CN102117239B - Test interface card and test method - Google Patents
Test interface card and test method Download PDFInfo
- Publication number
- CN102117239B CN102117239B CN200910266027.4A CN200910266027A CN102117239B CN 102117239 B CN102117239 B CN 102117239B CN 200910266027 A CN200910266027 A CN 200910266027A CN 102117239 B CN102117239 B CN 102117239B
- Authority
- CN
- China
- Prior art keywords
- bus
- test
- controller
- signal
- interface card
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Abstract
The invention discloses a test interface card, which is applied between a mainboard to be tested and a signal conversion interface card, wherein the mainboard to be tested is provided with a first-specification interface controller, a second-specification interface controller and a storage module. The test interface card comprises a first-specification bus, a second-specification bus and a third-specification bus, wherein the first-specification bus is coupled between the first-specification interface controller and the signal conversion interface card, and transmits a first test signal transmitted by the first-specification interface controller to the signal conversion interface card; the second-specification bus is coupled between the signal conversion interface card and the storage module, and transmits an output signal of the signal conversion interface card back to the storage module; and the third-specification bus couples the second-specification interface controller to form a loopback. Therefore, a test is performed for all the buses to shorten the test time.
Description
Technical field
The invention relates to a kind of test interface card, refer to especially a kind of test interface card that is applied to blade server.
Background technology
Blade server (blade server) 900 refers to processor, storer, even the hardware integration of the server system such as Winchester disk drive is to single cultrate motherboard, namely can allow a plurality of servers in a machine box for server, work simultaneously, share power supply unit wherein, display etc., integrated to reach efficient system.
But, relative blade server 900 can have the bus of plurality of specifications, for example: quick peripheral hardware interconnect standard (Peripheral Component Interconnect Express, abbreviation PCI-E), serial attached small computer system interface card (Serial Attached SCSI, abbreviation SAS), serial advanced technology accesses interface (Serial Advanced Technology Attachment, abbreviate SAT A) etc., also increased the complexity of blade server 900 in test.
Consult Fig. 1, blade server 900 is when testing for PCI-E bus 910 and SAS bus 920, PCI-E bus 910 need be coupled between the PCI-E controller 901 and SAS interface card 902 of blade server 900, and SAS bus 920 is coupled between SAS interface card 902 and the storage element 903 of blade server 900.So, PCI-E controller 901 can send PCI-E test signal, and is sent to SAS interface card 902 by PCI-E bus 910, and SAS interface card 902 converts this PCI-E test signal after SAS test signal to, by SAS bus 920, is back to storage element 903.Therefore, if storage element 903 receives SAS test signal, represent that PCI-E bus 910 and SAS bus 920 are by test, if not, represent that PCI-E bus 910 and SAS bus 920 at least one open circuit or damage, and will carry out follow-up inspection and repair.
Yet, when blade server 900 continues to test for SATA bus, need first SAS interface card 902 originally to be disassembled, change the SATA interface card 902 ' that SATA test signal can be converted to SAS test signal, as shown in Figure 2.Afterwards, then SATA bus 930 is coupled between the SATA controller 904 and SATA interface card 902 ' of blade server 900, and SAS bus 920 is coupled between SATA interface card 902 ' and storage element 903.The mode of test is as above-mentioned, and SATA controller 904 sends SATA test signal, and is sent to SATA interface card 902 ' by SATA bus 930, and SATA interface card 902 ' will be back to storage element 903 after the conversion of SATA test signal.
Yet known test mode is to change for different size bus the SAS interface card that meets this specification, that is to say, when the bus specification of wish test is more, dismantle number of times just more, thereby cause the too much take-down time, increase the time cost in test.In addition, Fig. 1 tests for PCI-E bus 910 and SAS bus 920; Fig. 2 tests for SATA bus 930 and SAS bus 920, therefore, can find that SAS bus 920 is repeated test, causes the waste of resource.
Summary of the invention
Therefore, object of the present invention, is to provide a kind of test interface card that can test all buses and not need repeatedly to dismantle.
So, test interface card of the present invention, to be applied between machine plate to be measured and signal translation interface card, this machine plate to be measured has the first specification interface controller, the second specification interface controller and storage module, and this test interface card comprises: the first specification bus, the second specification bus and the 3rd specification bus.
