CN102109688B - Method for testing line defects of LCD (liquid crystal display) panel, array substrate and drive wires - Google Patents
Method for testing line defects of LCD (liquid crystal display) panel, array substrate and drive wires Download PDFInfo
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- CN102109688B CN102109688B CN200910248059.1A CN200910248059A CN102109688B CN 102109688 B CN102109688 B CN 102109688B CN 200910248059 A CN200910248059 A CN 200910248059A CN 102109688 B CN102109688 B CN 102109688B
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Abstract
A method for testing line defects of an LCD panel, an array substrate and drive wires. The LCD panel comprises a plurality of groups of drive wires and a plurality of detection terminals, and each group of the drive wires at least comprises two drive wires, wherein the LCD panel further comprises a plurality of first switches, a plurality of second switches, a first switch control wire used for controlling the plurality of first switches, and a second switch control wire used for controlling the plurality of second switches, and one end of each of the two drive wires of at least one group of the drive wires is connected with one detection terminal through one first switch and one second switch respectively. At least two drive wires share one first detection terminal, so that the using times of probes can be reduced; the distance among the detection terminals are enlarged, and the defect of detection error caused by short circuit of the adjacent probes as soon as the probes are slightly bent can be avoided.
Description
Technical field
The present invention relates to field of display, relate in particular to a kind of display panels, array base palte and drive wire broken circuit detecting method thereof.
Background technology
In recent years, along with developing rapidly of information communication field, increasing to the demand of various types of display devices.The display device of main flow mainly contains at present: cathode-ray tube display (CRT), liquid crystal display (LCD), plasma scope (PDP), electroluminescent display (ELD) and vacuum fluorescent display (VFD) etc.
Because liquid crystal indicator has: the advantage such as light, thin, volume is little, power consumption is little, radiation is low, is widely used in various data processing equipments such as TV, notebook computer, mobile phone, personal digital assistant etc.
Referring to Fig. 1, is the electrical block diagram of a prior art liquid crystal indicator, and Fig. 2 is the circuit structure rough schematic view of the data line detection architecture of liquid crystal indicator shown in Fig. 1.Described liquid crystal indicator comprises data line DL1, the DL2 that many parallel interval arrange ..., many gate lines G L1s vertical with described data line, GL2 ... with a plurality of pixel cells that defined by described data line and gate line.
In the manufacturing process of liquid crystal indicator, data line or gate line are easy to occur line defect, open circuit, short circuit phenomenon, therefore, in the manufacture process of liquid crystal indicator or after having manufactured, need the data line of liquid crystal indicator or gate line whether to occur that line defect detects.Please refer to Fig. 2, it is the circuit structure rough schematic view of the data line detection architecture of liquid crystal indicator shown in Fig. 1.For the data line to described liquid crystal indicator detects, described liquid crystal indicator further comprises two short bars 101,102 and a plurality of detection terminal P1, P2 ...One end of adjacent data line connects respectively described two short bars 101,102, described many data line DL1, DL2 ... be electrically connected to respectively described a plurality of detection terminal P1, P2 ...
While detecting the line defect of liquid crystal indicator data line, many detector probe are pressed on described detection terminal probe is connected with data line, from detection data line, whether occur line defect, open circuit, short circuit phenomenon.
Yet there is following shortcoming in the liquid crystal indicator of described prior art:
(1) because every data lines is electrically connected to a detection terminal, detection terminal quantity is many, and when to data line out of circuit test, the corresponding probe of each detection terminal, makes into the quantity of the required probe of test a lot, and cost is high.
(2) along with the progressively raising of liquid crystal indicator resolution, corresponding high-resolution liquid crystal indicator, the distance d between adjacent data line (as shown in Figure 2), therefore just meticulousr to the requirement of probe, cause the increase of cost; And dwindling of the distance between adjacent data line, has limited the size of detection terminal, once probe slight curvature will make adjacent probe short circuit, cause detecting mistake.
Because the line defect to liquid crystal indicator gate line detects, there is identical structure and detection method, therefore, also have identical problem.
Summary of the invention
The problem that the present invention solves is that the display panels detection terminal of prior art is many, and required number of probes is many, the problem that cost is high.
For solving above technical matters, the invention provides a kind of display panels, it comprises many group drive wires and a plurality of detection terminal, every group of drive wire at least comprises two drive wires, described display panels also comprises a plurality of the first switches, a plurality of second switch, control the first thread switching control of described a plurality of the first switches and control the second switch control line of described a plurality of second switches, and two drive wire one end at least one group of drive wire are connected with a detection terminal with a second switch by one first switch respectively.
Optionally, two drive wire one end in described every group of drive wire are connected with a detection terminal with a second switch by one first switch respectively.
Optionally, described display panels further comprise the first short bar and the second short bar, in every group of drive wire, the other end of the drive wire that one end is connected with detection terminal by the first switch connects the first short bar, and the other end of the drive wire that one end is connected with detection terminal by second switch connects the second short bar.
Optionally, every group of drive wire comprises three drive wires, and another drive wire one end in every group is directly connected with a detection terminal.
Optionally, described display panels further comprises one the 3rd short bar, and in every group of drive wire, the other end of the drive wire that one end is directly connected with a detection terminal connects the 3rd short bar.
Optionally, every group of drive wire comprises three drive wires, described display panels also comprises a plurality of the 3rd switches and controls the 3rd thread switching control of described a plurality of the 3rd switches, and one end of three drive wires in every group is connected with a detection terminal by one first switch, a second switch and the 3rd switch respectively.
