench.
9. the reservoir testing apparatus of an extendible sample reservoir comprises:
The plural number test bench, it has been installed with plural reservoir to be measured;
One control module, its electric property coupling have a replaceable reservoir, and this replaceable reservoir stores a sample data; And
One master controller, be electrically connected to this plural number test bench and this control module respectively, wherein, this control module of this main controller controls reads this sample data of this replaceable reservoir and it is deposited in this plural number reservoir to be measured is a testing data, and this control module of this main controller controls reads this sample data that stores in this replaceable reservoir and compares this testing data that stores in this plural number reservoir to be measured one by one.
10. as the reservoir testing apparatus of extendible sample reservoir as described in the claim 9, wherein, the storage volume of this replaceable reservoir is equal to or greater than the storage volume of this plural number reservoir to be measured.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010101063921A CN102142284A (en) | 2010-01-29 | 2010-01-29 | Memorizer test device for extensible sample memorizers |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010101063921A CN102142284A (en) | 2010-01-29 | 2010-01-29 | Memorizer test device for extensible sample memorizers |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102142284A true CN102142284A (en) | 2011-08-03 |
Family
ID=44409727
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010101063921A Pending CN102142284A (en) | 2010-01-29 | 2010-01-29 | Memorizer test device for extensible sample memorizers |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102142284A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107305790A (en) * | 2016-04-21 | 2017-10-31 | 北京兆易创新科技股份有限公司 | The self-test method and device of a kind of non-volatility memorizer |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1525187A (en) * | 2003-02-26 | 2004-09-01 | ��ʽ���������Ƽ� | Apparatus for testing semiconductor integrated circuit |
| US20080250291A1 (en) * | 2007-04-09 | 2008-10-09 | Advantest Corporation | Test apparatus and electronic device |
| TW200845024A (en) * | 2007-03-21 | 2008-11-16 | Advantest Corp | Test apparatus and electronic device |
-
2010
- 2010-01-29 CN CN2010101063921A patent/CN102142284A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1525187A (en) * | 2003-02-26 | 2004-09-01 | ��ʽ���������Ƽ� | Apparatus for testing semiconductor integrated circuit |
| TW200845024A (en) * | 2007-03-21 | 2008-11-16 | Advantest Corp | Test apparatus and electronic device |
| US20080250291A1 (en) * | 2007-04-09 | 2008-10-09 | Advantest Corporation | Test apparatus and electronic device |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107305790A (en) * | 2016-04-21 | 2017-10-31 | 北京兆易创新科技股份有限公司 | The self-test method and device of a kind of non-volatility memorizer |
| CN107305790B (en) * | 2016-04-21 | 2020-07-31 | 北京兆易创新科技股份有限公司 | Self-testing method and device of non-volatile memory |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106571166B (en) | MT29F series NAND FLASH test aging system with customizable flow | |
| CN105760268B (en) | A kind of on piece random access memory build-in self-test method and device | |
| CN103367189B (en) | Test system and test method thereof | |
| CN105425201B (en) | metering chip simulation test method for software reliability detection of intelligent electric energy meter | |
| TWI503835B (en) | Test apparatus and test method | |
| US8217674B2 (en) | Systems and methods to test integrated circuits | |
| CN111026596A (en) | Test platform architecture and method for computer mainboard standard | |
| CN111858197A (en) | Device, system and method for supporting multiple SSD tests | |
| CN103092733A (en) | Testing device and testing method for simulating plugging and unplugging actions | |
| CN109656756B (en) | Multi-core CPU board debugging method and device and mobile storage medium | |
| CN205176215U (en) | Integrated circuit board test fixture of SMARTRACK system | |
| CN108806761A (en) | A kind of SSD function test methods, system and computer storage media | |
| CN106199374A (en) | Universal test platform and test method thereof | |
| CN105551528A (en) | Testing apparatus and method of high-speed large-capacity multi-chip Flash module based on ATE | |
| CN202230152U (en) | General automatic test device for multibus processor modules | |
| CN101211297A (en) | Method for automatically allocating test machine station each IP address and the machine station | |
| TWI440036B (en) | Memory test equipment with extensible sample memory | |
| CN102142284A (en) | Memorizer test device for extensible sample memorizers | |
| CN113204456A (en) | Test method, tool, device and equipment for VPP interface of server | |
| CN106251907B (en) | Built-in self-test system and method | |
| CN110287074B (en) | One-stop integrated test method and device for PCIE SSD product | |
| CN203643486U (en) | Probe board and consumable chip testing device | |
| CN113125938A (en) | Aging test monitoring method and system | |
| CN105807157A (en) | High temperature aging test system | |
| CN205353225U (en) | Multiple electronic parts automatic test equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20110803 |