The first specification bus is coupled between the first specification interface controller and signal translation interface card, and the first test signal that this first specification bus is sent the first specification interface controller is sent to signal translation interface card; The second specification bus is coupled between signal translation interface card and storage module, and this second specification bus is transmitted back to storage module by the output signal of signal translation interface card; Wherein one end of the 3rd specification bus be coupled to an output terminal of the second specification interface controller and wherein the other end be coupled to an input end of the second specification interface controller, make the 3rd specification bus become a closed loop (loopback) with the second specification interface controller, one end of the 3rd specification bus receives after the second test signal that the second specification interface controller sends, and the second test signal is back to the second specification interface controller from the other end of the 3rd specification bus.So, for all buses, test and do not need repeatedly to replace signal translation interface card and test, thereby reducing the time cost in test.
Preferably, the first specification bus is quick peripheral hardware interconnect standard (Peripheral ComponentInterconnect Express, PCI-E) bus, the second specification bus is serial attached small computer system interface card (Serial Attached SCSI, SAS) bus, the 3rd specification bus is that serial advanced technology accesses interface (Serial Advanced Technology Attachment, SATA) bus, the first specification interface controller be PCI-E controller and SATA controller one of them, the second specification interface controller be PCI-E controller and SATA controller wherein another, but not as limit.
In addition, test interface card of the present invention also can be integrated with signal translation interface card, and this test interface card comprises: signal conversion module, the first specification bus, the second specification bus and the 3rd specification bus.
Signal conversion module is in order to carry out received signal to export after format conversion; The first specification bus is coupled between the first specification interface controller and signal translation interface card, and the first test signal that this first specification bus is sent the first specification interface controller is sent to signal translation interface card; The second specification bus is coupled between signal translation interface card and storage module, and this second specification bus is transmitted back to storage module by the output signal of signal translation interface card; Wherein one end of the 3rd specification bus be coupled to an output terminal of the second specification interface controller and wherein the other end be coupled to an input end of the second specification interface controller, make the 3rd specification bus become a closed loop with the second specification interface controller, one end of the 3rd specification bus receives after the second test signal that the second specification interface controller sends, and the second test signal is back to the second specification interface controller from the other end of the 3rd specification bus.
Moreover another object of the present invention, is to provide a kind of method of testing that can test for all buses.
So, method of testing of the present invention is to be applied to machine plate to be measured, this machine plate to be measured has the first specification interface controller, the second specification interface controller, storage module, the first specification bus, the second specification bus and the 3rd specification bus, and this method of testing comprises following steps:
(A) the first specification bus is coupled between the first specification interface controller and a signal translation interface card, the second specification bus is coupled between signal translation interface card and storage module, one end of the 3rd specification bus is coupled to an output terminal of the second specification interface controller and the input end that the other end is coupled to the second specification interface controller, makes the 3rd specification bus become a closed loop with the second specification interface controller;
(B) make the first specification interface controller send the first test signal to signal translation interface card by the first specification bus, make signal translation interface card that the first test signal is carried out by the second specification bus, being sent to storage module after specification conversion; And
(C) make the second specification interface controller send the second test signal by one end of the 3rd specification bus, make the second test signal from the other end of the 3rd specification bus, be back to this second specification interface controller through the 3rd specification bus.
Effect of the present invention is, can test and not need repeatedly to replace signal translation interface card and test for all buses, to save the test duration, and can't repeated test occur and cause the problem of the wasting of resources.
Accompanying drawing explanation
Fig. 1 is a schematic diagram, and the test circuit of known test PCI-E bus and SAS bus is described;
Fig. 2 is a schematic diagram, and the test circuit of known testing SA TA bus and SAS bus is described;
Fig. 3 is circuit block diagram, and the first preferred embodiment of test interface card of the present invention is described;
Fig. 4 is process flow diagram, and the process flow diagram that this first preferred embodiment machine plate to be measured is tested for test interface card is described;
Fig. 5 is circuit block diagram, illustrates that the STAT controller of test module and the 3rd specification bus couple to be a closed loop;
Fig. 6 is circuit block diagram, and the second preferred embodiment of test interface card of the present invention is described;
Fig. 7 is circuit block diagram, and the 3rd preferred embodiment of test interface card of the present invention is described;
Fig. 8 is process flow diagram, and the process flow diagram that the 3rd preferred embodiment machine plate to be measured is tested for test interface card is described; And
Fig. 9 is circuit block diagram, and the 4th preferred embodiment of test interface card of the present invention is described.