Optionally, described display panels further comprises one the 3rd short bar, and in every group of drive wire, the other end of the drive wire that one end is connected with detection terminal by the 3rd switch connects the 3rd short bar.
Optionally, described the first switch, second switch and the 3rd switch are thin film transistor (TFT).
Optionally, described thin film transistor (TFT) is formed directly on display panels.
Optionally, described thin film transistor (TFT) is amorphous silicon film transistor or polycrystalline SiTFT.
Optionally, described drive wire is described display panels data line or gate line.
For solving above technical matters, the present invention also provides a kind of array base palte, it comprises many group drive wires and a plurality of detection terminal, every group of drive wire at least comprises two drive wires, described array base palte also comprises a plurality of the first switches, a plurality of second switch, control the first thread switching control of described a plurality of the first switches and control the second switch control line of described a plurality of second switches, and two drive wire one end at least one group of drive wire are connected with a detection terminal with a second switch by one first switch respectively.
Optionally, two drive wire one end in described every group of drive wire are connected with a detection terminal with a second switch by one first switch respectively.
Optionally, described array base palte further comprises the first short bar and the second short bar, in every group of drive wire, the other end of the drive wire that one end is connected with detection terminal by the first switch connects the first short bar, and the other end of the drive wire that one end is connected with detection terminal by second switch connects the second short bar.
Optionally, described array base palte is thin film transistor base plate.
For solving above technical matters, the present invention also provides a kind of drive wire line defect detection method of display panels, this display panels comprises many group drive wires and a plurality of detection terminal, every group of drive wire at least comprises two drive wires, described display panels also comprises a plurality of the first switches, a plurality of second switches, control the first thread switching control of described a plurality of the first switches and the second switch control line of the described a plurality of second switches of control, two drive wire one end at least one group of drive wire are connected with a detection terminal with a second switch by one first switch respectively, the method comprises: to the first thread switching control and the output of second switch control line, control voltage, make the first switch conduction second switch cut-off, probe is connected corresponding drive wire by detection terminal with the first switch and detects, to the first thread switching control and the output of second switch control line, control voltage, make the first switch cut-off second switch conducting, probe is connected corresponding drive wire by detection terminal with the first switch and detects.
The present invention also provides a kind of drive wire line defect detection method of display panels in addition, this display panels comprises many group drive wires and a plurality of detection terminal, every group of drive wire at least comprises two drive wires, described display panels also comprises a plurality of the first switches, a plurality of second switch, control the first thread switching control of described a plurality of the first switches and control the second switch control line of described a plurality of second switches, and two drive wire one end at least one group of drive wire are connected with a detection terminal with a second switch by one first switch respectively;
Described display panels further comprise the first short bar and the second short bar, in every group of drive wire, the other end of the drive wire that one end is connected with detection terminal by the first switch connects the first short bar, and the other end of the drive wire that one end is connected with detection terminal by second switch connects the second short bar;
The method comprises: many probes contact with described a plurality of detection terminals; To the first thread switching control and the output of second switch control line, control voltage, make the first switch conduction second switch cut-off, many probes are connected corresponding drive wire by corresponding detection terminal with the first switch and detect; To the first thread switching control and the output of second switch control line, control voltage, make second switch conducting the first switch cut-off, many probes are connected corresponding drive wire and detect with second switch by corresponding detection terminal.
Optionally, many probes are connected the step that corresponding drive wire detects and comprise with the first switch by corresponding detection terminal: a probe is exported a test voltage by corresponding detection terminal, and other probe detects described test voltage by corresponding detection terminal; As all other probes all do not detect as described in test voltage, with another probe, by corresponding detection terminal, export a test voltage, other probe detects described test voltage by corresponding detection terminal.
Optionally, when a probe does not detect test voltage, judge that its corresponding drive wire opens circuit.
Optionally, many probes are connected corresponding drive wire and detect and comprise with the first switch by corresponding detection terminal: a probe is exported a test voltage by corresponding detection terminal, and other probe detects described test voltage by corresponding detection terminal.
The present invention also provides a kind of drive wire line defect detection method of described display panels, this display panels comprises, many group drive wires and a plurality of detection terminal, every group of drive wire at least comprises two drive wires, described display panels also comprises a plurality of the first switches, a plurality of second switch, control the first thread switching control of described a plurality of the first switches and control the second switch control line of described a plurality of second switches, and two drive wire one end at least one group of drive wire are connected with a detection terminal with a second switch by one first switch respectively; Two drive wire one end in described every group of drive wire are connected with a detection terminal with a second switch by one first switch respectively; Described display panels further comprise the first short bar and the second short bar, in every group of drive wire, the other end of the drive wire that one end is connected with detection terminal by the first switch connects the first short bar, and the other end of the drive wire that one end is connected with detection terminal by second switch connects the second short bar; Every group of drive wire comprises three drive wires, and another drive wire one end in every group is directly connected with a detection terminal;
The method comprises: many probes contact with described a plurality of detection terminals; To the first thread switching control and the output of second switch control line, control voltage, make the first switch conduction second switch cut-off, many probes detect being connected corresponding drive wire with the first switch by corresponding detection terminal.
Optionally, many probes are detected and comprise be connected corresponding drive wire with the first switch by corresponding detection terminal: a probe is exported a test voltage by correspondence with the direct-connected detection terminal of drive wire, and other probe detects described test voltage by corresponding detection terminal.