[main element label declaration]
100 test interface card 21 test modules
200 machine plate 22 storage modules to be measured
300 signal translation interface card 31 first winding displacements
400 test interface card 32 second winding displacements
500 test interface card 201 first forwarders
600 test interface card 202 second forwarders
1 first specification bus 203 first receivers
2 second specification bus 204 second receivers
3 the 3rd specification bus 211 PCI-E controllers
4 the 4th specification bus 212 SATA controllers
5 the 5th specification bus 213 USB controllers
10 signal conversion module 214 QPI controllers
Embodiment
About aforementioned and other technology contents, feature and effect of the present invention, in the following detailed description coordinating with reference to four graphic preferred embodiments, can clearly present.
Consult Fig. 3, the first preferred embodiment for test interface card 100 of the present invention, this test interface card 100 is between machine plate 200 signal translation interface cards 300 to be measured, by the line design of bus wherein, machine plate 200 to be measured can once be tested all buses, and must be through replacement signal translation interface card 300 and test repeatedly, to reduce the time cost of test.
In the present embodiment, machine plate 200 to be measured is for blade server (blade server) and include test module 21 and storage module 22, but not as limit.This test module 21 is ICH9 chip, wherein there is the first specification interface controller 211 and the second specification interface controller 212, this the first specification interface controller 211 is quick peripheral hardware interconnect standard (Peripheral Component InterconnectExpress, PCI-E) controller (hereinafter to be referred as PCI-E controller 211), this the second specification interface controller 212 accesses interface (Serial Advanced Technology Attachment for serial advanced technology, SATA) controller (hereinafter to be referred as SATA controller 212), but not as limit; Storage module 22 is hard disk backboard (HDD backplane), in order to receive the output signal of signal translation interface card 300, and after receiving this output signal, transmits a confirmation signal to test module 21.
The test interface card 100 of the present embodiment comprises the first specification bus 1, the second specification bus 2 and the 3rd specification bus 3.
The first specification bus 1 is coupled between the PCI-E controller 211 and signal translation interface card 300 of test module 21, in order to the first test signal that PCI-E controller 211 is sent, is sent to signal translation interface card 300.In the present embodiment, the first specification bus is PCI-E bus, and the first test signal is PCI-E test signal.
The second specification bus 2 is coupled between signal translation interface card 300 and storage module 22, in order to the output signal of signal translation interface card 300 is transmitted back to storage module 22.In the present embodiment, signal translation interface card 300 is serial attached minicomputer system (Serial Attached SCSI, SAS) interface card, and owing to not having SAS controller in the test module 21 of the present embodiment, also just cannot export SAS test signal, therefore need to utilize signal translation interface card 300 that the first test signal (PCI-E test signal) is converted to SAS signal, and be back to storage module 22.
Wherein one end of the 3rd specification bus 3 is coupled to an output terminal of SATA controller 212 in test module 21, and wherein the other end is coupled to an input end of SATA controller 212, make 212 one-tenth one closed loops of the 3rd specification bus 3 and SATA controller (loopback), one end of the 3rd specification bus 3 receives the second test signal that SATA controller 212 sends, and this second test signal is back to SATA controller 212 from the other end of the 3rd specification bus 3.In the present embodiment, the 3rd specification bus 3 is a SATA bus, and the second test signal is a SATA test signal.
Coordinate and to consult Fig. 4, the process flow diagram of testing for the test interface card 100 of the present embodiment for machine plate 200 to be measured.Special instruction is below that hypothesis machine plate 200 to be measured has entered test pattern (test mode) and carried out following steps:
Thin portion, coordinate and consult Fig. 5, SATA controller 212 has the first forwarder 201, the second forwarder 202, the first receiver 203 and the second receiver 204, and the 3rd specification bus 3 has the first winding displacement 31 and the second winding displacement 32, the first winding displacement 31 is coupled between the first forwarder 201 and the second receiver 204, and the second winding displacement 32 is coupled between the second forwarder 202 and the first receiver 203.In step 20, SATA controller 212 transmits the second test signal by the first forwarder 201, via the first winding displacement 31 to second receivers 204, then by the second forwarder 202, the second test signal is sent back to the first receiver 203, so to complete the test of whole the 3rd specification bus 3.
In other words, the test interface card 100 of the present embodiment is after being coupled to machine plate 200 to be measured and signal translation interface card 300, by above-mentioned steps 10 and step 20, can test for all buses, do not need the bus of a kind of specification of every test just to reinstall signal translation interface card that should specification, so can significantly save the time cost in test.
Consult Fig. 6, the second preferred embodiment for test interface card 400 of the present invention, wherein roughly identical with the first preferred embodiment, difference is that the first specification bus 1 is coupled between the SATA controller 212 and signal translation interface card 300 of test module 21, the second specification bus 2 is coupled between signal translation interface card 300 and storage module 22, and the 3rd specification bus 3 is coupled to a closed loop (loopback) with PCI-E controller 211.It is worth mentioning that, 300, the signal translation interface card of the present embodiment needs correspondence to change into and the specification of SATA test signal can be converted to the SAS interface card of SAS test signal, after the first test signal is changed, is sent to storage module 22.
So can utilize equally the test interface card 400 of the present embodiment, make machine plate 200 to be measured can once test all buses, and do not need the bus of testing different size just to change signal translation interface card 300, to save the time cost of test.
Consult Fig. 7, the 3rd preferred embodiment for test interface card 500 of the present invention, wherein roughly identical with the first preferred embodiment, difference is that the test interface card 500 of the present embodiment (for example: universal serial bus (Universal Serial Bus can set up the 4th specification bus, USB)) the 4 and the 5th specification bus (for example: FASTTRACK (Quick Path Interconnect, QPI)) 5, its quantity is not as limit.
In the present embodiment, test module 22 also have a pair of should the 4th specification bus 4 USB controller 213 and to QPI controller 214 that should the 5th specification bus 5.
The connection of the 4th specification bus 4 is as the 3rd specification bus 3, wherein one end is coupled to an output terminal of USB controller 213 in test module 21, and wherein the other end is coupled to an input end of USB controller 213, make 213 one-tenth one closed loops of the 4th specification bus 4 and USB controller, one end of the 4th specification bus 4 receives the 3rd test signal that USB controller 213 sends, and the 3rd test signal is back to USB controller 213 from the other end of the 4th specification bus 4.And the 3rd test signal is USB test signal.
The connection of the 5th specification bus 5 is equally as the 3rd specification bus 3, wherein one end is coupled to an output terminal of QPI controller 214 in test module 21, and wherein the other end is coupled to an input end of QPI controller 214, make 214 one-tenth one closed loops of the 5th specification bus 5 and QPI controller, one end of the 5th specification bus 5 receives the 4th test signal that QPI controller 214 sends, and the 4th test signal is back to QPI controller 214 from the other end of the 5th specification bus 5.And the 4th test signal is QPI test signal.
Consult Fig. 8, the process flow diagram of testing for the test interface card 500 of the present embodiment for machine plate 200 to be measured.Similarly, be that hypothesis machine plate 200 to be measured has entered a test pattern (test mode) and carried out following steps:
Step 40, the PCI-E controller 211 of test module 21 sends the first test signal to signal translation interface card 300 by the first specification bus 1, signal translation interface card 300 is carried out the first test signal after specification conversion, by the second specification bus 2, be sent to storage module 22.This step is identical with the step 10 of the first preferred embodiment, therefore repeat no more.
After test module 21 execution step 40, together with step, carry out step 50, step 60 and step 70, namely all controllers corresponding with it mutually couple the bus that is closed loop and will synchronously test.
Consult Fig. 9, the 4th preferred embodiment for test interface card 600 of the present invention, wherein roughly identical with the first preferred embodiment, difference is, the test interface card 600 of the present embodiment also has a signal conversion module 10 in order to received signal is carried out exporting after format conversion.What specify is, the function of signal conversion module 10 is to be equal to the signal translation interface card 300 (Fig. 3) described in the first preferred embodiment, in other words, the test interface card 600 of the present embodiment is integrated in the test interface card described in the first preferred embodiment 100 and signal translation interface card 300 in same interface card.
In the present embodiment, the first specification bus 1 is coupled between the PCI-E controller 211 and signal conversion module 10 of test module 21, and the second specification bus 2 is coupled between signal conversion module 10 and storage module 22.Wherein, after signal conversion module 10 can be carried out the first test signal (PCI-E test signal) specification conversion, (converting SAS test signal to) is back to storage module 22.So, the test interface card 600 of the present embodiment can make 200 pairs of all buses of machine plate to be measured test equally, and does not need the bus of testing different size just to change signal translation interface card 300, to save the time cost of test.
In sum, test interface card of the present invention is coupled to one of them bus between test module and signal translation interface card, wherein another bus is coupled between signal translation interface card and storage module, all corresponding with it controller of all the other buses mutually couples and is closed loop, can test for all buses, and do not need through loaded down with trivial details replacement signal translation interface card 300, can significantly save the test duration.