Optionally, when a probe in detecting is to output voltage, judge drive wire that it is corresponding and adjacent drive wire short circuit.
The present invention increases on the basis of existing technology the first thread switching control of the first switch, second switch, described the first switch of control and controls the second switch control line of described second switch, two drive wire one end at least one group of drive wire are connected with a detection terminal with a second switch by one first switch respectively, therefore at least two drive wires share a detection terminal, carrying out when drive wire line defect detects saving number of probes, reduce costs.
Further, corresponding high-resolution display panel, because at least two drive wires share a detection terminal, the distance between adjacent detection terminal increases, and does not therefore need meticulousr probe, can not cause the increase of cost; And detection terminal quantity reduces, and then the distance between detection terminal increases, and can not cause the restriction to detection terminal size, once also just there will not be probe slight curvature will make adjacent probe short circuit, cause detecting wrong defect.
And, when not using detection architecture, can give the first thread switching control and second switch control line low-voltage, make the first switch of its connection and second switch in cut-off state, therefore in molding process section, even if detection terminal contacts with the ITO of upper substrate, the public electrode of detection terminal and upper substrate can conducting yet, there will not be line defect, causes liquid crystal indicator to be scrapped.
Accompanying drawing explanation
Fig. 1 is the electrical block diagram of a prior art liquid crystal indicator.
Fig. 2 is the circuit structure rough schematic view of the data line detection architecture of liquid crystal indicator shown in Fig. 1.
Fig. 3 is the electrical block diagram of display panels of the present invention.
Fig. 4 is the circuit reduction schematic diagram of data line detection architecture of the display panels of the present invention's the first specific embodiment.
Fig. 5 is the circuit reduction schematic diagram of data line detection architecture of the display panels of the present invention's the second specific embodiment.
Fig. 6 is the circuit reduction schematic diagram of data line detection architecture of the display panels of the present invention's the 3rd specific embodiment.
Fig. 7 is the circuit reduction schematic diagram of data line detection architecture of the display panels of the present invention's the 4th specific embodiment.
Fig. 8 is the circuit reduction schematic diagram of data line detection architecture of the display panels of the present invention's the 5th specific embodiment.
Embodiment
The specific embodiment of the present invention increases on the basis of existing technology the first thread switching control of the first switch, second switch, described the first switch of control and controls the second switch control line of described second switch, two drive wire one end at least one group of drive wire are connected with a detection terminal with a second switch by one first switch respectively, therefore in every group of drive wire, at least two drive wires share a detection terminal, number of probes carrying out can saving when drive wire line defect detects 1/3, reduces costs.
Below in conjunction with specific embodiment and accompanying drawing, the specific embodiment of the present invention is elaborated.
Referring to Fig. 3, is the electrical block diagram of display panel of the present invention.Display panels of the present invention, it comprises many group drive wires and a plurality of detection terminal, every group of drive wire at least comprises two drive wires, in the specific embodiment of the present invention, described drive wire is that many parallel interval arrange data line DL1, DL2 ..., or many and described data line DL1, DL2 ... vertical gate lines G L1, GL2 ...
For drive wire is carried out to line defect detection, display panels of the present invention further comprises detection architecture.
Please refer to Fig. 4, rough schematic view for the data line detection architecture of the display panels shown in the concrete Fig. 3 implementing of the present invention first, in this specific embodiment, every group of data line comprises three data lines, be specially, three adjacent data line DL1, DL2, DL3 is one group, DL4, DL5, DL6 is one group, described display panels also comprises a plurality of the first switches 231, a plurality of second switches 232, control the first thread switching control 221 of described a plurality of the first switches 231 and the second switch control line 222 of the described a plurality of second switches 232 of control, wherein, two data line one end at least one group of data line are connected with a detection terminal with a second switch 232 by one first switch 231 respectively, another data line one end is directly connected with a detection terminal, in this specific embodiment, one end of adjacent two data lines in every group of data line is connected with a detection terminal with a second switch 232 by one first switch 231 respectively, another data line one end is directly connected with a detection terminal.Being specially data line DL2 is connected with detection terminal P2 with a second switch 232 by one first switch 231 with DL3, data line DL1 is directly connected with detection terminal P1, data line DL5 is connected with detection terminal P4 with a second switch 232 by one first switch 231 with DL6, and data line DL4 is directly connected with detection terminal P3.
In this specific embodiment, described display panels further comprises the first short bar 201 and the second short bar 202 and the 3rd short bar 203, in every group of data line, the other end of data line DL1, DL4 that one end is directly connected with detection terminal P1, P3 is connected with the 3rd short bar 203, the other end of data line DL2, DL5 that one end is connected with detection terminal P2, P4 by the first switch 231 connects the first short bar 201, and the other end of data line DL3, DL6 that one end is connected with detection terminal P2, P4 by second switch 232 connects the second short bar 202.
In this first specific embodiment, data line DL3,DL6 peripheral wiring district A and the second short bar 202, at same metal level, form in one-time process, and data line DL3, DL6 are connected with data line DL3, the DL6 of viewing area B by through hole 212; Data line DL1, DL2, DL4, DL5 and the 3rd short bar 203, at same metal level, form in same technique, therefore need to be to adjacent data line DL1 and DL2, and DL4 and DL5 carry out short-circuit detecting.