Only as described above, it is only preferred embodiment of the present invention, when not limiting scope of the invention process with this, the simple equivalence of generally doing according to the claims in the present invention scope and invention description content changes and modifies, and all still belongs in the scope that the claims in the present invention contain.
Claims (9)
1. a test interface card, is applied between machine plate to be measured and signal translation interface card, and this machine plate to be measured has the first specification interface controller, the second specification interface controller and storage module, and this test interface card comprises:
The first specification bus, is coupled between this first specification interface controller and this signal translation interface card, and the first test signal that this first specification bus is sent this first specification interface controller is sent to this signal translation interface card;
The second specification bus, is coupled between this signal translation interface card and this storage module, and this second specification bus is transmitted back to this storage module by the output signal of this signal translation interface card; And
The 3rd specification bus, wherein one end be coupled to an output terminal of this second specification interface controller and wherein the other end be coupled to an input end of this second specification interface controller, make the 3rd specification bus become a closed loop with this second specification interface controller, one end of the 3rd specification bus receives the second test signal that this second specification interface controller sends, and this second test signal is back to this second specification interface controller from the other end of the 3rd specification bus.
2. test interface card according to claim 1, wherein, this signal translation interface card is serial attached small computer system interface SAS card, and this second specification bus is SAS bus, and this signal translation interface card is transmitted back to this storage module after this first test signal is converted to SAS specification.
3. test interface card according to claim 2, wherein, this the first specification bus be PCI-E bus and SATA bus one of them, the 3rd specification bus be PCI-E bus and SATA bus wherein another, when this first specification bus is PCI-E bus and the 3rd specification bus while being SATA bus, this first specification interface controller is that PCI-E controller and this second specification interface controller are SATA controller; When this first specification bus is SATA bus and the 3rd specification bus while being PCI-E bus, this first specification interface controller is that SATA controller and this second specification interface controller are PCI-E controller.
4. a method of testing, is applied to machine plate to be measured, and this machine plate to be measured has the first specification interface controller, the second specification interface controller, storage module, the first specification bus, the second specification bus and the 3rd specification bus, and this method of testing comprises following steps:
(A) this first specification bus is coupled between this first specification interface controller and a signal translation interface card, this the second specification bus is coupled between this signal translation interface card and this storage module, one end of the 3rd specification bus is coupled to an output terminal of this second specification interface controller and the input end that the other end is coupled to this second specification interface controller, makes the 3rd specification bus become a closed loop with this second specification interface controller;
(B) make this first specification interface controller send the first test signal to this signal translation interface card by this first specification bus, make this signal translation interface card that this first test signal is carried out by this second specification bus, being sent to this storage module after specification conversion; And
(C) make this second specification interface controller send the second test signal by one end of the 3rd specification bus, make this second test signal from the other end of the 3rd specification bus, be back to this second specification interface controller through the 3rd specification bus.
5. method of testing according to claim 4, wherein, this signal translation interface card is serial attached small computer system interface SAS card, and this second specification bus is SAS bus, and this signal translation interface card is transmitted back to this storage module after this first test signal is converted to SAS specification.
6. method of testing according to claim 5, wherein, this the first specification bus be PCI-E bus and SATA bus one of them, the 3rd specification bus be PCI-E bus and SATA bus wherein another, when this first specification bus is PCI-E bus and the 3rd specification bus while being SATA bus, this first specification interface controller is that PCI-E controller and this second specification interface controller are SATA controller; When this first specification bus is SATA bus and the 3rd specification bus while being PCI-E bus, this first specification interface controller is that SATA controller and this second specification interface controller are PCI-E controller.
7. a test interface card, is applied to machine plate to be measured, and this machine plate to be measured has the first specification interface controller, the second specification interface controller and storage module, and this test interface card comprises:
Signal conversion module, in order to carry out received signal to export after format conversion;
The first specification bus, is coupled between this first specification interface controller and this signal conversion module, and the first test signal that this first specification bus is sent this test module is sent to this signal conversion module;
The second specification bus, is coupled between this signal conversion module and this storage module, and this second specification bus is transmitted back to this storage module by the output signal of this signal conversion module; And
The 3rd specification bus, wherein one end be coupled to an output terminal of this second specification interface controller and wherein the other end be coupled to an input end of this second specification interface controller, make the 3rd specification bus become a closed loop with this second specification interface controller, one end of the 3rd specification bus receives the second test signal that this second specification interface controller sends, and this second test signal is back to this second specification interface controller from the other end of the 3rd specification bus.