In addition, it should be noted that, in this specific embodiment, data line DL2 is connected with detection terminal P2 with a second switch 232 by one first switch 231 with DL3, data line DL1 is directly connected with detection terminal P1, data line DL5 is connected with detection terminal P4 with a second switch 232 by one first switch 231 with DL6, and data line DL4 is directly connected with detection terminal P3; In other embodiment, can be that data line DL1 is connected with detection terminal P1 with a second switch 232 by one first switch 231 with DL2, data line DL3 is directly connected with detection terminal P2, data line DL4 is connected with detection terminal P3 with a second switch 232 by one first switch 231 with DL5, and data line DL6 is directly connected with detection terminal P4.
Refer to Fig. 5, for the second specific embodiment of the present invention, it is from the different of the first specific embodiment: in every group of data line, one end of two non-adjacent data lines is connected with a detection terminal with a second switch 332 by one first switch 331 respectively, and another data line one end is directly connected with a detection terminal.Being specially data line DL1 is connected with detection terminal P1 with a second switch 332 by one first switch 331 with DL3, data line DL2 is directly connected with detection terminal P2, data line DL4 is connected with detection terminal P3 with a second switch 332 by one first switch 331 with DL6, and data line DL5 is directly connected with detection terminal P4.
The first switch and second switch in this first specific embodiment and the second specific embodiment are thin film transistor (TFT), are formed directly on display panels, and it can be polycrystalline SiTFT or amorphous silicon film transistor.
Be understandable that, for convenience of description, the first specific embodiment of the present invention and the second specific embodiment be take data line and are described as example, and those skilled in the art can be applied in described data line detection architecture in gate line.
The first specific embodiment of the present invention and the second specific embodiment increase on the basis of existing technology the first thread switching control of the first switch, second switch, described the first switch of control and control the second switch control line of described second switch, two drive wire one end in every group of drive wire are connected with a detection terminal with a second switch by one first switch respectively, therefore in three drive wires of every group, two drive wires share a detection terminal, number of probes carrying out can saving when drive wire line defect detects 1/3rd, reduces costs.
Please refer to Fig. 6, it is the rough schematic view of the data line detection architecture of the display panels shown in the 3rd concrete Fig. 3 implementing, in this specific embodiment, adjacent two data line DL1 and DL2, DL3 and DL4, DL5 and DL6 are respectively one group, described display panels also comprises a plurality of the first switches 631, a plurality of second switches 632, control the first thread switching control 621 of described a plurality of the first switches 631 and the second switch control line 622 of the described a plurality of second switches 632 of control, two data line one end at least one group of data line are connected with a detection terminal with a second switch 632 by one first switch 631 respectively, in this specific embodiment, one end of two data lines in every group of data line is connected with a detection terminal with a second switch 632 by one first switch 631 respectively, being specially data line DL1 is connected with detection terminal P1 with a second switch 632 by one first switch 631 with DL2, data line DL3 is connected with detection terminal P2 with a second switch 632 by one first switch 631 with DL4, data line DL5 is connected with detection terminal P3 with a second switch 632 by one first switch 631 with DL6.
In this specific embodiment, described display panels further comprises the first short bar 601 and the second short bar 602, in every group of data line, data line DL1, the DL3 that one end is connected with detection terminal P1, P2, P3 by the first switch 631, the other end of DL5 connect the first short bar 601, and data line DL2, the DL4 that one end is connected with detection terminal P1, P2, P3 by second switch 632, the other end of DL6 connect the second short bar 602.
In addition, in the 3rd specific embodiment, adjacent data line at peripheral wiring district A at different metal levels, therefore in the 3rd specific embodiment, do not need data line to carry out short-circuit test, data line DL2, DL4,DL6 peripheral wiring district A are connected with data line DL2, DL4, the DL6 of viewing area B by through hole 612, and data line DL2, DL4,DL6 peripheral wiring district A and short bar 602, at same metal level, form in same technique.
The first switch 631 and second switch 632 in the 3rd specific embodiment are thin film transistor (TFT), are formed directly on display panels, and it can be polycrystalline SiTFT or amorphous silicon film transistor.
Figure 7 shows that display panels of the present invention the 4th specific embodiment, the difference of the 4th specific embodiment and the 3rd specific embodiment comprises: the data line detection architecture of the 4th specific embodiment comprises the first data line short bar 701, the second data line short bar 702 and the 3rd data line short bar 703.
Be understandable that, for convenience of description, the 3rd specific embodiment of the present invention and the 4th specific embodiment be take data line and are described as example, and those skilled in the art can be applied in described data line detection architecture in gate line.
The 3rd specific embodiment of the present invention and the 4th specific embodiment increase on the basis of existing technology the first thread switching control of the first switch, second switch, described the first switch of control and control the second switch control line of described second switch, two drive wire one end in every group of drive wire are connected with a detection terminal with a second switch by one first switch respectively, therefore two drive wires share a detection terminal, number of probes carrying out can saving when drive wire line defect detects 1/2nd, reduces costs.
Consult Fig. 8, for the 5th specific embodiment of the present invention, in the 5th specific embodiment, every group of drive wire comprises three drive wires, the structure of the data line shown in Fig. 8 of take describes as example, every group of data line comprises three data lines, is specially data line DL1, DL2, DL3 is one group, and data line DL4, DL5, DL6 are one group, described display panels also comprises a plurality of the first switches 831, a plurality of second switch 832, a plurality of the 3rd switch 833, control the first thread switching control 821 of described a plurality of the first switches 831 and the second switch control line 822 of the described a plurality of second switches 832 of control, and control the 3rd thread switching control 823 of described a plurality of the 3rd switches 833, one end of three data lines at least one group is respectively by one first switch 831, one second switch 832 is connected with a detection terminal with the 3rd switch 833, in this specific embodiment, one end of three data lines in every group of data line is respectively by one first switch 831, one second switch 832 is connected with a detection terminal with the 3rd switch 833, be specially data line DL1, DL2, DL3 is by one first switch 831, one second switch 832, one the 3rd switch 833 is connected with detection terminal P1, data line DL4, DL5, DL6 is by one first switch 831, one second switch 832, one the 3rd switch 833 is connected with detection terminal P2.
In this specific embodiment, described display panels further comprises the first short bar 801, the second short bar 802 and the 3rd short bar 803, in three data lines of every group, one end is by the first switch 831 and detection terminal P1, the data line DL1 that P2 connects, the other end of DL4 connects the first short bar 801, one end is by second switch 832 and detection terminal P1, the data line DL2 that P2 connects, the other end of DL5 connects the second short bar 802, one end is by the 3rd switch 833 and detection terminal P1, the data line DL3 that P2 connects, the other end of DL6 connects the 3rd short bar 803.
In this specific embodiment, data line DL3,DL6 peripheral wiring district A, is connected with data line DL3, the DL6 of viewing area B by through hole 812 at different metal levels from other data line DL1, DL2, DL4, DL5.In other embodiment, also can be for a data line in every group of data line and other two data lines be at same metal level.
The first switch 831 in this specific embodiment, second switch 832 and the 3rd switch 833 are thin film transistor (TFT), are formed directly on display panels, and it can be polycrystalline SiTFT or amorphous silicon film transistor.
Be understandable that, for convenience of description, the 4th specific embodiment of the present invention be take data line and is described as example, and those skilled in the art can be applied in described data line detection architecture in gate line.
The 5th specific embodiment of the present invention increases by the first switch on the basis of existing technology, second switch, the 3rd switch, control the first thread switching control of described the first switch and the second switch control line of the described second switch of control, control the 3rd thread switching control of described the 3rd switch, three drive wire one end in every group of drive wire are respectively by one first switch, one second switch is connected with a detection terminal with one the 3rd switch, therefore three drive wires of every group share a detection terminal, in the number of probes of carrying out can saving when drive wire line defect detects 2/3rds, reduce costs.
It will be appreciated by those skilled in the art that, display panels comprises array base palte, drive wire, detection architecture, pixel cell is integrated on this array base palte, therefore the circuit structure of above-described display panels can be applied on array base palte, therefore the array base palte of the specific embodiment of the invention comprises many group drive wires and a plurality of detection terminal, every group of drive wire at least comprises two drive wires, described array base palte also comprises a plurality of the first switches, a plurality of second switches, control the first thread switching control of described a plurality of the first switches and the second switch control line of the described a plurality of second switches of control, two drive wire one end at least one group of drive wire are connected with a detection terminal with a second switch by one first switch respectively.Two drive wire one end in described every group of drive wire are connected with a detection terminal with a second switch by one first switch respectively.Described array base palte further comprises the first short bar and the second short bar, in every group of drive wire, the other end of the drive wire that one end is connected with detection terminal by the first switch connects the first short bar, and the other end of the drive wire that one end is connected with detection terminal by second switch connects the second short bar.Wherein, described drive wire can be data line or gate line, and described array base palte is thin film transistor base plate.
The electric circuit inspection structure of the data line of the specific embodiment of above-described Fig. 4 to Fig. 8 can be applied to this array base palte, those skilled in the art can be applied to the circuit structure of above display panels, on this array base palte, at this, the array base palte of specific embodiment is not described in detail easily.
What it will be appreciated by those skilled in the art that is that the circuit structure of above-described display panels also can be applied to other display panel, therefore the display panel of the specific embodiment of the invention comprises many group drive wires and a plurality of detection terminal, every group of drive wire at least comprises two drive wires, described display panel also comprises a plurality of the first switches, a plurality of second switches, control the first thread switching control of described a plurality of the first switches and the second switch control line of the described a plurality of second switches of control, two drive wire one end at least one group of drive wire are connected with a detection terminal with a second switch by one first switch respectively.
The circuit structure of the data line of the specific embodiment of above-described Fig. 4 to Fig. 8 can be applied on other display panels, those skilled in the art can be applied to the circuit structure of above display panels, on other display panels, at this, the display panel of specific embodiment is not described in detail easily.
The drive wire line defect detection method of above-described display panels, comprise: to the first thread switching control and the output of second switch control line, control voltage, make the first switch conduction second switch cut-off, probe is connected corresponding drive wire by detection terminal with the first switch and detects; To the first thread switching control and the output of second switch control line, control voltage, make the first switch cut-off second switch conducting, probe is connected corresponding drive wire by detection terminal with the first switch and detects.
Further, the method comprises: many probes contact with described a plurality of detection terminals; To the first thread switching control and the output of second switch control line, control voltage, make the first switch conduction second switch cut-off, many probes are connected corresponding drive wire by corresponding detection terminal with the first switch and detect; To the first thread switching control and the output of second switch control line, control voltage, make second switch conducting the first switch cut-off, many probes are connected corresponding drive wire and detect with second switch by corresponding detection terminal.Wherein, many probes are connected the step that corresponding drive wire detects and comprise with the first switch by corresponding detection terminal: a probe is exported a test voltage by corresponding detection terminal, and other probe detects described test voltage by corresponding detection terminal; As all other probes all do not detect as described in test voltage, with another probe, by corresponding detection terminal, export a test voltage, other probe detects described test voltage by corresponding detection terminal.When a probe does not detect test voltage, judge that its corresponding drive wire opens circuit.
Below in conjunction with accompanying drawing and above-described specific embodiment, detection method of the present invention is described in detail.
In conjunction with the specific embodiment shown in Fig. 4, describe the method for testing of this specific embodiment in detail.
The method of testing opening circuit: probe 242,244 contacts (only shown two groups of data lines in this Fig. 4, in fact have many groups of data lines, so the quantity of probe and detection terminal has been a lot) with described detection terminal P2, P4, probe 245, 246 by terminal 223, 224 control voltage to the first thread switching control 221 and 222 outputs of second switch control line, make the first switch 231 conducting second switch 232 cut-offs, probe 242, 244 by corresponding detection terminal P2, P4 is to being connected corresponding data line DL2 with the first switch 231, DL5 detects, probe 242 is exported a test voltage by corresponding detection terminal P2, probe 244 detects described test voltage by corresponding detection terminal P4, when if probe P4 does not detect test voltage, utilize other probe (not shown) to detect test voltage, if being, all probes test voltage detected, judge that data line DL2 corresponding to detection terminal P2 opens circuit, to the first thread switching control 221 and 222 outputs of second switch control line, control voltage, make second switch 232 conducting the first switch 231 cut-offs, probe P2, P4 is by corresponding detection terminal 242, 244 are connected corresponding data line DL3 with second switch 232, DL6 detects, probe 242 is exported a test voltage by corresponding detection terminal P2, probe 244 detects described test voltage by corresponding detection terminal P4, when if probe 244 does not detect test voltage, utilize other probe in detecting test voltages, if being, all probes test voltage detected, the data line DL3 that judges probe 244 correspondences opens circuit.The method of testing opening circuit of other data lines is with the above.
The detection method of this specific embodiment also comprises, probe 241,243 contacts with detection terminal P1, P3, probe 241 is exported a test voltage by corresponding detection terminal P1, probe 243 detects described test voltage by corresponding detection terminal P3, when if probe P3 does not detect test voltage, utilize other probe (not shown) to detect test voltage, if all probes are, test voltage detected, judge that the data line DL1 of probe 241 correspondences opens circuit; Other with the decision method that opens circuit of the direct-connected data line of detection terminal, with the decision method opening circuit of data line DL1.
The detection method of short circuit: what adopt due to data line DL1 and DL2, DL4HeDL5 peripheral wiring district A is the metal of same layer, must enter short-circuit detecting, and data line DL2 and DL3, data line DL5 and DL6 are at different metal levels, so can there is not short circuit; At viewing area B, the distance between data line is larger, therefore can not have short circuit.
Short-circuit detecting between data line DL1 and DL2: probe 245,246 is controlled voltage by terminal 223,224 to the first thread switching control 221 and 222 outputs of second switch control line, make the first switch 231 conducting second switch 232 cut-offs, probe 241 is exported a test voltage by corresponding detection terminal P1, probe 242 detects described test voltage by corresponding detection terminal P2, if probe P2 detects test voltage, between decision data line DL1 and data line DL2, there is short circuit.
Between data line DL4 and DL5, whether exist the method for testing of short circuit identical with the short circuit test method between data line DL1 and DL2.
Above specific embodiment be take data line and is described as example, and certainly, the short circuit of above-described data line, out of circuit test method, be equally applicable to the short circuit of gate line, the test of opening circuit.
The method of testing of above-described specific embodiment, be applicable to every group and comprise three drive wires, wherein other specific embodiments that the first switch is connected with detection terminal with second switch, one end of another drive wire is directly connected with detection terminal are passed through respectively in one end of two drive wires.For example, shown in Fig. 5, the second specific embodiment of the present invention.
The method of testing of the drive wire line defect of the display panels of the 3rd specific embodiment of the present invention shown in Fig. 6 comprises: probe 641,642,643 contacts with described detection terminal P1, P2, P3 that (this figure has only shown three groups of data lines, in fact have many groups of data lines, so the quantity of probe and detection terminal is a lot), probe 644, 645 by terminal 623, 624 control voltage to the first thread switching control 621 and 622 outputs of second switch control line, make the first switch 631 conducting second switch 632 cut-offs, probe 641, 642, 643 by corresponding detection terminal P1, P2, P3 is to being connected corresponding data line DL1 with the first switch 631, DL3, DL5 detects, probe 641 is exported a test voltage by corresponding detection terminal P1, probe 642 detects described test voltage by corresponding detection terminal P2, when if probe 642 does not detect test voltage, utilize other probes (comprising probe 643 and not shown probe) to detect test voltage, if being, all probes test voltage detected, the data line DL1 that judges probe 641 correspondences opens circuit, probe 644, 645 by terminal 623, 624 control voltage to the first thread switching control 621 and 622 outputs of second switch control line, make the first switch 631 cut-off second switch 632 conductings, many probes 641, 642, 643 by corresponding detection terminal P1, P2, P3 is to being connected corresponding data line DL2 with second switch 632, DL4, DL6 detects, probe 641 is exported a test voltage by corresponding detection terminal P1, probe 642 detects described test voltage by corresponding detection terminal P2, when if probe 642 does not detect test voltage, utilize other probes (comprising probe 643 and not shown probe) to detect test voltage, if being, all probes test voltage detected, the data line DL2 that judges probe 641 correspondences opens circuit, the method of testing opening circuit of other data lines is with the above.
In this specific embodiment, adjacent data line is positioned at different metal levels at peripheral wiring district A, can not have short circuit phenomenon.
Above specific embodiment be take data line and is described as example, and certainly, the out of circuit test method of above-described data line, is equally applicable to the test that gate line opens circuit.
Figure 7 shows that the 4th specific embodiment of the present invention, the 4th specific embodiment has increased by the 3rd short bar on the basis of the 3rd specific embodiment, and the broken circuit detecting method of the 4th specific embodiment is with the broken circuit detecting method of the 3rd specific embodiment shown in Fig. 6.
The detection method of the drive wire line defect of the 5th specific embodiment of the present invention shown in Fig. 8 comprises, probe 841,842 contacts with described detection terminal P1, P2 that (this figure has only shown two groups of data lines, in fact have many groups of data lines, so the quantity of probe and detection terminal is a lot), probe 843, 844, 845 by terminal 824, 825, 826 to the first thread switching control 821, voltage is controlled in second switch control line 822 and the 3rd thread switching control 823 outputs, make the first switch 831 conducting second switches 832 and the 3rd switch 833 cut-offs, probe 841, 842 by corresponding detection terminal P1, P2 is to being connected corresponding data line DL1 with the first switch 831, DL4, probe 841 is exported a test voltage by corresponding detection terminal P1, probe 842 detects described test voltage by corresponding detection terminal P2, when if probe 842 does not detect test voltage, utilize other probe (not shown)s to detect test voltage, if being, all probes test voltage detected, the data line DL1 that judges probe 841 correspondences opens circuit, probe 843, 844, 845 by terminal 824, 825, 826 to the first thread switching control 821, voltage is controlled in second switch control line 822 and the 3rd thread switching control 823 outputs, make the first switch 831 cut-off second switch 832 conductings the 3rd switch 833 cut-offs, probe 841 is exported a test voltage by corresponding detection terminal P1, probe 842 detects described test voltage by corresponding detection terminal P2, when if probe 842 does not detect test voltage, utilize other probe (not shown)s to detect test voltage, if being, all probes test voltage detected, the data line DL2 that judges probe 841 correspondences opens circuit, probe 843, 844, 845 by terminal 824, 825, 826 to the first thread switching control 821, voltage is controlled in second switch control line 822 and the 3rd thread switching control 823 outputs, make the first switch 831 and second switch 832 cut-off the 3rd switch 833 conductings, probe 841 is exported a test voltage by corresponding detection terminal P1, probe 842 detects described test voltage by corresponding detection terminal P2, when if probe 842 does not detect test voltage, utilize other probe (not shown)s to detect test voltage, if being, all probes test voltage detected, the data line DL3 that judges probe 841 correspondences opens circuit, the method of testing opening circuit of other data lines is with the above.
In this specific embodiment, adjacent data line DL2 and DL3, DL5HeDL6 peripheral wiring district A is positioned at different metal levels, can there is not short circuit phenomenon, adjacent data line DL1 and DL2, DL4HeDL5 peripheral wiring district A is positioned at same metal level, need to carry out short-circuit detecting, this method for detecting short circuit comprises: probe 843, 844, 845 by terminal 824, 825, 826 to the first thread switching control 821, voltage is controlled in second switch control line 822 and the 3rd thread switching control 823 outputs, make the first switch 831 conducting second switch 832 cut-off the 3rd switch 833 cut-offs, probe 841 is exported a test voltage by corresponding detection terminal P1, a plurality of probes (comprising probe 842 and probe not shown in the figures) detect described test voltage by corresponding detection terminal (comprising detection terminal P2 and detection terminal not shown in the figures), if probe 842 detects on test voltage and probe 841 difference of the test voltage of output while exceeding the voltage drop on data line, illustrate between data line DL1 and DL2 and have short circuit.Method for detecting short circuit between other adjacent data lines as mentioned above.
Above specific embodiment be take data line and is described as example, and certainly, the short circuit test method of above-described data line, is equally applicable to the test of gate line short circuit.
Display panels of the present invention, array base palte, display panel increase on the basis of existing technology the first thread switching control of the first switch, second switch, described the first switch of control and control the second switch control line of described second switch, two drive wire one end at least one group of drive wire are connected with a detection terminal with a second switch by one first switch respectively, therefore at least two drive wires share a detection terminal, carrying out when drive wire line defect detects saving number of probes, reduce costs.
Further, corresponding high-resolution display panel, because at least two drive wires share a detection terminal, the distance between adjacent detection terminal increases, and does not therefore need meticulousr probe, can not cause the increase of cost; And detection terminal quantity reduces, and then the distance between detection terminal increases, and can not cause the restriction to detection terminal size, once also just there will not be probe slight curvature will make adjacent probe short circuit, cause detecting wrong defect.
And, when not using detection architecture, can give the first thread switching control and second switch control line low-voltage, make the first switch of its connection and second switch in cut-off state, also comprise in certain embodiments the 3rd control line, and the 3rd switch, by giving the 3rd thread switching control low-voltage, make the 3rd switch of its connection in cut-off state, therefore in molding process section, even if detection terminal contacts with the ITO of upper substrate, the public electrode of detection terminal and upper substrate can conducting yet, there will not be line defect, causes liquid crystal indicator to be scrapped.
The foregoing is only specific embodiments of the invention; in order to make those skilled in the art better understand spirit of the present invention; it is limited range that yet protection scope of the present invention not take the specific descriptions of this specific embodiment; any those skilled in the art is not within departing from the scope of spirit of the present invention; can make an amendment specific embodiments of the invention, and not depart from protection scope of the present invention.
Claims (8)
1. the drive wire line defect detection method of a display panels, described display panels comprises many group drive wires and a plurality of detection terminal, every group of drive wire at least comprises two drive wires, described display panels also comprises a plurality of the first switches, a plurality of second switch, control the first thread switching control of described a plurality of the first switches and control the second switch control line of described a plurality of second switches, and two drive wire one end at least one group of drive wire are connected with a detection terminal with a second switch by one first switch respectively;
It is characterized in that, described method comprises: to the first thread switching control and the output of second switch control line, control voltage, make the first switch conduction second switch cut-off, probe detects being connected corresponding drive wire with the first switch by detection terminal; To the first thread switching control and the output of second switch control line, control voltage, make the first switch cut-off second switch conducting, probe detects be connected corresponding drive wire with second switch by detection terminal.
2. the drive wire line defect detection method of a display panels, described display panels comprises many group drive wires and a plurality of detection terminal, every group of drive wire at least comprises two drive wires, and described display panels also comprises a plurality of the first switches, a plurality of second switch, control the first thread switching control of described a plurality of the first switches and control the second switch control line of described a plurality of second switches;
Two drive wire one end in described every group of drive wire are connected with a detection terminal with a second switch by one first switch respectively;
Described display panels further comprises the first short bar and the second short bar, in every group of drive wire, the other end of the drive wire that one end is connected with detection terminal by the first switch connects the first short bar, and the other end of the drive wire that one end is connected with detection terminal by second switch connects the second short bar;
It is characterized in that, described method comprises: many probes contact with described a plurality of detection terminals; To the first thread switching control and the output of second switch control line, control voltage, make the first switch conduction second switch cut-off, many probes detect being connected corresponding drive wire with the first switch by corresponding detection terminal; To the first thread switching control and the output of second switch control line, control voltage, make second switch conducting the first switch cut-off, many probes detect be connected corresponding drive wire with second switch by corresponding detection terminal.
3. the drive wire line defect detection method of display panels as claimed in claim 2, it is characterized in that: many probes are connected the step that corresponding drive wire detects and comprise with the first switch by corresponding detection terminal: a probe is exported a test voltage by corresponding detection terminal, and other probe detects described test voltage by corresponding detection terminal; As all other probes all do not detect as described in test voltage, with another probe, by corresponding detection terminal, export a test voltage, other probe detects described test voltage by corresponding detection terminal.
4. the drive wire line defect detection method of display panels as claimed in claim 3, is characterized in that: when a probe does not detect test voltage, judge that its corresponding drive wire opens circuit.
5. the drive wire line defect detection method of display panels as claimed in claim 2, it is characterized in that, many probes are detected and comprise be connected corresponding drive wire with the first switch by corresponding detection terminal: a probe is exported a test voltage by corresponding detection terminal, and other probe detects described test voltage by corresponding detection terminal.
6. the drive wire line defect detection method of a display panels, described display panels comprises many group drive wires and a plurality of detection terminal, every group of drive wire at least comprises two drive wires, and described display panels also comprises a plurality of the first switches, a plurality of second switch, control the first thread switching control of described a plurality of the first switches and control the second switch control line of described a plurality of second switches;
Two drive wire one end in described every group of drive wire are connected with a detection terminal with a second switch by one first switch respectively;
Described display panels further comprises the first short bar and the second short bar, in every group of drive wire, the other end of the drive wire that one end is connected with detection terminal by the first switch connects the first short bar, and the other end of the drive wire that one end is connected with detection terminal by second switch connects the second short bar;
Every group of drive wire comprises three drive wires, and another drive wire one end in every group is directly connected with a detection terminal;
It is characterized in that, described method comprises: many probes contact with described a plurality of detection terminals; To the first thread switching control and the output of second switch control line, control voltage, make the first switch conduction second switch cut-off, many probes detect being connected corresponding drive wire with the first switch by corresponding detection terminal.
7. the drive wire line defect detection method of display panels as claimed in claim 6, it is characterized in that, many probes are detected and comprise be connected corresponding drive wire with the first switch by corresponding detection terminal: a probe is exported a test voltage by correspondence with the direct-connected detection terminal of drive wire, and other probe detects described test voltage by corresponding detection terminal.
8. the drive wire line defect detection method of display panels as claimed in claim 7, is characterized in that, when a probe in detecting is to output voltage, judges drive wire that it is corresponding and adjacent drive wire short circuit.
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| CN102402031B (en) * | 2011-12-14 | 2014-01-22 | 深圳市华星光电技术有限公司 | Test system |
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| CN102768421A (en) * | 2012-07-24 | 2012-11-07 | 深圳市华星光电技术有限公司 | Liquid crystal display panel and manufacturing method thereof |
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| CN104280908A (en) * | 2014-10-21 | 2015-01-14 | 深圳市华星光电技术有限公司 | Detection circuit, liquid crystal display panel and manufacturing method of liquid crystal display panel |
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