8. test interface card according to claim 7, wherein, this second specification bus is SAS bus, this signal conversion module is transmitted back to this storage module after this first test signal is converted to SAS specification.
9. test interface card according to claim 8, wherein, this the first specification bus be PCI-E bus and SATA bus one of them, the 3rd specification bus be PCI-E bus and SATA bus wherein another, when this first specification bus is PCI-E bus and the 3rd specification bus while being SATA bus, this first specification interface controller is that PCI-E controller and this second specification interface controller are SATA controller; When this first specification bus is SATA bus and the 3rd specification bus while being PCI-E bus, this first specification interface controller is that SATA controller and this second specification interface controller are PCI-E controller.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200910266027.4A CN102117239B (en) | 2009-12-31 | 2009-12-31 | Test interface card and test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200910266027.4A CN102117239B (en) | 2009-12-31 | 2009-12-31 | Test interface card and test method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102117239A CN102117239A (en) | 2011-07-06 |
| CN102117239B true CN102117239B (en) | 2014-05-07 |
Family
ID=44216017
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200910266027.4A Expired - Fee Related CN102117239B (en) | 2009-12-31 | 2009-12-31 | Test interface card and test method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102117239B (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1508685A (en) * | 2002-12-19 | 2004-06-30 | 联想(北京)有限公司 | Computer main board power source stardard conformity measuring system |
| CN1645337A (en) * | 2004-04-16 | 2005-07-27 | 威盛电子股份有限公司 | Method and apparatus for testing host computer board including interconnecting peripheries quickly |
| CN101359307A (en) * | 2007-08-03 | 2009-02-04 | 英业达股份有限公司 | Test device of SAS channel and test method thereof |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7277815B2 (en) * | 2005-07-08 | 2007-10-02 | Yu-Chiang Shih | Test interface card |
-
2009
- 2009-12-31 CN CN200910266027.4A patent/CN102117239B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1508685A (en) * | 2002-12-19 | 2004-06-30 | 联想(北京)有限公司 | Computer main board power source stardard conformity measuring system |
| CN1645337A (en) * | 2004-04-16 | 2005-07-27 | 威盛电子股份有限公司 | Method and apparatus for testing host computer board including interconnecting peripheries quickly |
| CN101359307A (en) * | 2007-08-03 | 2009-02-04 | 英业达股份有限公司 | Test device of SAS channel and test method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102117239A (en) | 2011-07-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101311905A (en) | Debug card and debug method | |
| US20080046706A1 (en) | Remote Monitor Module for Computer Initialization | |
| US20130268708A1 (en) | Motherboard test device and connection module thereof | |
| CN101556551B (en) | Hardware acquisition system and method for equipment failure log | |
| CN105183575A (en) | Processor fault diagnosis method, device and system | |
| KR20110023836A (en) | Computer including a carrier board and methods of assembly | |
| CN103376340A (en) | Adapter plate, a multi-platform serial test system and method | |
| CN104678982A (en) | Test device using independent control module to test, and method of test device | |
| CN102455965A (en) | Electronic device test system and method | |
| CN111142011A (en) | Express delivery cabinet test fixture | |
| CN110968352A (en) | PCIE equipment resetting system and server system | |
| CN116340073B (en) | Test method, device and system | |
| CN101930393A (en) | Testing device for SAS (Serial Attached SCSI) back plate | |
| US9158609B2 (en) | Universal serial bus testing device | |
| CN102541705B (en) | Testing method for computer and tooling plate | |
| CN102117239B (en) | Test interface card and test method | |
| TWI502338B (en) | A testing interposer card and method of testing | |
| WO2017113321A1 (en) | Automatic test system for numerical control mainboard | |
| CN104035844A (en) | Fault testing method and electronic device | |
| CN101377753A (en) | Accessory test device and method | |
| CN116539992A (en) | Storage device in-place stable state detection device, method, logic module and medium | |
| CN214311726U (en) | A adapter plate for prototype is verified | |
| CN105068962A (en) | I2C controller access method and I2C controller access system | |
| US6973607B2 (en) | Method and apparatus for testing electronic components | |
| CN115303203A (en) | Debugging board of vehicle-mounted controller, vehicle-mounted controller mainboard and vehicle |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140507 Termination date: 20181231 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |